JPH07518B2 - Molecular beam crystal growth equipment - Google Patents
Molecular beam crystal growth equipmentInfo
- Publication number
- JPH07518B2 JPH07518B2 JP62006469A JP646987A JPH07518B2 JP H07518 B2 JPH07518 B2 JP H07518B2 JP 62006469 A JP62006469 A JP 62006469A JP 646987 A JP646987 A JP 646987A JP H07518 B2 JPH07518 B2 JP H07518B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- molecular beam
- single crystal
- substrate holder
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Description
【発明の詳細な説明】 〔概要〕 この発明は、分子線結晶成長装置において、 単結晶を成長する基板の周縁部を支持する基板ホルダと
該基板を空間部を介して熱輻射により加熱するヒータと
の間に、該基板ホルダを該ヒータから熱遮蔽する2枚以
上の金属板を所定間隔をおいて積層してなる熱反射板を
備えて、基板ホルダの温度を制御することにより、 基板面内の温度分布の均一性を向上して、成長する単結
晶層を改善するものである。DETAILED DESCRIPTION OF THE INVENTION [Outline] The present invention relates to a molecular beam crystal growth apparatus, including a substrate holder for supporting a peripheral portion of a substrate for growing a single crystal, and a heater for heating the substrate by heat radiation through a space. And a heat reflection plate formed by laminating two or more metal plates that heat shield the substrate holder from the heater at a predetermined interval, and control the temperature of the substrate holder. The uniformity of the temperature distribution in the inside is improved, and the growing single crystal layer is improved.
本発明は分子線結晶成長装置、特に成長を行う単結晶基
板の温度分布を改善してエピタキシャル成長の均一性が
向上する分子線結晶成長装置に関する。The present invention relates to a molecular beam crystal growth apparatus, and more particularly to a molecular beam crystal growth apparatus that improves the temperature distribution of a growing single crystal substrate to improve the uniformity of epitaxial growth.
半導体装置等には単結晶基板上に所要の単結晶層をエピ
タキシャル成長した基体が広く用いられている。エピタ
キシャル成長には種々の方法が行われているが、分子線
結晶成長方法(MBE法)は、結晶の成長速度、混晶の組
成比或いは不純物ドープ量などを最も正確に制御するこ
とができ、例えば超格子構造などの精密な結晶成長に最
も適している。A substrate obtained by epitaxially growing a required single crystal layer on a single crystal substrate is widely used for semiconductor devices and the like. Although various methods are used for epitaxial growth, the molecular beam crystal growth method (MBE method) can most accurately control the crystal growth rate, the composition ratio of mixed crystals, or the impurity doping amount. Most suitable for precise crystal growth such as superlattice structure.
しかしながらMBE法は他の成長方法に比較して成長速度
が低いのみならず、均一な成長が従来困難であってその
改善が強く要望されている。However, the MBE method has not only a low growth rate as compared with other growth methods, but also uniform growth has heretofore been difficult, and improvement thereof is strongly demanded.
MBE法は、目的とする単結晶を構成する元素及びこれに
ドープする不純物元素を10-10Torr程度の高真空中でセ
ルから分子ビーム状に蒸発させて、単結晶基板上に単結
晶層としてエピタキシャル成長する方法であり、その装
置の主要部は例えば第4図に示す模式図の如く構成され
ている。The MBE method is to evaporate the element composing the target single crystal and the impurity element to be doped into this into a molecular beam from a cell in a high vacuum of about 10 -10 Torr to form a single crystal layer on a single crystal substrate. This is an epitaxial growth method, and the main part of the apparatus is constructed, for example, as shown in the schematic view of FIG.
同図において、1は基板を支持、加熱する機構、2は分
子線源セル、3は液体窒素シュラウド、4AはRHEED用電
子銃、4BはRHEED用螢光スクリーンであり、単結晶を成
長させる単結晶基板10は基板を支持、加熱する機構1に
例えば下記のの様に装着される。In the figure, 1 is a mechanism for supporting and heating a substrate, 2 is a molecular beam source cell, 3 is a liquid nitrogen shroud, 4A is an electron gun for RHEED, and 4B is a fluorescent screen for RHEED. The crystal substrate 10 is attached to the mechanism 1 that supports and heats the substrate, for example, as described below.
