JPH07128291A - Inspection device of photosensitive drum - Google Patents
Inspection device of photosensitive drumInfo
- Publication number
- JPH07128291A JPH07128291A JP29761993A JP29761993A JPH07128291A JP H07128291 A JPH07128291 A JP H07128291A JP 29761993 A JP29761993 A JP 29761993A JP 29761993 A JP29761993 A JP 29761993A JP H07128291 A JPH07128291 A JP H07128291A
- Authority
- JP
- Japan
- Prior art keywords
- photosensitive drum
- inspection
- inspection device
- axial direction
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 30
- 238000005259 measurement Methods 0.000 claims description 11
- 238000009434 installation Methods 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、電子写真複写機、レー
ザープリンター等に用いられる感光体ドラムの電気特性
の検査装置に関し、特に測定時間を効果的に短縮できる
検査装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for inspecting the electrical characteristics of a photosensitive drum used in electrophotographic copying machines, laser printers and the like, and more particularly to a device for effectively reducing the measuring time.
【0002】[0002]
【従来の技術】電子写真複写機、レーザープリンター等
に使用される感光体ドラムについては、帯電特性、暗減
衰、感度、残留電位等の電気特性を測定することが要求
される。従来より、それらの電気特性を測定するには、
感光体ドラムを回転させながら帯電を行い、次いで露光
し、表面電位を測定することが行われている。図4は従
来使用されている特性測定のための検査装置の側面図で
ある。治具設置台6には帯電器2、露光器3および電位
測定装置4が回転する感光体ドラムの周囲に配置される
ように設けられており、そしてこの治具設置台6は、レ
ール8上を移動可能に設置されている。10はモーター
等の回転装置であって、両端にフランジ9を取り付けた
感光体ドラム1を回転させるためのものである。この検
査装置を用いて感光体ドラムの特性を測定する場合、両
端にフランジ9を取り付け、検査装置に装着し、感光体
を回転させて特性を測定する。2. Description of the Related Art Photoconductor drums used in electrophotographic copying machines, laser printers, etc. are required to measure electrical characteristics such as charging characteristics, dark decay, sensitivity, and residual potential. Traditionally, to measure their electrical properties,
The charging is performed while rotating the photosensitive drum, then the photosensitive drum is exposed to light and the surface potential is measured. FIG. 4 is a side view of a conventionally used inspection device for measuring characteristics. The jig installation base 6 is provided with the charger 2, the exposure device 3, and the potential measuring device 4 so as to be arranged around the rotating photosensitive drum, and the jig installation base 6 is mounted on the rail 8. Is installed so that it can be moved. Reference numeral 10 denotes a rotating device such as a motor for rotating the photosensitive drum 1 having flanges 9 attached to both ends. When the characteristics of the photoconductor drum are measured using this inspection device, the flanges 9 are attached to both ends, the flanges 9 are attached to the inspection device, and the photoconductor is rotated to measure the characteristics.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、この検
査装置により、電気特性を測定する場合、帯電電位や露
光条件等の条件が常に一定であれば効率的に測定ができ
るが、それらの条件が異なる場合には、各条件ごとに測
定する必要がある。したがって、この検査装置は、検査
作業を2度以上行わなければならないという欠点があっ
た。また、感光体ドラムを交換することが必要な場合
は、感光体ドラム面を傷付けるという危険もあった。そ
こで本発明は、条件ごとに検査作業をすることがなく、
同時に異なった条件で検査できる検査装置を提供し、測
定の効率/交換作業等の操作性を改善することを目的と
する。However, when measuring electrical characteristics with this inspection apparatus, it is possible to efficiently perform measurement if conditions such as charging potential and exposure conditions are always constant, but these conditions are different. In this case, it is necessary to measure under each condition. Therefore, this inspection device has a drawback that the inspection work must be performed twice or more. Further, when the photoconductor drum needs to be replaced, there is a risk of damaging the photoconductor drum surface. Therefore, the present invention does not perform inspection work for each condition,
At the same time, it is an object of the present invention to provide an inspection device capable of inspecting under different conditions and improve the efficiency of measurement / operability such as replacement work.
