JPH07146279A - Release detection method and ultrasonic microscope applying the method - Google Patents
Release detection method and ultrasonic microscope applying the methodInfo
- Publication number
- JPH07146279A JPH07146279A JP5293245A JP29324593A JPH07146279A JP H07146279 A JPH07146279 A JP H07146279A JP 5293245 A JP5293245 A JP 5293245A JP 29324593 A JP29324593 A JP 29324593A JP H07146279 A JPH07146279 A JP H07146279A
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- Prior art keywords
- sample
- signal
- acoustic lens
- reflected
- reflection
- Prior art date
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Links
- 238000001514 detection method Methods 0.000 title claims description 13
- 238000000034 method Methods 0.000 title description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- 230000005540 biological transmission Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、反射型の超音波顕微鏡
を使って試料内の剥離を検出する剥離検出方法及びその
方法を適用した超音波顕微鏡に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a peeling detection method for detecting peeling in a sample by using a reflection type ultrasonic microscope, and an ultrasonic microscope to which the method is applied.
【0002】[0002]
【従来の技術】従来、反射型の超音波顕微鏡がシリコン
ウエハ,モールドIC等の試料の内部に発生している剥
離を検出するの使用できることが知られている。反射型
の超音波顕微鏡の構成例を図5に示す。2. Description of the Related Art Conventionally, it is known that a reflection type ultrasonic microscope can be used to detect peeling occurring inside a sample such as a silicon wafer or a mold IC. FIG. 5 shows an example of the structure of a reflection type ultrasonic microscope.
【0003】この超音波顕微鏡は、高周波発振器1で発
生した高周波信号をサーキュレータ2を介してトランス
デューサ3に印加し超音波に変換する。この超音波を音
響レンズ4で収束し、その収束点には試料5を配置す
る。試料5はサンプルホルダー6により保持され、試料
5と音響レンズ4のレンズ面との間には水等のカプラ7
が充填される。試料5からの反射波は音響レンズ4で受
波されトランスデューサ3で電気的な反射信号に変換さ
れた後、サーキュレータ2を介して表示装置8へ入力す
る。サンプルホルダー6は走査回路9により制御される
走査装置10により水平面内をXY駆動される。This ultrasonic microscope applies a high frequency signal generated by a high frequency oscillator 1 to a transducer 3 via a circulator 2 to convert it into an ultrasonic wave. This ultrasonic wave is converged by the acoustic lens 4, and the sample 5 is placed at the convergence point. The sample 5 is held by a sample holder 6, and a coupler 7 such as water is provided between the sample 5 and the lens surface of the acoustic lens 4.
Is filled. The reflected wave from the sample 5 is received by the acoustic lens 4, converted into an electric reflected signal by the transducer 3, and then input to the display device 8 via the circulator 2. The sample holder 6 is driven XY in a horizontal plane by a scanning device 10 controlled by a scanning circuit 9.
【0004】以上のような超音波顕微鏡において、音響
レンズ4から試料5に入射した収束超音波は、試料表面
とカプラとの境界のような音響的性質の異なる界面にお
いて反射する。図6に示す試料の貼り合せ面を収束超音
波で走査すれば、剥離部は超音波をほぼ100%反射
し、その他の密着部は100%よりも十分に低い反射率
で反射する。このような反射波を電気的な反射信号に変
換し、その反射信号の信号強度を輝度値に変換して表示
装置8に表示すれば、表示された画像の明暗で信号強度
の大小を比較することができ剥離部を判断できる。In the ultrasonic microscope as described above, the converged ultrasonic waves incident on the sample 5 from the acoustic lens 4 are reflected at the interface having different acoustic properties such as the boundary between the sample surface and the coupler. When the bonded surface of the sample shown in FIG. 6 is scanned with convergent ultrasonic waves, the peeling portion reflects the ultrasonic waves by almost 100%, and the other contact portions reflect by a reflectance sufficiently lower than 100%. If such a reflected wave is converted into an electric reflected signal, and the signal intensity of the reflected signal is converted into a luminance value and displayed on the display device 8, the magnitude of the signal intensity is compared with the brightness of the displayed image. Therefore, the peeled portion can be determined.
