JPH0664737B2 - Method for manufacturing magnetic thin film - Google Patents
Method for manufacturing magnetic thin filmInfo
- Publication number
- JPH0664737B2 JPH0664737B2 JP8377585A JP8377585A JPH0664737B2 JP H0664737 B2 JPH0664737 B2 JP H0664737B2 JP 8377585 A JP8377585 A JP 8377585A JP 8377585 A JP8377585 A JP 8377585A JP H0664737 B2 JPH0664737 B2 JP H0664737B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- thin film
- strontium ferrite
- strontium
- magnetic thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims description 10
- 238000004519 manufacturing process Methods 0.000 title claims description 6
- 239000010409 thin film Substances 0.000 title claims description 6
- 239000010408 film Substances 0.000 claims description 27
- 229910052712 strontium Inorganic materials 0.000 claims description 25
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 claims description 24
- 229910000859 α-Fe Inorganic materials 0.000 claims description 24
- 230000005415 magnetization Effects 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 13
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 12
- 239000007789 gas Substances 0.000 claims description 7
- 239000012495 reaction gas Substances 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 2
- 229910052742 iron Inorganic materials 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 239000001301 oxygen Substances 0.000 claims description 2
- 229910052760 oxygen Inorganic materials 0.000 claims description 2
- -1 alcohol compound Chemical class 0.000 claims 2
- 125000000217 alkyl group Chemical group 0.000 claims 2
- 150000004703 alkoxides Chemical class 0.000 claims 1
- 238000000354 decomposition reaction Methods 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- 239000011261 inert gas Substances 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 7
- 229910000684 Cobalt-chrome Inorganic materials 0.000 description 6
- 239000010952 cobalt-chrome Substances 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000004642 Polyimide Substances 0.000 description 4
- AJCDFVKYMIUXCR-UHFFFAOYSA-N oxobarium;oxo(oxoferriooxy)iron Chemical compound [Ba]=O.O=[Fe]O[Fe]=O.O=[Fe]O[Fe]=O.O=[Fe]O[Fe]=O.O=[Fe]O[Fe]=O.O=[Fe]O[Fe]=O.O=[Fe]O[Fe]=O AJCDFVKYMIUXCR-UHFFFAOYSA-N 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 3
- 239000012159 carrier gas Substances 0.000 description 3
- 238000001771 vacuum deposition Methods 0.000 description 3
- WAIPAZQMEIHHTJ-UHFFFAOYSA-N [Cr].[Co] Chemical compound [Cr].[Co] WAIPAZQMEIHHTJ-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 235000019441 ethanol Nutrition 0.000 description 2
- MHKBQFNNFYZELC-UHFFFAOYSA-N ethanolate;iron(2+) Chemical compound [Fe+2].CC[O-].CC[O-] MHKBQFNNFYZELC-UHFFFAOYSA-N 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- YTBRWVXQNMQQTK-UHFFFAOYSA-N strontium;ethanolate Chemical compound CCO[Sr]OCC YTBRWVXQNMQQTK-UHFFFAOYSA-N 0.000 description 2
- 238000005979 thermal decomposition reaction Methods 0.000 description 2
- 229910000599 Cr alloy Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 239000013626 chemical specie Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- QVGXLLKOCUKJST-AKLPVKDBSA-N oxygen-19 atom Chemical compound [19O] QVGXLLKOCUKJST-AKLPVKDBSA-N 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000001376 precipitating effect Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
Landscapes
- Thin Magnetic Films (AREA)
- Chemical Vapour Deposition (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は高密度の垂直磁気記録を可能とする磁性体薄膜
の製造方法に関するものである。TECHNICAL FIELD The present invention relates to a method for producing a magnetic thin film that enables high density perpendicular magnetic recording.