【0004】[0004]
【課題を解決するための手段】本発明は、感光体ドラム
の電気特性を検査する検査装置において、感光体ドラム
の軸方向に移動可能であり、少なくとも帯電手段、露光
手段および電位測定手段を備えた計測装置を、感光体ド
ラムの軸方向に沿って2系統以上設けたことを特徴とす
る。本発明を実施例に相当する図1によって説明する
と、少なくとも帯電器2、露光器3および電位測定装置
4を備えた計測ユニットが感光体ドラムの軸方向に移動
可能な治具設置台6に載置されており、その測定ユニッ
トが感光体ドラムの軸方向に沿って2系統以上設けられ
ている。SUMMARY OF THE INVENTION The present invention is an inspection apparatus for inspecting the electrical characteristics of a photosensitive drum, which is movable in the axial direction of the photosensitive drum and includes at least a charging means, an exposing means and a potential measuring means. It is characterized in that two or more measuring devices are provided along the axial direction of the photosensitive drum. The present invention will be described with reference to FIG. 1, which corresponds to an embodiment. A measurement unit including at least a charger 2, an exposure device 3 and a potential measuring device 4 is mounted on a jig installation table 6 which is movable in the axial direction of a photosensitive drum. The measuring units are provided in two or more systems along the axial direction of the photosensitive drum.
【0005】[0005]
【作用】本発明の感光体ドラムの検査装置においては、
2系統以上の測定ユニットを備えているので、帯電条
件、露光条件(具体的には露光波長)等の測定条件が異
なる場合でも、測定ごとの条件設定或いは変更をしなく
ても、同時に測定条件における電気特性の検査を行うこ
とができる。In the photosensitive drum inspection apparatus of the present invention,
Since it has two or more measurement units, even if the measurement conditions such as charging conditions and exposure conditions (specifically, the exposure wavelength) are different, the measurement conditions can be measured simultaneously without changing or setting the conditions for each measurement. It is possible to inspect the electrical characteristics in
【0006】[0006]
【実施例】以下に本発明の実施例を図面を参照して説明
する。図1および図2は、本発明の検査装置の概略を示
す図であって、図1は側面図、図2は要部の断面図であ
る。この検査装置は、感光体ドラム1に対して、同心円
状に配置された帯電器2、露光器3および電位測定装置
4を備えた測定ユニットが治具設置台6に載置されてい
る。治具設置台6は図示されない適当な手段によってレ
ール8上を移動できるようになっている。9は、感光体
ドラムの両端に取り付けるフランジであり、10は静置
した感光体ドラムを回転させるためのモーターである。
露光器としては、発光ダイオードのほか、ハロゲンラン
プ、レーザー光源等、如何なるものでも使用できるが、
装置が大きくなる場合には、他の場所から誘導するよう
にしてもよい。また、電位測定装置4は、帯電器2と露
光器3の間の位置に設けてもよい。また、図2に示すよ
うに、必要に応じて除電露光器11を設けてもよい。な
お、7は露光器からの光を示す。Embodiments of the present invention will be described below with reference to the drawings. 1 and 2 are diagrams showing the outline of the inspection apparatus of the present invention, FIG. 1 is a side view, and FIG. 2 is a sectional view of a main part. In this inspection device, a measurement unit including a charger 2, an exposure device 3, and a potential measuring device 4 arranged concentrically with respect to the photosensitive drum 1 is placed on a jig installation table 6. The jig installation table 6 can be moved on the rail 8 by an appropriate means (not shown). Reference numeral 9 is a flange attached to both ends of the photosensitive drum, and 10 is a motor for rotating the stationary photosensitive drum.
As the exposure device, in addition to the light emitting diode, any kind of halogen lamp, laser light source, etc. can be used,
If the device becomes large, it may be guided from another place. Further, the potential measuring device 4 may be provided at a position between the charger 2 and the exposure device 3. Further, as shown in FIG. 2, a static eliminator / exposure device 11 may be provided if necessary. In addition, 7 shows the light from an exposure device.
