JPH0632929B2 - Method of manufacturing thermal head - Google Patents
Method of manufacturing thermal headInfo
- Publication number
- JPH0632929B2 JPH0632929B2 JP60139059A JP13905985A JPH0632929B2 JP H0632929 B2 JPH0632929 B2 JP H0632929B2 JP 60139059 A JP60139059 A JP 60139059A JP 13905985 A JP13905985 A JP 13905985A JP H0632929 B2 JPH0632929 B2 JP H0632929B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- plating
- thermal head
- conductor
- conductor layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/315—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
- B41J2/32—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
- B41J2/335—Structure of thermal heads
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Electronic Switches (AREA)
Description
【発明の詳細な説明】 〔発明の利用分野〕 本発明は、サーマルヘツドに係り、特に複数の発熱抵抗
体素子を同一基板上に直線的に配置し、記録すべき情報
に従い、この発熱抵抗体素子を通電、発熱させて感熱記
録紙に発色記録させて、あるいはインクリボンを介して
普通紙に転写記録させるサーマルヘツドに関する。Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal head, and in particular, a plurality of heating resistor elements are linearly arranged on the same substrate and the heating resistor elements are arranged according to information to be recorded. The present invention relates to a thermal head in which an element is energized and heated to color-record on a thermosensitive recording paper or transfer recording is performed on plain paper via an ink ribbon.
サーマルヘツドの一般的な構造は、第4図に示すよう
に、絶縁性基板1上に断面形状が略円弧状の部分グレー
ズ層2が設けられ、その上に発熱抵抗体層3が積層さ
れ、この発熱抵抗体層3上にアルミニウム等よりなる導
体層4が形成され、更にこの導体層4上に耐酸化層5、
耐摩耗層6が積層されている。導体層4は、部分グレー
ズ層2上でその一部が取り除かれることによつて、給電
電極となり、この導体層4が、取り除かれた部分の発熱
抵抗体層3は発熱部3′となる。そして導体層4の端子
部は、アルミニウムが半田付性が悪いため、その表面に
易半田性の金属(例えばスズあるいはスズ合金)がメツ
キされている。As shown in FIG. 4, the general structure of the thermal head is that an insulating substrate 1 is provided with a partial glaze layer 2 having a substantially arcuate cross section, and a heating resistor layer 3 is laminated thereon. A conductor layer 4 made of aluminum or the like is formed on the heating resistor layer 3, and an oxidation resistant layer 5 is further formed on the conductor layer 4.
A wear resistant layer 6 is laminated. By removing a part of the conductor layer 4 on the partial glaze layer 2, the conductor layer 4 becomes a power supply electrode, and the portion of the heat generating resistor layer 3 from which the conductor layer 4 is removed becomes a heat generating portion 3 '. Since the terminal portion of the conductor layer 4 has poor solderability with aluminum, the surface of the terminal portion is plated with an easily solderable metal (for example, tin or tin alloy).
そして従来、サーマルヘツドにおける端子部10の形成
方法としては、第3図に示すように、市販されているZ
n置換メツキ液を用いて、導体層4が形成されたサーマ
ルヘツドを市販メツキ液にデイツプして、アルミニウム
を置換しながらZn置換層を形成し、更に無電解メツキ
にてNiメツキを行ない、そしてこのNiメツキ層上
に、Sn又はSn合金を電解メツキして半田付性の良い
端子としている。As a conventional method for forming the terminal portion 10 in the thermal head, as shown in FIG.
Using the n-substituted plating solution, the thermal head having the conductor layer 4 formed thereon is dipped into a commercially available plating solution to form a Zn substitution layer while substituting aluminum, and further Ni plating is performed by electroless plating, and Sn or Sn alloy is electrolytically plated on the Ni plating layer to form a terminal having good solderability.
このような従来のサーマルヘツドにおいては、導体層4
は1.5〜2.0μmと大変薄いものであるため、バル
クに比べて密度が低くなつている。また、基板はアルミ
ナ基板を用いるため、導体層4の表面の凹凸が激しくA
l導体層のエツチングレートは高いものである。In such a conventional thermal head, the conductor layer 4
Has a very low density of 1.5 to 2.0 μm, and therefore has a lower density than the bulk. Also, since the substrate is an alumina substrate, the surface of the conductor layer 4 has severe irregularities.
The etching rate of the 1-conductor layer is high.
