JPH07270465A - Display device inspection method and inspection device - Google Patents

Abstract

(57) [Abstract] [Purpose] To realize an inspection device that improves the inspection efficiency of a display device. [Structure] The inspection substrate 2a to be brought into contact with the electrode terminal portion 12a of the display device 11 is always in contact with one electrode terminal p even if the inspection substrate 2a is displaced. In addition, a plurality of inspection terminals are arranged at a ratio of at least three to one electrode terminal. Inspection board 2
a is connected to the connection detection circuit 3 via the connection switching circuit 5, and the conduction / non-conduction of the U-link formed by the two terminals is individually discriminated, and the contact state of the electrode terminal pair inspection terminal is determined. Confirmed in advance. The inspection board 2a is a signal output circuit 4
Then, the operation signal for pass / fail judgment is applied to the display device 11 through the inspection terminal. According to the present invention, the contact between the inspection terminal and the electrode terminal p is ensured and the contact state thereof is confirmed in advance, so that the inspection efficiency is improved.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a display device inspection method and an inspection device which are preferably used for inspecting a display state of a display device such as a liquid crystal display panel. The present invention relates to a display device inspection method and an inspection device which are preferably implemented when inspecting a liquid crystal display panel in which a plurality of electrode terminals are arranged.

[0002]

2. Description of the Related Art For example, in a liquid crystal display panel, a plurality of electrode terminals are arranged at regular intervals in the peripheral portion of a panel substrate, and lead lines from a plurality of scanning electrodes (X electrodes) and a plurality of data electrodes (Y electrodes). ) And a lead wire from () are individually connected to the electrode terminals. When inspecting the quality of operation of such a liquid crystal display panel, an inspection substrate on which wiring patterns and probes are formed at the same pitch as the arrangement of the electrode terminals is brought into contact with the electrode terminals, and an operation signal is transmitted to the probe. It is input to each electrode via the display and displayed, and the quality of the operation is determined based on the display state.

A typical conventional technique of an inspection substrate used for inspecting such a display device is disclosed in, for example, Japanese Patent Application Laid-Open No. 4-297876. According to this, the connection end side is electrically connected to the wiring means of the flexible wiring board on which the wiring means arranged at the same pitch as the electrodes of the display panel are formed, and the probe is sandwiched together with the flexible wiring board. Insert the tip of the probe attached to the probe card part of the film attached according to the electrode to be measured into a laminated structure, and through the elastic body to give the tip of the probe a spring property as described above. A probe having a laminated structure is integrally attached to a probe mounting body so that electrical contact can be simultaneously made with respect to all electrodes of the display panel.

[0004]

In the prior art, as described above, the inspection board in which the probes are arranged at the same pitch as the pitch of the electrode terminals of the display panel is used, and the probes of the inspection board are connected to the terminals of the display panel. Is in contact with.

However, in such an inspection board,
There is a one-to-one correspondence between the electrode terminals of the display panel and the probes of the inspection board, so if there is a displacement between them, the electrode terminals and the probe will be disconnected, or there will be sufficient contact due to insufficient contact pressure. There is a problem that the state cannot be obtained. Therefore, even if a signal is given from the inspection device side to the display panel side, a desired operation state cannot be obtained, and it is determined that the display panel is in operation failure even though there is no abnormality. The above-mentioned misalignment and contact failure due to insufficient contact pressure of the terminals cannot be detected, and there is a problem that inspection efficiency and product yield are reduced. Particularly in recent years, due to the increase in display capacity, the terminal arrangement of liquid crystal display panels and the like has been steadily becoming finer, and a drastic measure is required for the above-mentioned contact between terminals.

An object of the present invention is to significantly reduce the contact failure between the display device and the inspection substrate and detect the contact state between the two in advance to improve the inspection efficiency of the display device. A method and an inspection device are provided.

[0007]

SUMMARY OF THE INVENTION The present invention provides a method for inspecting a display device having a plurality of electrode terminals arranged at an end thereof, wherein the plurality of inspection terminals are at least three with respect to one electrode terminal. Of the inspection substrate, the inspection substrate is attached to the display device so that the inspection terminal and the electrode terminal face each other, and the inspection substrate adjacent to the inspection substrate is prepared. By checking the conduction / non-conduction state between the terminals, the contact state between the electrode terminal and the inspection terminal is determined, and based on the determination result, an operation signal is applied to the inspection terminal to drive the display device, A display device inspection method is characterized by inspecting whether the operation of the display device is good or bad.

