JPH06138096A - Eddy current flaw detection probe and flaw detection method using the probe - Google Patents

Eddy current flaw detection probe and flaw detection method using the probe

Info

Publication number
JPH06138096A
JPH06138096A JP4312927A JP31292792A JPH06138096A JP H06138096 A JPH06138096 A JP H06138096A JP 4312927 A JP4312927 A JP 4312927A JP 31292792 A JP31292792 A JP 31292792A JP H06138096 A JPH06138096 A JP H06138096A
Authority
JP
Japan
Prior art keywords
probe
flaw detection
eddy current
magnetic field
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4312927A
Other languages
Japanese (ja)
Inventor
Yasutada Kishi
泰忠 貴志
Akitoshi Kato
晃敏 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GENSHIRYOKU ENJINIRIANGU KK
Original Assignee
GENSHIRYOKU ENJINIRIANGU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GENSHIRYOKU ENJINIRIANGU KK filed Critical GENSHIRYOKU ENJINIRIANGU KK
Priority to JP4312927A priority Critical patent/JPH06138096A/en
Publication of JPH06138096A publication Critical patent/JPH06138096A/en
Pending legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/30Nuclear fission reactors

Landscapes

  • Monitoring And Testing Of Nuclear Reactors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

(57)【要約】 【目的】 内挿型渦流探傷プローブにおいて、金属管等
におけるクラック等を、その方向や長短にかかわらず、
高感度かつ高速にて探傷し、しかも螺旋状に探傷するに
も回転機構も要さず、プローブをコンパクトかつ簡略に
構成して、曲管部への挿入性、耐久性、保守性を良好な
らしめる。 【構成】 プローブ1を周方向に略等分する複数の軸断
面上に、これら各断面と略平行に巻回した複数のコイル
9a,9b,9cを配設せしめた内挿型渦電流プローブ
を用い、上記各コイル9a,9b,9cに夫々、隣合う
ものから順次位相を遅らせて交流電流を流し、被検査物
に周方向に回転する半径方向の磁界を発生させ、かつこ
の磁界により上記被検査物の周面に生じる渦電流を検知
する。
(57) [Summary] [Purpose] In an insertion type eddy current flaw detection probe, regardless of the direction or length of cracks in metal pipes, etc.
Highly sensitive and high-speed flaw detection, and even a spiral flaw detection does not require a rotating mechanism, the probe is compact and simple, and if it is easy to insert into curved pipes, durable, and maintainable. Close. [Structure] An insertion type eddy current probe in which a plurality of coils 9a, 9b, 9c wound substantially parallel to the respective cross-sections of the probe 1 are arranged on a plurality of axial cross-sections that are equally divided in the circumferential direction. Using the coils 9a, 9b, 9c, an alternating current is applied to each of the coils 9a, 9b, 9c in order from the adjacent ones so that a radial magnetic field rotating in the circumferential direction is generated on the object to be inspected. The eddy current generated on the peripheral surface of the inspection object is detected.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は原子力発電所の熱交換器
の金属細管等において、管に発生したクラック等を検出
するための渦電流探傷プローブと、該プローブを用いた
探傷方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an eddy current flaw detection probe for detecting cracks or the like in a metal thin tube of a heat exchanger of a nuclear power plant, and a flaw detection method using the probe. is there.

【0002】[0002]

【従来の技術】熱交換器の細管のように、金属管の外側
からの接近が難しい場合には、プローブを金属管の中に
挿入して探傷するが、そのための内挿型プローブとして
最も汎用的なプローブは、高速探傷が可能で、曲管部へ
の挿入性も良いボビン型プローブである。このボビンコ
イル型プローブは、リード線を円筒状プローブの周方向
に巻回してコイルを形成しているため、渦電流は金属管
の周方向に流れる。即ち、渦電流探傷においては、プロ
ーブ内のコイルにより誘起された金属管内の渦電流が該
管の欠陥によって乱されることにより該欠陥を検出する
ものであるが、上記プローブでは金属管のクラック等の
欠陥が該管の周方向に存在した場合、クラックの方向が
前記渦電流の流れの方向と平行になるため、該渦電流は
ほとんど乱れず、探傷感度が低いという問題がある。
2. Description of the Related Art When it is difficult to approach a metal tube from the outside like a thin tube of a heat exchanger, a probe is inserted into the metal tube for flaw detection. The conventional probe is a bobbin type probe that enables high-speed flaw detection and has good insertability into a curved pipe section. In this bobbin coil type probe, since the lead wire is wound in the circumferential direction of the cylindrical probe to form a coil, the eddy current flows in the circumferential direction of the metal tube. That is, in eddy current flaw detection, an eddy current in a metal tube induced by a coil in the probe is disturbed by a defect in the tube to detect the defect. When the defect (1) exists in the circumferential direction of the tube, the crack direction becomes parallel to the flow direction of the eddy current, so that the eddy current is hardly disturbed and there is a problem that the flaw detection sensitivity is low.