また第3図の様に市販のZn置換メツキ法で処理を行な
う場合、Zn層を緻密に形成するためには、約1分間の
デイツプを2回行なつてZn層を形成する必要がある。
というのは1回のデイツプで生じたZn置換膜は粒子が
荒くて島状に付着して緻密性に乏しいため、再度同一液
にほぼ同一時間デイツプしてZn置換をやり直すことに
より、かなり緻密な良好なZn膜が形成できることが判
つているからである。Further, when the treatment is carried out by the commercially available Zn substitution plating method as shown in FIG. 3, it is necessary to form the Zn layer by performing the dipping for about 1 minute twice twice in order to form the Zn layer densely.
This is because the Zn-substituted film formed by one-time dipping has coarse particles and adheres like islands and is poor in denseness. This is because it is known that a good Zn film can be formed.
このように2回にわたつてデイツプを行なうことによ
り、Al導体層も2回エツチングされることになり、
1.5〜2.0μmのAl層がほとんど消失して抵抗体
層が露出してくることがあり、Niメツキの密着強度不
良の問題を生じやすい。Niメツキの密着強度不良の問
題を生じやすい、このため、Al単層構造の導体層で端
子部を形成する場合にはAl膜厚は少くとも2μmが必
要である。As described above, the Al conductor layer is also etched twice by performing the etching twice.
The Al layer having a thickness of 1.5 to 2.0 μm may almost disappear and the resistor layer may be exposed, and the problem of poor adhesion strength of Ni plating is likely to occur. The problem of poor adhesion strength of Ni plating is likely to occur. Therefore, when forming the terminal portion with a conductor layer having an Al single layer structure, the Al film thickness is required to be at least 2 μm.
このように、Al導体層を厚く形成する必要があり、そ
の場合第4図のように、ヘツド発熱部のAl導体が2μ
mの突出部となり発熱部3′のへこみが大きくなる。従
つて熱記録媒体との圧接が弱まり印加エネルギーを大き
くしないと良好な品質が得られない問題があつた。な
お、第4図において、7はNiメツキ層、8はSnメツ
キ層、9はヘツド面、10は端子部である。In this way, it is necessary to form the Al conductor layer thick, and in that case, as shown in FIG. 4, the Al conductor of the head heating portion is 2 μm.
It becomes a projecting part of m and the dent of the heat generating part 3'becomes large. Therefore, the pressure contact with the thermal recording medium is weakened, and good quality cannot be obtained unless the applied energy is increased. In FIG. 4, 7 is a Ni plating layer, 8 is a Sn plating layer, 9 is a head surface, and 10 is a terminal portion.
本発明は上述の問題点に鑑みてなされたものであり、そ
の目的とするところは、Al導体層からなる端子部のメ
ツキ製造方法を変更することにより、Al導体層の膜厚
を薄く形成しても端子部のメツキ品質に異常のない製造
歩留りの高いサーマルヘツドの製造方法を提供すること
にある。The present invention has been made in view of the above problems, and an object of the present invention is to form a thin film of the Al conductor layer by changing the method for manufacturing the plating of the terminal portion made of the Al conductor layer. However, it is still another object of the present invention to provide a method for manufacturing a thermal head having a high manufacturing yield without abnormalities in the plating quality of terminals.
かかる目的を達成するために、本発明のサーマルヘツド
の製造方法は、従来の端子メツキプロセスにおいて、N
iメツキ後加熱処理を追加したことを特徴とするもので
ある。In order to achieve such an object, the method of manufacturing a thermal head of the present invention uses the conventional terminal plating process in which N
It is characterized in that a heat treatment after i plating is added.
〔発明の実施例〕 以下、本発明の実施例を図面とともに説明する。Embodiments of the Invention Embodiments of the present invention will be described below with reference to the drawings.
第1図に示すように、アルミナ基板1上に部分的にグレ
ーズ層2の形成したのち、その上にTaをArとN2ガ
スのリアクテイブ,スパツタリング法により0.05〜
0.2μmの厚みで、Ta2Nからなる発熱抵抗体層3
を形成する。次に約1μmの厚みでAlからなる導体層
4を設け、そして、フオトリソ技術により発熱抵抗体
部、導体部のパターンを形成し、端子部10をマスキン
グして約2μm厚みのSiO2膜よりなる耐酸化層5並
びに約5μm厚みのTa2O5よりなる耐摩耗層6をス
パツタリングにより形成して、ヘツド面9を製作する。As shown in FIG. 1, after a glaze layer 2 is partially formed on an alumina substrate 1, Ta is deposited on the glaze layer 2 in an amount of 0.05 to 0.05 by a reactive and sputtering method of Ar and N 2 gas.
