JPH0580122B2 - - Google Patents
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- JPH0580122B2 JPH0580122B2 JP59250568A JP25056884A JPH0580122B2 JP H0580122 B2 JPH0580122 B2 JP H0580122B2 JP 59250568 A JP59250568 A JP 59250568A JP 25056884 A JP25056884 A JP 25056884A JP H0580122 B2 JPH0580122 B2 JP H0580122B2
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- voids
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Description
〔産業上の利用分野〕
この発明は内部欠陥のない高透磁率磁性薄鋼板
の製造方法に関し、特に内部欠陥のない製品を得
ることを目的とする。
〔従来の技術〕
Fe−Si合金、Fe−Si−Al合金の中には、Fe−
6.5wt%Si合金やFe−9.6wt%Si−5.4wt%Al合金
(センダスト)のように、極めて透磁率が高く、
優れた軟磁気特性を示すものがある。特にセンダ
ストは、1973年に増本、山本両博士によつて発明
されて以来、ダストコア、磁気ヘツドなど多くの
電子機器に応用されて来ている。特に磁気ヘツド
に関しては、磁気記録媒体の高密度化に伴い記録
媒体の高保磁力化が進みつつある昨今では、従来
使われてきたフエライトヘツドよりも飽和磁化の
高いセンダストの方が記録に適する材料として注
目されている。また、Fe−6.5wt%Si合金につい
ても、高い飽和磁束密度を持つことから変圧器の
鉄心やその他の電気、電子機器への利用が考えら
れている。
軟磁気特性の優れたこれらの高Si合金を実際に
電子部品等に適用する場合、最も問題となるの
は、これらの合金が脆性を示すため圧延により薄
く加工することができないという点である。この
ためセンダストの場合には、鋳造後、素材をスラ
イスすることにより磁気ヘツド用薄片を作製して
おり、ヘツドの製造工程の中では極めて効率の悪
い工程となつている。その上、センダストは鋳造
凝固時にクラツク、ピンホールなどが出来やす
く、これらの欠陥の除去が不可欠であり、そのた
めの工程も必要となる。
以上のような製造工程上の問題を解決するた
め、以下のような様々な方法が試みられて来てい
る。
熱間における圧延、変形
添加元素による加工性の改善
融体急冷法
圧延後成分調整法
の熱間において圧延、変形を行なう方法は、
1000℃以上で極めて低い歪速度をとることにより
可能となるが、その条件を工業的に実現するのは
かなりの困難を伴なうものである。の添加元素
により加工性を向上させようという試みも、元素
の添加により若干の加工性の改善は見られるもの
のやはり脆性を示し、薄板への加工は依然困難で
あるとともに、これら添加元素により磁性が悪化
してしまうという欠点がある。の融体急冷法は
溶融金属から直接薄板形状へ鋳造しようというも
ので、圧延加工することなしに薄板が得られると
いう点で、このような脆性を示す素材に対しては
極めて有効な方法である。の圧延後の成分調整
法は低Si、低Al鋼を溶製し、圧延により薄板と
した後、表面からの浸透によりSiあるいはAlを
富化させ、最終的に高Si鋼薄板とするものであ
る。この方法は、五弓、阿部により提案され、三
谷、大西らにより詳しく検討されたものである。
しかしながら、従来までに提案された浸透方法
は、浸透処理時間が30分を超えるため非常にまた
温度も1230℃程度と極めて高いことから、浸透処
理後の薄鋼板の形状が極めて悪くなるという欠点
があつた。更に高透磁率材料を製造する上で最も
致命的な現象は、従来法では浸透に伴いカーケン
ダルボイドと称する大きなボイドが生成し、焼結
処理を施してもなお相当量残存するため、透磁率
が著しく低下するということにある。Siの浸透法
により高Si薄鋼板を製造する方法が未だ現実のも
のとなつていないのは、ボイドの消去が困難であ
るという一点にあると言つても過言ではない。ボ
イドの形成を防止するものとしては、特公昭38−
26263号に示される様に母材を半溶融状態にして
