JPH06129944A - Analysis and evaluation system for aspherical shapes - Google Patents
Analysis and evaluation system for aspherical shapesInfo
- Publication number
- JPH06129944A JPH06129944A JP4274719A JP27471992A JPH06129944A JP H06129944 A JPH06129944 A JP H06129944A JP 4274719 A JP4274719 A JP 4274719A JP 27471992 A JP27471992 A JP 27471992A JP H06129944 A JPH06129944 A JP H06129944A
- Authority
- JP
- Japan
- Prior art keywords
- shape
- data
- aspherical
- aspherical surface
- curvature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
(57)【要約】
【目的】 本発明は、測定者の主観的判断が入らず、入
力の手間のかからない非球面形状の解析評価システムを
提供することを目的とし、さらにその測定精度を高める
ことを目的とする。
【構成】 形状測定機10からの測定データを取り込むデ
ータ取り込み回路21と、この回路21に取り込まれた測定
データから非球面軸の位置と傾きを探索し、探索結果に
基づいて測定誤差を補正する第1演算回路22を有する。
この演算回路22は更に所定の設計非球面式の係数中で近
軸曲率半径のみを変化させながら前記補正をした測定デ
ータと設計非球面式に基づく形状データとの偏差が最小
となるよう最適近軸曲率半径を有する非球面式を自動的
に推定する。偏差データを低周波成分と高周波成分とに
分離する第2演算回路23を設けるのが好ましい。
(57) [Summary] [Object] An object of the present invention is to provide an analysis / evaluation system for an aspherical shape that does not require subjective judgment of the measurer and does not require any input, and further to improve the measurement accuracy. With the goal. [Structure] A data capturing circuit 21 that captures the measurement data from the shape measuring instrument 10, and a position and an inclination of an aspherical surface axis are searched from the measurement data captured by the circuit 21, and a measurement error is corrected based on the search result. It has a first arithmetic circuit 22.
The arithmetic circuit 22 further adjusts the parallax radius of curvature within the coefficient of the predetermined design aspherical expression while varying the paraxial curvature radius so as to minimize the deviation between the measured data and the shape data based on the design aspherical expression. Automatically estimate an aspherical expression with an axial radius of curvature. It is preferable to provide a second arithmetic circuit 23 for separating the deviation data into a low frequency component and a high frequency component.
Description
【0001】[0001]
【産業上の利用分野】本発明は、非球面形状の解析評価
システム、特にライン走査型の形状測定機を用いる非球
面形状の解析評価システムに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an aspherical surface shape analysis / evaluation system, and more particularly to an aspherical surface shape analysis / evaluation system using a line scanning type shape measuring machine.
【0002】[0002]
【従来の技術】従来、非球面レンズ等の形状を評価する
場合には、高精度に仕上げたマスターレンズを用いてホ
ログラム手法で形状のずれを確認していたが、その形状
のずれ(誤差の値)を正確に把握することができないと
ともにマスターレンズが高価である等の問題があった。
そこで、近時、このような非球面形状を自動的に評価す
ることのできる評価システムが提案されている。2. Description of the Related Art Conventionally, when evaluating the shape of an aspherical lens or the like, a master lens finished with high accuracy was used to confirm the shape deviation by a hologram method. There is a problem that the value) cannot be accurately grasped and the master lens is expensive.
Therefore, recently, an evaluation system capable of automatically evaluating such an aspherical shape has been proposed.
【0003】この種の非球面形状の解析評価システムと
しては、例えば特開平3−33635号公報に記載され
たものがある。この評価システムは、フォームタリサー
フ(形状測定機)により測定を行い、複数の測定データ
を次式(1)のような非球面式に当てはめて、この式中
の係数等を推定することで回帰曲線を求め、各測定点で
のこの回帰曲線に対する偏差をグラフ表示するようにし
ている。An example of this type of aspherical surface analysis / evaluation system is disclosed in Japanese Patent Laid-Open No. 3-33635. This evaluation system measures by using a foam Talysurf (shape measuring machine), applies a plurality of measurement data to an aspherical formula such as the following formula (1), and estimates the coefficient in this formula to regress. A curve is obtained, and the deviation from this regression curve at each measurement point is displayed graphically.