この基板を支持、加熱する機構1は従来第5図に例示す
る如き構造となっている。すなわち、11は例えばモリブ
デン(Mo)等からなる基板ホルダ、12は例えば窒化ボロ
ン(BN)等からなるスペーサ、13は例えばBN等からなる
均熱板、14はヒータ、15は回転機構であり、10は単結晶
基板である。The mechanism 1 for supporting and heating this substrate has a structure as illustrated in FIG. That is, 11 is a substrate holder made of, for example, molybdenum (Mo), 12 is a spacer made of, for example, boron nitride (BN), 13 is a soaking plate made of, for example, BN, 14 is a heater, 15 is a rotating mechanism, 10 is a single crystal substrate.
単結晶基板10はこの基板ホルダ11上でヒータ14からの輻
射熱により、最適の基板温度として選択された温度、例
えば砒化ガリウム(GaAs)で600〜700℃、シリコン(S
i)で700〜800℃程度に加熱されるが、基板温度は単結
晶層の成長速度、結晶状態、多元化合物の組成、不純物
ドーピング濃度等に大きい影響を与えるために、前記温
度において例えば±5℃程度以内の温度分布とすること
が必要である。The single crystal substrate 10 is heated on the substrate holder 11 by radiant heat from the heater 14 to a temperature selected as an optimum substrate temperature, for example, gallium arsenide (GaAs) at 600 to 700 ° C. and silicon (S
In i), the substrate temperature is heated to about 700 to 800 ° C., but the substrate temperature has a great influence on the growth rate of the single crystal layer, the crystalline state, the composition of the multi-element compound, the impurity doping concentration, etc. It is necessary to make the temperature distribution within about ° C.
前記従来例の基板を支持、加熱する機構では、ヒータ14
からの輻射熱が基板ホルダ11をも強く加熱してこれが単
結晶基板10より高温となり、基板ホルダ11から単結晶基
板10への熱流入によってその中心部分より周辺部分が高
温となる温度の不均一分布を生じて、成長した単結晶層
の均一性が問題となっている。In the conventional mechanism for supporting and heating the substrate, the heater 14
Radiant heat from the substrate holder 11 also strongly heats the substrate holder 11, which becomes a higher temperature than the single crystal substrate 10. Due to the heat flow from the substrate holder 11 to the single crystal substrate 10, the peripheral portion has a higher temperature than the central portion, and the temperature is non-uniformly distributed. And the uniformity of the grown single crystal layer is a problem.
前記問題点は、単結晶を成長する基板の周縁部を支持す
る基板ホルダと該基板を空間部を介して熱輻射により加
熱するヒータとの間に、該基板ホルダを該ヒータから熱
遮蔽する2枚以上の金属板を所定間隔をおいて積層して
なる熱反射板を備えてなる本発明による分子線結晶成長
装置により解決される。The problem is that the substrate holder is thermally shielded from the heater between the substrate holder that supports the peripheral portion of the substrate on which the single crystal is grown and the heater that heats the substrate by heat radiation through the space. The problem is solved by the molecular beam crystal growth apparatus according to the present invention, which comprises a heat reflection plate formed by laminating one or more metal plates at a predetermined interval.
なお前記熱遮蔽手段には例えば熱反射板を用いることが
できる。A heat reflection plate can be used for the heat shield means, for example.
本発明によれば第1図に例示する如く、ヒータ14との間
を例えば熱反射板16により熱遮蔽して基板ホルダ11の温
度、従って基板ホルダ11と基板10との間の熱伝導量を適
量に制御することにより、基板10面内の温度分布の均一
性を向上して、成長する単結晶層の均一性を改善する。According to the present invention, as illustrated in FIG. 1, the temperature of the substrate holder 11 and thus the amount of heat conduction between the substrate holder 11 and the substrate 10 is controlled by thermally shielding the space between the heater 14 and the heater 14, for example. By controlling the amount appropriately, the uniformity of the temperature distribution in the plane of the substrate 10 is improved, and the uniformity of the growing single crystal layer is improved.
〔実施例〕 以下本発明を実施例により具体的に説明する。[Examples] The present invention will be specifically described below with reference to Examples.
第2図は本発明の第1の実施例について、その基板を支
持、加熱する機構部分を示す模式図であり、11は基板ホ
ルダ、12はスペーサ、13は均熱板、14はヒータ、15は回
転機構、16は本発明による熱遮蔽を行う熱反射板であ
り、10は単結晶を成長する単結晶基板である。FIG. 2 is a schematic view showing a mechanism part for supporting and heating the substrate in the first embodiment of the present invention, 11 is a substrate holder, 12 is a spacer, 13 is a soaking plate, 14 is a heater, 15 Is a rotating mechanism, 16 is a heat reflecting plate for heat shielding according to the present invention, and 10 is a single crystal substrate for growing a single crystal.
本実施例の基板ホルダ11には例えばMoが用いられ、その
基板マウント面の直径は約190mmで直径dwが約51mmの
基板6枚を回転対称形に配置して搭載することができ、
各開口の内径d0は約45mmである。For example, Mo is used for the substrate holder 11 of this embodiment, and six substrates having a substrate mounting surface diameter of about 190 mm and a diameter d w of about 51 mm can be arranged and mounted in a rotationally symmetrical manner.
The inner diameter d 0 of each opening is about 45 mm.
また熱反射板16は、例えば厚さ0.1mmのタンタル(Ta)
板4枚をピッチ0.5mmで積層した構成で、基板ホルダ11
の各開口と同心の位置に内径d1が約40mmの開口が設けら
れている。The heat reflection plate 16 is, for example, tantalum (Ta) having a thickness of 0.1 mm.
The board holder 11 has a structure in which four plates are stacked with a pitch of 0.5 mm.
An opening having an inner diameter d 1 of about 40 mm is provided at a position concentric with each opening.
なおヒータ14と基板ホルダ11との間隔は、前記従来例と
同じく約5mmであり、熱反射板16は基板ホルダ11と共に
基板マウント面の中心軸を回転軸として例えば20rpm程
度以下の速度で回転することができる。The distance between the heater 14 and the substrate holder 11 is about 5 mm as in the conventional example, and the heat reflecting plate 16 rotates together with the substrate holder 11 about the central axis of the substrate mounting surface as a rotation axis at a speed of about 20 rpm or less. be able to.
また第3図は本発明の第2の実施例を示す模式図であ
り、第1図と同一符号で対応する部分を示す。本実施例
の基板ホルダ11は前記従来例と同様に搭載する基板数を
1枚としている。Further, FIG. 3 is a schematic diagram showing a second embodiment of the present invention, in which the same reference numerals as in FIG. In the substrate holder 11 of this embodiment, the number of substrates to be mounted is one as in the conventional example.
本実施例の熱反射板16は図示の如く、軸方向が基板ホル
ダ11の基板マウント面に垂直な同軸円筒状に、厚さ、枚
数、ピッチが例えば前記実施例と同様なTa板で構成し、
ヒータ14をこの円筒内に設けている。As shown in the figure, the heat reflection plate 16 of the present embodiment is formed of a Ta plate whose thickness, number, and pitch are, for example, the same as those of the above-described embodiments, in a coaxial cylindrical shape whose axial direction is perpendicular to the substrate mounting surface of the substrate holder 11. ,
The heater 14 is provided in this cylinder.
上述の各実施例では例えば砒化ガリウム(GaAs)のMBE
成長に適する温度680℃において、基板10の全面にわた
って±5℃以内の温度分布が余裕をもって確保されてい
る。In the above embodiments, for example, gallium arsenide (GaAs) MBE is used.
At a temperature suitable for growth of 680 ° C., a temperature distribution within ± 5 ° C. is secured with a margin over the entire surface of the substrate 10.
また第1の実施例について、分子線源セル2を大開口の
ラングミュラ型として分子線を基板ホルダ11の全面に良
好な均一性で入射させ、GaAs単結晶基板上に高電子移動
度電界効果トランジスタのためのノンドープのGaAs層、
Siを選択的にドープしたAlGaAs層及びSiをドープしたGa
As層を連続して成長したが、各半導体層の厚さ、不純物
濃度などの基板相互間及び各基板面内のばらつきは何れ
も±1%以内であるなど、均一で良好な単結晶層が得ら
れた。Further, in the first embodiment, the molecular beam source cell 2 is a Langmuir type with a large opening, and the molecular beam is incident on the entire surface of the substrate holder 11 with good uniformity, and a high electron mobility field effect transistor is formed on the GaAs single crystal substrate. Undoped GaAs layer for
AlGaAs layer selectively doped with Si and Ga doped with Si
The As layer was grown continuously, but the variation of the thickness of each semiconductor layer, the impurity concentration, etc. between substrates and within each substrate was within ± 1%. Was obtained.
以上説明した如く本発明によれば、分子線エピタキシャ
ル成長法による単結晶層の均一性向上が達成され、更に
装置の構造が簡単でその実施が容易であり、例えば超格
子構造を備える半導体装置などの開発、実用化に顕著な
効果が得られる。As described above, according to the present invention, the uniformity of a single crystal layer can be improved by the molecular beam epitaxial growth method, and the structure of the device is simple and easy to implement. For example, in a semiconductor device having a superlattice structure, etc. A remarkable effect can be obtained for development and practical use.
第1図は本発明の原理図、 第2図は本発明の第1の実施例の模式図、 第3図は第2の実施例の模式図、 第4図は分子線結晶成長装置の模式図、 第5図は分子線結晶成長装置の基板支持、加熱機構の従
来例の模式図、 図において、 1は基板を支持、加熱する機構、 11は基板ホルダ、12はスペーサ、 13は均熱板、14はヒータ、 15は回転機構、 16は本発明による熱遮蔽を行う熱反射板、 2は分子線源セル、 10は単結晶を成長する単結晶基板を示す。FIG. 1 is a principle diagram of the present invention, FIG. 2 is a schematic diagram of a first embodiment of the present invention, FIG. 3 is a schematic diagram of a second embodiment, and FIG. 4 is a schematic diagram of a molecular beam crystal growth apparatus. Fig. 5 is a schematic view of a conventional example of a substrate supporting and heating mechanism of a molecular beam crystal growth apparatus. In the diagram, 1 is a mechanism for supporting and heating the substrate, 11 is a substrate holder, 12 is a spacer, 13 is soaking. A plate, 14 is a heater, 15 is a rotating mechanism, 16 is a heat reflection plate for heat shielding according to the present invention, 2 is a molecular beam source cell, and 10 is a single crystal substrate for growing a single crystal.
Claims (1)
基板ホルダと該基板を空間部を介して熱輻射により加熱
するヒータとの間に、該基板ホルダを該ヒータから熱遮
蔽する2枚以上の金属板を所定間隔をおいて積層してな
る熱反射板(16)を備えてなることを特徴とする分子線
結晶成長装置。1. A substrate holder that supports a peripheral portion of a substrate on which a single crystal is grown and a heater that heats the substrate by heat radiation through a space, and shields the substrate holder from the heater. A molecular beam crystal growth apparatus comprising a heat reflection plate (16) formed by laminating at least one metal plate at a predetermined interval.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62006469A JPH07518B2 (en) | 1987-01-14 | 1987-01-14 | Molecular beam crystal growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62006469A JPH07518B2 (en) | 1987-01-14 | 1987-01-14 | Molecular beam crystal growth equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63176392A JPS63176392A (en) | 1988-07-20 |
| JPH07518B2 true JPH07518B2 (en) | 1995-01-11 |
Family
ID=11639313
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62006469A Expired - Lifetime JPH07518B2 (en) | 1987-01-14 | 1987-01-14 | Molecular beam crystal growth equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07518B2 (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5730320A (en) * | 1980-07-29 | 1982-02-18 | Fujitsu Ltd | Substrate holder for molecular beam epitaxy |
-
1987
- 1987-01-14 JP JP62006469A patent/JPH07518B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63176392A (en) | 1988-07-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6136093A (en) | Method of making GaN single crystal and apparatus for making GaN single crystal | |
| KR20220006604A (en) | A method for depositing an epitaxial layer on the front surface of a semiconductor wafer, and a device for performing the method | |
| CA1102013A (en) | Molecular-beam epitaxy system and method including hydrogen treatment | |
| JPH07518B2 (en) | Molecular beam crystal growth equipment | |
| JP3923228B2 (en) | Substrate holding mechanism and compound semiconductor manufacturing method using the same | |
| JPH0959085A (en) | Single crystal growth method and single crystal growth apparatus | |
| JPH0215520B2 (en) | ||
| JP2733535B2 (en) | Semiconductor thin film vapor deposition equipment | |
| JPS61220414A (en) | Apparatus for generating molecular beam | |
| JPS598698A (en) | Vertical liquid phase epitaxial growth equipment | |
| JP3157866B2 (en) | Substrate holder for molecular beam crystal growth and molecular beam crystal growth method | |
| JPS6255919A (en) | Molecular beam crystal growth device | |
| JPS63297293A (en) | Method for growing crystal | |
| JPS6348703Y2 (en) | ||
| JP2004241460A (en) | Semiconductor manufacturing equipment | |
| JP2692138B2 (en) | Manufacturing method of single crystal thin film | |
| JPH042554B2 (en) | ||
| JPH03271193A (en) | Substrate holder | |
| JPS63204713A (en) | Substrate holder for molecular beam crystal growth | |
| JPH06122590A (en) | Molecular beam source cell and molecular beam crystal growth equipment | |
| JP3139045B2 (en) | Molecular beam crystal growth equipment | |
| JPS61141119A (en) | Device for crystal growth by molecular beam | |
| JPH0365590A (en) | Molecular beam epitaxy apparatus | |
| JPH0315333B2 (en) | ||
| JPH034024Y2 (en) |