JPH07134100A - Near infrared spectroscopy - Google Patents

Near infrared spectroscopy

Info

Publication number
JPH07134100A
JPH07134100A JP28286693A JP28286693A JPH07134100A JP H07134100 A JPH07134100 A JP H07134100A JP 28286693 A JP28286693 A JP 28286693A JP 28286693 A JP28286693 A JP 28286693A JP H07134100 A JPH07134100 A JP H07134100A
Authority
JP
Japan
Prior art keywords
sample
measurement
calibration curve
measurement sample
reference sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28286693A
Other languages
Japanese (ja)
Inventor
Sadakazu Fujioka
定和 藤岡
Taiichi Mori
泰一 森
Hiroshi Tsuchiya
浩史 土屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iseki and Co Ltd
Iseki Agricultural Machinery Mfg Co Ltd
Original Assignee
Iseki and Co Ltd
Iseki Agricultural Machinery Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iseki and Co Ltd, Iseki Agricultural Machinery Mfg Co Ltd filed Critical Iseki and Co Ltd
Priority to JP28286693A priority Critical patent/JPH07134100A/en
Publication of JPH07134100A publication Critical patent/JPH07134100A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】 【目的】 穀物等の成分分析において用いる検量線の適
否を迅速容易に判定使用とする。 【構成】 近赤外線等の照射によって測定サンプルの成
分等を予め設定してある検量線に基づいて分析する分析
装置であって、該測定サンプルの測定と既知の基準サン
プルとを交互的に自動測定すべく構成し、これら基準サ
ンプル及び測定サンプルの各吸光度の夫々の検量線への
あてはめを実行しつつ、基準サンプルの目標値算出結果
と上記既知データとの比較に基づいて測定サンプルの検
量線による成分算出の適否を推定する演算部を設ける。
(57) [Summary] [Purpose] To determine the suitability of the calibration curve used in the analysis of ingredients such as grains quickly and easily. [Arrangement] An analyzer for analyzing components of a measurement sample based on a preset calibration curve by irradiation with near infrared rays, etc., and automatically measuring the measurement sample and a known reference sample alternately. The calibration curve of the measurement sample based on the comparison between the target value calculation result of the reference sample and the known data while performing the fitting of each absorbance of the reference sample and the measurement sample to the respective calibration curve. An arithmetic unit for estimating the adequacy of component calculation is provided.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、近赤外分光分析装置
に関し、穀物の食味評価装置等に利用できる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a near-infrared spectroscopic analysis device, and can be used in a grain taste evaluation device and the like.

【0002】[0002]

【従来の技術及び発明が解決しようとする課題】ある成
分等の含有量等(目標値)を算出するために既知のサン
プルをもとに得た検量線は、外気温度、湿度、あるいは
光源の経時変化に影響を受け易い。このため従来は、定
期的に化学分析をしたサンプルを計測し、「ずれ」を確
認し、必要となれば検量線の修正を人為的に行なってい
た。
2. Description of the Related Art A calibration curve obtained based on a known sample for calculating the content (target value) of a certain component or the like is an external temperature, humidity, or light source It is easily affected by changes over time. For this reason, conventionally, a sample that has been subjected to a chemical analysis on a regular basis is measured, the "deviation" is confirmed, and the calibration curve is artificially corrected if necessary.

【0003】[0003]

【課題を解決するための手段】近赤外線等の照射によっ
て測定サンプルの成分等を予め設定してある検量線に基
づいて分析する分析装置であって、該測定サンプルの測
定と既知の基準サンプルとを交互的に自動測定すべく構
成し、これら基準サンプル及び測定サンプルの各吸光度
の夫々の検量線へのあてはめを実行しつつ、基準サンプ
ルの目標値算出結果と上記既知データとの比較に基づい
て測定サンプルの検量線による成分算出の適否を推定す
る演算部を設けてある近赤外分光分析装置の構成とす
る。
[Means for Solving the Problems] An analyzer for analyzing components of a measurement sample or the like based on a preset calibration curve by irradiation with near-infrared rays, the measurement of the measurement sample and a known reference sample Is configured to alternately perform automatic measurement, while performing the fitting of each absorbance of these reference sample and measurement sample to the respective calibration curve, based on the comparison of the target value calculation result of the reference sample and the above known data. The configuration of the near-infrared spectroscopic analysis apparatus is provided with an arithmetic unit that estimates the suitability of the component calculation based on the calibration curve of the measurement sample.