【0003】一方、周方向に並んだ複数(多くの場合8
個)のパンケーキコイル(表面コイルともいう)を有す
るマルチコイル型プローブもある。このプローブの上記
パンケーキコイルによる渦電流は、金属管の比較的狭い
範囲ではあるが、管の径方向を対称軸として流れるた
め、周方向のクラックに対し交差して流れる部分があ
り、この点においては前記したボビンコイル型プローブ
に比し探傷感度が高いとの利点がある。
On the other hand, a plurality (in many cases 8
There is also a multi-coil type probe having (an) pancake coil (also referred to as a surface coil). The eddy current due to the pancake coil of this probe is in a relatively narrow range of the metal tube, but since it flows with the tube radial direction as the axis of symmetry, there is a portion that intersects with the circumferential cracks. In the above, there is an advantage that the flaw detection sensitivity is higher than that of the bobbin coil type probe described above.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記プ
ローブのパンケーキコイルによる渦電流は、コイルの中
心部で強く、中心部から離れる程弱くなるため、コイル
とコイルの中間部付近で感度が低下し、この中間部内に
存するような長さの短いクラックの探傷には適さないと
いう問題点を有している。また、1〜3個程度のパンケ
ーキコイルを管壁に密着させ、プローブを回転させなが
ら螺旋状に走査を行う回転コイル型プローブもあるが、
このプローブにおいても、回転機構を有するために構造
が大型かつ複雑になり、曲管部への挿入性や耐久性、保
守性等に問題がある。
However, the eddy current due to the pancake coil of the above probe is strong at the center of the coil and becomes weaker as it goes away from the center, so the sensitivity decreases near the coil and the middle of the coil. However, there is a problem that it is not suitable for flaw detection of a crack having a short length existing in the intermediate portion. Also, there is a rotating coil type probe in which about 1 to 3 pancake coils are closely attached to the tube wall and scanning is performed in a spiral shape while rotating the probe.
Also in this probe, since it has a rotating mechanism, the structure becomes large and complicated, and there is a problem in insertability into the curved tube portion, durability, maintainability, and the like.

【0005】本発明は叙上の如き実状に対処してなされ
たものであり、金属管等におけるクラック等の欠陥をそ
の方向あるいは長短にかかわらず、感度を高くして、し
かも高速にて探傷検知することができ、かつその構造も
簡単で曲管部への挿入性や耐久性、保守性にも優れた渦
電流探傷プローブを提供することを目的とするものであ
る。
The present invention has been made in view of the above-mentioned actual situation, and detects defects such as cracks in a metal pipe or the like at high speed and with high sensitivity regardless of the direction or length of the defect. It is an object of the present invention to provide an eddy current flaw detection probe that can be manufactured, has a simple structure, and is excellent in insertability into a curved tube portion, durability, and maintainability.

