JPH0690033B2 - Displacement detection device - Google Patents

Displacement detection device

Info

Publication number
JPH0690033B2
JPH0690033B2 JP7276790A JP7276790A JPH0690033B2 JP H0690033 B2 JPH0690033 B2 JP H0690033B2 JP 7276790 A JP7276790 A JP 7276790A JP 7276790 A JP7276790 A JP 7276790A JP H0690033 B2 JPH0690033 B2 JP H0690033B2
Authority
JP
Japan
Prior art keywords
light
measured
objective lens
light receiving
receiving elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP7276790A
Other languages
Japanese (ja)
Other versions
JPH0315710A (en
Inventor
博雅 土井
義治 桑原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP7276790A priority Critical patent/JPH0690033B2/en
Publication of JPH0315710A publication Critical patent/JPH0315710A/en
Publication of JPH0690033B2 publication Critical patent/JPH0690033B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention 【産業上の利用分野】[Industrial applications]

この発明は、例えばレーザデイスク等の読み出しレーザ
スポツトの自動焦点合せ等に用いる、非接触で被測定物
の表面の変位を検出する装置の改良に関する。
The present invention relates to an improvement of a non-contact apparatus for detecting a displacement of a surface of an object to be measured, which is used for automatic focusing of a reading laser spot such as a laser disk.

【従来の技術】[Prior art]

従来、第9図に示されるように、レーザダイオード等の
光源1から光ビーム2をビームスプリツタ3及び対物レ
ンズ4を介して被測定物5での被測定表面5Aに、これと
略直交する方向に投射し、該被測定表面5Aで散乱反射さ
れた反射光を、再度対物レンズ4、ビームスプリツタ3
を経て、該ビームスプリツタ3の反射面3Aにより、直角
に反射させ、フーコープリズム6を介して、受光素子8
に入射させるようにした変位検出装置がある。 前記受光素子8はホトダイオード等からなる内側素子8A
及びその外側に隣接する外側素子8Bとから構成され、こ
れら内側素子8A及び外側素子8Bの出力は、比較器9を経
て、検出器(図示省略)に入力されるようになつてい
る。 ここで、前記内側素子8A及び外側素子8Bの出力A及びB
は、前記被測定表面5Aの、光源1からの距離に変化が生
じると、これに対応して増減し、両者の出力の差に基づ
いて、被測定表面5Aの光源1からの距離、即ち表面の変
位を測定することができる。 換言すれば、フーコープリズム6により集光された反射
光の合焦位置に内側素子8A及び外側素子8Bの境界線があ
るとき、これらの素子の出力の差ΔS=A−Bが零とな
る。
Conventionally, as shown in FIG. 9, a light beam 2 from a light source 1 such as a laser diode passes through a beam splitter 3 and an objective lens 4 and is substantially orthogonal to a surface 5A to be measured of an object 5 to be measured. The reflected light which is projected in the direction and scattered and reflected by the surface 5A to be measured is again reflected by the objective lens 4 and the beam splitter 3.
Then, the light is reflected at a right angle by the reflecting surface 3A of the beam splitter 3, and the light receiving element 8 is passed through the Foucault prism 6.
There is a displacement detection device that is made to be incident on. The light receiving element 8 is an inner element 8A composed of a photodiode or the like.
And an outer element 8B adjacent to the outer side thereof, and outputs of the inner element 8A and the outer element 8B are input to a detector (not shown) via a comparator 9. Here, outputs A and B of the inner element 8A and the outer element 8B
When the distance of the surface 5A to be measured from the light source 1 changes, it increases or decreases correspondingly, and the distance of the surface 5A to be measured from the light source 1, that is, the surface, based on the difference between the outputs of the two. The displacement of can be measured. In other words, when there is a boundary line between the inner element 8A and the outer element 8B at the focus position of the reflected light collected by the Foucault prism 6, the difference ΔS = AB between the outputs of these elements becomes zero.

【発明が解決しようとする課題】[Problems to be Solved by the Invention]

ところで、前記のような変位検出装置において、対物レ
ンズ4に収差があると、結像点がずれるので、これを補
正するためには、受光素子8を前後左右にずらさなけれ
ばならない。 しかしながら、受光素子を前後方向にずらした場合と比
較して、左右方向にずらした場合は、内側素子8Aと外側
素子8Bの出力の差の変化が非常に大きく、調整が困難に
なるという問題点がある。 又、前記内側素子8Aと外側素子8Bの出力の差ΔS=A−
Bは第10図に示されるようになり、ΔSが正か負である
かによつて前ピンか後ピンの判断が可能であるが、その
ずれ量が判別できない。 即ち、ΔS=Vrの場合、ΔS=0の点に接近した位置A1
であるのか、離間した位置A2であるのか不明である。 A1であれば対物レンズを低速で移動しなければハンチン
グを起こしてしまうし、又、A3であれば対物レンズを高
速移動しなければ時間がかかり、測定効率が落ちてしま
うという問題点が生じる。 前記第9図の例は、フーコープリズを用いたいわゆるフ
ーコー法の原理を応用したものであるが、他の方式、例
えば偏心光束法、ナイフエツジ法、臨界角法等のオート
フオーカス方式についても同様の問題点がある。 この発明は、上記従来の問題点に鑑みてなされたもので
あつて、受光素子を移動させることなく結像点の、光軸
と直交する方向のずれ、即ち、左右のずれを補正して、
対物レンズの収差に対応して迅速に測定することができ
る変位検出装置を提供することを目的とする。 又、他の発明は、結像点のずれの量を正確に検出して、
結像点を効率良く合焦位置に合わせることができるよう
にした変位検出装置を提供することを目的とする。
By the way, in the displacement detecting apparatus as described above, when the objective lens 4 has an aberration, the image forming point shifts. Therefore, in order to correct this, the light receiving element 8 has to be shifted in the front-back direction and the left-right direction. However, compared with the case where the light receiving element is shifted in the front-back direction, when it is shifted in the left-right direction, the change in the difference in output between the inner element 8A and the outer element 8B is extremely large, which makes adjustment difficult. There is. Further, the difference ΔS = A− between the outputs of the inner element 8A and the outer element 8B.
B becomes as shown in FIG. 10, and it is possible to determine the front pin or the rear pin depending on whether ΔS is positive or negative, but the shift amount cannot be determined. That is, when ΔS = Vr, the position A 1 close to the point of ΔS = 0
It is unknown whether or not it is the separated position A 2 . If A 1 is used , hunting will occur unless the objective lens is moved at low speed, and if A 3 is used , it will take time if the objective lens is not moved at high speed, and measurement efficiency will be reduced. Occurs. The example of FIG. 9 applies the principle of the so-called Foucault method using the Foucault prism, but the same applies to other methods such as the eccentric beam method, the knife edge method, and the autofocus method such as the critical angle method. There is a problem. The present invention has been made in view of the above conventional problems, in which the image forming point is moved without moving the light receiving element, the deviation in the direction orthogonal to the optical axis, that is, the lateral deviation is corrected,
An object of the present invention is to provide a displacement detection device that can quickly measure the aberration of an objective lens. Another invention is to accurately detect the amount of shift of the image formation point,
It is an object of the present invention to provide a displacement detection device capable of efficiently adjusting an image forming point to a focus position.

