JPH06244935A - Fault diagnostic system for configuration equipment of electronic exchange - Google Patents

Abstract

(57) [Abstract] [Purpose] In each constituent device of an electronic exchange, avoiding a large-scale failure due to the accumulation of failures that were conventionally ignored, such as intermittent failures and transfer errors that have been retransmitted, and electronic switching and communication Improve the reliability of the net. [Configuration] In a fault diagnosis system for each constituent device of an electronic exchange, a fault history in which, each time a fault is detected, fault information such as the date and time of fault occurrence and the contents of the fault is accumulated and registered in a non-volatile memory for each occurrence point. Based on the registration unit and the registered fault information, the frequency of occurrence of faults at the same location is calculated, and if the frequency of occurrence exceeds a specified threshold, this fault is determined as a fixed fault to be reported to the abnormality monitoring device. A fixed failure determination unit is provided.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure diagnosing technique for an electronic exchange, and more particularly, it improves the maintenance performance of each device constituting a communication path system, a signal system, etc. of the electronic exchange, and makes the electronic exchange highly reliable. The present invention relates to a failure diagnosis system for an electronic exchange constituent device that is suitable for performing the above.

[0002]

2. Description of the Related Art An electronic exchange is a subscriber interface device of a communication path system (in the case of a digital type electronic exchange),
Concentration line communication device, subscriber signal device and relay line signal device of signal processing system, main memory device and central processing device of control system, and monitoring test device and abnormality monitoring device of maintenance operation system. It is composed of each device. In such an electronic exchange, in order to ensure high reliability, for example,
The Institute of Electronics, Information and Communication Engineers, "Electronic Information and Communication Handbook" (1
1988, published by Ohmsha, Inc., pages 2158-215.
As described on page 9, a failure search for each component is performed.

Conventionally, when a failure occurs in each device of an electronic exchange, each device reports a failure, which has occurred in its own device, to an abnormality monitoring device by a failure reporting section provided in each device. The abnormality monitoring device that has received the report switches the failed device to the standby device and disconnects it from the operating system by the failure processing program, and outputs a failure message such as the failed device name and the failure content. The maintenance person activates a diagnostic program for the faulty device indicated by the fault message, diagnoses the faulty device, and replaces and repairs the faulty part based on the diagnostic result. After the repair is completed, the repair confirmation by the diagnostic program is performed again, and after the repair confirmation, the repaired device is returned to the operating state.

At this time, in order to determine whether the failure that has occurred is an intermittent failure that has occurred accidentally or a fixed failure (fixed failure) that has occurred due to a failure of the device, a maintenance person must repair the failed device. Instead, incorporate it into the operating system as it is. If the failure is not reproduced, it is regarded as an intermittent failure and the operation of the device is continued as it is. Also, when a transfer error such as an access error to the main memory or a communication error occurs, the resend process is performed, and if the resend process allows normal communication, it is not treated as an error.

Conventionally, these failures are often caused by factors such as instability of circuit elements, noise, and stacking.
Since it operates normally due to resending processing and is not detected as a failure, the maintenance person cannot grasp the latent failure status until the fixed failure. In addition, since each device does not hold such a failure state in hardware, each device alone cannot accurately grasp the state at the time of failure, and it is necessary to analyze the cause of the failure in detail and to determine the appropriate condition. Cannot perform maintenance. Therefore, it is not possible to detect and deal with intermittent failures and transfer errors that lead to fixed failures in the future at an early stage, and these failures develop into fixed failures with the lapse of time, and the electronic exchange and the communication network. There is a risk of causing large-scale disability that will affect the.

[0006]

The problem to be solved by the present invention is that, in the prior art, each device constituting the electronic exchange does not report an intermittent failure or a transfer error that has been retransmitted. It is impossible to avoid the occurrence of large-scale failures due to the accumulation of intermittent failures, transfer errors, etc., and the failure status of each device is not maintained, and all failures including intermittent failures and transfer errors Without recording the state of, detailed analysis of the failure state of the device alone,
The point is that the cause of failure cannot be accurately investigated and appropriate maintenance cannot be performed. An object of the present invention is to solve these problems of the prior art, avoid a large-scale failure due to the accumulation of unreported failures, improve the failure analysis accuracy at the time of maintenance of each device, and improve the maintenance performance. Another object of the present invention is to provide a failure diagnosis system for an electronic exchange constituent device that can improve the reliability of a communication network.

