JPH07106893A - Frequency adjustment method for piezoelectric resonator - Google Patents
Frequency adjustment method for piezoelectric resonatorInfo
- Publication number
- JPH07106893A JPH07106893A JP27743993A JP27743993A JPH07106893A JP H07106893 A JPH07106893 A JP H07106893A JP 27743993 A JP27743993 A JP 27743993A JP 27743993 A JP27743993 A JP 27743993A JP H07106893 A JPH07106893 A JP H07106893A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- electrodes
- voltage
- resonance frequency
- mother substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 14
- 230000010287 polarization Effects 0.000 claims abstract description 20
- 239000000758 substrate Substances 0.000 claims description 26
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 230000002950 deficient Effects 0.000 abstract description 11
- 239000000919 ceramic Substances 0.000 abstract description 7
- 239000011347 resin Substances 0.000 abstract description 4
- 229920005989 resin Polymers 0.000 abstract description 4
- 238000003618 dip coating Methods 0.000 abstract description 3
- 238000005530 etching Methods 0.000 abstract description 2
- 238000007740 vapor deposition Methods 0.000 abstract description 2
- 238000005476 soldering Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は圧電共振子の周波数調整
方法、特に厚み縦振動モードの圧電共振子の分極度を調
整する方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of adjusting the frequency of a piezoelectric resonator, and more particularly to a method of adjusting the polarization degree of a piezoelectric resonator in a thickness extensional vibration mode.
【0002】[0002]
【従来の技術】従来、厚み縦振動モードを利用した圧電
共振子は次のような工程で製造される。まずマザー基板
のほぼ全面に電極を形成し、これに予め決められた電界
をかけることにより、分極処理を行う。その後、電極を
エッチングして個別電極を形成し、マザー基板の中の1
個の個別電極について周波数を測定する。そして、その
周波数に応じて電極上に周波数調整インクを塗布するこ
とにより、マザー基板における周波数調整を行う。その
後、マザー基板を個別の素子に分離カットし、これに端
子を取り付けた後、ディップコーティング等の外装を施
すことにより、完成品とする。その後、個々の完成品の
周波数を測定し、その中から所定周波数範囲内のものを
良品として選別している。2. Description of the Related Art Conventionally, a piezoelectric resonator utilizing a thickness extensional vibration mode is manufactured by the following steps. First, an electrode is formed on almost the entire surface of the mother substrate, and a predetermined electric field is applied to the electrode to perform polarization processing. After that, the electrodes are etched to form individual electrodes, and
The frequency is measured for each individual electrode. Then, the frequency adjustment ink is applied to the electrodes according to the frequency to adjust the frequency on the mother substrate. After that, the mother substrate is separated and cut into individual elements, terminals are attached to this, and then an exterior such as dip coating is applied to complete the product. After that, the frequencies of the individual finished products are measured, and those within the predetermined frequency range are selected as non-defective products.
【0003】[0003]
【発明が解決しようとする課題】上記のような製造方法
の場合、マザー基板の段階で周波数測定と周波数調整と
を行っているが、その周波数測定は作業上マザー基板の
中の1点または数点に限られる。ところが、マザー基板
の中央部と周辺部とでは基板の厚みが異なるため、完成
品となった段階では周波数のバラツキが大きくなり、不
良率が増大してしまうという欠点がある。また、マザー
基板と完成品との周波数の相関関係が一定しないので、
マザー基板の段階で良品であったとしても、完成品の段
階でも良品であるとは限らない。周波数不良の完成品は
廃棄されるので、無駄が多い。そこで、本発明の目的
は、完成品における周波数のバラツキを少なくし、不良
率を大幅に低減できる圧電共振子の周波数調整方法を提
供することにある。In the case of the above manufacturing method, the frequency measurement and the frequency adjustment are performed at the stage of the mother board. However, the frequency measurement is one point or a few points in the mother board for work. Limited to points. However, since the thickness of the mother board is different between the central part and the peripheral part of the mother board, there is a drawback that the variation of the frequency becomes large at the stage of the finished product and the defective rate increases. Also, since the frequency correlation between the mother board and the finished product is not constant,
Even if it is a good product at the stage of the mother board, it is not always good at the stage of the finished product. Since the finished product with the defective frequency is discarded, there is much waste. Therefore, it is an object of the present invention to provide a method for adjusting the frequency of a piezoelectric resonator, which can reduce the frequency variation in a finished product and can significantly reduce the defective rate.
