JPH06231442A - Thin film magnetic disk and manufacturing method thereof - Google Patents

Thin film magnetic disk and manufacturing method thereof

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Publication number
JPH06231442A
JPH06231442A JP5014492A JP1449293A JPH06231442A JP H06231442 A JPH06231442 A JP H06231442A JP 5014492 A JP5014492 A JP 5014492A JP 1449293 A JP1449293 A JP 1449293A JP H06231442 A JPH06231442 A JP H06231442A
Authority
JP
Japan
Prior art keywords
magnetic disk
film
substrate
treatment
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5014492A
Other languages
Japanese (ja)
Inventor
Mitsuyoshi Otake
光義 大竹
Masahiro Watanabe
正博 渡辺
Takao Nakamura
孝雄 中村
Jiyun Fumioka
順 文岡
Noriyuki Takeo
典幸 武尾
Kenji Furusawa
賢司 古澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5014492A priority Critical patent/JPH06231442A/en
Publication of JPH06231442A publication Critical patent/JPH06231442A/en
Pending legal-status Critical Current

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  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To eliminate burrs and projections of a disk and to easily clean the disk after treatment by removing grooves formed by texturing of the surface of a Ni-P substrate and specifying the surface roughness of the plate CONSTITUTION:An aluminum substrate 1 (a) is used as a disk substrate, on which a Ni-P plating film 2 is formed to 10-30mum thickness by electroless plating (b). The surface of the plating film 2 is polished with a processing liquid containing an abrasive powder (c), and then cleaned to remove residual matter (d). Then the surface is treated with a surface treating liquid and treating cloth in the circumferencial direction (e). The residue after the treatment is washed out (f), and then a Cr base layer 3, Co magnetic film 4, and C protective film 5 of specified thickness are successively formed on the surface of the substrate 8 by sputtering (g). Further, dust or projections produced in this film forming process are treated with a surface processing machine using only a tape (h). No processing liquid is used. Then the surface is controlled by exposing to an atmosphere of satd. vapor pressure (i) so that a lubricant film can be easily adhered to the surface. A lubricant 6 is applied (j) and the disk is subjected to finish inspection (k). Since no burr or projection is produced in the process of surface treatment (e) or in other processes, nor abrasive powder is used, good cleaning can be easily done after treatment.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電子計算機やワークステ
ーション等の外部記憶装置として用いられている薄膜磁
気ディスク及びその製造方法に係り、特にヘッド浮上や
磁気特性に優れた磁性媒体に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thin film magnetic disk used as an external storage device such as a computer and a workstation, and a method for manufacturing the same, and more particularly to a magnetic medium excellent in head flying and magnetic characteristics.

【0002】[0002]

【従来の技術】磁気ディスク等の磁気記録技術を利用し
た記憶装置は、計算機やワークステーション等の外部記
憶装置として広く用いられており、近年の情報量の増大
に伴って益々大容量のものが要求されている。一方、装
置自身の形状は、より小型、軽量のものが望まれてお
り、これらを両立させるには記録媒体の飛躍的な記録密
度向上が不可欠となっている。これを実現するために表
面に磁性媒体を連続的に付けて作製する磁気ディスクの
開発が進められている。その方法として、アルミ合金
にNi−Pメッキした基板にCo系磁性膜をメッキ法で
付ける方法、Cr下地膜、Co系磁性膜、C保護膜を
スパッタにより成膜する方法、アルミ合金にアルマイ
ト処理し、ガンマ酸化鉄をスパッタにより成膜する方
法、が主流となっている。これらの膜構成は、クリーン
テクノロジーシンポジュウム(1988)でも述べてい
る。しかし、この薄膜磁気ディスクはこれら媒体を平ら
な面に成膜しただけでは円周方向に磁気異方性が付かな
いため、次の加工が行われている。
2. Description of the Related Art Storage devices utilizing magnetic recording technology, such as magnetic disks, are widely used as external storage devices such as computers and workstations. Is required. On the other hand, the shape of the apparatus itself is desired to be smaller and lighter, and in order to achieve both of them, it is essential to dramatically improve the recording density of the recording medium. In order to realize this, development of a magnetic disk in which a magnetic medium is continuously attached to the surface of the magnetic disk is under development. As the method, a Co-based magnetic film is applied to a Ni-P plated aluminum alloy substrate by a plating method, a Cr underlayer film, a Co-based magnetic film, a C protective film is formed by sputtering, and an aluminum alloy is anodized. However, a method of forming a film of gamma iron oxide by sputtering is the mainstream. These membrane configurations are also described in Clean Technology Symposium (1988). However, since the thin film magnetic disk does not have magnetic anisotropy in the circumferential direction only by depositing these media on a flat surface, the following processing is performed.

【0003】磁性膜形成前に磁気ディスクの基板面、あ
るいは基板表面に予め下地膜として設けられた例えばN
i−Pメッキ上を、図8の一部破断面斜視図に示すよう
に、磁気ディスク媒体の円周方向に、ほぼ同心円状に加
工痕を付ける加工(以下テクスチャ加工と略す)が行わ
れている。
Prior to the formation of the magnetic film, a substrate surface of the magnetic disk or an N film which is previously provided as a base film on the substrate surface is used.
As shown in the partially broken perspective view of FIG. 8, the i-P plating is subjected to a process (hereinafter abbreviated as texturing) for making processing marks in a substantially concentric shape in the circumferential direction of the magnetic disk medium. There is.

【0004】テクスチャ加工は、その利点として(1)
磁気ディスクの停止時に磁気ヘッドと磁気ディスク媒体
との間の吸着現象を軽減する効果、(2)加工表面上に
成膜される磁性膜に形状異方性を持たせることにより、
円周方向に磁気特性を均一化させる効果などを有する。
Texturing is one of its advantages (1)
The effect of reducing the adsorption phenomenon between the magnetic head and the magnetic disk medium when the magnetic disk is stopped, and (2) by giving shape anisotropy to the magnetic film formed on the processed surface,
It has the effect of making the magnetic characteristics uniform in the circumferential direction.