【0005】ところが、試料の貼り合せ面の全面が剥離
している場合、その界面を走査したときに得られる反射
信号は一様な信号強度値となり、信号強度の大小を比較
することによる剥離部の判断はできなくなる。反射型の
超音波顕微鏡の場合、全く剥離のない貼り合せ面を走査
した場合にも一様な信号強度の反射信号が得られるから
である。However, when the entire bonding surface of the sample is peeled off, the reflected signal obtained when the interface is scanned has a uniform signal strength value, and the peeled portion is obtained by comparing the magnitude of the signal strength. Can no longer be judged. This is because, in the case of a reflection type ultrasonic microscope, a reflection signal having a uniform signal intensity can be obtained even when scanning a bonding surface that does not peel at all.
【0006】一方、試料の剥離検出は、図7に示す透過
型の超音波顕微鏡を用いても行うことができる。透過型
の超音波顕微鏡は、2つの音響レンズ11,12を共焦
点となるように対向配置し、レンズ間にカプラ13を充
填し、サンプルホルダー14で固定した保持膜15に試
料Sを載置して共焦点位置に配置している。On the other hand, the peeling detection of the sample can also be carried out by using the transmission type ultrasonic microscope shown in FIG. In the transmission type ultrasonic microscope, two acoustic lenses 11 and 12 are arranged so as to be confocal to each other, a coupler 13 is filled between the lenses, and a sample S is placed on a holding film 15 fixed by a sample holder 14. And is placed at the confocal position.
【0007】この超音波顕微鏡では、高周波発振器1か
らトランスデューサ3aに高周波信号を印加し、音響レ
ンズ11で収束超音波を試料Sに入射する。そして試料
Sで音響的性質に応じて吸収等の作用を受けた超音波が
対向配置されている音響レンズ12で受波されトランス
デューサ3bで電気的な反射信号に変換され表示装置8
へ出力される。In this ultrasonic microscope, a high frequency signal is applied from the high frequency oscillator 1 to the transducer 3a, and the focused ultrasonic wave is incident on the sample S by the acoustic lens 11. Then, the ultrasonic wave that has been subjected to the action of absorption or the like in the sample S is received by the acoustic lens 12 arranged oppositely, is converted into an electric reflection signal by the transducer 3b, and is displayed by the display device 8
Is output to.
【0008】このような透過型の超音波顕微鏡によれ
ば、剥離部に入射した超音波はほぼ100%反射するた
め、反射信号の信号強度はほぼ0となる。一方、密着部
分を通過する超音波を吸収等の影響を受けるが僅かに減
衰するだけである。従って、試料の貼り合せ面が全面剥
離している場合は、反射信号はほぼ0となり全面剥離で
あると判断することができる。反射信号が一様であって
も所定の信号強度があれば剥離がない状態と判断でき
る。According to such a transmission type ultrasonic microscope, since the ultrasonic wave incident on the peeling portion is reflected by almost 100%, the signal intensity of the reflected signal becomes almost zero. On the other hand, ultrasonic waves passing through the close contact portion are affected by absorption and the like, but are only slightly attenuated. Therefore, when the bonded surface of the sample is completely peeled off, the reflected signal becomes almost 0, and it can be judged that the whole surface is peeled off. Even if the reflected signal is uniform, if there is a predetermined signal intensity, it can be determined that there is no peeling.
【0009】[0009]
【発明が解決しようとする課題】しかしながら、透過型
の超音波顕微鏡は、2つの音響レンズ11,12を共焦
点の状態に配置しなければならず位置合せ調整が煩雑で
あること、反射型の超音波顕微鏡に比べて構造が複雑で
あり部品点数も増えること等から、特定の分野を除き反
射型の超音波顕微鏡が主流となっている。従って、試料
の剥離検出においても反射型の超音波顕微鏡を用いた検
出が強く望まれている。However, in the transmission type ultrasonic microscope, the two acoustic lenses 11 and 12 must be arranged in a confocal state, and the alignment adjustment is complicated, and the reflection type Since the structure is more complicated than the ultrasonic microscope and the number of parts is increased, the reflection type ultrasonic microscope is predominant except in a specific field. Therefore, it is strongly desired to detect the peeling of the sample by using the reflection type ultrasonic microscope.
【0010】本発明は、以上のような実情に鑑みてなさ
れたもので、反射型の超音波顕微鏡を用いて全面剥離を
含め的確に剥離観察をすることができる剥離検出方法お
よびその方法を適用した超音波顕微鏡を提供することを
目的とする。The present invention has been made in view of the above circumstances, and a peeling detection method and a peeling detection method capable of accurately performing peeling observation including entire surface peeling by using a reflection type ultrasonic microscope are applied. The purpose of the present invention is to provide an ultrasonic microscope.