【0004】[0004]
【数1】 [Equation 1]
【0005】[0005]
【発明が解決しようとする課題】しかしながら、このよ
うな従来の非球面形状の解析評価システムにあっては、
上述のように複雑な非球面式の係数等を推定するため、
その処理にかなりの労力、手間がかかり、容易な測定が
できなかった。また、そのような労力を軽減するため
に、非球面式の係数のうち近軸曲率半径R以外の係数を
設計値に固定して、近軸曲率半径Rのみを変化させる
(入力を繰り返す)方法を採ることができるが、形状デ
ータに最も近い非球面式を得るとなるとやはり労力を必
要とするし、測定者の主観的判断が入ってしまうことか
ら正確な評価ができない。However, in such a conventional aspherical surface shape analysis / evaluation system,
As mentioned above, to estimate the complex aspherical coefficients, etc.,
The processing required a great deal of labor and time, and an easy measurement could not be performed. Further, in order to reduce such labor, a method of fixing coefficients other than the paraxial radius of curvature R among the coefficients of the aspherical expression to a design value and changing only the paraxial radius of curvature R (repeating input) However, it is still laborious to obtain the aspherical surface formula that is the closest to the shape data, and the subjective judgment of the measurer is involved, so an accurate evaluation cannot be performed.
【0006】そこで本発明は、測定者の主観的判断が入
らず、入力の手間のかからない非球面形状の解析評価シ
ステムを提供することを目的とし、さらに測定精度を高
精度にすることを目的とする。[0006] Therefore, an object of the present invention is to provide an analysis and evaluation system for an aspherical shape that does not require the subjective judgment of the measurer and does not require any input, and further to improve the measurement accuracy. To do.
【0007】[0007]
【課題を解決するための手段】上記目的達成のため、請
求項1記載の発明は、非球面形状を測定する形状測定機
の測定データに基づいて該非球面形状を解析評価する非
球面形状の解析評価システムであって、前記形状測定機
からの測定データを取り込むデータ取り込み手段と、デ
ータ取り込み手段に取り込まれた測定データから非球面
軸の位置と傾きを探索し、該非球面軸の位置と傾きに基
づいて測定誤差を補正する補正手段と、所定の設計非球
面式の係数中で近軸曲率半径のみを変化させ、前記補正
手段により補正された形状測定データと設計非球面式に
基づく形状データとの偏差が最小となるような最適近軸
曲率半径を有する非球面式を自動的に推定する推定手段
と、を備えたことを特徴とするものであり、請求項2記
載の発明は、前記形状測定データと最適近軸曲率半径を
有する非球面式に基づく形状データとの偏差を低周波成
分と高周波成分とに分離する分離手段を設けたことを特
徴とするものである。In order to achieve the above-mentioned object, the invention according to claim 1 analyzes the aspherical surface shape for analyzing and evaluating the aspherical surface shape based on the measurement data of a shape measuring machine for measuring the aspherical surface shape. In the evaluation system, a data capturing means for capturing the measurement data from the shape measuring instrument, and a position and an inclination of the aspherical surface axis are searched for from the measurement data captured by the data capturing means, and the position and the inclination of the aspherical surface axis are obtained. Correction means for correcting the measurement error based on the shape measurement data and the shape data based on the design aspherical expression, which is corrected by the correction means by changing only the paraxial curvature radius in the coefficient of the predetermined design aspherical expression. And an estimating means for automatically estimating an aspherical expression having an optimum paraxial radius of curvature that minimizes the deviation of (1), and the invention according to claim 2 is characterized in that In which characterized in that a separating means for separating the deviation between the shape data based on the aspheric equation with Jo measured data and the optimal paraxial curvature radius and the low and high frequency components.
