JPH07198729A - Method of approaching probe of probe microscope - Google Patents
Method of approaching probe of probe microscopeInfo
- Publication number
- JPH07198729A JPH07198729A JP5336610A JP33661093A JPH07198729A JP H07198729 A JPH07198729 A JP H07198729A JP 5336610 A JP5336610 A JP 5336610A JP 33661093 A JP33661093 A JP 33661093A JP H07198729 A JPH07198729 A JP H07198729A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- sample
- optical microscope
- microscope
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 140
- 238000000034 method Methods 0.000 title claims abstract description 9
- 230000003287 optical effect Effects 0.000 claims abstract description 36
- 238000013459 approach Methods 0.000 claims abstract description 22
- 238000006073 displacement reaction Methods 0.000 claims abstract description 10
- 238000012545 processing Methods 0.000 abstract description 3
- 241000256247 Spodoptera exigua Species 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000879 optical micrograph Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
- G01Q30/025—Optical microscopes coupled with SPM
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Image Input (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
(57)【要約】
【目的】 試料と探針の衝突なく、安全に、接近時間を
短縮することができるプローブ顕微鏡装置の探針接近方
法を提供すること。
【構成】 試料台５に搭載された試料４は光学顕微鏡１
０により観察される。探針１は光学顕微鏡１０の視野内
に位置せしめられる。Ｚ軸変位機構２は探針１を上下方
向に、又、上下機構１１は光学顕微鏡１０を上下方向
に、変位させる。光学顕微鏡１０の像はＣＣＤカメラ１
２、画像処理装置１３により表示装置１４に表示され
る。探針１を試料４に接近させる場合、光学顕微鏡１０
を、探針１に焦点が合う位置および試料４に焦点が合う
位置にそれぞれ変位させ、各位置の距離を求め、この距
離に基づいて探針１を試料４に接近させ、その後は緩や
かに所定距離まで探針１を試料４に接近させてゆく。最
初の接近で両者の間隔を極めて短くできるので、全体の
接近時間を大幅に短縮できる。
(57) [Abstract] [Purpose] To provide a probe approach method for a probe microscope apparatus, which can safely reduce the approach time without collision between the sample and the probe. [Structure] The sample 4 mounted on the sample table 5 is the optical microscope 1.
Observed by 0. The probe 1 is positioned within the field of view of the optical microscope 10. The Z-axis displacement mechanism 2 displaces the probe 1 in the vertical direction, and the vertical mechanism 11 displaces the optical microscope 10 in the vertical direction. The image of the optical microscope 10 is a CCD camera 1.
2. Displayed on the display device 14 by the image processing device 13. When the probe 1 is brought close to the sample 4, the optical microscope 10
Are respectively displaced to a position where the probe 1 is in focus and a position where the sample 4 is in focus, the distances at the respective positions are obtained, and the probe 1 is brought close to the sample 4 based on this distance, and thereafter, the distance is gently predetermined. The probe 1 is brought closer to the sample 4 to a distance. Since the distance between the two can be made extremely short at the first approach, the overall approach time can be greatly shortened.
Description
【０００１】[0001]
【産業上の利用分野】本発明は、探針を備え、この探針
を試料に接近させて種々の測定を行う原子間力顕微鏡等
のプローブ顕微鏡において、探針を試料に接近させるた
めのプローブ顕微鏡装置の探針接近方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention provides a probe for bringing a probe close to a sample in a probe microscope such as an atomic force microscope which is equipped with the probe and makes various measurements by bringing the probe close to the sample. The present invention relates to a method of approaching a probe of a microscope device.
【０００２】[0002]
【従来の技術】プローブ顕微鏡装置は、先端の尖った探
針を試料にｎｍ（１／１０9 ｍ）オーダまで近づけ、
そのときに探針と試料間に生じるトンネル電流や原子間
力等を測定することで、試料表面の形状等を原子寸法レ
ベルで計測することができる装置である。2. Description of the Related Art In a probe microscope apparatus, a probe with a sharp tip is brought close to a sample to the order of nm (1/10 9 m),
At this time, the device is capable of measuring the shape of the sample surface and the like at the atomic size level by measuring the tunnel current, atomic force, etc. generated between the probe and the sample.
【０００３】探針を試料に接近させるには、第１のステ
ップとして、目視等で探針と試料の距離を確認しながら
ある程度まで近づけ、その後、第２のステップとして、
例えばトンネル顕微鏡であればトンネル電流が検出され
るかどうかを常に監視しながらトンネル電流が検出され
るまで探針を接近させる方法が行われている。In order to bring the probe closer to the sample, the first step is to bring the probe and the sample closer to each other while visually confirming the distance between them, and then as the second step.
