JPH06242018A - Surface inspection system - Google Patents
Surface inspection systemInfo
- Publication number
- JPH06242018A JPH06242018A JP2440493A JP2440493A JPH06242018A JP H06242018 A JPH06242018 A JP H06242018A JP 2440493 A JP2440493 A JP 2440493A JP 2440493 A JP2440493 A JP 2440493A JP H06242018 A JPH06242018 A JP H06242018A
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- image pickup
- inspection object
- pickup signal
- illuminating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
(57)【要約】
【目的】 製品形状等に左右されることなく製品全面に
わたる高精度の検査を容易に行なうことができる表面検
査装置を提供する。
【構成】 検査対象物２をカメラ５側の第１の方向から
照明する第１照明手段３と、検査対象物２を当該検査対
象物２を介して第１の方向とはほぼ逆方向から照明する
第２照明手段４と、検査対象物２の輪郭部分に相当する
撮像信号レベルが、検査対象物の背景部分の撮像信号レ
ベルとほぼ等しくなるように、第１照明手段３及び第２
照明手段４を制御して、光量調整を行なう照明制御手段
８と、撮像信号ＳV を微分して微分撮像信号ＳD として
出力する微分手段１０と、微分撮像信号ＳD を２値化し
て２値化データＤB として出力する２値化手段１１と、
２値化データＤB に基づいて良否判別を行なう判別手段
１３と、を備える。
(57) [Summary] [Purpose] To provide a surface inspection device capable of easily performing high-precision inspection over the entire surface of a product without being influenced by the shape of the product. [Structure] First illumination means 3 for illuminating the inspection object 2 from a first direction on the camera 5 side, and illuminating the inspection object 2 through the inspection object 2 from a direction substantially opposite to the first direction. The second illuminating means 4 and the first illuminating means 3 and the second illuminating means 3 so that the image pickup signal level corresponding to the contour portion of the inspection object 2 becomes substantially equal to the image pickup signal level of the background portion of the inspection object.
The illumination control means 8 for controlling the illumination means 4 to adjust the light amount, the differentiating means 10 for differentiating the image pickup signal S V and outputting it as the differential image pickup signal S D , and the differential image pickup signal S D binarized to 2 Binarizing means 11 for outputting as binarized data D B ,
And a discriminating means 13 for discriminating pass / fail based on the binarized data D B.
Description
【０００１】[0001]
【産業上の利用分野】本発明は表面検査装置に係り、特
に得られた撮像信号を２値化処理することにより異物の
有無等を判別する表面検査装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface inspection device, and more particularly to a surface inspection device for discriminating the presence / absence of foreign matter by binarizing an obtained image pickup signal.
【０００２】[0002]
【従来の技術】従来、成形品の異物検査は画像処理を用
いた表面検査装置より行なわれている。2. Description of the Related Art Conventionally, a surface inspection device using image processing is used to inspect a molded product for foreign matter.
【０００３】図５に従来の表面検査装置の概要構成を示
す。表面検査装置３０は、検査対象物であるスプーン３
１の正面側（図面上、右側）から照明を行なう反射照明
装置３２と、スプーン３１の正面側から撮像してビデオ
信号ＳV を出力するカメラ３３と、ビデオ信号ＳV に基
づいて表面検査処理を行なう処理装置３４と、処理結果
である２値化画像データ等を表示するＣＲＴ等のディス
プレイ３５と、各種データを入力するキーボード等の入
力装置３６と、を備えて構成されている。FIG. 5 shows a schematic structure of a conventional surface inspection apparatus. The surface inspection device 30 uses the spoon 3 that is the inspection object.
1 on the front side (on the drawing, right side) and reflection illumination device 32 for illuminating from and captured from the front of the spoon 31 and the camera 33 for outputting a video signal S V, surface inspection process based on the video signal S V A processing device 34 for performing the above, a display 35 such as a CRT for displaying the binarized image data or the like as a processing result, and an input device 36 such as a keyboard for inputting various data are configured.
【０００４】処理装置３４は、ビデオ信号ＳV を２値化
して２値化画像データＤB ’として出力する２値化回路
３７と、２値化画像データＤB ’、演算結果データ等の
各種データを記憶するメモリ３８と、処理装置３４全体
を制御する制御回路３９と、を備えて構成されている。[0004] processor 34, 'and the binarization circuit 37 for outputting a binarized image data D B' video signals S V binarized to binary image data D B, various such processed data A memory 38 for storing data and a control circuit 39 for controlling the entire processing device 34 are provided.