【0008】[0008]
【作用】請求項1記載の発明では、非球面形状を測定し
た形状測定機からデータ取り込み手段に測定データが取
り込まれると、まず、補正手段によって非球面軸の位置
と傾きが求められ、該非球面軸の位置と傾きに基づいて
測定誤差が補正される。次いで、推定手段によって所定
の設計非球面式の係数中で近軸曲率半径のみを変化させ
つつ、前記補正がされた形状測定データと設計非球面式
に基づく形状データとの偏差が最小となるように最適近
軸曲率半径を有する非球面式が自動的に推定される。し
たがって、測定者の入力の手間がなくなり、しかも、主
観的判断も入らない正確な形状評価ができる。According to the first aspect of the invention, when the measurement data is taken into the data taking-in means from the shape measuring machine which measures the aspherical shape, first, the position and inclination of the aspherical surface axis are obtained by the correcting means, and the aspherical surface is obtained. The measurement error is corrected based on the axis position and tilt. Then, while varying only the paraxial radius of curvature in the coefficient of the predetermined design aspherical surface by the estimating means, the deviation between the corrected shape measurement data and the shape data based on the designed aspherical surface is minimized. The aspherical expression with the optimum paraxial radius of curvature is automatically estimated. Therefore, it is possible to perform accurate shape evaluation without the need for the input of the measurer and without subjective judgment.
【0009】また、請求項2記載の発明では、前記形状
測定データと最適近軸曲率半径を有する非球面式に基づ
く形状データとの偏差を、低周波成分と高周波成分とに
分離することから、形状誤差成分と表面粗さ成分を分け
て評価でき、評価の精度を高めることができる。According to the second aspect of the present invention, the deviation between the shape measurement data and the shape data based on the aspherical surface having the optimum paraxial radius of curvature is separated into a low frequency component and a high frequency component. The shape error component and the surface roughness component can be evaluated separately, and the evaluation accuracy can be improved.
【0010】[0010]
【実施例】以下、本発明の実施例を図面に基づいて説明
する。図1〜図4は請求項1、2記載の発明に係る非球
面形状の解析評価システムの一実施例を示す図である。
まず、構成を説明する。Embodiments of the present invention will be described below with reference to the drawings. 1 to 4 are views showing an embodiment of the analysis and evaluation system for an aspherical surface according to the invention described in claims 1 and 2.
First, the configuration will be described.
【0011】図1(a)において、10はライン走査型の
形状測定機(例えば公知のフォームタリサーフ)であ
り、形状測定器10は非球面形状を有する被測定物(図示
していない)の形状を測定し、非球面形状評価システム
20にその測定データを送るようになっている。図1
(b)に示すように、非球面形状評価システム20は、デ
ータ取り込み回路21、第1演算回路22、第2演算回路23
および出力装置24を具備しており、データ取り込み回路
21は形状測定器10から送られてきた形状測定データを取
り込み、第1演算手段22との間でデータの授受を行なう
データ取り込み手段となっている。In FIG. 1 (a), 10 is a line-scanning type shape measuring instrument (for example, a well-known foam Talysurf), and the shape measuring instrument 10 is of an object to be measured (not shown) having an aspherical shape. Aspherical shape evaluation system that measures the shape
The measurement data is sent to 20. Figure 1
As shown in (b), the aspherical surface shape evaluation system 20 includes a data acquisition circuit 21, a first arithmetic circuit 22, and a second arithmetic circuit 23.
And a data output circuit 24, and a data acquisition circuit
Reference numeral 21 is a data fetching means for fetching the shape measurement data sent from the shape measuring instrument 10 and exchanging the data with the first computing means 22.
