JPH0738146A - Semiconductor light emitting device - Google Patents

Semiconductor light emitting device

Info

Publication number
JPH0738146A
JPH0738146A JP20024893A JP20024893A JPH0738146A JP H0738146 A JPH0738146 A JP H0738146A JP 20024893 A JP20024893 A JP 20024893A JP 20024893 A JP20024893 A JP 20024893A JP H0738146 A JPH0738146 A JP H0738146A
Authority
JP
Japan
Prior art keywords
light emitting
emitting device
active layer
semiconductor light
gaalas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20024893A
Other languages
Japanese (ja)
Inventor
Takashi Iwamoto
岩本  隆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP20024893A priority Critical patent/JPH0738146A/en
Publication of JPH0738146A publication Critical patent/JPH0738146A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
    • H10H20/82—Roughened surfaces, e.g. at the interface between epitaxial layers

Landscapes

  • Led Devices (AREA)

Abstract

(57)【要約】 【目的】 光取り出し効率を向上させて、高出力の半導
体発光装置を提供することを目的とする。 【構成】 p−GaAlAsクラッド層2、n−GaA
lAsクラッド層4、これらのクラッド層2、4間に配
置したp−GaAlAs活性層3、下部電極7、上部電
極6、及び光取り出し面5から構成された半導体発光装
置1において、発光領域とならない活性層をエッチング
により除去して、その表面を光を乱反射するような凹凸
面8とした。
(57) [Summary] [Object] An object of the present invention is to provide a high-power semiconductor light-emitting device with improved light extraction efficiency. [Structure] p-GaAlAs cladding layer 2, n-GaA
In the semiconductor light emitting device 1 including the 1As clad layer 4, the p-GaAlAs active layer 3 disposed between these clad layers 2 and 4, the lower electrode 7, the upper electrode 6, and the light extraction surface 5, the semiconductor light emitting device 1 does not serve as a light emitting region. The active layer was removed by etching, and the surface thereof was formed into an uneven surface 8 that diffusely reflects light.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、発光ダイオード等の半
導体発光装置に係り、特に面発光型の半導体発光装置に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor light emitting device such as a light emitting diode, and more particularly to a surface emitting semiconductor light emitting device.

【0002】[0002]

【従来の技術】近年、光通信や、表示器として半導体発
光装置が多用されており、例えば高能率の光伝送を可能
にするためにも、より少ない電流で、より大きな光出力
が得られるような発光効率の高い、高出力な半導体発光
装置が求められている。
2. Description of the Related Art In recent years, a semiconductor light emitting device has been widely used as an optical communication device or a display device. For example, in order to enable highly efficient optical transmission, a larger light output can be obtained with a smaller current. There is a demand for a high-power semiconductor light emitting device with high luminous efficiency.

【0003】図2は、従来の半導体発光装置の一例の構
造を示す側断面図である。1 同図において、従来例の
半導体発光装置21は、p−GaAlAsクラッド層
2、p−GaAlAs活性層3、n−GaAlAsクラ
ッド層4が順次エピタキシャル成長されており、n−G
aAlAsクラッド層4からp−GaAlAsクラッド
層2に達する深さの円環状の電極狭窄溝10が形成さ
れ、分離されたn−GaAlAsクラッド層4下面には
円形の下部電極7が形成されている。この電流狭窄溝1
0は、p−GaAlAs活性層3の発光領域を円形の活
性層3aになるように分離し、電流が活性層3aのみに
流れるようにして、高出力で、効率の良い発光を得よう
とするものである。また、p−GaAlAsクラッド層
2上面には円形の光取り出し面5とその周囲部分には上
部電極6が形成されている。そして、この上部電極6と
下部電極7を介して電流が流され、活性層3aから上方
に出射された光は、光取り出し面5から外部へ出射され
る。
FIG. 2 is a side sectional view showing the structure of an example of a conventional semiconductor light emitting device. 1. In FIG. 1, in a semiconductor light emitting device 21 of a conventional example, a p-GaAlAs clad layer 2, a p-GaAlAs active layer 3, and an n-GaAlAs clad layer 4 are sequentially epitaxially grown.
An annular electrode confinement groove 10 having a depth reaching from the aAlAs clad layer 4 to the p-GaAlAs clad layer 2 is formed, and a circular lower electrode 7 is formed on the lower surface of the separated n-GaAlAs clad layer 4. This current constriction groove 1
0 separates the light emitting region of the p-GaAlAs active layer 3 into a circular active layer 3a, and allows current to flow only in the active layer 3a, so as to obtain high output and efficient light emission. It is a thing. A circular light extraction surface 5 is formed on the upper surface of the p-GaAlAs cladding layer 2 and an upper electrode 6 is formed on the peripheral portion thereof. Then, a current is passed through the upper electrode 6 and the lower electrode 7, and the light emitted upward from the active layer 3a is emitted from the light extraction surface 5 to the outside.