【0004】[0004]
【課題を解決するための手段】上記目的を達成するた
め、本発明は、外装が形成された各素子の周波数を測定
する工程と、各素子をその周波数と所定範囲との比較に
より選別する工程と、所定範囲外として選別された素子
の外部接続用端子に直流電圧を印加することにより、そ
の周波数が上記所定範囲内に入るように二次分極処理を
行う工程と、を備えるものである。In order to achieve the above object, the present invention provides a step of measuring a frequency of each element having an outer package and a step of selecting each element by comparing the frequency with a predetermined range. And a step of applying a secondary voltage to the external connection terminals of the elements selected as outside the predetermined range so that the frequency thereof falls within the predetermined range.
【0005】[0005]
【作用】端子が接続され、かつ外装が形成された完成品
における周波数を測定し、選別を行う。選別により不良
品とされた完成品に対し、外部接続用端子に直流電圧を
印加することにより、二次分極処理を行う。例えば、完
成品の周波数が所定範囲より低い場合には、+方向の直
流電圧を印加することにより周波数を高く調整し、逆に
所定範囲より高い場合には、−方向の直流電圧を印加す
ることにより周波数を低く調整する。これにより、全て
の完成品の周波数を所定範囲内に制御でき、不良品を解
消することが可能となる。Function: The frequency is measured and the selection is performed in the finished product to which the terminals are connected and the exterior is formed. Secondary polarization processing is performed by applying a DC voltage to the external connection terminal for the finished product that has been determined to be defective by sorting. For example, if the frequency of the finished product is lower than the prescribed range, the DC voltage in the + direction should be applied to adjust the frequency higher, and if it is higher than the prescribed range, the DC voltage in the-direction should be applied. Adjust the frequency lower by. As a result, the frequencies of all finished products can be controlled within a predetermined range, and defective products can be eliminated.
【0006】本発明方法によれば、マザー基板における
周波数が目標周波数より高くなっても完成品の段階で補
正できるので、マザー基板の一次分極処理を予め目標周
波数より低目となるように行う必要がなく、一次分極処
理が行いやすくなる。また、従来行われていたマザー基
板への周波数調整インクの塗布による周波数調整を省略
することも可能である。According to the method of the present invention, even if the frequency on the mother substrate becomes higher than the target frequency, it can be corrected at the stage of the finished product, so that it is necessary to perform the primary polarization treatment of the mother substrate so as to be lower than the target frequency beforehand. Therefore, it is easy to perform the primary polarization treatment. Further, it is possible to omit the conventional frequency adjustment by applying the frequency adjustment ink to the mother substrate.
【0007】[0007]
【実施例】本発明における圧電共振子の製造方法を図1
に従って説明する。まず、分極処理の施されていない長
方形の圧電セラミック基板よりなるマザー基板1(図2
参照)の表裏面に全面電極2,2を蒸着などの手法で形
成する(工程S1 )。そして、全面電極2,2間に直流
電圧を印加することにより、マザー基板1にその厚み方
向Pの一次分極を行う(工程S2 )。EXAMPLE FIG. 1 shows a method of manufacturing a piezoelectric resonator according to the present invention.
Follow the instructions below. First, a mother substrate 1 (FIG. 2) made of a rectangular piezoelectric ceramic substrate that is not subjected to polarization treatment is used.
The whole surface electrodes 2 and 2 are formed on the front and back surfaces of (see) by a method such as vapor deposition (step S 1 ). Then, by applying a DC voltage between the full-surface electrode 2, 2, performs an order polarization in the thickness direction P on the mother substrate 1 (step S 2).
【0008】分極処理が終了したマザー基板1の表裏面
には、個別電極パターンに対応するレジストマスクを印
刷し、エッチングする(工程S3 )。これにより、図3
のように振動電極3aを有する複数の個別電極3が形成
される。なお、個別電極3の形成方法としては、上記の
ように全面電極2の一部を利用して個別電極3を形成す
る方法のほか、全面電極2をすべてエッチング等にて除
去した後、新たに個別電極3を形成してもよい。A resist mask corresponding to the individual electrode pattern is printed on the front and back surfaces of the mother substrate 1 which has been polarized, and is etched (step S 3 ). As a result, FIG.