【0007】本発明の検査装置は、上記の測定ユニット
を2系統以上備えているので、異なる検査条件で同時に
検査できる。検査を行うには、まず感光体ドラムの直径
に合わせて、各計器を所定位置に固定し、感光体ドラム
1の両端にフランジ9を取り付け、次いで感光体ドラム
を検査装置に装着する。次に、感光体ドラムをモーター
10によって回転させて、帯電性、感度、サイクル特
性、残留電位等の電気特性を検査することができる。一
方、同一の感光体ドラムで印加電圧を異にして、帯電性
を検査する際には、2系統の帯電計器の印加電圧制御に
よって、電圧設定に対して自由自在に対応することがで
きる。印加電圧を自動的に制御できるようにしておけ
ば、検査工程を自動化する際にも、本発明は有効であ
る。すなわち、感光体ドラムを何回もセッティングした
り、測定しなくても、最初にロボットで感光体ドラムを
ハンドリングすれば、異なる印加電圧における帯電性を
同時に測定することが可能である。同様に露光も2系統
以上の測定ユニットによって行うことにより、異なる検
査条件における感度、サイクル特性、残留電位等の電気
特性を検査することができる。Since the inspection apparatus of the present invention comprises two or more systems of the above-mentioned measuring unit, it can inspect simultaneously under different inspection conditions. To perform the inspection, first, each instrument is fixed at a predetermined position in accordance with the diameter of the photosensitive drum, flanges 9 are attached to both ends of the photosensitive drum 1, and then the photosensitive drum is mounted on the inspection device. Next, the photosensitive drum can be rotated by the motor 10 to inspect the electrical characteristics such as chargeability, sensitivity, cycle characteristics, and residual potential. On the other hand, when the charging voltage is inspected by applying different voltages to the same photosensitive drum, the voltage setting can be freely handled by controlling the applied voltages of the two-system charging meter. If the applied voltage can be automatically controlled, the present invention is effective even when the inspection process is automated. That is, even if the photosensitive drum is not set or measured many times, if the robot first handles the photosensitive drum, it is possible to simultaneously measure the charging properties at different applied voltages. Similarly, by performing exposure with two or more measuring units, it is possible to inspect electrical characteristics such as sensitivity, cycle characteristics, and residual potential under different inspection conditions.
【0008】また、この場合、露光手段として、露光光
源を共用とし、分光フィルターを2系統以上備えるよう
にしてもよい。例えば、図3の概略図に示すように、光
源12からの光をフィルター14、14によって所望の
波長および強度に合わせ、ミラー15、15によって、
感光体ドラム1のドラム面上の2つの部分を照射するよ
うにする。なお、13は光源とフィルターの制御回路で
ある。In this case, the exposure light source may be shared and two or more spectral filters may be provided as the exposure means. For example, as shown in the schematic diagram of FIG. 3, the light from the light source 12 is tuned to the desired wavelength and intensity by the filters 14, 14 and by the mirrors 15, 15.
The two parts on the drum surface of the photosensitive drum 1 are irradiated. Reference numeral 13 is a light source and filter control circuit.
【0009】[0009]
【発明の効果】本発明の検査装置によれば、各感光体ド
ラムの帯電性が異なっていても容易に同時に検査を行う
ことができる。また、感光波長が異なっていても容易に
同時に検査を行うことができる。また、2系統以上の測
定ユニットを全く同じ条件にして測定をすれば、感光体
ドラムの軸方向の特性のムラを一度に検査することがで
きる。したがって、本発明の感光体ドラム検査装置によ
れば、測定時間を効果的に短縮することが可能である。According to the inspection apparatus of the present invention, it is possible to easily inspect at the same time even if the chargeability of each photosensitive drum is different. Further, even if the photosensitive wavelengths are different, the inspection can be easily performed at the same time. Further, if the measurement is performed under exactly the same conditions in two or more measuring units, it is possible to inspect the unevenness of the characteristics of the photosensitive drum in the axial direction at once. Therefore, according to the photoconductor drum inspection apparatus of the present invention, it is possible to effectively reduce the measurement time.
【図1】 本発明の検査装置の側面図である。FIG. 1 is a side view of an inspection device of the present invention.
【図2】 本発明の検査装置の要部断面図である。FIG. 2 is a sectional view of an essential part of the inspection device of the present invention.
【図3】 本発明の他の実施例の概略図である。FIG. 3 is a schematic view of another embodiment of the present invention.
【図4】 従来の検査装置の側面図である。FIG. 4 is a side view of a conventional inspection device.