【０００５】検査対象物であるスプーン３１は、図７に
示すように、粉ミルクを計量するための深底形状のカッ
プ部と、裏面にスプーン強度補強用のリブを有し、ユー
ザが当該スプーンを握持するための柄部と、を備えて構
成されている。As shown in FIG. 7, the spoon 31, which is the object to be inspected, has a deep-bottomed cup portion for weighing the powdered milk and a rib for reinforcing the spoon strength on the back surface. And a handle portion for gripping.
【０００６】次に動作を説明する。カメラ３３で取込ん
だ原画像が図６（ａ）に示すようなものである場合、カ
メラ３３から出力されるＡ’―Ａ’部分に相当するビデ
オ信号ＳV は図６（ｂ）に示すようなものとなる。この
ビデオ信号を２値化回路３７により、予め定めた２値化
レベルを用いて、２値化し、その結果に基づいて制御回
路３９が異物の有無の判定を行なっていた。Next, the operation will be described. When the original image captured by the camera 33 is as shown in FIG. 6 (a), the video signal S V corresponding to the A′-A ′ portion output from the camera 33 is shown in FIG. 6 (b). It will be something like. This video signal is binarized by the binarization circuit 37 using a predetermined binarization level, and the control circuit 39 determines the presence or absence of foreign matter based on the result.
【０００７】[0007]
【発明が解決しようとする課題】ところで、この表面検
査装置において、成形品のエッジ部分（成形品の外郭部
部分）は、検査精度の低下等から、検査対象（あるいは
検査範囲）から除外することが多い。By the way, in this surface inspection apparatus, the edge portion of the molded product (outer peripheral portion of the molded product) is excluded from the inspection target (or inspection range) due to deterioration of inspection accuracy and the like. There are many.
【０００８】例えば、このＡ’―Ａ’部分のビデオ信号
ＳV を２値化回路３７により、所定の２値化レベル（し
きい値）ＬA で２値化した場合を想定すると、カメラ３
３側からみて検査対象物であるスプーン３１と背景の濃
淡差があるため、図６（ｃ）に示すように、背景部分は
異物のある部分と同一の値を有することとなり、自動検
査を行なう際には、検査対象範囲であるウィンドウを設
けて、当該ウィンドウ内のみで異物の有無を判別する必
要があった。このウィンドウは、成形品の形状誤差、検
査時の位置ずれ等を含めて、実際の成形品のエッジ部分
（外郭部）よりも小さく設定されているため、エッジ部
分に異物が付着しているような場合でも、良品と判別さ
れてしまう可能性があった。For example, assuming that the video signal S V of the A′-A ′ portion is binarized by the binarization circuit 37 at a predetermined binarization level (threshold value) L A , the camera 3
Since there is a difference in shade between the spoon 31 which is the inspection object and the background when viewed from the 3 side, the background portion has the same value as the portion having the foreign matter as shown in FIG. 6C, and the automatic inspection is performed. At that time, it is necessary to provide a window which is an inspection target range and determine the presence or absence of a foreign substance only within the window. This window is set to be smaller than the actual edge part (outer part) of the molded product, including the shape error of the molded product, the positional deviation during inspection, etc., so it is likely that foreign matter will adhere to the edge part. Even in such a case, there was a possibility that the product was judged to be good.
【０００９】また、上記可能性を除去するため、Ａ’―
Ａ’部分のビデオ信号ＳV を２値化回路３７により、所
定の２値化レベルＬB で２値化した場合を想定すると、
図６（ｄ）に示すように、スプーンの背景部分はマスク
されることとなるが、同時にスプーンのエッジ部分及び
微小な異物もマスクされてしまうこととなる。In order to eliminate the above possibility, A'-
Assuming that the video signal S V of the A ′ portion is binarized by the binarization circuit 37 at a predetermined binarization level L B ,
As shown in FIG. 6D, the background portion of the spoon is masked, but at the same time, the edge portion of the spoon and minute foreign matter are also masked.
【００１０】上述のように、上記従来の表面検査装置に
おいては、成形品全面にわたる高精度の検査が困難であ
り、より高精度の検査を行なうためには製品形状に応じ
た検査ウィンドウサイズ、２値化レベルの設定および製
品位置ずれに対応する検査ウィンドウ位置の補正という
複雑な処理が必要となるという問題点があった。As described above, in the above-mentioned conventional surface inspection apparatus, it is difficult to perform high-precision inspection over the entire surface of the molded product, and in order to perform higher-precision inspection, the inspection window size according to the product shape, 2 There is a problem that complicated processing such as setting of a digitization level and correction of an inspection window position corresponding to a product position shift is required.