As described above, a plurality of individual electrodes 3 having the vibrating electrodes 3a are formed. As a method of forming the individual electrode 3, in addition to the method of forming the individual electrode 3 by utilizing a part of the entire surface electrode 2 as described above, after removing the entire surface electrode 2 by etching or the like, a new method is performed. The individual electrode 3 may be formed.
【0009】個別電極3を形成した後、マザー基板1上
のいずれか1個の個別電極3間の中心周波数F0 を測定
し、選別を行う(工程S4 )。なお、個別電極3はその
周波数F0 が目標周波数範囲より低めになるように予め
設定されている。選別の後、図4のように目標周波数範
囲との差に応じて周波数調整用インク4を振動電極3a
上に塗布し、周波数調整を行う(工程S5 )。周波数調
整の後、マザー基板1を第4図破線で示すように各個別
電極3ごとに分離カットし(工程S6 )、図5のような
素子Aを得る。After forming the individual electrodes 3, the center frequency F 0 between any one of the individual electrodes 3 on the mother substrate 1 is measured and selected (step S 4 ). The individual electrode 3 is preset so that its frequency F 0 is lower than the target frequency range. After the selection, as shown in FIG. 4, the frequency adjusting ink 4 is applied to the vibrating electrode 3a according to the difference with the target frequency range.
It is applied on the surface and frequency is adjusted (step S 5 ). After the frequency adjustment, the mother substrate 1 is separated and cut for each individual electrode 3 as shown by the broken line in FIG. 4 (step S 6 ), and the element A as shown in FIG. 5 is obtained.
【0010】図5において、素子Aは圧電セラミック基
板1aの表裏面に一対の電極3,3を形成してなり、両
電極3,3の円形の振動電極3a,3aが圧電セラミッ
ク基板1aを間にして対向している。また、電極3,3
の端子電極3b,3bは圧電セラミック基板1aの表裏
面の対称な両側端部に形成され、振動電極3aと端子電
極3bとは細い引出電極3cを介して導通している。両
電極3,3間に電圧が印加されると、圧電セラミック基
板1aには矢印P方向の分極処理が施されているので、
振動電極3a,3aで挟まれた圧電セラミック基板1a
の部分にエネルギー閉じ込め型厚み縦振動が励振され
る。In FIG. 5, an element A is formed by forming a pair of electrodes 3, 3 on the front and back surfaces of a piezoelectric ceramic substrate 1a, and circular vibrating electrodes 3a, 3a of both electrodes 3, 3 sandwich the piezoelectric ceramic substrate 1a. And are facing each other. Also, the electrodes 3, 3
The terminal electrodes 3b and 3b are formed at symmetrically opposite end portions of the front and back surfaces of the piezoelectric ceramic substrate 1a, and the vibrating electrode 3a and the terminal electrode 3b are electrically connected via a thin lead electrode 3c. When a voltage is applied between the electrodes 3 and 3, the piezoelectric ceramic substrate 1a is polarized in the direction of arrow P.
Piezoelectric ceramic substrate 1a sandwiched between vibrating electrodes 3a, 3a
An energy trap type thickness longitudinal vibration is excited in the area of.
【0011】上記素子Aの端子電極3b,3bに対して
リード端子5,5を半田付けし(工程S7 )、さらに素
子Aの周囲にディップコーティングにより外装樹脂層6
を形成し(工程S8 )、図6のような完成品Bを得る。
なお、外装樹脂層6を形成する際、振動電極3a上には
振動空間となる空洞7が公知の方法で形成される。その
後、図7に示す完成品Bの周波数選別・コントロールを
行う(工程S9 )。[0011] terminal electrodes 3b of the element A, the lead terminals 5,5 with respect 3b soldered (step S 7), exterior resin layer by dip coating around the still elements A 6
To form a (step S 8), to obtain a finished product B as shown in FIG. 6.
When the exterior resin layer 6 is formed, a cavity 7 serving as a vibration space is formed on the vibration electrode 3a by a known method. After that, frequency selection / control of the finished product B shown in FIG. 7 is performed (step S 9 ).