【0011】[0011]
【課題を解決するための手段】本発明は、上記目的を達
成するために、次のような手段を講じた。請求項1に対
応する剥離検出方法は、試料の内部にある剥離を超音波
を使って検出する剥離検出方法において、試料台に載置
した試料の底面を空気層に接触せしめ、音響レンズで収
束させた超音波を前記試料の上面から入射すると共に当
該試料からの反射波を前記音響レンズで受波し、前記音
響レンズで受波した反射波を電気的な反射信号に変換
し、前記反射信号に対して前記試料の底面に相当する時
間位置にゲートを掛けて信号成分を抽出し、前記試料と
前記音響レンズとを水平面内において相対的に走査する
ことにより得られる複数の前記信号成分から試料底面の
反射像を描画するようにした。In order to achieve the above object, the present invention has taken the following means. The peeling detection method according to claim 1 is a peeling detection method in which peeling inside a sample is detected using ultrasonic waves, and the bottom surface of the sample placed on the sample base is brought into contact with an air layer and converged by an acoustic lens. The reflected ultrasonic wave from the sample is received by the acoustic lens, the reflected ultrasonic wave received by the acoustic lens is converted into an electric reflected signal, and the reflected signal is received. A signal component is extracted by applying a gate to a time position corresponding to the bottom surface of the sample, and the sample is obtained from a plurality of the signal components obtained by relatively scanning the sample and the acoustic lens in a horizontal plane. The reflection image of the bottom was drawn.
【0012】請求項2に対応する超音波顕微鏡は、高周
波信号を発生する高周波発生手段と、前記高周波発生手
段で発生した高周波信号を超音波に変換するトランスデ
ューサと、前記トランスデューサで発生させた超音波を
所定位置に収束させる音響レンズと、前記音響レンズか
ら送信される収束超音波が入射される試料の底面を空気
層に接触させた状態でその試料を保持する試料台と、前
記試料から反射し前記音響レンズで受波された反射波を
前記トランスデューサで変換した電気的な反射信号が入
力し該反射信号から前記試料の底面に相当する信号成分
を抽出する受信手段と、前記試料と前記音響レンズとを
水平面内において相対的に移動する走査手段と、前記受
信手段から出力される信号成分から試料底面の反射像を
形成する画像形成手段とを具備する構成とした。An ultrasonic microscope according to a second aspect of the present invention is a high frequency generating means for generating a high frequency signal, a transducer for converting a high frequency signal generated by the high frequency generating means into an ultrasonic wave, and an ultrasonic wave generated by the transducer. To a predetermined position, a sample table that holds the sample in a state where the bottom surface of the sample on which the focused ultrasonic wave transmitted from the acoustic lens is incident is in contact with the air layer, and a sample table that reflects from the sample. Receiving means for inputting an electrical reflection signal obtained by converting the reflection wave received by the acoustic lens by the transducer and extracting a signal component corresponding to the bottom surface of the sample from the reflection signal, the sample and the acoustic lens And an image forming unit for forming a reflection image of the sample bottom surface from the signal component output from the receiving unit. It was configured to and a stage.
【0013】[0013]
【作用】請求項1に対応する剥離検出方法によれば、試
料底面に空気層が形成された試料の底面に相当する反射
波の信号成分を抽出して反射像が形成される。試料の途
中に剥離がなければ、試料底面と空気層との界面で超音
波がほぼ100%反射し、信号強度の大きい反射信号が
得られる。一方、試料の途中に剥離が存在していれば、
その剥離部分の超音波は剥離部でほぼ100%反射され
るため底面には至らず底面からは反射波が全く帰ってこ
ない。従って、反射波が全くない部分を剥離部と判断す
ることができ、所定の界面の全面が剥離している場合に
は底面からの反射波は全くないため全面剥離であると判
断することができる。According to the peeling detection method according to the first aspect, the reflected image is formed by extracting the signal component of the reflected wave corresponding to the bottom surface of the sample having the air layer formed on the bottom surface of the sample. If there is no peeling in the middle of the sample, almost 100% of the ultrasonic waves are reflected at the interface between the bottom surface of the sample and the air layer, and a reflected signal with a high signal intensity is obtained. On the other hand, if there is peeling in the middle of the sample,
Since almost 100% of the ultrasonic waves at the peeled portion are reflected by the peeled portion, the ultrasonic wave does not reach the bottom surface and no reflected wave returns from the bottom surface. Therefore, it is possible to determine that the portion where there is no reflected wave is the peeling portion, and when the entire surface of the predetermined interface is peeled, there is no reflected wave from the bottom surface, and therefore it can be determined that the entire surface is peeled. .
