JPH0722648A - Silicon carbide light emitting diode device - Google Patents

Silicon carbide light emitting diode device

Info

Publication number
JPH0722648A
JPH0722648A JP16688993A JP16688993A JPH0722648A JP H0722648 A JPH0722648 A JP H0722648A JP 16688993 A JP16688993 A JP 16688993A JP 16688993 A JP16688993 A JP 16688993A JP H0722648 A JPH0722648 A JP H0722648A
Authority
JP
Japan
Prior art keywords
type
substrate
emitting diode
light emitting
silicon carbide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16688993A
Other languages
Japanese (ja)
Inventor
Kazuyuki Koga
和幸 古賀
Kiyoshi Ota
潔 太田
Takashi Kano
隆司 狩野
Junko Suzuki
順子 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP16688993A priority Critical patent/JPH0722648A/en
Publication of JPH0722648A publication Critical patent/JPH0722648A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/819Bodies characterised by their shape, e.g. curved or truncated substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/83Electrodes
    • H10H20/832Electrodes characterised by their material
    • H10H20/835Reflective materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/814Bodies having reflecting means, e.g. semiconductor Bragg reflectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/736Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked lead frame, conducting package substrate or heat sink

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  • Led Device Packages (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To increase luminous intensity by forming a surface which is not parallel with the surface of a P-type SiC layer, in the part which is positioned on the side opposite to a P-type side electrode of an N-type SiC substrate and faces the electrode. CONSTITUTION:An N-type SiC single crystal substrate 2 has one main surface 2a and the other main surface (non-parallel surface) 2b inclined at an angle theta1 to the main surface 2a. Thereby emitted light is outputted outside an element 1, while the frequency of reflection from the other main surface 2b of the substrate 2 or the surface (upper surface) of a P-type SiC single crystal layer 4 is small, that is, while the absorption in the element 1 is small. Hence the luminous intensity of the element can be increased.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、炭化ケイ素発光ダイオ
ード素子に関する。
This invention relates to silicon carbide light emitting diode devices.

【0002】[0002]

【従来の技術】一般に、炭化ケイ素(SiC)は、耐熱
性及び機械的強度に優れ、放射線に対して強いなどの物
理的、化学的性質から耐環境性半導体材料として注目さ
れている。
2. Description of the Related Art In general, silicon carbide (SiC) has been attracting attention as an environment-resistant semiconductor material because of its excellent heat resistance and mechanical strength and physical and chemical properties such as resistance to radiation.

【0003】しかもSiC結晶は間接遷移型のIV−IV化
合物であり、SiC結晶は3C形、4H形、6H形、1
5R形等各種の結晶多形が存在し、その禁制帯幅は2.
4〜3.3eVと広範囲に亘ると共に、p型及びn型の
結晶が得られてpn接合の形成が可能であることから、
赤色から青色までのすべての波長範囲の可視光を発する
発光ダイオード材料として利用可能である。なかでも室
温において約3eVの禁制帯幅を有する6H形のSiC
結晶は、青色発光ダイオードの材料として用いられてい
る。
Moreover, the SiC crystal is an indirect transition type IV-IV compound, and the SiC crystal is 3C type, 4H type, 6H type, 1
There are various crystalline polymorphs such as 5R type, and the forbidden band width is 2.
From a wide range of 4 to 3.3 eV, p-type and n-type crystals are obtained and a pn junction can be formed,
It can be used as a light emitting diode material that emits visible light in all wavelength ranges from red to blue. Above all, 6H type SiC having a forbidden band width of about 3 eV at room temperature
Crystals are used as materials for blue light emitting diodes.

【0004】斯る炭化ケイ素発光ダイオード素子として
は、例えば雑誌「電子技術」の第26巻、第14号、第
128頁〜第129頁、1984年に示されている。
An example of such a silicon carbide light emitting diode element is shown in the magazine "Electronics", Vol. 26, No. 14, pp. 128-129, 1984.

【0005】図5は従来の炭化ケイ素発光ダイオード素
子を用いた炭化ケイ素発光ダイオード装置を示す断面図
である。
FIG. 5 is a sectional view showing a silicon carbide light emitting diode device using a conventional silicon carbide light emitting diode element.

【0006】図中、51は炭化ケイ素発光ダイオード素
子、52はこの発光ダイオード素子51を載置する導電
性の金属製ステムである。
In the figure, 51 is a silicon carbide light emitting diode element, and 52 is a conductive metal stem on which the light emitting diode element 51 is mounted.

【0007】この炭化ケイ素発光ダイオード素子51
は、n型SiC基板53の一主面上に形成された発光層
となるn型SiC層54、このn型SiC層54上に形
成されたp型SiC層55、このp型SiC層55上及
びn型SiC基板53の他の一主面上にそれぞれ形成さ
れたp型側電極、n型側電極56、57で構成されてい
る。
This silicon carbide light emitting diode element 51
Is an n-type SiC layer 54 serving as a light-emitting layer formed on one main surface of the n-type SiC substrate 53, a p-type SiC layer 55 formed on the n-type SiC layer 54, and a p-type SiC layer 55. And n-type SiC substrate 53 on the other main surface thereof, and a p-type side electrode and n-type side electrodes 56 and 57, respectively.

