JPH07146251A - Deficiency detector for sealed part - Google Patents
Deficiency detector for sealed partInfo
- Publication number
- JPH07146251A JPH07146251A JP5144308A JP14430893A JPH07146251A JP H07146251 A JPH07146251 A JP H07146251A JP 5144308 A JP5144308 A JP 5144308A JP 14430893 A JP14430893 A JP 14430893A JP H07146251 A JPH07146251 A JP H07146251A
- Authority
- JP
- Japan
- Prior art keywords
- light intensity
- difference
- light
- reference value
- detecting means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007812 deficiency Effects 0.000 title abstract 3
- 230000007547 defect Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 abstract description 17
- 238000012856 packing Methods 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 17
- 238000010586 diagram Methods 0.000 description 12
- 238000006073 displacement reaction Methods 0.000 description 10
- 230000037303 wrinkles Effects 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000007619 statistical method Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/82—Testing the joint
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C65/00—Joining or sealing of preformed parts, e.g. welding of plastics materials; Apparatus therefor
- B29C65/82—Testing the joint
- B29C65/8269—Testing the joint by the use of electric or magnetic means
- B29C65/8276—Testing the joint by the use of electric or magnetic means by the use of electric means
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】Detailed Description of the Invention
【０００１】[0001]
【産業上の利用分野】この発明は包装装置における透明
な包装物のシール部に発生するしわや、被包装物の噛み
込み等の不良を検出するシール部不良検出装置に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a seal portion defect detection device for detecting defects such as wrinkles occurring in a seal portion of a transparent package in a packaging device and biting of an object to be packaged.
【０００２】[0002]
【従来の技術】袋状の包装物に被包装物を収容する際、
包装物のシール部に被包装物やそのくず等が噛み込まれ
たり、包装物のしわが、発生することが多い。これら
は、確実に検出され、最終的に不良品として排出される
べきものであるが、従来、このようなシール部の不良検
出するものとしては、 機械的なリミットスイッチ等や光学的な変位センサ等
を用いてシーラーの変位を直接あるいは拡大して変位量
を検出するもの、 シーラー機構部の動力伝達系の負荷状況を監視し、そ
の負荷が所定値以上に増加した場合にシール不良と判定
するもの、 等の装置がある。2. Description of the Related Art When accommodating an object to be packaged in a bag-shaped package,
In many cases, the object to be packaged, scraps thereof, etc. are caught in the seal portion of the package, and wrinkles are generated in the package. These should be reliably detected and finally discharged as defective products.In the past, mechanical limit switches, optical displacement sensors, etc. have been used to detect defective seals. Etc. to detect the amount of displacement by directly or magnifying the displacement of the sealer, monitor the load condition of the power transmission system of the sealer mechanism, and judge that the seal is defective when the load increases above a specified value There are devices such as things.
【０００３】上記のの装置としては、実開平５−６１
２号公報にその構成が開示されている。この構成におい
ては、流入側コンベアと流出側コンベアとの間に設けら
れているヒートシール機構にこのヒートシール機構と一
体に変位する押動部材を取り付け、この押動部材が接触
して押動変位させることにより変位量を検出する接触式
変位センサを配設してある。これは、押動部材により接
触式変位センサの接触部が押動され、それを変位量とし
て筒状包装紙の熱溶着時の厚さ寸法を検出する。これに
より、熱溶着部に噛み込みのあるか否かを検知する。As the above-mentioned device, there is an actual flat type 5-61.
The structure is disclosed in Japanese Patent Publication No. In this structure, the heat-sealing mechanism provided between the inflow side conveyor and the outflow side conveyor is provided with a pushing member that is displaced integrally with the heat-sealing mechanism, and the pushing member comes into contact with the pushing-displacement member. A contact-type displacement sensor that detects the amount of displacement is provided. In this, the contact portion of the contact displacement sensor is pushed by the pushing member, and the thickness of the tubular wrapping paper at the time of heat welding is detected by using the contact portion as a displacement amount. As a result, it is detected whether or not the heat-welded portion is caught.