【0012】第1演算回路22および第2演算回路23はマ
イクロコンピュータ等から構成されており、第1演算回
路22はデータ取り込み回路21内のデータから前記非球面
の非球面軸の位置を探索する探索回路、並びに、図2に
αで示す非球面軸の傾きを前記非球面軸に対するデータ
分布の左右対称性から求めてその傾きを補正する補正回
路(両回路により補正手段が構成される)として機能
し、更に、近軸曲率半径Rの最適な非球面式(以下、最
適R非球面式という)を推定する推定回路(推定手段)
として機能するようになっている。The first arithmetic circuit 22 and the second arithmetic circuit 23 are composed of a microcomputer or the like, and the first arithmetic circuit 22 searches the data in the data fetching circuit 21 for the position of the aspherical axis of the aspherical surface. As a search circuit and a correction circuit (correction means is constituted by both circuits) for correcting the inclination by obtaining the inclination of the aspherical axis indicated by α in FIG. 2 from the left-right symmetry of the data distribution with respect to the aspherical axis. An estimation circuit (estimation means) that functions and further estimates an optimum aspherical expression with a paraxial radius of curvature R (hereinafter referred to as optimum R aspherical expression)
It is supposed to function as.
【0013】この第1演算回路22においては、前記補正
回路によって非球面軸の傾きαが補正された時点で図3
に示すような座標系が設定でき、このときのデータが純
粋な被測定物の非球面形状データとなる。また、前記推
定回路は、図4に示すような形状データに基づいて、所
定の設計非球面式(式(1)と同様な非球面式)の係数
(式(1)のR、K、EJ に相当する)の中で近軸曲率半
径Rのみを設計値から変化させていきつつ、その近軸曲
率半径Rを有する非球面式に基づく形状データと前記補
正後の測定データとの偏差が最小となるような近軸曲率
半径R(以下、これを最適近軸曲率半径Rs という)を
自動的に推定することで、最適R非球面式を推定する。
この推定に際しては、最小2乗法、減衰最小2乗法、実
験的回帰分析等の手法が利用できる。In the first arithmetic circuit 22, when the inclination α of the aspherical surface axis is corrected by the correction circuit, as shown in FIG.
The coordinate system as shown in can be set, and the data at this time becomes pure aspherical surface shape data of the measured object. Further, the estimating circuit uses the coefficients (R, K, E of the equation (1)) of a predetermined design aspherical equation (aspherical equation similar to the equation (1)) based on the shape data as shown in FIG. (Corresponding to J ), while changing only the paraxial radius of curvature R from the design value, the deviation between the shape data based on the aspherical expression having the paraxial radius of curvature R and the corrected measured data is The optimum R aspherical expression is estimated by automatically estimating the minimum paraxial radius of curvature R (hereinafter referred to as the optimum paraxial radius of curvature R s ).
For this estimation, a method such as a least square method, a damping least square method, or an experimental regression analysis can be used.
【0014】第2演算回路23は、データ取り込み回路21
に取り込まれた各測定データと最適R非球面式に基づく
形状データとの偏差を算出する算出回路を含むととも
に、その偏差データから移動平均、多項式近似等の手法
で近似曲線を算出する近似曲線算出回路を含んでいる。
図4に示すように、この近似曲線は被測定物の被球面形
状の誤差成分(大きな誤差成分)に対応する偏差データ
の低周波成分を示すもので、その近似曲線と偏差データ
との偏差が被測定物の表面の粗さ成分(小さな誤差成
分)に対応する偏差データの高周波成分となっている。
すなわち、第2演算回路23は形状測定データと最適近軸
曲率半径を有する非球面式に基づく形状データとの偏差
を低周波成分と高周波成分とに分離する分離手段となっ
ている。The second arithmetic circuit 23 is a data fetch circuit 21.
Approximate curve calculation that includes a calculation circuit that calculates a deviation between each measurement data taken in and the shape data based on the optimum R aspherical surface formula, and that calculates an approximate curve from the deviation data by a method such as moving average or polynomial approximation Contains the circuit.
As shown in FIG. 4, this approximate curve shows the low-frequency component of the deviation data corresponding to the error component (large error component) of the spherical surface shape of the object to be measured, and the deviation between the approximation curve and the deviation data is It is a high frequency component of the deviation data corresponding to the surface roughness component (small error component) of the object to be measured.