これを活用する技術がある。この技術では半溶融
状態を作り出すためにC量の調整とこれに対応す
る処理温度の設定がキーポイントとなつている
が、C量が0〜0.15wt%の場合に母材が半溶融状
態になつている温度(C:0wt%の時1250℃であ
り、C:0.15wt%の時1200℃である)領域でSi浸
透処理を行なうと、該処理中にボイドが発生して
も半溶融状態であるためにボイドが融着し、結果
的にボイドの形成が抑止された状態でSiの浸透処
理が行なわれるというものである。
しかしこの様な温度領域でSi浸透処理を行なう
と、被処理物の寸法の変化・形状の劣化が大きく
なつて別の問題を生ずることになる。そのためこ
れより温度の低い固相領域でボイド発生の抑止で
きる様なSi浸透処理の新たな開発が望まれてい
た。
一方、特公昭53−42019号では、処理雰囲気中
のSiCl4量を低くして(その飽和蒸気圧の25%を
含有するとしているが、これを容積百分率に換算
すると約2.5Vol%)、逆にH2ガスを多量に混合
(30Vol%)せしめると共に、反応温度を1075℃
〜1100℃と低くして、母材を上記処理雰囲気中に
接触させた段階では、SiCl4+2H2→Si+4HClの
SiCl4還元反応が進行して該母材上に純Siを析出
させる(Si化学気相メツキ)という技術がある。
これは、耐食性を高めるという目的ならともか
く、工業的には、一旦母材表面に純Siの化学気相
メツキを施してからその後浸透・拡散処理を別に
行なわなければならないため非能率的である。む
しろ母材が処理雰囲気中に接触せしめられた段階
で母材表面に形成されるSi富化層がこの様な純Si
ではなく、Fe3Siとなつていれば工業的には非常
に望ましい。
〔発明の概要〕
本発明は上記した従来技術の欠点を改善するた
めになされたもので、圧延後成分調整法に改良を
加えることにより、ボイドの生成を極めて低く抑
制することのできる製造法を提供しようとするも
のである。
本発明者らは、母材の寸法変化や形状劣化のな
い固相領域となる温度範囲でのSi浸透条件を詳細
に検討した結果、Si浸透処理後にも拡散均一化処
理後にもボイドの残留しない条件を見い出した。
かつ、このSi浸透処理により所望のSi量に調整し
た結果、極めて高い透磁率を有する高Si薄板を得
ることができた。
即ち、本発明者らは試験、研究を重ねた結果、
外部雰囲気からのSiの浸透する速度に関して該雰
囲気中にH2ガス等反応性の高いガスを含まない
場合は、Si化合物の分圧が極めて大きな要因とな
つており、Si化合物の分圧が高ければ高い程Siの
浸透速度は速いが、反面分圧が高いとボイド量が
多くなることを見い出したものである。
第1図にSiCl4雰囲気中でFe−5.4%Al鋼を処理
する場合において、SiCl4分圧を変えるため導入
ガス中SiCl4量を10vol%、16vol%、55vol%と変
えた場合の基板の重量変化を示す。重量変化はSi
の浸透の程度を表わすパラメーターであり、重量
変化が大きい程Siが多く浸透していることを示し
ている。この現象はFeCl2が系外に出る5Fe+
SiCl4→Fe3Si+2FeCl2の反応のためであると考え
られている。この第1図より、明らかにSi分圧が
高いほうが、Siの浸透速度が速いことがわかる。
しかし、ボイド量については、母材の寸法変化
や形状劣化が小さい固相領域では逆にSi分圧が高
くなると増加する傾向が認められる。第2図はSi
浸透処理後と拡散均一化処理後のSiCl4量とボイ
ド量との関係を示すもので、Si分圧が高くなると
ボイド量が増加することが明確に示されている。
この理由は明確ではないが、次のように考えら
れる。即ち、導入ガス(H2等の反応性ガスの含
まれていない雰囲気)中のSiCl4量を少なくする
と、単位時間、単位表面積あたり外部より浸透す
るSi量は減少するが、これはカーケンダル界面を
通して内部に浸透するSi原子の量も少なくなるこ
とを示しており、空孔、つまりカーケンダルボイ
ドの発生も少なくなる。このような状況下では、
ボイドの融着を促す半溶融状態の場合の現象とは
異なり、試料が熱的に活性であるために起こる
Fe、Si原子の拡散がSiの浸透現象とオーダー的
に並行して進行するため、生成したカーケンダル
ボイドが集合して安定なボイドとなる以前に、内
部の転位等によつて吸収、消滅しやすくなる。従
つてSiの浸透スピードを遅くすることにより、ボ