Further, according to the present invention, in an inspection device for a display device, which applies an operation signal to a plurality of electrode terminals of the display device to inspect whether or not the operation of the display device is good, a plurality of inspection terminals are provided on one electrode terminal. On the other hand, at least three inspection substrates are arranged, a signal output unit for outputting the operation signal, and a determination for individually determining the contact state between the electrode terminal and the inspection terminal for each terminal. An inspection apparatus for a display device, comprising: a means and a switching connection means for connecting one of the determination means and the signal output means to the inspection substrate.

Further, the present invention is characterized in that the discrimination means discriminates a conduction / non-conduction state between adjacent inspection terminals of the inspection substrate.

Further, the present invention is characterized in that the switching connection means selectively supplies the operation signal from the signal output means to the inspection terminal based on the determination result of the determination means.

[0011]

According to the present invention, the inspection substrate is first attached to the end portion of the display device. On the inspection board, a plurality of inspection terminals are arranged at a ratio of at least three to one electrode terminal of the display device. Therefore, at least two inspection terminals come into contact with one electrode terminal without performing accurate positioning at the time of bonding. By checking the conduction / non-conduction state of the adjacent inspection terminals, it is possible to determine which inspection terminal is in contact with the electrode terminal and which inspection terminal has a poor contact. Based on the determination result, an operation signal is applied to the inspection terminal in contact with the electrode terminal to drive the display device to inspect the quality. Since no operation signal is applied to the contact failure inspection terminal, it is not possible to judge that the display apparatus is in operation failure, despite the contact failure of the terminal as in the conventional case.

In the inspection device for a display device according to the present invention, an inspection board on which an inspection terminal that comes into contact with an electrode terminal of the display device is arranged, and a contact state of the inspection terminal are individually determined for each terminal. Means, a signal output means for outputting an operation signal for judging the quality of the operation of the display device, and a switching connection means for selecting one of the judgment means or the signal output means to connect to the inspection board. .

In the inspection, the inspection substrate is attached to the display device so that the electrode terminals of the display device and the inspection terminals face each other, and the discriminating means and the inspection substrate are first connected via the switching connection means. Then, the contact state between the adjacent inspection terminals is detected.

The number of inspection terminals is set at a ratio of at least 3 to one electrode terminal. Even if there is a displacement between the electrode terminal and the inspection terminal due to this,
At least two adjacent inspection terminals are always in contact with one electrode terminal. Therefore, the probability of contact failure occurring between the inspection terminal and the electrode terminal in the inspection is reduced.

After the contact state between the terminals is discriminated by the discriminating means,
The switching connection means switches and connects the inspection board to the signal output means. An operation signal from the signal output means is given to the display device through the inspection terminal and the electrode terminal, and the quality of the operation of the display device is determined. Since the contact state between the inspection terminal and the electrode terminal has been tested, it is easy to determine whether the display device malfunction is due to a false contact defect due to misalignment or a true malfunction due to the display device side. Therefore, the inspection efficiency and the inspection accuracy are improved.

According to the invention, the contact state between the electrode terminal and the inspection terminal is determined by checking the conduction / non-conduction state between the adjacent inspection terminals of the inspection substrate. As described above, at least two inspection terminals are in contact with the electrode terminals. Therefore, if the contact state is sufficient, the conductive state can be detected at a predetermined rate by sequentially examining the adjacent inspection terminals. In this way, the contact state between the electrode terminal and the inspection terminal can be determined with a relatively simple configuration.

Further, according to the present invention, the operation signal is selectively supplied to the inspection terminal based on the determination result of the contact state. Therefore, when it is determined that there is poor contact, the inspection substrate is attached again, or if there is no problem in the display state, the inspection is performed as it is. Therefore, erroneous inspection can be prevented.