【０００４】この他、特開平４−２６７７２０号には光
学的な変位センサ（ギャップセンサ）によるシール厚み
の検出を行う装置が開示されている。In addition to this, Japanese Patent Laid-Open No. 4-267720 discloses an apparatus for detecting the seal thickness by an optical displacement sensor (gap sensor).
【０００５】上記の装置としては、特開平３−６９４
２８号に開示されている。これは、シーラの駆動系の指
令信号とエンコーダから得た検出信号とを比較してシー
ラの位置偏差を求め、予め定められた設定値との対比に
よって被包装物の噛み込みを検出するものである。The above-mentioned device is disclosed in Japanese Patent Laid-Open No. 3-694.
No. 28. This compares the command signal of the drive system of the sealer with the detection signal obtained from the encoder to obtain the position deviation of the sealer, and detects the bite of the packaged object by comparing it with a preset value. is there.
【０００６】[0006]
【発明が解決しようとする課題】しかしながら、これら
の機械的な機構のシール部不良検出装置では、包装物が
軟体物であったり、薄物であったりすると、シール部の
厚みを正確に測定できず、被包装物の噛み込みや包装物
のしわが検出できない。また、微細なものの噛み込みも
同様に正確な厚みの測定ができず、さらに包装材の性状
変化（厚み変動等）によっても的確に噛み込みが検出で
きない場合が多かった。光学的な変位センサの場合も、
外乱の影響で正確な厚みの測定ができず、また、投光手
段、受光手段の汚れによっても光量が低下し、出力のレ
ベルが小さくなり、正確な厚みの測定が行えなかった。However, in the seal portion defect detection device having these mechanical mechanisms, if the package is a soft body or a thin one, the thickness of the seal portion cannot be accurately measured. , Bites of the packaged item and wrinkles of the package cannot be detected. In addition, even in the case of biting of a fine object, the thickness cannot be accurately measured in the same manner, and the biting cannot be accurately detected in many cases due to changes in the properties of the packaging material (thickness variation, etc.). In the case of an optical displacement sensor,
Accurate thickness measurement could not be performed due to the influence of disturbance, and the amount of light was reduced due to contamination of the light projecting means and the light receiving means, and the output level was reduced, making it impossible to perform accurate thickness measurement.
【０００７】[0007]
【課題を解決するための手段】このため本発明は、包装
物のシール部に光を投射する投光手段を設け、前記シー
ル部に投射されて透過あるいは反射した光を受け、この
光を光電変換し、電気信号を出力する複数の光強度検出
手段を配設し、この複数の光強度検出手段のうちの２個
から出力される電気信号の差を検出する少なくとも１個
以上の差検出手段を設けており、さらに正常なシール部
における基準値を発生する少なくとも１個以上の基準値
設定手段と、この基準値設定手段からの基準値と前記差
検出手段からの出力を受けて比較し、前記シール部の不
良の有無を判定するための比較判定手段とを備えたもの
で、高精度の被包装物の噛み込みを検出し、包装物のし
わ等をも検出する。For this reason, the present invention provides a light projecting means for projecting light on the seal portion of a package, receives the light projected or transmitted or reflected by the seal portion, and photoelectrically converts this light. A plurality of light intensity detecting means for converting and outputting an electric signal are provided, and at least one difference detecting means for detecting a difference between electric signals output from two of the plurality of light intensity detecting means. Is provided, and further, at least one reference value setting means for generating a reference value in the normal seal portion is compared with the reference value from the reference value setting means and the output from the difference detection means, It is provided with a comparison / determination unit for determining the presence / absence of a defect in the seal portion, and detects biting of a packaged object with high accuracy and also detects wrinkles and the like of the package.