【0014】請求項2に対応する超音波顕微鏡では、高
周波発生手段で発生した高周波信号がトランスデューサ
に印加されると、トランスデューサが発生させた超音波
が音響レンズで収束されながら試料に入射する。試料に
入射した超音波は剥離部分があればその部分でほぼ全反
射し、剥離部がなれば空気層に接触している底面でほぼ
全反射する。試料の底面または剥離部で反射した各反射
超音波は音響レンズで受波されトランスデューサで反射
信号に変換された後に受信手段に入力する。受信手段で
は反射信号から試料の底面に相当する位置からの反射波
の信号成分が抽出される。1回の動作では試料底面の1
点の画像情報が得られる。走査手段により試料と音響レ
ンズとを水平面内において相対的に移動し、試料底面の
複数点の画像情報を得て試料底面の反射像を画像形成手
段で形成する。In the ultrasonic microscope according to the second aspect, when the high frequency signal generated by the high frequency generating means is applied to the transducer, the ultrasonic wave generated by the transducer is incident on the sample while being converged by the acoustic lens. If there is a peeled portion, the ultrasonic wave incident on the sample is almost totally reflected at that portion, and if there is a peeled portion, it is almost totally reflected at the bottom surface in contact with the air layer. Each reflected ultrasonic wave reflected on the bottom surface or the peeling portion of the sample is received by the acoustic lens, converted into a reflected signal by the transducer, and then input to the receiving means. The receiving means extracts the signal component of the reflected wave from the position corresponding to the bottom surface of the sample from the reflected signal. One operation at the bottom of the sample
Image information of points is obtained. The sample and the acoustic lens are relatively moved in the horizontal plane by the scanning means, image information of a plurality of points on the bottom surface of the sample is obtained, and a reflection image of the bottom surface of the sample is formed by the image forming means.
【0015】[0015]
【実施例】以下、本発明の実施例について説明する。図
1は、本発明の一実施例に係る反射型超音波顕微鏡の全
体的な構成を示している。本実施例の反射型超音波顕微
鏡は、試料Sの底面を空気層に接触させた状態でその試
料Sを保持する試料台を備えている。水20が入れられ
た水槽21の底から中空ホース22の先端部を水槽内に
気密に挿入し、その中空ホース22の挿入端に接続筒2
3の下端を圧入している。この中空ホース22の他端は
不図示の吸引ポンプに接続されている。接続筒23の上
端部は下端部に比べ大きな内径となっおり、上端開口部
に試料台24が固定されている。試料台24は、その中
心部に試料Sの平面積よりも僅かに狭い開口部を有して
おり、その開口中心と接続筒23の中心軸とを一致さ
せ、かつ水平を保った状態で、接続筒23の上端部に固
定されている。また、試料台24上面の開口部周辺には
所定の弾性を有しかつ一定高さの凸状部25が閉じた枠
の如く形成されている。試料Sを試料台24の開口部を
覆うようにして凸状部25上に載置することにより、試
料Sの底面と、凸状部25,試料台24の開口部,接続
筒23等とで、試料Sの底面に接する空気層26を形成
する。EXAMPLES Examples of the present invention will be described below. FIG. 1 shows the overall structure of a reflection acoustic microscope according to an embodiment of the present invention. The reflection type ultrasonic microscope of the present embodiment includes a sample table that holds the sample S in a state where the bottom surface of the sample S is in contact with the air layer. The end of the hollow hose 22 is airtightly inserted into the water tank from the bottom of the water tank 21 containing the water 20, and the connecting tube 2 is inserted into the insertion end of the hollow hose 22.
The lower end of 3 is press-fitted. The other end of the hollow hose 22 is connected to a suction pump (not shown). The upper end of the connecting tube 23 has a larger inner diameter than the lower end, and the sample table 24 is fixed to the upper end opening. The sample table 24 has an opening in the center thereof that is slightly narrower than the plane area of the sample S, and with the center of the opening and the central axis of the connecting cylinder 23 aligned and kept horizontal, It is fixed to the upper end of the connecting tube 23. Around the opening on the upper surface of the sample table 24, a convex portion 25 having a predetermined elasticity and having a constant height is formed like a closed frame. By mounting the sample S on the convex portion 25 so as to cover the opening of the sample table 24, the bottom surface of the sample S, the convex portion 25, the opening of the sample table 24, the connecting tube 23, and the like are separated. , The air layer 26 in contact with the bottom surface of the sample S is formed.