For example, in the case of a tunnel microscope, a method is used in which the probe is brought closer until the tunnel current is detected while constantly monitoring whether or not the tunnel current is detected.
【０００４】[0004]
【発明が解決しようとする課題】ところで、例えばトン
ネル顕微鏡の場合であれば、トンネル電流が検出できる
領域まで探針を試料に対し接近させる必要があるが、そ
の距離は前述のとおりｎｍオーダであり、ときには数オ
ングストロームという距離まで接近させる必要がある。
しかもこの接近は、探針を試料に衝突させることなく行
わなければならない。したがって、最終的なトンネル電
流が検出される領域までの接近は、非常にゆっくりと行
う必要があり、このため、上記第２のステップの高速化
には必然的に限界がある。そのため、接近の高速化を図
るには、上記第１のステップで、衝突の危険無しに高速
でかつ可能な限り接近させ、これにより第２のステップ
で行う接近距離を短縮し、その結果として全体の接近に
要する時間を短縮することが必要になる。しかしなが
ら、目視による接近ではせいぜい数百μｍ程度までしか
接近できず、又、このような数百μｍ程度の接近でも衝
突の危険性が極めて高いという問題があった。By the way, in the case of, for example, a tunnel microscope, it is necessary to bring the probe closer to the sample up to the region where the tunnel current can be detected, but the distance is on the order of nm as described above. , Sometimes it is necessary to bring them up to a distance of a few angstroms.
Moreover, this approach must be performed without the probe colliding with the sample. Therefore, the approach to the region where the final tunnel current is detected needs to be performed very slowly, which inevitably limits the speedup of the second step. Therefore, in order to speed up the approach, in the first step, the approach step is performed as fast as possible without danger of collision, thereby shortening the approach distance performed in the second step, and as a result, It is necessary to shorten the time required for the approach. However, there is a problem that the visual approach can approach only a few hundreds of μm at the most, and the risk of collision is extremely high even when approaching a few hundreds of μm.
【０００５】本発明の目的は、上記従来技術における課
題を解決し、探針が試料に衝突することなく安全に、し
かもその接近時間を短くすることができるプローブ顕微
鏡装置の探針接近方法を提供することにある。An object of the present invention is to solve the above-mentioned problems in the prior art and provide a probe approaching method for a probe microscope apparatus in which the probe does not collide with a sample, and the approaching time can be shortened safely. To do.
【０００６】[0006]
【課題を解決するための手段】上記の目的を達成するた
め、本発明は、試料を搭載するための試料テーブルと、
前記試料の面に対向するように配置された探針と、この
探針を試料に対し接近および退避させるための変位機構
と、前記試料を観察する光学顕微鏡とを備えたプローブ
顕微鏡装置において、前記探針を前記光学顕微鏡の視野
内に位置せしめるとともに、前記光学顕微鏡の焦点を前
記探針と前記試料に順次合せ、それら焦点が合ったとき
の前記光学顕微鏡の各位置に基づいて前記探針と前記試
料間の距離を求め、その距離に基づいて前記探針を前記
試料に接近させることを特徴とする。In order to achieve the above object, the present invention provides a sample table for mounting a sample,
In a probe microscope apparatus comprising a probe arranged to face the surface of the sample, a displacement mechanism for moving the probe toward and away from the sample, and an optical microscope for observing the sample, While positioning the probe in the field of view of the optical microscope, the focus of the optical microscope is sequentially aligned with the probe and the sample, and the probe based on each position of the optical microscope when they are in focus. It is characterized in that a distance between the samples is obtained and the probe is brought close to the sample based on the distance.
【０００７】[0007]
【作用】探針を光学顕微鏡の視野内に位置せしめ、試料
と探針を同時に観察することができるようにし、光学顕
微鏡の焦点を探針に合わせたときの光学顕微鏡の位置
と、光学顕微鏡の焦点を試料に合わせたときの光学顕微
鏡の位置とを記憶し、それらの各位置、即ち光学顕微鏡
の移動量から探針と試料の距離を求める。その距離に基
づいて探針を試料から僅かに手前の位置まで接近させ
る。これにより、探針を従来の目視による方法よりさら
に近くまで、衝突することなく、高速に接近させること
ができる。その後は、例えばトンネル顕微鏡であればト
ンネル電流が検出されるまで、前記第２のステップによ
り接近を行う。[Function] The probe is positioned in the field of view of the optical microscope so that the sample and the probe can be observed at the same time. The position of the optical microscope when the focus of the optical microscope is aligned with the probe and the position of the optical microscope The position of the optical microscope when the focus is adjusted to the sample is stored, and the distance between the probe and the sample is obtained from those positions, that is, the moving amount of the optical microscope. Based on the distance, the probe is moved slightly closer to the position near the sample. As a result, the probe can be made to approach at a high speed without colliding even closer than the conventional visual inspection method. Thereafter, for example, in the case of a tunnel microscope, the approach is performed in the second step until the tunnel current is detected.