【問題点を解決するための手段】[Means for solving problems]

この発明は、光ビームを放射する光源と、被測定物の被
測定表面に対向して配置され、該被測定表面と略直交す
る前記光ビームの光路上に光軸を備えた対物レンズと;
この対物レンズに対して前記被測定物の反対側に配置さ
れ、前記光ビームが前記光路を通つて前記被測定表面に
直進し、且つ、該被測定表面で反射されて形成され、前
記対物レンズを通つた反射光を集光させる集光手段と;
前記反射光が集光される光スポツトの位置近傍であつ
て、該光スポツトを中心とし、且つ、該光軸と直交する
方向の同一直線上にアレイ状に配置された少なくとも4
個の受光素子と;これら受光素子の出力信号を、前記直
線上の任意の位置で2群に分離するアレイ切換手段と;
前記一方の群の出力信号の総和と他方の群の出力信号の
総和との差信号の変化により、前記被測定表面の前記光
軸方向の変位量を検出する検出器と;を含んで、変位検
出装置を構成することにより上記目的を達成するもので
ある。 又、他の発明は、光ビームを放射する光源と、被測定物
の被測定表面に対向して配置され、該被測定表面と略直
交する前記光ビームの光路上に光軸を備えた対物レンズ
と;この対物レンズに対して前記被測定物の反対側に配
置され、前記光ビームが前記光路を通つて前記被測定表
面に直進し、且つ、該被測定表面で反射されて形成さ
れ、前記対物レンズを通つた反射光を集光させる集光手
段と;前記反射光が集光される光スポツトの位置近傍で
あつて、前記光軸と直交する方向の同一直線上に、該光
スポツトを中心として対称的に配置された少なくとも2
対の受光素子と;前記光スポツトを境界として2群に分
けられた受光素子の各群の出力信号の総和の差信号の変
化により、前記被測定表面の前記光軸方向の変位量を検
出する検出器と;前記光スポツトに隣接する1対の受光
素子よりも光軸から離れた位置の受光素子の出力信号と
基準信号とを比較し、前者が後者より大きいときずれ信
号を出力する比較器と;を含んで変位検出装置を構成す
ることにより上記目的を達成するものである。 又、前記集光手段をフーコープリズムを備えた合焦シス
テムとすることにより上記目的を達成するものである。 又、前記集光手段を、偏心光束法による合焦システムと
することにより上記目的を達成するものである。 又、前記集光手段を、ナイフエツジ法による合焦システ
ムとすることにより上記目的を達成するものである。 又、前記集合手段を、臨界角法による合焦システムとす
ることにより上記目的を達成するものである。
The present invention provides a light source that emits a light beam, and an objective lens that is arranged so as to face a surface to be measured of a measured object and has an optical axis on an optical path of the light beam that is substantially orthogonal to the measured surface.
The objective lens is arranged on the opposite side of the object to be measured with respect to the objective lens, and the light beam is formed by passing through the optical path to go straight to the surface to be measured and being reflected by the surface to be measured. A condensing means for condensing the reflected light that has passed through;
At least 4 arranged near the position of the light spot where the reflected light is focused and arranged in an array on the same straight line in the direction orthogonal to the light axis with the light spot as the center.
Individual light receiving elements; array switching means for separating the output signals of these light receiving elements into two groups at arbitrary positions on the straight line;
A detector that detects the amount of displacement of the surface to be measured in the optical axis direction by the change in the difference signal between the sum of the output signals of the one group and the sum of the output signals of the other group; The above object is achieved by constructing a detection device. Another aspect of the present invention is a light source that emits a light beam, and an objective that is disposed so as to face a surface to be measured of the object to be measured and has an optical axis on the optical path of the light beam that is substantially orthogonal to the surface to be measured. A lens disposed on the opposite side of the object to be measured with respect to the objective lens, wherein the light beam travels straight through the optical path to the surface to be measured and is reflected by the surface to be measured; A condensing means for condensing the reflected light passing through the objective lens; in the vicinity of the position of the optical spot where the reflected light is condensed, on the same straight line in the direction orthogonal to the optical axis. At least 2 symmetrically arranged about
A pair of light receiving elements; the amount of displacement of the surface to be measured in the optical axis direction is detected by the change in the difference signal of the sum of the output signals of each group of light receiving elements divided into two groups with the optical spot as a boundary. A detector; a comparator for comparing an output signal of a light receiving element located farther from the optical axis than a pair of light receiving elements adjacent to the optical spot with a reference signal, and outputting a shift signal when the former is larger than the latter The above object is achieved by constructing the displacement detecting device including the following items; Further, the above object is achieved by using a focusing system having a Foucault prism as the light converging means. Further, the above-mentioned object is achieved by using the focusing means as a focusing system based on the eccentric beam method. Further, the above-mentioned object is achieved by using a focusing system by the knife edge method as the focusing means. Further, the above object is achieved by using a focusing system by the critical angle method as the collecting means.

