JPH07225199A - Method and apparatus for detecting deterioration of insulated coated electric wire - Google Patents

Method and apparatus for detecting deterioration of insulated coated electric wire

Info

Publication number
JPH07225199A
JPH07225199A JP6017285A JP1728594A JPH07225199A JP H07225199 A JPH07225199 A JP H07225199A JP 6017285 A JP6017285 A JP 6017285A JP 1728594 A JP1728594 A JP 1728594A JP H07225199 A JPH07225199 A JP H07225199A
Authority
JP
Japan
Prior art keywords
deterioration
electric wire
cracks
degree
crack
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6017285A
Other languages
Japanese (ja)
Inventor
Hirotaka Yoshida
吉田  浩隆
Eiichi Sakida
栄一 崎田
Tomohiko Nakamura
友彦 中村
Hiroaki Shindo
博昭 進藤
Junichi Masuda
順一 増田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP6017285A priority Critical patent/JPH07225199A/en
Publication of JPH07225199A publication Critical patent/JPH07225199A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】 (修正有) 【目的】絶縁被覆電線を非破壊で測定し、その絶縁被覆
の劣化程度を、ムラなく簡易かつ定量的に把握できる絶
縁被覆電線の劣化検出方法および装置を提供する。 【構成】測定部2は、絶縁被覆電線3の長手方向の所定
範囲を均一に照射し、電線3の長手方向の絶縁被覆表面
からの反射光を光強度分布波形として測定する光学セン
サ4を備え、本体部1は、光強度分布波形をデジタル変
換し、輝度値のデータ列である反射強度列に変換するA
/Dコンバータと、反射強度列を記憶する波形記憶装置
と、反射強度列と所定の亀裂判定基準値であるしきい値
とに基づいて、絶縁被覆の劣化度を算出する演算装置
と、劣化度を表示する出力装置とを備えて構成する。
(57) [Summary] (Modified) [Purpose] To provide a method and device for detecting the deterioration of an insulation-coated electric wire that allows nondestructive measurement of the insulation-coated electric wire and easily and quantitatively determine the degree of deterioration of the insulation coating. provide. A measuring unit 2 is provided with an optical sensor 4 which uniformly irradiates a predetermined range in the longitudinal direction of the insulating coated electric wire 3 and measures the reflected light from the insulating coated surface in the longitudinal direction of the electric wire 3 as a light intensity distribution waveform. The main body 1 digitally converts the light intensity distribution waveform into a reflection intensity sequence that is a data sequence of brightness values A
/ D converter, a waveform storage device that stores a reflection intensity sequence, an arithmetic device that calculates the degree of deterioration of the insulating coating based on the reflection intensity sequence and a threshold value that is a predetermined crack determination reference value, and a deterioration degree And an output device for displaying.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、絶縁被覆電線の絶縁被
覆の劣化を非破壊で検出する絶縁被覆電線の劣化検出方
法および装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for detecting deterioration of an insulation-coated electric wire for nondestructively detecting deterioration of the insulation coating of the insulation-coated electric wire.

【0002】[0002]

【従来の技術】従来、絶縁被覆電線の劣化を検出する方
法あるいは装置として、実開昭61−131674号が
ある。即ち、図8にその検査例を示すように、絶縁被覆
電線の絶縁被覆102の表面に複数本の線状電極103
を接触させた状態で、絶縁被覆電線の芯線101と絶縁
被覆102の間に電圧を印加し、絶縁被覆電線の芯線1
01が露出している絶縁被覆102の亀裂部分106に
線状電極103が入り込むと、電源105から検出器1
04、線状電極103、絶縁被覆電線の芯線101を通
って接地107へ通電することを利用し、その通電状態
を検出器104で検出する装置がある。
2. Description of the Related Art Conventionally, as a method or apparatus for detecting deterioration of an insulation-coated electric wire, there is Japanese Utility Model Laid-Open No. 61-131674. That is, as shown in the inspection example in FIG. 8, a plurality of linear electrodes 103 are provided on the surface of the insulating coating 102 of the insulating coated electric wire.
In the state where they are in contact with each other, a voltage is applied between the core wire 101 and the insulation coating 102 of the insulation-coated electric wire,
When the linear electrode 103 enters the crack portion 106 of the insulating coating 102 where 01 is exposed, the power source 105 causes the detector 1
There is a device in which the detector 104 detects the energized state by applying electricity to the ground 107 through the wire 04, the linear electrode 103, and the core wire 101 of the insulation-coated electric wire.

【0003】[0003]

【発明が解決しようとする課題】この方法は、絶縁被覆
電線の芯線101と線状電極103との機械的な接触を
利用するため、亀裂が閉じている状態の割れや微細なク
ラックを検出できないこと、通電時、絶縁被覆電線の芯
線101に検出電流が流れるため、現用線への適用が困
難であること、また線状電極103の走査線上にある亀
裂しか検出できず、絶縁被覆電線の絶縁被覆102の円
周方向に対してムラなく検査することが困難である等の
問題があった。
This method utilizes mechanical contact between the core wire 101 of the insulation-coated electric wire and the linear electrode 103, and therefore cannot detect cracks or fine cracks in a closed crack state. In addition, since a detection current flows through the core wire 101 of the insulation-coated electric wire when energized, it is difficult to apply it to the working wire, and only cracks on the scanning line of the linear electrode 103 can be detected, and insulation of the insulation-coated electric wire is detected. There was a problem that it was difficult to inspect the coating 102 in the circumferential direction without unevenness.

【0004】本発明は上記の欠点を改善するために提案
されたものであって、その目的は絶縁被覆電線を非破壊
で測定し、その絶縁被覆の劣化程度を、ムラなく簡易か
つ定量的に把握できる絶縁被覆電線の劣化検出方法およ
び装置を提供することにある。
The present invention was proposed in order to improve the above-mentioned drawbacks, and its purpose is to measure an insulation-coated electric wire in a nondestructive manner and to measure the degree of deterioration of the insulation coating uniformly and simply and quantitatively. An object of the present invention is to provide a method and an apparatus for detecting deterioration of an insulated covered electric wire that can be grasped.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に本発明の絶縁被覆電線の劣化検出方法は、絶縁被覆を
施した電線の該絶縁被覆の亀裂を測定し、前記絶縁被覆
の劣化度を検出する方法であって、前記電線の長手方向
の所定範囲を均一に照射し、前記電線の長手方向の前記
絶縁被覆表面からの反射光を光強度分布波形として測定
する光学センサと、前記光強度分布波形をデジタル変換
し、輝度値のデータ列である反射強度列に変換する変換
部とを備え、前記反射強度列と所定の劣化判定基準輝度
値とに基づいて、前記絶縁被覆の劣化度を算出する第1
のステップと、前記劣化度を表示部に表示する第2のス
テップとを含むことを特徴とする。
In order to achieve the above object, a method for detecting deterioration of an insulating coated electric wire according to the present invention is to measure cracks in the insulating covered electric wire and measure the degree of deterioration of the insulating covering. Is a method of detecting, a uniform irradiation in a predetermined range in the longitudinal direction of the electric wire, an optical sensor for measuring the reflected light from the insulating coating surface in the longitudinal direction of the electric wire as a light intensity distribution waveform, and the light The intensity distribution waveform is digitally converted, and a conversion unit that converts the intensity distribution waveform into a reflection intensity sequence that is a data sequence of luminance values is provided, and the degree of deterioration of the insulating coating is based on the reflection intensity sequence and a predetermined deterioration determination reference luminance value. First to calculate
And a second step of displaying the degree of deterioration on the display unit.