1…感光体ドラム、2…帯電器、3…露光器、4…電位
測定装置、6…治具設置台、7…光、8…レール、9…
フランジ、10…モーター、11…除電露光器、12…
光源、13…制御回路、14…フィルター、15…ミラ
ー。DESCRIPTION OF SYMBOLS 1 ... Photosensitive drum, 2 ... Charging device, 3 ... Exposure device, 4 ... Potential measuring device, 6 ... Jig installation base, 7 ... Light, 8 ... Rail, 9 ...
Flange, 10 ... Motor, 11 ... Static eliminator, 12 ...
Light source, 13 ... Control circuit, 14 ... Filter, 15 ... Mirror.
Claims (1)
装置において、感光体ドラムの軸方向に移動可能であ
り、少なくとも帯電手段、露光手段および電位測定手段
を備えた計測装置を、感光体ドラムの軸方向に沿って2
系統以上設けたことを特徴とする感光体ドラムの検査装
置。1. An inspection apparatus for inspecting the electrical characteristics of a photoconductor drum, the measurement device being movable in the axial direction of the photoconductor drum and provided with at least a charging means, an exposing means and a potential measuring means. 2 along the axial direction of
An inspection device for a photoconductor drum, which is provided with at least one system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29761993A JPH07128291A (en) | 1993-11-04 | 1993-11-04 | Inspection device of photosensitive drum |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP29761993A JPH07128291A (en) | 1993-11-04 | 1993-11-04 | Inspection device of photosensitive drum |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07128291A true JPH07128291A (en) | 1995-05-19 |
Family
ID=17848907
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP29761993A Pending JPH07128291A (en) | 1993-11-04 | 1993-11-04 | Inspection device of photosensitive drum |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07128291A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008292258A (en) * | 2007-05-23 | 2008-12-04 | Ricoh Co Ltd | Device for evaluating characteristics of electrophotographic photosensitive member |
-
1993
- 1993-11-04 JP JP29761993A patent/JPH07128291A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008292258A (en) * | 2007-05-23 | 2008-12-04 | Ricoh Co Ltd | Device for evaluating characteristics of electrophotographic photosensitive member |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2006135312A (en) | Lithography apparatus and method of manufacturing device | |
| JPH0682102B2 (en) | Pattern defect inspection device and pattern defect inspection method | |
| JPS6113130A (en) | Inspector for optical fiber assembly | |
| JPH07128291A (en) | Inspection device of photosensitive drum | |
| JPH06186265A (en) | Method and apparatus for characteristic measurement of photosensitive-substance drum | |
| US5929640A (en) | Automated stationary/portable test system for photoconductive drums | |
| JP4964702B2 (en) | Device for evaluating characteristics of electrophotographic photosensitive member | |
| JP2003005389A (en) | Photoconductor characteristics evaluation apparatus and photoconductor characteristics evaluation method | |
| JP2539218B2 (en) | Inspection method for photoreceptor characteristics | |
| KR960004436B1 (en) | Apparatus for evaluating characteristics of photosensitive drum for electrophotography | |
| JP2000275872A (en) | Photoconductor characteristic evaluation device | |
| JP4739131B2 (en) | Electrophotographic photosensitive member characteristic evaluation apparatus and characteristic evaluation method using the same | |
| JP3054243B2 (en) | Surface inspection equipment | |
| KR0158401B1 (en) | Ferrite core inspector | |
| JPH06236090A (en) | Device for measuring characteristic of photo drum | |
| JPH0727482Y2 (en) | Electrostatic recording device | |
| JPH02103435A (en) | Apparatus for checking lens resolution | |
| JP2601369B2 (en) | Characteristic evaluation device for photosensitive drum for electrophotography | |
| JP2010286612A (en) | Device for evaluating characteristics of electrophotographic photosensitive member | |
| JPH0242352A (en) | Measuring method for electrostatic charging voltage of photosensitive drum | |
| JPH03149556A (en) | Method for inspecting photosensitive drum | |
| JPH03172864A (en) | Method for inspecting photosensitive drum | |
| JP2011123158A (en) | Device for evaluating characteristics of electrophotographic photoreceptor | |
| JPH03229140A (en) | Surface inspection device | |
| JPH0412363A (en) | Inspecting method for photosensitive body |