イドの残留が抑制させることになる。
本発明者らは、更にSi分圧と得られた製品の磁
性特性についても検討した結果、第3図に示すよ
うに、SiCl4量が少ないほど保磁力が低くなると
の知見を得た。
本発明は、これら実験研究により得られた知見
に基づくもので、Si浸透処理雰囲気中のSi分圧を
制御することにより、ボイドがなく、しかも磁性
特性に優れた製品を得るようにしたものである。
即ち、本発明は通常の工程で製造したC:
0.01wt%以下の薄鋼板をSiCl4を含む雰囲気中に
置き、該薄鋼板にSiを浸透させるに際し、該雰囲
気中のSiCl4量6Vol%以上25Vol%以下、Si浸透
温度1100℃超え1200℃以下、処理時間30分以内の
条件で下記反応式によるSi浸透処理を施し、次い
で不活性雰囲気中で拡散処理を施すことを基本的
な特徴とするものである。
5Fe+SiCl4→Fe3Si+2FeCl2
これらの限定理由を述べる。
まず母材のC量については、それが0.01wt%を
超えて含まれた場合、磁気特性(特に透磁率)の
低下が著しくなる。そのため0.01wt%をその上限
とした。
次にSi浸透処理における雰囲気中のSiCl4量に
ついては、第2図から明らかなように、SiCl4量
25Vol%以下ではボイドは殆ど発生しない。また
第3図からSiCl4量25Vol%以下で保磁力の低下
は飽和する。この2つの観点から本発明において
はSi浸透処理雰囲気中のSiCl4量を25Vol%以下に
限定する。
一方、第1図において80%、85%、90%、95%
の重量変化があつた場合に導入ガス中のSiCl4量
(Vol%)とSi浸透処理時間の関係を示す第7図
(両対数目盛)から明らかなように、浸透処理時
間を本発明の目標である30分以下にするために導
入ガス中のSiCl4量は6Vol%以上にしなければな
らない。
また浸透温度は、1100℃以下ではSiの浸透が極
めて遅く、1200℃超えではSi浸透層に形成される
Fe3Siが融解してしまうため1100℃超え1200℃以
下の範囲とする。但し、ボイド抑制のためには、
できる限り高温にするのが有利である(本発明で
はCが0.01wt%以下と規定されているため1200℃
の場合でも母材は固相状態である)。
更に浸透処理時間については、基板の重量変化
を大きくしようとした場合(Siの浸透度合を大き
く使用とした場合)、導入ガス中のSiCl4量を6〜
25Vol%の範囲内で低めに設定すればする程、そ
の処理時間が長く掛かり、それが30分を超える
と、生産歩留りの点から好ましくない。そのため
本発明では浸透処理時間の上限を30分とした。
上記した条件の処理によりSiが所定量浸透した
後、拡散処理により成分を均一化するのである
が、この拡散処理は基板を冷却せずに雰囲気を不
活性ガスに切り換えることにより引き続き行なつ
てもよいし、基板を一定室温付近まで冷却し、改
めて拡散処理を施してもよい。
なお、本発明法によつて製造し得る高透磁率性
薄板の種類としては3〜6.5wt%Si−Fe合金、セ
ンダスト合金があるが、Siの浸透に供する出発薄
鋼板の成分としては、以下のように定めるのが好
ましい。
3〜6.5wt%Si−Fe合金の場合
C0.01wt%以下、Si0〜4.0%wt%、Mn2wt%
以下、その他不可避不純物は極力低い方が望ま
しい。
センダスト合金の場合
C0.01wt%以下、Si4wt%以下、Al3〜8wt
%、Ni4wt%以下、Mn2wt%以下、Cr、Tiな
どの耐食性を増す元素5wt%以下、その他の不
可避不純物は極力低い方が望ましい。
〔実施例〕
以下に示す化学成分を持つ合金を、熱間、冷間
圧延を経て、板厚0.40mmの薄板を作製し、これを
基板とした。
[Industrial Field of Application] The present invention relates to a method for manufacturing a high permeability magnetic thin steel sheet free of internal defects, and particularly aims to obtain a product free of internal defects. [Prior art] Fe-Si alloy and Fe-Si-Al alloy include Fe-Si alloy and Fe-Si-Al alloy.