【0004】[0004]

【発明が解決しようとする課題】ところで、上述したよ
うな構造の従来例の半導体発光装置21によれば、クラ
ッド層2は、活性層3よりバンドギャップが大きいの
で、発光波長での吸収係数は非常に小さく発光した光は
ほとんど吸収されない。一方、電流狭窄溝10によって
分離された発光領域外の活性層3bは、発光波長で大き
な吸収係数をもっている。また、一般に、半導体の屈折
率は約3.5と非常に大きいことから、垂直方向から約
17°以上傾いて光取り出し面5に入射する光は、全反
射されてしまい、直接取り出すことができない。従っ
て、光取り出し面5で反射された光が、発光領域外の活
性層3bに達すると、ほとんど吸収されて取り出すこと
ができないので、光取り出し効率が悪いという問題点が
あった。そこで、本発明は上記の点に着目してなされた
ものであって、光取り出し効率を向上させて、高出力の
半導体発光装置を提供することを目的とする。
By the way, according to the conventional semiconductor light emitting device 21 having the above-mentioned structure, the cladding layer 2 has a larger bandgap than the active layer 3, so that the absorption coefficient at the emission wavelength is large. Light emitted in a very small amount is hardly absorbed. On the other hand, the active layer 3b outside the light emitting region separated by the current confinement groove 10 has a large absorption coefficient at the emission wavelength. In addition, since the refractive index of a semiconductor is about 3.5, which is very large, the light incident on the light extraction surface 5 with an inclination of about 17 ° or more from the vertical direction is totally reflected and cannot be directly extracted. . Therefore, when the light reflected by the light extraction surface 5 reaches the active layer 3b outside the light emitting region, it is almost absorbed and cannot be extracted, so that there is a problem that the light extraction efficiency is poor. Therefore, the present invention has been made in view of the above points, and an object of the present invention is to provide a high-power semiconductor light emitting device with improved light extraction efficiency.

【0005】[0005]

【課題を解決するための手段】本発明の半導体発光装置
は、活性層を含む半導体結晶層の上部と下部とに電極を
形成し、前記活性層を発光領域とすると共に、前記活性
層の対向面側に、前記発光領域からの出射光を外部へ出
射する光取り出し面を形成した面発光型半導体発光装置
において、前記活性層側の発光領域以外の部分を、乱反
射領域として構成することにより、前述の目的を達成す
るものである。
In a semiconductor light emitting device of the present invention, electrodes are formed above and below a semiconductor crystal layer including an active layer so that the active layer serves as a light emitting region and faces the active layer. On the surface side, in a surface emitting semiconductor light emitting device in which a light extraction surface for emitting light emitted from the light emitting area to the outside is formed, by configuring a portion other than the light emitting area on the active layer side as a diffuse reflection area, The above-mentioned object is achieved.

【0006】[0006]

【作用】活性層から出射されて、光取り出し面で反射さ
れた光の内、乱反射領域に到達した光は、乱反射され
て、その一部は光取り出し面から外へ取り出される。
Of the light emitted from the active layer and reflected by the light extraction surface, the light that reaches the irregular reflection area is irregularly reflected, and a part thereof is extracted outside from the light extraction surface.

【0007】[0007]

【実施例】以下、図1を参照して本発明の一実施例を説
明する。なお、上述した従来例と同様の構成部分、また
は従来例と対応する構成部分には、同様の符号を用い
る。図1は、本発明の半導体発光装置の一実施例の構造
を示す側断面図である。同図において、半導体発光装置
1は、図示されていない基板上に、p−GaAlAsク
ラッド層2、p−GaAlAs活性層3及びn−GaA
lAsクラッド層4が液相成長法により、順次成長させ
た後、基板を除去する。次に、p−GaAlAsクラッ
ド層2表面には、円形の光取り出し面5を除いてその周
囲部分に上部電極6を形成する。また、n−GaAlA
sクラッド層4表面には、円形の下部電極7を形成し、
この下部電極をエッチングマスクとして、n−GaAl
Asクラッド層4から発光領域外の活性層を含み、p−
GaAlAsクラッド層2まで達してエッチングする。
このエッチングは、エッチングされた面が、光を乱反射
するような凹凸面8となるようなエッチング液を用いて
行う。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIG. The same reference numerals are used for the same components as those of the above-described conventional example or components corresponding to those of the conventional example. FIG. 1 is a side sectional view showing the structure of an embodiment of the semiconductor light emitting device of the present invention. In the figure, the semiconductor light emitting device 1 includes a p-GaAlAs cladding layer 2, a p-GaAlAs active layer 3 and an n-GaA on a substrate (not shown).
After the lAs clad layer 4 is sequentially grown by the liquid phase growth method, the substrate is removed. Next, on the surface of the p-GaAlAs cladding layer 2, an upper electrode 6 is formed on the peripheral portion thereof except for the circular light extraction surface 5. In addition, n-GaAlA
A circular lower electrode 7 is formed on the surface of the s clad layer 4,
Using this lower electrode as an etching mask, n-GaAl
Including the active layer outside the light emitting region from the As clad layer 4, p−
The GaAlAs cladding layer 2 is reached and etched.
This etching is performed using an etching solution such that the etched surface becomes the uneven surface 8 that diffusely reflects light.

【0008】また、凹凸面8を形成する他の方法は、図
示されていない基板上に、p−GaAlAsクラッド層
2、p−GaAlAs活性層3及びn−GaAlAsク
ラッド層4を液相成長法により、順次成長させた後、基
板を除去する。次に、円形の下部電極7が形成されるn
−GaAlAsクラッド層4表面中心部分をマスクし、
n−GaAlAsクラッド層4から発光領域外の活性層
を含み、p−GaAlAsクラッド層2まで達してエッ
チングする。p−GaAlAsクラッド層2表面には、
円形の光取り出し面5を除いてその周囲部分に下部電極
6を形成する。マスクされ残ったn−GaAlAsクラ
ッド層4表面には、円形の下部電極7を形成する。ま
た、エッチングされて露出したp−GaAlAsクラッ
ド層2表面には、例えばAu膜を蒸着法により形成し、
熱処理を施す。すると、p−GaAlAsクラッド層2
とAu膜との界面では合金化がおこり、Au合金化層
(図示せず)が形成される。Au膜とAu合金化層をエ
ッチングにより除去すると、光を乱反射するような凹凸
面8がp−GaAlAsクラッド層2表面に形成されて
いる。
Another method for forming the uneven surface 8 is to form a p-GaAlAs clad layer 2, a p-GaAlAs active layer 3 and an n-GaAlAs clad layer 4 on a substrate (not shown) by a liquid phase growth method. After sequentially growing, the substrate is removed. Next, a circular lower electrode 7 is formed n
-Mask the central part of the surface of the GaAlAs clad layer 4,
The n-GaAlAs clad layer 4 including the active layer outside the light emitting region is reached to the p-GaAlAs clad layer 2 for etching. On the surface of the p-GaAlAs clad layer 2,
The lower electrode 6 is formed on the peripheral portion except the circular light extraction surface 5. A circular lower electrode 7 is formed on the surface of the remaining masked n-GaAlAs cladding layer 4. Further, for example, an Au film is formed on the surface of the p-GaAlAs cladding layer 2 exposed by etching by a vapor deposition method,
Heat treatment is applied. Then, the p-GaAlAs cladding layer 2
At the interface between the Au film and the Au film, alloying occurs and an Au alloyed layer (not shown) is formed. When the Au film and the Au alloyed layer are removed by etching, an uneven surface 8 that diffusely reflects light is formed on the surface of the p-GaAlAs clad layer 2.