[0007]

In order to achieve the above object, a failure diagnosis system for an electronic exchange composing apparatus according to the present invention comprises: (1) a communication path system of an electronic exchange for making an exchange connection between a plurality of accommodated lines; In the failure diagnosis system of each component that configures the signal system, etc., detects the faults that occurred and faults such as transfer errors, and reports them to the fault monitoring device that controls fault measures such as disconnection from the operating system ,
Each time a failure is detected, at least the occurrence date and time and the content of the failure of the detected failure are accumulated in the failure history registration section for accumulating as failure information and the failure information registered in this failure information registration section. Based on the calculation of the occurrence frequency of the failure at the same occurrence location, when the occurrence frequency of this failure exceeds a predetermined threshold, a fixed failure determination unit that determines this failure as a fixed failure to be reported to the abnormality monitoring device. Is provided. (2) In the fault diagnosis system for an electronic exchange composing apparatus according to (1), the fault history registration section registers the fault information in a non-volatile memory.

[0008]

According to the present invention, each device constituting the electronic exchange has a non-volatile memory provided in each device when an error such as an intermittent failure or a transfer error caused by retransmission processing occurs.
The details of the failure, the date and time of occurrence, etc. are recorded for each occurrence location. Then, when the next failure occurs, the occurrence frequency and the occurrence frequency of the same past failure that has been recorded and accumulated up to the previous time are referenced to diagnose the occurrence frequency. And in a certain period,
When the same intermittent failure or transfer error occurs a certain number of times, the failure is reported to the abnormality monitoring device. As a result, the abnormality monitoring device can detect frequent intermittent failures and transfer errors before developing into a large-scale failure due to accumulation. Further, based on the failure information collected in the non-volatile memory of each device, the failure state of each device can be accurately grasped, and the detailed cause of the failure can be analyzed.

[0009]

Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of a configuration relating to the present invention of a failure diagnosis system for an electronic exchange constituent device of the present invention. In the figure, reference numerals 1 to 3 constitute a communication path system and a signal system of an electronic exchange, and constituent devices 4 for diagnosing a failure according to the present invention are designated by 4 in response to a failure report from each constituent device 1 to 3. , An abnormality monitoring device that separates a faulty device from the operating system and controls failure measures such as switching of a spare device (not shown).

Each of the constituent devices 1 to 3, as represented by the constituent device 1, represents a failure that detects a failure that has occurred in itself and a failure such as an access error to the main memory or a transfer error such as a communication error. A failure history in which the detection unit 5 and, every time a failure is detected by the failure detection unit 5, the failure occurrence date and time, the failure content, and the like are accumulated and registered in the nonvolatile memory 6 as failure information for each occurrence location. Based on the failure information registered in the registration unit 7 and the non-volatile memory 6, the failure occurrence frequency at the same occurrence location is calculated, and when the occurrence frequency of the failure exceeds a predetermined threshold, the failure is abnormally monitored. A failure diagnosis system including a fixed failure determination unit 8 that determines a fixed failure to be reported to the device, and a failure reporting unit 9 that reports a failure determined by the fixed failure determination unit 8 as a fixed failure to the abnormality monitoring device. Equipped with To have.

In the component device 1 having such a configuration, when a failure (not shown) or a transfer error occurs in a circuit (not shown), the failure detector 5 detects this failure. When the fault detection unit 5 detects this fault, the fault history registration unit 7 registers information (fault information) regarding this fault in the non-volatile memory 6. In registering the failure information in the non-volatile memory 6, the failure history registration unit 7 records similar failures that have occurred up to now, for example, for each failure at the same occurrence location, the content of the failure, the occurrence date and time, and the like. To do. As a result, the failure information for each occurrence location is accumulated and registered in the non-volatile memory 6. Further, the failure history registration unit 7 adds +1 to the number of times of occurrence of failures at the same past occurrence location recorded and accumulated up to the previous time, so that the number of times of occurrence is also stored in the nonvolatile memory 6. Record.

In this way, based on the registered contents of the non-volatile memory 6 in which the failure information generated in each circuit is registered,
The fixed failure determination unit 8 calculates the frequency of occurrence of a newly generated failure. That is, the occurrence frequency of a failure in a predetermined period in the circuit is calculated based on the occurrence date and time of each failure occurring in the same location (circuit) and the number of occurrences. Then, when the same intermittent failure or transfer error occurs a certain number of times in a certain period and the occurrence frequency exceeds a predetermined threshold, the fixed failure determination unit 8 notifies the failure to the abnormality monitoring device 4. Determined as a fixed fault to report. Based on the fixed failure determination result by the fixed failure determination unit 8, the failure reporting unit 9 reports the fixed failure to the abnormality monitoring device 4. At this time, the failure reporting unit 9 reports all failure information registered in the non-volatile memory 6 and related to this failure. In response to the report from the failure reporting unit 9, the abnormality monitoring device 4 disconnects the constituent device from the operating system and performs failure countermeasure control such as switching of a spare device (not shown).