【0006】[0006]

【課題を解決するための手段】即ち、上記目的に適合す
る本発明渦電流探傷プローブの特徴は、金属管等に挿入
される筒状または柱状の内挿型渦電流探傷プローブにお
いて、プローブの中心軸を含み、かつ該プローブを周方
向に略等分する複数の軸断面上に、上記プローブの両側
近傍を通り、かつ上記各断面と夫々略平行に巻回した複
数のコイルを配設せしめたところにある。また、本発明
の渦電流探傷方法は、上記本発明の渦電流探傷プローブ
を用い、上記各コイルに夫々、隣合うものから順次位相
を遅らせて交流電流を流し、上記プローブを挿入した被
検査物に周方向に回転する半径方向の磁界を発生させ、
かつ該磁界により上記被検査物の周面に生じる渦電流
を、上記各コイルまたは他のコイルにて検知することを
特徴とする。
That is, the feature of the eddy current flaw detection probe of the present invention which meets the above-mentioned object is that the center of the probe is used in a cylindrical or columnar insertion type eddy current flaw detection probe inserted into a metal tube or the like. On a plurality of axial cross-sections including a shaft and dividing the probe into substantially equal parts in the circumferential direction, a plurality of coils passing near both sides of the probe and wound substantially parallel to the respective cross-sections were arranged. Where it is. Further, the eddy current flaw detection method of the present invention uses the eddy current flaw detection probe of the present invention, in which an alternating current is applied to each of the coils with a phase delay from adjacent ones, and the probe is inserted. Generates a radial magnetic field that rotates in the circumferential direction,
An eddy current generated on the peripheral surface of the object to be inspected by the magnetic field is detected by each of the coils or another coil.

【0007】[0007]

【作用】上記本発明の渦電流探傷プローブ、またはこれ
を用いた本発明探傷方法においては、プローブ自体は回
転させることなく、磁界を回転させて螺旋状に走査が行
えることから、プローブが大型化することがなく、曲管
部等への挿入性、耐久性、及び保守性が良好に保たれ
る。そして、上記走査は、上記磁界により被検査物の周
面に生じる渦電流を検知するものであるため、クラック
等が周方向、軸方向の何れに生じていても、感度を高く
して探傷することが可能であり、しかも、上記渦電流は
回転する磁界と共に発生するため、従来のマルチコイル
型プローブのような感度の劣る領域もない。また、上記
磁界を回転させる走査は、例えば1kHzの交流電流で探
傷すれば、1000rpsの磁界回転数も得られるもの
であり、これによって、従来の回転コイル型プローブに
比し、数百倍の高速検査が可能となる。
In the eddy current flaw detection probe of the present invention or the flaw detection method of the present invention using the same, since the magnetic field can be rotated and spiral scanning can be performed without rotating the probe itself, the probe becomes large. Therefore, the insertability into the curved pipe portion, the durability, and the maintainability are kept good. Since the scanning detects the eddy current generated on the peripheral surface of the object to be inspected by the magnetic field, regardless of whether the crack or the like is generated in the circumferential direction or the axial direction, the sensitivity is increased to detect flaws. In addition, since the eddy current is generated together with the rotating magnetic field, there is no region of poor sensitivity as in the conventional multi-coil type probe. Further, in the scanning for rotating the magnetic field, a magnetic field rotation speed of 1000 rps can be obtained by flaw detection with an alternating current of 1 kHz, for example, which is several hundred times faster than the conventional rotating coil type probe. Inspection is possible.

【0008】[0008]