Heating resistor layer 3 having a thickness of 0.2 μm and made of Ta 2 N
To form. Next, a conductor layer 4 made of Al having a thickness of about 1 μm is provided, and a pattern of a heating resistor portion and a conductor portion is formed by the photolithography technique, and the terminal portion 10 is masked to form a SiO 2 film having a thickness of about 2 μm. the wear-resistant layer 6 of Ta 2 O 5 oxidation layer 5 and about 5μm thick is formed by Supatsutaringu, fabricating a head face 9.
次に第2図に示す工程で端子部10の範囲域でのAl層
に選択的にZn置換液(商品名 ボンダル液)に2回デ
イツプした後、無電解Niメツキを行い、Ni層7を約
2μmの厚みで端子全面に形成する。そして、クレオン
等で乾燥させてからベルト炉にて150℃で5分間、2
00℃で1分間、250℃で30秒間、300℃で10
秒間のいずれかの条件で加熱処理を行なう。しかる後N
i層を包囲してSnを電解メツキにより形成して、端子
部10を製作して外部回路(図示せず)との接続を行う
ものである。Next, in the process shown in FIG. 2, the Al layer in the area of the terminal portion 10 is selectively dipped twice in a Zn replacement solution (trade name: Bondal solution), and then electroless Ni plating is performed to form the Ni layer 7. It is formed on the entire surface of the terminal with a thickness of about 2 μm. Then, after drying with cleon, etc., in a belt furnace at 150 ° C. for 5 minutes, 2
1 minute at 00 ℃, 30 seconds at 250 ℃, 10 minutes at 300 ℃
Heat treatment is performed under any condition for 1 second. After a while N
The i layer is surrounded, Sn is formed by electrolytic plating, the terminal part 10 is manufactured, and it connects with an external circuit (not shown).
本実施例によれば、ヘツド面9の導体層4をAl又はA
l合金の単層蒸着で1μmと薄く形成するため、成膜材
料,成膜時間,メンテナンス時間の削減がはかられる。
またZn置換時のAlエツチングにより1μmのAl導
体の大半が消失するが、その際にAlはエツチング液に
溶解するとき発生するH2ガスが強力な還元作用を有す
るため、抵抗体層3の不動態膜が除去されて無電解Ni
メツキ液中で、Niが大変付着しやすくなる特性を示
す。一見この状態で良好なNiメツキができたように見
えるが、Ta2NとNi間の密着力は大変弱いものであ
る。しかしこれを前述の加熱条件で加熱すると極めて密
着力が向上し、従来のAl/Zn/Niの熱処理なしに
比べて格段の強度を保持することが判明した。According to this embodiment, the conductor layer 4 on the head surface 9 is made of Al or A.
Since it is formed as thin as 1 μm by the single layer vapor deposition of 1-alloy, the film forming material, the film forming time, and the maintenance time can be reduced.
Also, most of the 1 μm Al conductor disappears due to Al etching at the time of Zn substitution, but at that time, since H 2 gas generated when Al dissolves in the etching liquid has a strong reducing action, the failure of the resistor layer 3 is impaired. The dynamic film is removed and electroless Ni
It exhibits the property that Ni is very likely to adhere in the plating solution. At first glance, it seems that good Ni plating was formed in this state, but the adhesive force between Ta 2 N and Ni is very weak. However, it has been found that when this is heated under the above-mentioned heating conditions, the adhesion is remarkably improved and the strength is remarkably maintained as compared with the conventional case without heat treatment of Al / Zn / Ni.
この加熱処理は、従来のAl/Zn/Niにおいても顕
著な効果を示し、端子部10がAlが消失してTa2N
となつても、Alが残留していても、著しく密着強度が
高いものとなる。またNiメツキ後の空気中における加
熱により、Ni表面に酸化膜が生じてSnメツキ等のメ
ツキ性が低下する恐れがあるが、前述の加熱条件下にお
いては全く異常は発生せず、これまで不安定になりやす
かつたNiメツキの密着強度を顕著に安定化できること
が実験の結果判明した。This heat treatment shows a remarkable effect even in the case of the conventional Al / Zn / Ni, and Al disappears in the terminal portion 10 and Ta 2 N
However, even if Al remains, the adhesive strength is remarkably high. Also, heating in air after Ni plating may cause an oxide film on the Ni surface to reduce the plating property such as Sn plating, but under the above-mentioned heating conditions, no abnormality occurs at all. As a result of experiments, it was found that the adhesion strength of the Ni plating, which is likely to be stable, can be remarkably stabilized.