【０００８】[0008]
【作用】本発明のシール部不良検出装置によると、複数
の光強度検出手段を設け、そのうちの２個の光強度検出
手段から出力された信号を演算して差をとり、基準値設
定手段から出力された基準値との比較をすることによっ
て、外部の影響を受けずにシール部の不良を高精度に検
出できる。According to the seal defect detecting device of the present invention, a plurality of light intensity detecting means are provided, and the signals output from two of the light intensity detecting means are calculated to obtain the difference, and the reference value setting means is used. By comparing with the output reference value, it is possible to detect the defect of the seal portion with high accuracy without being affected by the outside.
【０００９】[0009]
【実施例】以下、本発明について図面の実施例を基に説
明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the embodiments of the drawings.
【００１０】図１は本発明の一実施例を示す構成図で、
図２はこの実施例における出力信号を示した図である。
図１において、包装機（図示せず）により、被包装物を
内包した透明な包装物１はその両端をシーラー（図示せ
ず）によってシールカットされ、シール部２を形成す
る。このシール作業の際、シール部２に被包装物を噛み
込み（噛み込み物３）、あるいは、しわを作ることがあ
る。これらの不良を検出するため、シール部２に光を投
射する投光手段５を設け、シール部３を間にして投光手
段５と対向した位置に、この投射された透過光を受ける
ための光強度検出手段６を設け、包装物１の移動方向
（矢印Ａ）に沿って２個（６ａ、６ｂ）配設している。FIG. 1 is a block diagram showing an embodiment of the present invention.
FIG. 2 is a diagram showing an output signal in this embodiment.
In FIG. 1, a transparent packaging 1 containing a packaged object is seal-cut at both ends by a sealer (not shown) by a packaging machine (not shown) to form a seal portion 2. At the time of this sealing work, an object to be packaged may be bitten into the seal portion 2 (bite 3) or wrinkles may be formed. In order to detect these defects, a light projecting means 5 for projecting light to the seal portion 2 is provided, and the projected transmitted light is received at a position facing the light projecting means 5 with the seal portion 3 in between. The light intensity detecting means 6 is provided, and two pieces (6a, 6b) are arranged along the moving direction (arrow A) of the package 1.
【００１１】包装物１が矢印Ａ方向に移動することによ
って（投光手段５および光強度検出手段６が移動しても
良い）、光強度検出手段（６ａ、６ｂ）によって受光さ
れた光信号はそれぞれ光電変換され、電気信号として差
検出手段７へ出力される。電気信号は差検出手段７にお
いて差を求められ、比較判定手段９に出力され、積分回
路１０で積分される。さらに基準値設定手段８により予
め設定された基準値に基づいた基準電圧Ｅ0は比較判定
手段９に出力され、コンパレータ１１で前述した積分出
力と比較される。この積分出力が基準電圧Ｅ0 よりも大
きいときは噛み込み物３が存在するものとして不良とさ
れ、不良検出信号として図示しない選別機や表示器及び
警報器等に出力される。When the package 1 moves in the direction of arrow A (the light projecting means 5 and the light intensity detecting means 6 may move), the optical signal received by the light intensity detecting means (6a, 6b) is Each is photoelectrically converted and output as an electric signal to the difference detecting means 7. The difference between the electric signals is obtained by the difference detecting means 7, the difference is outputted to the comparing and judging means 9, and the electric signal is integrated by the integrating circuit 10. Further, the reference voltage E 0 based on the reference value preset by the reference value setting means 8 is output to the comparison / determination means 9, and is compared with the above-described integrated output by the comparator 11. When the integrated output is larger than the reference voltage E 0 , it is determined that the bite object 3 is present and is defective, and is output as a defect detection signal to a not-shown sorter, display device, alarm device, or the like.
