JPH0720059A - Method and apparatus for measuring perspective distortion - Google Patents
Method and apparatus for measuring perspective distortionInfo
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- JPH0720059A JPH0720059A JP18726593A JP18726593A JPH0720059A JP H0720059 A JPH0720059 A JP H0720059A JP 18726593 A JP18726593 A JP 18726593A JP 18726593 A JP18726593 A JP 18726593A JP H0720059 A JPH0720059 A JP H0720059A
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- contrast
- light
- measured
- pattern
- transmitted
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、透明板材の歪を検出す
るための透視歪の測定方法およびその装置に関するもの
である。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a perspective distortion measuring method and apparatus for detecting distortion of a transparent plate material.
【０００２】[0002]
【従来の技術】従来、板ガラスや曲面ガラス等の透明体
の内部の透視歪を測定するために、スクリーン上の格子
などを被測定物を介して目視、あるいはカメラ等で観察
し、格子等の線の変形や曲りを基準線からのずれや傾
き、あるいは線の曲り具合等で評価していた。2. Description of the Related Art Conventionally, in order to measure the perspective distortion inside a transparent body such as flat glass or curved glass, a grid on a screen is visually observed through an object to be measured or a camera or the like, The deformation or bending of the line was evaluated by the deviation or inclination from the reference line, or the degree of bending of the line.
【０００３】[0003]
【発明が解決しようとする課題】しかしこのような従来
の方法では、面積的に小さな歪が格子の間に入ってしま
うと測定不可能となってしまうという問題がある。ま
た、目視による方法では、歪の測定が難しく、測定者に
よるばらつきが避けられないという問題がある。また、
従来カメラ等でデータを取込みこれを処理する方法（特
開平３−１９９９４６号公報、特開平３−１３５７０４
号公報）が提案されている。しかし、このような方法に
おいても、格子などの位置の精密な座標が必要となるた
め高分解能の検出が必要となるうえ、メッシュごとの複
雑な計算が必要となり評価するための計算量が膨大とな
り、測定時間が長くかかるなどの問題がある。However, such a conventional method has a problem that measurement cannot be performed if a small strain in area enters between the lattices. Further, the visual method has a problem in that it is difficult to measure the strain, and it is unavoidable that variations occur depending on the measurer. Also,
A conventional method of fetching data with a camera or the like and processing the data (Japanese Patent Laid-Open No. 3-199946 and Japanese Patent Laid-Open No. 3-135704)
Issue). However, even in such a method, since precise coordinates of the position of a grid or the like are required, high-resolution detection is required, and complicated calculation is required for each mesh, and the amount of calculation for evaluation becomes enormous. However, there are problems such as long measurement time.
【０００４】本発明は上記従来技術の欠点に鑑みなされ
たものであって、簡単な構成で容易に確実に歪を検出し
これを測定者によるばらつきを生ずることなく確実に判
定し測定の信頼性を高めた透視歪の測定方法および装置
の提供を目的とする。The present invention has been made in view of the above-mentioned drawbacks of the prior art, and it is possible to easily and surely detect a distortion with a simple structure, to reliably judge the distortion without causing variation by a measurer, and to improve the reliability of the measurement. It is an object of the present invention to provide a method and a device for measuring the perspective distortion with improved optics.
【０００５】[0005]
【課題を解決するための手段】前記目的を達成するた
め、本発明では、被測定物を透過した光を受光装置で受
光し、被測定物の透視歪の測定および検査をする方法に
おいて、コントラスト既知のパターンを持った光源から
被測定物に向けて光を照射して、前記被測定物を透過し
た光のコントラストの変化によって被測定物の歪の測定
を行う。In order to achieve the above object, the present invention provides a method for measuring and inspecting perspective distortion of an object to be measured by receiving light transmitted through the object to be measured by a light receiving device. Light is emitted from a light source having a known pattern toward the object to be measured, and the distortion of the object to be measured is measured by the change in the contrast of the light transmitted through the object to be measured.
【０００６】好ましい実施例においては、前記コントラ
スト既知のパターンとして、輝度の高い部分と低い部分
が交互に２次元的に広がり、両者の面積がほぼ等しくな
るようなパターンを用い、かつ測定すべき歪に対して充
分細かい周期を持っているパターンを用いることを特徴
としている。In a preferred embodiment, as the pattern of which contrast is known, a pattern in which high-luminance portions and low-luminance portions are two-dimensionally spread alternately and their areas are substantially equal to each other, and the strain to be measured is used. Is characterized by using a pattern having a sufficiently fine period.