【0006】又、前記光学センサは、前記光強度分布波
形を前記電線の円周上の複数箇所で測定するように構成
し、前記変換部は、複数の前記光強度分布波形を各々デ
ジタル変換し、複数の前記反射強度列に変換し、前記第
1のステップは、複数の前記反射強度列と前記所定の劣
化判定基準輝度値とに基づいて、単一の前記絶縁被覆の
劣化度を算出するようにしたことを特徴とする。
Further, the optical sensor is configured to measure the light intensity distribution waveform at a plurality of locations on the circumference of the electric wire, and the conversion unit digitally converts the plurality of light intensity distribution waveforms. , A plurality of the reflection intensity sequences, and the first step calculates a deterioration degree of the single insulation coating based on the plurality of reflection intensity sequences and the predetermined deterioration determination reference luminance value. It is characterized by doing so.

【0007】又、本発明の絶縁被覆電線の劣化検出方法
は、前記絶縁被覆の劣化度を、前記絶縁被覆の亀裂数と
亀裂幅の関係より決定する劣化判定テーブルを備え、前
記第1のステップは、前記反射強度列より前記輝度値の
ヒストグラムを作成する第3のステップと、前記ヒスト
グラムに基づいて、亀裂判定基準値であるしきい値を算
出する第4のステップと、前記反射強度列の各輝度値
が、前記しきい値より低い箇所である亀裂箇所を特定し
て、前記亀裂箇所の総数を亀裂数、前記亀裂箇所の幅を
亀裂幅として求め、その幅が最大となる最大亀裂幅を求
める第5のステップと、前記亀裂数と前記最大亀裂幅で
前記劣化判定テーブルを参照して前記劣化度を求める第
6のステップとを含むことを特徴とする。
Further, the method for detecting deterioration of an insulation-coated electric wire according to the present invention comprises a deterioration determination table for determining the degree of deterioration of the insulation coating from the relationship between the number of cracks in the insulation coating and the crack width, and the first step. Is a third step of creating a histogram of the brightness value from the reflection intensity sequence, a fourth step of calculating a threshold value which is a crack determination reference value based on the histogram, and a reflection intensity sequence of the reflection intensity sequence. Each brightness value is a crack location that is lower than the threshold value is specified, the total number of crack locations, the number of cracks, the width of the crack location is determined as the crack width, and the maximum crack width is the maximum width. And a sixth step of obtaining the degree of deterioration by referring to the deterioration determination table with the number of cracks and the maximum crack width.

【0008】又、本発明の絶縁被覆電線の劣化検出方法
は、前記絶縁被覆電線の劣化度を、前記絶縁被覆の亀裂
数と亀裂幅の関係より決定する劣化判定テーブルを備
え、前記第1のステップは、前記複数の反射強度列より
前記輝度値のヒストグラム(H1 ,H2 ,…,Hn )を
複数作成する第7のステップと、前記ヒストグラム(H
1 ,H2 ,…,Hn )に基づいて、前記ヒストグラムと
1対1に対応する前記しきい値(Ith1 ,Ith2 ,…,
thn )を算出する第8のステップと、前記反射強度列
毎に、前記反射強度列の各輝度値が、前記しきい値より
低い箇所である亀裂箇所を特定して、前記亀裂箇所の総
数を亀裂数、前記亀裂箇所の幅を亀裂幅として求め、そ
の幅が最大となる最大亀裂幅を求め、該亀裂数(x1
2 ,…,xn )と該最大亀裂幅(dmax1,dmax2
…,dmaxn)を求める第9のステップと、前記第9のス
テップで求めた複数の最大亀裂幅(dmax1,dmax2
…,dmaxn)と亀裂数(x1 ,x2 ,…,xn )の中で
最大の最大亀裂幅(dmax )及び亀裂数(x)で前記劣
化判定テーブルを参照して前記劣化度を求める第10の
ステップとを含むことを特徴とする。
The method for detecting deterioration of an insulation-coated electric wire according to the present invention further comprises a deterioration determination table for determining the degree of deterioration of the insulation-coated electric wire based on the relationship between the number of cracks and the crack width of the insulation coating. The step includes a seventh step of creating a plurality of histograms (H 1 , H 2 , ..., H n ) of the brightness values from the plurality of reflection intensity sequences, and the histogram (H
, H n ) based on 1 , H 2 , ..., H n ) and the threshold values (I th1 , I th2 , ...
8 th step of calculating I thn ), and for each of the reflection intensity rows, a crack location where each luminance value of the reflection intensity row is lower than the threshold value is specified, and the total number of the crack locations is determined. Is calculated as the number of cracks, and the width of the crack portion is calculated as the crack width, and the maximum crack width that maximizes the width is calculated, and the number of cracks (x 1 ,
x 2 , ..., X n ) and the maximum crack width (d max1 , d max2 ,
,, d maxn ) and a plurality of maximum crack widths (d max1 , d max2 , obtained in the ninth step)
, D maxn ) and the maximum crack width (d max ) and the number of cracks (x) among the number of cracks (x 1 , x 2 , ..., X n ) are referred to the deterioration determination table to determine the degree of deterioration. And a tenth step of:

【0009】又、前記しきい値は、前記ヒストグラムか
ら出現頻度が最大になる輝度値Imax を求め、該輝度値
max から輝度値が小さくなる方向に前記ヒストグラム
を追跡して最初に出現頻度が零になる輝度値Iraise
と、輝度値零の中間の輝度値(Iraise /2)に設定す
ることを特徴とする。
As the threshold value, a luminance value I max having the highest appearance frequency is obtained from the histogram, and the histogram is traced in the direction of decreasing the luminance value from the brightness value I max, and the appearance frequency is first. The brightness value I raise
And a brightness value (I raise / 2) intermediate between brightness values of zero.

【0010】又、本発明の絶縁被覆電線の劣化検出装置
は、絶縁被覆を施した電線の該絶縁被覆の亀裂を測定
し、前記絶縁被覆の劣化度を検出する装置であって、測
定部は、前記電線の長手方向の所定範囲を均一に照射
し、前記電線の長手方向の前記絶縁被覆表面からの反射
光を光強度分布波形として測定する光学センサを備え、
本体部は、前記光強度分布波形をデジタル変換し、輝度
値のデータ列である反射強度列に変換する変換部と、前
記反射強度列を記憶する記憶部と、前記反射強度列と所
定の亀裂判定基準値であるしきい値とに基づいて、前記
絶縁被覆の劣化度を算出する処理部と、前記劣化度を表
示する表示部とを備えたことを特徴とするものである。
The insulation-coated electric wire deterioration detecting device of the present invention is a device for measuring cracks in the insulation-coated electric wire and detecting the degree of deterioration of the insulation coating. An optical sensor for uniformly irradiating a predetermined range in the longitudinal direction of the electric wire and measuring reflected light from the insulating coating surface in the longitudinal direction of the electric wire as a light intensity distribution waveform,
The main body unit digitally converts the light intensity distribution waveform and converts it into a reflection intensity sequence that is a data sequence of luminance values, a storage unit that stores the reflection intensity sequence, the reflection intensity sequence and a predetermined crack. It is characterized by comprising a processing unit for calculating the degree of deterioration of the insulating coating based on a threshold value which is a judgment reference value, and a display unit for displaying the degree of deterioration.