【００１２】図２（Ａ）は、光強度検出手段６ｂの出力
信号のレベルを時間的な変化で示したもので、レベルの
低下した部分が噛み込み物３の存在を示している。図２
（Ｂ）は、光強度検出手段６ａの出力信号のレベルを示
したもので、レベルの低下した部分が図２（Ａ）と比較
して包装物１の移動速度による時間の遅れの分だけズレ
がある。図２（Ｃ）は、光強度検出手段６ａと光強度検
出手段６ｂのレベル差を示したものであり、基本的には
零クロス信号となる。図２（Ｄ）は、レベル差信号を積
分した積分出力を示したもので、基準電圧を併記してあ
る。図２（Ｅ）は、積分出力と基準電圧とを比較したも
ので、積分出力が基準電圧よりも大きい場合、つまり噛
み込み物３が存在する場合のコンパレータ出力を示して
いる。FIG. 2 (A) shows the level of the output signal of the light intensity detecting means 6b as a function of time, and the lowered level shows the presence of the bite object 3. Figure 2
FIG. 2B shows the level of the output signal of the light intensity detecting means 6a, and the lowered portion is shifted by the time delay due to the moving speed of the package 1 as compared with FIG. 2A. There is. FIG. 2C shows the level difference between the light intensity detecting means 6a and the light intensity detecting means 6b, which is basically a zero cross signal. FIG. 2D shows an integrated output obtained by integrating the level difference signal, and the reference voltage is also shown. FIG. 2E is a comparison between the integrated output and the reference voltage, and shows the comparator output when the integrated output is larger than the reference voltage, that is, when the trapped object 3 is present.
【００１３】図３には、第二の実施例の構成を示してあ
る。本実施例は、単純に良品の時系列パターンと不良品
の時系列パターンとの差分から不良を検出した例であ
る。図中の番号で１〜７は図１と同じ名称であり、図１
の構成とは比較判定手段９の詳細と、ロータリーエンコ
ーダ１２が異なる。シール部２に印刷があるような場
合、図１のような構成では噛み込み物３との区別が困難
である。したがって、本実施例の場合は、いったん良品
サンプルの波形をサンプリングする。差検出手段７から
出力された信号はＡ／Ｄ変換され、良品波形サンプルメ
モリ１５側へ切り換えられているマルチプレクサ１４を
通って、良品波形サンプルメモリ１５へ出力され、その
波形パターンが記憶される。FIG. 3 shows the configuration of the second embodiment. This embodiment is an example in which a defect is simply detected from the difference between a time-series pattern of a good product and a time-series pattern of a defective product. The numbers 1 to 7 in the figure have the same names as those in FIG.
The details of the comparison / determination unit 9 and the rotary encoder 12 are different from those in FIG. When the seal portion 2 is printed, it is difficult to distinguish it from the bite object 3 with the configuration shown in FIG. Therefore, in the case of this embodiment, the waveform of a non-defective sample is once sampled. The signal output from the difference detecting means 7 is A / D converted, output to the non-defective waveform sample memory 15 through the multiplexer 14 switched to the non-defective waveform sample memory 15, and the waveform pattern thereof is stored.
【００１４】実際の検査時には、差検出手段７から出力
された信号はＡ／Ｄ変換され、波形演算処理部１６側へ
切り換えられたマルチプレクサ１４を通って、波形演算
処理部１６へ出力される。このとき、ロータリーエンコ
ーダ１２からはシール部２の基準位置の検出値や包装物
１の移動スピードの設定値が良品波形サンプルメモリ１
５及び波形演算処理部１６に出力され、この波形演算処
理部１６において被検査物の波形パターンと、前に良品
波形サンプルメモリ１５に記憶されていた良品サンプル
の波形パターンとが同期をとって比較される。この場
合、良品と不良品のパターンの比較をするため、外乱の
影響、すなわち包装物の経時変化、光量の変化、投受光
面の汚れ等の影響をを受けずに確実に不良品の検出が行
える。At the time of actual inspection, the signal output from the difference detecting means 7 is A / D converted and output to the waveform calculation processing section 16 through the multiplexer 14 switched to the waveform calculation processing section 16 side. At this time, the detected value of the reference position of the seal portion 2 and the set value of the moving speed of the package 1 are displayed from the rotary encoder 12 as the non-defective waveform sample memory 1.