【実施例】以下、さらに添付図面を参照して、本発明の
実施例を説明する。図1は本発明実施例の渦電流探傷プ
ローブを示す正面図であり、図において、(1)は円筒
状のプローブ本体、(2)は挿入性を向上させる円すい
状ガイド、(3)はセンタリング用ブラシ(板ばねでも
良い)、(4)はコイルアッセンブリ、(5)はリード
線、(6)はこのリード線を保護するフレキシブルチュ
ーブを夫々示している。そして、本発明では上記プロー
ブにおいて、図2に示すように、プローブ(1)の中心
軸(A)を含み、かつ該プローブ(1)を周方向に60
°ずつ6等分する3つの軸断面(7a),(7b),
(7c)上に、図3あるいは図4(イ),(ロ)に示す
如く、前記コイルアッセンブリン(4)において他部よ
り太く形成されたプローブの両側(8),(8)を通
り、かつ上記各断面(7a),(7b),(7c)と略
平行に巻回した3つのコイル(9a),(9b),(9
c)を配設した構成を設けている。各コイル(9a),
(9b),(9c)は夫々、交流電流を位相を遅らせ
て、順次隣合うコイルに送る発振器(図示せず)に接続
されている。即ち、この実施例においては、上記各コイ
ル(9a),(9b),(9c)は、励磁用と検出用と
を夫々兼ねている。
Embodiments of the present invention will be described below with reference to the accompanying drawings. FIG. 1 is a front view showing an eddy current flaw detection probe of an embodiment of the present invention. In the figure, (1) is a cylindrical probe body, (2) is a conical guide for improving insertability, and (3) is centering. Brush (may be a leaf spring), (4) shows a coil assembly, (5) shows a lead wire, and (6) shows a flexible tube for protecting the lead wire. In the present invention, the probe includes the central axis (A) of the probe (1) as shown in FIG.
Three axial sections (7a), (7b), which are equally divided into 6 by °
As shown in FIG. 3 or FIG. 4 (a), (b), on (7c), passing through both sides (8), (8) of the probe formed thicker than the other part in the coil assembly (4), And three coils (9a), (9b), (9) wound substantially parallel to the above-mentioned cross sections (7a), (7b), (7c).
c) is provided. Each coil (9a),
Each of (9b) and (9c) is connected to an oscillator (not shown) that delays the phase of the alternating current and sends it to the adjacent coils in sequence. That is, in this embodiment, each of the coils (9a), (9b), (9c) serves both for excitation and for detection.

【0009】また、図5に示すものは、本発明第2実施
例の渦電流探傷プローブであり、上記第1実施例の構成
に加え、コイルアッセンブリン(4)において、前記コ
イル(9a),(9b),(9c)を励磁専用として設
けると共に、その後方に検出用のボビンコイル(10)
を併設した構成を有している。
FIG. 5 shows an eddy current flaw detection probe according to the second embodiment of the present invention. In addition to the structure of the first embodiment, in addition to the coil assembly (4), the coil (9a), (9b) and (9c) are provided exclusively for excitation, and a bobbin coil (10) for detection is provided behind them.
It has a configuration in which

【0010】一方、本発明の渦流探傷方法は、上記の如
きプローブを用い、上記各コイル(9a),(9b),
(9c)に夫々、隣合うものから順次、前記発振器(図
示せず)によって交流電流を、2π/3ずつ位相を遅らせ
て流し、図8,図9に示すように、プローブを挿入した
導体の被検査物(K)に周方向に回転する半径方向の磁
界(H1 ) 〜(Hx )を発生させ、さらに図9に示すよ
うに、この磁界(H1) 〜(Hx )により上記被検査物
(K)の周面に渦電流(11)を発生させて、この渦電
流(11)を、上記各コイル(9a)〜(9c)あるい
はボビンコイル(10)にて検知するものである。
On the other hand, the eddy current flaw detection method of the present invention uses the probe as described above and uses the coils (9a), (9b),
In (9c), alternating currents are sequentially passed from the adjacent ones by the oscillator (not shown) with a phase delay of 2π / 3, and as shown in FIG. 8 and FIG. Radial magnetic fields (H 1 ) to (H x ) that rotate in the circumferential direction are generated on the inspection object (K), and as shown in FIG. 9, the magnetic fields (H 1 ) to (H x ) cause An eddy current (11) is generated on the peripheral surface of the inspection object (K), and the eddy current (11) is detected by the coils (9a) to (9c) or the bobbin coil (10). .

【0011】これを図4,図6〜図9を参照して詳しく
は説明する。図4において、コイル(9a)にI=I0
sin ωtで表される交流電流を流すと、コイル(9a)
の中心には、図6に示すように矢印(B)方向にH1
0sin ωtで表される磁界が生じる。ここで、H0
定数、ωは交流電流の角速度、tは時間である。
This will be described in detail with reference to FIGS. 4 and 6-9. In FIG. 4, I = I 0 is applied to the coil (9a).
When an alternating current represented by sin ωt is applied, the coil (9a)
At the center of the arrow, as shown in FIG. 6, H 1 = in the direction of the arrow (B).
A magnetic field represented by H 0 sin ωt is generated. Here, H 0 is a constant, ω is the angular velocity of the alternating current, and t is time.