従来の技術 近年磁気記録は、高密度化,ディタル化の方向へ進みつ
つある。磁気記録の方式として従来は磁気記録媒体の面
内に磁化の容易軸を持っているいわゆる面内磁化による
磁気記録方式が主であった。しかしながら本方式では記
録密度を上げれば上げるほど磁気記録媒体内の磁化方向
が互いに反発し合うように並ぶため高密度化を計るのが
困難になってきている。そこで最近磁気記録の新しい方
式として磁気記録媒体の面内に対して垂直方向に磁化容
易軸を持っているいわゆる垂直磁化による磁気記録方式
が開発され〔例えばエス・イワサキとワイ・ナカヤマ;
高密度記録のため磁気モードの分析,アイ・イー・イー
・イー,トランス,マガジン,MAG−13,5番,1272ページ,
1977年(Ar analysis for the magnetization mode for
high density magnetic recording. IEEE Trans. Mag
n. MAG−13.No.5,p.1272(1977))〕記録密度が飛躍的
に増大することが可能となった。この垂直磁気記録方式
にもちいられている記録媒体としては、コバルト−クロ
ム(Co−Cr)合金膜が主としてスパッタ法〔例えばエス
・イワサキとケイ・オオウチ:垂直磁化異方性を持つコ
バルト・クロム記録フィルム,アイ・イー・イー・イ
ー,トランス,マガジンMAG−14,5,第849ページ,1978年
(K.Ouchi:Co−Cr recording film with perpendicular
magnetic anisotropy, IEEE Trans. Magn. MAG−14,5,
849(1978))〕,真空蒸着法〔例えば杉田龍二;真空
蒸着法によるCo−Cr垂直異方性膜信学技報,MR81−5(1
981)〕等によって開発されつつある。またCo−Cr以外
にもバリウムフェライト(BaO・6Fe2O3)がスパッタ
法〔例えば星,松岡,直江,山中;対向ターゲット式ス
パッタによるC軸配向Ba−フェライト膜の構造と磁気特
性,信学論(C),J66−C,1,p.9−16(昭和58−01)〕
により得られている。2. Description of the Related Art In recent years, magnetic recording is progressing toward higher densities and digitalization. As a magnetic recording method, a magnetic recording method based on so-called in-plane magnetization, which has an easy axis of magnetization in the plane of the magnetic recording medium, has heretofore been mainly used. However, in this method, as the recording density is increased, the magnetization directions in the magnetic recording medium are arranged so as to repel each other, which makes it difficult to achieve high density. Therefore, as a new method of magnetic recording, a so-called perpendicular magnetic recording method having an easy axis of magnetization perpendicular to the in-plane of the magnetic recording medium has recently been developed [for example, S. Iwasaki and W. Nakayama;
Magnetic mode analysis for high-density recording, IEE, transformer, magazine, MAG-13, No. 5, page 1272,
1977 (Ar analysis for the magnetization mode for
high density magnetic recording. IEEE Trans. Mag
n. MAG-13.No.5, p.1272 (1977))] It has become possible to dramatically increase the recording density. As a recording medium used in this perpendicular magnetic recording system, a cobalt-chromium (Co-Cr) alloy film is mainly used as a sputtering method [for example, S. Iwasaki and Kei Ouchi: cobalt-chromium recording having perpendicular magnetization anisotropy. Film, iE, E, Trance, Magazine MAG-14, 849, 1978 (K.Ouchi: Co-Cr recording film with perpendicular
magnetic anisotropy, IEEE Trans. Magn. MAG-14,5,
849 (1978)]], vacuum evaporation method [eg Ryuji Sugita; Co-Cr vertical anisotropic film by vacuum evaporation method Technical Report, MR81-5 (1)
981)] and so on. The barium ferrite other than Co-Cr (BaO · 6Fe 2 O 3) is a sputtering method [for example star, Matsuoka, Naoe, Yamanaka; Structure and magnetic properties of C-axis oriented Ba- ferrite film by a facing target sputtering, IEICE Theory (C), J66-C, 1, p.9-16 (Showa 58-01)]
Has been obtained by.