【0011】又、前記測定部は、前記電線の長手方向を
円周方向から覆う2分割された分割部材の内側面に、前
記電線の長手方向の所定範囲で前記光強度分布波形を測
定する光学センサを複数具備したことを特徴とするもの
である。
The measuring unit is an optical device for measuring the light intensity distribution waveform in a predetermined range in the longitudinal direction of the electric wire on the inner side surface of a divided member that divides the electric wire in the longitudinal direction from the circumferential direction. It is characterized in that a plurality of sensors are provided.

【0012】又、本発明の絶縁被覆電線の劣化検出装置
は、前記絶縁被覆電線の劣化度を、前記絶縁被覆の亀裂
数と亀裂幅の関係より決定する劣化判定テーブルを具備
し、前記処理部は、少なくとも1の前記輝度値のヒスト
グラムを作成する手段と、前記ヒストグラムより少なく
とも1の前記しきい値を算出する手段と、前記反射強度
列の各輝度値が、前記しきい値より低い箇所である亀裂
箇所を特定して、前記亀裂箇所の総数を亀裂数、前記亀
裂箇所の幅を亀裂幅として求め、その幅が最大となる最
大亀裂幅を求め、前記亀裂数と前記最大亀裂幅で前記劣
化判定テーブルを参照して前記劣化度を求める手段とを
備えたことを特徴とするものである。
In addition, the deterioration detecting device for an insulating covered electric wire according to the present invention comprises a deterioration judging table for determining the degree of deterioration of the insulating covered electric wire based on the relationship between the number of cracks and the crack width of the insulating covering. Is a means for creating a histogram of at least one of the brightness values, a means for calculating at least one of the threshold values from the histogram, and a position where each brightness value of the reflection intensity sequence is lower than the threshold value. By specifying a certain crack location, the total number of the crack locations is the number of cracks, the width of the crack location is determined as the crack width, the maximum crack width at which the width is maximum is determined, and the number of the cracks and the maximum crack width And a means for obtaining the degree of deterioration by referring to a deterioration determination table.

【0013】又、前記光学センサは、前記電線の長手方
向の所定範囲内に、フォトダイオードまたはレーザダイ
オードから成る発光素子と、CCD素子から成る受光素
子を前記電線の長手方向と直交する方向に対で配置した
光センサを、前記所定範囲内に複数個並べて構成したこ
とを特徴とするものである。又、本発明の絶縁被覆電線
の劣化検出装置は、前記測定部と前記本体部を一体にし
たことを特徴とするものである。
Further, in the optical sensor, a light emitting element composed of a photodiode or a laser diode and a light receiving element composed of a CCD element are arranged in a predetermined range in the longitudinal direction of the electric wire in a direction orthogonal to the longitudinal direction of the electric wire. It is characterized in that a plurality of the optical sensors arranged in (1) are arranged in the predetermined range. Further, the deterioration detecting apparatus for an insulated covered electric wire according to the present invention is characterized in that the measuring section and the main body section are integrated.

【0014】[0014]

【作用】上記手段により本発明は、光学センサを絶縁被
覆電線の表面に接触させるだけで測定できるので、迅速
かつ容易に非破壊検査が実施できる。又、複数の光学セ
ンサを適宜、配置することによって、円周方向に対して
ムラなく点検が行える。
With the above means, the present invention can perform the nondestructive inspection quickly and easily because the measurement can be performed only by bringing the optical sensor into contact with the surface of the insulating covered electric wire. Further, by appropriately disposing a plurality of optical sensors, inspection can be performed in the circumferential direction without unevenness.

【0015】更に、亀裂の輝度レベルを、ケーブルの被
覆色の輝度レベルから相対的に割り出しているので、ケ
ーブル色に依存しない亀裂検出が可能である。又、絶縁
被覆の劣化を表面亀裂の発生頻度から定量化しているの
で、点検者の主観や熟練に依存しない劣化診断が可能と
なる。
Furthermore, since the brightness level of the crack is relatively determined from the brightness level of the coating color of the cable, the crack detection independent of the cable color is possible. In addition, since the deterioration of the insulating coating is quantified from the frequency of occurrence of surface cracks, it is possible to perform deterioration diagnosis that does not depend on the subjectivity or skill of the inspector.

【0016】[0016]

【実施例】以下図面を参照して本発明の実施例を詳細に
説明する。本発明の一実施例を電気通信用に用いている
CCP(カラー・コーデッド・ポリエチレン)ケーブル
の劣化検出方法を例にとって説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings. One embodiment of the present invention will be described by taking a deterioration detection method for a CCP (color coded polyethylene) cable used for telecommunication as an example.

【0017】図1は本発明による絶縁被覆電線の劣化検
出方法を実現する劣化検出装置の構成図である。劣化検
出装置は、本体部1、測定部2から構成される。前記本
体部1と測定部2を一体に構成してもよい。又、前記測
定部2は絶縁被覆電線3の長手方向を円周方向から覆う
2分割された分割部材の内側面に、光学センサ4を複数
具備するように構成してもよい。
FIG. 1 is a block diagram of a deterioration detecting device which realizes a method of detecting deterioration of an insulated wire according to the present invention. The deterioration detecting device includes a main body 1 and a measuring unit 2. The main body 1 and the measuring unit 2 may be integrally configured. Further, the measuring unit 2 may be configured to include a plurality of optical sensors 4 on the inner surface of a divided member that divides the insulated coated electric wire 3 in the longitudinal direction from the circumferential direction.

【0018】測定部2の内部には、絶縁被覆の表面を測
定する光学センサ4が複数個配置されている。本例では
4つの光学センサ4を用い、1組ずつ対向させるように
配置し、各発光素子と受光素子を絶縁被覆電線3の長手
方向と直交する方向に対で配置した場合について説明す
る。
Inside the measuring section 2, a plurality of optical sensors 4 for measuring the surface of the insulating coating are arranged. In this example, a case will be described in which four optical sensors 4 are used and are arranged so as to face each other, and the light emitting elements and the light receiving elements are arranged in pairs in a direction orthogonal to the longitudinal direction of the insulating covered electric wire 3.