【0012】ここで、B−B方向をx軸、B−B方向と
A−A方向とに夫々直交する方向をy軸にあてはめると
すると、磁界(H1 ) の方向は、図6に示すようにx軸
方向となる。
Assuming that the BB direction is applied to the x axis and the directions orthogonal to the BB direction and the AA direction are applied to the y axis, the direction of the magnetic field (H 1 ) is shown in FIG. Thus, the x-axis direction is set.

【0013】次に、図4に示すコイル(9b)とコイル
(9c)に夫々、コイル(9a)と同じ大きさで、かつ
位相が夫々120°(2π/3) 、240°(4π/3) 遅れた
電流を流すと、コイル(9b)にはH2 =H0 sin (ω
t−2π/3)、コイル(9c)にはH3 =H0 sin (ω
t−4π/3)で表される磁界が発生し、上記磁界
(H2 ),(H3 ) は、図7に示すように、前記した磁界
(H1 ) の向きであるx軸と、夫々120°,240°
を成す方向に発生する。
Next, the coil (9b) and the coil (9c) shown in FIG. 4 have the same size as the coil (9a) and the phases thereof are 120 ° (2π / 3) and 240 ° (4π / 3), respectively. ) When a delayed current is passed, H 2 = H 0 sin (ω
t-2π / 3), and H 3 = H 0 sin (ω) in the coil (9c).
A magnetic field represented by t-4π / 3) is generated, and the magnetic fields (H 2 ), (H 3 ) are, as shown in FIG. 7, the x-axis which is the direction of the magnetic field (H 1 ) and 120 ° and 240 ° respectively
Occurs in the direction of.

【0014】上記磁界(H1 ),(H2 ),(H3 ) を夫
々、x成分、y成分に分割し、添字x,yを付けて表す
と、下記数1に示す如く、 以下余白
When the above magnetic fields (H 1 ), (H 2 ), and (H 3 ) are divided into x component and y component, respectively, and the suffixes x and y are added, the margins are as shown below.

【0015】[0015]

【数1】 となり、結局、3個の磁界を合成して、コイルアッセン
ブリによる磁界を求めると、下記数2に示す如く、
[Equation 1] Finally, when three magnetic fields are combined and the magnetic field due to the coil assembly is obtained, as shown in Equation 2 below,

【0016】[0016]

【数2】 となる。この両式と、sin ωt 2 +cos ωt 2 =1の式
とにより、下記数3に示す如く、
[Equation 2] Becomes From both equations and the equation of sin ωt 2 + cos ωt 2 = 1 as shown in the following Equation 3,

【0017】[0017]

【数3】 となり、磁界の向きは図8に示すように、1秒間に、下
記数4、
[Equation 3] And the direction of the magnetic field is as shown in FIG.

【0018】[0018]

【数4】 の回転数で回転し、その大きさは、下記数5、[Equation 4] It rotates at the number of rotations of

【0019】[0019]

【数5】 の通りである。上述の設定状態のコイルアッセンブリを
図9に示すように、導体である管(K)に挿入すると、
管の内部には、同図に示すように、円周上を磁界(H)
の向きの回転に応じて移動する渦電流が発生し、これを
検知することで探傷が可能となる。
[Equation 5] Is the street. When the coil assembly in the above-mentioned set state is inserted into the tube (K) which is a conductor as shown in FIG. 9,
Inside the tube, as shown in the figure, a magnetic field (H) is generated on the circumference.
An eddy current that moves according to the rotation of the direction is generated, and flaw detection is possible by detecting this.

【0020】しかして、上記本発明の探傷プローブある
いはこれを用いた探傷方法にあっては、プローブ自体は
回転させることなく、磁界(H1 ) 〜(Hx )を回転さ
せることにより螺旋状に走査が行えるものであり、回転
機構を不要にしてプローブの大型化を防ぎ、曲管部等へ
の良好な挿入性、耐久性、及び保守性を保持することが
可能である。しかも、上記磁界の回転による走査は、従
来の回転コイル型プローブが4〜6rps程度であるの
に対し、1kHzの交流電流で探傷すれば1000rps
の回転数を得ることができ、これにより上記回転コイル
型プローブの数百倍の高速検査が可能である。
In the flaw detection probe of the present invention or the flaw detection method using the same, however, the magnetic field (H 1 ) to (H x ) is rotated without rotating the probe itself to form a spiral shape. Since the scanning can be performed, it is possible to prevent the probe from increasing in size by eliminating the need for a rotation mechanism, and to maintain good insertability into a curved pipe section, durability, and maintainability. In addition, the scanning by the rotation of the magnetic field is about 4 to 6 rps in the conventional rotating coil type probe, but 1000 rps is detected if the flaw is detected with an alternating current of 1 kHz
It is possible to obtain the number of rotations of the rotary coil type probe, which enables high-speed inspection several hundred times that of the rotary coil type probe.