【0008】一方、ステム52は、前記発光ダイオード
素子51を載置する載置面52aと、発光ダイオード素
子51を囲繞しこの素子51から発せられる光を装置上
側に反射する反射面52bで構成されている。
On the other hand, the stem 52 is composed of a mounting surface 52a on which the light emitting diode element 51 is mounted, and a reflecting surface 52b surrounding the light emitting diode element 51 and reflecting light emitted from this element 51 to the upper side of the device. ing.

【0009】前記発光ダイオード素子51は、銀ペース
ト58を用いて基板53側でステム52の載置面52a
に固着されると共にn型側電極57とステム52が電気
的に接続される。またp型側電極56は、導電性ワイヤ
ーにて図示しない電極端子と電気的に接続されている。
In the light emitting diode element 51, the mounting surface 52a of the stem 52 on the substrate 53 side is formed using silver paste 58.
And the n-type side electrode 57 and the stem 52 are electrically connected. The p-type side electrode 56 is electrically connected to an electrode terminal (not shown) with a conductive wire.

【0010】[0010]

【発明が解決しようとする課題】斯るSiC発光ダイオ
ード素子は、n型SiC層54のうちpn接合(発光
層)に近いp型側電極56垂下の該電極面積に略比例し
た領域で発光が生じる。この発光した光のうちp型Si
C層55側へ垂直に向う光及びステム52の載置面52
a側へ垂直に向かう光は、基板53の他の一主面とp型
SiC層55の表面とで多重反射されている間に吸収さ
れるため、装置から十分な光取り出しができないといっ
た問題があった。
In such a SiC light emitting diode element, light is emitted in a region of the n-type SiC layer 54 which is substantially proportional to the electrode area of the p-type side electrode 56 near the pn junction (light-emitting layer). Occurs. Of this emitted light, p-type Si
Light that goes vertically to the C layer 55 side and the mounting surface 52 of the stem 52
The light traveling vertically to the a side is absorbed while being multiple-reflected by the other main surface of the substrate 53 and the surface of the p-type SiC layer 55, so that there is a problem that sufficient light cannot be extracted from the device. there were.

【0011】従って、本発明は発光強度の大きいSiC
発光ダイオード素子を提供することを目的とする。
Therefore, according to the present invention, SiC having high emission intensity is used.
It is an object to provide a light emitting diode device.

【0012】[0012]

【課題を解決するための手段】本発明のSiC発光ダイ
オード素子は、n型SiC基板と、該n型SiC基板上
に形成されたn型SiC層と、該n型SiC層上に形成
されたp型SiC層と、該p型SiC層上の一部に形成
されたp型側電極と、前記n型SiC基板の該p型側電
極と反対側上に形成されたn型側電極と、を備え、前記
n型SiC基板のp型側電極と反対側で且つ対向する部
分に、前記p型SiC層の表面に対して非平行な面を具
備したことを特徴とする。
A SiC light emitting diode device of the present invention comprises an n-type SiC substrate, an n-type SiC layer formed on the n-type SiC substrate, and an n-type SiC layer. a p-type SiC layer, a p-type side electrode formed on a part of the p-type SiC layer, and an n-type side electrode formed on the opposite side of the n-type SiC substrate from the p-type side electrode, And a surface non-parallel to the surface of the p-type SiC layer is provided in a portion of the n-type SiC substrate opposite to and facing the p-type side electrode.

【0013】特に、前記非平行な面は、前記p型側電極
の垂下で発光し前記p型SiC層の表面と垂直方向であ
って前記基板側に進行する光のうち少なくともその一部
の光は該非平行な面にて反射された直後の進行光路の延
長線が前記p型側電極の外側に存在するように設定され
ていることを特徴とする。
Particularly, the non-parallel surface emits light under the p-type side electrode and is at least a part of light traveling in the direction perpendicular to the surface of the p-type SiC layer and toward the substrate. Is set so that an extension line of the traveling optical path immediately after being reflected by the non-parallel surface exists outside the p-type side electrode.

【0014】[0014]

【作用】本発明の構成によれば、n型SiC基板のp型
側電極と反対側で且つ対向する部分に、p型SiC層の
表面に対して非平行な面を具備しているので、発光した
光は、基板又はp型SiC層の表面との反射回数が少な
いうちに素子外に放出される。
According to the structure of the present invention, since the surface of the n-type SiC substrate opposite to and facing the p-type side electrode is provided with a surface that is not parallel to the surface of the p-type SiC layer. The emitted light is emitted to the outside of the device while the number of reflections with the surface of the substrate or the p-type SiC layer is small.

【0015】特に、前記非平行な面が、前記p型側電極
の垂下で発光し前記p型SiC層の表面と垂直方向であ
って前記基板側に進行する光のうち少なくともその一部
の光は該非平行な面にて反射された直後の進行光路の延
長線が前記p型側電極の外側に存在するように設定され
ている場合には、前記p型側電極で遮られる光の量が少
なくなる。
In particular, at least a part of the light whose non-parallel surface emits light under the p-type side electrode and is perpendicular to the surface of the p-type SiC layer and progresses toward the substrate side. Is set so that the extension line of the traveling optical path immediately after being reflected by the non-parallel surface exists outside the p-type side electrode, the amount of light blocked by the p-type side electrode is Less.

【0016】[0016]

【実施例】本発明の第1実施例に係るSiC発光ダイオ
ード装置を図を参照して説明する。図1は本実施例のS
iC発光ダイオード装置の模式断面図である。
EXAMPLE A SiC light emitting diode device according to a first example of the present invention will be described with reference to the drawings. FIG. 1 shows S of this embodiment.
It is a schematic cross section of an iC light emitting diode device.