【0005】しかし、他方ではダイヤモンドやアルミナ
等の砥粒を使って加工するため、表面にバリや突起等が
発生しやすく、これがもとでヘッドの浮上特性や磁性媒
体の結晶成長が不均一となり、記録密度向上が期待でき
ないと云う難点があった。
On the other hand, however, since abrasive grains such as diamond and alumina are used for processing, burrs and protrusions are likely to occur on the surface, which causes non-uniform flying characteristics of the head and crystal growth of the magnetic medium. However, there is a problem that it cannot be expected to improve the recording density.

【0006】なお、この種のテクスチャ加工に関連する
ものとして、例えば特開昭63−42027、特開昭6
3−249933、特開昭63−42019、特開昭6
2−262227等の公報が挙げられる。
Note that, as a technique related to this type of texture processing, for example, Japanese Patent Laid-Open Nos. 63-42027 and 6-SHO6.
3-249933, JP-A-63-42019, JP-A-6-63
2-262227 etc. are mentioned.

【0007】[0007]

【発明が解決しようとする課題】したがって、本発明は
上記のような現状に鑑みてなされたものであり、その目
的とするところは従来のテクスチャ加工技術の問題を解
消することにあり、ヘッドの浮上特性を損なわず、且
つ、磁気特性を向上させることのできる改良された基板
の表面処理を有する薄膜磁気ディスク及びその製造方法
を提供することにある。
Therefore, the present invention has been made in view of the above situation, and an object of the present invention is to solve the problem of the conventional texture processing technique. It is an object of the present invention to provide a thin film magnetic disk having an improved surface treatment of a substrate that can improve the magnetic characteristics without impairing the flying characteristics, and a method for manufacturing the same.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
に本発明では、Ni−Pメッキした基板表面を境面研磨
し、後に円周方向に表面処理することを特徴とする。さ
らに具体的に説明すれば上記目的は、磁性媒体を支える
Ni−Pメッキ基板上に、下地膜、磁性膜、保護膜、潤
滑膜を順次成膜する工程を有する薄膜磁気ディスクの製
造方法において、前記Ni−Pメッキ基板をダイヤモン
ド砥粒を使い凹凸やうねりを取り除き、次いで境面研磨
したNi−P基板表面を、砥粒の無い表面処理液と表面
処理テープ又は表面処理シートで円周方向に擦る工程を
付加して成る薄膜磁気ディスクの製造方法により達成さ
れる。
In order to achieve the above object, the present invention is characterized in that the surface of a Ni-P plated substrate is subjected to boundary polishing and then subjected to a circumferential surface treatment. More specifically, the above object is to provide a method for manufacturing a thin film magnetic disk including a step of sequentially forming a base film, a magnetic film, a protective film, and a lubricating film on a Ni-P plated substrate supporting a magnetic medium, The Ni-P-plated substrate was subjected to removal of irregularities and undulations using diamond abrasive grains, and then the surface of the Ni-P substrate which was subjected to boundary polishing was circumferentially treated with an abrasive-free surface treatment liquid and a surface treatment tape or surface treatment sheet. This is achieved by a method of manufacturing a thin film magnetic disk which is formed by adding a rubbing step.

【0009】表面処理液としてはアルコール類、もしく
は界面活性剤等の親水性の処理液を主成分とするものが
良く、これらはそれぞれ単独でも両者を混合して併用し
ても良い。アルコール類としては、例えばエチレングリ
コール、プロピレングリコール、ポリエチレングリコー
ル、ポリプロピレングリコール、グリセリン等の多価ア
ルコール系、もしくは適度な粘性を持つ高級アルコール
が挙げられる。界面活性剤としては、例えばポリオキシ
エチレン系の非イオン界面活性剤などを主成分とするも
のが良く、エッチング作用を有するもの、例えばEDT
A(エチレンジアミン4酢酸2ナトリウム)のようなキ
レート剤を添加したものを使用すると表面処理の効果が
更に良くなり好ましい。同様にエチレングリコール等の
アルコール類の処理液についても、エッチング作用を有
する成分を添加することは有効である。また、表面処理
テープ又はシートについては、例えばナイロンの如き脂
肪族ポリアミド、ポリエステル、セルロース等の合成繊
維を使用することが好ましい。更に、Ni−P表面を擦
る際の押し付け圧は、1〜20kg/cm2が好ましい。
As the surface treatment liquid, those containing alcohol or a hydrophilic treatment liquid such as a surfactant as a main component are preferable, and these may be used alone or in combination of both. Examples of alcohols include polyhydric alcohols such as ethylene glycol, propylene glycol, polyethylene glycol, polypropylene glycol, and glycerin, or higher alcohols having an appropriate viscosity. As the surfactant, for example, one containing a polyoxyethylene-based nonionic surfactant as a main component is preferable, and one having an etching action, for example, EDT
It is preferable to use a compound to which a chelating agent such as A (ethylenediaminetetraacetic acid disodium salt) is added, because the effect of the surface treatment is further improved. Similarly, it is effective to add a component having an etching action to a treatment liquid of alcohols such as ethylene glycol. For the surface-treated tape or sheet, it is preferable to use synthetic fibers such as aliphatic polyamide such as nylon, polyester, cellulose and the like. Further, the pressing pressure when rubbing the Ni-P surface is preferably 1 to 20 kg / cm 2 .