【0019】本体部1はさらに、図2に示すように、各
光学センサ4からの入力信号をアナログからデジタルに
変換するA/Dコンバータ7、デジタル信号データ(波
形データ)として記憶しておく波形記憶装置8、波形デ
ータに所定の演算を施し、亀裂の検出、劣化程度の判定
を行う演算装置9、劣化程度を判定する際のデータが蓄
積された劣化程度基準データベース10、判定結果の出
力を行う出力装置11から構成される。光センサ4は、
被測定電線の長手方向に沿って直線状に並ぶように配置
された、複数の発光素子5、受光素子6の対で構成され
る(本例では各2048個の素子を配置した場合につい
て説明する)。
As shown in FIG. 2, the main body 1 further includes an A / D converter 7 for converting an input signal from each optical sensor 4 from analog to digital, and a waveform stored as digital signal data (waveform data). A storage device 8, a calculation device 9 that performs a predetermined calculation on the waveform data to detect cracks and determine the degree of deterioration, a deterioration degree reference database 10 that stores data for determining the degree of deterioration, and an output of the determination result. It is composed of an output device 11 for performing. The optical sensor 4 is
It is composed of a pair of a plurality of light emitting elements 5 and light receiving elements 6 arranged so as to be linearly arranged along the longitudinal direction of the measured electric wire (in this example, a case where 2048 elements are arranged will be described. ).

【0020】前記発光素子5にはレーザダイオード、フ
ォトダイオードを用い、測定する範囲内の絶縁被覆電線
3を均一に照射するように、発光素子5を直線的に複数
配置するか、レンズで光を直線方向に広げてもよい。
A laser diode or a photodiode is used as the light emitting element 5, and a plurality of light emitting elements 5 are arranged linearly or a lens is used to emit light so as to uniformly irradiate the insulated wire 3 within the range to be measured. You may spread in a linear direction.

【0021】前記受光素子6にはCCD素子を用い、直
線方向の光を細かく受光するようにする。前記光学セン
サ4の構成は図2に示すように、発光素子5と受光素子
6の横方向の配置はずれていない。
A CCD element is used as the light receiving element 6 so that light in the linear direction can be finely received. As shown in FIG. 2, the structure of the optical sensor 4 is such that the light emitting element 5 and the light receiving element 6 are arranged in the lateral direction.

【0022】即ち、測定部2で絶縁被覆電線3を挟み、
光学センサ4の発光素子5から発光され光により絶縁被
覆電線3の長手方向の所定範囲を均一に照射し、前記絶
縁被覆電線3の長手方向の絶縁被覆表面から反射された
測定光Lを光学センサ4の受光素子6により受光して光
強度分布波形として測定する。光学センサ4で測定した
光強度分布波形をデジタル変換し、輝度値のデータ列で
ある反射強度列に変換する。この反射強度列と所定の劣
化判定基準値とに基づいて、前記絶縁被覆の劣化度を算
出する。この場合、劣化判定基準値である亀裂判定レベ
ルより低い反射強度列の反射レベルの部分を亀裂部分と
みなす。亀裂数と亀裂幅に基づいて劣化度を算出し、劣
化を診断する。
That is, the insulation covered electric wire 3 is sandwiched between the measuring parts 2,
The light emitted from the light emitting element 5 of the optical sensor 4 uniformly illuminates a predetermined range in the longitudinal direction of the insulation-coated electric wire 3 by the light, and the measurement light L reflected from the surface of the insulation-coated electric wire 3 in the longitudinal direction is optically sensored. Light is received by the light receiving element 6 of 4 and measured as a light intensity distribution waveform. The light intensity distribution waveform measured by the optical sensor 4 is digitally converted into a reflection intensity sequence which is a data sequence of luminance values. The deterioration degree of the insulation coating is calculated based on the reflection intensity sequence and a predetermined deterioration determination reference value. In this case, the portion of the reflection level of the reflection intensity sequence that is lower than the crack determination level that is the deterioration determination reference value is regarded as the crack portion. Deterioration is diagnosed by calculating the degree of deterioration based on the number of cracks and the crack width.

【0023】測定部2は外部の光が入射しないよう、例
えば光学センサ4と絶縁被覆電線3が接触するように構
成する。前記測定部2の幅(絶縁被覆電線3の長手方
向)は、電話線の場合、約6cm程度が上限である。こ
れは、接続端子函内の絶縁被覆電線3を測定する場合、
測定出来るよう直線状にできる長さに基づいている。
The measuring unit 2 is constructed so that the optical sensor 4 and the insulating covered electric wire 3 are in contact with each other so that external light does not enter. In the case of a telephone wire, the upper limit of the width of the measuring section 2 (longitudinal direction of the insulation-coated electric wire 3) is about 6 cm. When measuring the insulation-coated electric wire 3 in the connection terminal box,
It is based on the length that can be straightened so that it can be measured.

【0024】劣化度は、本体部1の出力装置11に設け
た表示部(7セグメントLEDなど)に表示する。劣化
度を文字列で表示する場合には、ポケベルと同じ表示部
を用いれば、「トリカエル ヒツヨウガ アリマス」な
どの表示も当然可能である。
The degree of deterioration is displayed on a display section (7-segment LED or the like) provided on the output device 11 of the main body section 1. When the deterioration degree is displayed as a character string, it is naturally possible to display "Trica frog, Alymus" or the like by using the same display unit as the pager.

【0025】また本装置は、電力消費量の増大、製造価
格の増加になるような可動部を使用しないようにしてい
る。図3は本発明劣化検出装置の動作フローである。図
1に示すように被測定電線3を測定部2に挟み込み、測
定部2に対向配置した4つの光センサ4によって、絶縁
被覆の表面状態を長手方向に沿って直線状に測定する
(測定工程)。
Further, the present apparatus does not use a movable part which increases power consumption and manufacturing cost. FIG. 3 is an operation flow of the deterioration detecting device of the present invention. As shown in FIG. 1, the electric wire 3 to be measured is sandwiched between the measuring sections 2, and the surface state of the insulating coating is linearly measured along the longitudinal direction by the four optical sensors 4 arranged to face the measuring section 2 (measuring step). ).

【0026】受光したアナログ信号は、各測定系列ごと
にA/Dコンバータ7により所定の階調(本例では25
6階調)に量子化されてデジタル信号に変換され(A/
D変換工程)、さらに、波形記憶装置8に波形データ列
n (n=0〜2047)として記憶される(波形記憶
工程)。図4に劣化した絶縁被覆電線3の波形データの
一例を示す。(a)は被測定電線3の外観を示し、図中
の点線a−a′が発光および受光素子5,6で測定され
る走査ラインである。(b)は測定された波形データを
示し、横軸は走査画素数、縦軸は輝度値である。劣化に
伴い絶縁被覆上に生じた亀裂は、陰影によってその位置
の輝度値を低下させる。なお、健全な被覆上でも輝度値
が一定になるとは限らず、汚れや色ムラ等の影響により
値は変動する。
The received analog signal is subjected to a predetermined gradation (25 in this example) by the A / D converter 7 for each measurement series.
It is quantized into 6 gradations and converted into a digital signal (A /
D conversion step), and is further stored in the waveform storage device 8 as a waveform data string S n (n = 0 to 2047) (waveform storage step). FIG. 4 shows an example of waveform data of the deteriorated insulation-coated electric wire 3. (A) shows the appearance of the electric wire 3 to be measured, and dotted lines aa 'in the figure are scanning lines measured by the light emitting and light receiving elements 5 and 6. (B) shows the measured waveform data, the horizontal axis is the number of scanning pixels, and the vertical axis is the luminance value. The crack generated on the insulating coating due to the deterioration lowers the brightness value at that position due to the shadow. Note that the brightness value does not always become constant even on a healthy coating, and the value fluctuates due to the effects of stains, color unevenness, and the like.