【0016】この反射型超音波顕微鏡の動作を制御回路
30が管理する。制御回路30から送信トリガ信号を受
けることにより高周波信号を発生する送信機31の出力
端がサーキュレータ32を介してトランスデューサ33
に接続されている。このトランスデューサ33は音響レ
ンズ34の一端面に設けられ電気/音響変換素子として
機能する。音響レンズ34は他端面にレンズ面を有して
おり、トランスデューサ33から入射される超音波を所
定位置に収束させる。また音響レンズ34はレンズ面で
受波する反射超音波をトランスデューサ33側の一端面
へ伝播させる。またトランスデューサ33はサーキュレ
ータ32の他の端子を介して受信機35に接続されてい
る。試料Sから反射して音響レンズ34のレンズ面で受
波された反射超音波をトランスデューサ33で電気信号
(反射信号)に変換した後、サーキュレータを通って受
信機35に入力する。The control circuit 30 manages the operation of the reflection type ultrasonic microscope. An output end of a transmitter 31 that generates a high frequency signal by receiving a transmission trigger signal from the control circuit 30 has a transducer 33 through a circulator 32.
It is connected to the. The transducer 33 is provided on one end surface of the acoustic lens 34 and functions as an electric / acoustic conversion element. The acoustic lens 34 has a lens surface on the other end surface, and converges the ultrasonic wave incident from the transducer 33 to a predetermined position. Further, the acoustic lens 34 propagates the reflected ultrasonic wave received by the lens surface to the one end surface on the transducer 33 side. The transducer 33 is also connected to the receiver 35 via the other terminal of the circulator 32. The reflected ultrasonic wave reflected from the sample S and received by the lens surface of the acoustic lens 34 is converted into an electric signal (reflected signal) by the transducer 33, and then input to the receiver 35 through the circulator.
【0017】受信機35は、制御回路30から入力する
制御信号に基づいて、反射信号の任意位置の信号成分を
切出す機能を有する。本実施例では試料Sの底面に相当
する位置の信号成分が抽出されるように切出しタイミン
グを設定する。また、受信機35は反射信号から切出し
た信号成分のピーク値を一定期間ホールドして画像メモ
リ36へ入力する。The receiver 35 has a function of cutting out a signal component at an arbitrary position of the reflected signal based on the control signal input from the control circuit 30. In this embodiment, the cutout timing is set so that the signal component at the position corresponding to the bottom surface of the sample S is extracted. Further, the receiver 35 holds the peak value of the signal component cut out from the reflected signal for a certain period and inputs it to the image memory 36.
【0018】また、音響レンズ34を水平面内における
X方向へ駆動するX移動装置37と、水槽21が載置さ
れているステージ39を水平面内におけるY方向へ駆動
するY移動装置38とを備えている。X移動装置37と
Y移動装置38のそれぞれ移動タイミング,移動方向及
び移動量は制御回路30から指示される。Further, an X moving device 37 for driving the acoustic lens 34 in the X direction in the horizontal plane and a Y moving device 38 for driving the stage 39 on which the water tank 21 is placed in the Y direction in the horizontal plane are provided. There is. The control circuit 30 gives instructions regarding the movement timing, the movement direction, and the movement amount of the X movement device 37 and the Y movement device 38, respectively.
【0019】そして試料底面の収束超音波での走査が終
了したところで画像メモリ36に記憶された画像データ
をモニタ40へ表示する。次に、以上のように構成され
た本実施例において、図2に示すように貼り合せ面の一
部に剥離部41が存在する試料Sの剥離観察を行う場合
の動作について説明する。The image data stored in the image memory 36 is displayed on the monitor 40 when the scanning of the bottom surface of the sample with the focused ultrasonic waves is completed. Next, in the present embodiment configured as described above, an operation in the case of performing peeling observation of the sample S in which the peeling portion 41 exists on a part of the bonding surface as shown in FIG. 2 will be described.
【0020】先ず、試料台24の凸状部25に試料Sを
載せ、中空ホース22に接続されている吸引ポンプを駆
動する。これにより空気層26が負圧化され試料Sが負
圧吸引されて下方に押し付けられ試料Sと凸状部25と
が気密に接触することにより空気層26内に水が侵入で
きないようになる。First, the sample S is placed on the convex portion 25 of the sample table 24, and the suction pump connected to the hollow hose 22 is driven. As a result, the air layer 26 is made to have a negative pressure, the sample S is sucked at a negative pressure and pressed downward, and the sample S and the convex portion 25 are in airtight contact with each other, so that water cannot enter the air layer 26.