【0021】また、本発明の渦流探傷プローブでは、上
述のように従来のボビンコイル型プローブと同等以上の
高速検査が可能であるばかりでなく、探傷は、被検査物
の周面に生じる渦電流を検知するものであるため、クラ
ック等の欠陥が、周方向、軸方向の何れであっても高感
度な探傷が行え、しかも、上記渦電流は回転する磁界と
共に発生するため、従来のマルチコイル型プローブのよ
うな感度の劣る領域もなく、詳細な検査にも適してい
る。
Further, the eddy current flaw detection probe of the present invention not only enables high-speed inspection equal to or higher than that of the conventional bobbin coil type probe as described above, but the flaw detection also detects eddy currents generated on the peripheral surface of the object to be inspected. Since it is for detection, defects such as cracks can be detected with high sensitivity regardless of whether it is in the circumferential direction or the axial direction, and the eddy current is generated together with the rotating magnetic field. It is also suitable for detailed inspections, as it does not have a region with low sensitivity like a probe.

【0022】従って、本発明の渦電流探傷プローブは、
多数の管体の全長、全数の詳細検査が高速で行えるもの
であり、原子炉の熱交換器等、多数の配管の保守検査に
最適である。
Therefore, the eddy current flaw detection probe of the present invention is
It is capable of performing detailed inspections of the total length and length of many pipes at high speed, and is ideal for maintenance inspection of many pipes such as heat exchangers of nuclear reactors.

【0023】以上、本発明の実施例について説明した
が、前記したコイルは、同様な回転磁場が得られるので
あれば、例えば2個、あるいは4個以上でもよく、ま
た、コイルの形状は必ずしも円状に巻回する必要はな
い。さらに、前記ボビンコイルの配置は、渦電流を検知
できる範囲であれば、前述の位置には限定されず、ま
た、ガイドの形状等、プローブを構成する各種部品の形
状、数量、相対配置等は、本発明の要旨を逸脱しない範
囲において、適宜変更が可能である。
Although the embodiments of the present invention have been described above, the number of the coils may be two or four or more as long as the same rotating magnetic field can be obtained, and the shape of the coil is not necessarily circular. It does not need to be wound into a shape. Further, the arrangement of the bobbin coil is not limited to the above-mentioned position as long as it can detect the eddy current, and the shape, the quantity, the relative arrangement, etc. of various parts constituting the probe, such as the shape of the guide, Various changes can be made without departing from the scope of the present invention.

【0024】[0024]

【発明の効果】以上説明したように、本発明は、プロー
ブを周方向に略等分する複数の軸断面上に、これら各断
面と略平行に巻回した複数のコイルを配設せしめた内挿
型渦電流探傷プローブを用い、上記各コイルに夫々、隣
合うものから順次位相を遅らせて交流電流を流し、被検
査物に周方向に回転する半径方向の磁界を発生させ、か
つこの磁界により上記被検査物の周面に生じる渦電流を
検知するものであり、プローブ自体は回転させることな
く、磁界を回転させることにより螺旋状に走査を行い、
これによって、回転機構を不要にしてプローブの大型化
を防ぎ、曲管部等への良好な挿入性、または耐久性、及
び保守性を保持することが可能である。しかも、上記磁
界の回転による走査は、1kHzの交流電流で探傷すれば
1000rpsの回転数を得ることができ、これにより
従来の回転コイル型プローブの数百倍の高速検査が可能
である。
As described above, according to the present invention, a plurality of coils wound substantially parallel to the respective axial cross sections that divide the probe into substantially equal parts in the circumferential direction are arranged. Using an insertion type eddy current flaw detection probe, an alternating current is applied to each of the above coils in order to gradually delay the phase from the adjacent ones to generate a radial magnetic field rotating in the circumferential direction on the object to be inspected. The eddy current generated on the peripheral surface of the object to be inspected is detected, and the probe itself does not rotate, but the magnetic field is rotated to perform a spiral scan,
As a result, it is possible to prevent the probe from increasing in size by eliminating the need for a rotating mechanism, and to maintain good insertability into a curved pipe section or the like, durability, and maintainability. Moreover, the scanning by the rotation of the magnetic field described above can obtain a rotation speed of 1000 rps by detecting flaws with an alternating current of 1 kHz, which enables high-speed inspection several hundred times that of the conventional rotary coil type probe.

