JPH0712943Y2 - Ｉｃデバイスの低温試験装置 - Google Patents

Ｉｃデバイスの低温試験装置

Info

Publication number
JPH0712943Y2
JPH0712943Y2 JP7227088U JP7227088U JPH0712943Y2 JP H0712943 Y2 JPH0712943 Y2 JP H0712943Y2 JP 7227088 U JP7227088 U JP 7227088U JP 7227088 U JP7227088 U JP 7227088U JP H0712943 Y2 JPH0712943 Y2 JP H0712943Y2
Authority
JP
Japan
Prior art keywords
test chamber
temperature
cooling
test
blow
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7227088U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01180674U (2
Inventor
収 森岡
敬三 徳重
明男 木邨
隆弘 二瓶
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP7227088U priority Critical patent/JPH0712943Y2/ja
Priority to US07/284,547 priority patent/US4918928A/en
Publication of JPH01180674U publication Critical patent/JPH01180674U/ja
Application granted granted Critical
Publication of JPH0712943Y2 publication Critical patent/JPH0712943Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP7227088U 1987-12-17 1988-05-30 Ｉｃデバイスの低温試験装置 Expired - Lifetime JPH0712943Y2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP7227088U JPH0712943Y2 (ja) 1988-05-30 1988-05-30 Ｉｃデバイスの低温試験装置
US07/284,547 US4918928A (en) 1987-12-17 1988-12-15 Apparatus for testing IC devices at low temperature and cooling bag for use in testing IC devices at low temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7227088U JPH0712943Y2 (ja) 1988-05-30 1988-05-30 Ｉｃデバイスの低温試験装置

Publications (2)

Publication Number Publication Date
JPH01180674U JPH01180674U (2) 1989-12-26
JPH0712943Y2 true JPH0712943Y2 (ja) 1995-03-29

Family

ID=31297442

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7227088U Expired - Lifetime JPH0712943Y2 (ja) 1987-12-17 1988-05-30 Ｉｃデバイスの低温試験装置

Country Status (1)

Country Link
JP (1) JPH0712943Y2 (2)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2757609B2 (ja) * 1991-07-31 1998-05-25 日立電子エンジニアリング株式会社 Ｉｃハンドラの温度制御方法

Also Published As

Publication number Publication date
JPH01180674U (2) 1989-12-26

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