JPH0766169A - Wet treatment equipment - Google Patents
Wet treatment equipmentInfo
- Publication number
- JPH0766169A JPH0766169A JP20740793A JP20740793A JPH0766169A JP H0766169 A JPH0766169 A JP H0766169A JP 20740793 A JP20740793 A JP 20740793A JP 20740793 A JP20740793 A JP 20740793A JP H0766169 A JPH0766169 A JP H0766169A
- Authority
- JP
- Japan
- Prior art keywords
- pure water
- water supply
- wafer
- supply pipe
- bottom plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 51
- 238000005406 washing Methods 0.000 abstract description 8
- 238000006467 substitution reaction Methods 0.000 abstract 1
- 239000000428 dust Substances 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Weting (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は薬液処理されたウェーハ
を水洗するウェット処理装置の水洗槽における純水給水
構造に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a deionized water supply structure in a washing tank of a wet processing apparatus for washing a chemical-treated wafer with water.
【0002】[0002]
【従来の技術】従来、この種のウェット処理装置の水洗
槽は図2aの側断面図、図2bの底板をのぞいた平面
図、図2cの底板の平面図に示すように水洗槽1の槽中
央にある純水給水穴より純水を供給しており、またキャ
リア3を載せる底板4には、純水を通す丸穴4aが多数
設けられていた。2. Description of the Related Art Conventionally, the washing tank of this type of wet processing apparatus is shown in a side sectional view of FIG. 2a, a plan view of the bottom plate of FIG. 2b, and a bottom view of the bottom plate of FIG. 2c. Pure water is supplied from a pure water supply hole in the center, and the bottom plate 4 on which the carrier 3 is mounted has a large number of round holes 4a through which pure water passes.
【0003】[0003]
【発明が解決しようとする課題】ところで、従来の純水
給水方法は、槽中央部より供給しているがその上に丸穴
4aを設けた底板4があるため、ウェーハ2への純水の
流れを妨げてしまい、純水の流れのほとんどが側壁6を
つたわって流れウェーハ2付近の水がよどんでしまい、
純水の置換効率が悪くなるという欠点があった。In the conventional pure water supply method, water is supplied from the center of the tank, but since there is a bottom plate 4 having a round hole 4a on it, pure water to the wafer 2 is not supplied. This impedes the flow, and most of the pure water flows along the side wall 6 and the water near the wafer 2 stagnates.
There is a drawback that the efficiency of replacing pure water becomes poor.
【0004】[0004]
【課題を解決するための手段】本発明は、薬液処理さた
ウェーハを水洗するウェット処理装置の水洗槽におい
て、ウェーハキャリアの真下に設けた多数の給水穴を純
水給水パイプとウェーハキャリアの形状にあわせた長穴
を有する底板を有することを特徴とする。SUMMARY OF THE INVENTION According to the present invention, in a washing tank of a wet processing apparatus for washing a chemically treated wafer with water, a large number of water supply holes provided directly under the wafer carrier are provided in the pure water supply pipe and the shape of the wafer carrier. It is characterized by having a bottom plate having an elongated hole adapted to.
【0005】[0005]
【作用】上記の構成によると、純水給水パイプから給水
された純水はウェーハ表面に当たって流れるため、ウェ
ーハ付近の純水置換効率が向上する。According to the above construction, since the pure water supplied from the pure water supply pipe hits the surface of the wafer and flows, the pure water replacement efficiency in the vicinity of the wafer is improved.
【0006】[0006]
【実施例】以下、本発明について図面を参照して説明す
る。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings.
【0007】図1aはその側断面図、図1bは底板をの
ぞいた状態の平面図、図1cは底板4の平面図である。
水洗槽1の純水給水口として純水給水パイプ5を取り付
ける。これはウェーハ2を載せたキャリア3の真下に位
置する多数の給水穴5aを有している。純水給水パイプ
5の給水穴5aは、ウェーハ2の中心に純水が飛び出す
よう傾を有している。さらにその上には全面にわたって
底板4が設けられ、その底板には純水給水パイプ5より
給水される純水の流れをキャリア3に集中し、かつ妨げ
ないように長穴4aを設ける。FIG. 1a is a side sectional view of the same, FIG. 1b is a plan view of a state in which the bottom plate is removed, and FIG. 1c is a plan view of the bottom plate 4.
A pure water supply pipe 5 is attached as a pure water supply port of the washing tank 1. This has a large number of water supply holes 5a located directly below the carrier 3 on which the wafer 2 is placed. The water supply hole 5a of the pure water supply pipe 5 is inclined so that the pure water is ejected to the center of the wafer 2. Further, a bottom plate 4 is provided over the entire surface, and a long hole 4a is provided on the bottom plate so that the flow of pure water supplied from a pure water supply pipe 5 is concentrated on the carrier 3 and does not hinder the flow.
【0008】図1cに示す本実施例の底板4に設けた長
穴4aは、ウェーハのキャリア3より若干大きめの外寸
とし、キャリア3が落下しないようにバー4bを双方に
2本ずつ設けている。The elongated hole 4a formed in the bottom plate 4 of this embodiment shown in FIG. 1c has an outer size slightly larger than the carrier 3 of the wafer, and two bars 4b are provided on both sides to prevent the carrier 3 from falling. There is.