【0017】図中、1はSiC発光ダイオード素子であ
って、2はこの素子1を構成する上面300μm角、中
央部の厚みが200μmのn型SiC単結晶基板であっ
て、該基板2は一主面2aとその一主面2aに対して角
度θ1をなす他の一主面(非平行な面)2bを有してい
る。尚、本実施例では角度θ1は37度である。
In the figure, 1 is a SiC light emitting diode element, and 2 is an n-type SiC single crystal substrate having a 300 μm square upper surface and a central portion having a thickness of 200 μm, which constitutes this element 1. It has a main surface 2a and another main surface (non-parallel surface) 2b forming an angle θ 1 with the main surface 2a. In this embodiment, the angle θ 1 is 37 degrees.

【0018】この一主面2a上には、ドナーとなるN
(窒素)と共にp型に反転しない程度のアクセプタとな
るAl(アルミニウム)がドープされた(一定)層厚5
μmのn型SiC単結晶層(発光層)3がエピタキシャ
ル成長されている。このn型SiC単結晶層3上には、
アクセプタとなるAlがドープされた(一定)層厚5μ
mのp型SiC単結晶層4がエピタキシャル成長されて
いる。
On this one main surface 2a, N serving as a donor is formed.
(Constant) layer thickness 5 doped with Al (aluminum) that becomes an acceptor to the extent that it does not invert to p-type together with (nitrogen)
An n-type SiC single crystal layer (light emitting layer) 3 having a thickness of μm is epitaxially grown. On the n-type SiC single crystal layer 3,
Al (doped) layer thickness of 5μ
The p-type SiC single crystal layer 4 of m is epitaxially grown.

【0019】このp型SiC単結晶層4上の中央には、
上面170μm角のp型側電極5が形成されている。斯
るp型側電極5としては、厚み1μm程度のTi−Al
−Tiからなるp型側オーミック電極及び厚み1μm程
度のAu−Ti−Pdからなるボンディング電極がこの
順序で構成されてなる電極等の従来周知のものを使用で
きる。
At the center of the p-type SiC single crystal layer 4,
A p-type side electrode 5 having an upper surface of 170 μm square is formed. As such a p-type side electrode 5, Ti-Al having a thickness of about 1 μm is used.
Conventionally known electrodes such as an electrode in which a p-type ohmic electrode made of —Ti and a bonding electrode made of Au—Ti—Pd having a thickness of about 1 μm are formed in this order can be used.

【0020】また、前記n型SiC単結晶基板2の他の
一主面2b上全域には、n型側電極6が形成されてい
る。斯るn型側電極6としては、厚み1μm程度のNi
−Auからなるn型側オーミック電極及び厚み1μm程
度のAu−Ti−Pdからなるボンディング電極がこの
順序で構成されてなる電極等の従来周知のものを使用で
きる。
An n-type side electrode 6 is formed on the entire other main surface 2b of the n-type SiC single crystal substrate 2. As such an n-type side electrode 6, Ni having a thickness of about 1 μm is used.
Conventionally known electrodes such as an n-type ohmic electrode made of —Au and a bonding electrode made of Au—Ti—Pd having a thickness of about 1 μm configured in this order can be used.

【0021】7は導電性の金属製ステムであって、前記
発光ダイオード素子1を載置する載置面7aと、発光ダ
イオード素子1を囲繞しこの素子1から発せられる光を
装置上側に反射する反射面7bで構成されている。
Reference numeral 7 denotes a conductive metal stem which surrounds the mounting surface 7a on which the light emitting diode element 1 is mounted and the light emitting diode element 1 and reflects light emitted from the element 1 to the upper side of the device. It is composed of a reflecting surface 7b.

【0022】前記発光ダイオード素子1は、銀ペースト
等の導電性接着材8により基板2側でステム7の載置面
7aに固着されると共にn型側電極6とステム7が電気
的に接続される。またp型側電極5は、導電性ワイヤー
にて図示しない電極端子と電気的に接続されている。
The light emitting diode element 1 is fixed to the mounting surface 7a of the stem 7 on the substrate 2 side by a conductive adhesive material 8 such as silver paste, and the n-type side electrode 6 and the stem 7 are electrically connected. It The p-type side electrode 5 is electrically connected to an electrode terminal (not shown) with a conductive wire.

【0023】ここで、この発光ダイオード素子1の製造
を説明する。
Here, the manufacturing of the light emitting diode element 1 will be described.

【0024】まず、厚みが一定のn型SiC単結晶基板
2を準備する。次に、この基板2の一主面2a上にn型
SiC単結晶層3及びp型SiC単結晶層4をこの順序
でLPE法(液相エピタキシャル成長法)又は化学的気
相堆積法(CVD法)を用いてエピタキシャル成長させ
る。その後、この基板2の一主面2aと反対側の面を研
摩して該一主面2aに対して角度θ1をなす他の主面2
bを形成する。以下従来周知の工程を経て完成される。
First, an n-type SiC single crystal substrate 2 having a constant thickness is prepared. Next, the n-type SiC single crystal layer 3 and the p-type SiC single crystal layer 4 are arranged in this order on the main surface 2a of the substrate 2 in this order by the LPE method (liquid phase epitaxial growth method) or the chemical vapor deposition method (CVD method). ) Is used for epitaxial growth. After that, the surface opposite to the one main surface 2a of the substrate 2 is polished to form another main surface 2 forming an angle θ 1 with the one main surface 2a.
b is formed. The process is completed by the conventionally known steps.