【0010】[0010]

【作用】境面研磨後の基板表面は、マクロ的には平らな
表面でも、ミクロ的にはランダムな加工痕が残ってい
る。このため、この基板上に磁性媒体を成膜しても磁気
異方性は得られない。そこで、プレーン基板に表面処理
液を付けてテープ又はシートで円周方向に擦り、ランダ
ムな加工痕を小さくしてより平滑で平面な表面にすると
共に、擦った方向に矯正する。ここでの矯正は、処理前
の極表面の原子はランダムであるが、円周方向に擦るこ
とで擦った方向に規則性を持って再配列する。この場
合、円周方向に磁気異方性が表れる原子の再配列状態が
得られる。このように、円周方向に表面処理をすること
で、この上に成膜される磁性体には円周方向に磁気異方
性が現れ、また、テクスチャ加工のような砥粒による切
削等で発生するバリや突起は全く発生しないためヘッド
の浮上特性が向上する。
Function The surface of the substrate after the boundary polishing has a flat surface macroscopically, but microscopically random processing marks remain. Therefore, magnetic anisotropy cannot be obtained even if a magnetic medium is formed on this substrate. Therefore, the surface treatment liquid is applied to the plain substrate and rubbed in a circumferential direction with a tape or a sheet to reduce random processing marks to form a smoother and flat surface, and to correct the rubbed direction. In the correction here, the atoms on the pole surface before the treatment are random, but they are rearranged by rubbing in the circumferential direction with regularity in the rubbing direction. In this case, a rearranged state of atoms having magnetic anisotropy in the circumferential direction can be obtained. In this way, by performing a surface treatment in the circumferential direction, magnetic anisotropy appears in the circumferential direction in the magnetic substance formed on the surface, and by cutting with abrasive grains such as texturing. Since no burrs or protrusions are generated, the flying characteristics of the head are improved.

【0011】また、テクスチャ加工のように砥粒を使っ
て表面に十数nm以上の加工溝を付けないため、切削等
で発生するバリや突起は全く発生しない。このためヘッ
ドの浮上特性を向上する。
Further, unlike the texture processing, since abrasive grains are not used to form a processing groove of more than ten and several nm on the surface, burrs and protrusions generated by cutting or the like are not generated at all. Therefore, the flying characteristics of the head are improved.

【0012】[0012]

【実施例】以下、本発明の一実施例を図面を用いて説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

【0013】図1は、本発明の薄膜磁気ディスクの膜構
成を示し、図2はその製造プロセスの一例を示す工程
図、図3、図4、図5、図6は表面処理を実現する装置
を模式的に示す斜視図、図7は本発明の製造プロセスで
作製した基板の磁気特性、図8は従来の薄膜磁気ディス
クの膜構成図、図9は実施例3の薄膜磁気ディスクの構
成図を示し、図10は保護膜に凹凸を付ける工程図を示
す。
FIG. 1 shows a film structure of a thin film magnetic disk of the present invention, FIG. 2 is a process diagram showing an example of its manufacturing process, and FIGS. 3, 4, 5, and 6 are devices for realizing surface treatment. FIG. 7 is a schematic perspective view, FIG. 7 is a magnetic characteristic of the substrate manufactured by the manufacturing process of the present invention, FIG. 8 is a film configuration diagram of a conventional thin film magnetic disk, and FIG. 9 is a configuration diagram of the thin film magnetic disk of Example 3. FIG. 10 shows a process drawing for making unevenness on the protective film.

【0014】〈実施例1〉図1は本発明の薄膜磁気ディ
スクの構造を示す。従来のスパッタ磁気ディスクは図8
に示すように、Ni−Pメッキ膜と下地膜の間にテクス
チャ加工してあるために、保護膜上での表面も下からの
形状がそのまま上に現れている。また、テクスチャ加工
をしているため、所々にバリや突起が現れる。本発明で
は、テクスチャ加工をしないため、図1に示すように、
理想的に近い表面の平らな形状が得られる。次に、磁気
ディスクの構造とそれぞれの役割について詳細に説明す
る。
Example 1 FIG. 1 shows the structure of a thin film magnetic disk of the present invention. A conventional sputter magnetic disk is shown in FIG.
As shown in (1), since the Ni-P plating film and the base film are texture-processed, the shape on the surface of the protective film from the bottom appears as it is. Also, since it is textured, burrs and protrusions appear in places. In the present invention, since no texture processing is performed, as shown in FIG.
A near-ideal surface flat shape is obtained. Next, the structure of the magnetic disk and the role of each will be described in detail.

【0015】本発明の薄膜磁気ディスクの構成は、図1
に示すように磁性媒体を支えるアルミ合金基板1、基板
に適度な固さを持たせるためのNi−Pメッキ下地膜
2、磁性媒体の磁気異方性を付けるための下地膜3、磁
性膜4、磁性膜が磁気ヘッドとの摺動から保護するため
の保護膜5、摩耗係数を小さくするための潤滑膜で構成
する。但し、本実施例では図1のNi−Pメッキ下地膜
2にはテクスチャ加工を施さない。
The structure of the thin film magnetic disk of the present invention is shown in FIG.
As shown in FIG. 3, an aluminum alloy substrate 1 for supporting the magnetic medium, a Ni—P plated underlayer film 2 for giving the substrate an appropriate hardness, an underlayer film 3 for imparting magnetic anisotropy of the magnetic medium, and a magnetic film 4. The magnetic film is composed of a protective film 5 for protecting the magnetic head from sliding with respect to the magnetic head, and a lubricating film for reducing the wear coefficient. However, in this embodiment, the Ni—P plating base film 2 of FIG. 1 is not textured.

【0016】(製造方法)次に、本発明の薄膜磁気ディ
スクの製造方法を図2の工程図に従って説明する。
(Manufacturing Method) Next, a method of manufacturing the thin film magnetic disk of the present invention will be described with reference to the process chart of FIG.

【0017】工程(a)でディスク基板としてアルミ基
板1を準備する。
In step (a), an aluminum substrate 1 is prepared as a disc substrate.

【0018】工程(b)で基板1に無電解メッキ法によ
りNi−Pメッキ2を10〜30μm付ける。
In step (b), the Ni-P plating 2 is applied to the substrate 1 by electroless plating to a thickness of 10 to 30 μm.