[0018]

1 is a block diagram showing the configuration of an inspection apparatus 1 for a display device according to an embodiment of the present invention. Inspection device 1
Includes inspection substrates 2a and 2b, a connection detection circuit 3 that is a determination unit, a signal output circuit 4 that is a signal output unit, and a switching connection circuit 5 that is a switching connection unit. Inspection board 2
a and 2b through the inspection cables Lx and Ly, the connection detection circuit 3 through the connection cable Lc, and the signal output circuit 4
Are respectively connected to the switching connection circuit 5 via the output cables Ld and Le.

The liquid crystal display panel 11 has a plurality of scanning electrodes x1, x2, ..., X (m-1), xm and a plurality of data electrodes y1, y2, ..., Y (n-1), yn. The electrodes are arranged so as to be orthogonal to each other, and each electrode has an electrode terminal portion 12a,
The scanning electrode terminals p1, p2, ...
p (m-1), pm and the data electrode terminals q1, q2,
, Q (n-1), qn are individually connected.

The inspection substrates 2a and 2b are provided corresponding to the electrode terminal portions 12a and 12b, and are a plurality of counterpart electrode terminals p1, p2, p3, ..., q1, q2, q3.
A plurality of inspection terminals that come into contact with (... uses reference symbols p and q when collectively referred to) are arranged at predetermined intervals.
The inspection terminal will be described later.

The connection detection circuit 3 includes the inspection substrate 2a,
The conduction / non-conduction state between the adjacent inspection terminals of 2b is determined. The signal output circuit 4 outputs an operation signal for determining the quality of the liquid crystal display panel 11 to the inspection substrates 2a and 2b.
It is applied to each electrode of the liquid crystal display panel 11 via. The switching connection circuit 5 switches the inspection boards 2a and 2b to the connection detection circuit 3 or the signal output circuit 4, and connects the individual electrode terminals p and q to the connection detection circuit 3 or the signal output circuit 4. A CPU (central processing unit) 6 performs control operation such as switching to which side and connecting each electrode terminal p, q to which circuit.

The memory 7 stores the connection state between the individual electrode terminals p and q and the individual inspection terminals determined by the connection detection circuit 3. When the inspection boards 2a, 2b are switched to the signal output circuit 4 side, the CPU 6 switches based on the stored data so that each output terminal of the signal output circuit 4 and the corresponding electrode terminal p, q are connected. The connection circuit 5 is controlled. Signal output circuit 4, switching connection circuit 5, CP
U6 and memory 7 are connected by bus lines 8 and 9, respectively.

In FIG. 1, the electrode terminal portion 1 of the display panel 11 is shown.
One inspection board 2a, 2b corresponding to 2a, 12b
However, according to the scale and shape of the number of terminals of the electrode terminal portions 12a and 12b, the inspection substrates 2a and 2b are replaced with a plurality of inspection substrates 2a1 as shown in FIG.
2a2; 2b1, 2b2 and the like may be appropriately divided and provided.

FIG. 3 is a diagram in which the connection relationship between the inspection boards 2a and 2b and the electrode terminal portions 12a and 12b is partially omitted. What should be noted in the present invention is the inspection substrate 2
As shown in FIG. 3, the inspection terminals arranged on a and 2b are arranged at a constant pitch at a rate of at least three for each one electrode terminal p and q. It is set up. Thereby, the electrode terminal portion 12a and the inspection substrate 2a, and the electrode terminal portion 12b and the inspection substrate 2
When they are respectively affixed to and contacted with b, a pair of two adjacent inspection terminals always contacts with the other electrode terminal.

In FIG. 3, portions corresponding to those in FIG. 1 above are designated by the same reference numerals. Electrode terminal portions 12a, 12b
The inspection boards 2a and 2b that come into contact with the inspection cable L
A plurality of inspection terminals r provided at one end of x and Ly
, R1, r2, r3, ...; S1, s2, s3, .. (reference numerals r and s are used for generic names) are arranged at regular intervals. An inspection lead wire La is provided on each of the inspection terminals r and s.
1, La2, La3, ...; Lb1, Lb2, Lb3 ,.
Are individually connected. The other ends of the inspection cables Lx and Ly are connected to the switching connection circuit 5 shown in FIG.