【０００７】さらに好ましい実施例においては、被測定
物からの透過光量を前記パターンの高輝度部および低輝
度部の位置に対応して検出し、該高輝度部および低輝度
部の検出光量に基づいてコントラストを算出し、被測定
物を透過しない場合のコントラストと透過した場合のコ
ントラストとの比較により歪を測定することを特徴とし
ている。In a further preferred embodiment, the amount of transmitted light from the object to be measured is detected in correspondence with the positions of the high brightness part and the low brightness part of the pattern, and based on the detected light amounts of the high brightness part and the low brightness part. The contrast is calculated by measuring the contrast, and the distortion is measured by comparing the contrast when the object is not transmitted and the contrast when the object is transmitted.
【０００８】また、前記目的を達成するため、本発明に
係る透過歪測定装置は、所定の明暗コントラストパター
ンを有する光源と、該光源からの光を被測定物を通して
受光する受光装置と、該受光装置により受光した光のコ
ントラストの変化を検出するためのコントラスト検出手
段とを備えたことを特徴としている。In order to achieve the above object, the transmission distortion measuring apparatus according to the present invention comprises a light source having a predetermined light and dark contrast pattern, a light receiving apparatus for receiving light from the light source through an object to be measured, and the light receiving apparatus. The apparatus is characterized by comprising a contrast detecting means for detecting a change in the contrast of light received by the device.
【０００９】好ましい実施例においては、前記光源のコ
ントラストパターンは、測定すべき歪に対し充分細かい
ピッチで交互に連続する明暗模様からなることを特徴と
している。In a preferred embodiment, the contrast pattern of the light source is characterized by comprising bright and dark patterns which are alternately continuous at a sufficiently fine pitch for the strain to be measured.
【００１０】さらに好ましい実施例においては、前記光
源のコントラストパターンは、縦横方向に拡がるチェッ
カー模様からなることを特徴としている。In a further preferred embodiment, the contrast pattern of the light source is a checkered pattern that spreads in the vertical and horizontal directions.
【００１１】別の好ましい実施例においては、前記コン
トラスト検出手段は、被測定物からの透過光量を前記コ
ントラストパターンの明部および暗部の位置に対応して
検出し、明部および暗部の光量に基づいてコントラスト
を算出する演算処理装置からなることを特徴としてい
る。In another preferred embodiment, the contrast detecting means detects the amount of light transmitted from the object to be measured in correspondence with the positions of the bright and dark portions of the contrast pattern, and based on the light amounts of the bright and dark portions. It is characterized in that it comprises an arithmetic processing unit for calculating the contrast.
【００１２】[0012]
【作用】一般に透視歪はレンズ的な作用をもたらすもの
であり、被測定物の透視歪が含まれている部分は焦点ず
れを起こした状態となる。このように、被測定物が透視
歪を有していて、焦点ずれが生じた場合、検出光学系の
光源面での錯乱円は大きくなり、透視歪部を透過した光
は歪部がなかった場合に検出される位置と異なる位置に
ずれるため、既知のコントラストパターンの、本来高輝
度となるはず、あるいは低輝度となるはずの光の焦点が
ずれることによって、高輝度と低輝度とが互いに緩和さ
れ、コントラストに変化が生ずる。OPERATION Generally, the perspective distortion has a lens-like effect, and the portion of the object to be measured that contains the perspective distortion is defocused. In this way, when the DUT has perspective distortion and defocus occurs, the circle of confusion on the light source surface of the detection optical system becomes large, and the light transmitted through the perspective distortion section has no distortion section. In the known contrast pattern, the high-luminance and low-luminance are alleviated because the light of the known contrast pattern is supposed to be high-luminance or low-luminance. As a result, the contrast changes.
【００１３】本発明においては、透光体の透視歪を測定
する際、光源としてコントラスト既知のパターンを持っ
た光源を用い、被測定物透過後の上記したコントラスト
の変化を検出することによって、歪の測定、評価、検出
をしているので、精密な座標測定や複雑な処理をする必
要がなく人間の感性に近い指標による透視歪の定量的測
定、評価、検出が可能となる。また、同様な原理によ
り、鏡面反射をするような被測定物の反射像のコントラ
ストの変化によって反射歪の測定、評価、検出も可能で
ある。In the present invention, when the perspective distortion of the translucent body is measured, a light source having a pattern with a known contrast is used as a light source, and the above-mentioned change in the contrast after passing through the object to be measured is detected. Since the measurement, evaluation, and detection are performed, it is possible to perform quantitative measurement, evaluation, and detection of the perspective distortion with an index close to human sensitivity without the need for precise coordinate measurement and complicated processing. Further, according to the same principle, it is possible to measure, evaluate, and detect reflection distortion by changing the contrast of the reflection image of the object to be measured that causes specular reflection.