【0004】[0004]

【発明の作用効果】測定サンプルの測定のみならず、既
知の基準サンプルの測定とを交互的に行ない、基準サン
プルの検量線のずれを監視しながら、測定サンプルの検
量線の適否を判定するものであるから、従来のように定
期的な維持管理に比較して、農産物生産現場や青果物の
選別場などの外気温度や湿度など環境条件に変化し易い
ところでも安定した精度が確保できる。
[Advantageous effects of the invention] Not only the measurement of the measurement sample but also the measurement of the known reference sample are alternately performed, and the suitability of the calibration curve of the measurement sample is determined while monitoring the deviation of the calibration curve of the reference sample. Therefore, as compared with the conventional regular maintenance, stable accuracy can be secured even in a place where environmental conditions such as outside air temperature and humidity such as an agricultural production site and a vegetable and fruit sorting place are likely to change.

【0005】[0005]

【実施例】この発明の一実施例を図面に基づき説明す
る。図1,2において、1は穀物サンプルを照射する光
源、2は集光用のレンズ、3はスリットであり、これら
はレンズ2の光軸上にくるように配置する。4は光の通
過と遮断とを行なうためのチョッパ、5は複数のフィル
タを取り付けたフィルタ付き円盤である。6は反射ミラ
ー、7は測定する穀物サンプルをセットするサンプルセ
ットディスク、8は光を検出する光電検出器である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings. In FIGS. 1 and 2, 1 is a light source for irradiating a grain sample, 2 is a condensing lens, 3 is a slit, and these are arranged so as to be on the optical axis of the lens 2. Reference numeral 4 is a chopper for passing and blocking light, and 5 is a disk with a filter having a plurality of filters attached thereto. Reference numeral 6 is a reflection mirror, 7 is a sample set disk for setting a grain sample to be measured, and 8 is a photoelectric detector for detecting light.

【0006】上記チョッパ4は、光の通過と遮断を行な
うために光の通過部と遮断部とを交互に形成した円盤で
あり、モータ4aにより測定時に一定速度で回転するよ
うに構成される。フィルタ付き円盤5は円盤の中心から
等距離の位置に所定間隔で6個の穴をあけ、その各穴に
フィルタ5A〜5Fを取り付けたものであり、モータ5
aにより測定時に間歇回転し、その停止時にこれらフィ
ルタ5A〜5Fのいずれか一がレンズ2の光軸上にくる
ように構成する。これらフィルタ5A〜5Fは測定サン
プルにおける測定対象成分、例えば蛋白質の吸収に特徴
を有する所定波長(因みに蛋白質の場合には、2150n
m,2170nm,2190nm等)の近赤外線を透過させるも
のに設定される。
The chopper 4 is a disk in which light passing portions and light blocking portions are alternately formed for passing and blocking light, and is configured to rotate at a constant speed by the motor 4a during measurement. The filter-equipped disc 5 has six holes at equal distances from the center of the disc at predetermined intervals, and filters 5A to 5F are attached to the respective holes.
It is configured such that it rotates intermittently during measurement by a, and any one of these filters 5A to 5F comes on the optical axis of the lens 2 when it stops. These filters 5A to 5F are designed to absorb a component to be measured in a measurement sample, for example, a predetermined wavelength (for a protein, 2150 n
m, 2170 nm, 2190 nm, etc.) is set so that it transmits near infrared rays.

【0007】サンプルセットディスク7は、円盤の中心
から所定距離離れた円周上の所定位置に、セラミックか
らなる参照用反射板9、穀物粒子の大きさを非常に小さ
く粉砕した測定サンプルを充填した透明容器(セル)1
0、及び既知の成分を含有する基準サンプルを充填した
透明容器11,12を配設している。この基準サンプル
は例えば成分測定すべき検量線の適応レンジの最大と最
小とに設定する。即ち、玄米の蛋白含量を測定する場合
であれば、玄米の蛋白含量が最小域(例えば8%)にあ
る玄米サンプル、及び逆にこれが最大域(例えば10
%)にある玄米サンプルに設定する如きである。サンプ
ルセットディスク7はモータ7aにより測定時に回転す
るとともに、その停止時には反射ミラー6からの反射光
上にこれらサンプルが位置するように構成している。な
お、サンプルは参照用反射板9,低レンジ基準サンプ
ル,測定サンプル,高レンジ基準サンプルの順に繰返し
測定できる構成としている。
The sample set disk 7 was filled with a reference reflection plate 9 made of ceramic and a measurement sample crushed to a very small size at a predetermined position on the circumference at a predetermined distance from the center of the disk. Transparent container (cell) 1
0 and transparent containers 11 and 12 filled with reference samples containing known components are provided. This reference sample is set, for example, at the maximum and minimum of the adaptive range of the calibration curve for component measurement. That is, when measuring the protein content of brown rice, the brown rice sample in which the protein content of brown rice is in the minimum range (for example, 8%), and conversely, this is the maximum range (for example, 10%).
%) In the brown rice sample. The sample set disk 7 is rotated by a motor 7a at the time of measurement, and when stopped, these samples are positioned on the reflected light from the reflection mirror 6. The sample is configured so that the reference reflection plate 9, the low range reference sample, the measurement sample, and the high range reference sample can be repeatedly measured in this order.