【作用】[Action]

この発明は、光スポツトの位置近傍であつて、該光スポ
ツトを中心として、光軸と直交する方向の同一直線上に
アレイ状に配置された少なくとも4個の受光素子を含
み、これらの受光素子をアレイ切換手段によつて対物レ
ンズの収差に応じて2群に分けて、各群の出力信号の総
和の差に基づき合焦させるようにしているので、受光素
子を光軸と直交する方向に移動させることなく、対物レ
ンズの収差に基づく結像点のずれを補正して、測定を容
易確実にすることができる。 又、他の発明は、同様のフーコー法等の場合、光スポツ
トの位置近傍で、光スポツトを中心として対称的に少な
くとも2対の受光素子を直線状に配置し、該光スポツト
位置を境界として受光素子の各群の出力信号の総和の差
から合焦点を検出し、更に、結像点が大きくずれたとき
は、光スポツト位置から離れた位置の受光素子の出力信
号に基づきこれを検出して、結像点を高速度で合焦位置
に戻すことができる。
The present invention includes at least four light receiving elements arranged in an array near the position of the light spot and on the same straight line in a direction orthogonal to the optical axis with the light spot as the center. Is divided into two groups according to the aberration of the objective lens by the array switching means, and focusing is performed based on the difference of the total sum of the output signals of each group. Therefore, the light receiving element is arranged in the direction orthogonal to the optical axis. It is possible to correct the deviation of the image forming point due to the aberration of the objective lens without moving the lens and to easily and surely perform the measurement. Further, in another invention, in the case of the similar Foucault method, at least two pairs of light receiving elements are arranged linearly in the vicinity of the position of the optical spot symmetrically with respect to the optical spot, and the optical spot position is used as a boundary. The in-focus point is detected from the difference in the sum of the output signals of each group of light-receiving elements, and when the image formation point is greatly deviated, this is detected based on the output signal of the light-receiving element at a position distant from the optical spot position. Thus, the image formation point can be returned to the in-focus position at high speed.