【００１４】また、好ましい実施例においては、透視歪
の測定、検査において輝度の高い部分と低い部分が交互
に２次元的に拡がり、両者の面積がほぼ等しくなるよう
なパターンを用い、歪に対して充分細かい周期を持って
いるパターンを用いている。これにより歪の方向性によ
る影響を受けることがなく、面積的に小さい歪に対して
も測定、評価、検出が可能になる。Further, in the preferred embodiment, in the measurement and inspection of the perspective distortion, a pattern in which a high luminance portion and a low luminance portion are two-dimensionally spread alternately and the areas of both are substantially equal to each other, The pattern has a sufficiently fine period. This makes it possible to measure, evaluate, and detect even a small strain in area without being affected by the directionality of strain.
【００１５】[0015]
【実施例】以下、本発明の実施例について説明する。図
１は本発明の実施例に係る透視歪測定装置の概略的斜視
図である。１はコントラスト既知のパターンを持った散
乱光源であり、例えば、縦横方向に２次元的に拡がるチ
ェッカーパターンを持つ均一な平面光源である。２は被
測定物であり、３はＣＣＤカメラ等のカメラ（撮像装
置）であり、４は得られた信号を処理、演算するプログ
ラムを内蔵したＣＰＵ、ＲＯＭ、ＲＡＭ等の演算回路か
らなる演算処理装置である。光源１は必ずしもこのよう
なチェッカーパターンである必要はなく、測定したい歪
の特性によっては、ドット、格子などのパターンでもよ
く、コントラスト既知の輝度の高い部分と低い部分が連
続するパターンを持った散乱光源であれば他の模様、形
状のパターンが使用可能である。EXAMPLES Examples of the present invention will be described below. FIG. 1 is a schematic perspective view of a perspective distortion measuring device according to an embodiment of the present invention. Reference numeral 1 denotes a scattered light source having a pattern with a known contrast, for example, a uniform plane light source having a checkered pattern which spreads two-dimensionally in the vertical and horizontal directions. Reference numeral 2 is an object to be measured, 3 is a camera (imaging device) such as a CCD camera, and 4 is an arithmetic processing including an arithmetic circuit such as a CPU, a ROM, a RAM, etc., which has a program for processing and arithmetically operating the obtained signals. It is a device. The light source 1 does not necessarily have to have such a checker pattern, and may have a pattern such as a dot or a lattice depending on the characteristic of the distortion to be measured, and has a pattern in which a high brightness part and a low brightness part where the contrast is known are continuous. As long as it is a light source, other patterns and shape patterns can be used.
【００１６】この実施例の光源は、白と黒の面を均一照
明することにより実現したが、面散乱光源をマスクする
方法などでもよい。また、場所によるコントラストやピ
ッチを変えて、場所により検出感度に差を設けることも
可能である。カメラ３についても、必ずしもカメラ形式
のものである必要はなく、ある面におけるコントラスト
を特定できるものであれば他の手段を用いてもよい。The light source of this embodiment is realized by uniformly illuminating the white and black surfaces, but a method of masking the surface scattering light source may be used. Further, it is also possible to change the contrast and pitch depending on the location to provide a difference in detection sensitivity depending on the location. The camera 3 does not necessarily have to be of the camera type, and other means may be used as long as the contrast on a certain surface can be specified.
【００１７】上記測定装置により被測定物を透過させず
に検出光量を測定すると、例えばＡ−Ａ’の線に沿った
値は図２のようになる。横軸はパターン位置、縦軸は検
出光量Ｑを示す。図示したように、高輝度部および低輝
度部の値はどのパターンでもほぼ一様になる。なお、高
輝度部はパターンの白い部分（明部）であり、低輝度部
はパターンの黒い部分（暗部）である。When the amount of detected light is measured by the above measuring device without passing through the object to be measured, the values along the line AA 'are as shown in FIG. The horizontal axis represents the pattern position, and the vertical axis represents the detected light amount Q. As shown in the figure, the values of the high-luminance portion and the low-luminance portion are almost uniform in any pattern. The high-luminance portion is a white portion (bright portion) of the pattern, and the low-luminance portion is a black portion (dark portion) of the pattern.