FIG. 4 shows the electrode terminal portion 12a and the inspection substrate 2
It is a figure which shows the correspondence with a, and expands and shows a part of above-mentioned FIG. Although only a part of the electrode terminal portion 12a and the inspection substrate 2a is shown in FIG. 4, the inspection substrate 2b and the electrode terminal portion 12b have the same structure. In the electrode terminal portion 12a, electrode terminals p1 to pm having a width of 80 μm are arranged at a pitch w1 (for example, 120 μm). On the other hand, the inspection board 2a has a pitch w2 of 1/3 (for example, 40 μm) of the pitch w1 and a total of α inspection terminals r.
1 to rα are provided.

As described above, in this embodiment, at least three inspection terminals r (inspection terminals s) are provided for one electrode terminal p (electrode terminal q). Even when the positions of both 12a and the inspection substrate 2a are displaced in the direction indicated by the arrow A when the inspection substrate 2a is brought into contact with the inspection substrate 2a, for example, for the electrode terminal p1, the inspection terminals r1, r2, or r
2, r3, or r3, r4, a positional relationship is ensured in which a pair of adjacent inspection terminals always contacts one electrode terminal.

As a result, one electrode terminal p and two inspection lead wires La and La (or electrode terminal q and two inspection lead wires Lb and Lb) always form one U-link circuit. To be done. Therefore, according to the present invention, the probability of occurrence of contact failure due to the positional deviation is significantly reduced, and the pretest posture is reliably arranged. The ratio of the above-mentioned terminal for inspection to the electrode terminal may be 4: 1 or 5: 1 or the like in conformity with the terminal pitch or the terminal shape.

Further, it should be noted in the present invention that prior to inspecting the operation of the display panel 11, the connection detecting circuit 3 conducts / disconnects between adjacent inspection terminals via the U-link circuit. Is to determine. The determination operation of the conduction / non-conduction state will be described with reference to FIG. 5 below. By previously determining the conduction / non-conduction state between the electrode terminals p and q and the inspection terminals r and s, a useless signal is obtained. It is possible to avoid the application of electricity and improve the inspection efficiency.

FIG. 5 is a circuit diagram showing a connection between the connection detection circuit 3 and the switching connection circuit 5 with a part thereof omitted. Figure 5
Then, the electrode terminal portions 12a and 12b are shown arranged in the same row,
The parts corresponding to those in FIG. 3 above are designated by the same reference numerals. The switching connection circuit 5 includes α switches Ka1 to Kaα (the reference numeral Ka is used when collectively referred to) of the same number as the inspection lead wire La, and β switches Kb1 to Kbβ of the same number as the inspection lead wire Lb. (Refer to Kb when collectively referred to
Is used) and. The switches Ka and Kb are realized by, for example, semiconductor switching elements. The switching connection circuit 5 further includes a plurality of other switches and multiplexer circuits (not shown), which will be described later with reference to FIGS. 6 and 7.

The test terminals r1, r2, r3, ... Are individually connected to the common contacts c1, c2, c3, ... Of the switch Ka via test lead wires La1, La2, La3 ,. . The inspection terminals q1, q2, q3, ... Are individually connected to the common contacts f1, f2, f3, ... Of the switch Kb via the inspection lead wires Lb1, Lb2, Lb3 ,.

In FIG. 5, the switches Ka and Kb have the same configuration, and the switch Ka will be described. The switches Ka1, Ka2, Ka3, ... Are all normally open contacts a1, a2, a3, ... For the common contacts c1, c2, c3 ,.
2, b3, ... There is no normally closed contact. The other one of the normally-open contacts a1, a2, a3, ... Is connected in common to the line Lc1 and the line Lc2, and is connected to the line Lc1.
The connection cable Lc including c1 and Lc2 is connected to the connection detection circuit 3 realized by a continuity meter (ohm meter) or the like. The other normally open contacts b1, b2, b3, ... Are connected to a signal output circuit 4 not shown here, which will be described later with reference to FIG.

The CPU 6 inputs the control signal S1 for individually operating the plurality of switches Ka to the switching connection circuit 5 via the bus line 8. As described above, in the present embodiment, when the inspection substrate 2a is attached to and brought into contact with the electrode terminal portion 12a, one electrode terminal p is always in contact with the two inspection terminals r, r. One U-link circuit is formed by the electrode terminal p and the two inspection lead wires La and La. Therefore, by checking the conduction / non-conduction of the U-link circuit, the contact state between the electrode terminal p and the inspection terminals r, r can be determined, and the contact state of the terminal can be confirmed in advance.