【実施例】【Example】

以下、第1発明の実施例を図面を参照して説明する。 この実施例は、第1図乃至第3図に示されるように、光
ビーム10を出射するレーザダイオード等の光源12と、被
測定物14の被測定表面14Aに対向して配置され、該被測
定表面14Aと略直交する前記光ビームの光路上に光軸11
を備えた対物レンズ16と、この対物レンズ16に対して前
記被測定物14の反対側に配置され、前記光ビーム10が前
記光路を通つて前記被測定表面14Aに直進し、且つ、該
被測定表面14Aで反射されて形成され、前記対物レンズ1
6を通つた反射光を集光させるフーコープリズム18と、
前記反射光が集光される光スポツトの位置近傍であつ
て、該光スポツトを中心として、且つ、光軸11と直交す
る方向の同一直線上にアレイ状に配置された8個の受光
素子20A、20B、・・・20Hと、これら受光素子20A、20
B、・・・20Hの出力信号を、前記直線上の任意の位置で
2群に分離するアレイ切換手段22と、前記一方の群の出
力信号の総和と他方の群の出力信号の総和との差信号の
変化により、前記被測定表面14Aの前記光軸11方向の変
位量を検出する検出器28と、を含んで変位検出装置を構
成したものである。 前記光源12は、前記光軸11に対してその射出光ビーム10
の光軸が直交するように光軸11の側方に配置されてい
る。 光源12から射出された光ビーム10と前記光軸11との交点
であつて、前記対物レンズ16とフーコープリズム18との
間の位置には、ハーフミラー30が光軸11及び光源12から
の光ビーム10の射出光軸の各々に対して45°の角度をな
すように配置されている。 又、光軸11上には、前記ハーフミラー30とフーコープリ
ズム18との間の位置に集束レンズ32が配置されている。 更に、前記ハーフミラー30と光源12との間では、光源12
からの光ビーム10の射出光軸上にコリメータレンズ34が
配置されている。 このコリメータレンズ34は、光源12から射出された光ビ
ーム10を、光軸11と直交する平行光線としてハーフミラ
ー30に入射させるものである。 又、対物レンズ16はハーフミラー30で直角に、光軸11に
沿つて反射された平行光線である光ビーム10を被測定表
面14Aに集光させ、且つ、被測定表面14Aからの反射光線
を平行光線としてハーフミラー30を経て集束レンズ32に
到達させるものである。 この集束レンズ32は、光軸11に沿つた平行光線である反
射光を集束させ、フーコープリズム18を経て、受光素子
20A〜20Hに合焦させるものである。 前記受光素子20A〜20Hは、前記フーコープリズム18を通
つた反射光線の合焦位置であつて、且つ、各受光素子の
境界線が、フーコープリズム18の四角形端面の対向する
2辺と平行となるように該2辺と直交する直線上に等間
隔で配置されている。 又、これら受光素子20A〜20Hの感度は同一であり、対物
レンズ16に収差がないとき、第4番目の受光素子20Dと
第5番目の受光素子20Eの境界線上に反射光が合焦する
ようにされている。 第3図に示す検出器28は、受光素子20A〜20Fの出力A〜
Fを加算する加算器36と、受光素子20C〜20Hの出力C〜
Hを加算する加算器38と、加算器36の出力信号と加算器
38の出力信号の差を算出する減算器40と、加算器36、38
の出力を加算する加算器42と、これら減算器40及び加算
器42の出力信号を各々分子及び分母として商を演算する
割算器43と、を含んで構成されている。 前記アレイ切換手段22は、前記受光素子20C〜20Fと加算
器36との間に設けられた切換器44C〜44Fと、前記受光器
20C〜20Fと前記加算器38との間に設けられた切換器46C
〜46Fと、これら切換器44C〜44F及び46C〜46Fを切換え
る切換制御器48と、から構成されている。 この切換制御器48は、第3図に示されるアレイ切換デー
タに基づいて前記受光素子20A〜20Hを2群に分けて、そ
の一方の出力信号を加算器36に、又、他方の出力信号を
加算器38にそれぞれ振分けるべく、切換器44C〜44F、46
C〜46Fを制御するようにされている。 即ち、受光素子20Bと20Cの間を境界として2群に分け
て、受光素子20A及び20Bの出力信号を加算器36に、他の
受光素子20C〜20Hの出力信号を加算器38に振分ける第1
モードと、受光素子20Cと20Dの間を境界として振分ける
第2モードと、受光素子20Dと20Eの間を境界として振分
ける第3モードと、受光素子20Eと20Fの間を境界として
振分ける第4モードと、受光素子20Fと20Gの間を境界と
して振分ける第5モードとを、選択的に切り替えるべ
く、切換器44C〜44F、46C〜46Fを制御することができる
ようにされている。 次に上記実施例装置の作用を説明する。 光源12から光ビーム10を射出して、ハーフミラー30で光
軸11に沿つて反射させ、これを対物レンズ16を介して、
被測定物14の被測定表面14Aに照射する。被測定表面14A
からの反射光は、再び対物レンズ16を通つて、更にハー
フミラー30、集束レンズ32及びフーコープリズム18を通
つて、受光素子20A〜20Hに合焦する。 対物レンズ16の収差に基づく結像位置のずれがない場合
は、減算器40の出力信号ΔS3は、第3モードで合焦位置
において零となり、且つ、後ピン側でマイナス、前ピン
側でプラスのサインカーブ状となる。 従つて、対物レンズ16を光軸11に沿つて移動させ、受光
素子20A〜20Dの出力と20E〜20Hの出力の差ΔS3=(A+
B+C+D)−(E+F+G+H)=0となるようにす
れば、合焦点を検出できる。 即ち検出器28における減算器40の出力信号が零となるよ
うにすればよい。 ここで、割算器43において、前記減算器40の出力信号Δ
S3を、加算器42の出力信号(A+・・・+H)で割算し
ているのは、受光素子20、22の全受光量でΔS3を割算す
ると、被測定表面14Aの反射率の違いの影響を低減で
き、安定した分離能が得られるからである。 光源12あるいは対物レンズ16を変更すると、収差による
結像位置が前記受光素子20A〜20Hの方向にずれる。 このずれは、光源12の種類あるいは対物レンズ16の種類
によつて予めわかつている。 従つて、これに応じて、切換制御器48により、切換器44
C〜44F、46C〜46Fを切換える。 例えば、収差によつて、結像点が受光素子20Cと20Dの間
にオフセツトする場合は、切換制御器48において第2モ
ードを選択し、受光素子20A〜20Cが加算器36に、又、受
光素子20D〜20Hが加算器38にそれぞれその信号を出力で
きるように、切換器44C〜44F及び46C〜46Fを切換える。 この第2モードの場合は、合焦信号ΔS2がΔS2=(A+
B+C)−(D+E+F+G+H)=0となるように、
対物レンズ16を駆動して合焦点を検出できる。 この実施例においては、収差による結像点のずれを受光
素子を移動させることなく、アレイ切換手段22によつて
補正し、迅速確実に合焦点の検出をすることができる。 次に、第5図に示される第2発明の実施例について説明
する。 この実施例は、前記第1発明の実施例におけると同様
の、光源12と、対物レンズ16と、フーコープリズム18と
を備えた変位検出装置において、被測定物表面で反射さ
れた反射光が集光される光スポツト11Aの位置近傍であ
つて、該スポツトを中心として、且つ、対物レンズの光
軸と直交する方向の同一直線上に対称的に配置された2
対の受光素子52A、52B及び54A、54Bと、前記光スポツト
11Aを境界として2群に分けられた前記受光素子52A、54
A及び52B、54Bのそれぞれの出力信号の総和の差信号の
変化により、被測定表面の光軸方向の変位量を検出する
検出器56と、前記光スポツト11Aから離れた側の受光素
子54A、54Bの出力信号と基準信号Vrefとを比較し、前者
が後者より大きいときずれ信号を出力する比較器58A、5
8Bと、を設けたものである。 前記演算器56は、第5図に示されるように、受光素子52
A、54Aの出力信号の和を演算する加算器60Aと、受光素
子52B、54Bの出力信号を加算する加算器60Bと、加算器6
0Aと60Bの出力信号の和を演算する加算器62と、加算器6
0Aの出力信号から加算器60Bの出力信号の差を演算する
減算器64と、加算器62の出力信号を分母とし、減算器64
の出力信号を分子として割算を行う割算器66と、を備え
て構成されている。 前記比較器58A、58Bの出力信号は、ずれ表示器68A、68B
に出力されて、結像点がずれていることを表示できるよ
うにされている。 又、割算器66の出力信号も、合焦表示器70に出力され
て、合焦状態を表示するようにされている。 割算器66の出力信号である合焦信号ΔSに基づいて、合
焦点を検出する過程は前記と同一であるので説明を省略
する。 結像点が大きくずれた場合、例えば、第5図において右
側にずれた場合は、受光素子54Bの出力信号が通常の場
合と比較して非常に大きくなる。 従つて、この受光素子54Bからの出力信号と基準信号Vre
fを比較器58Bにおいて比較し、受光素子54Bからの出力
信号が基準信号を上廻つているときは、これをずれ表示
器68Bで表示して、結像点が図において右側に大きくず
れたことを表示する。 従つて、この場合は、対物レンズを高速移動させて迅速
に合焦点を求めることができる。 結像点が受光素子54A側にずれた場合は、比較器58Aから
の出力信号により、ずれがずれ表示器68Aに表示される
ので、この場合も同様に、迅速に合焦点まで対物レンズ
を移動させることができる。 結像点のずれが少ない場合は、前述のように、合焦信号
ΔS=0となるように対物レンズを微動させて調整し、
合焦点を得ることができる。 従つて、ずれ表示器68A、68Bにずれが表示されていない
場合は、常に対物レンズを微動させて、ハンチングを起
こすことなく合焦点を得ることができる。 なお、上記実施例において、受光素子は2対とされてい
るが、本発明はこれに限定されるものでなく、3対以上
の複数であつてもよい。 この場合は、ずれ信号を出力するための比較器が受光素
子に対応して必要となり、又、該比較器に対応してずれ
表示器も必要となる。 前記第1発明及び第2発明の実施例は、共にフーコー法
を利用したシステムについてのものであるが、本発明は
これに限定されるものでなく、例えば第6図に示される
第3実施例のように、偏心光束法を利用したもの、又は
第7図に示される第4実施例のようにナイフエツジ法を
利用したもの、第8図に示される第5実施例のように、
臨界角法を利用したもののいずれにも適用されるもので
ある。 第3実施例について、第6図において、符号72は対物
鏡、74は絞りをそれぞれ示す。他の構成は前記第1図の
実施例と同一又は相当部分については第1図と同一の符
号を付することにより説明を省略するものとする。 この偏心光束法を用いた変位検出器の場合も、受光素子
21A〜21F及びその切換え手段、更には検出器は、前記第
3図及び又は第5図の構成と同一とするものとする。 第4実施例については、第7図において、符号76は対物
レンズ16とハーフミラー30との間に配置された1/4波長
板、78は受光素子20と収束レンズ32との間であつて、収
束レンズ32の焦点位置に配置されたナイフエツジをそれ
ぞれ示す。 この実施例においても、受光素子21A〜21Fの配列及び検
出器の構成は、前記第3図又は第5図の構成がそのまま
適用され得る。 第8図に示される臨界角法を利用した第5実施例の場合
は、前記第7図の実施例における収束レンズ32とナイフ
エツジ78に代えて、プリズム80を配置したものである。 プリズム80は、ハーフミラー30からの反射光に対して、
その屈折角が臨界角となるように配置されている。 この実施例の場合も、受光素子21A〜21F、あるいは切換
え手段、検出器の構成は前記第3図又は第5図と同様の
ものとなる。
An embodiment of the first invention will be described below with reference to the drawings. In this embodiment, as shown in FIGS. 1 to 3, a light source 12 such as a laser diode for emitting a light beam 10 and a surface 14A to be measured of an object 14 to be measured are arranged so as to face each other. The optical axis 11 is provided on the optical path of the light beam substantially orthogonal to the measurement surface 14A.
Is disposed on the opposite side of the object to be measured 14 with respect to the objective lens 16, and the light beam 10 goes straight to the surface to be measured 14A through the optical path, and The objective lens 1 is formed by being reflected by the measurement surface 14A.
Foucault prism 18 that collects the reflected light that passed through 6,
Eight light-receiving elements 20A arranged in an array in the vicinity of the position of the light spot where the reflected light is focused, and centered on the light spot and on the same straight line in the direction orthogonal to the optical axis 11. , 20B, ... 20H and these light receiving elements 20A, 20
Array switching means 22 for separating the output signals of B, ..., 20H into two groups at an arbitrary position on the straight line, and the sum of the output signals of the one group and the sum of the output signals of the other group. A displacement detecting device is configured to include a detector 28 that detects the amount of displacement of the measured surface 14A in the optical axis 11 direction based on the change in the difference signal. The light source 12 emits its light beam 10 with respect to the optical axis 11.