Materials with extremely high magnetic permeability, such as 6.5wt%Si alloy and Fe-9.6wt%Si-5.4wt%Al alloy (Sendust),
Some exhibit excellent soft magnetic properties. In particular, since Sendust was invented by Dr. Masumoto and Dr. Yamamoto in 1973, it has been applied to many electronic devices such as dust cores and magnetic heads. In particular, regarding magnetic heads, as the density of magnetic recording media increases, the coercive force of recording media is increasing, and Sendust, which has a higher saturation magnetization, is a more suitable material for recording than the conventionally used ferrite head. Attention has been paid. Additionally, Fe-6.5wt%Si alloy has a high saturation magnetic flux density, so it is being considered for use in transformer cores and other electrical and electronic devices. When these high-Si alloys with excellent soft magnetic properties are actually applied to electronic parts, etc., the biggest problem is that these alloys exhibit brittleness and cannot be processed into thin pieces by rolling. For this reason, in the case of Sendust, thin pieces for magnetic heads are produced by slicing the material after casting, which is an extremely inefficient process in the head manufacturing process. Furthermore, sendust is prone to cracks and pinholes during casting and solidification, and it is essential to remove these defects, which requires a process. In order to solve the above-mentioned manufacturing process problems, various methods have been tried as described below. Hot rolling and deformation Improving workability with additive elements Melt quenching method Post-rolling component adjustment method The hot rolling and deforming methods are as follows:
This is possible by maintaining an extremely low strain rate at temperatures above 1000°C, but achieving this condition industrially is extremely difficult. Attempts have been made to improve workability by adding elements, but although the workability is slightly improved by the addition of elements, it still shows brittleness, and processing into thin sheets remains difficult, and these additive elements also reduce magnetic properties. The disadvantage is that it gets worse. The melt quenching method aims to directly cast molten metal into a thin plate shape, and is an extremely effective method for materials that exhibit brittleness such as this, in that a thin plate can be obtained without rolling. . The post-rolling composition adjustment method involves melting low-Si and low-Al steel, rolling it into a thin plate, enriching it with Si or Al by permeation from the surface, and finally producing a high-Si steel thin plate. be. This method was proposed by Gokyumi and Abe, and was studied in detail by Mitani, Onishi et al. However, the infiltration methods that have been proposed so far have the drawback that the infiltration treatment time is extremely long, exceeding 30 minutes, and the temperature is extremely high, around 1230°C, resulting in extremely poor shape of the thin steel sheet after the infiltration treatment. It was hot. Furthermore, the most fatal phenomenon in producing high magnetic permeability materials is that with conventional methods, large voids called Kirkendall voids are generated as a result of penetration, and a considerable amount remains even after sintering, resulting in a decrease in magnetic permeability. is significantly reduced. It is no exaggeration to say that the reason why the method of manufacturing high-Si thin steel sheets by Si infiltration method has not yet become a reality is that it is difficult to eliminate voids. To prevent the formation of voids,
As shown in No. 26263, there is a technique that utilizes the base material in a semi-molten state. In this technology, the key points are adjusting the amount of C and setting the corresponding processing temperature in order to create a semi-molten state, but when the amount of C is 0 to 0.15 wt%, the base material becomes a semi-molten state. If Si infiltration treatment is performed in the temperature range where C: 0 wt% is 1250 °C and C: 0.15 wt% is 1200 °C, it will remain in a semi-molten state even if voids occur during the treatment. Therefore, the voids are fused together, and as a result, Si infiltration treatment is performed in a state where void formation is suppressed. However, if Si infiltration treatment is performed in such a temperature range, the change in dimensions and deterioration of the shape of the object to be treated will increase, leading to other problems. Therefore, it has been desired to develop a new Si infiltration treatment that can suppress the generation of voids in the solid phase region with lower temperatures. On the other hand, in Japanese Patent Publication No. 53-42019, the amount of SiCl 4 in the processing atmosphere is lowered (it is said to contain 25% of its saturated vapor pressure, but this is about 2.5Vol% when converted to volume percentage), and vice versa. A large amount of H 2 gas (30Vol%) is mixed with the mixture, and the reaction temperature is increased to 1075℃.