【0021】次に、水槽21内に水を入れ試料Sの上面
よりも高い水位を保ち、かつ試料Sに対向配置された音
響レンズ34のレンズ面が図1に示すように水中に没す
るようにする。Next, water is put in the water tank 21 to keep the water level higher than the upper surface of the sample S, and the lens surface of the acoustic lens 34 arranged to face the sample S is submerged in water as shown in FIG. To
【0022】音響レンズ34と試料Sとの相対位置を初
期設定したならば、制御回路30から送信機31へ送信
トリガ信号を与える。送信機31は送信トリガ信号を受
信すると高周波信号を発生する。この高周波信号はトラ
ンスデューサ33で超音波に変換され音響レンズ34内
を伝播した後、レンズ面で屈折して収束超音波となって
試料Sに入射する。When the relative position between the acoustic lens 34 and the sample S is initialized, a transmission trigger signal is given from the control circuit 30 to the transmitter 31. Upon receiving the transmission trigger signal, the transmitter 31 generates a high frequency signal. This high-frequency signal is converted into ultrasonic waves by the transducer 33, propagates through the acoustic lens 34, and then is refracted by the lens surface to be converged ultrasonic waves and incident on the sample S.
【0023】例えば、試料SのA点に入射した超音波は
界面42でほとんど反射することなくそのままを通過
し、試料底面と空気層26との界面で反射する。また、
試料SのB点に入射した超音波は界面42に形成されて
いる剥離部41でほとんど反射する。このような試料S
からの反射超音波はレンズ面で受波され、トランスデュ
ーサ33で電気的な反射信号に変換され、受信機35に
入力する。For example, the ultrasonic wave incident on the point A of the sample S passes through the interface 42 as it is with almost no reflection, and is reflected at the interface between the sample bottom surface and the air layer 26. Also,
The ultrasonic wave incident on the point B of the sample S is almost reflected by the peeling portion 41 formed on the interface 42. Such a sample S
The reflected ultrasonic wave from is received by the lens surface, converted into an electric reflected signal by the transducer 33, and input to the receiver 35.
【0024】図3は試料SのA点及びB点からの反射超
音波を音響/電気変換した各反射信号と、反射信号から
試料底面に相当する信号成分を切出すためのゲート信号
とを示している。A点,B点の各反射信号ともに同一時
刻t1で表面反射波が受信される。剥離のないA点から
の反射信号は時刻t3で、試料底面と空気層26との界
面での反射波成分が受信される。一方、途中に剥離部4
1があるB点からの反射信号は、試料底面よりも手前で
反射するため、時刻t1と時刻t3との間の時刻t2で
反射成分が現れ、試料底面に相当する時刻t3では反射
成分は現れない。FIG. 3 shows respective reflected signals obtained by acoustically / electrically converting the reflected ultrasonic waves from the points A and B of the sample S, and a gate signal for cutting out a signal component corresponding to the sample bottom surface from the reflected signals. ing. Surface reflection waves are received at the same time t1 for each of the reflection signals at points A and B. The reflected signal from the point A without peeling is received at time t3, and the reflected wave component at the interface between the sample bottom surface and the air layer 26 is received. On the other hand, the peeling part 4
Since the reflection signal from point B where 1 is present is reflected before the bottom surface of the sample, the reflection component appears at time t2 between time t1 and time t3, and the reflection component appears at time t3 corresponding to the bottom surface of the sample. Absent.
【0025】従って、本実施例のように試料底面反射波
に切出しタイミングを合わせたゲート信号で反射信号か
ら信号成分を抽出すると、剥離の無い部分に入射した超
音波の反射信号からは信号強度の大きい試料底面からの
反射波成分がピーク検波されて画像メモリ36に記憶さ
れる。また剥離部41に入射した超音波の反射信号から
は信号強度が0の画像データが画像メモリ36に記憶さ
れる。Therefore, when the signal component is extracted from the reflected signal by the gate signal whose cut-out timing is adjusted to the reflected wave on the bottom surface of the sample as in the present embodiment, the signal intensity of the reflected signal of the ultrasonic wave incident on the portion where there is no separation is shown. The reflected wave component from the large sample bottom surface is peak-detected and stored in the image memory 36. In addition, image data having a signal intensity of 0 is stored in the image memory 36 from the reflected signal of the ultrasonic wave that has entered the peeling unit 41.