【0025】斯る発光ダイオード素子1は、基板2の他
の一主面2bがp型SiC単結晶層4の表面(最上部層
の上面)に対して角度θ1をなす傾斜面(非平行な面)
であるので、発光した光は、基板2の他の一主面2b又
はp型SiC単結晶層4の表面(上面)との反射回数が
少ないうちに、即ち素子1内で吸収されることが少ない
うちに素子1外に放出される。この結果、斯る素子(装
置)の発光強度が大きくなる。
In the light emitting diode element 1, the other main surface 2b of the substrate 2 is an inclined surface (non-parallel) forming an angle θ 1 with the surface of the p-type SiC single crystal layer 4 (upper surface of the uppermost layer). Face)
Therefore, the emitted light may be absorbed while the number of reflections with the other main surface 2b of the substrate 2 or the surface (upper surface) of the p-type SiC single crystal layer 4 is small, that is, in the element 1. It is emitted to the outside of the element 1 while the amount is small. As a result, the emission intensity of such an element (device) increases.

【0026】更に、斯る発光ダイオード素子1は、発光
層となるn型SiC単結晶層3のうち、p型側電極5の
垂下の部分9(図中、ドットで示す部分)が主に発光部
となるが、本実施例では、特に前記他の一主面2bの角
度θ1は、前記部分9で発光し前記p型SiC単結晶層
4の表面(上面)と垂直方向であって前記基板2側に進
行する光の他の一主面2bにて反射された直後の進行光
路の延長線10、10が、前記p型側電極5の外側に存
在する(前記p型側電極5と交差しない)ように設定さ
れているので、前記p型側電極5で遮られる光の量が少
なくなる。従って、より多くの光が素子1外に放出され
るので、斯る素子(装置)の発光強度がより大きくな
る。
Further, in such a light emitting diode element 1, in the n-type SiC single crystal layer 3 serving as a light-emitting layer, a portion 9 (portion indicated by a dot in the figure) depending on the p-type side electrode 5 mainly emits light. In this embodiment, in particular, the angle θ 1 of the other main surface 2b is the direction perpendicular to the surface (upper surface) of the p-type SiC single crystal layer 4 which emits light at the portion 9 and Extension lines 10 and 10 of the traveling optical path immediately after being reflected by the other main surface 2b of the light traveling to the substrate 2 side are present outside the p-type side electrode 5 (the p-type side electrode 5 and Since they are set so as not to cross each other, the amount of light blocked by the p-type side electrode 5 is reduced. Therefore, since more light is emitted to the outside of the element 1, the emission intensity of such an element (device) becomes larger.

【0027】次に、本発明の第2実施例に係るSiC発
光ダイオード装置ついて図を用いて説明する。本実施例
において、第1実施例と異なる点はn型SiC単結晶基
板の形状であり、第1実施例と同一部分又は対応する部
分には同一符号を付してその説明は割愛する。尚、図2
(a)はこの発光ダイオード装置の構造を模式的に示す
断面図、図2(b)はこの発光ダイオード装置に用いら
れる発光ダイオード素子の下面図である。
Next, a SiC light emitting diode device according to a second embodiment of the present invention will be described with reference to the drawings. The present embodiment is different from the first embodiment in the shape of the n-type SiC single crystal substrate, and the same portions or corresponding portions as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted. Incidentally, FIG.
FIG. 2A is a sectional view schematically showing the structure of this light emitting diode device, and FIG. 2B is a bottom view of a light emitting diode element used in this light emitting diode device.

【0028】図2中、11は発光ダイオード素子であっ
て、12はこの素子11を構成する厚みLが200μ
m、上面300μm角のn型SiC単結晶基板である。
この基板12の一主面12aに対向する他の一主面12
bには、p型側電極5の対向する部分を含んでこの電極
5の幅より大きな幅、例えば幅180μmのV字型スト
ライプ溝13が形成されている。このV字型ストライプ
溝13は、そのV字型を構成する傾斜面(非平行な面)
13a、13aが、前記の基板12の一主面12aに対
してそれぞれ角度θ2を有している。本実施例の場合に
は、この角度θ2は37°(度)である。
In FIG. 2, reference numeral 11 denotes a light emitting diode element, and 12 has a thickness L constituting the element 11 of 200 μm.
m is an n-type SiC single crystal substrate having an upper surface of 300 μm square.
The other main surface 12 opposite to the main surface 12a of the substrate 12
In b, a V-shaped stripe groove 13 having a width larger than the width of the p-type side electrode 5 including the facing portion, for example, 180 μm, is formed. The V-shaped stripe groove 13 is an inclined surface (non-parallel surface) forming the V-shape.
13 a and 13 a form an angle θ 2 with respect to the one main surface 12 a of the substrate 12, respectively. In the case of the present embodiment, this angle θ 2 is 37 ° (degrees).

【0029】前記V字型ストライプ溝13上を含み他の
一主面12b上の全域には、第1実施例と同様のn型側
電極14が形成されている。
An n-type side electrode 14 similar to that of the first embodiment is formed on the entire other main surface 12b including the V-shaped stripe groove 13.