【0025】また、本発明の渦流探傷プローブでは、探
傷は、被検査物の周面に生じる渦電流を検知するもので
あるため、クラック等の欠陥が、周方向、軸方向の何れ
であっても高感度な探傷が行え、しかも、上記渦電流は
回転する磁界と共に発生するため、従来のマルチコイル
型プローブのような感度の劣る領域もなく、詳細な検査
にも適している。
Further, in the eddy current flaw detection probe of the present invention, since flaw detection detects an eddy current generated on the peripheral surface of the object to be inspected, defects such as cracks are present in either the circumferential direction or the axial direction. Since it is possible to perform flaw detection with high sensitivity, and since the eddy current is generated together with the rotating magnetic field, it is suitable for detailed inspection without the area of poor sensitivity as in the conventional multi-coil type probe.

【0026】即ち、本発明の渦電流プローブは、多数の
管体の全長、全数の詳細検査が高速で行えるものであ
り、原子炉の熱交換器等、多数の配管の保守検査に最も
適しているといえる。
That is, the eddy current probe of the present invention is capable of performing a detailed inspection of the total length and the total number of many pipes at high speed, and is most suitable for the maintenance inspection of many pipes such as a heat exchanger of a nuclear reactor. Can be said to be.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例の渦電流探傷プローブを示す正面
図である。
FIG. 1 is a front view showing an eddy current flaw detection probe according to an embodiment of the present invention.

【図2】同実施例の軸断面を示す説明図である。FIG. 2 is an explanatory view showing an axial cross section of the embodiment.

【図3】同実施例のコイルを示す説明図である。FIG. 3 is an explanatory diagram showing a coil of the example.

【図4】(イ)同実施例のコイルをプローブの軸方向か
ら見た示す説明図である。 (ロ)同コイルをプローブの軸直角方向から見た説明図
である。
FIG. 4 (a) is an explanatory view showing the coil of the embodiment as seen from the axial direction of the probe. (B) It is explanatory drawing which looked at the same coil from the direction orthogonal to the axis of a probe.

【図5】本発明第2実施例の渦電流探傷用プローブを示
す正面図である。
FIG. 5 is a front view showing an eddy current flaw detection probe according to a second embodiment of the present invention.

【図6】磁界の回転についての説明図である(斜視
図)。
FIG. 6 is an explanatory view of rotation of a magnetic field (perspective view).

【図7】磁界の回転についての説明図である。FIG. 7 is an explanatory diagram of rotation of a magnetic field.

【図8】磁界の回転についての説明図である。FIG. 8 is an explanatory diagram of rotation of a magnetic field.

【図9】被検査物と磁界、ならびに磁界による渦電流を
示す説明図である。
FIG. 9 is an explanatory diagram showing an object to be inspected, a magnetic field, and an eddy current caused by the magnetic field.