上述のごとく本発明は、最もローコストなAlを導体材
料として用い、端子部のAl膜厚が従来の略半分になつ
ても、従来のメツキプロセスで無電解Niメツキのあと
に150〜300℃の温度条件で加熱処理を追加するこ
とによつて、Ta2N又はAlのいずれに対してもNi
メツキの密着力が極めて安定化できる。As described above, the present invention uses the lowest cost Al as the conductor material, and even if the Al film thickness of the terminal portion is about half that of the conventional one, the conventional plating process is performed at 150 to 300 ° C. after the electroless Ni plating. By adding the heat treatment under the temperature condition, Ni is added to both Ta 2 N and Al.
The adhesion of the beetle can be extremely stabilized.
このようにAl導体の膜厚を薄くしても、端子部の形成
が容易に信頼性良く行えるため、成膜材料,成膜時間,
メンテナンス時間の大幅削減によるコスト低減と、印字
品質に敏感に影響する発熱部の突出量が大幅に増大する
ことによる熱効率アツプから印字エネルギーが低減でき
る。また発熱部の段差が小さくなるため、機械的強度バ
ラツキが少なくなるという実用上の効果がある。Even if the film thickness of the Al conductor is reduced as described above, the terminal portion can be formed easily and reliably.
Printing energy can be reduced due to cost reduction due to a drastic reduction in maintenance time, and thermal efficiency up due to a drastic increase in the amount of protrusion of the heat generating portion that sensitively affects printing quality. Further, since the step of the heat generating portion is reduced, there is a practical effect that variations in mechanical strength are reduced.
【図面の簡単な説明】 第1図は本発明の実施例を示すサーマルヘツドの断面
図、第2図は本発明のサーマルヘツドの製造工程図、第
3図は従来のサーマルヘツドの製造工程図、第4図は従
来例のサーマルヘツドの断面図である。 1……アルミナ基板、2……部分グレーズ層、3……抵
抗体層、3′……発熱部、4……導体層、7……Niメ
ツキ層、8……Snメツキ層、9……ヘツド面、10…
…端子部。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a sectional view of a thermal head showing an embodiment of the present invention, FIG. 2 is a manufacturing process drawing of the thermal head of the present invention, and FIG. 3 is a manufacturing process drawing of a conventional thermal head. FIG. 4 is a sectional view of a conventional thermal head. 1 ... Alumina substrate, 2 ... Partial glaze layer, 3 ... Resistor layer, 3 ... Heat generating part, 4 ... Conductor layer, 7 ... Ni plating layer, 8 ... Sn plating layer, 9 ... Head side, 10 ...
… Terminal part.
Claims (1)
ーズ層上に発熱抵抗体層と、この発熱抵抗体層に給電す
るアルミニウム又はアルミニウム合金からなる導体層
と、これらの発熱抵抗体層及び導体層を保護する保護膜
とを積層してなる構成のサーマルヘツドであつて、前記
導体層の端子部にニツケル又はニツケル合金からなる下
地鍍着層を形成した後、150〜300℃の温度条件で
加熱処理を施し、更にその下地鍍着層上に、易半田付性
の低融点金属層を形成したことを特徴とするサーマルヘ
ツドの製造方法。1. A glaze layer is provided on an insulating substrate, a heating resistor layer is formed on the glaze layer, a conductor layer made of aluminum or an aluminum alloy for supplying power to the heating resistor layer, and these heating resistor layers. A thermal head having a structure in which a conductor film and a protective film for protecting the conductor layer are laminated, and a base plating layer made of nickel or nickel alloy is formed at a terminal portion of the conductor layer, and then the temperature is set to 150 to 300 ° C. A method for producing a thermal head, characterized in that a heat treatment is performed under the conditions, and a low melting point metal layer having solderability is formed on the underlying plating layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60139059A JPH0632929B2 (en) | 1985-06-27 | 1985-06-27 | Method of manufacturing thermal head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60139059A JPH0632929B2 (en) | 1985-06-27 | 1985-06-27 | Method of manufacturing thermal head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61297160A JPS61297160A (en) | 1986-12-27 |
| JPH0632929B2 true JPH0632929B2 (en) | 1994-05-02 |
Family
ID=15236527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60139059A Expired - Fee Related JPH0632929B2 (en) | 1985-06-27 | 1985-06-27 | Method of manufacturing thermal head |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0632929B2 (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61182964A (en) * | 1985-02-09 | 1986-08-15 | Alps Electric Co Ltd | thermal head |
-
1985
- 1985-06-27 JP JP60139059A patent/JPH0632929B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61297160A (en) | 1986-12-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |