JPH07128227A - Atomic absorption spectrophotometer with sample concentration function - Google Patents
Atomic absorption spectrophotometer with sample concentration functionInfo
- Publication number
- JPH07128227A JPH07128227A JP5293888A JP29388893A JPH07128227A JP H07128227 A JPH07128227 A JP H07128227A JP 5293888 A JP5293888 A JP 5293888A JP 29388893 A JP29388893 A JP 29388893A JP H07128227 A JPH07128227 A JP H07128227A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- concentration
- absorbance
- injection
- calibration curve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Sampling And Sample Adjustment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】
【目的】 未知試料の分析対象元素の濃度が定量下限よ
り小さい場合に、自動的に濃縮して再測定できるように
する。
【構成】 試料の吸光度Aが定量下限Astdより小さい
ものであったときは、濃縮制御部18は注入制御部10
によりその試料を一定量yずつ複数回繰り返して注入さ
せ、その繰返しの最後の注入を除く各注入試料に対して
電源制御部12により濃縮モードProg.Bでの加熱をさ
せ、その繰返しの最後の注入試料に対しては分析モード
Prog.Mでの加熱をさせる。濃度算出部20は、濃縮試
料による測定吸光度A'を用いて検量線から算出した濃
度を濃縮率により補正して出力する。
(57) [Summary] [Purpose] If the concentration of the element to be analyzed in the unknown sample is lower than the lower limit of quantification, it is automatically concentrated to enable remeasurement. [Constitution] When the absorbance A of the sample is smaller than the lower limit of quantification Astd, the concentration controller 18 determines that the injection controller 10
The sample is repeatedly injected by a fixed amount y by a plurality of times, and each injection sample except the last injection of the repetition is heated in the concentration mode Prog.B by the power supply control unit 12, and the final injection of the repetition is performed. Analysis mode for injected samples
Heat with Prog.M. The concentration calculating unit 20 corrects the concentration calculated from the calibration curve using the measured absorbance A ′ of the concentrated sample by the concentration rate and outputs the corrected concentration.
Description
【0001】[0001]
【産業上の利用分野】本発明は様々な物質中に含まれる
金属元素の定量分析を行なう原子吸光分光光度計に関
し、とくにフレームレス方式の原子化部を備え、オート
サンプラを備えて自動分析を行なうようにした原子吸光
分光光度計に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an atomic absorption spectrophotometer for quantitatively analyzing metallic elements contained in various substances, and in particular, it is equipped with a flameless atomization unit and equipped with an autosampler for automatic analysis. The present invention relates to an atomic absorption spectrophotometer designed to be used.
【0002】[0002]
【従来の技術】フレームレス方式の原子吸光分光光度計
では、試料を電気加熱炉中に入れて高温に加熱すること
により、試料の乾燥、灰化及び原子化を行なって原子蒸
気を生成させ、その原子蒸気中に適当な波長の光を透過
させて原子吸光分析を行なう。加熱炉ではグラファイト
チューブの両端の電極からグラファイトチューブに通電
することにより発熱させる。2. Description of the Related Art In a flameless atomic absorption spectrophotometer, a sample is placed in an electric heating furnace and heated to a high temperature to dry, ash and atomize the sample to generate atomic vapor. Atomic absorption analysis is performed by transmitting light of an appropriate wavelength through the atomic vapor. In the heating furnace, heat is generated by energizing the graphite tube from electrodes on both ends of the graphite tube.
【0003】試料中の測定対象元素の濃度は、検出器に
よる検出信号から求めた吸光度を元にして算出する。吸
光度から濃度を算出するために、測定試料量と同量の標
準試料を用いて予め濃度と吸光度との関係を示す検量線
を作成しておく。原子化部の電気加熱炉にはグラファイ
ト炉が主に用いられており、そのグラファイト炉に試料
を自動的に注入するオートサンプラを用いた自動分析が
行なわれている。The concentration of the element to be measured in the sample is calculated based on the absorbance obtained from the detection signal from the detector. In order to calculate the concentration from the absorbance, a standard curve showing the relationship between the concentration and the absorbance is prepared in advance using a standard sample of the same amount as the measurement sample amount. A graphite furnace is mainly used as an electric heating furnace in the atomization section, and automatic analysis is performed using an autosampler that automatically injects a sample into the graphite furnace.
【0004】自動分析では、未知試料の吸光度を測定し
たとき、その吸光度が検量線から濃度を算出できる最高
濃度の吸光度の検量点よりも大きな値になったときは、
オートサンプラで希釈液を用いて試料を自動的に希釈
し、再測定することが行なわれている。一方、未知試料
の吸光度が検量線から濃度を求めることのできる最低濃
度の吸光度の検量点(以下、定量下限という)よりも小
さい場合には、その未知試料の再測定は行なっていな
い。In the automatic analysis, when the absorbance of an unknown sample is measured and the absorbance becomes a value larger than the calibration point of the maximum concentration at which the concentration can be calculated from the calibration curve,
Samples are automatically diluted with an autosampler using a diluent, and remeasurement is performed. On the other hand, when the absorbance of the unknown sample is smaller than the calibration point (hereinafter referred to as the lower limit of quantification) of the minimum concentration at which the concentration can be obtained from the calibration curve, the unknown sample is not remeasured.
【0005】[0005]
【発明が解決しようとする課題】試料中の測定対象元素
の濃度が0ではないが、定量下限よりも小さい場合に
は、再測定は行なわず、検量線を外插するなどして濃度
を算出しているため、定量下限より低濃度の試料の測定
精度が悪くなる問題を含んでいる。このような低濃度試
料を再測定する場合は、作業者が手作業で試料を濃縮す
る作業が必要になってくる。手作業により濃縮を行なっ
て再測定をすると、測定誤差が大きくなり、作業者の個
人差も生じる。本発明は未知試料の分析対象元素の濃度
が定量下限より小さい場合に、自動的に濃縮して再測定
できるようにすることを目的とするものである。If the concentration of the element to be measured in the sample is not 0, but it is smaller than the lower limit of quantification, re-measurement is not performed and the concentration is calculated by external calibration or the like. Therefore, there is a problem in that the measurement accuracy of a sample having a concentration lower than the lower limit of quantification is deteriorated. When re-measuring such a low-concentration sample, the operator needs to manually concentrate the sample. If concentration is performed manually and re-measurement is performed, a measurement error becomes large and individual differences among workers occur. It is an object of the present invention to automatically concentrate and re-measure when the concentration of an element to be analyzed in an unknown sample is lower than the lower limit of quantification.
【0006】[0006]
【課題を解決するための手段】本発明が対象とするフレ
ームレス方式の原子吸光分光光度計は、通電発熱し分析
すべき試料を乾燥、灰化及び原子化して原子蒸気を生成
する電気加熱炉と、電気加熱炉に試料を自動的に注入す
るオートサンプラと、電気加熱炉中の原子蒸気に測定光
を照射し、その透過光から分析対象元素の吸光度を求め
る光学系と、試料注入及び分析動作を制御し、得られた
吸光度Aから試料の分析対象元素の濃度Cを算出して出
力する制御装置とを備えている。A flameless atomic absorption spectrophotometer to which the present invention is directed is an electric heating furnace for generating an atomic vapor by heating, energizing, and drying, ashing, and atomizing a sample to be analyzed. And an automatic sampler that automatically injects a sample into an electric heating furnace, an optical system that irradiates atomic vapor in the electric heating furnace with measurement light, and obtains the absorbance of the element to be analyzed from the transmitted light, sample injection and analysis A control device that controls the operation and calculates and outputs the concentration C of the element to be analyzed in the sample from the obtained absorbance A.
【0007】制御装置の機能を図1に示す。制御装置8
は、オートサンプラ4による所定量x又はyの試料注入
動作を制御する注入制御部10と、電気加熱炉の加熱電
源2を制御する加熱モードとして、分析時の乾燥、灰化
及び原子化の加熱過程をもつ分析モードProg.Mの他
に、乾燥のみの加熱過程又は乾燥及び灰化のみの加熱過
程をもつ濃縮モードProg.Bを有する電源制御部12
と、一定量xの標準試料の測定により得られた検量線デ
ータC=f(A)を記憶している検量線記憶部14と、
一定量xの未知試料の測定時に光学系で得られた吸光度
Aを定量下限Astdと比較する比較部16と、比較部1
6での比較の結果、その試料の吸光度Aが定量下限Ast
dより小さいものであったときは注入制御部10により
その試料を一定量yずつ複数回繰り返して注入させると
ともに、その繰返しの最後の注入を除く各注入試料に対
して電源制御部12により濃縮モードProg.Bでの加熱
をさせ、その繰返しの最後の注入試料に対しては電源制
御部12により分析モードProg.Mでの加熱をさせる濃
縮制御部18と、比較部16での比較の結果、その試料
の吸光度Aが定量下限Astd以上であったときはその測
定吸光度Aを用いて検量線から濃度を算出して出力し、
比較部16での比較の結果、その試料の吸光度Aが定量
下限Astdより小さいものであったときはそのときの濃
縮試料による測定吸光度A'を用いて検量線から算出し
た濃度を濃縮率により補正して出力する濃度算出部20
とを備えている。The function of the controller is shown in FIG. Control device 8
Is a heating mode that controls the injection control unit 10 that controls the sample injection operation of a predetermined amount x or y by the autosampler 4 and the heating power source 2 of the electric heating furnace. In addition to the analysis mode Prog.M having a process, the power supply controller 12 has a concentration mode Prog.B having a heating process only for drying or a heating process only for drying and ashing.
And a calibration curve storage unit 14 that stores calibration curve data C = f (A) obtained by measuring a standard sample of a fixed amount x,
A comparison unit 16 for comparing the absorbance A obtained by the optical system with the lower limit of quantification Astd when measuring a certain amount x of an unknown sample, and a comparison unit 1.
As a result of comparison in 6, the absorbance A of the sample is the lower limit of quantification Ast.
When it is smaller than d, the injection control unit 10 repeatedly injects a fixed amount y by a plurality of times, and the power supply control unit 12 causes each injection sample except the last injection of the repetition to be concentrated. As a result of comparison between the concentration control unit 18 that causes heating in Prog.B and the heating in the analysis mode Prog.M by the power supply control unit 12 for the last injected sample in the repetition, and the comparison unit 16, When the absorbance A of the sample is greater than or equal to the lower limit of quantification Astd, the concentration is calculated from the calibration curve using the measured absorbance A and output.
When the absorbance A of the sample is smaller than the lower limit of quantification Astd as a result of the comparison in the comparison unit 16, the concentration calculated from the calibration curve using the measured absorbance A ′ of the concentrated sample at that time is corrected by the concentration rate. Concentration output unit 20
It has and.
【0008】[0008]
【作用】図1と図2により本発明の動作を説明する。ま
ず、分析条件として、未知試料の濃度が定量下限より小
さい場合に炉内濃縮する回数Nを濃縮制御部18に設定
し、濃縮する際の炉内濃縮用温度プログラムProg.Bと
測定用温度プログラムProg.Mを電源制御部12に設定
しておく。標準試料測定時及び未知試料の通常の測定時
の試料注入量xμlと炉内濃縮時の試料注入量yμlを
注入制御部10に設定する。xとyが等しくてもよい。
未知試料の測定に先立って、分析対象元素の濃度が既知
の複数の標準試料を用いて測定を行ない、検量線を作成
する。検量線データは検量線記憶部14に記憶させる。The operation of the present invention will be described with reference to FIGS. First, as analysis conditions, when the concentration of an unknown sample is lower than the lower limit of quantification, the number N of times of concentration in the furnace is set in the concentration control unit 18, and a temperature program for concentration in the furnace Prog.B and a temperature program for measurement in concentration are set. Prog.M is set in the power supply controller 12. A sample injection amount x μl at the time of measuring the standard sample and a normal measurement of the unknown sample and a sample injection amount y μl at the time of concentration in the furnace are set in the injection controller 10. x and y may be equal.
Prior to the measurement of the unknown sample, measurement is performed using a plurality of standard samples with known concentrations of the element to be analyzed, and a calibration curve is created. The calibration curve data is stored in the calibration curve storage unit 14.
【0009】次に、図2に示されるように未知試料を測
定する。オートサンプラ4により未知試料のxμlが電
気加熱炉に注入され、測定用温度プログラムProg.Mに
従って試料の乾燥、灰化及び原子化が行なわれ、吸光度
が求められる。その吸光度が0以下であれば、対象元素
濃度0を出力されて測定が終了する。Next, an unknown sample is measured as shown in FIG. The autosampler 4 injects x μl of an unknown sample into an electric heating furnace, and the sample is dried, incinerated and atomized in accordance with the measurement temperature program Prog.M, and the absorbance is obtained. If the absorbance is 0 or less, a target element concentration of 0 is output and the measurement ends.
【0010】その吸光度Aが定量下限Astd以上である
場合は、検量線記憶部14の検量線データを用いて、濃
度算出部20で C=f(A) により濃度が算出され、表示部22に表示されて分析が
終了する。When the absorbance A is equal to or higher than the lower limit of quantification Astd, the concentration calculation unit 20 calculates the concentration by C = f (A) using the calibration curve data in the calibration curve storage unit 14, and the display unit 22 displays the concentration. Displayed and analysis ends.
【0011】一方、その吸光度Aが定量下限Astdより
小さい場合は、オートサンプラ4により試料が濃縮され
て再測定される。その濃縮工程では、濃縮制御部18は
試料注入部10を介してオートサンプラ4からyμlの
試料を電気加熱炉に注入し、電源制御部12を介して乾
燥のみの加熱過程又は乾燥と灰化の加熱過程のみを含む
濃縮モードの加熱プログラムProg.Bに従って乾燥段階
又は灰化段階まで行なう。この試料yμlの注入と、乾
燥又は乾燥及び灰化が(N−1)回繰り返された後、N
回目には再びyμlの試料がオートサンプラ4から電気
加熱炉に注入され、今度は測定用温度プログラムProg.
Mに従って乾燥、灰化及び原子化までの加熱過程を経て
吸光度が測定される。On the other hand, when the absorbance A is smaller than the lower limit of quantification Astd, the sample is concentrated by the autosampler 4 and remeasured. In the concentration step, the concentration control unit 18 injects y μl of the sample from the autosampler 4 into the electric heating furnace via the sample injection unit 10, and the heating process of only drying or the drying and ashing process via the power supply control unit 12. According to the heating program Prog.B in the concentrating mode including only the heating process, the drying step or the ashing step is performed. After injecting this sample yμl and drying or drying and ashing were repeated (N-1) times, N
At the second time, a yμl sample was injected again from the autosampler 4 into the electric heating furnace, and this time the temperature program for measurement Prog.
According to M, the absorbance is measured through a heating process including drying, ashing and atomization.
【0012】このようにして得られた吸光度A’は濃縮
された試料の吸光度である。そこで、検量線を作成した
ときのxμlでの試料量に換算するために、濃縮率によ
る補正がなされる。その補正された濃度は C=(x/Ny)・f(A') である。ここで、f(A')は検量線を用いて求めた濃縮
試料の吸光度、 (x/Ny)は濃縮率による補正
係数である。The absorbance A'obtained in this way is the absorbance of the concentrated sample. Therefore, in order to convert into the sample amount in x μl when the calibration curve was created, correction by the concentration rate is performed. The corrected density is C = (x / Ny) .f (A '). Here, f (A ′) is the absorbance of the concentrated sample obtained using the calibration curve, and (x / Ny) is the correction coefficient based on the concentration rate.
【0013】[0013]
【実施例】図3に本発明の一実施例の概略構成図を示
す。30は原子化部であり、加熱電源2により通電され
て発熱するグラファイトチューブを備えている。グラフ
ァイトチューブ内には試料が注入され、グラファイトチ
ューブにより試料が加熱されて原子化される。32は原
子化部30で生成した原子蒸気に測定光を照射する光源
であり、例えば中空陰極ランプ(ホローカソードラン
プ)が用いられる。34は原子化部30を透過してきた
測定光を分光する分光器部、36は分光された光を検出
する検出部であり、増幅装置6は検出部36の検出信号
を増幅し、吸光度を算出する。制御装置8はCPUとイ
ンターフェイス(I/O)を含んでおり、図1に示され
た機能を果たしているほか、光源32の点灯を制御し、
分光器部34での分光動作を制御する。38はキーボー
ドなどの操作部である。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 3 shows a schematic configuration diagram of an embodiment of the present invention. Reference numeral 30 denotes an atomization part, which is provided with a graphite tube that is energized by the heating power source 2 to generate heat. A sample is injected into the graphite tube, and the sample is heated and atomized by the graphite tube. Reference numeral 32 is a light source that irradiates the atomic vapor generated in the atomization unit 30 with measurement light, and for example, a hollow cathode lamp (hollow cathode lamp) is used. Reference numeral 34 is a spectroscope section that disperses the measurement light that has passed through the atomization section 30, and 36 is a detection section that detects the dispersed light. The amplification device 6 amplifies the detection signal of the detection section 36 and calculates the absorbance. To do. The control device 8 includes a CPU and an interface (I / O), performs the functions shown in FIG. 1, and controls the lighting of the light source 32.
The spectroscopic operation in the spectroscope unit 34 is controlled. Reference numeral 38 is an operation unit such as a keyboard.
【0014】加熱電源2はグラファイトチューブに流す
電流を制御するために、AC200Vの電源をトランス
32で変圧してグラファイトチューブに供給する。通電
制御はトライアックにより行なわれ、トライアックは制
御装置8の電源制御部2からの温度プログラムProg.M
又はProg.Bに従った点弧パルス信号により制御され
る。The heating power source 2 transforms a 200 V AC power source with a transformer 32 and supplies it to the graphite tube in order to control the current flowing through the graphite tube. The energization control is performed by a triac, and the triac is a temperature program Prog.M from the power supply controller 2 of the controller 8.
Alternatively, it is controlled by an ignition pulse signal according to Prog.B.
【0015】図4に一実施例の外観の概略平面図を示
す。40は原子吸光光度計本体であり、その原子化部3
0のグラファイトチューブには試料をオートサンプラで
注入するための試料注入穴44が設けられている。原子
吸光光度計本体40の近傍には試料供給用のターンテー
ブル46が配置されており、ターンテーブル46上には
容器48が配置されており、容器48には未知試料の入
った容器、標準試料の入った容器、試薬の入った容器、
ブランク液の入った容器などが含まれている。原子吸光
光度計本体40とターンテーブル46の近傍にはさらに
ノズル洗浄容器や混合容器が配置されているが、図示は
省略している。ターンテーブル46に配置された未知試
料などの試料溶液を吸引してグラファイトチューブの試
料注入穴44へ注入したり、混合容器で試料を混合した
り、試料注入後のノズルを洗浄したりするために、ター
ンテーブル46上の試料採取位置、ノズル洗浄容器の位
置、混合容器の位置、及び試料注入穴44の位置にノズ
ルを移動させるために、先端にノズルが設けられたサン
プラアーム50が配置されている。FIG. 4 shows a schematic plan view of the appearance of one embodiment. Reference numeral 40 is the atomic absorption spectrophotometer main body, and the atomization unit 3
No. 0 graphite tube is provided with a sample injection hole 44 for injecting a sample with an autosampler. A turntable 46 for sample supply is arranged near the atomic absorption spectrophotometer main body 40, and a container 48 is arranged on the turntable 46. The container 48 contains a container containing an unknown sample and a standard sample. , A container containing reagents,
A container containing the blank solution is included. A nozzle washing container and a mixing container are further arranged near the atomic absorption photometer main body 40 and the turntable 46, but they are not shown. For sucking a sample solution such as an unknown sample placed on the turntable 46 and injecting it into the sample injection hole 44 of the graphite tube, mixing the sample in the mixing container, or cleaning the nozzle after the sample injection. In order to move the nozzle to the sample collection position on the turntable 46, the position of the nozzle cleaning container, the position of the mixing container, and the position of the sample injection hole 44, a sampler arm 50 having a nozzle at its tip is arranged. There is.
【0016】図5にターンテーブル46とノズル52を
備えた吸引・吐出機構を示す。ノズル52はサンプラア
ーム50の先端に設けられ、サンプラアーム50は回転
と上下方向の移動をする。ノズル52の流路52には容
量の小さい小シリンジ56が接続され、その流路52に
三叉ジョイントを介して接続された流路には三方バルブ
58を介して容量の大きい大シリンジ60と洗浄液(又
はブランク液)62の容器が接続されている。小シリン
ジ56はターンテーブル46に配置された未知試料その
他の試料溶液を吸引して試料注入穴44へ注入するのに
用いられ、大シリンジ60は混合容器で複数の試料溶液
を撹拌して混合したり、ノズル52や混合容器の洗浄や
ブランク液を供給したりするのに用いられる。FIG. 5 shows a suction / discharge mechanism having a turntable 46 and a nozzle 52. The nozzle 52 is provided at the tip of the sampler arm 50, and the sampler arm 50 rotates and moves in the vertical direction. A small capacity syringe 56 having a small capacity is connected to the flow path 52 of the nozzle 52, and a large capacity syringe 60 having a large capacity and a cleaning solution ( Or a blank solution) 62 is connected. The small syringe 56 is used to suck an unknown sample or other sample solution placed on the turntable 46 and inject it into the sample injection hole 44, and the large syringe 60 mixes a plurality of sample solutions with stirring in a mixing container. It is also used for cleaning the nozzle 52 and the mixing container and supplying a blank liquid.
【0017】[0017]
【発明の効果】本発明では未知試料による原子吸光の吸
光度が定量下限より小さい場合には、自動的に未知試料
を炉内で濃縮して再測定するようにしたので、再測定後
に得られる吸光度が検量線で濃度を求めるのに適した吸
光度まで大きくすることができ、測定精度が向上する。
また、このように濃縮できることにより定量できる低濃
度側の濃度範囲が広くなり、適用範囲が広がる。試料を
濃縮する作業はオートサンプラで自動的に行なうため、
人為的な誤差が生じることがなく、この点でも測定精度
が高まる。In the present invention, when the absorbance of atomic absorption by an unknown sample is smaller than the lower limit of quantification, the unknown sample is automatically concentrated in the furnace and re-measured. Can be increased to an absorbance suitable for obtaining the concentration by using a calibration curve, and the measurement accuracy is improved.
Moreover, the concentration range on the low concentration side that can be quantified is widened by such concentration, and the applicable range is widened. Since the work of concentrating the sample is automatically performed by the autosampler,
There is no human error, and the measurement accuracy is improved in this respect as well.
【図1】本発明における主として制御装置部分を示すブ
ロック図である。FIG. 1 is a block diagram mainly showing a control device portion in the present invention.
【図2】本発明の動作を示すフローチャート図である。FIG. 2 is a flowchart showing the operation of the present invention.
【図3】一実施例を示す概略構成図である。FIG. 3 is a schematic configuration diagram showing an embodiment.
【図4】一実施例の概略平面図である。FIG. 4 is a schematic plan view of one embodiment.
【図5】同実施例におけるオートサンプラの流路を示す
流路図である。FIG. 5 is a flow path diagram showing a flow path of the autosampler in the same example.
2 加熱電源 4 オートサンプラ 6 増幅装置 8 制御装置 10 注入制御部 12 電源制御部 14 検量線記憶部 16 比較部 18 濃縮制御部 20 濃度算出部 22 表示部 30 原子化部 32 光源部 34 分光器部 36 検出器 2 heating power source 4 autosampler 6 amplification device 8 control device 10 injection control unit 12 power supply control unit 14 calibration curve storage unit 16 comparison unit 18 concentration control unit 20 concentration calculation unit 22 display unit 30 atomization unit 32 light source unit 34 spectroscopic unit 36 detector
Claims (1)
及び原子化して原子蒸気を生成する電気加熱炉と、電気
加熱炉に試料を自動的に注入するオートサンプラと、電
気加熱炉中の原子蒸気に測定光を照射し、その透過光か
ら分析対象元素の吸光度を求める光学系と、試料注入及
び分析動作を制御し、得られた吸光度Aから試料の分析
対象元素の濃度Cを算出して出力する制御装置とを備え
たフレームレス方式の原子吸光分光光度計において、 前記制御装置は、オートサンプラによる所定量x又はy
の試料注入動作を制御する注入制御部と、 電気加熱炉の加熱電源を制御する加熱モードとして、分
析時の乾燥、灰化及び原子化の加熱過程をもつ分析モー
ドProg.Mの他に、乾燥のみの加熱過程又は乾燥及び灰
化のみの加熱過程をもつ濃縮モードProg.Bを有する電
源制御部と、 一定量xの標準試料の測定により得られた検量線データ
C=f(A)を記憶している検量線記憶部と、 一定量xの未知試料の測定時に前記光学系で得られた吸
光度Aを検量線が適用できる最低濃度の検量点Astdと
比較する比較部と、 比較部での比較の結果、その試料の吸光度Aが最低濃度
の検量点Astdより小さいものであったときは注入制御
部によりその試料を一定量ずつ複数回繰り返して注入さ
せるとともに、その繰返しの最後の注入を除く各注入試
料に対して電源制御部により濃縮モードProg.Bでの加
熱をさせ、その繰返しの最後の注入試料に対しては電源
制御部により分析モードProg.Mでの加熱をさせる濃縮
制御部と、 比較部での比較の結果、その試料の吸光度Aが最低濃度
の検量点Astd以上であったときはその測定吸光度Aを
用いて検量線から濃度を算出して出力し、比較部での比
較の結果、その試料の吸光度Aが最低濃度の検量点Ast
dより小さいものであったときはそのときの濃縮試料に
よる測定吸光度A'を用いて検量線から算出した濃度を
濃縮率により補正して出力する濃度算出部とを備えてい