【００１１】そこで、本発明の目的は、製品形状等に左
右されることなく製品全面にわたる高精度の検査を容易
に行なうことができる表面検査装置を提供することにあ
る。Therefore, an object of the present invention is to provide a surface inspection apparatus capable of easily performing high-precision inspection over the entire surface of a product without being influenced by the shape of the product or the like.
【００１２】[0012]
【課題を解決するための手段】上記課題を解決するた
め、本発明は、検査対象物をカメラで撮像し、得られた
撮像信号に基づいて表面検査を行なう表面検査装置にお
いて、前記検査対象物を前記カメラ側の第１の方向から
照明する第１照明手段と、前記検査対象物を当該検査対
象物を介して前記第１の方向とはほぼ逆方向から照明す
る第２照明手段と、前記検査対象物の輪郭部分に相当す
る前記撮像信号レベルが、前記検査対象物の背景部分の
前記撮像信号レベルとほぼ等しくなるように、前記第１
照明手段及び前記第２照明手段を制御して、光量調整を
行なう照明制御手段と、前記撮像信号を微分して微分撮
像信号として出力する微分手段と、前記微分撮像信号を
２値化して２値化データとして出力する２値化手段と、
前記２値化データに基づいて良否判別を行なう判別手段
と、を備えて構成する。In order to solve the above-mentioned problems, the present invention provides a surface inspection apparatus which images an object to be inspected with a camera and inspects the surface based on the obtained image pickup signal. A first illuminating means for illuminating the object from a first direction on the camera side, a second illuminating means for illuminating the inspection object through the inspection object in a direction substantially opposite to the first direction, The first image pickup signal level corresponding to the contour portion of the inspection object is substantially equal to the image pickup signal level of the background portion of the inspection object.
Illumination control means for controlling the illumination means and the second illumination means to adjust the light amount, differentiating means for differentiating the image pickup signal and outputting it as a differential image pickup signal, and binarizing the differential image pickup signal for binarization. Binarization means for outputting as digitized data,
And a judging means for judging whether the quality is good or bad based on the binarized data.
【００１３】[0013]
【作用】本発明によれば、照明制御手段の制御下で、第
１照明手段は、検査対象物をカメラ側の第１の方向から
照明し、第２の照明手段は、検査対象物を当該検査対象
物を介して第１の方向とはほぼ逆方向から照明する。According to the present invention, under the control of the illumination control means, the first illuminating means illuminates the inspection object from the first direction on the camera side, and the second illuminating means illuminates the inspection object. Illumination is performed from a direction substantially opposite to the first direction through the inspection object.
【００１４】このとき、照明制御手段は、検査対象物の
輪郭部分に相当する撮像信号レベルが、検査対象物の背
景部分の撮像信号レベルとほぼ等しくなるように制御す
る。一方、微分手段は、撮像信号を微分して微分撮像信
号として出力し、２値化手段はこの微分撮像信号を２値
化して２値化データとして出力する。At this time, the illumination control means controls the image pickup signal level corresponding to the contour portion of the inspection object to be substantially equal to the image pickup signal level of the background portion of the inspection object. On the other hand, the differentiating means differentiates the image pickup signal and outputs it as a differential image pickup signal, and the binarizing means binarizes this differential image pickup signal and outputs it as binarized data.
【００１５】これにより、判別手段はこの２値化データ
に基づいて検査対象物の良否判別を行なう。従って、検
査対象物の輪郭部分の２値化データと検査対象物の背景
部分の２値化データとは良品の場合に等しくなるので、
区別して取り扱う必要がなくなり、自動検査の際に検査
範囲であるウィンドウを設定する等の特別な処理を行な
わずに検査対象物の輪郭部分を含め全面にわたって検査
を行なえる。また、２値化データは、微分撮像信号に基
づいて生成しているので、緩やかに傾斜が変化する検査
対象物でも、容易に良否判別を行なうことができ、製品
形状に左右されることがなく、表面検査を行なえる。Thus, the discriminating means discriminates the quality of the inspection object based on the binarized data. Therefore, since the binarized data of the contour portion of the inspection object and the binarized data of the background portion of the inspection object are equal to each other in the case of a good product,
It is no longer necessary to handle them separately, and inspection can be performed over the entire surface including the contour portion of the inspection object without performing special processing such as setting a window that is an inspection range during automatic inspection. Further, since the binarized data is generated based on the differential image pickup signal, it is possible to easily determine whether the inspection target has a gradual change in inclination or not, and is not affected by the product shape. , Surface inspection can be performed.