【０００８】[0008]
【実施例】以下、本発明を図示の実施例に基づいて説明
する。図１は本発明の実施例に係るプローブ顕微鏡装置
の全体構成図である。プローブ顕微鏡の探針１は、支持
台３により支持された接近・退避用のＺ軸変位機構２に
より支持されており、試料台５の上に搭載された試料４
に対して接近・退避を行うことができる。上記Ｚ軸変位
機構としては、例えば圧電素子を利用したインチワーム
機構を用いることができるが、それに限定されるもので
はなく、探針１を試料に対し接近させ、プローブ顕微鏡
観察を行うことができるものであればどのような機構で
も良い。なお、上記インチワーム機構は、一般的に知ら
れている機構であるので、その説明は省略する。６は試
料をＸＹ平面内で走査し、またＺ軸方向に上下するため
のトライポッド機構であり、これも走査型プローブ顕微
鏡装置では一般的に用いられる機構であるので説明を省
略する。７はＺ軸変位機構２の駆動を制御するコントロ
ーラ、８はトライポッド機構の駆動を制御するコントロ
ーラである。以上の各要素によりプローブ顕微鏡が構成
される。The present invention will be described below with reference to the illustrated embodiments. FIG. 1 is an overall configuration diagram of a probe microscope apparatus according to an embodiment of the present invention. The probe 1 of the probe microscope is supported by a Z-axis displacement mechanism 2 for approaching and retracting supported by a support base 3, and a sample 4 mounted on a sample base 5.
Can be approached and retracted. As the Z-axis displacement mechanism, for example, an inchworm mechanism using a piezoelectric element can be used, but the Z-axis displacement mechanism is not limited thereto, and the probe 1 can be brought close to the sample for probe microscope observation. Any mechanism may be used as long as it is one. Since the inchworm mechanism is a generally known mechanism, its explanation is omitted. Reference numeral 6 is a tripod mechanism for scanning the sample in the XY plane and moving it up and down in the Z-axis direction. This is also a mechanism generally used in the scanning probe microscope apparatus, and therefore its explanation is omitted. Reference numeral 7 is a controller for controlling the drive of the Z-axis displacement mechanism 2, and 8 is a controller for controlling the drive of the tripod mechanism. A probe microscope is configured by the above elements.
【０００９】プローブ顕微鏡による観察時には、探針１
をＺ軸変位機構２により試料表面上ｎｍオーダまで接近
させる。この接近により、例えばトンネル顕微鏡では、
試料と探針間にトンネル電流が流れる。そのトンネル電
流を図示しない電流検出回路により検出し、コントロー
ラ８の制御の下にトライポッド６により試料をＸＹ平面
内で走査し、かつ、コントローラ７の制御の下にＺ軸方
向にトンネル電流が一定になるようなサーボ制御を行
う。これにより、試料の３次元像を得ることができる。When observing with a probe microscope, the probe 1
Are brought close to the order of nm on the sample surface by the Z-axis displacement mechanism 2. By this approach, for example, in a tunnel microscope,
A tunnel current flows between the sample and the probe. The tunnel current is detected by a current detection circuit (not shown), the sample is scanned in the XY plane by the tripod 6 under the control of the controller 8, and the tunnel current is made constant in the Z-axis direction under the control of the controller 7. Servo control is performed so that Thereby, a three-dimensional image of the sample can be obtained.
【００１０】本実施例のプローブ顕微鏡装置は、上記プ
ローブ顕微鏡に加えて次の構成要素を有する。即ち、１
０は光学顕微鏡を示し、光学顕微鏡の上下機構１１を介
して支持台３により支持されている。本実施例では、探
針１は光学顕微鏡１０と試料４との間の光路中に位置せ
しめられ、試料４および探針１の光学顕微鏡像は、支持
台３に取り付けられたＣＣＤカメラ１２の撮像面上に結
像する。このＣＣＤカメラ１２の画像信号は、画像処理
装置１３により処理され、表示装置１４に表示される。
１５は上下機構１１の駆動を制御するコントローラ、１
６はマイクロコンピュータより成り各コントローラ７、
８、１５を制御する演算制御部である。The probe microscope apparatus of this embodiment has the following components in addition to the above probe microscope. That is, 1
Reference numeral 0 denotes an optical microscope, which is supported by a support base 3 via a vertical mechanism 11 of the optical microscope. In this embodiment, the probe 1 is positioned in the optical path between the optical microscope 10 and the sample 4, and the optical microscope images of the sample 4 and the probe 1 are captured by the CCD camera 12 mounted on the support 3. Form an image on the surface. The image signal of the CCD camera 12 is processed by the image processing device 13 and displayed on the display device 14.