ることを特徴とする原子吸光分光光度計。1. An electric heating furnace for generating an atomic vapor by drying, ashing, and atomizing a sample to be analyzed by heating with electric current, an autosampler for automatically injecting the sample into the electric heating furnace, and an inside of the electric heating furnace. The optical system that irradiates the atomic vapor with the measurement light, determines the absorbance of the element to be analyzed from the transmitted light, controls the sample injection and analysis operation, and calculates the concentration C of the element to be analyzed in the sample from the obtained absorbance A. In a flameless atomic absorption spectrophotometer equipped with a controller that outputs the predetermined amount x or y by an autosampler.
In addition to the analysis mode Prog.M, which has a heating process of drying, ashing and atomization during analysis, as a heating mode for controlling the sample injection operation of the Power control unit with concentration mode Prog.B having only heating process or heating process of only drying and ashing, and calibration curve data C = f (A) obtained by measuring a fixed amount x standard sample The calibration curve storage section, a comparison section for comparing the absorbance A obtained by the optical system with a calibration point Astd of the lowest concentration to which the calibration curve can be applied when measuring a fixed amount x of unknown sample, and a comparison section As a result of the comparison, when the absorbance A of the sample is smaller than the calibration point Astd of the lowest concentration, the injection control unit repeatedly injects the sample a plurality of fixed amounts, and excludes the last injection of the repetition. Power supply for each injected sample The control unit controls heating in the concentration mode Prog.B, and the final injection sample of the repetition is heated in the analysis mode Prog.M by the power supply control unit. As a result, when the absorbance A of the sample is equal to or higher than the calibration point Astd of the lowest concentration, the concentration is calculated and output from the calibration curve using the measured absorbance A, and the result of the comparison in the comparison unit is the absorbance of the sample. A is the lowest calibration point Ast
When it is smaller than d, it is provided with a concentration calculation unit that corrects the concentration calculated from the calibration curve using the measured absorbance A ′ of the concentrated sample at that time and outputs the corrected concentration. Atomic absorption spectrophotometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29388893A JP3239914B2 (en) | 1993-10-30 | 1993-10-30 | Atomic absorption spectrophotometer with sample concentration function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29388893A JP3239914B2 (en) | 1993-10-30 | 1993-10-30 | Atomic absorption spectrophotometer with sample concentration function |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH07128227A true JPH07128227A (en) | 1995-05-19 |
| JP3239914B2 JP3239914B2 (en) | 2001-12-17 |
Family
ID=17800456
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29388893A Expired - Fee Related JP3239914B2 (en) | 1993-10-30 | 1993-10-30 | Atomic absorption spectrophotometer with sample concentration function |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3239914B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010117284A (en) * | 2008-11-14 | 2010-05-27 | Hitachi High-Technologies Corp | Autosampler, atomic absorption photometer, and pretreatment method |
| JPWO2022044060A1 (en) * | 2020-08-24 | 2022-03-03 |
-
1993
- 1993-10-30 JP JP29388893A patent/JP3239914B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010117284A (en) * | 2008-11-14 | 2010-05-27 | Hitachi High-Technologies Corp | Autosampler, atomic absorption photometer, and pretreatment method |
| JPWO2022044060A1 (en) * | 2020-08-24 | 2022-03-03 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3239914B2 (en) | 2001-12-17 |
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