発明が解決しようとする問題点 これらの垂直磁気記録媒体においてCo−Cr合金膜は低温
で作成することが可能であるが垂直磁化の大きさの目安
となる垂直磁気異方性がバリウムフェライトやストロン
チウムフェライトよりちいさい。そのため完全な垂直磁
化膜とはならずある程度面内の磁化成分をものこすとい
う問題がある。Problems to be Solved by the Invention In these perpendicular magnetic recording media, the Co--Cr alloy film can be formed at a low temperature, but the perpendicular magnetic anisotropy that is a measure of the magnitude of perpendicular magnetization has barium ferrite or strontium. Smaller than ferrite. Therefore, there is a problem in that the film does not become a completely perpendicular magnetic film and the in-plane magnetization component is to some extent destroyed.
また一方バリウムフェライトやストロンチウムフェライ
トは、ほぼ完全なC軸配向の膜が得られるため、ほぼ完
全な垂直磁化膜が作成できる。しかしながらバリウムフ
ェライトやストロンチウムフェライト膜を作成するのに
は、500℃以上の基板温度が必要であるため、ポリイミ
ドやアルミ上にストロンチウムフェライトやBaフェライ
トを作成することが困難である。On the other hand, since barium ferrite or strontium ferrite can be obtained as a film with almost perfect C-axis orientation, it is possible to form an almost perfect perpendicular magnetization film. However, it is difficult to form strontium ferrite or Ba ferrite on polyimide or aluminum because a substrate temperature of 500 ° C. or higher is required to form a barium ferrite or strontium ferrite film.
問題点を解決するための手段 本発明は前記問題点を解決するため、従来のスパッタ法
や真空蒸着法ではなく、プラズマ中に反応ガスを流しプ
ラズマの活性さを利用したプラズマCVD法によって、350
℃以下の低温で垂直磁気異方性の大きいストロンチウム
フェライト単相C軸配向膜から成る垂直磁化膜を製造す
る方法を提供する。Means for Solving the Problems In order to solve the above problems, the present invention does not use a conventional sputtering method or a vacuum deposition method, but a plasma CVD method utilizing a plasma CVD method in which a reactive gas is flowed in plasma to utilize 350
Provided is a method for producing a perpendicular magnetization film composed of a strontium ferrite single-phase C-axis oriented film having a large perpendicular magnetic anisotropy at a low temperature of ℃ or less.
作 用 発明者らは、プラズマCVD法を用いることによって350℃
以下の低温でストロンチウムフェライトが得られること
を見いだした。すなわちSrおよびFeを含有する金属アル
コオキサイド例えばSr(O・C2H5)2(ジエトキシ
ストロンチウム)およびFe(O・C2H5)3(ジエト
キシ鉄)をそれぞれエチルアルコール中に溶解させ、ア
ルゴン(Ar)をキャリアガスとし、酸素(O2)を反応
ガスとして、高周波プラズマ(周波数13.56MHz),電力
0.5W/cm2以上)中にこれらのガスを導入して、350℃
以下の基板上で分解析出させることによりストロンチウ
ムフェライトを生成するものである。Working inventors have found that by using the plasma CVD method
It has been found that strontium ferrite can be obtained at the following low temperatures. That is, a metal alcooxide containing Sr and Fe, for example, Sr (O.C 2 H 5 ) 2 (diethoxystrontium) and Fe (O.C 2 H 5 ) 3 (diethoxyiron) are dissolved in ethyl alcohol, Argon (Ar) as carrier gas, oxygen (O 2 ) as reaction gas, high frequency plasma (frequency 13.56MHz), power
0.5W / cm 2 or more) with these gases introduced at 350 ℃
The strontium ferrite is produced by decomposing and precipitating on the following substrate.