Reference numeral 15 is a controller for controlling the drive of the up-and-down mechanism 11.
6 is a microcomputer, each controller 7,
This is an arithmetic control unit for controlling the components 8 and 15.
【００１１】次に、探針１を試料４に対し接近させると
きの方法について説明する。まず、目視により探針１を
試料４に接近させる。この段階では、目視で衝突してい
ないことが確認できる範囲内で接近させるだけでよく、
おおむね数ｍｍ位まで接近させることになる。この状態
で光学顕微鏡１０を上下させ、探針１の背面に焦点が一
致する位置に停止させ、そのときの光学顕微鏡１０の
（上下機構１１の）位置を制御演算部１６に記憶する。
一般に、光学顕微鏡１０の上下機構１１の駆動アクチュ
エータにはステッピングモータを用いるため、光学顕微
鏡１０の上下位置を容易に制御演算部１６に記憶させる
ことができる。次に、光学顕微鏡１０を下降させ、試料
４の表面に焦点が一致する位置に停止させ、そのときの
光学顕微鏡１０の（上下機構１１の）位置を制御演算部
１６に記憶させる。Next, a method for bringing the probe 1 closer to the sample 4 will be described. First, the probe 1 is visually approached to the sample 4. At this stage, all you have to do is approach within the range where you can visually confirm that there is no collision,
The distance will be about a few millimeters. In this state, the optical microscope 10 is moved up and down and stopped at a position where the focal point matches the back surface of the probe 1, and the position (of the up-and-down mechanism 11) of the optical microscope 10 at that time is stored in the control calculator 16.
Generally, since a stepping motor is used as a drive actuator of the vertical mechanism 11 of the optical microscope 10, the vertical position of the optical microscope 10 can be easily stored in the control calculation unit 16. Next, the optical microscope 10 is lowered and stopped at a position where the focal point matches the surface of the sample 4, and the position (of the vertical mechanism 11) of the optical microscope 10 at that time is stored in the control calculation unit 16.
【００１２】前記探針１に焦点を合わせたときの光学顕
微鏡１０の上下位置の記憶値と、試料４の表面に焦点を
合わせたときの光学顕微鏡１０の上下位置の記憶値とを
制御演算部１６で比較することにより、探針１と試料４
の表面との距離を求めることができる。実際に探針１を
接近させるときには、探針接近用のＺ軸変位機構２の位
置決め精度、光学顕微鏡１０の停止時のオーバーシュー
ト量などを考慮し、上述のようにして求めた探針１と試
料４との距離から適当な値を減じた距離だけ探針１を接
近させる。A control calculation unit controls the stored value of the vertical position of the optical microscope 10 when the probe 1 is focused and the stored value of the vertical position of the optical microscope 10 when the surface of the sample 4 is focused. By comparing with 16, the probe 1 and the sample 4
The distance to the surface of can be calculated. When actually approaching the probe 1, the probe 1 obtained as described above is considered in consideration of the positioning accuracy of the Z-axis displacement mechanism 2 for approaching the probe, the overshoot amount when the optical microscope 10 is stopped, and the like. The probe 1 is moved closer by a distance obtained by subtracting an appropriate value from the distance to the sample 4.
【００１３】本実施例では、このような接近方法により
探針１が試料４に衝突することはなく、したがって、目
視により接近する場合に比べ、より近くまで、しかも高
速に接近させることができる。このように、より近くま
で接近させることができるため、その後の接近、即ち、
例えばトンネル顕微鏡であればトンネル電流を常に監視
しながら探針１を衝突の危険がない低い速度で接近させ
る接近に要する時間も短くなり、結局、全体の接近に要
する時間を大幅に短縮することができる。In this embodiment, the probe 1 does not collide with the sample 4 by such an approaching method, and therefore, the probe 1 can be brought closer to the sample 4 at a higher speed as compared with the case of visually approaching. In this way, it is possible to get closer, so the subsequent approach, that is,
For example, in the case of a tunnel microscope, the time required for approaching the probe 1 at a low speed where there is no risk of collision while constantly monitoring the tunnel current is shortened, and the time required for the overall approach can be greatly shortened. it can.