That is, the second arithmetic circuit 23 serves as a separating means for separating the deviation between the shape measurement data and the shape data based on the aspherical surface having the optimum paraxial radius of curvature into a low frequency component and a high frequency component.
【0015】出力装置24は少なくとも最適R非球面式に
対応する曲線と前記近似曲線との双方を出力する装置と
なっており、近似曲線により非球面形状の誤差を画面表
示又は記録紙にプリントする。なお、形状誤差成分(大
きな誤差成分)の出力のみならず、表面粗さ成分の出力
が可能であることはいうまでもない。次に、作用を説明
する。The output device 24 is a device for outputting at least both the curve corresponding to the optimum R aspherical surface expression and the approximate curve, and the error of the aspherical surface shape is displayed on the screen or printed on the recording paper by the approximated curve. . It goes without saying that not only the shape error component (large error component) but also the surface roughness component can be output. Next, the operation will be described.
【0016】まず、形状測定器10により被測定物の被球
面形状が測定され、その測定データが形状測定器10から
データ取り込み回路21に取り込まれると、第1演算回路
22の探索回路によって、まず、データ取り込み回路21内
の測定データから非球面軸の位置が探索され、次いで、
非球面軸の傾きαが前記非球面軸に対するデータ分布の
左右対称性から求められ、その傾きをゼロとした場合の
値になるよう測定データが補正される。この時点で、図
3に示すような座標系が設定され、被測定物の純粋な非
球面形状データが得られる。First, the shape measuring instrument 10 measures the spherical shape of the object to be measured, and when the measurement data is fetched from the shape measuring instrument 10 into the data fetching circuit 21, the first arithmetic circuit
The 22 search circuit first searches for the position of the aspherical axis from the measurement data in the data acquisition circuit 21, and then
The inclination α of the aspherical surface axis is obtained from the left-right symmetry of the data distribution with respect to the aspherical surface axis, and the measured data is corrected to a value when the inclination is zero. At this point, the coordinate system as shown in FIG. 3 is set, and pure aspherical surface shape data of the measured object is obtained.
【0017】次いで、このような形状データに基づい
て、所定の設計非球面式の複数の係数中で近軸曲率半径
Rのみを設計値から少しずつ変化させながら、最適R非
球面式が推定される。次に、第2演算回路23によって、
データ取り込み回路21に取り込まれた各測定データと最
適R非球面式に基づく形状データとの偏差が算出され、
その偏差データから近似曲線が算出され、更にその近似
曲線と測定データの偏差が算出されることで、被測定物
の非球面形状誤差が自動的に出力装置24により出力され
る。Next, based on such shape data, the optimum R aspherical surface formula is estimated while gradually changing only the paraxial radius of curvature R from the design value among a plurality of coefficients of a predetermined design aspherical surface formula. It Next, by the second arithmetic circuit 23,
The deviation between each measurement data captured by the data capturing circuit 21 and the shape data based on the optimum R aspherical surface formula is calculated,
An approximate curve is calculated from the deviation data, and the deviation between the approximate curve and the measurement data is calculated, so that the output device 24 automatically outputs the aspherical shape error of the object to be measured.
【0018】このように本実施例では、第1演算回路22
によって所定の設計非球面式の係数中で近軸曲率半径R
のみを変化させつつ、形状測定データ(傾きに対する補
正をしたデータ)と設計非球面式に基づく形状データと
の偏差が最小となるように最適R非球面式が自動的に推
定される。したがって、測定者による入力の手間がかか
らないとともに、測定者の主観的判断も入らなくなり、
正確な形状評価のできる解析評価システムとなる。As described above, in this embodiment, the first arithmetic circuit 22
Paraxial radius of curvature R
The optimum R aspherical surface formula is automatically estimated so that the deviation between the shape measurement data (data corrected for inclination) and the shape data based on the design aspherical surface surface is minimized while changing only the above. Therefore, it is not necessary for the measurer to input, and the subjective judgment of the measurer is not included,
It becomes an analysis and evaluation system that enables accurate shape evaluation.