【符号の説明】[Explanation of symbols]

(1) プローブ本体 (2) ガイド (3) センタリング用ブラシ (4) コイルアッセンブリ (5) リード線 (6) フレキシブルチューブ (7a) プローブの軸断面 (7b) プローブの軸断面 (7c) プローブの軸断面 (8) プローブの両側部 (9a) コイル (9b) コイル (9c) コイル (10) ボビンコイル (11) 渦電流 (H1 ) 〜(Hx )磁界 (A) プローブの中心軸(1) Probe body (2) Guide (3) Centering brush (4) Coil assembly (5) Lead wire (6) Flexible tube (7a) Probe axial section (7b) Probe axial section (7c) Probe axis Section (8) Both sides of probe (9a) Coil (9b) Coil (9c) Coil (10) Bobbin coil (11) Eddy current (H 1 ) to (H x ) magnetic field (A) Central axis of probe

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 金属管等に挿入される筒状または柱状の
内挿型渦電流探傷プローブにおいて、プローブの中心軸
を含み、かつ該プローブを周方向に略等分する複数の軸
断面上に、上記プローブの両側近傍を通り、かつ上記各
断面と夫々略平行に巻回した複数のコイルを配設せしめ
たことを特徴とする渦電流探傷プローブ。
1. A cylindrical or columnar insertion type eddy current flaw detection probe to be inserted into a metal tube or the like, on a plurality of axial cross-sections including a central axis of the probe and dividing the probe into substantially equal portions in the circumferential direction. An eddy current flaw detection probe characterized in that a plurality of coils wound around both sides of the probe and wound substantially parallel to the respective cross-sections are arranged.
【請求項2】 筒状または柱状プローブの中心軸を含
み、かつ該プローブを周方向に略等分する複数の軸断面
上に、上記プローブの両側近傍を通り、かつ上記各断面
と夫々略平行に巻回した複数のコイルを配設せしめた内
挿型渦電流探傷プローブを用い、上記各コイルに夫々、
隣合うものから順次位相を遅らせて交流電流を流し、上
記プローブを挿入した被検査物に周方向に回転する半径
方向の磁界を発生させ、かつ該磁界により上記被検査物
の周面に生じる渦電流を、上記各コイルまたは他のコイ
ルにて検知することを特徴とする渦電流探傷方法。
2. A plurality of axial cross sections including a central axis of a cylindrical or columnar probe and dividing the probe into substantially equal parts in the circumferential direction, passing near both sides of the probe and being substantially parallel to the respective cross sections. Using an insertion type eddy current flaw detection probe having a plurality of coils wound around
An alternating current is made to flow from one next to the other by sequentially delaying the phase to generate a radial magnetic field that rotates in the circumferential direction on the inspection object with the probe inserted, and the vortex is generated on the peripheral surface of the inspection object by the magnetic field. An eddy current flaw detection method, wherein an electric current is detected by each of the above coils or another coil.
JP4312927A 1992-10-27 1992-10-27 Eddy current flaw detection probe and flaw detection method using the probe Pending JPH06138096A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4312927A JPH06138096A (en) 1992-10-27 1992-10-27 Eddy current flaw detection probe and flaw detection method using the probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4312927A JPH06138096A (en) 1992-10-27 1992-10-27 Eddy current flaw detection probe and flaw detection method using the probe

Publications (1)

Publication Number Publication Date
JPH06138096A true JPH06138096A (en) 1994-05-20

Family

ID=18035151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4312927A Pending JPH06138096A (en) 1992-10-27 1992-10-27 Eddy current flaw detection probe and flaw detection method using the probe

Country Status (1)

Country Link
JP (1) JPH06138096A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100395205B1 (en) * 2001-06-01 2003-08-21 사단법인 고등기술연구원 연구조합 Internal metal pipe inspection apparatus having centralizer
JP2009198213A (en) * 2008-02-19 2009-09-03 Toshiba Corp Eddy current flaw detecting probe, eddy current flaw detecting device, and eddy current flaw detection method
DE102011104293B4 (en) 2010-07-30 2021-10-07 Olympus Ndt Inc. Orthogonal eddy current probe for testing in multiple directions

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100395205B1 (en) * 2001-06-01 2003-08-21 사단법인 고등기술연구원 연구조합 Internal metal pipe inspection apparatus having centralizer
JP2009198213A (en) * 2008-02-19 2009-09-03 Toshiba Corp Eddy current flaw detecting probe, eddy current flaw detecting device, and eddy current flaw detection method
DE102011104293B4 (en) 2010-07-30 2021-10-07 Olympus Ndt Inc. Orthogonal eddy current probe for testing in multiple directions

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