【0012】図7において、完成品Bの周波数F0 を測
定する(工程S10)。この測定は、測定装置の測定端子
を完成品Bのリード端子5,5に接触させて行う。次い
で、測定した周波数F0 が目標周波数F1 〜F2 の範囲
内にあるか否かを選別する(工程S11)。F1 ≦F0 ≦
F2 であれば、良品として後述する二次分極を行わな
い。F1 >F0 であれば、周波数F0 が低過ぎるので、
+方向の一定の直流電圧をリード端子5,5間に印加
し、周波数を高める方向に二次分極を行う(工程
S12)。一方、F0 >F2 であれば、周波数が高過ぎる
ので、−方向の一定の直流電圧をリード端子5,5間に
印加し、周波数を低める方向に二次分極を行う(工程S
13)。上記のように二次分極を行った後、再度周波数F
0 の測定(工程S10)と選別(工程S11)を行い、目標
周波数F1 〜F2 の範囲内に入るまで繰り返し二次分極
を行う。このようにして、初期の完成品Bの段階で図8
(a)のような周波数分布であったものを、図8(b)
のような周波数分布に調整でき、殆ど不良品を発生させ
ずに済む。In FIG. 7, the frequency F 0 of the finished product B is measured (step S 10 ). This measurement is performed by bringing the measuring terminals of the measuring device into contact with the lead terminals 5 and 5 of the finished product B. Next, it is selected whether or not the measured frequency F 0 is within the range of the target frequencies F 1 to F 2 (step S 11 ). F 1 ≦ F 0 ≦
If it is F 2 , the secondary polarization described later as a non-defective product is not performed. If F 1 > F 0 , the frequency F 0 is too low, so
A constant DC voltage in the + direction is applied between the lead terminals 5 and 5 to perform secondary polarization in the direction of increasing the frequency (step S 12 ). On the other hand, if F 0 > F 2 , the frequency is too high, so a constant DC voltage in the − direction is applied between the lead terminals 5 and 5, and secondary polarization is performed in the direction of decreasing the frequency (step S
13 ). After performing the secondary polarization as described above, the frequency F is again measured.
Measurement of 0 (step S 10 ) and selection (step S 11 ) are performed, and secondary polarization is repeatedly performed until the target frequency falls within the range of F 1 to F 2 . In this way, at the stage of the initial finished product B, as shown in FIG.
The frequency distribution shown in FIG. 8A is shown in FIG.
The frequency distribution can be adjusted as described above, and it is possible to generate almost no defective products.
【0013】なお、上記実施例では二次分極の際、+方
向または−方向の一定の直流電圧を繰り返し印加するよ
うにしたが、これに代えて、周波数F0 と目標値(F1
またはF2 )との差に応じた直流電圧を印加するように
してもよい。これであれば、1回の二次分極で済む。ま
た、上記実施例ではマザー基板の段階で周波数調整用イ
ンク4を塗布して周波数調整を行うようにしたが、この
工程を省略してもよい。本発明は、実施例のようなリー
ド端子付き圧電共振子に限らず、共振子素子をケース内
に収容したチップ型圧電共振子にも適用できる。この場
合、外部接続用端子としては、ケースの外面に形成され
た外部電極あるいは金属キャップであってもよい。In the above embodiment, a constant DC voltage in the + direction or in the − direction is repeatedly applied during the secondary polarization, but instead of this, the frequency F 0 and the target value (F 1
Alternatively, a DC voltage corresponding to the difference from F 2 ) may be applied. In this case, one secondary polarization is sufficient. Further, in the above embodiment, the frequency adjustment ink 4 is applied at the stage of the mother substrate to adjust the frequency, but this step may be omitted. The present invention is not limited to the piezoelectric resonator with lead terminals as in the embodiments, but can be applied to a chip-type piezoelectric resonator having a resonator element housed in a case. In this case, the external connection terminal may be an external electrode or a metal cap formed on the outer surface of the case.