In order to determine the conduction / non-conduction state, the switching connection circuit 5 is set to the conduction state discrimination mode, the connection detection circuit 3 is connected, and the common contact c of each switch Ka is one normally open contact a.
Be connected only to. Next, for example, when the switches Ka1 and Ka2 are operated to connect the common contacts c1 and c2 and the normally open contacts a1 and a2, respectively, the electrode terminal p
The connection detection circuit 3 determines whether or not 1 is connected to the inspection terminals r1 and r2. A discrimination signal S2 is sent from the switching connection circuit 3 to the CPU 6 via the bus line 8.

When it is determined that the contact state between the electrode terminal p1 and the inspection terminals r1 and r2 is good, the switches Ka1 and Ka2.
Is restored, one switch Ka3 is skipped, and the next pair of switches Ka4, Ka5 is operated to check the conduction / non-conduction between the electrode terminal p2 and the inspection terminals r4, r5. By sequentially repeating this, it is determined whether the contact state between each electrode terminal p and the inspection terminals r, r is good or bad, and CP
U6 writes the data based on the discrimination signal S2 to the memory 7 each time, and the data indicating the contact state of all the electrode terminal pair inspection terminals is stored in the memory 7.

If it is determined that the switches Ka1 and Ka2 are defective during operation, the positional deviation is checked. At this time, only the switch circuit Ka1 is restored, and the switch circuit Ka1 is restored.
3 operates, and in cooperation with the operating switch circuit Ka2,
The conduction state between the terminal lead wires La2 and La3 is checked. If it is determined to be good, it is determined that the electrode terminal p1 is in contact with the inspection terminals r2 and r3. Thereafter, the continuity / non-conduction between the terminals is sequentially examined in the same manner as described above. It goes without saying that the detection of the positional deviation is also performed for terminals other than the head terminal. For example, if non-conduction is detected between the inspection terminals r4 and r5, the inspection terminals r3 and r4 are detected. The conduction state between the inspection terminals r5-r6 is checked.

As described above, with respect to one defective conduction state, it is possible to find the inspection terminals r, r which are in contact with the electrode terminal p or to judge the defective contact by detecting the positional deviation at least twice. it can. In addition, even when the electrode terminal p is not provided on the way, or an extreme displacement such as the inspection terminals r5 and r6 being in contact with the leading electrode terminal p1 is caused. Search is possible. Therefore, the margin when the inspection substrate 2a is attached to the electrode terminal portion 12a and brought into contact therewith is increased, and the workability is improved.

The above operation is similarly performed for the other switch Kb, and thus the good or bad of the contact state between all the electrode terminals p, q and all the inspection terminals r, s is determined in advance. The connection detection circuit 3 includes switches Ka and Kb.
Each may be separately provided to reduce the inspection time.

As described above, in the present invention, the contact state and the connection state between the electrode terminal p and the inspection terminal r are confirmed before inspecting the operation of the display panel 11. Therefore, it is possible to eliminate useless work such as checking the contact between the terminals and performing the alignment again after the malfunction is found as in the conventional technique. Moreover, in the present invention, the contact state and the connection state of the electrode terminal and the inspection terminal are immediately discriminated while both are in contact with each other, so that the time required for the inspection is significantly saved.

Further noteworthy in the present invention is that the connection switching circuit 5, based on the discrimination output of the connection detection circuit 3,
The inspection terminals r and s are connected to the signal output circuit 4 by switching. As a result, a signal for inspection is not supplied to the terminal in which the contact failure has occurred, so that unnecessary trouble and time waste due to the contact failure can be avoided and the inspection efficiency can be improved.

FIG. 6 is a circuit diagram showing a connection between the signal output circuit 4 and the switching connection circuit 5 with a part thereof omitted. Figure 6
In FIG. 3, the same reference numerals are attached to the portions corresponding to FIGS. The signal output circuit 4 includes output terminals ox1 to oxm; oy1 to oyn (reference numerals ox and oy are used when collectively referred to) corresponding to the scan electrodes x1 to xm and the data electrodes y1 to yn of the display panel 11, Each output terminal ox,
An operating signal for driving the corresponding electrode is derived from oy. The output terminals ox and oy are output cables Ld and L
It is connected to the switching connection circuit 5 via e.