5 and the waveform calculation processing unit 16, and the waveform calculation processing unit 16 compares the waveform pattern of the object to be inspected with the waveform pattern of the good product sample previously stored in the good product waveform sample memory 15 in synchronization. To be done. In this case, since the patterns of non-defective products and defective products are compared, defective products can be reliably detected without being affected by disturbance, that is, changes over time of the package, changes in light intensity, dirt on the light emitting / receiving surface, etc. You can do it.
【００１５】図４は第二の実施例の構成による波形パタ
ーンの比較を示した図である。図４（Ａ）は良品サンプ
ルの時系列パターンを示した図である。印刷個所の部分
だけが図２（Ｃ）と同様に光強度検出手段６ａ、６ｂの
差分として現れている。図４（Ｂ）は印刷個所以外に噛
み込み物３の部分が存在する不良品の時系列パターンを
示している。図４（Ｃ）は波形演算処理部１６において
良品サンプルの時系列パターンと不良品の時系列パター
ンとを比較し、差をとったパターンの例である。当然、
噛み込みが発生した場合、良品の時系列パターンと相違
が発生する。したがって、この差分パターンを評価する
ことによって噛み込みの存在を検出することが可能とな
る。パターン評価の方法は、ピークの数やピーク間の時
間の評価あるいは統計的な手法によっても可能である
が、いずれにしても時系列パターンのパターンマッチン
グに関することであり、ここでの記述は省略する。FIG. 4 is a diagram showing a comparison of waveform patterns according to the configuration of the second embodiment. FIG. 4A is a diagram showing a time series pattern of non-defective samples. Only the printed portion appears as a difference between the light intensity detecting means 6a and 6b as in FIG. 2C. FIG. 4B shows a time-series pattern of defective products in which the portion of the bite object 3 is present in addition to the printing portion. FIG. 4C is an example of a pattern obtained by comparing the time-series pattern of the non-defective product and the time-series pattern of the defective product in the waveform calculation processing section 16 and taking the difference. Of course,
When biting occurs, a difference occurs from the time-series pattern of a good product. Therefore, it is possible to detect the presence of the bite by evaluating the difference pattern. The pattern evaluation method can be performed by evaluating the number of peaks or the time between peaks, or by a statistical method, but in any case, it is related to pattern matching of time-series patterns, and description thereof is omitted here. .
【００１６】シール部２の基準位置の検出や移動スピー
ドの設定等は、例えばロータリーエンコーダ１２を用い
れば時系列パターンの時間軸方向の正規化が容易に行え
る。移動スピードや基準位置が一定であればこの処置は
不要である。The detection of the reference position of the seal portion 2 and the setting of the moving speed can be easily performed by normalizing the time series pattern in the time axis direction by using the rotary encoder 12, for example. If the moving speed and the reference position are constant, this measure is unnecessary.
【００１７】図５は第三の実施例の構成を示す図であ
る。本実施例では、光強度検出手段６をマトリックス状
に配列（６ａ〜６ｄ）し、任意の２個を第一、第二の実
施例と同様に処理することにより、空間的（２次元的）
に検出エリアを広げるとともに、上下方向、斜め方向に
対しても検出感度を持たせることが可能である。勿論、
光強度検出手段６の個数は被測定部分の大きさによって
任意に変えることが可能である。FIG. 5 is a diagram showing the configuration of the third embodiment. In the present embodiment, the light intensity detecting means 6 are arranged in a matrix (6a to 6d), and any two of them are processed in the same manner as in the first and second embodiments to spatially (two-dimensionally).
It is possible to widen the detection area and to have detection sensitivity in the vertical and diagonal directions. Of course,
The number of light intensity detecting means 6 can be arbitrarily changed depending on the size of the portion to be measured.