【0014】[0014]
【発明の効果】以上の説明で明らかなように、本発明に
よれば、周波数選別で不良品とされた完成品に対し、外
部接続用端子に直流電圧を印加することにより二次分極
処理を行うようにしたので、マザー基板の中央部と周辺
部との厚みの違いや、マザー基板と完成品との周波数の
相関関係による周波数バラツキの影響を受けず、全ての
完成品の周波数を所定範囲内に制御できる。そのため、
不良品を解消することが可能となる。As is apparent from the above description, according to the present invention, a secondary polarization treatment is applied to a completed product which is determined to be defective by frequency selection by applying a DC voltage to the external connection terminal. Since this is done, the frequency of all finished products is within the specified range without being affected by the difference in thickness between the central portion and the peripheral portion of the mother substrate or the frequency variation due to the correlation between the frequencies of the mother substrate and finished products. It can be controlled within. for that reason,
It is possible to eliminate defective products.
【図1】本発明にかかる圧電共振子の全製造方法のフロ
ー図である。FIG. 1 is a flow chart of an overall method for manufacturing a piezoelectric resonator according to the present invention.
【図2】マザー基板に全面電極を形成した状態の斜視図
である。FIG. 2 is a perspective view showing a state where a full-scale electrode is formed on a mother substrate.
【図3】マザー基板に個別電極を形成した状態の斜視図
である。FIG. 3 is a perspective view showing a state where individual electrodes are formed on a mother substrate.
【図4】マザー基板に周波数調整用インクを塗布した状
態の斜視図である。FIG. 4 is a perspective view showing a state where the frequency adjusting ink is applied to the mother substrate.
【図5】個別の素子にカットした状態の斜視図である。FIG. 5 is a perspective view of a state in which individual elements are cut.
【図6】完成品の断面図である。FIG. 6 is a sectional view of the finished product.
【図7】完成品の選別,周波数調整の方法を示すフロー
図である。FIG. 7 is a flowchart showing a method of selecting a finished product and adjusting a frequency.
【図8】完成品の周波数調整前と後の周波数分布図であ
る。FIG. 8 is a frequency distribution diagram of a finished product before and after frequency adjustment.
1 マザー基板 2 全面電極 3 個別電極 3a 振動電極 4 周波数調整用インク 5 リード端子 6 外装樹脂 1 Mother board 2 Full surface electrode 3 Individual electrode 3a Vibration electrode 4 Frequency adjustment ink 5 Lead terminal 6 Exterior resin
Claims (1)
外装を形成する工程とを含む圧電共振子の製造方法にお
いて、 上記外装が形成された各素子の周波数を測定する工程
と、 各素子をその周波数と所定範囲との比較により選別する
工程と、 所定範囲外として選別された素子の外部接続用端子に直
流電圧を印加することにより、その周波数が上記所定範
囲内に入るように二次分極処理を行う工程と、を備える
ことを特徴とする圧電共振子の周波数調整方法。1. A step of performing primary polarization treatment on a mother substrate, a step of forming a plurality of individual electrodes on the mother substrate, a step of separately cutting the mother substrate for each individual electrode, and In a method for manufacturing a piezoelectric resonator, including a step of connecting a connecting terminal and forming an outer package, a step of measuring the frequency of each element in which the outer package is formed, A step of selecting by comparison, and a step of performing a secondary polarization treatment so that the frequency thereof falls within the predetermined range by applying a DC voltage to the external connection terminals of the elements selected as outside the predetermined range. A method for adjusting the frequency of a piezoelectric resonator, comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27743993A JPH07106893A (en) | 1993-10-07 | 1993-10-07 | Frequency adjustment method for piezoelectric resonator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27743993A JPH07106893A (en) | 1993-10-07 | 1993-10-07 | Frequency adjustment method for piezoelectric resonator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07106893A true JPH07106893A (en) | 1995-04-21 |
Family
ID=17583588
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27743993A Pending JPH07106893A (en) | 1993-10-07 | 1993-10-07 | Frequency adjustment method for piezoelectric resonator |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07106893A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6772491B2 (en) | 2000-12-25 | 2004-08-10 | Murata Manufacturing Co., Ltd. | Manufacturing method for ceramic oscillator |
-
1993
- 1993-10-07 JP JP27743993A patent/JPH07106893A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6772491B2 (en) | 2000-12-25 | 2004-08-10 | Murata Manufacturing Co., Ltd. | Manufacturing method for ceramic oscillator |
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