【0026】この様の動作を繰り返して試料Sの底面全
体を収束超音波で走査し、上述した試料底面の反射波強
度からなる画像データを画像メモリ36に記憶する。こ
の画像メモリ36に記憶した画像データを、信号強度を
輝度値に変換してモニタ40へ表示することにより試料
Sの底面の反射像が表示される。モニタ40に表示され
た画像のうち輝度値が0の部分が剥離部分となる。By repeating the above operation, the entire bottom surface of the sample S is scanned with a focused ultrasonic wave, and the image data composed of the intensity of the reflected wave on the bottom surface of the sample is stored in the image memory 36. The reflected image of the bottom surface of the sample S is displayed by converting the signal intensity of the image data stored in the image memory 36 into a luminance value and displaying the luminance value on the monitor 40. A portion having a luminance value of 0 in the image displayed on the monitor 40 is a peeled portion.
【0027】このように本実施例によれば、試料Sの底
面を空気層に接触させた状態で、その試料Sの底面の超
音波反射像を形成するようにしたので、試料Sの界面全
面が剥離している場合であってもその剥離を検出するこ
とができ、反射型の超音波顕微鏡で透過型の反射顕微鏡
と同等の剥離検出能力を実現できる。As described above, according to the present embodiment, the ultrasonic reflection image of the bottom surface of the sample S is formed in a state where the bottom surface of the sample S is in contact with the air layer, so that the entire interface of the sample S is The peeling can be detected even when the peeling has occurred, and the peeling detection capability equivalent to that of the transmission type reflection microscope can be realized by the reflection type ultrasonic microscope.
【0028】なお、試料Sの底面を空気層に接触させる
構造は前述した実施例のものに限定されるものではな
く、例えば図4に示す吸盤構造のものであっても良い。
水槽の中に吸着凹面を上に向けた吸盤43を固定し、そ
の吸盤43の吸着凹面で試料Sの底面を吸着固定する。
本発明は上記実施例に限定されるものではなく、本発明
の要旨を逸脱しない範囲内で種々変形実施可能である。The structure for bringing the bottom surface of the sample S into contact with the air layer is not limited to that of the above-described embodiment, and may be, for example, the suction cup structure shown in FIG.
The suction cup 43 with the suction concave surface facing upward is fixed in the water tank, and the bottom surface of the sample S is suction fixed by the suction concave surface of the suction disk 43.
The present invention is not limited to the above embodiments, and various modifications can be made without departing from the gist of the present invention.
【0029】[0029]
【発明の効果】以上詳記したように本発明によれば、反
射型の超音波顕微鏡を用いて全面剥離を含め的確に試料
の剥離観察をすることができる剥離検出方法およびその
方法を適用した超音波顕微鏡を提供できる。As described above in detail, according to the present invention, the peeling detection method and the peeling detection method capable of accurately observing the peeling of the sample including the entire surface peeling by using the reflection type ultrasonic microscope are applied. An ultrasonic microscope can be provided.
【図1】本発明の一実施例に係る反射型の超音波顕微鏡
の構成図である。FIG. 1 is a configuration diagram of a reflective ultrasonic microscope according to an embodiment of the present invention.
【図2】図1に示す反射型超音波顕微鏡における試料載
置状態を示す図である。FIG. 2 is a diagram showing a sample mounting state in the reflection ultrasonic microscope shown in FIG.
【図3】図2に示す各点からの反射信号の波形図を示す
図である。FIG. 3 is a diagram showing a waveform diagram of a reflected signal from each point shown in FIG.
【図4】試料載置台の変形例を示す図である。FIG. 4 is a view showing a modified example of the sample mounting table.
【図5】従来の反射型の超音波顕微鏡の構成図である。FIG. 5 is a configuration diagram of a conventional reflection-type ultrasonic microscope.
【図6】貼り合せ面に剥離部が形成された試料の一部断
面図である。FIG. 6 is a partial cross-sectional view of a sample in which a peeling portion is formed on a bonding surface.
【図7】従来の透過型の超音波顕微鏡の構成図である。FIG. 7 is a block diagram of a conventional transmission type ultrasonic microscope.
21…水槽、22…中空ホース、23…接続筒、24…
試料台、25…凸状部、30…制御回路、31…送信
機、32…サーキュレータ、33…トランスデューサ、
34…音響レンズ、35…送信機、36…画像メモリ、
37…X移動装置、38…Y移動装置、39…ステー
ジ、40…モニタ。21 ... Water tank, 22 ... Hollow hose, 23 ... Connection tube, 24 ...