【0019】工程(c)でNi−Pメッキ2の表面を砥
粒等を含む加工液を用いて境面研磨する。
In step (c), the surface of the Ni-P plating 2 is surface-polished using a working liquid containing abrasive grains and the like.

【0020】工程(d)で基板表面に付着した砥粒、研
磨粉や加工液等の加工残渣物を洗浄する。
In step (d), processing residues such as abrasive grains, polishing powder and processing liquid attached to the substrate surface are washed.

【0021】工程(e)で表面処理液と処理布で円周方
向に表面処理する。この表面処理方法が本発明の特徴点
であり、後で詳細に述べる。
In the step (e), the surface is treated in the circumferential direction with the surface treatment liquid and the treated cloth. This surface treatment method is a feature of the present invention and will be described in detail later.

【0022】工程(f)で表面処理後に付着している処
理残渣物を洗浄する。
In step (f), the treatment residue attached after the surface treatment is washed.

【0023】工程(g)で基板8の表面上にスパッタ方
法により所定の厚みのCr下地膜3、Co磁性膜4、C
保護膜5を順次成膜する。
In step (g), a Cr underlayer 3, Co magnetic layer 4, C having a predetermined thickness are formed on the surface of the substrate 8 by a sputtering method.
The protective film 5 is sequentially formed.

【0024】工程(h)で成膜時に発生したゴミや突起
等を取るために、図3、図4の表面加工装置を用いて、
テープだけで表面加工処理を行う。この場合、処理液は
使用しない。
In order to remove dust, projections, etc. generated during the film formation in the step (h), the surface processing apparatus shown in FIGS. 3 and 4 is used.
Surface treatment is done only with tape. In this case, the processing liquid is not used.

【0025】工程(i)で表面に潤滑膜が付きやすいよ
うに飽和水蒸気圧の雰囲気にさらす等の表面調整を行
う。
In step (i), surface adjustment such as exposure to an atmosphere of saturated water vapor pressure is carried out so that a lubricating film is easily attached to the surface.

【0026】工程(j)で潤滑剤6を塗布する。In step (j), the lubricant 6 is applied.

【0027】工程(k)で最後の検査をする。A final inspection is performed in step (k).

【0028】次に、本発明の最も特徴のある工程(e)
の表面処理について二つの方法を説明する。
Next, the most characteristic step (e) of the present invention
Two methods for the surface treatment will be described.

【0029】(処理方法1)表面処理の一方法として図
3(a),(b)に示すように、処理テープをコンタク
トローラー10で押し付けながら基板を回転させ表面を
擦る処理をする。処理液の供給方法は(a)の様に、基
板と処理テープの間に処理液を滴下したり、(b)の様
に基板に処理液をスプレーで吹き付けたりする。また、
この処理を(c)の様に処理液の中で行うことも考えら
れる。
(Treatment Method 1) As one method of surface treatment, as shown in FIGS. 3A and 3B, the substrate is rotated by pressing the treatment tape with the contact roller 10 to rub the surface. As for the method of supplying the treatment liquid, the treatment liquid is dropped between the substrate and the treatment tape as shown in (a), or the treatment liquid is sprayed onto the substrate as shown in (b). Also,
It is also conceivable to carry out this treatment in the treatment liquid as in (c).

【0030】両面処理の場合は(a)と同じ機構の処理
装置を裏面に設置すれば良い。
In the case of double-sided processing, a processing device having the same mechanism as in (a) may be installed on the back surface.

【0031】コンタクトローラ10は基板8の半径より
小さい巾、半径と同じ巾、基板の直径と同じ巾の何方の
巾でも良い。但し、この場合、処理テープ9の巾は、ロ
ーラの巾と同じ、又はこれ以上のものを使用する必要が
ある。コンタクトローラと処理テープを揺動することで
基板表面を均一に処理することができる。
The contact roller 10 may have a width smaller than the radius of the substrate 8, the same width as the radius, or the same width as the diameter of the substrate. However, in this case, the width of the processing tape 9 needs to be the same as or wider than the width of the roller. The substrate surface can be uniformly processed by swinging the contact roller and the processing tape.

【0032】テープの押し付け圧はローラの巾や材質、
固さ等で変わるが、本実験では、例えば45mm巾のポ
リウレタン系のφ20mmのローラを使用した場合、
2.5kgfで行った。この場合の押し付け圧は最低1
kgfは必要である。また、ディスクの回転数は100
〜1000rpmの範囲で良いが、本実験では600r
pmとした。
The pressing pressure of the tape depends on the width and material of the roller,
In this experiment, for example, when a polyurethane-based φ20 mm roller having a width of 45 mm is used, it changes depending on hardness and the like.
It was performed at 2.5 kgf. The pressing pressure in this case is at least 1
kgf is required. The rotation speed of the disc is 100.
The range is up to 1000 rpm, but in this experiment 600r
pm.

【0033】処理テープはナイロン、ポリエステル、セ
ルロース等のプラスチィック繊維であれば良い。
The treatment tape may be a plastic fiber such as nylon, polyester or cellulose.

【0034】(処理方法2)図5(a),(b)は処理
シートを用いた表面処理方法を示す。(a)は、基板8
を保持した定板11に、上から処理シート12を貼り付
けた処理円板13を押し付けながら回転させたり、逆に
(b)の様に処理シート12を貼り付た処理円板13
に、基板8を保持した定板11を押し付けながら回転さ
せて表面処理を行う。また、(a),(b)を組み合わ
せ、図6(c)の様に基板固定治具14に基板8を固定
し両面同時に処理する方法も考えられる。
(Processing Method 2) FIGS. 5A and 5B show a surface processing method using a processing sheet. (A) shows the substrate 8
The processing disc 13 having the treatment sheet 12 attached thereto is rotated while being pressed against the fixed plate 11 holding the treatment disc, or conversely, the treatment disc 13 having the treatment sheet 12 attached thereto as shown in (b).
Then, the surface treatment is performed by rotating the pressing plate 11 holding the substrate 8 while pressing it. Further, a method of combining (a) and (b) and fixing the substrate 8 to the substrate fixing jig 14 as shown in FIG.