At the stage where the base material is brought into contact with the above treatment atmosphere at a low temperature of ~1100℃, SiCl 4 + 2H 2 → Si + 4HCl changes.
There is a technique in which a SiCl 4 reduction reaction progresses to deposit pure Si on the base material (Si chemical vapor phase plating). Although the purpose of this is to improve corrosion resistance, from an industrial perspective, it is inefficient because it requires chemical vapor phase plating of pure Si on the surface of the base material and then separate penetration and diffusion treatments. Rather, the Si-enriched layer that forms on the surface of the base material when it comes into contact with the processing atmosphere is such a pure Si layer.
It would be very desirable from an industrial perspective if it were to be Fe 3 Si instead of Fe 3 Si. [Summary of the Invention] The present invention has been made to improve the above-mentioned drawbacks of the prior art, and has developed a manufacturing method that can suppress the generation of voids to an extremely low level by improving the post-rolling composition adjustment method. This is what we are trying to provide. As a result of a detailed study of Si infiltration conditions in a temperature range that provides a solid phase region without dimensional change or shape deterioration of the base material, the present inventors found that no voids remain after Si infiltration treatment or diffusion homogenization treatment. I found the conditions.
Moreover, as a result of adjusting the amount of Si to a desired level through this Si infiltration treatment, it was possible to obtain a high-Si thin plate with extremely high magnetic permeability. That is, as a result of repeated tests and research by the present inventors,
Regarding the rate of penetration of Si from the external atmosphere, if the atmosphere does not contain highly reactive gases such as H 2 gas, the partial pressure of the Si compound is an extremely important factor; They found that the higher the pressure, the faster the rate of Si penetration, but on the other hand, the higher the partial pressure, the greater the amount of voids. Figure 1 shows the results when processing Fe-5.4%Al steel in a SiCl 4 atmosphere and changing the amount of SiCl 4 in the introduced gas to 10 vol%, 16 vol%, and 55 vol% to change the SiCl 4 partial pressure. Shows weight change. Weight change is Si
This is a parameter that expresses the degree of penetration of Si, and the larger the weight change, the more Si has penetrated. This phenomenon is caused by FeCl 2 leaving the system as 5Fe+
It is thought that this is due to the reaction of SiCl 4 →Fe 3 Si + 2FeCl 2 . From FIG. 1, it is clear that the higher the Si partial pressure, the faster the Si permeation rate. However, the amount of voids tends to increase as the Si partial pressure increases in the solid phase region where dimensional changes and shape deterioration of the base material are small. Figure 2 shows Si
It shows the relationship between the amount of SiCl 4 and the amount of voids after infiltration treatment and diffusion homogenization treatment, and clearly shows that the amount of voids increases as the Si partial pressure increases. Although the reason for this is not clear, it is thought to be as follows. In other words, if the amount of SiCl 4 in the introduced gas (atmosphere that does not contain reactive gases such as H 2 ) is reduced, the amount of Si penetrating from the outside per unit time and unit surface area will decrease, but this will occur through the Kirkendall interface. This indicates that the amount of Si atoms penetrating into the interior is also reduced, and the occurrence of vacancies, or Kirkendall voids, is also reduced. Under such circumstances,
This phenomenon occurs because the sample is thermally active, unlike the phenomenon that occurs when the sample is in a semi-molten state, which promotes the fusion of voids.