【0027】演算装置9は、波形データから輝度値別の
出現回数を数え、出現頻度分布(以後ヒストグラムと呼
ぶ)を作成する(波形解析工程その1)。図5は、図4
(b)に示した波形データから得られるヒストグラムで
ある。横軸が輝度値i、縦軸は輝度値の出現回数の累積
数ni を表す。図の中で、分布塊1が絶縁被覆の地の色
を反映しており、分布塊2が亀裂による陰影の色を反映
している。
The arithmetic unit 9 counts the number of appearances for each brightness value from the waveform data and creates an appearance frequency distribution (hereinafter referred to as a histogram) (waveform analysis step 1). FIG. 5 shows FIG.
It is a histogram obtained from the waveform data shown in (b). The horizontal axis is the luminance value i, the vertical axis represents the cumulative number n i of the number of occurrences of luminance values. In the figure, the distribution lump 1 reflects the color of the ground of the insulating coating, and the distribution lump 2 reflects the color of the shadow due to the crack.

【0028】さらに演算装置9は、絶縁被覆の地と亀裂
の区別するためのしきい値レベルIthを、以下の手法に
より自動算出する(波形解析工程その2)。まず、ヒス
トグラムから最大累積数(出現頻度が最大)を与える輝
度値Imax を求め、つぎにImax から輝度値が小さくな
る方向にヒストグラムを追跡したとき、最初に累積数が
零になる点を検出し、その点の輝度値Iraise と輝度値
0の中間値をIth(=Iraise /2、以後この亀裂判定
基準値をしきい値を呼ぶ)とする。
Further, the arithmetic unit 9 automatically calculates the threshold level I th for distinguishing the ground and the crack of the insulating coating by the following method (waveform analysis step 2). First, a luminance value I max that gives the maximum cumulative number (maximum appearance frequency) is obtained from the histogram, then, when the histogram is traced in the direction in which the luminance value decreases from I max , the point at which the cumulative number first becomes zero is found. It is detected, and the intermediate value between the brightness value I raise at that point and the brightness value 0 is defined as I th (= I raise / 2, and this crack determination reference value is hereinafter referred to as a threshold value).

【0029】図5のヒストグラムにおいて、輝度値(I
max )は、絶縁被覆電線3の色に相当する輝度値に出現
する。従って、被覆色が「白」であれば高いレベルとな
り、亀裂の判定も容易であるが、被覆色が濃厚色の場合
には低いレベルになるので、亀裂の判定も困難となる。
これらに基づいて、被覆色が濃厚色の場合でも確実に亀
裂を判定することができるように、しきい値はIraise
/2で算出するようにしている。このようにしきい値が
被覆色によって変動するので、複数の被覆色が混在する
電話線のケーブルでも、亀裂を測定することができる。
In the histogram of FIG. 5, the luminance value (I
max) appears in the luminance value corresponding to the color of the insulated wire 3. Therefore, if the coating color is “white”, the level is high, and the crack can be easily determined. However, if the coating color is a dark color, the level is low, and thus the determination of the crack is difficult.
Based on these, the threshold value is I raise so that the crack can be surely determined even when the coating color is a dark color.
It is calculated as / 2. Since the threshold value varies depending on the coating color in this manner, cracks can be measured even in a telephone line cable in which a plurality of coating colors are mixed.

【0030】つぎに演算装置9は、波形データの中で輝
度値が、しきい値のレベルよりも低下している箇所の数
をカウントし、さらにその幅(画素数)の最大値を測定
する(波形解析工程その3)。これらの値は、それぞれ
亀裂の数、最大亀裂の幅とみなされる。図6は波形デー
タとしきい値から亀裂を検出する様子を示す説明図であ
る。(a)が波形データで、図中の点線で示された輝度
値Ithがしきい値レベルである。(b)は、亀裂、およ
び亀裂幅の検出結果を示しており、亀裂が3箇所、最大
亀裂の幅が3画素(ドット)である。
Next, the arithmetic unit 9 counts the number of locations in the waveform data where the luminance value is lower than the threshold level, and further measures the maximum value of its width (pixel number). (Waveform analysis step 3). These values are regarded as the number of cracks and the maximum crack width, respectively. FIG. 6 is an explanatory diagram showing how a crack is detected from waveform data and a threshold value. (A) is the waveform data, and the luminance value I th shown by the dotted line in the figure is the threshold level. (B) shows the results of detection of cracks and crack widths, where there are three cracks and the maximum crack width is three pixels (dots).

【0031】その値をもとに演算装置9は、劣化程度基
準データベース10で予めデータ化している劣化判定テ
ーブルを参照し、検出した亀裂数と最大亀裂幅から各測
定系列ごとに劣化度を割り当てる(データベース参照工
程)。図7にCCPケーブルの絶縁被覆劣化の判定に使
用する劣化判定テーブルを示す。絶縁被覆劣化に対する
亀裂数と最大亀裂幅の分布範囲から、一義的に劣化度が
決まる。表1は、劣化度とその状態の関係を示したもの
である。
Based on the value, the arithmetic unit 9 refers to the deterioration determination table which is made into data in advance in the deterioration degree reference database 10, and allocates the deterioration degree to each measurement series from the detected number of cracks and the maximum crack width. (Database reference process). FIG. 7 shows a deterioration judgment table used for judging deterioration of the insulation coating of the CCP cable. The degree of deterioration is uniquely determined from the distribution range of the number of cracks and the maximum crack width with respect to deterioration of the insulating coating. Table 1 shows the relationship between the degree of deterioration and its state.

【0032】[0032]

【表1】 [Table 1]

【0033】最後に演算装置9は、各測定系列ごとに割
り当てた劣化度の中から最も大きい劣化度を選び、被測
定電線の劣化度と定める(劣化判定工程)。出力装置1
1は、劣化度を出力、表示する(結果出力)。
Finally, the arithmetic unit 9 selects the largest degree of deterioration from the degrees of deterioration assigned to each measurement series, and determines it as the degree of deterioration of the wire to be measured (deterioration determining step). Output device 1
1 outputs and displays the deterioration degree (result output).

【0034】次に、本実施例について、劣化程度基準デ
ータベースの劣化判定テーブルの構成を表2に示し、波
形記憶装置内の波形データの構成を表3に示す。表4は
図4に対応した波形データの実例を示す。
Next, regarding this embodiment, Table 2 shows the structure of the deterioration determination table of the deterioration degree reference database, and Table 3 shows the structure of the waveform data in the waveform storage device. Table 4 shows an example of the waveform data corresponding to FIG.