【００１８】一方、上記測定装置により被測定物透過後
の検出光量を図３に示す。この場合、歪（歪の強い部
分）を透過した部分（図３の６）においてはパターンの
高輝度部（明部）および低輝度部（暗部）の値の比ある
いは差は、非歪部（歪の弱い部分、図３の５および７）
を透過したものに比べ小さくなる。即ち、６の部分では
高輝度部の光量は低下し、低輝度部の光量は増加してい
る。したがってコントラストは低下している。この被測
定物透過後のコントラストと、被測定物を透過していな
い場合のコントラストとの比によって透視歪を定量的に
評価している。On the other hand, FIG. 3 shows the amount of light detected after passing through the object to be measured by the above measuring device. In this case, in the portion (6 in FIG. 3) that has transmitted the distortion (the portion having the strong distortion), the ratio or difference between the values of the high luminance portion (bright portion) and the low luminance portion (dark portion) of the pattern is Part with weak distortion, 5 and 7 in FIG. 3)
Will be smaller than that transmitted through. That is, the light amount in the high-luminance portion decreases in the portion 6 and the light amount in the low-luminance portion increases. Therefore, the contrast is lowered. The perspective distortion is quantitatively evaluated by the ratio of the contrast after passing through the measured object and the contrast when the measured object is not transmitted.
【００１９】実施例では、光源から被測定物までを３０
０ｍｍ、被測定物からカメラまでを７００ｍｍとし、焦
点距離７５ｍｍ、Ｆ値２．８という条件で、自動車用合
せガラスを光軸に対して２５度傾けた状態における点状
の歪の測定を行った。この結果、白部分の輝度Ｉmax と
黒部分の輝度Ｉmin の差を全体の明るさで正規化したコ
ントラストを表す値Ｃ＝（Ｉmax −Ｉmin ）／（Ｉmax
＋Ｉmin ）は、歪部のコントラスト値が非歪部のコント
ラストの値の１０分の１程度であることが測定された。
また、測定者の識別感覚に基づく官能的な歪の強さが強
いほど、歪み部分のコントラストの値が小さくなるとい
う相関も確認できた。In the embodiment, 30 from the light source to the object to be measured.
The point-like strain was measured under the conditions of 0 mm, 700 mm from the object to be measured to the camera, a focal length of 75 mm, and an F value of 2.8, and the laminated glass for automobile was tilted 25 degrees with respect to the optical axis. . As a result, a value C = (I max −I min ) / (I max representing the contrast obtained by normalizing the difference between the brightness I max of the white part and the brightness I min of the black part with the overall brightness.
+ I min ), the contrast value of the distorted portion was measured to be about 1/10 of the contrast value of the non-distorted portion.
It was also confirmed that the stronger the sensual distortion based on the sense of identification of the measurer, the smaller the contrast value in the distorted portion.
【００２０】さらに簡易的に高輝度部の検出光量の低下
量、あるいは低輝度部の検出光量の増加量によって透視
歪量を評価することも可能である。また、結像系の焦点
深度を深くとる、焦点合わせを実施する、もともと歪量
を予想した位置に焦点を合せておくなどのなんらかの方
法により歪部分に焦点を合せた形にして歪部が非歪部に
比べてコントラストの高い状態として、高コントラスト
部、高輝度部、あるいは低輝度部の検出による歪の評価
も可能である。Further, it is possible to simply evaluate the amount of perspective distortion by the decrease amount of the detected light amount of the high brightness portion or the increase amount of the detected light amount of the low brightness portion. Also, by using a method such as deepening the depth of focus of the imaging system, performing focusing, or focusing on the position where the amount of distortion was originally predicted, the distorted part is made non-distorted by focusing on the distorted part. It is also possible to evaluate the distortion by detecting a high-contrast portion, a high-luminance portion, or a low-luminance portion as a state in which the contrast is higher than that of the distorted portion.