【００１８】図６は第四の実施例の構成を示す図であ
る。本実施例では、第一から第三までの実施例のような
透過光を利用したシール部不良検出装置ではなく、反射
光を利用したシール部不良検出装置である。図中の番号
は図１と同じであるが、光強度検出手段（６ａ、６ｂ）
の配設位置が第一から第三までの実施例と異なり、投光
手段５が配設されたと同じ側の位置にある。反射光を利
用するのは、特に透明の包装物１の中の反射物からなる
噛み込み物３を検出する場合に有効である。FIG. 6 is a diagram showing the configuration of the fourth embodiment. The present embodiment is not a seal defect detecting device that uses transmitted light as in the first to third embodiments, but a seal defect detecting device that uses reflected light. The numbers in the figure are the same as those in FIG. 1, but the light intensity detecting means (6a, 6b)
Unlike the first to third embodiments, the arrangement position of is located on the same side where the light projecting means 5 is arranged. The use of reflected light is particularly effective when detecting the bite object 3 made of a reflective object in the transparent package 1.
【００１９】[0019]
【発明の効果】この発明によれば次のような効果が得ら
れる。 １．包装物が軟体物であったり、薄物である場合、光の
強度を検出することによって非接触式に測定するため、
シール部の不良、すなわち噛み込み物やしわを高精度に
検出できる。また、微細なものの噛み込みも同様に高精
度に検出できる。 ２．複数の光強度検出手段を設け、そのうちの２個の光
強度検出手段から出力された信号を演算して差をとり、
基準値設定手段から出力された基準値との比較をするこ
とによって、外部の影響、すなわち包装物の経時変化、
光量の変化、投受光面の汚れ等の影響を受けずにシール
部の不良を高精度に検出できる。According to the present invention, the following effects can be obtained. 1. If the package is soft or thin, it measures non-contact by detecting the intensity of light,
It is possible to detect a defective seal portion, that is, a bite or a wrinkle with high accuracy. In addition, biting of a fine object can be detected with high accuracy as well. 2. A plurality of light intensity detecting means are provided, and the signals output from two of the light intensity detecting means are calculated to obtain the difference,
By comparing with the reference value output from the reference value setting means, external influence, that is, the change with time of the package,
It is possible to detect a defect in the seal portion with high accuracy without being affected by a change in light amount, dirt on the light emitting / receiving surface, and the like.
【図１】本発明の一実施例の構成を示すブロック図であ
る。FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.
【図２】図１に示す実施例の各部の検出信号を示す信号
波形図である。FIG. 2 is a signal waveform diagram showing a detection signal of each part of the embodiment shown in FIG.
【図３】本発明の第二の実施例の構成を示すブロック図
である。FIG. 3 is a block diagram showing a configuration of a second exemplary embodiment of the present invention.
【図４】図３に示す実施例の時系列パターンを示す信号
波形図である。4 is a signal waveform diagram showing a time series pattern of the embodiment shown in FIG.
【図５】本発明の第三の実施例の構成を示すブロック図
である。FIG. 5 is a block diagram showing a configuration of a third exemplary embodiment of the present invention.
【図６】本発明の第四の実施例の構成を示すブロック図
である。FIG. 6 is a block diagram showing a configuration of a fourth exemplary embodiment of the present invention.
１ 包装物。 ２ シール部。 ３ 噛み込み物。 ４ しわ。 ５ 投光手段。 ６ 光強度検出手段。 ７ 差検出手段。 ８ 基準値設定手段。 ９ 比較判定手段。 １０ 積分回路。 １１ コンパレータ。 １２ ロータリーエンコーダ。 １３ Ａ／Ｄ変換器。 １４ マルチプレクサ。 １５ 良品波形サンプリングメモリ。 １６ 波形演算処理部。 Ｅ0 基準電圧。1 Package. 2 Seal part. 3 Bite. 4 wrinkles. 5 Projection means. 6 Light intensity detection means. 7 Difference detection means. 8 Reference value setting means. 9 Comparison determination means. 10 Integrator circuit. 11 Comparator. 12 Rotary encoder. 13 A / D converter. 14 Multiplexer. 15 Good waveform sampling memory. 16 Waveform calculation processing unit. E 0 Reference voltage.