このように低温でストロンチウムフェライトの析出が可
能となるのは、プラズマ中においては、化学反応を低温
で引きおこす活性なラジカルやイオン等の化学種が多く
存在し、通のCVD(熱による分解析出をおこなうCVD)で
はエネルギー的におこりえない反応がプラズマ中では可
能であるためである。〔例えば薄膜ハンドブック225ペ
ージ,オーム社,昭和58年12月10日〕 また一般にプラズマCVD法は通常の熱CVD法にくらべて、
低温で酸化物,炭化物,窒化物等の高融点物質が合成で
きるばかりでなく、熱分解析出反応を伴うために低温に
おいても高純度でしかも結晶性の良い膜が得られる。そ
のためストロンチウムフェライトのような結晶の配向性
の良いことが必要でしかもそれを低温で合成するのには
最適の方法であると考えられる。In this way, it is possible to deposit strontium ferrite at low temperatures because in plasma there are many chemical species such as active radicals and ions that cause chemical reactions at low temperatures, and it is common for CVD (thermal decomposition and deposition) to occur. This is because a reaction that cannot occur energetically in the plasma CVD is possible in the plasma. [For example, page 225 of the thin film handbook, Ohmsha, Dec. 10, 1983] In general, plasma CVD is more efficient than ordinary thermal CVD.
Not only can high-melting substances such as oxides, carbides, and nitrides be synthesized at low temperatures, but a high-purity film with good crystallinity can be obtained even at low temperatures because of the thermal decomposition and precipitation reaction. Therefore, it is necessary to have good crystal orientation such as strontium ferrite, and it is considered to be the optimum method for synthesizing it at low temperature.
実施例 以下、本発明の一実施例について、図面に基づいて説明
する。図は本発明の一実施例におけるプラズマCVD装置
の概略図を示すものである。第1図において、11は反応
チャンバー、12は高周波電極、13は高周波電源、14は基
板加熱ホルダー、15は基板、16はSr(OR)2のバブラ
ー、17はFe(OR)3のバブラー、18はArキャリアガスボ
ンベ、19はO2反応ガスボンベ、20はロータリーポンプ
である。Embodiment An embodiment of the present invention will be described below with reference to the drawings. The figure shows a schematic view of a plasma CVD apparatus in an embodiment of the present invention. In FIG. 1, 11 is a reaction chamber, 12 is a high frequency electrode, 13 is a high frequency power supply, 14 is a substrate heating holder, 15 is a substrate, 16 is a Sr (OR) 2 bubbler, 17 is a Fe (OR) 3 bubbler, 18 is an Ar carrier gas cylinder, 19 is an O 2 reaction gas cylinder, and 20 is a rotary pump.
まずジエトキシストロンチウム〔Sr(O・C
2H5)2〕および、ジエトキシ鉄〔Fe(O・C
2H5)3〕をエタノール〔C2H5OH〕の入った〔Sr
(O・C2H5)2,Fe(O・C2H5)330wt%溶
液〕バブラー16,17にそれぞれ入れ、バブル用のアルゴ
ンガスをそれぞれ20cc/分および200cc/分流し、これ
らの蒸気をロータリーポンプ20によって減圧状態になっ
た反応チャンバー11内の350℃に加熱されたポリイミド
基板上に導入する。次に同じく反応ガスである酸素19を
200cc/分の流量で同じくガラス基板上に流し、反応チ
ヤンバー11内に導入する。この時のガス圧は10Torrであ
った。次いで高周波電力(13.65MHz)を500W(SW/c
m2)で60分印加し反応させた。。First, diethoxy strontium [Sr (O ・ C
2 H 5 ) 2 ] and diethoxy iron [Fe (O · C)
2 H 5 ) 3 ] in ethanol [C 2 H 5 OH] [Sr
(O · C 2 H 5 ) 2 , Fe (O · C 2 H 5 ) 3 30 wt% solution] Bubblers 16 and 17 were respectively charged, and argon gas for bubbles was flowed at 20 cc / min and 200 cc / min, respectively. The steam is introduced by the rotary pump 20 onto the polyimide substrate heated to 350 ° C. in the reaction chamber 11 which has been depressurized. Next, the same reaction gas of oxygen 19
It is also flown on the glass substrate at a flow rate of 200 cc / min and introduced into the reaction chamber 11. The gas pressure at this time was 10 Torr. Next, the high frequency power (13.65MHz) is 500W (SW / c
m 2 ) was applied for 60 minutes for reaction. .