Are arranged on the sides of the optical axis 11 so that the optical axes of are orthogonal to each other. At the intersection between the light beam 10 emitted from the light source 12 and the optical axis 11, at a position between the objective lens 16 and the Foucault prism 18, a half mirror 30 is used to emit light from the optical axis 11 and the light source 12. It is arranged so as to form an angle of 45 ° with respect to each of the exit optical axes of the beam 10. A focusing lens 32 is arranged on the optical axis 11 between the half mirror 30 and the Foucault prism 18. Further, between the half mirror 30 and the light source 12, the light source 12
A collimator lens 34 is arranged on the emission optical axis of the light beam 10 from. The collimator lens 34 makes the light beam 10 emitted from the light source 12 incident on the half mirror 30 as a parallel light beam orthogonal to the optical axis 11. Further, the objective lens 16 collects the light beam 10, which is a parallel light beam reflected along the optical axis 11 at a right angle by the half mirror 30, on the surface 14A to be measured, and reflects the light beam reflected from the surface 14A to be measured. The parallel rays are made to reach the focusing lens 32 via the half mirror 30. The focusing lens 32 focuses the reflected light, which is a parallel light beam along the optical axis 11, and passes through the Foucault prism 18 to receive the light.
It focuses on 20A to 20H. The light receiving elements 20A to 20H are at the focus positions of the reflected light rays that have passed through the Foucault prism 18, and the boundary lines of the respective light receiving elements are parallel to the two opposite sides of the square end face of the Foucault prism 18. Thus, they are arranged at equal intervals on a straight line orthogonal to the two sides. Further, the light receiving elements 20A to 20H have the same sensitivity, and when the objective lens 16 has no aberration, the reflected light is focused on the boundary line between the fourth light receiving element 20D and the fifth light receiving element 20E. Has been The detector 28 shown in FIG. 3 has outputs A to A of the light receiving elements 20A to 20F.
Adder 36 for adding F and output C of light receiving elements 20C to 20H
Adder 38 for adding H, output signal of adder 36 and adder
Subtractor 40 for calculating the difference between the output signals of 38 and adders 36, 38
It is configured to include an adder 42 that adds the outputs of the above, and a divider 43 that calculates the quotient using the output signals of the subtractor 40 and the adder 42 as the numerator and denominator, respectively. The array switching means 22 includes switching devices 44C to 44F provided between the light receiving elements 20C to 20F and the adder 36, and the light receiving device.
Switching device 46C provided between 20C to 20F and the adder 38
.About.46F and a switching controller 48 for switching these switching devices 44C to 44F and 46C to 46F. The switching controller 48 divides the light receiving elements 20A to 20H into two groups based on the array switching data shown in FIG. 3, and outputs one output signal to the adder 36 and the other output signal. Switchers 44C to 44F, 46 to distribute to adders 38, respectively.
It is designed to control C to 46F. That is, the light receiving elements 20B and 20C are divided into two groups with the boundary as the boundary, and the output signals of the light receiving elements 20A and 20B are assigned to the adder 36 and the output signals of the other light receiving elements 20C to 20H are assigned to the adder 38. 1
Mode, a second mode in which the light receiving elements 20C and 20D are used as boundaries, a third mode in which the light receiving elements 20D and 20E are used as boundaries, and a third mode in which the light receiving elements 20E and 20F are used as boundaries The switchers 44C to 44F and 46C to 46F can be controlled so as to selectively switch between the four modes and the fifth mode in which the light receiving elements 20F and 20G are distributed as boundaries. Next, the operation of the apparatus of the above embodiment will be described. The light beam 10 is emitted from the light source 12, reflected by the half mirror 30 along the optical axis 11, and is reflected via the objective lens 16.
The surface 14A to be measured of the object 14 to be measured is irradiated. Surface to be measured 14A
The reflected light from passes through the objective lens 16 again, further passes through the half mirror 30, the focusing lens 32, and the Foucault prism 18, and is focused on the light receiving elements 20A to 20H. When there is no shift of the image forming position based on the aberration of the objective lens 16, the output signal ΔS 3 of the subtractor 40 becomes zero at the in-focus position in the third mode, and is minus on the rear pin side and on the front pin side. It becomes a plus sine curve. Accordingly, the objective lens 16 is moved along the optical axis 11, and the difference ΔS 3 = (A +) between the outputs of the light receiving elements 20A to 20D and 20E to 20H.
If B + C + D)-(E + F + G + H) = 0, the in-focus point can be detected. That is, the output signal of the subtractor 40 in the detector 28 may be set to zero. Here, in the divider 43, the output signal Δ of the subtractor 40
The reason why S 3 is divided by the output signal (A + ... + H) of the adder 42 is that when ΔS 3 is divided by the total amount of light received by the light-receiving elements 20 and 22, the reflectance of the surface 14A to be measured is measured. This is because the influence of the difference can be reduced and a stable resolution can be obtained. When the light source 12 or the objective lens 16 is changed, the image forming position due to the aberration shifts toward the light receiving elements 20A to 20H. This deviation is known in advance depending on the type of the light source 12 or the type of the objective lens 16. Accordingly, in response to this, the switching controller 48 causes the switching device 44 to