【0009】以上のような構成よりなる本発明の一実施
例の半導体発光装置1によれば、活性層から発光された
光の内、光取り出し面5で反射された光は、ほとんど吸
収を受けることなくクラッド層2を通っていく。そし
て、凹凸面8に達した光は、そこで乱反射され、再び光
取り出し面5に向かい、垂直に近く入射された光は外に
取り出される。こうした過程を繰り返すことで、光取り
出し効率を向上させることができる。その結果、装置の
光出力を高めることができる。
According to the semiconductor light emitting device 1 of one embodiment of the present invention having the above structure, most of the light emitted from the active layer, which is reflected by the light extraction surface 5, is absorbed. Without passing through the clad layer 2. Then, the light that has reached the uneven surface 8 is diffusely reflected there, and heads for the light extraction surface 5 again, and the light that is incident nearly vertically is extracted to the outside. By repeating such a process, the light extraction efficiency can be improved. As a result, the light output of the device can be increased.

【0010】なお、本実施例で用いた材料や製造方法等
は、これらに限定されるものではなく、適宜変更可能で
ある。
The materials and manufacturing methods used in this embodiment are not limited to these, and can be changed as appropriate.

【0011】[0011]

【発明の効果】以上説明したように、本発明の半導体発
光装置によれば、光取り出し効率が向上し、光出力を高
めることができる。
As described above, according to the semiconductor light emitting device of the present invention, the light extraction efficiency is improved and the light output can be increased.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の半導体発光装置の一実施例の構造を示
す側断面図である。
FIG. 1 is a side sectional view showing a structure of an embodiment of a semiconductor light emitting device of the present invention.

【図2】従来の半導体発光装置の一例の構造を示す側断
面図である。
FIG. 2 is a side sectional view showing a structure of an example of a conventional semiconductor light emitting device.

【符号の説明】[Explanation of symbols]

1 半導体発光装置 2 p−GaAlAsクラッド層(半導体結晶層) 3 p−GaAlAs活性層(活性層) 4 n−GaAlAsクラッド層(半導体結晶層) 5 光取り出し面 6 上部電極(電極) 7 下部電極(電極) 8 凹凸面(乱反射領域) 1 Semiconductor Light-Emitting Device 2 p-GaAlAs Clad Layer (Semiconductor Crystal Layer) 3 p-GaAlAs Active Layer (Active Layer) 4 n-GaAlAs Clad Layer (Semiconductor Crystal Layer) 5 Light Extraction Surface 6 Upper Electrode (Electrode) 7 Lower Electrode ( Electrode) 8 Uneven surface (diffuse reflection area)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】活性層を含む半導体結晶層の上部と下部と
に電極を形成し、前記活性層を発光領域とすると共に、
前記活性層の対向面側に、前記発光領域からの出射光を
外部へ出射する光取り出し面を形成した面発光型半導体
発光装置において、 前記活性層側の発光領域以外の部分を、乱反射領域とし
たことを特徴とする半導体発光装置。
1. An electrode is formed on an upper portion and a lower portion of a semiconductor crystal layer including an active layer, and the active layer serves as a light emitting region.
In a surface emitting semiconductor light emitting device having a light extraction surface for emitting light emitted from the light emitting region to the outside on the opposite surface side of the active layer, a portion other than the light emitting region on the active layer side is defined as a diffuse reflection region. A semiconductor light emitting device characterized by the above.
JP20024893A 1993-07-20 1993-07-20 Semiconductor light emitting device Pending JPH0738146A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20024893A JPH0738146A (en) 1993-07-20 1993-07-20 Semiconductor light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20024893A JPH0738146A (en) 1993-07-20 1993-07-20 Semiconductor light emitting device