【0035】処理シートは当然基板より大きくする必要
がある。加工液は図6(d)に示すように処理シート1
2を貼り付けた処理円板13の中央に穴を空け、そこか
ら供給するか、図4の(c)と同様に処理部全体を処理
液に浸して行うようにしても良い。
The processing sheet naturally needs to be larger than the substrate. The processing liquid is the processing sheet 1 as shown in FIG.
It is also possible to make a hole in the center of the processing disk 13 to which 2 is attached and to supply from there, or to immerse the entire processing section in the processing liquid as in the case of FIG. 4C.

【0036】処理シートの材質、基板又は処理円板の回
転数は当然、処理方法1と同じで良い。但し、押し付け
圧は1kgf/cm2以上は必要である。
The material of the processing sheet and the rotation speed of the substrate or the processing disc may be the same as those in the processing method 1. However, the pressing pressure must be 1 kgf / cm 2 or more.

【0037】処理方法2は処理方法1に比べ基板全面を
一度に処理でき、また、構造が簡単であるため、大量処
理が可能となる。
The treatment method 2 can treat the entire surface of the substrate at once as compared with the treatment method 1, and since the structure is simple, a large amount of treatment can be performed.

【0038】以上の表面処理により、加工痕やバリ、突
起等が無く、また表面粗さは2nmRa以下とすること
でヘッド浮上量0.1μm以下が可能となる。
By the above surface treatment, there are no processing marks, burrs, protrusions and the like, and the surface roughness is 2 nmRa or less, so that the head flying height can be 0.1 μm or less.

【0039】(処理液)以上、表面処理の方法について
説明したが、次に処理液について説明する。
(Treatment Liquid) The method of surface treatment has been described above. Next, the treatment liquid will be described.

【0040】表面処理は基板と処理テープの滑り状態と
基板表面への処理効果を付けるため、親水性の処理液が
良い。例えば、処理液の主成分としてエチレングリコー
ル、ポリエチレングリコール、プロピレングリコール、
ポリプロピレングリコール、グリセリン等の多価アルコ
ール系、又、適度な粘性を持つ高級アルコール、更に界
面活性剤等が使用できる。界面活性剤の主成分はポリオ
キシエチレン系の非イオン界面活性剤等が良い。界面活
性剤の場合、エッチング作用のあるものを使用すること
により、表面処理の効果は更に良くなる。同様にエチレ
ングリコール等の他の処理液についても、エッチング作
用のある液を添加するだけで表面処理効果は更に良くな
る。エッチング作用のある液としては、例えばEDTA
(エチレンジアミン4酢酸2ナトリウム)のようなキレ
ート剤を添加したものを使用しても良い。但し、この場
合の処理液はアルカリ性でなければエッチング効果は現
れない。表面処理後の濯ぎを兼ねた洗浄を考えると界面
活性剤を使用する方がプロセスは簡単に済む。
In the surface treatment, a hydrophilic treatment liquid is preferable because it gives a sliding state between the substrate and the treatment tape and a treatment effect on the substrate surface. For example, as the main component of the treatment liquid, ethylene glycol, polyethylene glycol, propylene glycol,
Polyhydric alcohols such as polypropylene glycol and glycerin, higher alcohols having appropriate viscosity, and surfactants can be used. The main component of the surfactant is preferably a polyoxyethylene-based nonionic surfactant or the like. In the case of a surfactant, the effect of the surface treatment is further improved by using one having an etching action. Similarly, for other treatment liquids such as ethylene glycol, the surface treatment effect is further improved by adding a liquid having an etching action. As the liquid having an etching action, for example, EDTA
You may use what added the chelating agent like (ethylenediamine tetraacetic acid disodium). However, the etching effect does not appear unless the treatment liquid in this case is alkaline. Considering the cleaning that also serves as rinsing after the surface treatment, the process is easier when the surfactant is used.

【0041】こうして得られた基板は、この上に成膜す
るCr下地膜、Co磁性膜の結晶配向を高め、磁気特性
の良い薄膜磁気ディスクが得られる。
The substrate thus obtained enhances the crystal orientation of the Cr underlayer film and the Co magnetic film formed on the substrate, and a thin film magnetic disk having good magnetic characteristics can be obtained.

【0042】次に、本発明した基板の磁気特性について
説明する。
Next, the magnetic characteristics of the substrate of the present invention will be described.

【0043】図7は、工程(e)で表面処理した基板8
に、工程(g)でCr下地膜、Co磁性膜、C保護膜を
スパッタ方法で成膜した磁気ディスクについて、磁気異
方性を測定した結果を示したものである。縦軸には円周
方向の保磁力Hc(θ)と半径方向の保磁力Hc(R)
の比を示した。Hc(θ/R)が1の場合、磁気異方性
は無く、この値が大きい方が磁気異方性が付いており磁
気特性がよいことを示す。その結果、本実施例の表面処
理をすることにより、比較のために作製した未処理(プ
レーン基板)基板と比べ、磁気異方性が格段に付いてい
ることが判る。なお、本実施例による表面処理Aは処理
液の主成分にプロピレングリコールを使用した場合、同
じく表面処理Bの処理液はポリオキシエチレン系の界面
活性剤が主成分の洗剤を使用した場合をそれぞれ示して
いる。
FIG. 7 shows the substrate 8 surface-treated in the step (e).
9 shows the results of measuring the magnetic anisotropy of the magnetic disk having the Cr underlayer film, the Co magnetic film, and the C protective film formed by the sputtering method in the step (g). The vertical axis represents the coercive force Hc (θ) in the circumferential direction and the coercive force Hc (R) in the radial direction.
The ratio of When Hc (θ / R) is 1, there is no magnetic anisotropy, and the larger this value is, the more magnetic anisotropy is and the better the magnetic properties are. As a result, it can be seen that the surface treatment of this example has markedly higher magnetic anisotropy than the untreated (plain substrate) substrate prepared for comparison. The surface treatment A according to the present example uses propylene glycol as a main component of the treatment liquid, and the treatment liquid of surface treatment B also uses a detergent containing a polyoxyethylene-based surfactant as a main component. Shows.