【0009】しかしながら、キャリア3を置く位置を精
度よく置く(ストッパ等の設置)ことにより、長穴4a
をキャリアの大きさに合わせることもできる。However, the long hole 4a can be formed by accurately placing the carrier 3 (positioning a stopper or the like).
Can also be adapted to the size of the carrier.
【0010】この実施例によれば、ウェーハ2の真下よ
り純水を給水することができることから、ウェーハ付近
の純水の流れが活発になり、純水置換効率が向上すると
いう利点がある。According to this embodiment, since pure water can be supplied from directly under the wafer 2, there is an advantage that the flow of pure water in the vicinity of the wafer becomes active and the pure water replacement efficiency is improved.
【0011】[0011]
【発明の効果】以上説明したように、この発明はウェー
ハ付近の純水置換効率を向上させたことにより、ウェー
ハ表裏のゴミ除去率が上がり、ゴミ不良を低減できる効
果がある。As described above, according to the present invention, the efficiency of replacing pure water in the vicinity of the wafer is improved, so that the removal rate of dust on the front and back surfaces of the wafer is increased and dust defects can be reduced.
【図1】 aは、本発明の実施例を示す側断面図。b
は、その底板をのぞいた状態の平面図。cは、その底板
の平面図。FIG. 1A is a side sectional view showing an embodiment of the present invention. b
Is a plan view with the bottom plate removed. c is a plan view of the bottom plate.
【図2】 aは、従来の水洗装置の側断面図。bは、そ
の底板をのぞいた状態の平面図。cは、その底板の平面
図。FIG. 2A is a side sectional view of a conventional water washing device. b is the top view of the state which looked at the bottom plate. c is a plan view of the bottom plate.
1 水洗槽 2 ウェーハ 3 キャリア 4 底板 5 純水給水パイプ 6 給水穴 7 長穴 1 Water Wash Tank 2 Wafer 3 Carrier 4 Bottom Plate 5 Pure Water Supply Pipe 6 Water Supply Hole 7 Oblong Hole
Claims (2)
おいて、ウェーハの真下に給水穴を多数設けた純粋給水
パイプを設け、かつウェーハの入ったキャリアを載せる
底板にキャリアに合わせた長穴を有することを特徴とす
るウェット処理装置。1. A wet processing apparatus for rinsing a wafer with water, comprising a pure water supply pipe having a large number of water supply holes just below the wafer, and a bottom plate on which a carrier containing a wafer is mounted, having an elongated hole adapted to the carrier. Wet processing equipment characterized by.
出するよう設けられている請求項1のウェット処理装
置。2. The wet processing apparatus according to claim 1, wherein the water supply hole is provided so as to eject pure water toward the wafer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5207407A JP2845309B2 (en) | 1993-08-23 | 1993-08-23 | Wet processing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5207407A JP2845309B2 (en) | 1993-08-23 | 1993-08-23 | Wet processing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0766169A true JPH0766169A (en) | 1995-03-10 |
| JP2845309B2 JP2845309B2 (en) | 1999-01-13 |
Family
ID=16539231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5207407A Expired - Lifetime JP2845309B2 (en) | 1993-08-23 | 1993-08-23 | Wet processing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2845309B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100334058B1 (en) * | 1999-07-15 | 2002-04-26 | 김광교 | Cleaning water stabilization apparatus of cleaning bath for water making semiconductor |
| KR100400282B1 (en) * | 1996-06-29 | 2004-06-04 | 주식회사 하이닉스반도체 | Capacitor Manufacturing Method for Semiconductor Devices |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03232228A (en) * | 1990-02-08 | 1991-10-16 | Fujitsu Ltd | Liquid processor of semiconductor wafer |
| JPH0533819A (en) * | 1991-07-30 | 1993-02-09 | Toyoda Mach Works Ltd | Drive force transmission device |
| JPH06333907A (en) * | 1993-05-26 | 1994-12-02 | Tokyo Electron Ltd | Cleaning equipment |
-
1993
- 1993-08-23 JP JP5207407A patent/JP2845309B2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03232228A (en) * | 1990-02-08 | 1991-10-16 | Fujitsu Ltd | Liquid processor of semiconductor wafer |
| JPH0533819A (en) * | 1991-07-30 | 1993-02-09 | Toyoda Mach Works Ltd | Drive force transmission device |
| JPH06333907A (en) * | 1993-05-26 | 1994-12-02 | Tokyo Electron Ltd | Cleaning equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100400282B1 (en) * | 1996-06-29 | 2004-06-04 | 주식회사 하이닉스반도체 | Capacitor Manufacturing Method for Semiconductor Devices |
| KR100334058B1 (en) * | 1999-07-15 | 2002-04-26 | 김광교 | Cleaning water stabilization apparatus of cleaning bath for water making semiconductor |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2845309B2 (en) | 1999-01-13 |
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