Switches C to 44F and 46C to 46F. For example, when the image formation point is offset between the light receiving elements 20C and 20D due to aberration, the second mode is selected by the switching controller 48, and the light receiving elements 20A to 20C are received by the adder 36 and the light receiving elements 20A to 20C. The switches 44C to 44F and 46C to 46F are switched so that the elements 20D to 20H can output the signals to the adder 38, respectively. In this second mode, the focus signal ΔS 2 is ΔS 2 = (A +
B + C)-(D + E + F + G + H) = 0,
The objective lens 16 can be driven to detect the focal point. In this embodiment, the shift of the image forming point due to the aberration can be corrected by the array switching means 22 without moving the light receiving element, and the in-focus point can be detected quickly and surely. Next, an embodiment of the second invention shown in FIG. 5 will be described. This embodiment is the same as in the first embodiment of the present invention, and in the displacement detecting device provided with the light source 12, the objective lens 16 and the Foucault prism 18, the reflected light reflected by the surface of the object to be measured is collected. 2 is symmetrically arranged in the vicinity of the position of the light spot 11A to be illuminated, centered on the spot and on the same straight line in the direction orthogonal to the optical axis of the objective lens.
A pair of light receiving elements 52A, 52B and 54A, 54B and the optical spots.
The light receiving elements 52A and 54 divided into two groups with 11A as a boundary.
A and 52B, a detector 56 for detecting the amount of displacement in the optical axis direction of the surface to be measured by a change in the difference signal of the sum of the output signals of each, and a light receiving element 54A on the side remote from the optical spot 11A, The comparators 58A, 5 which compare the output signal of 54B with the reference signal Vref and output a shift signal when the former is larger than the latter
8B is provided. The computing unit 56, as shown in FIG.
An adder 60A that calculates the sum of the output signals of A and 54A, an adder 60B that adds the output signals of the light receiving elements 52B and 54B, and an adder 6
Adder 62 that calculates the sum of the output signals of 0A and 60B, and adder 6
The subtractor 64 that calculates the difference between the output signal of the 0A and the output signal of the adder 60B and the subtractor 64 that uses the output signal of the adder 62 as the denominator
And a divider 66 that performs division using the output signal of 1 as the numerator. The output signals of the comparators 58A and 58B are the deviation indicators 68A and 68B.
Is output to display that the image forming point is deviated. The output signal of the divider 66 is also output to the focus indicator 70 to display the focus state. Since the process of detecting the in-focus point based on the in-focus signal ΔS which is the output signal of the divider 66 is the same as the above, the description thereof will be omitted. When the image forming point is largely deviated, for example, when it is deviated to the right side in FIG. 5, the output signal of the light receiving element 54B becomes very large as compared with the normal case. Therefore, the output signal from the light receiving element 54B and the reference signal Vre
f is compared in the comparator 58B, and when the output signal from the light receiving element 54B exceeds the reference signal, this is displayed on the shift indicator 68B, and the image formation point is greatly shifted to the right side in the figure. indicate. Therefore, in this case, the objective lens can be moved at high speed to quickly obtain the focal point. When the image forming point is displaced to the light receiving element 54A side, the displacement is displayed on the displacement indicator 68A by the output signal from the comparator 58A. In this case as well, the objective lens is quickly moved to the in-focus point. Can be made. When there is little deviation of the image formation point, as described above, the objective lens is finely adjusted and adjusted so that the focus signal ΔS = 0.
Focus can be obtained. Therefore, when no deviation is displayed on the deviation indicators 68A and 68B, the objective lens can always be finely moved to obtain the in-focus point without causing hunting. In the above embodiment, the number of light receiving elements is two, but the present invention is not limited to this, and there may be a plurality of three or more pairs. In this case, a comparator for outputting the shift signal is required corresponding to the light receiving element, and a shift indicator is also required corresponding to the comparator. The first and second embodiments of the present invention both relate to a system using the Foucault method, but the present invention is not limited to this. For example, a third embodiment shown in FIG. Such as the one using the eccentric beam method, the one using the knife edge method like the fourth embodiment shown in FIG. 7, or the fifth embodiment shown in FIG.
It is applied to any of those utilizing the critical angle method. Regarding the third embodiment, in FIG. 6, reference numeral 72 is an objective mirror and 74 is a diaphragm. With respect to other configurations, the same or corresponding portions as those of the embodiment shown in FIG. 1 are designated by the same reference numerals as those in FIG. 1 and their explanations are omitted. Also in the case of the displacement detector using this eccentric beam method, the light receiving element
21A to 21F, the switching means therefor, and the detector are the same as those shown in FIG. 3 and / or FIG. In the fourth embodiment, in FIG. 7, reference numeral 76 is a quarter-wave plate arranged between the objective lens 16 and the half mirror 30, and 78 is between the light receiving element 20 and the converging lens 32. , Knife edges arranged at the focal position of the converging lens 32, respectively. Also in this embodiment, the arrangement of the light receiving elements 21A to 21F and the structure of the detector may be the same as the structure shown in FIG. 3 or FIG. In the case of the fifth embodiment utilizing the critical angle method shown in FIG. 8, a prism 80 is arranged in place of the converging lens 32 and the knife edge 78 in the embodiment of FIG. The prism 80, for the reflected light from the half mirror 30,
It is arranged so that the refraction angle becomes a critical angle. Also in this embodiment, the light receiving elements 21A to 21F, or the switching means and the detector have the same configurations as those shown in FIG. 3 or FIG.