【0044】〈実施例2〉従来のテクスチャ加工はダイ
ヤモンドやアルミナ等の砥粒を使って加工するため基板
表面にバリや突起等が発生し易く、これがもとで磁気ヘ
ッドの浮上特性や磁気媒体の結晶成長が不均一となり、
保磁力等の磁気特性に向上が期待出来なかったが、この
様な場合にでもテクスチャ加工後に本発明の表面処理工
程を採用すれば、表面状態が改質され磁気特性の向上が
見られる。即ち、この実施例は、実施例1の工程(e)
に2段階の処理を行うものであり、初めに周知の手法で
Ni−Pメッキ2の表面をテクスチャ加工し、次いで実
施例1の工程(e)と同様の表面処理を行う。
<Embodiment 2> Since conventional texturing is performed by using abrasive grains such as diamond and alumina, burrs and protrusions are apt to occur on the substrate surface, which causes the levitation characteristics of the magnetic head and the magnetic medium. Crystal growth becomes uneven,
Although improvement in magnetic properties such as coercive force could not be expected, even in such a case, if the surface treatment step of the present invention is adopted after texture processing, the surface condition is modified and the magnetic properties are improved. That is, this example is the same as the step (e) of Example 1.
The surface of the Ni-P plating 2 is textured by a well-known method, and then the same surface treatment as the step (e) of Example 1 is performed.

【0045】〈実施例3〉実施例1ではより平坦な表面
の構造をしているが、ヘッドが安定に浮上したり停止し
たりするためには適度な表面粗さが必要である。これ
は、静止状態の平らな表面に平らな物を乗せた場合、空
気中からの水分等が接触面に凝集し、それが元でその物
体は吸着現象を起こすためである。従来はテクスチャ加
工で表面に円周方向に小さな溝を作り、ヘッドと基板の
粘着を防止していた。しかし、テクスチャ加工ではバリ
や突起等が発生し、この凸部とヘッドが衝突しヘッドク
ラッシュを起こす問題もあり、表面の粗さをコントロー
ルすることが難しい。そこで、実施例1のヘッドと基板
の粘着を防止するために高さをコントロールした凹凸を
保護膜に付けることで対応する。
<Embodiment 3> In Embodiment 1, the structure of a flatter surface is used, but an appropriate surface roughness is required for the head to stably fly and stop. This is because when a flat object is placed on a flat surface in a stationary state, moisture or the like from the air agglomerates on the contact surface, which causes the object to cause an adsorption phenomenon. In the past, texture processing was used to make small grooves in the circumferential direction on the surface to prevent adhesion between the head and the substrate. However, there is a problem that burrs, protrusions, and the like are generated in the texturing, and the head collides with the protrusion and the head crashes, and it is difficult to control the surface roughness. Therefore, in order to prevent the adhesion between the head and the substrate in the first embodiment, the height is controlled to form unevenness on the protective film.

【0046】図9の(a)は実施例3の凹凸の高さをコ
ントロールした基板の断面構造を示す。C保護膜の形状
以外は実施例1の構造と同じである。即ち、C保護膜5
の表面は小さな凹凸が無数に点在させておき、平らなヘ
ッドでも吸着現象を起こさないようにしてある。凸の形
状は(b)に示すように円周上、又はら線状、円の中心
から円の外側方向に放射状に付けても良く、更に(c)
に示すような小さな点状の凸でも良い。ここで必要なこ
とは、凸の丘の面積をヘッドの面積より小さくすること
である。高さはヘッドと保護膜の摺動による摩耗から考
えると高い方が良いが、記録密度を上げるためにはこの
高さは小さくする方が良く、これらの兼ね合いから2〜
100nmが良い。
FIG. 9A shows the sectional structure of the substrate of Example 3 in which the height of the irregularities is controlled. The structure is the same as that of Example 1 except the shape of the C protective film. That is, C protective film 5
There are countless small irregularities scattered on the surface of so as to prevent the adsorption phenomenon even with a flat head. The convex shape may be on the circumference of the circle as shown in (b), or may be a radial shape, or may be radially attached from the center of the circle to the outside of the circle.
It may be a small dot-shaped convex as shown in. What is needed here is to make the area of the convex hill smaller than the area of the head. The height is preferably high considering the wear caused by the sliding of the head and the protective film, but it is better to reduce the height in order to increase the recording density.
100 nm is good.

【0047】凹凸の付ける方法としては、実施例1の工
程図2の工程(g)まで作製した基板を工程図10の
(a)に示すようにレジストを付け、ホトリソグラフィ
ーにより凹凸を付ける方法、又は、工程図(b)に示す
ように微粒子等を保護膜の付いた基板に均一に付け、そ
の粒子をマスクに酸素プラズマや紫外線とオゾンのエッ
チング作用等により凹凸を付ける方法でも良い。プロセ
スの簡素化のためには(b)が望ましい。
As the method of forming the unevenness, a method is used in which the substrate manufactured up to the step (g) of the process drawing of Example 1 is provided with a resist as shown in FIG. Alternatively, as shown in the process diagram (b), fine particles or the like may be uniformly applied to a substrate provided with a protective film, and the particles may be used as a mask to make unevenness by an etching action of oxygen plasma or ultraviolet rays and ozone. (B) is desirable for simplification of the process.

【0048】以上本発明の薄膜磁気ディスクを使うこと
で高記録密度の磁気ディスク装置が実現出来る。
As described above, by using the thin film magnetic disk of the present invention, a magnetic disk device having a high recording density can be realized.