【００１４】[0014]
【発明の効果】以上述べたように、本発明では、光学顕
微鏡の焦点を探針に合わせた位置と、光学顕微鏡の焦点
を試料に合わせた位置との間の光学顕微鏡の移動量から
探針と試料の距離を求め、その距離に基づいて探針を試
料に接近させるようにしたので、目視により接近させる
場合に比べ、より近くまで衝突の危険無しに高速に接近
させることができ、それにより、最終段階において低速
で行う接近の距離を短縮することができ、ひいては、全
体の接近に要する時間を大幅に短縮することができる。As described above, according to the present invention, the probe is determined from the amount of movement of the optical microscope between the position where the focus of the optical microscope is focused on the probe and the position where the focus of the optical microscope is focused on the sample. The distance between the sample and the sample is calculated, and the probe is made to approach the sample based on that distance.Therefore, the probe can be approached at a higher speed without danger of collision, as compared with the case of approaching it visually. In the final stage, the distance of the low-speed approach can be shortened, and thus the time required for the entire approach can be significantly shortened.
【図１】本発明の実施例に係るプローブ顕微鏡装置の全
体構成図である。FIG. 1 is an overall configuration diagram of a probe microscope apparatus according to an embodiment of the present invention.
１ 探針 ２ Ｚ軸変位機構 ４ 試料 １０ 光学顕微鏡 １１ 上下機構 １２ ＣＣＤカメラ １３ 画像処理装置 １４ 表示装置 1 probe 2 Z-axis displacement mechanism 4 sample 10 optical microscope 11 vertical mechanism 12 CCD camera 13 image processing device 14 display device
Claims (1)
前記試料の面に対向するように配置された探針と、この
探針を試料に対し接近および退避させるための変位機構
と、前記試料を観察する光学顕微鏡とを備えたプローブ
顕微鏡装置において、前記探針を前記光学顕微鏡の視野
内に位置せしめるとともに、前記光学顕微鏡の焦点を前
記探針と前記試料に順次合せ、それら焦点が合ったとき
の前記光学顕微鏡の各位置に基づいて前記探針と前記試
料間の距離を求め、その距離に基づいて前記探針を前記
試料に接近させることを特徴とする走査型プローブ顕微
鏡装置の探針接近方法。1. A sample table for mounting a sample,
In a probe microscope apparatus comprising a probe arranged to face the surface of the sample, a displacement mechanism for moving the probe toward and away from the sample, and an optical microscope for observing the sample, While positioning the probe in the field of view of the optical microscope, the focus of the optical microscope is sequentially aligned with the probe and the sample, and the probe based on each position of the optical microscope when they are in focus. A probe approach method for a scanning probe microscope apparatus, characterized in that a distance between the samples is obtained, and the probe is brought closer to the sample based on the distance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33661093A JP3325372B2 (en) | 1993-12-28 | 1993-12-28 | Probe approach method for probe microscope equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33661093A JP3325372B2 (en) | 1993-12-28 | 1993-12-28 | Probe approach method for probe microscope equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH07198729A true JPH07198729A (en) | 1995-08-01 |
| JP3325372B2 JP3325372B2 (en) | 2002-09-17 |
Family
ID=18300945
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP33661093A Expired - Fee Related JP3325372B2 (en) | 1993-12-28 | 1993-12-28 | Probe approach method for probe microscope equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3325372B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20210333219A1 (en) * | 2020-04-27 | 2021-10-28 | Mpi Corporation | Method of determining distance between probe and wafer held by wafer probe station |
| CN113759149A (en) * | 2020-06-01 | 2021-12-07 | 日本株式会社日立高新技术科学 | Microscope system, observation method of sample, calibration method of film thickness of sample, calculation method of complex refractive index of sample |
-
1993
- 1993-12-28 JP JP33661093A patent/JP3325372B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20210333219A1 (en) * | 2020-04-27 | 2021-10-28 | Mpi Corporation | Method of determining distance between probe and wafer held by wafer probe station |
| CN113759149A (en) * | 2020-06-01 | 2021-12-07 | 日本株式会社日立高新技术科学 | Microscope system, observation method of sample, calibration method of film thickness of sample, calculation method of complex refractive index of sample |
| JP2021189061A (en) * | 2020-06-01 | 2021-12-13 | 株式会社日立ハイテクサイエンス | Microscope system and method for observing sample using microscope system |
| CN113759149B (en) * | 2020-06-01 | 2025-11-21 | 株式会社日立高新技术分析 | Method for correcting film thickness of sample and method for calculating complex refractive index of sample |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3325372B2 (en) | 2002-09-17 |
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