Because the diffusion of Fe and Si atoms progresses in parallel with the permeation phenomenon of Si, the Kirkendall voids are absorbed and annihilated by internal dislocations, etc., before they aggregate and become stable voids. It becomes easier. Therefore, by slowing down the penetration speed of Si, the remaining voids can be suppressed. The present inventors further investigated the Si partial pressure and the magnetic properties of the obtained product, and as a result, as shown in FIG. 3, they found that the smaller the amount of SiCl 4 , the lower the coercive force. The present invention is based on the knowledge obtained through these experimental studies, and by controlling the Si partial pressure in the Si infiltration treatment atmosphere, it is possible to obtain a product with no voids and excellent magnetic properties. be. That is, in the present invention, C produced by a normal process:
When placing a thin steel plate of 0.01wt% or less in an atmosphere containing SiCl 4 and infiltrating the thin steel plate with Si, the amount of SiCl 4 in the atmosphere should be 6 Vol% or more and 25 Vol% or less, and the Si permeation temperature should be more than 1100°C and less than 1200°C. The basic feature is that Si infiltration treatment is performed according to the following reaction formula under conditions of a treatment time of 30 minutes or less, and then a diffusion treatment is performed in an inert atmosphere. 5Fe+SiCl 4 →Fe 3 Si+2FeCl 2The reason for these limitations will be explained. First, regarding the amount of C in the base material, if it is contained in excess of 0.01 wt%, the magnetic properties (particularly magnetic permeability) will be significantly lowered. Therefore, the upper limit was set at 0.01wt%. Next, regarding the amount of SiCl 4 in the atmosphere during Si infiltration treatment, as is clear from Figure 2, the amount of SiCl 4
Void hardly occurs below 25Vol%. Moreover, from FIG. 3, the decrease in coercive force is saturated when the amount of SiCl 4 is 25 Vol% or less. From these two viewpoints, in the present invention, the amount of SiCl 4 in the Si infiltration treatment atmosphere is limited to 25 Vol% or less. On the other hand, in Figure 1, 80%, 85%, 90%, 95%
As is clear from FIG. 7 (log-logarithmic scale), which shows the relationship between the amount of SiCl4 in the introduced gas (Vol%) and the Si infiltration treatment time when the weight of In order to reduce the time to 30 minutes or less, the amount of SiCl 4 in the introduced gas must be 6 Vol% or more. In addition, when the penetration temperature is below 1100℃, Si penetration is extremely slow, and when it exceeds 1200℃, a Si penetration layer is formed.
Since Fe 3 Si will melt, the temperature should be above 1100°C and below 1200°C. However, in order to suppress voids,
It is advantageous to set the temperature as high as possible (in the present invention, C is specified to be 0.01wt% or less, so 1200℃
Even in the case of , the base material is in a solid state). Furthermore, regarding the infiltration treatment time, when trying to increase the weight change of the substrate (when using a large Si infiltration degree), the amount of SiCl 4 in the introduced gas should be
The lower it is set within the range of 25 Vol%, the longer the processing time will take, and if it exceeds 30 minutes, it is unfavorable from the viewpoint of production yield. Therefore, in the present invention, the upper limit of the infiltration treatment time is set to 30 minutes. After a predetermined amount of Si permeates through the process under the above conditions, the components are made uniform through a diffusion process, but this diffusion process can be continued without cooling the substrate by switching the atmosphere to an inert gas. Alternatively, the substrate may be cooled to around a constant room temperature and the diffusion treatment may be performed again. The types of high magnetic permeability thin sheets that can be produced by the method of the present invention include 3 to 6.5 wt% Si-Fe alloy and sendust alloy, but the starting thin steel sheet used for Si infiltration has the following components: It is preferable to define it as follows. For 3-6.5wt% Si-Fe alloy: C0.01wt% or less, Si0-4.0%wt%, Mn2wt%
Below, it is desirable that other unavoidable impurities be as low as possible. For Sendust alloy: C0.01wt% or less, Si4wt% or less, Al3~8wt
%, Ni 4wt% or less, Mn 2wt% or less, elements that increase corrosion resistance such as Cr and Ti 5wt% or less, and other unavoidable impurities as low as possible. [Example] A thin plate having a thickness of 0.40 mm was produced by hot and cold rolling an alloy having the chemical components shown below, and this was used as a substrate.
【表】
この基板を、第4図に示す装置を用いて、Si浸
透処理を施した。第4図中、1はSiCl4を満たし
た丸底フラスコ、2は恒温水槽、3は炉、Xは試
料である。[Table] This substrate was subjected to Si infiltration treatment using the apparatus shown in FIG. In FIG. 4, 1 is a round bottom flask filled with SiCl 4 , 2 is a constant temperature water bath, 3 is a furnace, and X is a sample.
【表】
導入ガス中のSiCl4は、SiCl4気化器の恒温槽2
の温度をコントロールすることにより変化させ
た。また浸透処理条件は、いずれもSiが9.6wt%
まで浸透する条件に合わせた。
Si浸透処理に用いた炉3は、炭化ケイ素発熱体
を有し、炉心管は内径40mmのセラミツク製で
SiCl4のキヤリアガスとしてはArを用い、その流
量は0.5/minである。
このようにSi浸透処理を施した試料を化学分析
したところ、いずれも目標とするSi量(9.6wt%)
を含有することがわかつた。
第5図及び第6図に、Si浸透処理後及び1200℃
1時間不活性雰囲気中にて拡散均一化処理後の試
料A〜Dの断面組織写真を示す。導入ガス中の
SiCl4量が増すほどSi浸透処理後、拡散均一化処
理後ともにボイドの生成が顕著となつている。
拡散均一化処理後の組織を見ると、試料Dは残
留ボイドが大きく、数多くあるのに比べ、試料A
〜Cはいずれもボイドはほとんど見られない。[Table] SiCl 4 in the introduced gas is
The temperature was changed by controlling the temperature. In addition, the penetration treatment conditions were such that Si was 9.6wt%.
The conditions have been adjusted to ensure that it penetrates even further. Furnace 3 used for Si infiltration treatment has a silicon carbide heating element, and the furnace core tube is made of ceramic with an inner diameter of 40 mm.
Ar is used as a carrier gas for SiCl 4 and its flow rate is 0.5/min. Chemical analysis of the samples subjected to Si infiltration treatment revealed that the target amount of Si (9.6wt%) was achieved in both cases.
It was found that it contains Figures 5 and 6 show the results after Si infiltration treatment and at 1200℃.
The cross-sectional microstructure photographs of samples A to D after diffusion homogenization treatment in an inert atmosphere for 1 hour are shown. in the introduced gas
As the amount of SiCl 4 increases, the generation of voids becomes more pronounced both after Si infiltration treatment and after diffusion homogenization treatment. Looking at the structure after the diffusion homogenization treatment, sample D has large and numerous residual voids, whereas sample A
-C, almost no voids are observed.
第1図はSi浸透処理時間と重量変化との関係を
示すグラフ、第2図はSiCl4量とボイド量との関
係を示すグラフ、第3図はSiCl4量と保磁力との
関係を示すグラフ、第4図は実施例実施のための
装置概略図、第5図と第6図は金属の断面組織を
示す顕微鏡写真、第7図はSi浸透処理時間と導入
ガス中のSiCl4量を関係を示すグラフである。
Figure 1 is a graph showing the relationship between Si infiltration treatment time and weight change, Figure 2 is a graph showing the relationship between SiCl4 amount and void amount, and Figure 3 is a graph showing the relationship between SiCl4 amount and coercive force. Graph, Figure 4 is a schematic diagram of the apparatus for carrying out the example, Figures 5 and 6 are micrographs showing the cross-sectional structure of the metal, and Figure 7 shows the Si infiltration treatment time and the amount of SiCl 4 in the introduced gas. It is a graph showing a relationship.