【0035】[0035]

【表2】 [Table 2]

【0036】[0036]

【表3】 [Table 3]

【0037】[0037]

【表4】 [Table 4]

【0038】波形データの受光素子番号は、必須項目で
はない。波形記憶装置8のメモリのアドレスに対応して
輝度値を格納すればよい。光学センサ4を複数設置した
場合でも、センサ毎にアドレスを割り当てれば良い。光
学センサ4を複数設置した場合、波形データは各センサ
毎にアドレスを割り当てて作成し、劣化度を求めるパラ
メータである亀裂幅、亀裂数は、各センサで測定した中
から最大のものを採用する。例えば、#1〜#4の光学
センサ4で亀裂数、最大亀裂幅が下記の通り測定された
場合には、下線の値をもって劣化度を算出する。
The light receiving element number of the waveform data is not an essential item. The brightness value may be stored corresponding to the address of the memory of the waveform storage device 8. Even when a plurality of optical sensors 4 are installed, an address may be assigned to each sensor. When a plurality of optical sensors 4 are installed, waveform data is created by allocating an address to each sensor, and the crack width and the number of cracks, which are parameters for obtaining the degree of deterioration, are the maximum measured from each sensor. . For example, when the number of cracks and the maximum crack width are measured by the optical sensors 4 of # 1 to # 4 as described below, the deterioration degree is calculated using the underlined value.

【0039】 このように最大値を採用することにより、劣化度を厳し
く判定する(高い安全率)ことになる。
[0039] By adopting the maximum value in this way, the degree of deterioration is strictly determined (high safety factor).

【0040】即ち、光学センサ4で測定した複数の光強
度分布波形をそれぞれデジタル変換し、それぞれ対応し
た輝度値のデータ列である複数の反射強度列に変換す
る。この複数の反射強度列より輝度値のヒストグラム
(H1 ,H2 ,…,Hn )を複数作成する。このヒスト
グラム(H1 ,H2 ,…,Hn )に基づいて、ヒストグ
ラムと1対1に対応するしきい値(Ith1 ,Ith2
…,Ithn )を算出する。前記反射強度列毎に、前記反
射強度列の各輝度値が、前記しきい値より低い箇所であ
る亀裂箇所を特定して、この亀裂箇所の総数を亀裂数、
前記亀裂箇所の幅を亀裂幅として求め、その幅が最大と
なる最大亀裂幅を求め、該亀裂数(x1 ,x2,…,xn
)と該最大亀裂幅(dmax1,dmax2,…,dmaxn)を
求める。前記複数の最大亀裂幅(dmax1,dmax2,…,
maxn)と亀裂数(x1 ,x2 ,…,xn )の中で最大
の最大亀裂幅(dmax )及び亀裂数(x)で劣化判定テ
ーブルを参照して劣化度を求める。
That is, a plurality of light intensity distribution waveforms measured by the optical sensor 4 are digitally converted into a plurality of reflection intensity sequences which are data sequences of corresponding brightness values. A plurality of brightness value histograms (H 1 , H 2 , ..., H n ) are created from the plurality of reflection intensity sequences. Based on this histogram (H 1 , H 2 , ..., H n ), threshold values (I th1 , I th2 ,
, I thn ) is calculated. For each of the reflection intensity columns, each brightness value of the reflection intensity column is specified as a crack location that is lower than the threshold value, and the total number of the crack locations is the number of cracks,
The width of the cracked portion is determined as the crack width, the maximum crack width that maximizes the width is determined, and the number of cracks (x 1 , x 2 , ..., X n
) And the maximum crack width (d max1 , d max2 , ..., D maxn ). The plurality of maximum crack widths (d max1 , d max2 , ...,
d maxn ) and the number of cracks (x 1 , x 2 , ..., X n ) and the maximum maximum crack width (d max ) and the number of cracks (x) are referred to the deterioration determination table to determine the degree of deterioration.

【0041】[0041]

【発明の効果】以上説明したように本発明によれば、こ
れまで点検者の経験や熟練に依存していた判断行為を、
機械により絶対的、定量的に実施できる。また、光学的
な測定であるため、非破壊で円周方向にわたってムラな
く、簡易かつ迅速な計測が可能である。さらに、本発明
では、測定ごとに亀裂の検出レベルを適宜選択している
ので、絶縁被覆の色に依存することなく、劣化検出がで
きる。
As described above, according to the present invention, it is possible to perform a judgment action which has been dependent on the experience and skill of the inspector.
It can be performed absolutely and quantitatively by a machine. Further, since it is an optical measurement, it is non-destructive and can be easily and promptly measured in the circumferential direction without unevenness. Furthermore, in the present invention, since the crack detection level is appropriately selected for each measurement, deterioration can be detected without depending on the color of the insulating coating.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す斜視図である。FIG. 1 is a perspective view showing an embodiment of the present invention.

【図2】本発明の一実施例に係る劣化検出装置の内部構
成を示す構成説明図である。
FIG. 2 is a configuration explanatory view showing an internal configuration of a deterioration detection device according to an embodiment of the present invention.

【図3】本発明の一実施例に係る劣化検出方法の処理の
流れを示すフローチャートである。
FIG. 3 is a flowchart showing a processing flow of a deterioration detecting method according to an embodiment of the present invention.

【図4】本発明の一実施例に係る劣化した絶縁被覆電線
を測定した場合に得られる波形データのうちの1つを模
式的に表した図で、(a)は被測定電線の外観および測
定ライン、(b)は測定した波形データを示す。
FIG. 4 is a diagram schematically showing one of waveform data obtained when a deteriorated insulation-coated electric wire according to an embodiment of the present invention is measured. FIG. The measurement line, (b) shows the measured waveform data.

【図5】本発明の一実施例に係る波形データから得られ
るヒストグラム及びしきい値を示す説明図である。
FIG. 5 is an explanatory diagram showing a histogram and threshold values obtained from waveform data according to an embodiment of the present invention.

【図6】本発明の一実施例に係る波形データとしきい値
から亀裂を検出する様子を示す模式図で、(a)は波形
データ、(b)は亀裂および亀裂幅の検出結果を示す。
6A and 6B are schematic diagrams showing how a crack is detected from waveform data and a threshold value according to an embodiment of the present invention, FIG. 6A shows waveform data, and FIG. 6B shows a detection result of a crack and a crack width.

【図7】本発明の一実施例に係るCCPケーブルの絶縁
被覆を診断した場合に劣化程度を決定する劣化判定テー
ブルである。
FIG. 7 is a deterioration determination table that determines the degree of deterioration when diagnosing the insulation coating of the CCP cable according to the embodiment of the present invention.

【図8】従来の通電法による劣化検出方法を示す説明図
である。
FIG. 8 is an explanatory diagram showing a deterioration detection method by a conventional energization method.

【符号の説明】[Explanation of symbols]

1…本体部、2…測定部、3…絶縁被覆電線、4…光学
センサ、5…発光素子、6…受光素子、7…A/Dコン
バータ、8…波形記憶装置、9…演算装置、10…劣化
程度基準データベース、11…出力装置。
DESCRIPTION OF SYMBOLS 1 ... Main body part, 2 ... Measuring part, 3 ... Insulated coating electric wire, 4 ... Optical sensor, 5 ... Light emitting element, 6 ... Light receiving element, 7 ... A / D converter, 8 ... Waveform storage device, 9 ... Arithmetic device, 10 ... deterioration degree reference database, 11 ... output device.