Publications (1)

Publication Number Publication Date
JPH0738146A true JPH0738146A (en) 1995-02-07

Family

ID=16421245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20024893A Pending JPH0738146A (en) 1993-07-20 1993-07-20 Semiconductor light emitting device

Country Status (1)

Country Link
JP (1) JPH0738146A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002026392A (en) * 2000-06-30 2002-01-25 Toshiba Corp Semiconductor light emitting element, method of manufacturing the same, and semiconductor light emitting device
DE10224219A1 (en) * 2002-05-31 2003-12-18 Osram Opto Semiconductors Gmbh Thin film luminescence diode, includes separated regions for photon generation and coupling light out
US6956241B2 (en) 2002-04-05 2005-10-18 Kabushiki Kaisha Toshiba Semiconductor light emitting element with improved light extraction efficiency
EP1592072A3 (en) * 2004-04-30 2007-12-26 Osram Opto Semiconductors GmbH Optoelectronic semiconductor chip and method of fabricating the same
EP2234182A4 (en) * 2007-12-28 2014-09-03 Nichia Corp SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND METHOD FOR MANUFACTURING THE SAME
JP2015099946A (en) * 1998-02-19 2015-05-28 フィリップス ルミレッズ ライティング カンパニー リミテッド ライアビリティ カンパニー LED and LED assembly method
CN108767076A (en) * 2012-01-10 2018-11-06 亮锐控股有限公司 Pass through the LED light output of selective area roughening control
US12298059B2 (en) 2017-01-23 2025-05-13 Lg Electronics Inc. Refrigerator and transparent panel assembly for refrigerator

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015099946A (en) * 1998-02-19 2015-05-28 フィリップス ルミレッズ ライティング カンパニー リミテッド ライアビリティ カンパニー LED and LED assembly method
JP2002026392A (en) * 2000-06-30 2002-01-25 Toshiba Corp Semiconductor light emitting element, method of manufacturing the same, and semiconductor light emitting device
US6956241B2 (en) 2002-04-05 2005-10-18 Kabushiki Kaisha Toshiba Semiconductor light emitting element with improved light extraction efficiency
US6936853B2 (en) 2002-05-31 2005-08-30 Osram Opto Semiconductors Gmbh Light-emitting semiconductor component
DE10224219B4 (en) * 2002-05-31 2010-05-27 Osram Opto Semiconductors Gmbh A light emitting semiconductor device having at least partially separated light generation and light extraction regions
DE10224219A1 (en) * 2002-05-31 2003-12-18 Osram Opto Semiconductors Gmbh Thin film luminescence diode, includes separated regions for photon generation and coupling light out
EP1592072A3 (en) * 2004-04-30 2007-12-26 Osram Opto Semiconductors GmbH Optoelectronic semiconductor chip and method of fabricating the same
US7435999B2 (en) 2004-04-30 2008-10-14 Osram Opto Semiconductors Gmbh Semiconductor chip for optoelectronics and method for the production thereof
EP2234182A4 (en) * 2007-12-28 2014-09-03 Nichia Corp SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND METHOD FOR MANUFACTURING THE SAME
US8883529B2 (en) 2007-12-28 2014-11-11 Nichia Corporation Method for manufacturing semiconductor light emitting device
US9159868B2 (en) 2007-12-28 2015-10-13 Nichia Corporation Method for manufacturing semiconductor light emitting device
CN108767076A (en) * 2012-01-10 2018-11-06 亮锐控股有限公司 Pass through the LED light output of selective area roughening control
US12298059B2 (en) 2017-01-23 2025-05-13 Lg Electronics Inc. Refrigerator and transparent panel assembly for refrigerator

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