【００１６】[0016]
【実施例】次に図１乃至図４及び図７を参照して本発明
の好適な実施例を説明する。図１に検査対象物である粉
ミルク計量用のスプーンを検査する表面検査装置の概要
構成を示す。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT A preferred embodiment of the present invention will now be described with reference to FIGS. FIG. 1 shows a schematic configuration of a surface inspection device for inspecting a spoon for measuring powdered milk which is an inspection object.
【００１７】表面検査装置１は、スプーン２の正面側
（図面上、右側）から照明を行なうリングライト等の反
射照明装置３と、スプーン２の背面側から照明を行なう
背景照明装置４と、スプーン２の正面側から撮像してビ
デオ信号ＳV を出力するカメラ５と、ビデオ信号ＳV に
基づいて表面検査処理を行なう処理装置６と、処理結果
である２値化画像データ等を表示するＣＲＴ等のディス
プレイ７と、処理装置６の制御下で反射照明装置３及び
背景照明装置４の照明制御を行なう照明制御装置８と、
各種データを入力するキーボード等の入力装置９と、を
備えて構成されている。The surface inspection device 1 includes a reflection illumination device 3 such as a ring light which illuminates the front side of the spoon 2 (on the right side in the drawing), a background illumination device 4 which illuminates from the back side of the spoon 2, and the spoon 2. a camera 5 for outputting a video signal S V and imaged from the front side, a processing unit 6 which performs surface inspection process based on the video signal S V, CRT or the like for displaying the binary image data such as a processing result Display 7, and a lighting control device 8 for controlling the lighting of the reflective lighting device 3 and the background lighting device 4 under the control of the processing device 6.
And an input device 9 such as a keyboard for inputting various data.
【００１８】処理装置６は、ビデオ信号ＳV を微分して
微分ビデオ信号ＳD を出力する微分回路１０と、微分ビ
デオ信号ＳD を２値化して２値化画像データＤB として
出力する２値化回路１１と、２値化画像データＤB 、演
算結果データ等の各種データを記憶するメモリ１２と、
処理装置６全体を制御する制御回路１３と、を備えて構
成されている。The processor 6 includes a differentiating circuit 10 which differentiates the video signal S V to output a differential video signal S D, and outputs it as binary image data D B by binarizing the differential video signal S D 2 A binarizing circuit 11 and a memory 12 for storing various data such as binarized image data D B and operation result data,
And a control circuit 13 for controlling the entire processing device 6.
【００１９】背景照明装置４は、背景照明光ＬＬを出射
する光源１４と、背景照明光ＬＬを拡散して均一な平面
光源とするための光拡散板１５と、を備えて構成されて
いる。The background illuminating device 4 comprises a light source 14 for emitting the background illuminating light LL, and a light diffusing plate 15 for diffusing the background illuminating light LL into a uniform flat light source.
【００２０】次に動作を説明する。１）検査準備 まず図２を参照して検査の準備について説明する。この
場合において、反射照明装置３の光量は予め設定した値
に固定しておくものとする。Next, the operation will be described. 1) Preparation for inspection First, preparation for inspection will be described with reference to FIG. In this case, the light quantity of the reflective illumination device 3 is fixed to a preset value.
【００２１】所定位置に設置した検査対象物であるスプ
ーン２に対して反射照明装置３による反射照明のみを行
なった場合にカメラ５で取込んだ原画像が図２（ａ）に
示すものであるとすると、Ａ―Ａ部分を走査したときの
ビデオ信号ＳV は図２（ｂ）に示すようなものとなる。FIG. 2A shows an original image captured by the camera 5 when only the reflection illumination device 3 performs the reflection illumination on the spoon 2 which is the inspection object installed at a predetermined position. Then, the video signal S V when the AA portion is scanned becomes as shown in FIG.
【００２２】このとき、ビデオ信号ＳV のスプーン２の
背景部分の信号レベルＬ1 と、スプーン２のエッジ部分
（図２（ａ）中、斜線で示す。）の信号レベルＬ2 が等
しくなるように、入力装置９、処理装置６を介して照明
制御装置８を制御して背景照明装置４の光量を調整す
る。[0022] At this time, the signal level L 1 of the background portion of the spoon 2 of the video signal S V, (in FIG. 2 (a), the hatched.) Edge of the spoon 2 signal level L 2 so that equal the Then, the illumination control device 8 is controlled via the input device 9 and the processing device 6 to adjust the light amount of the background illumination device 4.
【００２３】この結果、ビデオ信号ＳV は、図２（ｃ）
に示すようなものとなり、スプーンのエッジ部分では信
号レベルが変化せず、異物２０存在位置のみ急激に信号
レベルが変化するように設定されることとなる。尚、実
際の表面検査の準備段階においては、良品を用いて準備
を行なうことが望ましい。２）表面検査 次に表面検査処理について説明する。As a result, the video signal S V is shown in FIG.