【0049】[0049]

【発明の効果】以上説明したように本発明によれば、テ
クスチャ加工のように砥粒を使って加工をしないので、
基板表面に対しては処理液と処理テープで擦るだけの表
面処理のため、何れも従来の問題点を解消することがで
き、所期の目的を達成することができた。すなわち、
(1)バリや突起が発生しない(2)砥粒を使わないの
で処理後の洗浄性が良い、(3)砥粒等の研磨粉を含む
加工液を使わないで表面処理だけで済むため、処理後の
洗浄が簡素になり、(4)磁気異方性が付くと共にヘッ
ドの浮上特性が向上する効果がある。
As described above, according to the present invention, since abrasive grains are not used for processing unlike texture processing,
Since the surface treatment of the substrate surface was simply performed by rubbing it with the treatment liquid and the treatment tape, the conventional problems could be solved and the intended purpose could be achieved. That is,
(1) No burrs or protrusions are generated (2) Abrasive grains are not used, resulting in good cleanability after treatment. (3) Only surface treatment is required without using a machining liquid containing abrasive powder such as abrasive grains. Cleaning after the treatment is simplified, and (4) magnetic anisotropy is added, and the flying characteristics of the head are improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1の薄膜磁気ディスクの構造を
示す一部破断斜視図である。
FIG. 1 is a partially cutaway perspective view showing a structure of a thin film magnetic disk according to a first embodiment of the present invention.

【図2】同じく実施例1の薄膜磁気ディスクの製造工程
図である。
FIG. 2 is a manufacturing process diagram of the thin-film magnetic disk of the first embodiment as well.

【図3】同じく表面処理方法を実現する装置例1を模式
的に示した斜視図である。
FIG. 3 is a perspective view schematically showing an example 1 of an apparatus that also realizes the surface treatment method.

【図4】同じく表面処理方法を実現する装置例1を模式
的に示した斜視図である。
FIG. 4 is a perspective view schematically showing an example 1 of an apparatus that also realizes the surface treatment method.

【図5】同じく表面処理方法を実現する装置例2を模式
的に示した斜視図である。
FIG. 5 is a perspective view schematically showing an example 2 of an apparatus that also realizes the surface treatment method.

【図6】同じく表面処理方法を実現する装置例2を模式
的に示した斜視図である。
FIG. 6 is a perspective view schematically showing an example 2 of an apparatus that also realizes the surface treatment method.

【図7】磁気特性として円周方向(θ)と半径方向
(R)保磁力比Hc(θ/R)を示した特性図である。
FIG. 7 is a characteristic diagram showing the magnetic coercive force ratio Hc (θ / R) in the circumferential direction (θ) and the radial direction (R) as magnetic characteristics.

【図8】従来の薄膜磁気ディスクの構造を示す一部破断
斜視図である。
FIG. 8 is a partially cutaway perspective view showing the structure of a conventional thin film magnetic disk.

【図9】本発明の実施例3の薄膜磁気ディスクの構造を
示す断面及び斜視図である。
9A and 9B are a cross-sectional view and a perspective view showing the structure of a thin film magnetic disk of Example 3 of the present invention.

【図10】同じく実施例3の保護膜に凹凸を付ける工程
図である。
FIG. 10 is a process drawing of similarly forming irregularities on the protective film of Example 3.

【符号の説明】[Explanation of symbols]

1…アルミ基板、 2…Ni−P下地膜、 3…下地膜、 4…磁性膜、 5…保護膜、 6…潤滑膜、 7…処理液、 8…Ni−P基板、 9…処理テープ、 10…コンタクトローラー、 11…定板、 12…処理シート、 13…処理円板、 14…基板固定治具。 DESCRIPTION OF SYMBOLS 1 ... Aluminum substrate, 2 ... Ni-P base film, 3 ... Base film, 4 ... Magnetic film, 5 ... Protective film, 6 ... Lubrication film, 7 ... Treatment liquid, 8 ... Ni-P substrate, 9 ... Treatment tape, 10 ... Contact roller, 11 ... Fixed plate, 12 ... Treatment sheet, 13 ... Treatment disc, 14 ... Substrate fixing jig.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 文岡 順 神奈川県小田原市国府津2880番地株式会社 日立製作所ストレージシステム事業部内 (72)発明者 武尾 典幸 神奈川県小田原市国府津2880番地株式会社 日立製作所ストレージシステム事業部内 (72)発明者 古澤 賢司 神奈川県横浜市戸塚区吉田町292番地株式 会社日立製作所生産技術研究所内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Jun Fumioka 2880 Kozu, Odawara, Kanagawa Hitachi Storage Systems Division (72) Inventor Noriyuki Takeo 2880 Kozu, Odawara, Kanagawa Hitachi Storage Systems Co., Ltd. (72) Inventor Kenji Furusawa, 292 Yoshida-cho, Totsuka-ku, Yokohama-shi, Kanagawa Stock Engineering Institute, Hitachi, Ltd.

Claims (13)