【００２１】[0021]
【発明の効果】以上説明したように、本発明では、コン
トラスト既知のパターンを有する光源を用いて、被測定
物の透過光のコントラスト変化を求め、このコントラス
ト変化により歪を検出しているため、短時間で簡易に人
間の感性に近い指標を用いて定量的に光学歪の測定、評
価、検出が可能となり、大量の評価、工程内における検
査が測定者によるばらつきを生じることなく可能とな
り、検査の信頼性が高まる。As described above, in the present invention, the light source having a pattern with a known contrast is used to obtain the contrast change of the transmitted light of the object to be measured, and the distortion is detected by this contrast change. Optical strain can be quantitatively measured, evaluated, and detected easily in a short time by using an index close to human sensitivity, and a large amount of evaluation and in-process inspection can be performed without causing variations among inspectors. Credibility increases.
【００２２】さらに、本発明によれば、被測定物の透過
光のコントラスト変化によって定量的に歪を検出できる
ため、歪の大きさの基準値を設定することが可能とな
り、この基準値を適正検査の指標とすることができる。Further, according to the present invention, since the strain can be quantitatively detected by the change in the contrast of the transmitted light of the object to be measured, it becomes possible to set the reference value of the magnitude of the strain, and the reference value can be set appropriately. It can be used as an index for inspection.
【図１】本発明の実施例に係る透視歪測定装置の基本構
成を示す構成説明図FIG. 1 is a structural explanatory view showing a basic structure of a perspective distortion measuring device according to an embodiment of the present invention.
【図２】光源からの光を被測定物を透過させず直接受光
した場合の明暗パターン部の受光量を示す検出信号のグ
ラフFIG. 2 is a graph of a detection signal indicating the amount of light received by a light and dark pattern portion when light from a light source is directly received without passing through an object to be measured.
【図３】光源からの光を被測定物を通して受光した場合
の明暗パターン部の受光量を示す検出信号のグラフFIG. 3 is a graph of a detection signal indicating the amount of light received by a light-dark pattern portion when light from a light source is received through an object to be measured.
１：コントラスト既知のパターンを持った光源 ２：被測定物 ３：カメラ ４：信号を処理する演算処理装置 1: Light source having a pattern with known contrast 2: Object to be measured 3: Camera 4: Arithmetic processing device for processing signals
Claims (7)
光装置で受光し、被測定物の透視歪の測定および検査を
する方法であって、コントラスト既知のパターンを持っ
た光源から被測定物に向けて光を照射して、前記被測定
物を透過した光のコントラストの変化によって被測定物
の歪の測定を行うことを特徴とする透視歪の測定方法。1. A method for measuring and inspecting the perspective distortion of an object to be measured by receiving the transmitted light transmitted through the object to be measured, which is a light source having a pattern of known contrast. And irradiating light to the object to be measured, and measuring the distortion of the object to be measured by changing the contrast of the light transmitted through the object to be measured.
輝度の高い部分と低い部分が交互に２次元的に拡がり、
両者の面積がほぼ等しくなるようなパターンを用い、か
つ測定すべき歪に対して充分細かい周期を持っているパ
ターンを用いることを特徴とする請求項１に記載の透視
歪の測定方法。2. The pattern having a known contrast,
Areas with high and low brightness spread two-dimensionally alternately,
The method for measuring the perspective distortion according to claim 1, wherein a pattern having areas substantially equal to each other is used, and a pattern having a sufficiently fine period for the distortion to be measured is used.
高輝度部および低輝度部の位置に対応して検出し、該高
輝度部および低輝度部の検出光量に基づいてコントラス
トを算出し、被測定物を透過しない場合のコントラスト
と透過した場合のコントラストとの比較により歪を測定
することを特徴とする請求項２に記載の透視歪の測定方
法。3. The amount of transmitted light from the object to be measured is detected corresponding to the positions of the high-luminance portion and low-luminance portion of the pattern, and the contrast is calculated based on the detected light amount of the high-luminance portion and low-luminance portion. The method for measuring perspective distortion according to claim 2, wherein the distortion is measured by comparing the contrast when the object to be measured is not transmitted and the contrast when the object is transmitted.
光源と、 該光源からの光を被測定物を通して受光する受光装置
と、 該受光装置により受光した光のコントラストの変化を検
出するためのコントラスト検出手段とを備えたことを特
徴とする透視歪の測定装置。4. A light source having a predetermined light-dark contrast pattern, a light receiving device for receiving light from the light source through an object to be measured, and contrast detection means for detecting a change in contrast of light received by the light receiving device. A device for measuring perspective distortion, which comprises:
すべき歪に対し充分細かいピッチで交互に連続する明暗
模様からなることを特徴とする請求項４に記載の透視歪
の測定装置。5. The apparatus for measuring perspective distortion according to claim 4, wherein the contrast pattern of the light source is composed of bright and dark patterns that are alternately continuous at a sufficiently fine pitch with respect to the distortion to be measured.