The signal level does not change at the edge portion of the spoon, and the signal level is set to change rapidly only at the position where the foreign matter 20 exists. In the actual preparation stage of the surface inspection, it is desirable to use good products for preparation. 2) Surface Inspection Next, the surface inspection processing will be described.
【００２４】検査準備により、検査対象物であるスプー
ン２の背景部分の信号レベルＬ1 と、エッジ部分の信号
レベルＬ2 が等しくなったら、表面検査を開始する。カ
メラ５で取込んだ原画像が図３（ａ）に示すようなもの
である場合、カメラ５から出力されるＡ―Ａ部分に相当
するビデオ信号ＳV は３（ｂ）に示すようなものとな
る。When the signal level L 1 of the background portion of the spoon 2, which is the object to be inspected, and the signal level L 2 of the edge portion become equal by the inspection preparation, the surface inspection is started. When the original image captured by the camera 5 is as shown in FIG. 3 (a), the video signal S V corresponding to the portion AA output from the camera 5 is as shown in 3 (b). Becomes
【００２５】このＡ―Ａ部分のビデオ信号ＳV を微分回
路１０により微分すると、微分ビデオ信号ＳD は図３
（ｃ）に示すようなものとなり、信号レベルが急激に変
化した点、すなわち、異物により明るさが減少した部分
が検出される。When the video signal S V of the AA portion is differentiated by the differentiating circuit 10, the differential video signal S D is shown in FIG.
As shown in (c), the point where the signal level changes abruptly, that is, the portion where the brightness is reduced by the foreign matter is detected.
【００２６】同様にして、原画像の全てのビデオ信号Ｓ
V を微分し、所定の２値化レベル（しきい値）で２値化
すると図３（ｄ）に示す画像データが得られ、この２値
化画像データに基づいて、制御回路１３が良品か不良品
かを示す判別信号ＤＥＴを出力するので、この判別信号
ＤＥＴに基づいて容易に異物を検出することが可能とな
る。Similarly, all video signals S of the original image are
When V is differentiated and binarized at a predetermined binarization level (threshold value), the image data shown in FIG. 3 (d) is obtained. Based on the binarized image data, is the control circuit 13 a good product? Since the discrimination signal DET indicating the defective product is output, it becomes possible to easily detect the foreign matter based on the discrimination signal DET.
【００２７】次に上記表面検査装置をスプーン製造工程
後の全面自動検査工程に用いた場合について図４を参照
して説明する。まず、射出成形装置で成形されたスプー
ンは、表面検査装置に搬送され、所定の治具により、カ
ップ部の凸部を上側にしてカップ部をクランプされる。Next, a case where the above-mentioned surface inspection apparatus is used in a full-face automatic inspection process after the spoon manufacturing process will be described with reference to FIG. First, the spoon molded by the injection molding apparatus is conveyed to the surface inspection apparatus, and the cup portion is clamped by a predetermined jig with the convex portion of the cup portion facing upward.
【００２８】そのまま、第１の検査工程（図中、丸数字
で示す。以下、同様。）に搬送され、柄の先端部の表面
側（正面側）を第１の表面検査装置のカメラＣにより撮
像して上述したような手順で表面検査を行なう。As it is, it is conveyed to the first inspection step (indicated by a circled number in the figure. The same applies hereinafter), and the front surface side (front side) of the tip of the handle is taken by the camera C of the first surface inspection apparatus. An image is taken and a surface inspection is performed by the procedure as described above.
【００２９】次に、第２の検査工程に搬送され、第１の
表面検査装置のカメラとは反対側に設置したカメラを有
する第２の表面検査装置により柄の先端部の裏面側（背
面側）の表面検査を行なう。Next, the second surface inspection apparatus, which is conveyed to the second inspection step and has a camera installed on the side opposite to the camera of the first surface inspection apparatus, is used to remove the back side (back side) of the tip of the handle. ) Surface inspection.
【００３０】つづいて、スプーンは検査待ちのスプーン
を一時的に蓄える中間バッファを介して、第３の検査工
程に搬送され、第１の表面検査装置と同構成の第３の表
面検査装置によりスプーンの中間部分（柄の根元部）の
表面側の表面検査を行なう。Subsequently, the spoon is conveyed to the third inspection step through an intermediate buffer that temporarily stores the spoon waiting for inspection, and the spoon is inspected by the third surface inspection device having the same structure as the first surface inspection device. Surface inspection of the surface side of the intermediate part (root of the handle).