【0008】光検出器8の後段には、信号の増幅を行な
う増幅器13、A/D変換を行なうA/D変換器14、
及びマイクロコンピュータ等で構成される演算器15を
接続する。この演算器15は光電検出器8の検出値に基
づき、予め記憶された検量線に基づき蛋白含量を求める
等の各種処理を行なう。演算器15で求められた穀物サ
ンプルの蛋白含量等は液晶表示器などで構成する表示器
16に表示される。
An amplifier 13 for amplifying a signal, an A / D converter 14 for A / D conversion, and
And a calculator 15 including a microcomputer or the like. The calculator 15 performs various processes such as obtaining the protein content based on the detection value of the photoelectric detector 8 based on a calibration curve stored in advance. The protein content and the like of the grain sample obtained by the computing unit 15 is displayed on the display unit 16 composed of a liquid crystal display unit or the like.

【0009】尚、17,18は反射光を検出器8に導く
ための光学系である。上例の作用について説明する。フ
ィルタ付き円盤5が図に示す位置にあり、チョッパ4が
所定速度で回転しているものとする。このときには光源
1から発射された光はレンズ2、スリット3を経由して
チョッパ4で通過と遮断を繰返し、通過した光はフィル
タ5Aにて設定された波長の近赤外線のみが透過する。
この透過光は反射ミラー6で反射されたのち、下方で待
機するサンプルセットディスク7の参照用反射板9に向
けて投光照射される。
Numerals 17 and 18 are optical systems for guiding the reflected light to the detector 8. The operation of the above example will be described. It is assumed that the disk with filter 5 is at the position shown in the figure and the chopper 4 is rotating at a predetermined speed. At this time, the light emitted from the light source 1 passes through the lens 2 and the slit 3 and is repeatedly blocked and blocked by the chopper 4, and only the near-infrared light having the wavelength set by the filter 5A is transmitted as the transmitted light.
This transmitted light is reflected by the reflection mirror 6 and then projected and emitted toward the reference reflection plate 9 of the sample set disk 7 standing by below.

【0010】上記参照用反射板9で反射した反射光は、
光電検出器8で受光されて光電変換される。光電変換さ
れた電気信号は、増幅器13でA/D変換されて演算器
15に入力される。このような参照用反射板9からの反
射光はチョッパ4を光が通過するたびに間歇的に得られ
る。そこで、演算器15は、光電検出器8から出力され
る複数の電気信号に基づきその平均値R0i(iはフィル
タを示す)を算出する。
The reflected light reflected by the reference reflection plate 9 is
The light is received by the photoelectric detector 8 and photoelectrically converted. The photoelectrically converted electric signal is A / D converted by the amplifier 13 and input to the calculator 15. The reflected light from the reference reflection plate 9 is intermittently obtained every time the light passes through the chopper 4. Therefore, the calculator 15 calculates the average value R 0i (i represents a filter) of the plurality of electric signals output from the photoelectric detector 8.

【0011】次にサンプルセットディスク7を回転し、
低レベル基準サンプルを投光部に移動させる。同様に反
射光から得られる電気信号を測定して平均値RLiを求め
る。更に、測定サンプル、及び高レベル基準サンプルの
夫々測定平均値RXi,RHiを求めて記憶する。次いで各
測定値から吸光度を求める。即ち、吸光度ODji=lo
gR0i/Rji(j=0,L,H)によって算出する。
Next, the sample set disk 7 is rotated,
Move the low level reference sample to the emitter. Similarly, an electric signal obtained from the reflected light is measured to obtain an average value R Li . Further, the measured average values R Xi and R Hi of the measurement sample and the high-level reference sample are obtained and stored. Then, the absorbance is determined from each measured value. That is, the absorbance OD ji = lo
It is calculated by gR 0i / R ji (j = 0, L, H).