【発明の効果】【The invention's effect】

第1発明は、上記のように構成したので、対物レンズあ
るいは光源の変更に基づく収差によつて結像点がずれた
場合にも、受光素子を移動させることなく該結像点のず
れを補正して、迅速確実に合焦点を検出することができ
るという優れた効果を有する。 又、第2発明は、結像点のずれの大小を確実に弁別、検
出し、そのずれ量に応じて対物レンズの移動速度を切換
え、ハンチングを起こしたり、あるいは余計な時間がか
かることなく、迅速に合焦点を検出することができると
いう優れた効果を有する。
Since the first aspect of the present invention is configured as described above, even if the image forming point is deviated due to the aberration caused by the change of the objective lens or the light source, the deviation of the image forming point is corrected without moving the light receiving element. Thus, there is an excellent effect that the in-focus point can be detected quickly and surely. The second aspect of the present invention reliably discriminates and detects the magnitude of the deviation of the image formation point, switches the moving speed of the objective lens according to the deviation amount, causes hunting, or does not take extra time. It has an excellent effect that the focused point can be detected quickly.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明を適用すべき変位検出装置を示す断面
図、第2図は第1発明の実施例における受光スポツトと
受光素子の関係を示す平面図、第3図は同実施例の検出
器及びアレイ切換手段を示す回路図、第4図は同実施例
における検出器の出力信号の状態を示す線図、第5図は
本発明の第2実施例の要部を示す回路図、第6図〜8図
は前記第1図及び第2発明を他の検出方法に適用した第
3〜第5実施例を示す断面図、第9図は従来の変位検出
装置を示す断面図、第10図は同従来の変位検出装置にお
ける合焦信号を示す線図である。 10……光ビーム、11……光軸、 12……光源、14……被測定物、 16……対物レンズ、 18……フーコープリズム、 20A〜20H……受光素子、 22……アレイ切換手段、 28……検出器、 52A、52B、54A、54B……受光素子、 56、84……検出器、 58A、58B……比較器、 68A、68B……ずれ表示器、 78……ナイフエツジ、 80……プリズム。
FIG. 1 is a sectional view showing a displacement detecting device to which the present invention is applied, FIG. 2 is a plan view showing a relationship between a light receiving spot and a light receiving element in an embodiment of the first invention, and FIG. 3 is a detection of the same embodiment. FIG. 4 is a circuit diagram showing the detector and array switching means, FIG. 4 is a diagram showing the state of the output signal of the detector in the same embodiment, and FIG. 5 is a circuit diagram showing the essential parts of the second embodiment of the present invention. 6 to 8 are sectional views showing third to fifth embodiments in which the first and second inventions are applied to other detection methods, and FIG. 9 is a sectional view showing a conventional displacement detecting device, The figure is a diagram showing a focusing signal in the conventional displacement detecting apparatus. 10 ... Light beam, 11 ... Optical axis, 12 ... Light source, 14 ... Object to be measured, 16 ... Objective lens, 18 ... Foucault prism, 20A-20H ... Light receiving element, 22 ... Array switching means , 28 …… Detector, 52A, 52B, 54A, 54B …… Light receiving element, 56, 84 …… Detector, 58A, 58B …… Comparator, 68A, 68B …… Displacement indicator, 78 …… Knife edge, 80 ……prism.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】光ビームを放射する光源と、被測定物の被
測定表面に対向して配置され、該被測定表面と略直交す
る前記光ビームの光路上に光軸を備えた対物レンズと;
この対物レンズに対して前記被測定物の反対側に配置さ
れ、前記光ビームが前記光路を通つて前記被測定表面に
直進し、且つ、該被測定表面で反射されて形成され、前
記対物レンズを通つた反射光を集光させる集光手段と;
前記反射光が集光される光スポツトの位置近傍であつ
て、該光スポツトを中心とし、且つ、該光軸と直交する
方向の同一直線上にアレイ状に配置された少なくとも4
個の受光素子と;これら受光素子の出力信号を、前記直
線上の任意の位置で2群に分離するアレイ切換手段と;
前記一方の群の出力信号の総和と他方の群の出力信号の
総和との差信号の変化により、前記被測定表面の前記光
軸方向の変位量を検出する検出器と;を有してなる変位
検出装置。
1. A light source which emits a light beam, and an objective lens which is arranged so as to face a surface to be measured of an object to be measured and has an optical axis on an optical path of the light beam which is substantially orthogonal to the surface to be measured. ;
The objective lens is arranged on the opposite side of the object to be measured with respect to the objective lens, and the light beam is formed by passing through the optical path to go straight to the surface to be measured and being reflected by the surface to be measured. A condensing means for condensing the reflected light that has passed through;
At least 4 arranged near the position of the light spot where the reflected light is focused and arranged in an array on the same straight line in the direction orthogonal to the light axis with the light spot as the center.
Individual light receiving elements; array switching means for separating the output signals of these light receiving elements into two groups at arbitrary positions on the straight line;
A detector for detecting a displacement amount of the surface to be measured in the optical axis direction, based on a change in a difference signal between a sum total of output signals of the one group and a sum total of output signals of the other group; Displacement detection device.
【請求項2】光ビームを放射する光源と、被測定物の被
測定表面に対向して配置され、該被測定表面と略直交す
る前記光ビームの光路上に光軸を備えた対物レンズと;
この対物レンズに対して前記被測定物の反対側に配置さ
れ、前記光ビームが前記光路を通つて前記被測定表面に
直進し、且つ、該被測定表面で反射されて形成され、前
記対物レンズを通つた反射光を集光させる集光手段と;
前記反射光が集光される光スポツトの位置近傍であつ
て、前記光軸と直交する方向の同一直線上に該光スポツ
トを中心として対称的に配置された少なくとも2対の受
光素子と;前記光スポツトを境界として2群に分けられ
た受光素子の各群の出力信号の総和の差信号の変化によ
り、前記被測定表面の前記光軸方向の変位量を検出する
検出器と;前記光スポツトに隣接する1対の受光素子よ
りも光軸から離れた位置の受光素子の出力信号と基準信
号とを比較し、前者が後者より大きいときずれ信号を出
力する比較器と;を有してなる変位検出装置。
2. A light source which emits a light beam, and an objective lens which is arranged so as to face a surface to be measured of the object to be measured and has an optical axis on an optical path of the light beam which is substantially orthogonal to the surface to be measured. ;
The objective lens is arranged on the opposite side of the object to be measured with respect to the objective lens, and the light beam is formed by passing through the optical path to go straight to the surface to be measured and being reflected by the surface to be measured. A condensing means for condensing the reflected light that has passed through;
At least two pairs of light-receiving elements which are arranged in the vicinity of the position of the light spot where the reflected light is focused and which are symmetrically arranged about the light spot on the same straight line in the direction orthogonal to the optical axis; A detector for detecting the displacement amount of the surface to be measured in the optical axis direction by the change of the difference signal of the sum of the output signals of the respective groups of the light receiving elements divided into two groups with the optical spot as a boundary; A comparator that compares the output signal of the light receiving element located farther from the optical axis than the pair of light receiving elements adjacent to the reference signal with the reference signal and outputs a shift signal when the former is larger than the latter. Displacement detection device.
【請求項3】請求項1又は2において、前記集光手段は
フーコープリズムを備えた合焦システムであることを特
徴とする変位検出装置。
3. The displacement detecting device according to claim 1, wherein the light converging means is a focusing system including a Foucault prism.
【請求項4】請求項1又は2において、前記集光手段
は、偏心光束法による合焦システムであることを特徴と
する変位検出装置。
4. A displacement detecting device according to claim 1 or 2, wherein said light converging means is a focusing system based on an eccentric beam method.
【請求項5】請求項1又は2において、前記集光手段
は、ナイフエツジ法による合焦システムであることを特
徴とする変位検出装置。
5. The displacement detecting device according to claim 1, wherein the light converging means is a focusing system based on a knife edge method.
【請求項6】請求項1又は2において、前記集合手段
は、臨界角法による合焦システムであることを特徴とす
る変位検出装置。
6. The displacement detecting device according to claim 1 or 2, wherein the collecting means is a focusing system based on a critical angle method.
JP7276790A 1989-03-27 1990-03-22 Displacement detection device Expired - Fee Related JPH0690033B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7276790A JPH0690033B2 (en) 1989-03-27 1990-03-22 Displacement detection device