【００３１】次にスプーンは第４の検査工程に搬送さ
れ、図面上側に斜め方向に配置された２台のカメラを有
する第４の表面検査装置によりスプーンの中間部分（柄
の根元部）の裏面側の表面検査を行なう。この場合にお
いて２台のカメラで検査を行なうのは、図７（ｂ）及び
図７（ｃ）に示したように、柄の裏面側には、リブが垂
直に形成されており、リブの側面部に異物が付着してい
るような場合に１台の垂直方向に設置したカメラでは検
出することができないからである。Next, the spoon is conveyed to the fourth inspection step, and the fourth surface inspection device having two cameras obliquely arranged on the upper side of the drawing uses the fourth surface inspection device to provide the back surface of the middle portion (root portion of the handle) of the spoon. Side surface inspection. In this case, the inspection is performed by the two cameras because, as shown in FIGS. 7B and 7C, the ribs are formed vertically on the back surface side of the handle, and the side surfaces of the ribs are formed. This is because when a foreign matter is attached to the part, it cannot be detected by one camera installed in the vertical direction.
【００３２】つづいて、次の工程でスプーンは他の治具
により、柄の部分がクランプされる。クランプ終了後、
第５の検査工程に搬送され、第４の表面検査装置と同構
成の第５の表面検査装置により、カップ部の表面側の検
査を行なう。この場合も、２台のカメラを用いて検査を
行なうのは、図７（ｄ）に示すようにカップ部の側面も
垂直に切り立っており、カップ部内面の側面部に付着し
た異物を検出するためである。Subsequently, in the next step, the handle portion of the spoon is clamped by another jig. After clamping
The surface of the cup portion is inspected by the fifth surface inspection device having the same configuration as the fourth surface inspection device, after being conveyed to the fifth inspection step. Also in this case, the inspection is performed using the two cameras because the side surface of the cup portion is also vertically raised as shown in FIG. 7D, and foreign matter attached to the side surface portion of the inner surface of the cup portion is detected. This is because.
【００３３】さらに第６の検査工程に搬送され、第４、
第５の表面検査装置と同構成の第６の表面検査装置によ
り、カップ部の裏面側の検査を行なう。同様にして、こ
の場合も、２台のカメラを用いて検査を行なうのは、カ
ップ部の外面の側面部に付着した異物を検出するためで
ある。Further transferred to the sixth inspection step, the fourth,
The sixth surface inspection device having the same configuration as the fifth surface inspection device inspects the back surface side of the cup portion. Similarly, in this case as well, the reason why the inspection is performed by using the two cameras is to detect the foreign matter attached to the side surface portion of the outer surface of the cup portion.
【００３４】以上の表面検査終了後の、スプーンは、リ
ジェクト工程に搬送され、判別信号ＤＥＴにより異物が
検出されたスプーンはリジェクトされ、残った良品は次
の工程へと搬送されることとなる。After the surface inspection described above, the spoon is conveyed to the rejecting step, the spoon in which the foreign matter is detected by the discrimination signal DET is rejected, and the remaining good products are conveyed to the next step.
【００３５】以上の説明のように本実施例によれば、垂
直に切り立った面を有するような検査対象物であって
も、自動的に全面について表面検査を行なうことがで
き、表面検査の手間及び検査時間を削減するとともに、
確実に表面検査を行なうことができる。As described above, according to the present embodiment, the surface inspection can be automatically performed on the entire surface even for the inspection object having the vertically raised surface. And reduce inspection time,
The surface can be surely inspected.
【００３６】以上の実施例においては、検査準備の段階
で、反射照明を点灯した状態で、背景照明を調整した
が、逆に背景照明を点灯した状態で反射照明を調整した
り、双方とも点灯した状態で相対的に照明を調整するよ
うに構成することも可能である。また、反射照明及び背
景照明はそれぞれ１個の光源であっても良いし、複数の
光源であっても良い。In the above-described embodiments, the background illumination is adjusted with the reflection illumination turned on at the stage of the inspection preparation, but conversely, the reflection illumination is adjusted with the background illumination turned on, or both are turned on. It is also possible to adjust the illumination relatively in this state. Further, each of the reflection illumination and the background illumination may be one light source or a plurality of light sources.