【0012】上記吸光度を算出すると、予め設定してい
た検量線に基づいて目標値yjを求める。ここでyj=k
0+Σ(kj・ODji)の算出式及びその定数k0,kj
を、求めようとする成分毎に各設定している。こうして
得た基準サンプルの目標値yL,yHについて、化学分析
等によって予め知っており記憶装置に適宜記憶させた値
と比較し、それらとのずれの有無を比較処理する。「ず
れ」がないと判断されると、測定サンプルに関する検量
線についてもずれがなく又は極めて小さいものと推定
し、算出された目標値yXを表示すべくなし、上記「ず
れ」があるときはその「ずれ」量によって目標値yX
修正し、この修正値y’Xを表示する。
When the absorbance is calculated, the target value y j is obtained based on the calibration curve that has been set in advance. Where y j = k
The calculation formula of 0 + Σ (k j · OD ji ) and its constants k 0 , k j, etc. are set for each component to be obtained. The target values y L and y H of the reference sample thus obtained are compared with the values which are known in advance by chemical analysis or the like and are appropriately stored in the storage device, and the presence or absence of deviation from them is compared. If it is determined that there is no "deviation", the measurement sample is also assumed deviation without or extremely small for the calibration curve for, without in order to display the calculated target value y X, when there is the "deviation" is The target value y X is corrected by the “deviation” amount, and the corrected value y ′ X is displayed.

【図面の簡単な説明】[Brief description of drawings]

【図1】装置概要図である。FIG. 1 is a schematic diagram of an apparatus.

【図2】その斜視図である。FIG. 2 is a perspective view thereof.

【図3】ブロック図である。FIG. 3 is a block diagram.

【図4】フロー図である。FIG. 4 is a flowchart.

【符号の説明】[Explanation of symbols]

1 光源 2 集光用レンズ 3 スリット 4 チョッパ 5 フィルタ付き円盤 6 反射ミラー 7 サンプルセットディスク 8 光電検出器 9 参照用反射板 10,11,12 透明容器(セル) 13 増幅器 14 A/D変換器 15 演算器 16 表示器 1 Light Source 2 Condensing Lens 3 Slit 4 Chopper 5 Disk with Filter 6 Reflecting Mirror 7 Sample Set Disk 8 Photoelectric Detector 9 Reference Reflecting Plate 10, 11, 12 Transparent Container (Cell) 13 Amplifier 14 A / D Converter 15 Computing unit 16 Display

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 近赤外線等の照射によって測定サンプル
の成分等を予め設定してある検量線に基づいて分析する
分析装置であって、該測定サンプルの測定と既知の基準
サンプルとを交互的に自動測定すべく構成し、これら基
準サンプル及び測定サンプルの各吸光度の夫々の検量線
へのあてはめを実行しつつ、基準サンプルの目標値算出
結果と上記既知データとの比較に基づいて測定サンプル
の検量線による成分算出の適否を推定する演算部を設け
てある近赤外分光分析装置。
1. An analyzer for analyzing components and the like of a measurement sample based on a preset calibration curve by irradiation of near infrared rays, wherein the measurement of the measurement sample and a known reference sample are alternately performed. The calibration of the measurement sample based on the comparison between the target sample calculation result of the reference sample and the known data while performing the automatic measurement and fitting the respective absorbances of the reference sample and the measurement sample to the respective calibration curves. A near-infrared spectroscopic analysis device provided with a calculation unit for estimating the suitability of component calculation using a line.
JP28286693A 1993-11-12 1993-11-12 Near infrared spectroscopy Pending JPH07134100A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28286693A JPH07134100A (en) 1993-11-12 1993-11-12 Near infrared spectroscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28286693A JPH07134100A (en) 1993-11-12 1993-11-12 Near infrared spectroscopy

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2002293173A Division JP2003161697A (en) 2002-10-07 2002-10-07 Agricultural product spectrometer

Publications (1)

Publication Number Publication Date
JPH07134100A true JPH07134100A (en) 1995-05-23

Family

ID=17658104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28286693A Pending JPH07134100A (en) 1993-11-12 1993-11-12 Near infrared spectroscopy

Country Status (1)

Country Link
JP (1) JPH07134100A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114184605A (en) * 2022-02-16 2022-03-15 宁波海壹生物科技有限公司 Measuring system and method of chemiluminescence immunoassay analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114184605A (en) * 2022-02-16 2022-03-15 宁波海壹生物科技有限公司 Measuring system and method of chemiluminescence immunoassay analyzer

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