Sample stage, 25 ... convex portion, 30 ... control circuit, 31 ... transmitter, 32 ... circulator, 33 ... transducer,
34 ... Acoustic lens, 35 ... Transmitter, 36 ... Image memory,
37 ... X moving device, 38 ... Y moving device, 39 ... Stage, 40 ... Monitor.
Claims (2)
検出する剥離検出方法において、試料台に載置した試料
の底面を空気層に接触せしめ、音響レンズで収束させた
超音波を前記試料の上面から入射すると共に当該試料か
らの反射波を前記音響レンズで受波し、前記音響レンズ
で受波した反射波を電気的な反射信号に変換し、前記反
射信号から前記試料の底面に相当する信号成分を抽出
し、前記試料と前記音響レンズとを水平面内において相
対的に走査することにより得られる複数の前記信号成分
から試料底面の反射像を描画することを特徴とする剥離
検出方法。1. A peeling detection method for detecting peeling inside a sample using ultrasonic waves, wherein the bottom surface of the sample placed on a sample stage is brought into contact with an air layer, and the ultrasonic wave focused by an acoustic lens is used. The reflected wave from the sample incident from the top surface of the sample is received by the acoustic lens, the reflected wave received by the acoustic lens is converted into an electrical reflected signal, and from the reflected signal to the bottom surface of the sample. A peeling detection method characterized by extracting a corresponding signal component and drawing a reflection image of the bottom surface of the sample from a plurality of the signal components obtained by relatively scanning the sample and the acoustic lens in a horizontal plane. .
と、前記高周波発生手段で発生した高周波信号を超音波
に変換するトランスデューサと、前記トランスデューサ
で発生させた超音波を所定位置に収束させる音響レンズ
と、前記音響レンズから送信される収束超音波が入射さ
れる試料の底面を空気層に接触させた状態でその試料を
保持する試料台と、前記試料から反射し前記音響レンズ
で受波された反射波が前記トランスデューサで変換され
ることにより得られる電気的な反射信号が入力し該反射
信号から前記試料の底面に相当する信号成分を抽出する
受信手段と、前記試料と前記音響レンズとを水平面内に
おいて相対的に走査する走査手段と、前記受信手段から
出力される信号成分から試料底面の反射像を形成する画
像形成手段とを具備したことを特徴とする超音波顕微
鏡。2. A high-frequency generator for generating a high-frequency signal, a transducer for converting the high-frequency signal generated by the high-frequency generator into ultrasonic waves, and an acoustic lens for converging the ultrasonic waves generated by the transducer to a predetermined position. A sample stage that holds the sample in a state where the bottom surface of the sample on which the converged ultrasonic wave transmitted from the acoustic lens is incident is in contact with an air layer, and a reflection reflected from the sample and received by the acoustic lens Receiving means for inputting an electrical reflection signal obtained by converting a wave by the transducer and extracting a signal component corresponding to the bottom surface of the sample from the reflection signal, and the sample and the acoustic lens in a horizontal plane. And scanning means for relatively scanning in, and image forming means for forming a reflected image of the bottom surface of the sample from the signal component output from the receiving means. An ultrasonic microscope characterized by that.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5293245A JPH07146279A (en) | 1993-11-24 | 1993-11-24 | Release detection method and ultrasonic microscope applying the method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5293245A JPH07146279A (en) | 1993-11-24 | 1993-11-24 | Release detection method and ultrasonic microscope applying the method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07146279A true JPH07146279A (en) | 1995-06-06 |
Family
ID=17792327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5293245A Withdrawn JPH07146279A (en) | 1993-11-24 | 1993-11-24 | Release detection method and ultrasonic microscope applying the method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07146279A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015049088A (en) * | 2013-08-30 | 2015-03-16 | 川崎重工業株式会社 | Ultrasonic flaw detector |
| JP2020186914A (en) * | 2019-05-09 | 2020-11-19 | 株式会社日立パワーソリューションズ | Ultrasonic inspection apparatus and ultrasonic inspection system |
-
1993
- 1993-11-24 JP JP5293245A patent/JPH07146279A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015049088A (en) * | 2013-08-30 | 2015-03-16 | 川崎重工業株式会社 | Ultrasonic flaw detector |
| US10101302B2 (en) | 2013-08-30 | 2018-10-16 | Kawasaki Jukogyo Kabushiki Kaisha | Ultrasonic flaw detector |
| JP2020186914A (en) * | 2019-05-09 | 2020-11-19 | 株式会社日立パワーソリューションズ | Ultrasonic inspection apparatus and ultrasonic inspection system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20010130 |