次にこの時ポリイミド基板上に析出したストロンチウム
フェライトの膜厚は、約2.0μmであった。次にこの膜
について、X線解析、およびVSM(振動試料型磁力計)
による膜の磁気的特性を測定した。結果は、第1表,試
料番号1に示す。以下同様にして、基板温度、Sr(OR)
2,Fe(OR)3のバブラー量(Arの流量),反応チャン
バー内の圧力,高周波電力等を変化させた時の膜厚,X線
解析,VSMの結果を第1表試料番号2〜8に示す。また試
料番号9〜16は本願発明外の比較例である。Next, the film thickness of the strontium ferrite deposited on the polyimide substrate at this time was about 2.0 μm. Next, for this film, X-ray analysis and VSM (vibrating sample magnetometer)
The magnetic properties of the film according to The results are shown in Table 1, Sample No. 1. Substrate temperature, Sr (OR)
2 、 Fe (OR) 3 bubbler amount (Ar flow rate), pressure in the reaction chamber, film thickness when changing high frequency power, X-ray analysis, VSM results are shown in Table 1 Sample Nos. 2-8 Shown in. Further, sample numbers 9 to 16 are comparative examples other than the present invention.
ここでX線解析は、ストロンチウムフェライトの単相で
C軸配向が得られたかどうかを調べた。またVSMの結果
からストロンチウムフェライトの飽和磁化及びヒステリ
シス曲線(B−Hカーブ)を求めストロンチウムフェラ
イトの垂直方向の残留磁化および水平方向の残留磁化を
求めた(垂直方向の残留磁化が水平方向の残留磁化にく
らべて大きければ大きいほどよりすぐれた垂直磁化膜と
いえる) なお特許請求の範囲において、基板温度を350℃以下と
限定したのは、350℃以上になると基板材料として使用
されるポリイミドやAl等において熱的変形や劣化がおこ
り良質のストロンチウムフェライト膜が得られないため
である。Here, the X-ray analysis investigated whether or not the C-axis orientation was obtained in the single phase of strontium ferrite. Further, the saturation magnetization and hysteresis curve (BH curve) of strontium ferrite were obtained from the results of VSM, and the remanent magnetization in the vertical direction and the remanent magnetization in the horizontal direction of strontium ferrite were obtained (the remanent magnetization in the vertical direction is the remanent magnetization in the horizontal direction). The larger the size, the better the perpendicular magnetization film.) In the scope of claims, the substrate temperature is limited to 350 ° C. or lower, because when the temperature is 350 ° C. or higher, polyimide or Al used as a substrate material is thermally deformed or deteriorated to obtain a high quality strontium ferrite film. Because there is no.
またプラズマ電力を0.5W〜10Wと限定したのは0.5W/cm
2以下のプラズマ電力では、十分に気相中で単相のスト
ロンチウムフェライトが合成できないためであり、10W
/cm2以上では、電力が強すぎて気相中で出来たストロ
ンチウムフェライトが再分解されストロンチウムフェラ
イト以外の相(Fe3O4等)が析出するためである。Also, the plasma power was limited to 0.5W to 10W by 0.5W / cm
This is because single-phase strontium ferrite cannot be synthesized sufficiently in the gas phase with a plasma power of 2 or less.
This is because if the electric power is higher than / cm 2 , the strontium ferrite generated in the gas phase is redissolved due to too high electric power, and phases other than strontium ferrite (Fe 3 O 4 etc.) precipitate.
またプラズマを維持する時の圧力を0.1〜10Torrに限定
したのは0.1Torr以下では、反応生成物(ストロンチウ
ムフェライト)の製膜速度が遅く、実用上問題があるた
めであり、10Torr以上では基板上に膜として成生せず、
空間でパウダー状物質となるためである。The pressure for maintaining the plasma was limited to 0.1 to 10 Torr because the film formation rate of the reaction product (strontium ferrite) was slow at 0.1 Torr or less, which was a problem in practice. Does not grow as a film in
This is because it becomes a powdery substance in the space.