【特許請求の範囲】[Claims] 【請求項1】磁性媒体を支えるNi−Pメッキ基板の上
に、下地膜、磁性膜、保護膜、潤滑膜を順次成膜する薄
膜磁気ディスクにおいて、Ni−P基板表面にテクスチ
ャ加工溝が無く、表面の粗さが2nmRa以下の平面で
あることを特徴とする薄膜磁気ディスク。
1. A thin-film magnetic disk in which a base film, a magnetic film, a protective film, and a lubricating film are sequentially formed on a Ni-P plated substrate that supports a magnetic medium, and there is no textured groove on the surface of the Ni-P substrate. A thin film magnetic disk having a flat surface with a surface roughness of 2 nm Ra or less.
【請求項2】請求項1記載の薄膜磁気ディスクにおい
て、アルミ基板にNi−Pをメッキし、その後基板表面
を境面研磨、洗浄後スパッタにより下地膜、磁性膜、保
護膜を成膜し、潤滑膜を付けることを特徴とする薄膜磁
気ディスクの製造方法。
2. The thin-film magnetic disk according to claim 1, wherein an aluminum substrate is plated with Ni-P, and then the substrate surface is surface-polished, and after cleaning, a base film, a magnetic film, and a protective film are formed by sputtering, A method of manufacturing a thin-film magnetic disk, comprising applying a lubricating film.
【請求項3】請求項2記載の製造方法の境面研磨におい
て、先ず始めに砥粒を添加した加工液と研磨布で大方の
凹凸やうねりを除去し、次に、表面処理をすることを特
徴とする薄膜磁気ディスクの製造方法。
3. In the surface polishing of the manufacturing method according to claim 2, first of all, most irregularities and undulations are removed with a working fluid containing abrasive grains and a polishing cloth, and then surface treatment is performed. A method for manufacturing a thin film magnetic disk characterized by the above.
【請求項4】請求項3記載の製造方法の表面処理におい
て、処理液と処理布でNi−P表面を円周方向に擦るこ
とを特徴とする薄膜磁気ディスクの製造方法。
4. The method of manufacturing a thin film magnetic disk according to claim 3, wherein the surface of the Ni—P is rubbed in a circumferential direction with a treatment liquid and a treatment cloth.
【請求項5】請求項4記載の製造方法において、加工液
及び処理液に親水性の液を使用することを特徴とする薄
膜磁気ディスクの製造方法。
5. The method for manufacturing a thin film magnetic disk according to claim 4, wherein a hydrophilic liquid is used as the working liquid and the processing liquid.
【請求項6】請求項4記載の製造方法において、処理布
に脂肪族ポリアミド(ナイロン)、ポリエステル、セル
ロース等のプラスチィック繊維を使用することを特徴と
する薄膜磁気ディスクの製造方法。
6. The method of manufacturing a thin film magnetic disk according to claim 4, wherein the treated cloth is made of a plastic fiber such as aliphatic polyamide (nylon), polyester or cellulose.
【請求項7】請求項3又は請求項4記載の製造方法にお
いて、加工液及び処理液に適度の粘性を持ち、且つ、エ
ッチング作用のあることを特徴とする薄膜磁気ディスク
の製造方法。
7. The method for manufacturing a thin film magnetic disk according to claim 3 or 4, wherein the working liquid and the processing liquid have an appropriate viscosity and have an etching action.
【請求項8】請求項5記載の製造方法において、処理液
の主成分にエチレングリコール、ポリエチレングリコー
ル、グリセリン等の多価アルコール系、又、適度な粘性
を持つ高級アルコール、更に界面活性剤等の親水性の処
理液を使用することを特徴とする薄膜磁気ディスクの製
造方法。
8. The production method according to claim 5, wherein the main component of the treatment liquid is a polyhydric alcohol such as ethylene glycol, polyethylene glycol or glycerin, a higher alcohol having an appropriate viscosity, and a surfactant. A method of manufacturing a thin-film magnetic disk, which comprises using a hydrophilic treatment liquid.
【請求項9】請求項3記載の製造方法において、表面処
理は基板表面の中心を軸に処理布が相対的に回転しなが
ら表面を擦ることを特徴とする薄膜磁気ディスクの製造
方法。
9. The method of manufacturing a thin film magnetic disk according to claim 3, wherein the surface treatment is performed by rubbing the surface of the substrate while the treated cloth relatively rotates about the center of the substrate surface.
【請求項10】請求項1記載の薄膜磁気ディスクにおい
て、保護膜に凹凸を付けたことを特徴とする薄膜磁気デ
ィスク
10. The thin film magnetic disk according to claim 1, wherein a protective film is provided with irregularities.
【請求項11】請求項10記載の薄膜磁気ディスクにお
いて、保護膜をスパッタで成膜した後に微粒子を均一に
付け、この微粒子をマスクに保護膜をエッチングし、凹
凸を付けることを特徴とする薄膜磁気ディスクの製造方
法。
11. A thin film magnetic disk according to claim 10, wherein a protective film is formed by sputtering and then fine particles are uniformly applied, and the protective film is etched by using the fine particles as a mask to form irregularities. Manufacturing method of magnetic disk.
【請求項12】請求項11記載の製造方法のエッチング
において、酸素プラズマやオゾンと紫外線により保護膜
をエッチングすることを特徴とする薄膜磁気ディスクの
製造方法。
12. A method for manufacturing a thin film magnetic disk according to claim 11, wherein the protective film is etched by oxygen plasma, ozone and ultraviolet rays.
【請求項13】ヘッドと磁気ディスクのスペーシングが
0.1μm以下でデータを記録する磁気ディスク装置に
おいて、請求項1又は10の薄膜磁気ディスクを使用し
たことを特徴とする磁気ディスク装置。
13. A magnetic disk device, wherein the thin film magnetic disk according to claim 1 or 10 is used in a magnetic disk device for recording data with a head-magnetic disk spacing of 0.1 μm or less.
JP5014492A 1993-02-01 1993-02-01 Thin film magnetic disk and manufacturing method thereof Pending JPH06231442A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5014492A JPH06231442A (en) 1993-02-01 1993-02-01 Thin film magnetic disk and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5014492A JPH06231442A (en) 1993-02-01 1993-02-01 Thin film magnetic disk and manufacturing method thereof

Publications (1)

Publication Number Publication Date
JPH06231442A true JPH06231442A (en) 1994-08-19

Family

ID=11862554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5014492A Pending JPH06231442A (en) 1993-02-01 1993-02-01 Thin film magnetic disk and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JPH06231442A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990057732A (en) * 1997-12-30 1999-07-15 윤종용 Hard Disk Texturing Methods

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19990057732A (en) * 1997-12-30 1999-07-15 윤종용 Hard Disk Texturing Methods

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