【0019】また、上述のように、形状測定データと最
適近軸曲率半径を有する非球面式に基づく形状データと
の偏差を、低周波成分と高周波成分とに分離するから、
形状誤差成分と表面粗さ成分とを分けて評価することが
でき、従来かなり困難であった非球面形状誤差の評価を
高精度にできる。Further, as described above, since the deviation between the shape measurement data and the shape data based on the aspherical surface having the optimum paraxial radius of curvature is separated into the low frequency component and the high frequency component,
Since the shape error component and the surface roughness component can be separately evaluated, the aspherical surface shape error, which has been considerably difficult in the past, can be evaluated with high accuracy.
【0020】[0020]
【発明の効果】請求項1記載の発明によれば、非球面形
状を測定した形状測定機からデータ取り込み手段に測定
データを取り込み、補正手段により非球面軸の位置と傾
きを求めて測定誤差を補正した後、推定手段により所定
の設計非球面式の係数中で近軸曲率半径のみを変化させ
つつ、前記補正をしたデータと設計非球面式に基づく形
状データとの偏差が最小となるように最適近軸曲率半径
を有する非球面式を自動的に推定するようにしているの
で、測定者の入力の手間をなくすことができるととも
に、主観的判断が入らないようにでき、正確な形状評価
のできる非球面形状の解析評価システムを提供すること
ができる。According to the first aspect of the invention, the measurement data is fetched from the shape measuring machine measuring the aspherical shape into the data fetching means, and the position and inclination of the aspherical surface axis are obtained by the correcting means to eliminate the measurement error. After the correction, the estimating means changes only the paraxial radius of curvature in the coefficient of the predetermined design aspherical expression, and minimizes the deviation between the corrected data and the shape data based on the design aspherical expression. Since the aspherical expression with the optimum paraxial radius of curvature is automatically estimated, it is possible to eliminate the time and effort of the operator's input, as well as to avoid subjective judgment, and to perform accurate shape evaluation. It is possible to provide an analysis / evaluation system of an aspherical shape that can be performed.
【0021】また、請求項2記載の発明によれば、前記
形状測定データと最適近軸曲率半径を有する非球面式に
基づく形状データとの偏差を、低周波成分と高周波成分
とに分離するので、形状誤差成分と表面粗さ成分を分け
て評価でき、評価の精度を高めることができる。According to the second aspect of the present invention, the deviation between the shape measurement data and the shape data based on the aspherical expression having the optimum paraxial curvature radius is separated into a low frequency component and a high frequency component. The shape error component and the surface roughness component can be separately evaluated, and the evaluation accuracy can be improved.
【図1】本発明に係る非球面形状の解析評価システムの
一実施例を示す図で、(a)は全体の概略ブロック図、
(b)はその解析評価システムのブロック図である。FIG. 1 is a diagram showing an embodiment of an analysis and evaluation system for an aspherical shape according to the present invention, in which (a) is an overall schematic block diagram,
(B) is a block diagram of the analysis evaluation system.
【図2】その傾き補正前の形状測定データを示すグラフ
である。FIG. 2 is a graph showing shape measurement data before the inclination correction.
【図3】その傾き補正後の形状測定データを示すグラフ
である。FIG. 3 is a graph showing shape measurement data after the inclination correction.
【図4】最適非球面式に対する測定データの球面成分、
非球面成分および粗さ成分の関係を示す説明図である。FIG. 4 is a spherical component of measurement data for the optimum aspherical expression,
It is explanatory drawing which shows the relationship of an aspherical surface component and a roughness component.