【００３７】[0037]
【発明の効果】本発明によれば、検査対象物の輪郭部分
の２値化データと検査対象物の背景部分の２値化データ
とは良品の場合に等しくなるので、区別して取り扱う必
要がなくなり、自動検査の際に検査範囲であるウィンド
ウを設定する等の特別な処理を行なわずに検査対象物の
輪郭部分を含め全面にわたって検査を行なうことができ
る。また、２値化データは、微分撮像信号に基づいて生
成しているので、緩やかに傾斜が変化するような検査対
象物でも、容易に良否判別を行なうことができ、製品形
状に左右されることがなく、表面検査を行なうことがで
きる。According to the present invention, since the binarized data of the contour portion of the inspection object and the binarized data of the background portion of the inspection object are the same in the case of non-defective products, it is not necessary to treat them separately. In addition, it is possible to perform the inspection over the entire surface including the contour portion of the inspection object without performing special processing such as setting a window that is an inspection range in the automatic inspection. In addition, since the binarized data is generated based on the differential image pickup signal, it is possible to easily determine whether the inspection target has a gradual inclination change or not, and it depends on the product shape. The surface inspection can be carried out without any trouble.
【図１】実施例の表面検査装置の概要構成を示すブロッ
ク図である。FIG. 1 is a block diagram showing a schematic configuration of a surface inspection device according to an embodiment.
【図２】検査準備処理を説明する図である。FIG. 2 is a diagram illustrating an inspection preparation process.
【図３】実施例の表面検査処理を説明する図である。FIG. 3 is a diagram illustrating a surface inspection process according to an embodiment.
【図４】実施例の表面検査装置を全面自動検査工程に用
いた場合の工程説明図である。FIG. 4 is a process explanatory view when the surface inspection apparatus of the embodiment is used in a full-face automatic inspection process.
【図５】従来の表面検査装置の概要構成を示すブロック
図である。FIG. 5 is a block diagram showing a schematic configuration of a conventional surface inspection device.
【図６】従来の表面検査処理を説明する図である。FIG. 6 is a diagram illustrating a conventional surface inspection process.
【図７】検査対象物であるスプーンの形状を説明する図
である。FIG. 7 is a diagram illustrating the shape of a spoon which is an inspection object.
１…表面検査装置 ２…スプーン ３…反射照明装置 ４…背景照明装置 ５…カメラ ６…処理装置 ７…ディスプレイ ８…照明制御装置 ９…入力装置 １０…微分回路 １１…２値化回路 １２…メモリ １３…制御回路 １４…光源 １５…光拡散板 DESCRIPTION OF SYMBOLS 1 ... Surface inspection device 2 ... Spoon 3 ... Reflection illumination device 4 ... Background illumination device 5 ... Camera 6 ... Processing device 7 ... Display 8 ... Illumination control device 9 ... Input device 10 ... Differentiation circuit 11 ... Binarization circuit 12 ... Memory 13 ... Control circuit 14 ... Light source 15 ... Light diffusion plate
Claims (1)
撮像信号に基づいて表面検査を行なう表面検査装置にお
いて、 前記検査対象物を前記カメラ側の第１の方向から照明す
る第１照明手段と、 前記検査対象物を当該検査対象物を介して前記第１の方
向とはほぼ逆方向から照明する第２照明手段と、 前記検査対象物の輪郭部分に相当する前記撮像信号レベ
ルが、前記検査対象物の背景部分の前記撮像信号レベル
とほぼ等しくなるように、前記第１照明手段及び前記第
２照明手段を制御して、光量調整を行なう照明制御手段
と、 前記撮像信号を微分して微分撮像信号として出力する微
分手段と、 前記微分撮像信号を２値化して２値化データとして出力
する２値化手段と、 前記２値化データに基づいて良否判別を行なう判別手段
と、 を備えたことを特徴とする表面検査装置。1. A surface inspection apparatus which images an inspection object with a camera and inspects the surface based on the obtained image pickup signal, the first illumination illuminating the inspection object from a first direction on the camera side. Means, second illuminating means for illuminating the inspection object from a direction substantially opposite to the first direction through the inspection object, and the imaging signal level corresponding to the contour portion of the inspection object, An illumination control unit that controls the first illumination unit and the second illumination unit to adjust the light amount so as to be substantially equal to the image pickup signal level of the background portion of the inspection object; and the image pickup signal is differentiated. Differentiating means for outputting a differential image pickup signal as a differential image pickup signal, a binarizing means for binarizing the differential image pickup signal and outputting it as binarized data, and a discriminating means for making a pass / fail judgment based on the binarized data. Prepared Surface inspection apparatus according to claim and.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02440493A JP3229901B2 (en) | 1993-02-12 | 1993-02-12 | Surface inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02440493A JP3229901B2 (en) | 1993-02-12 | 1993-02-12 | Surface inspection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH06242018A true JPH06242018A (en) | 1994-09-02 |
| JP3229901B2 JP3229901B2 (en) | 2001-11-19 |
Family
ID=12137236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP02440493A Expired - Lifetime JP3229901B2 (en) | 1993-02-12 | 1993-02-12 | Surface inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3229901B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006226715A (en) * | 2005-02-15 | 2006-08-31 | Dainippon Printing Co Ltd | Appearance inspection device |