発明の効果 以上述べてきたように、本発明によれば、プラズマの活
性さを巧みに利用して350℃以下の比較的低温で、垂直
磁気記録媒体としてすぐれたストロンチウムフェライト
膜が作成できる方法であって高密度の磁気記録を達成す
るのにきわめて有益な発明である。As described above, according to the present invention, it is possible to form a strontium ferrite film excellent as a perpendicular magnetic recording medium at a relatively low temperature of 350 ° C. or less by skillfully utilizing the plasma activity. It is a very useful invention for achieving high density magnetic recording.
図は本発明の一実施例におけるプラズマCVD装置の概略
図である。 11……反応チャンバー、12……高周波電極、13……高周
波電源、14……基板加熱ホルダー、15……基板、16……
Sr(OR)2のバブラー、17……Fe(OR)3のバブラー、
18……Arキャリアガスボンベ、19……O2反応ガスボン
ベ、20……ロータリーポンプ。The figure is a schematic view of a plasma CVD apparatus in one embodiment of the present invention. 11 …… Reaction chamber, 12 …… High frequency electrode, 13 …… High frequency power supply, 14 …… Substrate heating holder, 15 …… Substrate, 16 ……
Sr (OR) 2 bubbler, 17 …… Fe (OR) 3 bubbler,
18 …… Ar carrier gas cylinder, 19 …… O 2 reaction gas cylinder, 20 …… Rotary pump.
Claims (3)
有する金属アルコオキサイドの蒸気と、これらを輸送す
るガスとしての不活性ガスおよび、反応ガスとしての酸
素(O2)をプラズマ中で分解させ350℃以下に保持さ
せた基体上にストロンチウムフェライト単相C軸配向膜
から成る垂直磁化膜を析出させることを特徴とする磁性
体薄膜の製造方法。1. Decomposition in a plasma of vapor of metal alkoxide containing strontium (Sr) and iron (Fe), an inert gas as a gas for transporting the vapor, and oxygen (O 2 ) as a reaction gas. A method for producing a magnetic thin film, which comprises depositing a perpendicular magnetization film composed of a strontium ferrite single-phase C-axis orientation film on a substrate kept at 350 ° C. or lower.
ド化合物として、化学式がSr(OR)2(ただし、Rはア
ルキル基)で示されることを特徴とする特許請求の範囲
第1項記載のストロンチウムフェライト単相C軸配向膜
から成る磁性体薄膜の製造方法。2. The strontium ferrite single phase according to claim 1, wherein the strontium-containing alcohol compound has a chemical formula of Sr (OR) 2 (where R is an alkyl group). A method for manufacturing a magnetic thin film comprising a C-axis alignment film.
て、化学式がFe(OR)3(ただし、Rはアルキル基)で
示されることを特徴とする特許請求の範囲第1項記載の
ストロンチウムフェライト単相C軸配向膜から成る磁性
体薄膜の製造方法。3. The strontium ferrite single phase according to claim 1, characterized in that the iron-containing alkoxide compound has a chemical formula represented by Fe (OR) 3 (where R is an alkyl group). A method for manufacturing a magnetic thin film comprising a C-axis alignment film.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8377585A JPH0664737B2 (en) | 1985-04-19 | 1985-04-19 | Method for manufacturing magnetic thin film |
| US06/826,386 US4717584A (en) | 1985-02-07 | 1986-02-05 | Method of manufacturing a magnetic thin film |
| DE8686300848T DE3685346D1 (en) | 1985-02-07 | 1986-02-07 | MAGNETIC THIN FILM AND METHOD FOR THE PRODUCTION THEREOF. |
| EP86300848A EP0194748B1 (en) | 1985-02-07 | 1986-02-07 | Magnetic thin film and method of manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8377585A JPH0664737B2 (en) | 1985-04-19 | 1985-04-19 | Method for manufacturing magnetic thin film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61242331A JPS61242331A (en) | 1986-10-28 |
| JPH0664737B2 true JPH0664737B2 (en) | 1994-08-22 |
Family
ID=13811978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8377585A Expired - Lifetime JPH0664737B2 (en) | 1985-02-07 | 1985-04-19 | Method for manufacturing magnetic thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0664737B2 (en) |
-
1985
- 1985-04-19 JP JP8377585A patent/JPH0664737B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61242331A (en) | 1986-10-28 |
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