JPH077733B2 - Sliding contact device - Google Patents
Sliding contact deviceInfo
- Publication number
- JPH077733B2 JPH077733B2 JP11031687A JP11031687A JPH077733B2 JP H077733 B2 JPH077733 B2 JP H077733B2 JP 11031687 A JP11031687 A JP 11031687A JP 11031687 A JP11031687 A JP 11031687A JP H077733 B2 JPH077733 B2 JP H077733B2
- Authority
- JP
- Japan
- Prior art keywords
- sliding contact
- contact
- thick film
- pattern
- thick
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Details Of Resistors (AREA)
- Adjustable Resistors (AREA)
- Contacts (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、計測器、各種機械等で、検出用、制御用、設
定用、発振器用などに使用されているボリュームスイッ
チ、ポテンシォメータ、トリマー(可変抵抗器の一種)
等で用いられる摺動接点装置の改良に関する。The present invention relates to a volume switch, potentiometer, and potentiometer used for detection, control, setting, oscillator, etc. in measuring instruments, various machines, etc. Trimmer (a type of variable resistor)
The present invention relates to an improvement of a sliding contact device used in the above.
(従来の技術とその問題点) 従来より上記のボリュームスイッチ、ポテンシォメー
タ、トリマー等で用いられる摺動接点装置は、セラミッ
クス基板上にカーボン(C)や酸化ルテニウム(RuO2)
などの抵抗ペーストを焼成して厚膜抵抗パターンを形成
して成る配線板と、この配線板の厚膜抵抗パターンに対
向して摺動し得るようになされたスプリング端子材にAg
接点材をかしめ或いは溶接して成るすり接点とにより構
成されているが、この摺動接点装置は、ノイズが発生し
易く、又接触抵抗がやや高く且つ幾分ばらつきがあって
不安定であり、しかも摩耗し易くて寿命が短く、接点信
頼性にやや欠けるものであった。(Prior art and its problems) Sliding contact devices conventionally used in the above volume switches, potentiometers, trimmers, etc. have carbon (C) and ruthenium oxide (RuO 2 ) on a ceramic substrate.
Ag is applied to a wiring board made by firing a resistance paste such as to form a thick film resistance pattern and a spring terminal material that can slide against the thick film resistance pattern of this wiring board.
The sliding contact device is composed of a sliding contact formed by crimping or welding a contact material, but this sliding contact device is liable to generate noise, has a slightly high contact resistance and is unstable due to some variation. Moreover, it was easily worn, had a short life, and lacked contact reliability.
この為、セラミックス基板上のカーボンや酸化ルテニウ
ムの厚膜抵抗パターンのすり接点と摺動する部分を、Ag
−Pb系の導体ペーストに置き換えて焼成するかあるいは
厚膜抵抗パターンのすり接点と摺動する部分にAg−Pd系
導体ペーストを重ねて焼成することにより、接触信頼性
を改善し、又すり接点のAg接点材を硫化防止の為、Ag−
Pd30〜50wt%に置き換えている。Therefore, the portion of the thick film resistance pattern of carbon or ruthenium oxide on the ceramic substrate that slides with the sliding contact should be
-The contact reliability is improved by replacing it with a Pb-based conductor paste and firing it, or by stacking and firing the Ag-Pd-based conductor paste on the part that slides on the sliding contact of the thick film resistance pattern. Ag contact material of Ag-
Pd is replaced with 30-50 wt%.
然し乍ら、厚膜抵抗パターンと接点材が同種の組合せの
為、容易に凝着、剥離が起こり、摩耗が促進される。又
Ag−Pd30〜50wt%の接点材はHv160〜200で硬すぎるのに
対し、Ag−Pd系の導体ペーストの焼成物である厚膜導体
パターンが軟らかい為、摩耗が多くなり、早期に寿命と
なる。更にAg−Pd30〜50wt%接点材は、電気伝導度(IA
CS3.8〜5.5)が低い為、発熱する等の問題点があった。However, since the thick film resistance pattern and the contact material are the same kind of combination, adhesion and peeling easily occur, and wear is promoted. or
The contact material of Ag-Pd 30 to 50 wt% is too hard at Hv160 to 200, while the thick film conductor pattern, which is a fired product of Ag-Pd-based conductor paste, is soft and wears a lot, leading to early life. . Furthermore, the Ag-Pd 30 to 50 wt% contact material has an electrical conductivity (IA
Since CS3.8 to 5.5) is low, there were problems such as heat generation.