フロントページの続き (72)発明者 進藤 博昭 東京都千代田区内幸町一丁目1番6号 日 本電信電話株式会社内 (72)発明者 増田 順一 東京都千代田区内幸町一丁目1番6号 日 本電信電話株式会社内Front page continuation (72) Inventor Hiroaki Shindo 1-6, Uchisaiwaicho, Chiyoda-ku, Tokyo Nihon Telegraph and Telephone Corporation (72) Inventor Junichi Masuda 1-6, Uchisaiwaicho, Chiyoda-ku, Tokyo Nihon Telegraph Phone Co., Ltd.

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】 絶縁被覆を施した電線の該絶縁被覆の亀
裂を測定し、前記絶縁被覆の劣化度を検出する方法であ
って、 前記電線の長手方向の所定範囲を均一に照射し、前記電
線の長手方向の前記絶縁被覆表面からの反射光を光強度
分布波形として測定する光学センサと、 前記光強度分布波形をデジタル変換し、輝度値のデータ
列である反射強度列に変換する変換部とを備え、 前記反射強度列と所定の劣化判定基準輝度値とに基づい
て、前記絶縁被覆の劣化度を算出する第1のステップ
と、 前記劣化度を表示部に表示する第2のステップとを含む
ことを特徴とする絶縁被覆電線の劣化検出方法。
1. A method for measuring the degree of deterioration of the insulating coating by measuring cracks in the insulating coating of an electric wire coated with the insulating coating, the method comprising uniformly irradiating a predetermined range in the longitudinal direction of the electrical wire, An optical sensor that measures reflected light from the insulating coating surface in the longitudinal direction of the electric wire as a light intensity distribution waveform, and a conversion unit that digitally converts the light intensity distribution waveform and converts it into a reflection intensity sequence that is a data sequence of luminance values. A first step of calculating the degree of deterioration of the insulating coating based on the reflection intensity sequence and a predetermined deterioration determination reference luminance value; and a second step of displaying the degree of deterioration on a display unit. A method for detecting deterioration of an insulation-coated electric wire, comprising:
【請求項2】 前記光学センサは、前記光強度分布波形
を前記電線の円周上の複数箇所で測定するように構成
し、 前記変換部は、複数の前記光強度分布波形を各々デジタ
ル変換し、複数の前記反射強度列に変換し、 前記第1のステップは、複数の前記反射強度列と前記所
定の劣化判定基準輝度値とに基づいて、単一の前記絶縁
被覆の劣化度を算出するようにしたことを特徴とする請
求項1記載の絶縁被覆電線の劣化検出方法。
2. The optical sensor is configured to measure the light intensity distribution waveform at a plurality of locations on the circumference of the wire, and the conversion unit digitally converts the plurality of light intensity distribution waveforms. , A plurality of the reflection intensity sequences, and the first step calculates a deterioration degree of a single insulation coating based on the plurality of reflection intensity sequences and the predetermined deterioration determination reference luminance value. The method for detecting deterioration of an insulated covered electric wire according to claim 1, wherein the method is as described above.
【請求項3】 前記絶縁被覆の劣化度を、前記絶縁被覆
の亀裂数と亀裂幅の関係より決定する劣化判定テーブル
を備え、 前記第1のステップは、 前記反射強度列より前記輝度値のヒストグラムを作成す
る第3のステップと、 前記ヒストグラムに基づいて、亀裂判定基準値であるし
きい値を算出する第4のステップと、 前記反射強度列の各輝度値が、前記しきい値より低い箇
所である亀裂箇所を特定して、前記亀裂箇所の総数を亀
裂数、前記亀裂箇所の幅を亀裂幅として求め、その幅が
最大となる最大亀裂幅を求める第5のステップと、 前記亀裂数と前記最大亀裂幅で前記劣化判定テーブルを
参照して前記劣化度を求める第6のステップとを含むこ
とを特徴とする請求項1記載の絶縁被覆電線の劣化検出
方法。
3. A deterioration determination table for determining the degree of deterioration of the insulation coating from the relationship between the number of cracks and the crack width of the insulation coating, wherein the first step comprises a histogram of the brightness values from the reflection intensity column. And a fourth step of calculating a threshold value that is a crack determination reference value based on the histogram, and each luminance value of the reflection intensity sequence is lower than the threshold value. The number of cracks, the number of cracks, the total number of cracks, the width of the cracks is determined as the crack width, and the fifth step of determining the maximum crack width at which the width is maximum, and the number of cracks A sixth step of obtaining the degree of deterioration by referring to the deterioration determination table with the maximum crack width, the deterioration detecting method of the insulated covered wire according to claim 1.
【請求項4】 前記絶縁被覆電線の劣化度を、前記絶縁
被覆の亀裂数と亀裂幅の関係より決定する劣化判定テー
ブルを備え、 前記第1のステップは、 前記複数の反射強度列より前記輝度値のヒストグラム
(H1 ,H2 ,…,Hn)を複数作成する第7のステッ
プと、 前記ヒストグラム(H1 ,H2 ,…,Hn )に基づい
て、前記ヒストグラムと1対1に対応する前記しきい値
(Ith1 ,Ith2 ,…,Ithn )を算出する第8のステ
ップと、 前記反射強度列毎に、前記反射強度列の各輝度値が、前
記しきい値より低い箇所である亀裂箇所を特定して、前
記亀裂箇所の総数を亀裂数、前記亀裂箇所の幅を亀裂幅
として求め、その幅が最大となる最大亀裂幅を求め、該
亀裂数(x1 ,x2 ,…,xn )と該最大亀裂幅(d
max1,dmax2,…,dmaxn)を求める第9のステップ
と、 前記第9のステップで求めた複数の最大亀裂幅
(dmax1,dmax2,…,dmaxn)と亀裂数(x1 ,x
2 ,…,xn )の中で最大の最大亀裂幅(dmax )及び
亀裂数(x)で前記劣化判定テーブルを参照して前記劣
化度を求める第10のステップとを含むことを特徴とす
る請求項2記載の絶縁被覆電線の劣化検出方法。
4. A deterioration determination table that determines the degree of deterioration of the insulation-coated electric wire from the relationship between the number of cracks and the crack width of the insulation coating, wherein the first step comprises the luminance from the plurality of reflection intensity columns. histogram values (H 1, H 2, ... , H n) and a seventh step of creating multiple, the histogram (H 1, H 2, ... , H n) on the basis of, on the histogram one-to-one Eighth step of calculating the corresponding threshold value (I th1 , I th2 , ..., I thn ), and for each reflection intensity row, each luminance value of the reflection intensity row is lower than the threshold value. A crack location that is a location is specified, the total number of the crack locations is determined as the number of cracks, and the width of the crack location is determined as the crack width, and the maximum crack width that maximizes the width is determined, and the number of cracks (x 1 , x 2 , ..., X n ) and the maximum crack width (d
max1, d max2, ..., a ninth step of obtaining a d maxn), said ninth multiple maximum crack width obtained in step (d max1, d max2, ... , d maxn) and number of cracks (x 1, x
2 , ..., X n ), and a tenth step of obtaining the degree of deterioration by referring to the deterioration determination table with the maximum maximum crack width (d max ) and the number of cracks (x). The method for detecting deterioration of an insulated covered electric wire according to claim 2.
【請求項5】 前記しきい値は、 前記ヒストグラムから出現頻度が最大になる輝度値I
max を求め、該輝度値Imax から輝度値が小さくなる方
向に前記ヒストグラムを追跡して最初に出現頻度が零に
なる輝度値Iraise と、輝度値零の中間の輝度値(I
raise /2)に設定することを特徴とする請求項3又は
4記載の絶縁被覆電線の劣化検出方法。
5. The threshold value is a luminance value I that maximizes the frequency of appearance from the histogram.
max is calculated, the histogram is traced in the direction of decreasing the brightness value from the brightness value I max, and the brightness value I raise at which the appearance frequency becomes zero first and the brightness value (I
The method of detecting deterioration of an insulated covered wire according to claim 3 or 4, wherein the method is set to raise / 2).
【請求項6】 絶縁被覆を施した電線の該絶縁被覆の亀
裂を測定し、前記絶縁被覆の劣化度を検出する装置であ
って、 測定部は、 前記電線の長手方向の所定範囲を均一に照射し、前記電
線の長手方向の前記絶縁被覆表面からの反射光を光強度
分布波形として測定する光学センサを備え、 本体部は、 前記光強度分布波形をデジタル変換し、輝度値のデータ
列である反射強度列に変換する変換部と、 前記反射強度列を記憶する記憶部と、 前記反射強度列と所定の亀裂判定基準値であるしきい値
とに基づいて、前記絶縁被覆の劣化度を算出する処理部
と、 前記劣化度を表示する表示部とを備えたことを特徴とす
る絶縁被覆電線の劣化検出装置。
6. A device for measuring cracks in an insulation-coated electric wire to detect a degree of deterioration of the insulation coating, wherein the measuring unit uniformly covers a predetermined range in the longitudinal direction of the electric wire. An optical sensor that irradiates and measures reflected light from the insulating coating surface in the longitudinal direction of the electric wire as a light intensity distribution waveform is provided, and the main body unit digitally converts the light intensity distribution waveform, and in a data string of luminance values. Based on the conversion unit for converting to a certain reflection intensity sequence, a storage unit that stores the reflection intensity sequence, and the threshold value that is the reflection intensity sequence and a predetermined crack determination reference value, the deterioration degree of the insulating coating. A deterioration detecting device for an insulated covered electric wire, comprising: a processing unit for calculating; and a display unit for displaying the deterioration degree.
【請求項7】 前記測定部は、前記電線の長手方向を円
周方向から覆う2分割された分割部材の内側面に、前記
電線の長手方向の所定範囲で前記光強度分布波形を測定
する光学センサを、複数具備したことを特徴とする請求
項6記載の絶縁被覆電線の劣化検出装置。
7. The optical unit for measuring the light intensity distribution waveform in a predetermined range in the longitudinal direction of the electric wire on an inner surface of a divided member that divides the electric wire in a longitudinal direction from a circumferential direction. The deterioration detecting device for an insulated covered electric wire according to claim 6, wherein a plurality of sensors are provided.
【請求項8】 前記絶縁被覆電線の劣化度を、前記絶縁
被覆の亀裂数と亀裂幅の関係より決定する劣化判定テー
ブルを具備し、 前記処理部は、 少なくとも1の前記輝度値のヒストグラムを作成する手
段と、 前記ヒストグラムより少なくとも1の前記しきい値を算
出する手段と、 前記反射強度列の各輝度値が、前記しきい値より低い箇
所である亀裂箇所を特定して、前記亀裂箇所の総数を亀
裂数、前記亀裂箇所の幅を亀裂幅として求め、その幅が
最大となる最大亀裂幅を求め、前記亀裂数と前記最大亀
裂幅で前記劣化判定テーブルを参照して前記劣化度を求
める手段とを備えたことを特徴とする請求項6又は7記
載の絶縁被覆電線の劣化検出装置。
8. A deterioration determination table for determining the degree of deterioration of the insulation-coated wire from the relationship between the number of cracks and the crack width of the insulation coating, wherein the processing unit creates a histogram of at least one of the brightness values. Means for calculating at least one of the threshold value from the histogram, each luminance value of the reflection intensity column, to identify a crack location that is lower than the threshold value of the crack location The total number of cracks, the width of the crack location is determined as the crack width, the maximum crack width that maximizes the width is determined, and the deterioration degree is determined by referring to the deterioration determination table with the number of cracks and the maximum crack width. The deterioration detecting apparatus for an insulated covered electric wire according to claim 6 or 7, further comprising:
【請求項9】 前記光学センサは、 前記電線の長手方向の所定範囲内に、フォトダイオード
またはレーザダイオードから成る発光素子と、CCD素
子から成る受光素子を前記電線の長手方向と直交する方
向に対で配置した光センサを、前記所定範囲内に複数個
並べて構成したことを特徴とする請求項6、7又は8記
載の絶縁被覆電線の劣化検出装置。
9. The optical sensor comprises a light emitting element made up of a photodiode or a laser diode and a light receiving element made up of a CCD element within a predetermined range in the longitudinal direction of the electric wire in a direction orthogonal to the longitudinal direction of the electric wire. 9. The deterioration detecting device for an insulated covered wire according to claim 6, 7 or 8, wherein a plurality of the optical sensors arranged in (1) are arranged in the predetermined range.
【請求項10】 前記測定部と前記本体部を一体にした
ことを特徴とする請求項9記載の絶縁被覆電線の劣化検
出装置。
10. The deterioration detecting device for an insulated coated electric wire according to claim 9, wherein the measuring unit and the main body unit are integrated.
JP6017285A 1994-02-14 1994-02-14 Method and apparatus for detecting deterioration of insulated coated electric wire Pending JPH07225199A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6017285A JPH07225199A (en) 1994-02-14 1994-02-14 Method and apparatus for detecting deterioration of insulated coated electric wire