In addition to the switches Ka and Kb described above, the switching connection circuit 5 has the same number of switches Kc1 and Kc1.
Kd2, Kc3, ...; Kd1, Kd2, Kd3, .. The configurations of the switches Kc and Kd are the same, and the switch Kc will be described. Each switch Kc is connected to the other normally open contact of the switch Ka, and one normally open contact g1, corresponding to the common contacts i1, i2, i3, ... And common contacts i1, i2, i3 ,.
g2, g3, ... And the other normally open contacts h1, h2, h3
... and. There is no normally closed contact.

Normally open contacts of different polarities of adjacent switches Kc, for example, normally open contacts h1-g2, h2-g3, h3-.
The g4, ... Are commonly connected to the lines A1, A2, A3 ,. Refer to these contact points as h1 ・ g
2, h2 · g3, h3 · g4, ... Therefore, for example, when the switches Kc1 and Kc2 are operated so that the common contacts i1 and i2 are connected to the contacts h1 and g2, the line A1 is switched to the switch Ka through the switches Kc1 and Kc2.
1, Ka2, and further connected to the electrode terminal p1 through the inspection terminals r1 and r2. Further, for example, the switch Kc2 and the switch kc3 are connected to each other with contact points h2.g.
If operated to the 3 side, the line A2 and the inspection terminals r2, r
3 and 3 are connected. The above-mentioned configuration is applied to the other switches Kd1 to Kdβ, lines B1 to Bβ and contacts k1 · j.
The same applies to 2, k2.j3, k2.j4, ....

In this embodiment, the switches Kc and Kd have such a contact structure so that the inspection terminals r and s can be obtained.
And the position deviation of the electrode terminals p and q are corrected, and the signal output circuit 4 is operated in cooperation with the multiplexer 5a described below.
The output terminals ox, oy and the electrode terminals p, q are connected to each other arbitrarily.

The multiplexer 5a is realized by a logic circuit such as a decoder, has a control terminal and a large number of output terminals for one input terminal, and responds to an input control signal, selects one line from a plurality of lines. Is a logic circuit for selecting. The output terminals of the multiplexer 5a are connected through the lines A1 to Aα and the lines B1 to Bβ (reference symbols A and B are used when collectively referred to) to the contact points h1 · g2.
, k1, j2, k2, j3, ... are individually connected, and the output terminals ox1 to oxm; oy1 to oyn of the signal output circuit 4 are individually connected to the respective input terminals. In response to the control signal input from the bus line 8, the multiplexer 5a connects the output terminal ox1 of the signal output circuit 4 to the contacts h1.g as indicated by the broken line arrow.
It connects between two, and operates so as to connect the output terminal oy1 to the contact point k1 · j2.

By the continuity determination operation described in FIG. 5 above,
The contact state and connection state of each electrode terminal p, q and the inspection terminal r, s are confirmed, and the data is written in the memory 7. When the continuity determination operation is completed and a certain evaluation is obtained, the switching connection circuit 5 is switched to the operation determination mode, and the control signal based on the data is sent from the CPU 6 to the bus line 8
Be entered via.

In response to the control signal, the switches Ka and Kb connected to the inspection terminals r and s and the switches Kc and Kd connected to the lines A and B are selectively operated, and the respective electrode terminals are activated. The two inspection terminals r, r; s, s, which are in contact with p and q, are connected to the lines A and B, respectively,
For example, the electrode terminal p1 and the line A1 are connected. The same applies to other terminals and lines. On the other hand, the multiplexer 5a selectively connects the output terminals ox and oy of the signal output circuit 4 and the lines A and B by the control signal. As a result, each output terminal o of the signal output circuit 4
x and oy and the respective electrode terminals p and q of the display panel 11 are
It is surely connected via the inspection terminals r and s which are actually in contact with each other. Then, the operation signal from the signal output circuit 4 is sequentially output from each output terminal, the scan electrodes x and the control electrodes y of the display panel 11 are driven, and a predetermined inspection is performed.

