JPH06235708A - 金属の被覆適性評価方法 - Google Patents

金属の被覆適性評価方法

Info

Publication number: JPH06235708A
Authority: JP; Japan
Prior art keywords: metal; content; cobalt; measured; binder metal
Prior art date: 1992-08-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

JP5211706A

Other languages

English (en)

Japanese (ja)

Inventor

Hans Dr Schulz

シュルツハンス

Rudolf Dr Lanzenberger

ランツェンベルガールドルフ

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

OC Oerlikon Balzers AG

Original Assignee

Balzers AG

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1992-08-27

Filing date

1993-08-26

Publication date

1994-08-23

1993-08-26 Application filed by Balzers AG filed Critical Balzers AG

1994-08-23 Publication of JPH06235708A publication Critical patent/JPH06235708A/ja

Status Pending legal-status Critical Current

Links

229910052751 metal Inorganic materials 0.000 title claims abstract description 68
239000002184 metal Substances 0.000 title claims abstract description 68
238000000576 coating method Methods 0.000 title claims abstract description 28
239000011248 coating agent Substances 0.000 title claims abstract description 27
238000000034 method Methods 0.000 title claims description 34
239000010941 cobalt Substances 0.000 claims abstract description 59
229910017052 cobalt Inorganic materials 0.000 claims abstract description 59
GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims abstract description 59
239000011230 binding agent Substances 0.000 claims abstract description 37
238000005259 measurement Methods 0.000 claims abstract description 21
238000004458 analytical method Methods 0.000 claims abstract description 8
239000000203 mixture Substances 0.000 claims abstract description 3
238000005240 physical vapour deposition Methods 0.000 claims description 12
239000011247 coating layer Substances 0.000 claims description 10
238000004876 x-ray fluorescence Methods 0.000 claims description 10
238000011156 evaluation Methods 0.000 claims description 6
238000001228 spectrum Methods 0.000 claims description 6
-1 for example Substances 0.000 claims description 4
230000035515 penetration Effects 0.000 claims description 4
238000011088 calibration curve Methods 0.000 claims description 3
230000002093 peripheral effect Effects 0.000 claims description 3
230000003595 spectral effect Effects 0.000 claims description 3
239000012925 reference material Substances 0.000 claims description 2
WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
239000010937 tungsten Substances 0.000 claims description 2
229910052721 tungsten Inorganic materials 0.000 claims description 2
238000010183 spectrum analysis Methods 0.000 claims 1
238000001704 evaporation Methods 0.000 abstract 1
239000012466 permeate Substances 0.000 abstract 1
230000002787 reinforcement Effects 0.000 abstract 1
239000010410 layer Substances 0.000 description 12
238000011282 treatment Methods 0.000 description 12
PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 10
150000002739 metals Chemical class 0.000 description 8
230000007423 decrease Effects 0.000 description 7
150000001247 metal acetylides Chemical class 0.000 description 7
229910052759 nickel Inorganic materials 0.000 description 5
230000001070 adhesive effect Effects 0.000 description 4
230000000694 effects Effects 0.000 description 4
239000002245 particle Substances 0.000 description 4
239000002585 base Substances 0.000 description 3
238000004140 cleaning Methods 0.000 description 3
238000001816 cooling Methods 0.000 description 3
239000002173 cutting fluid Substances 0.000 description 3
NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
230000002378 acidificating effect Effects 0.000 description 2
239000011195 cermet Substances 0.000 description 2
239000012459 cleaning agent Substances 0.000 description 2
238000005520 cutting process Methods 0.000 description 2
230000032798 delamination Effects 0.000 description 2
238000001914 filtration Methods 0.000 description 2
238000004519 manufacturing process Methods 0.000 description 2
238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 1
239000003513 alkali Substances 0.000 description 1
229910000147 aluminium phosphate Inorganic materials 0.000 description 1
239000012809 cooling fluid Substances 0.000 description 1
230000000779 depleting effect Effects 0.000 description 1
238000002265 electronic spectrum Methods 0.000 description 1
230000003628 erosive effect Effects 0.000 description 1
230000005284 excitation Effects 0.000 description 1
230000002349 favourable effect Effects 0.000 description 1
238000012921 fluorescence analysis Methods 0.000 description 1
238000002347 injection Methods 0.000 description 1
239000007924 injection Substances 0.000 description 1
238000000691 measurement method Methods 0.000 description 1
TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
238000001420 photoelectron spectroscopy Methods 0.000 description 1
238000005498 polishing Methods 0.000 description 1
238000004445 quantitative analysis Methods 0.000 description 1
238000004904 shortening Methods 0.000 description 1
238000005728 strengthening Methods 0.000 description 1
239000000126 substance Substances 0.000 description 1
238000005211 surface analysis Methods 0.000 description 1
238000004441 surface measurement Methods 0.000 description 1
MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 description 1
UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 1

Classifications

- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material

Landscapes

Chemical & Material Sciences (AREA)
Chemical Kinetics & Catalysis (AREA)
Engineering & Computer Science (AREA)
Materials Engineering (AREA)
Mechanical Engineering (AREA)
Metallurgy (AREA)
Organic Chemistry (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)

JP5211706A 1992-08-27 1993-08-26 金属の被覆適性評価方法 Pending JPH06235708A (ja)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
CH2669/92A CH684903A5 (de)	1992-08-27	1992-08-27	Verfahren zur Beurteilung der Beschichtbarkeit von Metallen.
CH02669/92-3		1992-08-27

Publications (1)

Publication Number	Publication Date
JPH06235708A true JPH06235708A (ja)	1994-08-23

Family

ID=4238913

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP5211706A Pending JPH06235708A (ja)	1992-08-27	1993-08-26	金属の被覆適性評価方法

Country Status (3)

Country	Link
JP (1)	JPH06235708A (de)
CH (1)	CH684903A5 (de)
DE (1)	DE4326852A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB9819732D0 (en) *	1998-09-11	1998-11-04	Renishaw Plc	Tool conditioning monitoring
US11446951B2 (en) *	2016-02-02	2022-09-20	Soreq Nuclear Research Center	Authentication of metallic objects

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE2716689A1 (de) *	1977-04-15	1978-10-19	Ibm Deutschland	Herstellung von eichstandards fuer die roentgenfluoreszenzanalyse
DE3542003A1 (de) *	1985-11-28	1987-06-04	Geesthacht Gkss Forschung	Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
JP2853261B2 (ja) *	1989-05-16	1999-02-03	三菱マテリアル株式会社	金属分析方法および分析装置
DE4021617C2 (de) *	1990-07-06	1993-12-02	Kugelfischer G Schaefer & Co	Vorrichtung zum kontinuierlichen Messen des Eisengehaltes in Zinkschichten
DE4028043A1 (de) *	1990-09-05	1992-03-12	Geesthacht Gkss Forschung	Verfahren und vorrichtung zur analyse und bestimmung der konzentration von elementen im oberflaechenbereich von objekten

1992
- 1992-08-27 CH CH2669/92A patent/CH684903A5/de not_active IP Right Cessation
1993
- 1993-08-10 DE DE4326852A patent/DE4326852A1/de not_active Withdrawn
- 1993-08-26 JP JP5211706A patent/JPH06235708A/ja active Pending

Also Published As

Publication number	Publication date
CH684903A5 (de)	1995-01-31
DE4326852A1 (de)	1994-03-03

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