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6017285A JPH07225199A (en) 1994-02-14 1994-02-14 Method and apparatus for detecting deterioration of insulated coated electric wire

Publications (1)

Publication Number Publication Date
JPH07225199A true JPH07225199A (en) 1995-08-22

Family

ID=11939718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6017285A Pending JPH07225199A (en) 1994-02-14 1994-02-14 Method and apparatus for detecting deterioration of insulated coated electric wire

Country Status (1)

Country Link
JP (1) JPH07225199A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006184254A (en) * 2004-12-28 2006-07-13 Meiji Milk Prod Co Ltd Non-defective product determination criterion setting method and determination processing accuracy determination method, non-defective product determination criterion setting device and determination processing accuracy determination device in inspection apparatus
JP2012154870A (en) * 2011-01-28 2012-08-16 Mitsubishi Electric Corp Deterioration diagnostic device and deterioration diagnostic method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006184254A (en) * 2004-12-28 2006-07-13 Meiji Milk Prod Co Ltd Non-defective product determination criterion setting method and determination processing accuracy determination method, non-defective product determination criterion setting device and determination processing accuracy determination device in inspection apparatus
JP2012154870A (en) * 2011-01-28 2012-08-16 Mitsubishi Electric Corp Deterioration diagnostic device and deterioration diagnostic method

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