方向に拡がるチェッカー模様からなることを特徴とする
請求項５に記載の透視歪の測定装置。6. The apparatus for measuring perspective distortion according to claim 5, wherein the contrast pattern of the light source is a checkered pattern extending in the vertical and horizontal directions.
らの透過光量を前記コントラストパターンの明部および
暗部の位置に対応して検出し、明部および暗部の光量に
基づいてコントラストを算出する演算処理装置からなる
ことを特徴とする請求項４に記載の透視歪の測定装置。7. The contrast detecting means detects the amount of transmitted light from the object to be measured in correspondence with the positions of the bright portion and the dark portion of the contrast pattern, and calculates the contrast based on the light amounts of the bright portion and the dark portion. The apparatus for measuring perspective distortion according to claim 4, wherein the apparatus comprises a processing device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18726593A JPH0720059A (en) | 1993-06-30 | 1993-06-30 | Method and apparatus for measuring perspective distortion |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18726593A JPH0720059A (en) | 1993-06-30 | 1993-06-30 | Method and apparatus for measuring perspective distortion |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0720059A true JPH0720059A (en) | 1995-01-24 |
Family
ID=16202960
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18726593A Pending JPH0720059A (en) | 1993-06-30 | 1993-06-30 | Method and apparatus for measuring perspective distortion |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0720059A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000018922A (en) * | 1998-07-02 | 2000-01-21 | Toshiba Eng Co Ltd | Apparatus for thickness defect inspection and its inspection method |
| JP2002507742A (en) * | 1998-03-25 | 2002-03-12 | ラゾー ラザー ゾルター ゲーエムベーハー | Method and apparatus for detecting defects in sheet glass, especially drips, threads and lines |
| JP2002524718A (en) * | 1998-03-25 | 2002-08-06 | ラゾー アーゲー | Method and apparatus for measuring the optical quality of sheet glass and other translucent materials and detecting defects |
| JP2009139365A (en) * | 2007-12-07 | 2009-06-25 | Utechzone Co Ltd | Device and method for defect inspection of translucent material |
| WO2010117004A1 (en) * | 2009-04-09 | 2010-10-14 | 旭硝子株式会社 | Method for detecting ream of light-transmitting platy object |
| US7869061B2 (en) | 2005-09-15 | 2011-01-11 | Jfe Steel Corporation | Surface-distortion measuring device and method |
| JP2015075483A (en) * | 2013-10-10 | 2015-04-20 | 英治 神谷 | Defect detection method for light transmissive film |
| EP3580551A4 (en) * | 2017-02-09 | 2020-12-16 | Glasstech, Inc. | SYSTEM AND ASSOCIATED PROCEDURE FOR ONLINE DETECTION OF SMALL DEFECTS ON / IN A GLASS PANEL |
-
1993
- 1993-06-30 JP JP18726593A patent/JPH0720059A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002507742A (en) * | 1998-03-25 | 2002-03-12 | ラゾー ラザー ゾルター ゲーエムベーハー | Method and apparatus for detecting defects in sheet glass, especially drips, threads and lines |
| JP2002524718A (en) * | 1998-03-25 | 2002-08-06 | ラゾー アーゲー | Method and apparatus for measuring the optical quality of sheet glass and other translucent materials and detecting defects |
| JP2000018922A (en) * | 1998-07-02 | 2000-01-21 | Toshiba Eng Co Ltd | Apparatus for thickness defect inspection and its inspection method |
| US7869061B2 (en) | 2005-09-15 | 2011-01-11 | Jfe Steel Corporation | Surface-distortion measuring device and method |
| JP2009139365A (en) * | 2007-12-07 | 2009-06-25 | Utechzone Co Ltd | Device and method for defect inspection of translucent material |
| WO2010117004A1 (en) * | 2009-04-09 | 2010-10-14 | 旭硝子株式会社 | Method for detecting ream of light-transmitting platy object |
| JP2015075483A (en) * | 2013-10-10 | 2015-04-20 | 英治 神谷 | Defect detection method for light transmissive film |
| EP3580551A4 (en) * | 2017-02-09 | 2020-12-16 | Glasstech, Inc. | SYSTEM AND ASSOCIATED PROCEDURE FOR ONLINE DETECTION OF SMALL DEFECTS ON / IN A GLASS PANEL |
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