| WO2012066990A1 (en) * | 2010-11-16 | 2012-05-24 | 東洋鋼鈑株式会社 | Sheet-material inspection method and sheet-material inspection device |
| WO2012067054A1 (en) * | 2010-11-16 | 2012-05-24 | 東洋鋼鈑株式会社 | Method for inspecting porous plate surface and apparatus for inspecting porous plate surface |
| JP2021189071A (en) * | 2020-06-01 | 2021-12-13 | 株式会社 システムスクエア | Inspection device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004219122A (en) * | 2003-01-10 | 2004-08-05 | Dainippon Printing Co Ltd | Inspection apparatus and inspection method for foreign matter defect |
-
1993
- 1993-02-12 JP JP02440493A patent/JP3229901B2/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006226715A (en) * | 2005-02-15 | 2006-08-31 | Dainippon Printing Co Ltd | Appearance inspection device |
| WO2012066990A1 (en) * | 2010-11-16 | 2012-05-24 | 東洋鋼鈑株式会社 | Sheet-material inspection method and sheet-material inspection device |
| WO2012067054A1 (en) * | 2010-11-16 | 2012-05-24 | 東洋鋼鈑株式会社 | Method for inspecting porous plate surface and apparatus for inspecting porous plate surface |
| JP2012107937A (en) * | 2010-11-16 | 2012-06-07 | Toyo Kohan Co Ltd | Inspection method and apparatus for plate |
| JP2012107936A (en) * | 2010-11-16 | 2012-06-07 | Toyo Kohan Co Ltd | Surface inspection method and apparatus for perforated plate |
| CN103119424A (en) * | 2010-11-16 | 2013-05-22 | 东洋钢钣株式会社 | Method for inspecting porous plate surface and apparatus for inspecting porous plate surface |
| JP2021189071A (en) * | 2020-06-01 | 2021-12-13 | 株式会社 システムスクエア | Inspection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3229901B2 (en) | 2001-11-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5444480A (en) | Method of inspecting solid body for foreign matter | |
| EP0483966B1 (en) | Method of and apparatus for inspecting a transparent or translucent article such as a bottle | |
| KR100202215B1 (en) | Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test objects | |
| JP4269005B2 (en) | Glass bottle inspection equipment | |
| JP3751345B2 (en) | Container inspection machine | |
| JP2003139523A (en) | Surface defect detecting method and surface defect detecting device | |
| JPWO2004036198A1 (en) | Method and apparatus for creating reference image in glass bottle inspection apparatus | |
| JP2002513463A (en) | System and method for detecting stress in a molded container | |
| JPH06294749A (en) | Flaw inspection method for plat glass | |
| JP3229901B2 (en) | Surface inspection equipment | |
| JPH0634573A (en) | Bottle inspector | |
| JP3155106B2 (en) | Bottle seal appearance inspection method and apparatus | |
| JPH02257044A (en) | bottle inspection equipment | |
| JP3289801B2 (en) | Surface inspection equipment | |
| CN116773537A (en) | Appearance inspection device for ring-shaped products | |
| JPH06118026A (en) | Method for inspecting vessel inner surface | |
| JPH05203584A (en) | Device for detecting characteristic amount on work surface | |
| JP2002303583A (en) | Inspection method for container and inspection device for container | |
| JPH07104287B2 (en) | Inspection method for minute defects of transparent object with curved surface | |
| JPH06160065A (en) | Chip inspection device | |
| JPH10160676A (en) | Rice grain inspection device | |
| JP3149336B2 (en) | Optical member inspection device | |
| JP2818347B2 (en) | Appearance inspection device | |
| JPH04270951A (en) | Method for inspecting bottle | |
| JPH06160290A (en) | System and apparatus for inspecting foreign matter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080907 Year of fee payment: 7 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090907 Year of fee payment: 8 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090907 Year of fee payment: 8 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Year of fee payment: 9 Free format text: PAYMENT UNTIL: 20100907 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110907 Year of fee payment: 10 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110907 Year of fee payment: 10 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Year of fee payment: 11 Free format text: PAYMENT UNTIL: 20120907 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Year of fee payment: 11 Free format text: PAYMENT UNTIL: 20120907 |
|
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130907 Year of fee payment: 12 |
|
| EXPY | Cancellation because of completion of term | ||
| FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130907 Year of fee payment: 12 |