10 形状測定機 20 非球面形状評価システム 21 データ取り込み回路(データ取り込み手段) 22 第1演算回路(補正手段、推定手段) 23 第2演算回路(分離手段) 10 Shape measuring machine 20 Aspherical surface shape evaluation system 21 Data acquisition circuit (data acquisition means) 22 First arithmetic circuit (correction means, estimation means) 23 Second arithmetic circuit (separation means)
Claims (2)
ータに基づいて該非球面形状を解析評価する非球面形状
の解析評価システムであって、 前記形状測定機からの測定データを取り込むデータ取り
込み手段と、 データ取り込み手段に取り込まれた測定データから非球
面軸の位置と傾きを探索し、該非球面軸の位置と傾きに
基づいて測定誤差を補正する補正手段と、 所定の設計非球面式の係数中で近軸曲率半径のみを変化
させ、前記補正手段により補正された形状測定データと
設計非球面式に基づく形状データとの偏差が最小となる
ような最適近軸曲率半径を有する非球面式を自動的に推
定する推定手段と、を備えたことを特徴とする非球面形
状の解析評価システム。1. An aspherical surface shape analysis / evaluation system for analyzing and evaluating the aspherical surface shape based on measurement data of a shape measuring machine for measuring an aspherical surface shape, wherein the data acquisition is for taking in measurement data from the shape measuring machine. Means, a correction means for searching the position and the inclination of the aspherical surface axis from the measurement data taken in by the data acquisition means, and correcting the measurement error based on the position and the inclination of the aspherical surface axis, An aspherical surface formula having an optimum paraxial radius of curvature such that only the paraxial radius of curvature is changed in the coefficient and the deviation between the shape measurement data corrected by the correction means and the shape data based on the design aspherical surface formula is minimized. An aspherical surface shape analyzing and evaluating system, which comprises:
有する非球面式に基づく形状データとの偏差を低周波成
分と高周波成分とに分離する分離手段を設けたことを特
徴とする請求項1記載の非球面形状の解析評価システ
ム。2. A separating means for separating a deviation between the shape measurement data and the shape data based on an aspherical surface having an optimum paraxial radius of curvature into a low frequency component and a high frequency component. 1. The analysis and evaluation system of aspherical shape according to 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27471992A JP3321210B2 (en) | 1992-10-14 | 1992-10-14 | Analysis and evaluation system for aspherical shapes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27471992A JP3321210B2 (en) | 1992-10-14 | 1992-10-14 | Analysis and evaluation system for aspherical shapes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06129944A true JPH06129944A (en) | 1994-05-13 |
| JP3321210B2 JP3321210B2 (en) | 2002-09-03 |
Family
ID=17545622
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27471992A Expired - Lifetime JP3321210B2 (en) | 1992-10-14 | 1992-10-14 | Analysis and evaluation system for aspherical shapes |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3321210B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010210289A (en) * | 2009-03-06 | 2010-09-24 | Olympus Corp | Machine and method for measuring surface shape, and method of analyzing surface shape measurement value |
| JP2011085765A (en) * | 2009-10-15 | 2011-04-28 | Sharp Corp | Lens, lens array, and lens evaluation device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7236693B2 (en) | 2005-03-22 | 2007-06-26 | Globaltec Fireplaces, Inc. | Flame simulator for use in an electric heater |
| JP5281918B2 (en) * | 2009-02-19 | 2013-09-04 | オリンパス株式会社 | Surface shape measuring machine, surface shape measuring method, and method of analyzing surface shape measurement value |
-
1992
- 1992-10-14 JP JP27471992A patent/JP3321210B2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010210289A (en) * | 2009-03-06 | 2010-09-24 | Olympus Corp | Machine and method for measuring surface shape, and method of analyzing surface shape measurement value |
| JP2011085765A (en) * | 2009-10-15 | 2011-04-28 | Sharp Corp | Lens, lens array, and lens evaluation device |
| CN102043175A (en) * | 2009-10-15 | 2011-05-04 | 夏普株式会社 | Lens, lens array and lens evaluation device |
| TWI424198B (en) * | 2009-10-15 | 2014-01-21 | Sharp Kk | Lens, lens array, and lens evaluation device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3321210B2 (en) | 2002-09-03 |
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