As described above, an intermittent failure that has not been conventionally treated as a failure, a transfer error that has been retransmitted, and the like are also reported to the anomaly monitoring device 4, so that these intermittent failures and transfer errors are accumulated. It is possible to avoid a large-scale failure. Further, since all the failure information is collected in the non-volatile memory, the failure status of each of the constituent devices 1 to 3 can be accurately grasped even with the device alone taken out from the electronic exchange, and the detailed analysis of the cause of the failure can be performed. It can be performed.

FIG. 2 is an explanatory diagram showing an embodiment of the memory configuration of the nonvolatile memory in FIG. 1 according to the present invention.
The nonvolatile memory 6 of the present embodiment is largely divided into a common management information area 20 for registering statistical information of each failure and an individual failure collection area 21 for registering detailed information such as date and time of occurrence of each failure and details of the failure. It has a separate memory structure.
The common management information area 20 is divided into an 8-bit intermittent failure area 22 and a transfer error area 23, and has a size of 8 bits × 128.

In the intermittent failure area 22, the abnormality monitoring device 4 of FIG. 1 was once reported, but the number of occurrences of failures determined to be intermittent failures by the reproduction test is 2b for each occurrence location.
It is recorded in the individual counters (MPUa to NETa) of it, and the total number of occurrences of these individual counters (MPUa to NETa) is recorded in the common counter (COMa) of 4 bits. Further, in the transfer error area 23, the number of transfer error occurrences is generated when a communication error or the like occurs, or when communication is normally performed by the resending process despite the occurrence of the communication error or the like. 2 for each location
It is recorded in the individual counters (MPUb to NETb) of bit, and the total number of occurrences of these individual counters (MPUb to NETb) is recorded in the common counter (COMb) of 4 bits.

In this embodiment, in the intermittent failure area 22 and the transfer error area 23, each individual counter is a microprocessor counter (MPUa in the figure,
MPUb), driver counter (DRV in the figure)
a, described as DRVb), memory counter (ME in the figure)
Ma and MEMb), bus control circuit counters (BUSa and BUSb in the figure), protocol processing circuit counters (PROa and PROb in the figure), inter-device communication circuit counters (NETa in the figure) , NETb)).

When a failure occurs, the failure history registration unit 7 in FIG.
b and individual counters (MPUa to NETa, MP
+1 is added and recorded in the area of the corresponding circuit unit (Ub to NETb). At this time, the individual failure collection area 21
The failure history registration unit 7 in FIG. 1 records the date and time of occurrence and the details of the failure, and the detailed information of the failure ((1) to
(N)) is stored. Hereinafter, using the following FIG.
The operation of recording failure information in the nonvolatile memory 6 having such a configuration will be described.

FIG. 3 is an explanatory diagram showing an embodiment of the operation of recording the failure information in the nonvolatile memory of the failure history registration section in FIG. This figure shows a common counter 31 (common counters COMa and COMb in FIG. 2 when a failure occurs).
2) and individual counters 32 and 33 (individual counters MPUa to NETa, MPUb to NE in FIG. 2).
Tb) or the flow of recording information in the individual failure collection area 21. A in the figure
When a failure occurs in the device at the time of, the failure history registration unit 7 in FIG. 1 causes the common counter 31 and the corresponding areas of the individual counters 32 and 33 provided for each circuit to
+1 is added to the number of times of failure occurrence so far and recorded (at the time point B in the figure), and the individual failure collection area 21 is indexed based on the numerical value of the common counter 31 (at the time point C in the figure). ), And record it in the corresponding failure detailed information area (at the point of D in the figure).

In this way, the individual counters 32, 3
3 and the information recorded in the individual failure collection area 21, the fixed failure determination unit 8 in FIG. 1 analyzes the newly generated failure and sets the number of times this failure has occurred within a certain period in advance. If the threshold value exceeds the threshold, the failure is determined as a fixed failure, and the failure monitoring unit 4 in FIG. 1 is notified via the failure reporting unit 9 in FIG. 1 (time point E in the drawing).

By recording the collected fault information in the non-volatile memory, the recorded fault information is retained even when the failed component device is removed from the electronic exchange and the power supply is cut off. It By this,
Even the constituent device alone can read the history of the failure state, analyze the details of the failure, and accurately determine the cause of the failure. Next, the operation according to the present invention by the failure diagnosis system for the constituent device 1 in FIG. 1 will be described based on the flowchart in FIG.