Claims (1)
を投射する投光手段（５）と、 該シール部（２）に投射されて透過あるいは反射した光
を受け、この光を光電変換し、電気信号を出力する複数
の光強度検出手段（６）と、 該複数の光強度検出手段（６）のうちの２個から出力さ
れる電気信号の差を検出する少なくとも１個の差検出手
段（７）と、 正常なシール部における基準値を発生する少なくとも１
個の基準値設定手段（８）と、 該基準値設定手段（８）からの基準値と前記差検出手段
（７）からの出力を受けて比較し、前記シール部（２）
の不良の有無を判定するための比較判定手段（９）とを
備えたシール部不良検出装置。1. A light projecting means (5) for projecting light onto a seal part (2) of a transparent package (1), and a light which is transmitted to or reflected by the seal part (2). A plurality of light intensity detecting means (6) for photoelectrically converting light and outputting an electric signal, and at least one for detecting a difference between electric signals output from two of the plurality of light intensity detecting means (6). A plurality of difference detecting means (7) and at least 1 for generating a reference value in a normal seal portion
Individual reference value setting means (8), the reference value from the reference value setting means (8) and the output from the difference detecting means (7) are received and compared, and the seal portion (2)
And a defect determination device (9) for determining the presence / absence of a defect in the seal portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5144308A JPH07146251A (en) | 1993-05-24 | 1993-05-24 | Deficiency detector for sealed part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5144308A JPH07146251A (en) | 1993-05-24 | 1993-05-24 | Deficiency detector for sealed part |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07146251A true JPH07146251A (en) | 1995-06-06 |
Family
ID=15359067
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5144308A Pending JPH07146251A (en) | 1993-05-24 | 1993-05-24 | Deficiency detector for sealed part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07146251A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004036200A1 (en) * | 2002-10-15 | 2004-04-29 | Tetra Laval Holdings & Finance S.A. | Method and apparatus for quality inspection |
| WO2004038393A1 (en) * | 2002-10-22 | 2004-05-06 | Tetra Laval Holdings & Finance S.A. | Vessel inspection method and vessel inspection device |
| WO2018012282A1 (en) * | 2016-07-13 | 2018-01-18 | 株式会社システムスクエア | Inspection device |
-
1993
- 1993-05-24 JP JP5144308A patent/JPH07146251A/en active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004036200A1 (en) * | 2002-10-15 | 2004-04-29 | Tetra Laval Holdings & Finance S.A. | Method and apparatus for quality inspection |
| US7399983B2 (en) | 2002-10-15 | 2008-07-15 | Tetra Laval Holdings & Finance S.A. | Quality inspection method and quality inspection device |
| AU2003271120B2 (en) * | 2002-10-15 | 2008-09-11 | Tetra Laval Holdings & Finance S.A. | Method and apparatus for quality inspection |
| WO2004038393A1 (en) * | 2002-10-22 | 2004-05-06 | Tetra Laval Holdings & Finance S.A. | Vessel inspection method and vessel inspection device |
| US7167803B2 (en) | 2002-10-22 | 2007-01-23 | Tetra Labal Holdings & Finance S.A. | Vessel inspection method and vessel inspection device |
| AU2003301571B2 (en) * | 2002-10-22 | 2008-05-08 | Tetra Laval Holdings & Finance S.A. | Vessel inspection method and vessel inspection device |
| CN100445733C (en) * | 2002-10-22 | 2008-12-24 | 利乐拉瓦尔集团及财务有限公司 | Container inspection method and container inspection device |
| KR101013241B1 (en) * | 2002-10-22 | 2011-02-08 | 테트라 라발 홀딩스 앤드 피낭스 소시에떼아노님 | Container inspection method and container inspection device |
| WO2018012282A1 (en) * | 2016-07-13 | 2018-01-18 | 株式会社システムスクエア | Inspection device |
| JPWO2018012282A1 (en) * | 2016-07-13 | 2019-05-09 | 株式会社 システムスクエア | Inspection device |
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