Claims (1)
鋼板をSiCl4を含む雰囲気中に置き、該薄鋼板に
Siを浸透させるに際し、 該雰囲気中のSiCl4量6Vol%以上25Vol%以下、
Si浸透温度1100℃超え1200℃以下、処理時間30分
以内の条件で下記反応式によるSi浸透処理を施
し、次いで不活性雰囲気中で拡散処理を施すこと
を特徴とする内部欠陥のない高透磁率磁性薄鋼板
の製造方法。 5Fe+SiCl4→Fe3Si+2FeCl2 [Claims] 1. A thin steel plate with a carbon content of 0.01wt% or less manufactured by a normal process is placed in an atmosphere containing SiCl4 , and the thin steel plate is
When infiltrating Si, the amount of SiCl4 in the atmosphere is 6 Vol% or more and 25 Vol% or less,
High magnetic permeability with no internal defects characterized by performing Si infiltration treatment according to the following reaction formula at a Si infiltration temperature of over 1100℃ and below 1200℃ and treatment time within 30 minutes, followed by diffusion treatment in an inert atmosphere. A method for producing magnetic thin steel sheets. 5Fe+SiCl 4 →Fe 3 Si+2FeCl 2
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59250568A JPS61129803A (en) | 1984-11-29 | 1984-11-29 | Method for manufacturing high permeability magnetic thin steel sheet without internal defects |
| PCT/JP1985/000535 WO1986002105A1 (en) | 1984-09-28 | 1985-09-26 | Process for producing thin magnetic steel plate having high permeability |
| US06/845,873 US4832762A (en) | 1984-09-28 | 1985-09-26 | Method for producing thin steel sheet of high magnetic permeability |
| DE8585904865T DE3585686D1 (en) | 1984-09-28 | 1985-09-26 | METHOD FOR PRODUCING THIN MAGNETIC STEEL SHEETS OF HIGH PERMEABILITY. |
| KR1019860700166A KR950013285B1 (en) | 1984-09-28 | 1985-09-26 | Process for production thin magnetic steel plate having high ptrmeability |
| EP85904865A EP0198084B1 (en) | 1984-09-28 | 1985-09-26 | Process for producing thin magnetic steel plate having high permeability |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59250568A JPS61129803A (en) | 1984-11-29 | 1984-11-29 | Method for manufacturing high permeability magnetic thin steel sheet without internal defects |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61129803A JPS61129803A (en) | 1986-06-17 |
| JPH0580122B2 true JPH0580122B2 (en) | 1993-11-08 |
Family
ID=17209823
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59250568A Granted JPS61129803A (en) | 1984-09-28 | 1984-11-29 | Method for manufacturing high permeability magnetic thin steel sheet without internal defects |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61129803A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06224971A (en) * | 1993-01-22 | 1994-08-12 | Nec Commun Syst Ltd | Data change detection system |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6324015A (en) * | 1986-07-16 | 1988-02-01 | Nippon Kokan Kk <Nkk> | Apparatus for producing steel sheet |
| JPS6324034A (en) * | 1986-07-16 | 1988-02-01 | Nippon Kokan Kk <Nkk> | Method for manufacturing high-silicon steel sheet with insulating film |
| JPS6324033A (en) * | 1986-07-16 | 1988-02-01 | Nippon Kokan Kk <Nkk> | Method for manufacturing metal materials using chemical vapor deposition processing |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6012686B2 (en) * | 1976-09-29 | 1985-04-03 | 株式会社日立製作所 | floating magnetic head |
-
1984
- 1984-11-29 JP JP59250568A patent/JPS61129803A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06224971A (en) * | 1993-01-22 | 1994-08-12 | Nec Commun Syst Ltd | Data change detection system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61129803A (en) | 1986-06-17 |
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