FIG. 4 is a flow chart showing an embodiment of the processing operation according to the present invention by the failure diagnosis system for the constituent devices in FIG. During normal operation (step 401), when the failure detection unit 5 in FIG. 1 detects a failure such as a failure or a transfer error (step 40).
2), the fault history registration section 7 of FIG. 1 records the detailed information of this fault in the individual failure collection area 21 set in the nonvolatile memory 6 shown in FIG.
The counter of the common management information area 20 set in the non-volatile memory 6 shown in 1 is incremented by +1 and the number of failures is recorded (step 403).

Then, by the fixed fault judging section 8 of FIG.
In this way, the number of failure occurrences recorded in the common management information area 20 of the non-volatile memory 6 shown in FIG. 2, the occurrence date and time of the failure recorded in the individual failure collection area 21, the detailed failure content, etc. Whether the fault is a fixed fault to be reported by referring to the detailed information in the past and whether the number of occurrences of this fault, transfer error, etc., exceeds a preset threshold value within a certain period. Is determined (step 404). If it is not a fixed failure, it is judged to be an intermittent failure or a transfer error of a retransmission processing target, and the processing ends (step 408). If it exceeds the threshold value, it is determined as a fixed failure (step 405), and detailed information of the failure recorded in the individual failure collection area 21 of the nonvolatile memory 6 shown in FIG. 2 is collected (step 40).
6), the fault reporting unit 9 of FIG. 1 notifies the abnormality monitoring device 4 of FIG. 1 (step 407) and ends the process (step 408). It should be noted that after such processing is completed, as shown in FIG.
The abnormality monitoring device 4 prompts the maintenance person to replace the component device that has reported the failure.

As described above with reference to FIGS. 1 to 4, in the failure diagnosis system for the electronic exchange constituent devices of this embodiment, each constituent device autonomously determines its own failure state. It is possible to efficiently deal with intermittent failures that will become fixed and latent in the future, transfer errors that have been retransmitted, and so on. This makes it possible to quickly deal with failures such as intermittent failures and transfer errors that were not conventionally treated as failures that require repair, and before these failures become latent and become large-scale failures. The maintenance person can be notified.

Further, since information on each fault state that has occurred is recorded in the non-volatile memory, the state of each fault can be analyzed in detail, and the cause of the fault can be accurately grasped. Faults such as errors can be found early and the quality of hardware can be improved. The present invention is shown in FIGS.
The embodiment is not limited to the embodiment described with reference to FIG. 4, and various modifications can be made without departing from the spirit of the invention.

[0025]

According to the present invention, each device constituting an electronic exchange judges an intermittent failure that may develop into a large-scale failure or a transfer error that has been retransmitted, and reports it to the abnormality monitoring apparatus. It is possible to prevent the occurrence of a large-scale failure, and the device itself records and retains the status information of each failure that occurred in its own device, and can be used during maintenance of the device alone. It is possible to improve the failure analysis accuracy and improve the maintenance performance, and it is possible to improve the reliability of the electronic exchange and the communication network.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of a configuration relating to the present invention of a failure diagnosis system for an electronic exchange constituent device of the present invention.

FIG. 2 is an explanatory diagram showing an example of a storage configuration according to the present invention of the nonvolatile memory in FIG.

FIG. 3 is an explanatory diagram showing an example of an operation of recording failure information in a nonvolatile memory of a failure history registration unit in FIG.

4 is a flow chart showing an embodiment of the processing operation according to the present invention by the failure diagnosis system for the constituent devices in FIG.

[Explanation of symbols]

 1-3 Component devices 4 Abnormality monitoring device 5 Fault detection unit 6 Nonvolatile memory 7 Fault history registration unit 8 Fixed fault determination unit 9 Fault reporting unit 20 Common management information area 21 Individual fault collection area 22 Intermittent fault area 23 Transfer error Area 31 Common counter 32, 33 Individual counter

Claims (2)

[Claims] 1. A communication path system, a signal system, etc. of an electronic exchange for performing an exchange connection between a plurality of accommodated lines, and
In the failure diagnosis system of each component, which detects a failure such as a failure that has occurred and a failure such as a transfer error, and reports it to an abnormality monitoring device that controls failure measures such as disconnection from the operating system, each time the above failure is detected, At least the date and time of occurrence of the detected fault and the contents of the fault are cumulatively registered as fault information for each occurrence point, and a fault history registration unit for registering the fault information at the same occurrence point based on the fault information registered by the fault information registration unit. A fixed failure determination means for calculating a failure occurrence frequency and determining the failure as a fixed failure to be reported to the abnormality monitoring device when the failure occurrence frequency exceeds a predetermined threshold is provided. Fault diagnosis system for electronic exchange constituent devices. 2. The fault diagnosis system for an electronic exchange constituent device according to claim 1, wherein the fault history registration means is:
A failure diagnosis system for an electronic exchange constituent device, wherein the failure information is registered in a non-volatile memory.