(発明の目的) 本発明は、上記問題点を解決することのできる摺動接点
装置を提供することを目的とするものである。(Object of the Invention) It is an object of the present invention to provide a sliding contact device that can solve the above problems.
(問題点を解決するための手段) 前記の問題点を解決するための本発明の摺動接点装置
は、セラミック基板上に、抵抗ペースト焼成して厚膜抵
抗パターンを形成し、この厚膜抵抗パターンに接続して
Ag導体ペーストを焼成して厚膜導体パターンを形成して
成る配線板と、この配線板の厚膜導体パターンに対向し
て摺動し得るようになされAg〜Cu3〜20wt%の接点材が
スプリング端子材に取付けられて成るすり接点とにより
構成されていることを特徴とする。(Means for Solving Problems) A sliding contact device of the present invention for solving the above problems is formed by forming a thick film resistance pattern by firing a resistance paste on a ceramic substrate. Connect to the pattern
A wiring board made by firing an Ag conductor paste to form a thick film conductor pattern and a contact material of Ag to Cu3 to 20 wt% that can slide against the thick film conductor pattern of this wiring board is a spring. It is characterized by comprising a sliding contact mounted on a terminal material.
本発明の摺動接点装置に於いて、すり接点の接点材をAg
−Cu3〜20wt%とした理由は、Ag中のCuが3wt%未満だと
潤滑効果が薄く、そのすり接点がセラミック基板上のAg
の厚膜導体パターンとの接触に於いて凝着、剥離が生
じ、20wt%超えると、酸化物が生成されてノイズの発生
原因となるからである。In the sliding contact device of the present invention, the contact material of the sliding contact is Ag
-The reason for setting Cu3 to 20wt% is that if the Cu content in Ag is less than 3wt%, the lubrication effect is small, and the sliding contact is
This is because adhesion and peeling occur in contact with the thick film conductor pattern, and when it exceeds 20 wt%, oxides are generated and cause noise.
(作用) 上記の如く構成された摺動接点装置は、すり接点とセラ
ミックス基板上の厚膜導体パターンとの接触作用におい
て、すり接点のAg−Cu3〜20wt%接点材の硬さ(Hv110〜
150)が軟らかく滑りやすいので、接触抵抗が低く安定
していて、Ag厚膜導体パターンを損耗することが無く、
又凝着、剥離が殆ど無くなり、摩耗が減少するので、良
好な接触が得られる。更にすり接点のAg−Cu3〜20wt%
接点材の電気伝導度がIACS80〜95%と良好であるので、
発熱しない。(Operation) In the sliding contact device configured as described above, in the contact action between the sliding contact and the thick film conductor pattern on the ceramic substrate, the hardness of the contact material is Ag-Cu3 to 20 wt% (Hv110 to
150) is soft and slippery, so the contact resistance is low and stable, and the Ag thick film conductor pattern is not damaged.
Also, since adhesion and peeling are almost eliminated and wear is reduced, good contact can be obtained. In addition, Ag-Cu3 to 20wt% of sliding contact
Since the electrical conductivity of the contact material is as good as IACS 80-95%,
No fever.
(実施例1) 本発明の摺動接点装置の実施例を説明すると、図に示す
如き板厚0.6mm、直径30mmの純度98%のAl2O3基板1上の
外周に幅3mmでRuO2の抵抗ペーストをスクリーン印刷
し、800℃で焼成して厚さ10μの厚膜抵抗パターン2を
形成し、この厚膜抵抗パターン2に接続して、周方向
に、Ag導体ペーストとスクリーン印刷し、800℃で焼成
して、0.2mm間隔に幅0.2mm、長さ7mm、厚さ10μの厚膜
導体パターン3を形成して配線板4とした。一方、この
配線板4の厚膜導体パターン3に対向して夫々摺動する
ようになされた2種のすり接点5は、Ag−Cu7.5wt%とA
g−Cu16.0wt%−ニッケル0.1wt%の2種の接点線材(直
系1.5mm)から作製した頭部径3mm、頭部厚さ0.6mm、脚
部径1.5mm、脚部長1.5mmの2種のリベット接点6を、夫
々幅4mm、厚さ0.15mmのBe−Cuより成るスプリング端子
材7の接点取付穴に挿入しかしめて成るものである。(Example 1) An example of the sliding contact device of the present invention will be described. As shown in the figure, RuO 2 with a width of 3 mm on the outer periphery of an Al 2 O 3 substrate 1 having a plate thickness of 0.6 mm and a diameter of 30 mm and a purity of 98%. Screen printing of the resistance paste of No. 2 and baking at 800 ° C. to form a thick film resistance pattern 2 having a thickness of 10 μ, connecting to this thick film resistance pattern 2 and screen printing with Ag conductor paste in the circumferential direction, By firing at 800 ° C., a thick film conductor pattern 3 having a width of 0.2 mm, a length of 7 mm and a thickness of 10 μ was formed at intervals of 0.2 mm to obtain a wiring board 4. On the other hand, the two types of sliding contacts 5 which are adapted to slide respectively facing the thick film conductor pattern 3 of the wiring board 4 are Ag-Cu 7.5 wt% and A
Two types of head diameter 3mm, head thickness 0.6mm, leg diameter 1.5mm, leg length 1.5mm made from two types of contact wire material (direct type 1.5mm) of g-Cu16.0wt% -nickel 0.1wt% The rivet contacts 6 are inserted into the contact mounting holes of the spring terminal material 7 made of Be-Cu each having a width of 4 mm and a thickness of 0.15 mm.
このように構成された実施例1、2の摺動接点装置と、
Ag−Pd30wt%接点材を有するすり接点を配線板Ag−Pd30
wt%の厚膜導入パターンと対向させて成る従来の摺動接
点装置とを、下記の試験条件にて摺動開閉試験を行った
処、下記の表に示すような結果を得た。A sliding contact device of Examples 1 and 2 configured in this way,
Ag-Pd30 wt% Soil contact with contact material Wiring board Ag-Pd30
A sliding contact test was conducted on a conventional sliding contact device formed by facing a wt% thick film introduction pattern, and the results shown in the following table were obtained.
試験条件 接触力:10g、動作:回転往復型(55度)、駆動:60スト
ローク/min、通電:12V、100mA 上記の表で明らかなように実施例1、2の摺動接点装置
は、従来例の摺動装置に比し、寿命が大概倍増している
ことが判る。これはひとえにすり接点5のAg−Cu3〜20w
t接点材の硬さが軟らかく滑りやすい為、対向するAgの
厚膜導体パターン3を損耗することが無く、又凝着、剥
離することが無く、摩耗が減少し、更にAg−Cu3〜20wt
%接点材の電気伝導度が良好で発熱することが無いから
である。Test condition Contact force: 10g, Operation: Reciprocating rotation type (55 degrees), Drive: 60 strokes / min, Energization: 12V, 100mA As is clear from the above table, it is understood that the sliding contact devices of Examples 1 and 2 generally have a doubled life as compared with the sliding device of the conventional example. This is all about the contact 5 Ag-Cu3-20w
Since the hardness of the t-contact material is soft and slippery, there is no wear on the opposing Ag thick film conductor pattern 3, no adhesion or peeling, and less wear. Ag-Cu3-20wt
% The electrical conductivity of the contact material is good and no heat is generated.
尚、前記の寿命は、厚膜導体パターン3の摩耗により、
すり接点5がAl2O3基板との接触となって、オープン状
態(接点抵抗無限大)となった場合と、厚膜導体パター
ン3間のスリット部の目詰まりによりショートした場合
で判定した。The above-mentioned life is due to the wear of the thick film conductor pattern 3.
It was determined that the sliding contact 5 was in contact with the Al 2 O 3 substrate and was in an open state (infinite contact resistance), and that the slit portion between the thick film conductor patterns 3 was short-circuited.
尚、上記実施例の摺動接点装置の配線板4は円形である
が、矩形でも良いものである。その場合、厚膜抵抗パタ
ーンは矩形の配線板の一側端に形成し、厚膜導体パター
ンは厚膜抵抗パターンに接続してその長手方向に一定間
隔に平行に形成すると良い。そしてすり接点は厚膜導体
パターンに対向して厚膜抵抗パターンの長手方向に摺動
し得るようにする。またセラミックス基板上にベローズ
形状に前後に往復させた厚膜抵抗パターンを形成し、そ
の上に厚膜導体パターンを一定間隔に並べて形成した配
線板と、この配線板の厚膜導体パターンに対向して摺動
するようにしたすり接点とより成る摺動接点装置として
も良い。The wiring board 4 of the sliding contact device of the above embodiment is circular, but may be rectangular. In that case, the thick-film resistance pattern may be formed on one end of the rectangular wiring board, and the thick-film conductor pattern may be connected to the thick-film resistance pattern and formed parallel to the longitudinal direction at regular intervals. The sliding contact faces the thick film conductor pattern and can slide in the longitudinal direction of the thick film resistance pattern. In addition, a thick-film resistance pattern that reciprocates back and forth in a bellows shape is formed on a ceramic substrate, and a thick-film conductor pattern is formed on the thick-film resistance pattern arranged at regular intervals. The sliding contact device may be a sliding contact device configured to slide by sliding.
さらに実施例2のようにCuの一部を0.01〜1wtの範囲で
鉄族元素で置き換えてもよいものである。Further, as in Example 2, part of Cu may be replaced with an iron group element in the range of 0.01 to 1 wt.
(発明の効果) 以上の説明で判るように本発明の摺動接点装置は、すり
接点のAg−Cu3〜20wt%が硬さ(Hv110〜150)が軟らか
く滑りやすいので、接触作用においてセラミックス基板
上のAg厚膜導体パターンが損耗することが無く、又凝
着、剥離が殆んど無くなり、摩耗が減少するので、良好
な接触が得られる。(Effects of the Invention) As can be seen from the above description, the sliding contact device of the present invention has a hardness (Hv110 to 150) of Ag-Cu3 to 20 wt% of the sliding contact is soft and slippery. Since the Ag thick film conductor pattern of No. 1 is not worn, and adhesion and peeling are almost eliminated and wear is reduced, good contact can be obtained.
従って、接触信頼性が向上し、摺動接点装置の寿命が著
しく増長する。更にすり接点のAg−Cu3〜20wt%接点材
の電気伝導度が良好であるので、接触作用において、発
熱せず、溶着が起こりにくい。従って、摺動接点装置の
耐溶着性が著しく向上する。Therefore, the contact reliability is improved and the life of the sliding contact device is significantly extended. Further, since the contact material of Ag-Cu3 to 20 wt% of the sliding contact has a good electric conductivity, the contact action does not generate heat and the welding hardly occurs. Therefore, the welding resistance of the sliding contact device is significantly improved.
図は本発明の摺動接点装置の一実施例を示す概略斜視図
である。FIG. 1 is a schematic perspective view showing an embodiment of the sliding contact device of the present invention.
Claims (1)
成して厚膜抵抗パターンを形成し、この厚膜抵抗パター
ンに接続してAg導体ペーストを焼成して厚膜導体パター
ンを形成して成る配線板と、この配線板の厚膜導体パタ
ーンに対向して摺動し得るようになされAg−Cu3〜20wt
%の接点材がスプリング端子材に取り付けられて成るす
り接点とにより構成されていることを特徴とする摺動接
点装置。1. A wiring formed by firing a resistance paste on a ceramic substrate to form a thick-film resistance pattern, connecting the thick-film resistance pattern and firing an Ag conductor paste to form a thick-film conductor pattern. The board and the thick film conductor pattern of this wiring board can be made to slide opposite to each other.
% Of the contact material is attached to the spring terminal material, and the sliding contact is formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11031687A JPH077733B2 (en) | 1987-05-06 | 1987-05-06 | Sliding contact device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11031687A JPH077733B2 (en) | 1987-05-06 | 1987-05-06 | Sliding contact device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63274106A JPS63274106A (en) | 1988-11-11 |
| JPH077733B2 true JPH077733B2 (en) | 1995-01-30 |
Family
ID=14532626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11031687A Expired - Lifetime JPH077733B2 (en) | 1987-05-06 | 1987-05-06 | Sliding contact device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH077733B2 (en) |
-
1987
- 1987-05-06 JP JP11031687A patent/JPH077733B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63274106A (en) | 1988-11-11 |
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