In this operation determination mode, the contact state between the electrode terminals p and q and the inspection terminals r and s is confirmed in advance. Therefore, if a malfunction is found, the cause is the display panel 11 side. It is clear that the inspection accuracy and the inspection efficiency can be significantly improved.

[0049]

As described above, according to the present invention, at least three inspection terminals are provided for each electrode terminal on the inspection substrate that contacts the plurality of electrode terminals of the display device. There is. Therefore, even if a displacement occurs when the inspection board is contacted, at least two adjacent inspection terminals always face one electrode terminal, so that the probability of contact failure between the terminals is significantly reduced. In addition, a reliable inspection can be performed, and the workability is improved because the alignment accuracy is relaxed.

Further, according to the present invention, the contact state between the one electrode terminal and the two inspection terminals is individually discriminated by the discriminating means, and the contact states of all the electrode terminal pair inspection terminals are preliminarily determined. Since the operation signal is given from the signal output means after confirming the above, if the operation is defective despite the determination of good, the cause can be determined other than the contact failure between the terminals, and the inspection accuracy is improved. improves. Since the contact state can be confirmed over all the terminals without moving the inspection substrate, the inspection efficiency can be significantly improved.

Further, according to the present invention, the operation signal is selectively supplied to the inspection terminal based on the determination result of the contact state. Therefore, when it is determined that the contact is defective, the inspection substrate is again mounted. If it is pasted again or if there is no problem in the display state, the inspection efficiency is improved by executing the inspection as it is, and the power consumption is also reduced.

[Brief description of drawings]

FIG. 1 is a display device inspection apparatus 1 according to an embodiment of the present invention.
3 is a block diagram showing the configuration of FIG.

FIG. 2 is a block diagram showing the configuration of another embodiment of the present invention.

3 is a diagram showing an inspection substrate 2a of the inspection device 1 and an electrode terminal portion 12a of the display device 11. FIG.

FIG. 4 is a diagram showing a part of FIG. 3 in an enlarged manner.

5 is a circuit diagram showing a connection relationship between a connection detection circuit 3 of the inspection device 1 and a switching connection circuit 5. FIG.

FIG. 6 is a circuit diagram showing a connection relationship between a signal output circuit 4 and a switching connection circuit 5 of the inspection device 1.

[Explanation of reference signs] 1 inspection device for display device 2, 2a, 2b inspection substrate 3 connection detection circuit 4 signal output circuit 5 switching connection circuit 5a multiplexer 11 display device 12, 12a, 12b electrode terminal portion Lc connection cable Ld, Le Output cable Lx, Ly Inspection cable p1 to pm Scan electrode terminal q1 to qn Data electrode terminal r1 to rα Scan electrode side inspection terminal s1 to sβ Data electrode side inspection terminal x1 to xm Scan electrode y1 to yn of display panel 11 Data electrode of display panel 11

Claims (4)

[Claims] 1. A method for inspecting a display device having a plurality of electrode terminals arranged at an end thereof, wherein a plurality of inspection terminals are arranged at a ratio of at least three to one electrode terminal. An inspection substrate is prepared, the inspection substrate is attached to a display device so that the inspection terminal and the electrode terminal face each other, and a conduction / non-conduction state between adjacent inspection terminals of the inspection substrate. By determining the contact state between the electrode terminal and the inspection terminal, the operation signal is applied to the inspection terminal to drive the display device based on the determination result, and the operation of the display device is inspected. A method for inspecting a display device, comprising: 2. An inspection apparatus for a display device, which applies an operation signal to a plurality of electrode terminals of the display device to inspect whether the operation of the display device is good or bad, wherein a plurality of inspection terminals are provided for at least one of the electrode terminals. Inspection substrates arranged in a ratio of three; signal output means for outputting the operation signal; determination means for individually determining the contact state between the electrode terminals and the inspection terminals for each terminal; An inspection apparatus for a display device, comprising: switching connection means for selecting one of the determination means and the signal output means and connecting to the inspection substrate. 3. The inspection device for a display device according to claim 2, wherein the determination unit determines a conductive / non-conductive state between adjacent inspection terminals of the inspection substrate. 4. The switching connection means selectively supplies the operation signal from the signal output means to the inspection terminal based on the determination result of the determination means. Display device inspection device.