【0030】この発光ダイオード素子11は、第1実施
例と同様に銀ペースト等の導電性接着材8を用いて基板
12側でステム7の載置面7aに固着されると共にn型
側電極14とステム7が電気的に接続される。またp型
側電極5は、導電性ワイヤーにて図示しない電極端子と
電気的に接続されている。
This light emitting diode element 11 is fixed to the mounting surface 7a of the stem 7 on the substrate 12 side by using a conductive adhesive material 8 such as silver paste as in the first embodiment, and the n-type side electrode 14 is attached. And the stem 7 are electrically connected. The p-type side electrode 5 is electrically connected to an electrode terminal (not shown) with a conductive wire.

【0031】ここで、この発光ダイオード素子11の製
造を説明する。
Here, the manufacturing of the light emitting diode element 11 will be described.

【0032】まず、厚みが一定のn型SiC単結晶基板
12を準備する。次に、この基板12の一主面12a上
にn型SiC単結晶層3及びp型SiC単結晶層4をこ
の順序でLPE法(液相エピタキシャル成長法)又は化
学的気相堆積法)を用いてエピタキシャル成長させる。
その後、この基板12の一主面12aと反対側の面を研
摩して所望の基板厚みとすると共に一主面12aと平行
な他の一主面12bを作成する。しかる後、この他の一
主面12bにV字型刃装着のダイシングソーを用いてV
字型ストライプ溝13を形成する。最後に、従来周知の
方法でp型側、n型側電極5、14を作成する。
First, an n-type SiC single crystal substrate 12 having a constant thickness is prepared. Next, the n-type SiC single crystal layer 3 and the p-type SiC single crystal layer 4 are formed on the one main surface 12a of the substrate 12 in this order by the LPE method (liquid phase epitaxial growth method) or the chemical vapor deposition method). Epitaxial growth.
Then, the surface opposite to the one main surface 12a of the substrate 12 is polished to a desired substrate thickness and another main surface 12b parallel to the one main surface 12a is formed. After that, a V-shaped blade-mounted dicing saw is used for V on the other main surface 12b.
The V-shaped stripe groove 13 is formed. Finally, the p-type side and n-type side electrodes 5 and 14 are formed by a conventionally known method.

【0033】斯る発光ダイオード素子11でも、p型S
iC単結晶層4の表面(最上部層の上面)に対して傾斜
面13a、13aが角度θ2をなすので、発光した光
は、傾斜面13a、13aとp型SiC単結晶層4の表
面(上面)との反射回数が少ないうちに、即ち素子内で
の吸収が少ないうちに素子11外に放出される。この結
果、斯る素子(装置)の発光強度が大きくなる。
Even in such a light emitting diode element 11, the p-type S
Since the inclined surfaces 13a, 13a form an angle θ 2 with respect to the surface of the iC single crystal layer 4 (the upper surface of the uppermost layer), the emitted light is emitted from the inclined surfaces 13a, 13a and the surface of the p-type SiC single crystal layer 4. The light is emitted to the outside of the element 11 while the number of reflections with the (top surface) is small, that is, while the absorption inside the element is small. As a result, the emission intensity of such an element (device) increases.

【0034】また、斯る発光ダイオード素子11では、
発光層となるn型SiC単結晶層3のうち、p型側電極
5の垂下の部分9(図中、ドットで示す)が主に発光部
となるが、本実施例では、前記傾斜面13a、13aの
角度θ2が、前記部分9で発光し前記p型SiC単結晶
層4の表面(上面)と垂直方向であって前記基板12側
に進行する光のうち殆どの光の傾斜面13a、13aに
て反射された直後の進行光路の延長線20、20が、前
記p型側電極5の外側に存在する(前記p型側電極5と
交差しない)ように設定されているので、前記p型側電
極5で遮られる光の量が少なくなる。従って、斯る装置
(素子)の発光強度はより大きくなる。
Further, in such a light emitting diode element 11,
Of the n-type SiC single crystal layer 3 serving as a light-emitting layer, a hanging portion 9 (indicated by a dot in the figure) of the p-type side electrode 5 mainly serves as a light-emitting portion, but in the present embodiment, the inclined surface 13a is used. , 13a, the angle θ 2 of which is most of the light that is emitted from the portion 9 and is perpendicular to the surface (upper surface) of the p-type SiC single crystal layer 4 and that travels toward the substrate 12 side. , 13a, the extension lines 20 and 20 of the traveling optical path immediately after being reflected by the light source 13a and 13a are set to be present outside the p-type side electrode 5 (not intersecting with the p-type side electrode 5). The amount of light blocked by the p-type side electrode 5 is reduced. Therefore, the emission intensity of such a device (element) becomes higher.

【0035】次に、本発明の第3実施例に係るSiC発
光ダイオード装置ついて図を用いて説明する。本実施例
において、第2実施例と異なる点はV字型ストライプ溝
上にn型側電極を設けないでn型SiC基板に比べて低
い屈折率を有する低屈折率材料を設けた点であり、第2
実施例と同一部分及び対応する部分には同一符号を付し
てその説明は割愛する。尚、図3(a)はこの発光ダイ
オード装置の構造を模式的に示す断面図、図3(b)は
この発光ダイオード装置に用いられる発光ダイオード素
子の下面図である。
Next, a SiC light emitting diode device according to a third embodiment of the present invention will be described with reference to the drawings. This example differs from the second example in that an n-type side electrode is not provided on the V-shaped stripe groove and a low refractive index material having a lower refractive index than that of the n-type SiC substrate is provided. Second
The same parts and corresponding parts as those of the embodiment are designated by the same reference numerals and the description thereof will be omitted. 3A is a sectional view schematically showing the structure of the light emitting diode device, and FIG. 3B is a bottom view of the light emitting diode element used in the light emitting diode device.

【0036】図中、n型SiC単結晶基板12の一主面
12aに対向する他の主面12bに形成されたV字型ス
トライプ溝13内には、発光した光に対する屈折率にお
いて基板12の屈折率n1より小さな屈折率n2(n1
2)を有するエポキシ樹脂等の透光性の低屈折率材料
21が充填されている。
In the figure, in a V-shaped stripe groove 13 formed on another main surface 12b opposite to one main surface 12a of the n-type SiC single crystal substrate 12, the substrate 12 has a refractive index with respect to emitted light. Refractive index n 2 (n 1 > less than refractive index n 1
A light-transmitting low refractive index material 21 such as an epoxy resin having n 2 ) is filled.

【0037】前記V字型ストライプ溝13が形成されて
いない他の主面12b上には、第1実施例と同様のn型
側電極24が形成されている。この発光ダイオード素子
11は、第2実施例と同様に銀ペースト等の導電性接着
材28を用いて基板12側でステム7の載置面7aに固
着されると共にn型側電極24とステム7が電気的に接
続される。またp型側電極5は、導電性ワイヤーにて図
示しない電極端子と電気的に接続されている。
On the other main surface 12b where the V-shaped stripe groove 13 is not formed, an n-type side electrode 24 similar to that of the first embodiment is formed. This light emitting diode element 11 is fixed to the mounting surface 7a of the stem 7 on the substrate 12 side using a conductive adhesive material 28 such as silver paste as in the second embodiment, and the n-type side electrode 24 and the stem 7 are attached. Are electrically connected. The p-type side electrode 5 is electrically connected to an electrode terminal (not shown) with a conductive wire.

【0038】図4に、青色光に対する屈折率n1が2.
6のSiC単結晶下面に青色光に対する屈折率n2の透
光性低屈折率層を設けた場合に、青色光の入射光がSi
C単結晶から透光性屈折率層へ入射角θi(度)で入射
した後、低屈折率層へ角度θtで透過する透過光以外に
生じる界面にて角度θiで反射する反射光の前記入射光
に対する反射光の割合(反射強度)を示す。
In FIG. 4, the refractive index n 1 for blue light is 2.
When a transparent low refractive index layer having a refractive index n 2 for blue light is provided on the lower surface of the SiC single crystal of No. 6, the incident light of blue light is Si
Reflected light reflected at an angle θ i at an interface other than transmitted light that is incident on the light-transmitting refractive index layer from the C single crystal at the incident angle θ i (degrees) and then is transmitted to the low refractive index layer at the angle θ t. The ratio (reflected intensity) of the reflected light to the incident light is shown.

【0039】この図4から判るように、前記入射角θi
が大きくなってある角度を越えると急激に反射強度が大
きくなり、更に角度が大きくなると全反射となる。例え
ば屈折率n2 が1.25の場合には入射角θiが28°
(度)以上になれば、前反射(即ち透過光が発生せずに
反射光のみ)となる。また、屈折率n2が1.54の場
合には入射角θiが37°以上にすれば全反射となる。
As can be seen from FIG. 4, the incident angle θ i
When the angle exceeds a certain angle, the reflection intensity rapidly increases, and when the angle increases, total reflection occurs. For example, when the refractive index n 2 is 1.25, the incident angle θ i is 28 °.
If it is (degrees) or more, it becomes the pre-reflection (that is, only the reflected light without generating the transmitted light). When the refractive index n 2 is 1.54, total reflection occurs when the incident angle θ i is 37 ° or more.

【0040】従って、斯る発光ダイオード素子11が、
青色光を発光し、且つ素子11を構成するn型SiC単
結晶基板12、n型SiC単結晶層3、及びp型SiC
単結晶層4が6H型SiC単結晶からなる場合には、前
記屈折率n1(n型SiC単結晶基板12の屈折率)は
2.6程度であるので、角度θ2を37°とした本実施
例では、低屈折率材料21として、屈折率n2が1.5
4以下望ましくは1以上のエポキシ樹脂等の材料を選択
すれば、発光した光は透光性低屈折率材料21を透過す
ることなく傾斜面13a、13aにて全反射されるの
で、第2実施例に比べても素子(装置)の発光強度は顕
著に大きくなる。
Therefore, the light emitting diode element 11 is
An n-type SiC single crystal substrate 12, which emits blue light and constitutes an element 11, an n-type SiC single crystal layer 3, and a p-type SiC
When the single crystal layer 4 is made of 6H-type SiC single crystal, the refractive index n 1 (refractive index of the n-type SiC single-crystal substrate 12) is about 2.6, so the angle θ 2 is set to 37 °. In this embodiment, the low refractive index material 21 has a refractive index n 2 of 1.5.
If the material is 4 or less, preferably 1 or more, such as epoxy resin, the emitted light is totally reflected by the inclined surfaces 13a and 13a without passing through the translucent low refractive index material 21, so the second embodiment The emission intensity of the element (device) becomes significantly higher than that of the example.

【0041】尚、本発明は、前記各実施例に限定される
ことなく、n型SiC基板のp型側電極と反対側で且つ
対向する部分に、p型SiC層の表面(上面)に対して
非平行な面を具備すれば、基板又はp型SiC層の表面
(上面)との反射回数が少なくなるので、素子外に放出
される光の量が多くできる。例えば、上記第2実施例で
用いたV字型ストライプ溝13に代えてU字型ストライ
プ溝(U字型面)、又はp型側電極の面積より大きな面
積の開口部を有する円錐状面(すりばち状面)等を設け
てもよい。
The present invention is not limited to the above-described embodiments, but is applied to the surface (upper surface) of the p-type SiC layer at a portion of the n-type SiC substrate opposite to and facing the p-type side electrode. If such a non-parallel surface is provided, the number of reflections with respect to the surface (upper surface) of the substrate or the p-type SiC layer decreases, so that the amount of light emitted outside the device can be increased. For example, instead of the V-shaped stripe groove 13 used in the second embodiment, a U-shaped stripe groove (U-shaped surface), or a conical surface having an opening having an area larger than the area of the p-type side electrode ( It is also possible to provide a skirt-like surface).

【0042】更に、発光ダイオード素子外には発光した
光が全方向に均一に放射されるのが、装置から放出され
る光が片寄らないので好ましい。従って、p型SiC層
の表面に対して非平行な面は、発光した光が素子外に均
一に放射されるようにp型側電極に対して対称に設ける
のがよい。この点から、第2実施例で用いた発光ダイオ
ード素子11は、第1実施例で用いた発光ダイオード素
子1より望ましい。
Further, it is preferable that the emitted light is uniformly emitted in all directions to the outside of the light emitting diode element because the light emitted from the device is not biased. Therefore, the plane that is not parallel to the surface of the p-type SiC layer is preferably provided symmetrically with respect to the p-type side electrode so that the emitted light can be uniformly emitted to the outside of the device. From this point, the light emitting diode element 11 used in the second embodiment is more preferable than the light emitting diode element 1 used in the first embodiment.

【0043】更に、非平行な面で全反射を行うために非
平行な面をn型SiC基板より低い屈折率の低屈折率材
料で覆う場合には、n型SiC基板の屈折率n1はその
基板の結晶多形、発光ダイオード素子の発光する波長領
域等によって変わるので、p型SiC層の表面(上面)
と角度θiをなす非平行な面を覆う低屈折率材料の屈折
率n2は、以下に示すスネルの式において、 n1/n2=sinθt/sinθi θtを90度として得られる次式より算出されたn2以下
と選択すればよい。
Further, when the non-parallel surface is covered with a low-refractive index material having a lower refractive index than the n-type SiC substrate for total reflection on the non-parallel surface, the refractive index n 1 of the n-type SiC substrate is The surface (upper surface) of the p-type SiC layer changes because it depends on the crystalline polymorph of the substrate, the wavelength range of light emitted by the light emitting diode element, and the like.
The refractive index n 2 of the low refractive index material that covers the non-parallel surface that forms an angle θ i with is obtained by n 1 / n 2 = sin θ t / sin θ i θ t as 90 degrees in the Snell's equation shown below. It may be selected as n 2 or less calculated by the following equation.

【0044】n2=n1・sinθi N 2 = n 1 · sin θ i

【0045】[0045]

【発明の効果】本発明のSiC発光ダイオード素子は、
n型SiC基板と、該n型SiC基板上に形成されたn
型SiC層と、該n型SiC層上に形成されこのn型S
iC層とでpn接合を形成するp型SiC層と、該p型
SiC層上の一部に形成されたp型側電極と、前記n型
SiC基板の該p型側電極と反対側上に形成されたn型
側電極と、を備え、前記n型SiC基板のp型側電極と
反対側で且つ対向する部分に、前記p型SiC層の表面
に対して非平行な面を具備しているので、従来のSiC
発光ダイオード素子に比べて、発光した光は基板とp型
SiC層の表面との反射回数が少ないうちに、即ち素子
内で吸収されることが少ないうちに素子外に放出され
る。従って従来の素子に比べて十分な光が素子外に放出
される。この結果、斯る素子の発光強度が従来のものに
比べて大きくなるので、これをステム等に組み込んだ装
置も発光強度が大きくなる。
The SiC light emitting diode element of the present invention is
n-type SiC substrate and n formed on the n-type SiC substrate
-Type SiC layer and the n-type S layer formed on the n-type SiC layer
A p-type SiC layer forming a pn junction with the iC layer, a p-type side electrode formed on a part of the p-type SiC layer, and a side of the n-type SiC substrate opposite to the p-type side electrode. And a surface not parallel to the surface of the p-type SiC layer at a portion of the n-type SiC substrate opposite to and facing the p-type side electrode. Existing SiC
Compared with the light emitting diode element, the emitted light is emitted to the outside of the element while the number of reflections between the substrate and the surface of the p-type SiC layer is small, that is, while being absorbed in the element. Therefore, a sufficient amount of light is emitted outside the device as compared with the conventional device. As a result, the light emission intensity of such an element becomes higher than that of the conventional one, so that the device incorporating this element also has a high light emission intensity.

【0046】特に、非平行な面は、前記p型側電極の垂
下で発光し前記p型SiC層の表面と垂直方向であって
前記基板側に進行する光のうち少なくともその一部の光
は該反射面にて反射された直後の進行光路の延長線が前
記p型側電極の外側に存在するように設定されている場
合には、前記p型側電極に遮られる発光した光の量を小
さくできるので、斯る素子はより発光量が大きくなる。
Particularly, the non-parallel surface emits light under the p-type side electrode and is at least a part of the light which is perpendicular to the surface of the p-type SiC layer and travels to the substrate side. When the extension line of the traveling optical path immediately after being reflected by the reflecting surface is set to exist outside the p-type side electrode, the amount of emitted light blocked by the p-type side electrode is set as follows. Since it can be made small, the amount of light emitted from such an element becomes larger.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例に係るSiC発光ダイオー
ド装置を模式的に示す断面図である。
FIG. 1 is a sectional view schematically showing a SiC light emitting diode device according to a first embodiment of the present invention.

【図2】本発明の第2実施例に係るSiC発光ダイオー
ド装置を模式的に示す図である。
FIG. 2 is a diagram schematically showing a SiC light emitting diode device according to a second embodiment of the present invention.

【図3】本発明の第3実施例に係るSiC発光ダイオー
ド装置を模式的に示す図である。
FIG. 3 is a diagram schematically showing a SiC light emitting diode device according to a third embodiment of the present invention.

【図4】SiC結晶の下面に低屈折率層を設けた場合の
反射強度と入射角度の関係を示す図である。
FIG. 4 is a diagram showing a relationship between a reflection intensity and an incident angle when a low refractive index layer is provided on a lower surface of a SiC crystal.

【図5】従来のSiC発光ダイオード装置を模式的に示
す断面図である。
FIG. 5 is a sectional view schematically showing a conventional SiC light emitting diode device.

【符号の説明】[Explanation of symbols]

2 n型SiC単結晶基板 2b 他の一主面(非平行な面) 3 n型SiC層 4 p型SiC層 5 p型側電極 12 n型SiC単結晶基板 13 V字型ストライプ溝 13a 傾斜面(非平行な面) 21 低屈折率材料 2 n-type SiC single crystal substrate 2b Other main surface (non-parallel surface) 3 n-type SiC layer 4 p-type SiC layer 5 p-type side electrode 12 n-type SiC single-crystal substrate 13 V-shaped stripe groove 13a inclined surface (Non-parallel surface) 21 Low refractive index material

───────────────────────────────────────────────────── フロントページの続き (72)発明者 鈴木 順子 大阪府守口市京阪本通2丁目18番地 三洋 電機株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Junko Suzuki 18-2 Keihan Hondori, Moriguchi City, Osaka Prefecture Sanyo Electric Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 n型炭化ケイ素基板と、該n型炭化ケイ
素基板上に形成されたn型炭化ケイ素層と、該n型炭化
ケイ素層上に形成されたp型炭化ケイ素層と、該p型炭
化ケイ素層上の一部に形成されたp型側電極と、前記n
型炭化ケイ素基板の該p型側電極と反対側上に形成され
たn型側電極と、を備え、前記n型炭化ケイ素基板のp
型側電極と反対側で且つ対向する部分に、前記p型炭化
ケイ素層の表面に対して非平行な面を具備したことを特
徴とする炭化ケイ素発光ダイオード素子。
1. An n-type silicon carbide substrate, an n-type silicon carbide layer formed on the n-type silicon carbide substrate, a p-type silicon carbide layer formed on the n-type silicon carbide layer, and the p-type silicon carbide layer. A p-type side electrode formed on a part of the n-type silicon carbide layer, and n.
An n-type side electrode formed on the opposite side of the p-type silicon carbide substrate from the p-type silicon carbide substrate.
A silicon carbide light emitting diode element comprising a surface that is non-parallel to the surface of the p-type silicon carbide layer at a portion opposite to and opposite to the mold side electrode.
【請求項2】 前記非平行な面は、前記p型側電極の垂
下で発光し前記p型炭化ケイ素層の表面と垂直方向であ
って前記基板側に進行する光のうち少なくともその一部
の光は該非平行な面にて反射された直後の進行光路の延
長線が前記p型側電極の外側に存在するように設定され
ていることを特徴とする請求項1記載の炭化ケイ素発光
ダイオード素子。
2. The non-parallel surface is at least a part of light that is emitted from the p-type side electrode depending on a direction perpendicular to the surface of the p-type silicon carbide layer and proceeds to the substrate side. 2. The silicon carbide light emitting diode element according to claim 1, wherein the extension line of the traveling optical path immediately after being reflected by the non-parallel surfaces is set outside the p-type side electrode. .
JP16688993A 1993-07-06 1993-07-06 Silicon carbide light emitting diode device Pending JPH0722648A (en)

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JP16688993A JPH0722648A (en) 1993-07-06 1993-07-06 Silicon carbide light emitting diode device

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JPH0722648A true JPH0722648A (en) 1995-01-24

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JP2005019608A (en) * 2003-06-25 2005-01-20 Matsushita Electric Works Ltd Semiconductor light emitting device
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US7283736B2 (en) 2004-01-15 2007-10-16 Ricoh Company, Ltd. Imaging apparatus and imaging method
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US8350284B2 (en) 2008-09-30 2013-01-08 Toyoda Gosei Co., Ltd. Light emitting element and light emitting device
US8653546B2 (en) 2009-10-06 2014-02-18 Epistar Corporation Light-emitting device having a ramp
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