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP7471889 1989-03-27
JP1-74718 1989-03-27
JP7276790A JPH0690033B2 (en) 1989-03-27 1990-03-22 Displacement detection device

Publications (2)

Publication Number Publication Date
JPH0315710A JPH0315710A (en) 1991-01-24
JPH0690033B2 true JPH0690033B2 (en) 1994-11-14

Family

ID=26413904

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7276790A Expired - Fee Related JPH0690033B2 (en) 1989-03-27 1990-03-22 Displacement detection device

Country Status (1)

Country Link
JP (1) JPH0690033B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4553030B2 (en) * 2008-04-11 2010-09-29 ソニー株式会社 Automatic focus control unit, electronic equipment, automatic focus control method

Also Published As

Publication number Publication date
JPH0315710A (en) 1991-01-24

Similar Documents

Publication Publication Date Title
EP0219908B1 (en) Apparatus for optically scanning an information plane
US7116412B2 (en) Angle detection optical system, angle detection apparatus, optical signal switch system and information recording and reproduction system
US5033856A (en) Three-dimensional shape measuring apparatus
NL7904579A (en) OPTICAL IMAGING SYSTEM INCLUDING AN OPTO-ELECTRONIC DETECTION SYSTEM FOR DETERMINING A DEROGATION BETWEEN THE IMAGE SCREEN AND A SECOND PLACE TO BE IMAGES ON.
US5424834A (en) Optical displacement sensor for measurement of shape and coarseness of a target workpiece surface
US6580495B2 (en) Surveying instrument having a phase-difference detection type focus detecting device and a beam-splitting optical system
US5822293A (en) Magnetooptical recording/reproducing apparatus
JP4652745B2 (en) Optical displacement measuring instrument
JPS6161178B2 (en)
JPH0690033B2 (en) Displacement detection device
JPH1089953A (en) Focus detecting apparatus
JPH07294231A (en) Optical surface roughness meter
JPH06213623A (en) Optical displacement sensor
JPS6331858B2 (en)
US20070291598A1 (en) Servo Branch of Optical Disc Drive Comprising a Switchable Diaphragm and a Device for Beam Deflection, and Methods for Measuring Beam Lanking and Spherical Aberration
JP2552660B2 (en) Focus error detector
JPH05223565A (en) Distance measuring device
JPH0717047Y2 (en) Autofocus device for optical measuring instrument
JP2808713B2 (en) Optical micro displacement measuring device
KR880004297Y1 (en) Optical sensor for focusing control
JPH07174552A (en) Apparatus for detecting focal point
JPH089697Y2 (en) Microscope autofocus equipment
JPH0654232B2 (en) Displacement detection device
JPH0743835B2 (en) Focus error detector
JPH0968408A (en) Optical displacement sensor

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees