JPH0783744B2 - X-ray tomography system - Google Patents
X-ray tomography systemInfo
- Publication number
- JPH0783744B2 JPH0783744B2 JP62138756A JP13875687A JPH0783744B2 JP H0783744 B2 JPH0783744 B2 JP H0783744B2 JP 62138756 A JP62138756 A JP 62138756A JP 13875687 A JP13875687 A JP 13875687A JP H0783744 B2 JPH0783744 B2 JP H0783744B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- resolution
- subject
- detector
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はX線断層撮影装置に係り、特に、主として平行
に近いX線束を用いて、被検体の注目部分をより高分解
能に計測し得るX線断層撮影装置に関する。Description: TECHNICAL FIELD The present invention relates to an X-ray tomography apparatus, and in particular, it is possible to measure a target portion of a subject with higher resolution by using an X-ray flux that is mainly parallel. The present invention relates to an X-ray tomography apparatus.
X線断層撮影装置(X線CT;X−ray,ComputedTomograph
y)は人体の診断装置として考案され、現在では広く医
療機関で用いられているが、近年本装置は工業材料の欠
陥や異物の検査等へ応用されるなど、その広い技術的可
能性が注目されている。ところで、ここ数年、このよう
なX線断層撮影装置に、被検体の一部分のみをより高分
解能に計測表示する機能をもたせる試みがなされてい
る。例えば、人体の全身を計測できる装置で、頭部のみ
をより高分解能に計測できれば便利となるからである。X-ray tomography system (X-ray CT; X-ray, Computed Tomograph
y) was devised as a human body diagnostic device and is now widely used in medical institutions, but in recent years this device has been applied to inspection of defects in industrial materials and foreign substances, and its wide technical potential has been noted. Has been done. By the way, in recent years, attempts have been made to provide such an X-ray tomography apparatus with a function of measuring and displaying only a part of a subject with higher resolution. This is because, for example, it would be convenient if an apparatus capable of measuring the whole body of a human body could measure only the head with higher resolution.
医療用では、例えば特開昭56−161039号公報で、位置敏
感型の検出器で中央部の素子間隔が狭く、端部は両側と
も素子間隔が広いものを用いることで、中央の注目部分
のみ高分解能を断層像とするような手法がとりあげられ
ている。また、特開昭58−32749号公報でも、検出器に
中央部に素子が密の検出器、その片方に素子が粗の検出
器をつなげたような形状のものを用いている。また、フ
アンビームも、光源と回転中心を結ぶ線に対し対称でな
いようなものを用い、中央部の注目部分のみを高分解能
に計測・表示する手法が提出されている。さらに、特開
昭58−149739号公報では、第2世代の装置に関して、走
査の量を減らし、注目部分の外側は外挿を行つて、注目
部分のみ高分解能な断層像を得ることのできる手法が記
述されている。For medical use, for example, in Japanese Unexamined Patent Publication No. 56-161039, by using a position-sensitive detector with a narrow element gap in the central portion and wide element gaps on both ends, only the central portion of interest is used. Techniques such as high-resolution tomographic images have been taken up. Further, in Japanese Patent Laid-Open No. 58-32749, a detector having a shape in which a detector having a dense element in the central portion and a detector having a coarse element is connected to one of the detectors is used. In addition, there has been proposed a method for measuring and displaying only the focused portion of the central portion with high resolution by using a fan beam which is not symmetrical with respect to the line connecting the light source and the center of rotation. Further, in Japanese Laid-Open Patent Publication No. 58-149739, a method for reducing the amount of scanning for the second-generation apparatus and extrapolating the outside of the target portion to obtain a high-resolution tomographic image only in the target portion. Is described.
また、後述する本発明の実施例で単色X線による断層像
計測について説明するが、その単色X線を利用した断層
像計測については、特開昭54−151387号公報等がある。
また、シンクロトロン軌道放射光を用いた単色X線によ
る断層像計測については、L.Grodzins,Nuclear Instrum
ents and Methods,206,p.541,p.547(1983),およびA.
C.Thompson,et al.,Nuclear Instruments and Methods in Physical Research,222,
P.319(1987)等の報告がなされている。このような単
色X線の利用は、断層像の定量性の向上に極めて有効で
ある。Further, although a tomographic image measurement using a monochromatic X-ray will be described in an embodiment of the present invention described later, Japanese Patent Application Laid-Open No. 54-151387 discloses the tomographic image measurement using the monochromatic X-ray.
Regarding tomographic image measurement by monochromatic X-ray using synchrotron orbit synchrotron radiation, L. Grodzins, Nuclear Instrum
ents and Methods, 206, p.541, p.547 (1983), and A.
C. Thompson, et al., Nuclear Instruments and Methods in Physical Research, 222,
Reports such as P.319 (1987) have been made. The use of such monochromatic X-rays is extremely effective in improving the quantitativeness of tomographic images.
注目部分の断層像を高分解能に計測・表示しようとする
場合、従来発明では、前述したように、検出器に素子間
隔の狭い領域と広い領域とを組み合わせたような複雑形
状のものを用いる必要があつた。しかし、特に工業材料
の評価等のために非常に素子間隔が狭い検出器を用いた
場合、このような複雑形状のものを準備するのは、実際
上難しいという問題があつた。In order to measure and display a tomographic image of a portion of interest with high resolution, in the conventional invention, as described above, it is necessary to use a detector having a complicated shape such as a combination of a region with a narrow element spacing and a region with a wide element spacing. I got it. However, particularly when a detector having a very narrow element interval is used for evaluation of industrial materials and the like, it is actually difficult to prepare such a complicated shape.
また一方で、CT技術の課題として現在達成できる検出器
の分解能より、より高分解能な断層像を、注目部分だけ
でよいから入手したいという要望や、高分解能の検出器
を用いた場合、その検出器の全長より幅のある被検体の
注目部分を、高分解能に計測したいといつたことがあ
る。On the other hand, as a task of CT technology, there is a desire to obtain a tomographic image with a higher resolution than the resolution of the detector currently achievable, because only the part of interest is required. There is a case where I want to measure with high resolution a portion of the subject that is wider than the entire length of the vessel.
本発明の目的は、以上の点をふまえて、検出器に複雑形
状のものを用いないでも、注目部分の断層像をより高分
解能に計測することが可能な装置を提供することにあ
る。In view of the above points, an object of the present invention is to provide an apparatus capable of measuring a tomographic image of a target portion with higher resolution without using a detector having a complicated shape.
X線源と、被検体を透過したX線を検出する検出器と、
この検出器で得られた透過量計測データを処理して被検
体の断層像を得るデータ処理装置とからなるX線断層撮
影装置において、X線経路中に設けられる非対称反射結
晶板より成る分解能変更手段を備え、データ処理装置は
前記被検体の全体を透過するX線とこの分解能変更手段
で被検体の注目部分を透過するX線を反射させ拡大した
X線が検出器で検出されてそれぞれ得られる二組の透過
量計測データに基づいて、或いは前記注目部分を透過し
たX線と前記分解能変更手段で被検体の全体を透過する
X線を反射させ縮小したX線が検出器で検出されてそれ
ぞれ得られる二組の透過量計測データに基づいて、被検
体の注目部分の高分解能な断層像を得られるものであ
る。An X-ray source and a detector for detecting X-rays transmitted through the subject;
An X-ray tomography apparatus comprising a data processing apparatus for processing transmission amount measurement data obtained by this detector to obtain a tomographic image of a subject, and changing resolution by an asymmetric reflection crystal plate provided in an X-ray path. The data processing device is provided with a means, and the X-ray transmitted through the entire subject and the X-ray transmitted through the target portion of the subject are reflected by the resolution changing means, and enlarged X-rays are detected by the detector and obtained. Based on the two sets of transmission amount measurement data obtained, or the detector detects X-rays that have been reduced by reflecting the X-rays that have passed through the portion of interest and the X-rays that have passed through the entire subject by the resolution changing means. It is possible to obtain a high-resolution tomographic image of the target portion of the subject based on the two sets of transmission amount measurement data obtained.
本発明によれば、一定の分解能の検出器であつても、被
検体の注目部分の高分解能な断層像が得られる。According to the present invention, a high-resolution tomographic image of a target portion of a subject can be obtained even with a detector having a constant resolution.
また、本発明によれば、分解能変更手段を設けるだけ
で、検出器自体の分解能を高めるために該検出器の構造
を複雑化する必要なく、高分解能の透過量計測データが
得られる。Further, according to the present invention, only by providing the resolution changing means, it is possible to obtain high resolution transmission amount measurement data without complicating the structure of the detector itself in order to increase the resolution of the detector itself.
すなわち、被検体全体の断層像計測と、注目部分のより
高分解能な計測の2度の計測により、それらのデータを
組み合わせることで、注目部分の高分解能な断層像を得
ることができる。特に、平行に近いX線束を用いた場
合、非対称反射結晶板を分解能変更手段として用いるこ
とができ、像の拡大が可能なため、これを注目鵜分の計
測に応用することで、使用する位置敏感型の検出器固有
の分解能より高い分解能で、注目部分の断層像を得るこ
とが可能となる。これは、素子間隙が狭く、もともと分
解能の高い検出器を用いた場合、それ以上の分解能を検
出器の工作で出すのは難しいので、非常に有効である。That is, a high-resolution tomographic image of the target portion can be obtained by combining the data by measuring the tomographic image of the entire subject and measuring the target portion with higher resolution. In particular, when an X-ray flux close to parallel is used, the asymmetric reflection crystal plate can be used as the resolution changing means and the image can be magnified. Therefore, by applying this to the attention cormorant measurement, the position used It is possible to obtain a tomographic image of the portion of interest at a resolution higher than that of the sensitive detector. This is very effective when a detector with a narrow element gap and a high resolution is originally used, and it is difficult to obtain a resolution higher than that by working the detector.
また、平行に近いX線束の場合は、前記非対称反射結晶
板を逆向きに使うことで像の縮小が可能なため、これを
被検体全体の断層像計測に用いることによって、検出器
の全長より幅のある被検体の計測が可能となる。これ
は、分解能の高い検出器を用いた場合、どうしても検出
器の全長が短かくなるので、その場合に有効である。あ
との2例は、非対称反射結晶板を利用することで、結果
的に単色X線による断層像を計測することになるので、
定量性等にも大変優れている。Further, in the case of an X-ray flux that is nearly parallel, the image can be reduced by using the asymmetric reflection crystal plate in the opposite direction. Therefore, by using this for the tomographic image measurement of the entire subject, It is possible to measure a wide range of objects. This is effective in that case because the total length of the detector is inevitably short when a detector with high resolution is used. In the other two examples, by using an asymmetric reflection crystal plate, a tomographic image by monochromatic X-rays will be measured as a result.
It is also excellent in quantification.
X線源として扇形状に拡がるフアンビームを用いた場
合、被検体をX線源側に相対的に近づけることで分解能
向上を達成することができる。しかし、従来の発明で
は、フアンビームから被検体がはみ出る迄動かすことは
なかつた。本発明では、被検体の全体を透過するX線の
計測は、フアンビーム内に被検体を置いて行い、注目部
分の透過X線の計測は、被検体をフアンビームからはみ
出る迄、X線源側へ相対的に近づけて行う。これによ
り、一層の分解能向上が期待できる。本発明の分解能変
更手段は、被検体の支持台を、X線源側にフアンビーム
の拡がり範囲を越える位置迄相対的に接離自在とするこ
とにより構成される。二つの計測データにより被検体の
注目部分の高分解能な断層像を得る点は、前述のものと
変わらない。When a fan beam that spreads in a fan shape is used as the X-ray source, the resolution can be improved by bringing the subject relatively close to the X-ray source side. However, according to the conventional invention, the object is not moved until it protrudes from the fan beam. In the present invention, the measurement of X-rays transmitted through the entire subject is performed by placing the subject in a fan beam, and the measurement of the transmitted X-rays of a target portion is performed by the X-ray source until the subject protrudes from the fan beam. Perform relatively close to the side. As a result, further improvement in resolution can be expected. The resolution changing means of the present invention is configured by making the support base of the subject relatively movable toward and away from the X-ray source side up to a position beyond the spread range of the fan beam. The point that a high-resolution tomographic image of the target portion of the subject is obtained from the two measurement data is the same as that described above.
まず、本発明の原理を概説する。位置敏感型の検出器を
用いた断層像計測法で断層像の空間分解能を決定するの
は、検出素子の間隔である。しかし、技術的にこの間隔
を狭めるには限度があり、断層像の分解能をさらに向上
させるためには、光学系の工夫等が必要である。光源と
して平行に近い単色X線を用いると、非対称反射結晶板
を利用して像の拡大が可能であり、試料部での高い分解
能を達成することができる。第3図は、この像の拡大を
説明したもので、被検体である試料を透過してきた単色
X線1を、回折結晶面19とブラツク角θBをなすように
入射させると、X線は回折結晶面19においてブラツグ反
射し、結晶表面18に対しては、同図に示すような非対称
な角度で出射される。この際、長さl1のものがl2へ拡大
される。その拡大率は、 拡大率=l2/l1=sin(θB+α)/sin(θB+α) …(1) で表わされる。ここで、αは回折結晶面19と結晶表面18
とのなす角である。この方法で、光源に単色光ではな
く、連続光で平行に近いX線を用いると、非対称反射結
晶板の回折結晶面19とちようどブラツグ角θBをなす波
長のX線のみがブラツグ反射され、単色化と拡大を同時
に行うことができる。この手法は、このように利用でき
ることももちろんである。First, the principle of the present invention will be outlined. It is the distance between the detection elements that determines the spatial resolution of the tomographic image by the tomographic image measurement method using the position-sensitive detector. However, there is a limit to narrowing this interval technically, and it is necessary to devise an optical system or the like in order to further improve the resolution of the tomographic image. When monochromatic X-rays that are nearly parallel are used as the light source, the image can be magnified using the asymmetric reflection crystal plate, and high resolution at the sample portion can be achieved. FIG. 3 illustrates the enlargement of this image. When the monochromatic X-ray 1 that has passed through the sample that is the subject is made incident so as to make a black angle θ B with the diffraction crystal plane 19, the X-ray is generated. It is Bragg-reflected on the diffraction crystal plane 19 and is emitted to the crystal surface 18 at an asymmetrical angle as shown in FIG. At this time, the length l 1 is expanded to l 2 . The enlargement ratio is represented by the enlargement ratio = l 2 / l 1 = sin (θ B + α) / sin (θ B + α) (1). Where α is the diffraction crystal plane 19 and the crystal surface 18
It is the angle formed by. In this method, if X-rays that are continuous light and are nearly parallel are used as the light source, only X-rays having a wavelength that forms the diffraction crystal plane 19 of the asymmetric reflection crystal plate and the Brad angle θ B are reflected by the Bragg reflection. Therefore, it is possible to perform monochromaticization and enlargement at the same time. Of course, this method can be used in this way.
本発明は、注目部分の計測に上記方法を用いた装置であ
る。被検体の断層面全体の測定にあつては、分解能変更
手段として非対称反射結晶板を用いずに計測し、続く注
目部分の測定では、非対称反射結晶板による拡大で注目
部分の分解能のよい測定データを得る。これらのデータ
より、検出器の分解能以上の注目部分の高分解能な単色
X線断層像を求めることが可能である。The present invention is an apparatus using the above method for measuring a portion of interest. For the measurement of the entire tomographic plane of the subject, the measurement is performed without using the asymmetric reflection crystal plate as the resolution changing means, and in the subsequent measurement of the portion of interest, the measurement data with good resolution of the portion of interest is magnified by the asymmetric reflection crystal plate. To get From these data, it is possible to obtain a high-resolution monochromatic X-ray tomographic image of the target portion having a resolution higher than that of the detector.
光源が平行に近いX線の場合、結晶による非対称反射
は、第4図に示したごとく、上記のような拡大ばかりで
なく、縮小にも利用できる。素子間隔の狭い検出器は、
全長が短かいので、被検体の断層面全体をカバーできな
いことがある。このような場合、上記縮小法により、被
検体断面全体の断層像測定が可能となる。本発明装置に
は、この手法も用いることができる。すなわち、まず本
縮小法により、被検体の断層面全体の計測を行つたの
ち、注目部分を非対称反射結晶板を置かずに、あるいは
前述した拡大法を用いて測定し、両データから注目部分
の分解能のよい単色X線断層像を求め得る。When the light source is an X-ray which is nearly parallel, the asymmetric reflection by the crystal can be used not only for the enlargement as described above but also for the reduction as shown in FIG. Detectors with narrow element spacing
Since the total length is short, it may not be possible to cover the entire tomographic plane of the subject. In such a case, the reduction method described above makes it possible to measure a tomographic image of the entire cross section of the subject. This method can also be used in the device of the present invention. That is, first, the entire reduction plane of the subject is measured by this reduction method, and then the target portion is measured without placing the asymmetric reflection crystal plate or using the above-mentioned enlargement method, and the target portion is measured from both data. A monochromatic X-ray tomographic image with good resolution can be obtained.
これまで記述してきたように、本発明は、断層像の測定
に当り、被検体の断層面全体の測定と、その中の注目部
分の分解能の高い測定とから、該注目部分の高分解能な
断層像を得ようとするものである。これら二つの測定デ
ータを実際に組み合わせる手法は、種々考えられるが、
両者のアングルピツチ数(投影像の数)を同数に設定し
た場合には、以下のような手法がとれる。それは、各投
影毎に、両データを組み合わせる方法で、その概要を第
5図に示す。同図は、ある投影の吸収曲線を描いたもの
で、Xは検出器のチヤンネル、θは被検体へ入射するX
線の角度、μtは吸光度を示す。図中、全体に拡がつた
曲線22は、断層面全体の計測で得られたデータで、斜線
部21は、高分解能な部分測定で得られた領域である。拡
大図24から分かるように、部分測定で得られたデータ23
は、単位長さ当りの測定チヤンネル数が多くなつてい
る。ところで、像再生を行うためには、等間隔の計測デ
ータが必要であるから、斜線部21の外側の部分を、部分
測定のデータ23の間隔と同じ間隔で分割して、見掛け上
の測定データを算出することで、像再生が可能となる。As described above, the present invention, in measuring a tomographic image, includes measuring the entire tomographic plane of the subject and measuring the high resolution of the target portion in the tomographic image, It is about trying to get an image. There are various possible methods for actually combining these two measurement data,
When the number of angle pitches (the number of projected images) of both is set to the same number, the following method can be adopted. It is a method of combining both data for each projection, and its outline is shown in FIG. This figure shows the absorption curve of a certain projection, where X is the detector channel and θ is the incident X on the subject.
The angle of the line, μt, indicates the absorbance. In the figure, a curve 22 that spreads over the whole is data obtained by measurement of the entire fault plane, and a shaded portion 21 is an area obtained by high-resolution partial measurement. As can be seen from the enlarged view 24, the data obtained from the partial measurement 23
Has a large number of measured channels per unit length. By the way, in order to reproduce an image, it is necessary to have measurement data at equal intervals, so the outer part of the shaded area 21 is divided at the same intervals as the interval of the partial measurement data 23, and apparent measurement data is obtained. By calculating, it becomes possible to reproduce the image.
この見掛け上の測定データを求める方式は、幾通りか考
えられるが、最も単純には、隣り合う二つの計測データ
を直線で結び、それを分割して見掛けの測定データとす
る方法がある。また、隣接する数個から数十個の計測デ
ータについて、2次以上の多項式をカーブフイツトし、
最小自乗法等で最適な曲線を求めて、それを分割する手
法も考えられる。その他分割点から計測点までの距離の
逆数を重みとして、隣接する数個のデータから算出する
手法等も考えられる。いずれにせよ、このような手法で
得られた見掛け上の測定データと、部分測定で得られた
データとを組み合わせることで、像再生が可能となり、
注目部分の高分解能な断層像を得ることができる。There are several possible methods for obtaining the apparent measurement data, but the simplest method is to connect two adjacent measurement data with a straight line and divide them to obtain the apparent measurement data. In addition, for several to several tens of adjacent measurement data, curve fitting a polynomial of degree 2 or higher,
A method of obtaining an optimum curve by the method of least squares and dividing the curve is also conceivable. In addition, a method of calculating from the data of several adjacent points by using the reciprocal of the distance from the division point to the measurement point as a weight is also considered. In any case, by combining the apparent measurement data obtained by such a method and the data obtained by the partial measurement, image reproduction becomes possible,
It is possible to obtain a high-resolution tomographic image of the part of interest.
断層面全体の計測データと、部分測定のデータとを組み
合わせる別の手法として、以下のようなものも考えられ
る。すなわち、断層面全体の像再生をまず行つたのちに
部分測定に移る方法で、予め求める注目部分の領域を、
例えば部分測定のときのスキヤン幅を直径とする円内等
と決めておき、部分測定時の計測データから、この領域
の外側で吸収される量を全体の断層像から求めて差し引
くことで、注目部分の高分解能な断層像を求めることが
できる。第6図は、その手法を示したもので、図中、被
検体6の点線部分28で吸収される量を全体の断層像から
求め、それを計測データから差し引くことで、注目部分
26のみの投影像を得るわけである。27は注目部分のみの
吸収曲線を示す。As another method of combining the measurement data of the entire tomographic plane and the partial measurement data, the following method can be considered. That is, the area of the target portion to be obtained in advance is calculated by the method of first performing image reproduction of the entire tomographic plane and then shifting to partial measurement.
For example, by setting the scanning width at the time of partial measurement as a circle with the diameter as the diameter, etc., and by subtracting the amount absorbed outside this region from the whole tomographic image from the measurement data at the time of partial measurement, A high-resolution tomographic image of a part can be obtained. FIG. 6 shows the method. In the figure, the amount absorbed by the dotted line portion 28 of the subject 6 is obtained from the entire tomographic image, and is subtracted from the measured data to obtain the target portion.
Only 26 projection images are obtained. 27 shows the absorption curve of only the attention part.
点線部分28での吸収量の計算は、種々の方法が考えられ
るが、全体の断層像の各画素を細かく分割して、得られ
た細かな画素の吸収計数を、もともとの大きな画素の値
から求めて、さらに部分測定の各投影時に、各検出素子
に入射するX線の透過領域と、この細かな画素の重なり
具合いから、やはり比例配分等をして点線部分28での吸
収量を求める手法が簡便である。細かな画素の吸収係数
の値は、例えば第7図に示すように、隣接4個の大きな
画素の値から求めればよい。同図において、31は断層像
全体計測時の画素、32は分割により得られた細かな画素
を示す。大きな画素の中心から、求めるべき小さな画素
の中心までの距離の逆数の重みをつけて平均化すること
で、算出することが可能である。本発明装置に含まれる
手法より、第7図の斜線部分で表わされる細かな画素A
(4,4)の吸収係数μA(4,4)は、隣接4個の大きな画
素A,B,C,Dの各吸収係数μA〜μDと、その中心から各
画素の中心までの距離lA〜lDとから、 より求まる。この例では、 となる。Various methods can be considered for calculating the absorption amount in the dotted line portion 28, but each pixel of the entire tomographic image is finely divided, and the absorption coefficient of the obtained fine pixel is calculated from the original large pixel value. Further, a method for obtaining the absorption amount in the dotted line portion 28 by proportional distribution and the like from the transmission region of X-rays incident on each detection element and the overlapping degree of these fine pixels at each projection of each partial measurement Is simple. The value of the absorption coefficient of a fine pixel may be obtained from the values of four large adjacent pixels as shown in FIG. 7, for example. In the figure, 31 is a pixel at the time of measuring the entire tomographic image, and 32 is a fine pixel obtained by division. It is possible to calculate by weighting the reciprocal of the distance from the center of a large pixel to the center of a small pixel to be calculated and averaging. According to the method included in the device of the present invention, the fine pixel A represented by the hatched portion in FIG.
(4,4) of the absorption coefficient mu A (4,4) is adjacent four large pixel A, B, C, and the absorption coefficient μ A ~μ D and D, from the center to the center of each pixel From the distance l A ~ l D , Get more. In this example, Becomes
ところで、このようなデータの組み合わせ手法は、アン
グルピツチ数を合わせる必要がない等の利点がある。By the way, such a data combination method has an advantage that it is not necessary to match the number of angle pitches.
次に、本発明の実施例を第1図に基づいて説明する。初
めに、平行に近いX線束を用い、注目部分の測定にあつ
ては、非対称反射による像の拡大を行うことを特徴とす
る装置について説明する。同図はその概要を示したもの
である。装置は、平行に近いX線束1(または1′)、
そのX線束の形状を整える入射スリツト4(または
4′)、被検体6の透過光の散乱線を一部除去する出射
スリツト5(または5′)、像の拡大を必要に応じて行
うための非対称反射結晶板3よりなる分解能変更手段、
最終的にX線を検出する位置敏感型検出器9(または
9′)、データの出し入れや走査系等への駆動信号送信
を行うシーケンサ13、シーケンサ13をはじめとする系全
体の制御と演算処理を行うコンピユータよりなるデータ
処理装置14、および得られた断層像等を映すための画像
表示装置16,データ保存用の磁気デイスク装置17,人間か
ら命令を送るためのキーボード15等から構成されてい
る。10は検出器用回転ステージ、11は非対称反射結晶板
3用の回転ステージ、12は同結晶板3の移動や調整を行
うための支持台である。また、8は被検体6の支持回転
・走査ステージ、7は被検体6の注目部分を表わしてい
る。2(または2′)、最終的に検出器9(または
9′)で検出するX線束である。Next, an embodiment of the present invention will be described with reference to FIG. First, an apparatus which is characterized in that an X-ray flux close to parallel is used and an image is magnified by asymmetric reflection in measuring a target portion will be described. The figure shows the outline. The device consists of a near parallel X-ray flux 1 (or 1 '),
An entrance slit 4 (or 4 ') for adjusting the shape of the X-ray flux, an exit slit 5 (or 5') for partially removing scattered rays of transmitted light of the subject 6, and an image for enlarging the image as necessary. Resolution changing means consisting of asymmetric reflection crystal plate 3,
Position-sensitive detector 9 (or 9 ') that finally detects X-rays, sequencer 13 that sends and receives data and transmits drive signals to the scanning system, etc. Control and arithmetic processing of the entire system including sequencer 13 A data processing device 14 including a computer for performing the above, an image display device 16 for displaying the obtained tomographic image, etc., a magnetic disk device 17 for storing data, a keyboard 15 for sending a command from a human, etc. . Reference numeral 10 is a rotary stage for the detector, 11 is a rotary stage for the asymmetric reflection crystal plate 3, and 12 is a support base for moving and adjusting the crystal plate 3. Reference numeral 8 denotes a supporting / rotating / scanning stage of the subject 6, and 7 denotes a target portion of the subject 6. 2 (or 2 '), which is the X-ray flux finally detected by the detector 9 (or 9').
最初に、被検体6の断層面全体の計測を行う。その場
合、非対称反射結晶板3の支持台12を移動させて、該結
晶板3がX線束の経路より外れるようにして、位置敏感
型の検出器9′で被検体6の全体透過X線のX線束2′
を検出する。1回の投影像測定が終わつたら、被検体6
を一定角度回転して、次の測定を行う。これを、被検体
6が180度ないし360度回転するまで繰り返して、像再生
に必要な一連の透過量計測データを得る。First, the entire tomographic plane of the subject 6 is measured. In that case, the support 12 of the asymmetric reflection crystal plate 3 is moved so that the crystal plate 3 is out of the path of the X-ray flux, and the position-sensitive detector 9 ′ detects the total transmitted X-rays of the subject 6. X-ray flux 2 '
To detect. When one projection image measurement is completed, the subject 6
Is rotated by a certain angle and the next measurement is performed. This is repeated until the subject 6 rotates 180 to 360 degrees to obtain a series of transmission amount measurement data necessary for image reproduction.
次に、注目部分7の計測に移る。今度は、非対称反射結
晶板3の支持台12を逆方向に移動させて、該結晶板3が
X線束を非対称反射する位置までもつていく。被検体6
を透過したX線は、ここで非対称反射されることで、前
述の第3図に示したごとく拡大されて、位置敏感型の検
出器9へ入射する。この検出器9は、検出器用回転ステ
ージ10により前記検出器9′を同図の位置に移動させた
ものである。そのため、検出器9の分解能で決まつてい
た測定系の解像力は、この拡大された分だけ向上し、よ
り分解能の高い被検体6の計測データを得ることができ
る。入射X線束1が単色光の場合、非対称反射結晶板3
は、その回折結晶面19でその単色X線をブラツグ反射す
るよう入念に調整しておく。また、入射X線束1には連
続光を用い、非対称反射結晶板3で単色化を行う場合に
は、被検体6についての最初の断層面全体の測定の際
に、別途入射X線を分光して、同じ単色X線を得るよう
にする。非対称反射は非常に厳密な条件で行われるた
め、非対称反射結晶板3の結晶表面18の切り出しおよび
セツテイングは、入念に行う必要がある。また、断層像
計測にあたつては、被検体6の回転中心と検出器9,9′
の相互位置に厳密に設定する必要があるので、計測を行
う前に、被検体6の回転中心位置、2回にわたる計測の
検出器9,9′の位置、非対称反射結晶板3の位置や角度
等を十分に調整しておくことが必要である。非対称反射
結晶板3は、用いるX線の波長や拡大率,X線束の形状等
を考慮して準備する必要がある。データ処理に関して気
を付けねばならないことは、非対称反射によつて拡大さ
れたX線束は、左右が反転していることがある。このた
め、両計測データから注目部分7の高分解能な断層像を
求める際には、注意を要する。Next, the measurement of the attention portion 7 will be performed. Next, the support 12 of the asymmetric reflection crystal plate 3 is moved in the opposite direction to bring it to a position where the crystal plate 3 asymmetrically reflects the X-ray flux. Subject 6
The X-rays that have passed through are asymmetrically reflected here, and are expanded as shown in FIG. 3 described above, and are incident on the position-sensitive detector 9. The detector 9 is obtained by moving the detector 9'to the position shown in the figure by a detector rotary stage 10. Therefore, the resolving power of the measurement system, which is determined by the resolution of the detector 9, is improved by this expanded amount, and the measurement data of the subject 6 with higher resolution can be obtained. When the incident X-ray flux 1 is monochromatic light, the asymmetric reflection crystal plate 3
Is carefully adjusted so that the monochromatic X-ray is reflected by the diffraction crystal plane 19 by Bragg reflection. Further, when continuous light is used for the incident X-ray flux 1 and the asymmetric reflection crystal plate 3 is used for monochromatization, the incident X-rays are separately separated during the first measurement of the entire tomographic plane of the subject 6. To obtain the same monochromatic X-ray. Since the asymmetric reflection is performed under extremely strict conditions, it is necessary to carefully cut out and set the crystal surface 18 of the asymmetric reflection crystal plate 3. Further, in measuring the tomographic image, the center of rotation of the subject 6 and the detectors 9, 9 '
Since it is necessary to strictly set the mutual positions of, the position of the center of rotation of the subject 6, the positions of the detectors 9 and 9'of the two measurements, the position and the angle of the asymmetric reflection crystal plate 3 before the measurement. It is necessary to adjust etc. sufficiently. The asymmetric reflection crystal plate 3 needs to be prepared in consideration of the wavelength of the X-rays used, the magnification, the shape of the X-ray flux, and the like. One thing to be aware of regarding data processing is that the X-ray flux expanded by the asymmetric reflection may be flipped left and right. Therefore, caution is required when obtaining a high-resolution tomographic image of the target portion 7 from both measurement data.
本実施例では、平行に近いX線束としてシンクロトロン
軌道放射光を用い、チヤンネルカツト型のSi単結晶分光
器で分光し、単色X線とした。これは、シンクロトロン
軌道放射光がほとんど平行に近く、強度の大きな光だか
らである。検出器9,9′には、素子間隔25μm,高さ2.5m
m,素子数1024個のフオトダイオードアレイを用いた。こ
の検出器9,9′は、X線を検出するために表面にシンチ
レータが塗布してある。分解能変更手段としての非対称
反射結晶板3は、回折面が(220)面であるSi単結晶を
用い、結晶表面18と回折結晶面19とのなす角αは、α=
6.2゜に切り出してある。先ず初めに、断層像全体の計
測を行うために、スリツト4′でX線束を幅30mm,厚さ
0.5mmに成形した。また、非対称反射結晶板3は、支持
台12を動かすことで、X線束の経路より外れるようにし
ておく。検出器9′は、検出器用回転ステージ10により
入射X線1′の正面の位置にもつていつて、測定を行
う。被検体6の回転,投影像測定を繰り返すことで、直
径25mm以内の被検体6の全体断層像である全体透過量計
測データを計測することができる。In this embodiment, synchrotron orbit radiant light was used as an X-ray flux that was nearly parallel, and was dispersed by a channel cut type Si single crystal spectrometer to obtain a monochromatic X-ray. This is because the synchrotron orbital radiation is almost parallel and has high intensity. The detectors 9 and 9'include element spacing of 25 μm and height of 2.5 m.
A photodiode array with m and 1024 elements was used. The detectors 9 and 9'have a scintillator coated on the surface for detecting X-rays. The asymmetric reflection crystal plate 3 as the resolution changing means uses a Si single crystal having a (220) diffraction surface, and the angle α formed between the crystal surface 18 and the diffraction crystal surface 19 is α =
Cut out to 6.2 °. First of all, in order to measure the whole tomographic image, the slit 4 ′ was used to set the X-ray flux to a width of 30 mm and a thickness of
It was molded to 0.5 mm. Further, the asymmetric reflection crystal plate 3 is set so as to be deviated from the path of the X-ray flux by moving the support 12. The detector 9 ′ is brought to the position in front of the incident X-ray 1 ′ by the detector rotation stage 10 and performs measurement. By repeating the rotation of the subject 6 and the measurement of the projected image, it is possible to measure the total transmission amount measurement data, which is the whole tomographic image of the subject 6 within a diameter of 25 mm.
次に、注目部分7の測定を行うために、スリツト4で入
射X線束を幅8mm,厚さ0.5mmに成形した。非対称反射結
晶板3を支持台12によりX線束を非対称反射できる位置
へもつていく。また、非対称反射結晶板3は、測定を始
める前に予め、用いる単色X線が該結晶板3中の回折結
晶面19でブラツグ反射し、検出器9へ入射するよう、そ
の傾きやあおりを調整しておく。検出器9の設定位置
も、測定前に確認しておき、部分計測に移つた際に、そ
の位置まで精度よくもつていく。ここで用いた非対称反
射結晶板3では、波長0.827Å(15keV)の単色X線に対
し約3倍、波長0.620Å(20keV)では約5倍、波長0.49
6Å(25keV)では約11倍の拡大が行われ、これにより、
ほぼその分だけ検出器9の固有の分解能より優れた解像
力を得ることができる。やはり、全体の断層像計測の場
合と同様な走査を行つて、注目部分7の高分解能な要部
透過量計測データを得る。Next, in order to measure the target portion 7, the incident X-ray flux was shaped by the slit 4 to have a width of 8 mm and a thickness of 0.5 mm. The asymmetric reflection crystal plate 3 is brought to a position where the X-ray flux can be asymmetrically reflected by the support 12. Before the measurement is started, the tilt and the tilt of the asymmetric reflection crystal plate 3 are adjusted so that the monochromatic X-rays to be used are reflected by the diffraction crystal plane 19 in the crystal plate 3 and incident on the detector 9. I'll do it. The setting position of the detector 9 is also confirmed before the measurement, and when the partial measurement is started, the position is accurately brought to that position. The asymmetric reflection crystal plate 3 used here is about 3 times as much as a monochromatic X-ray with a wavelength of 0.827Å (15 keV), about 5 times at a wavelength of 0.620 Å (20 keV), and a wavelength of 0.49.
At 6 Å (25keV), about 11 times expansion is performed,
A resolution superior to the inherent resolution of the detector 9 can be obtained by almost that amount. After all, the same scanning as in the case of measuring the entire tomographic image is performed to obtain high-resolution main part transmission amount measurement data of the target portion 7.
このようにして得た2組の計測データから、注目部分7
の分解能の高い断層像を求める手法としては、既述した
二つの方法を用いた。すなわち、一つは、各投影像毎に
補正する手法で、見掛けの測定データを、隣接チヤネル
のデータの直線近似より求めた(第5図)。他の手法
は、一旦全体の断層像を求めて、注目部分7より外側の
吸収量を算出し、この注目部分7の計測データより差し
引くことで、該注目部分7のみの投影像を求め、それか
ら断層像を求める手法である。(第6図)。From the two sets of measurement data obtained in this way,
As the method of obtaining a tomographic image with high resolution, the above-mentioned two methods were used. That is, one is a method of correcting each projected image, and apparent measurement data is obtained by linear approximation of data of adjacent channels (FIG. 5). Another method is to obtain the entire tomographic image once, calculate the absorption amount outside the attention portion 7, and subtract it from the measurement data of the attention portion 7 to obtain the projection image of only the attention portion 7, and then This is a method for obtaining a tomographic image. (Fig. 6).
以上、注目部分7の測定の際に、非対称反射結晶板3を
用いた非対称反射による像拡大に応用した場合の一例に
つき記述したが、本発明は、本実施例に限定されるもの
ではない。測定系およびデータの組み合わせ法は、その
他の選択や組み合わせが可能である。光源は、キンクロ
トロン軌道放射光以外のもので、無論かまわない。検出
器9,9′も、本実施例に用いたフオトダイオードアレイ
ばかりでなく、医療用によく用いられるガスチエンバ
や、またより分解能の高い撮像管等を利用することもで
きる。非対称反射結晶板3は、拡大率,反射率,X線束の
形状,X線の波長等を考慮して、できれば数種類用意して
おくのがよい。また、X線が全く平行ではなく、わずか
な拡がりをもつている場合には、非対称反射結晶板3を
わずかに凹面になるように加工して用いることも可能で
ある。X線を当初は単色化せずに、非対称反射の際、は
じめて単色化することも可能だが、その場合は、全体の
断層像計測時に別途分光を行つて、必要な単色X線を取
り出し、断層面の位置を注意深く合わせて計測を行う必
要がある。As described above, an example of application to image enlargement by asymmetric reflection using the asymmetric reflection crystal plate 3 at the time of measuring the attention portion 7 has been described, but the present invention is not limited to this embodiment. Other choices and combinations of measurement systems and data combination methods are possible. The light source is not limited to the synchrotron orbit synchrotron radiation, and of course, it does not matter. As the detectors 9 and 9 ', not only the photodiode array used in this embodiment, but also a gas chamber often used for medical purposes, an imaging tube having a higher resolution, or the like can be used. Several types of asymmetric reflection crystal plates 3 are preferably prepared in consideration of magnification, reflectance, X-ray flux shape, X-ray wavelength, and the like. In addition, when the X-rays are not completely parallel and have a slight spread, the asymmetric reflection crystal plate 3 can be processed so as to have a slightly concave surface and used. It is also possible to convert the X-rays to monochromatic for the first time at the time of asymmetric reflection without monochromating the X-rays, but in that case, separate spectroscopy is performed when measuring the entire tomographic image to extract the necessary monochromatic X-rays and It is necessary to carefully measure the positions of the surfaces.
次に、第2図に基づいて他実施例を示す。この実施例
は、平行に近いX線束を用い、全体の断層像計測時に非
対称反射による像の縮小を行うことを特徴とする装置の
事例である。装置の構成は第1図のものと同様である。
ただし、分解能変更手段である非対称反射結晶板3が拡
大ではなく、縮小を行う向きに固定されている。最初に
被検体6の断層面全体の計測を行う場合は、該結晶板3
の支持台12を移動させて、該結晶板3が入射X線1のX
線束を非対称反射する位置までもつていく。被検体6を
透過したX線は、ここで非対称反射されることで縮小さ
れて、位置敏感型の検出器9へ入射する。この手法によ
り、検出器9の全長より幅のある被検体6の断層像の計
測が可能となる。次に、注目部分7の計測を行う。該結
晶板3の支持台12を移動させて、該結晶板3がX線束の
経路より外れるようにして、そのまま入射X線1の正面
に設置した検出器9′で、被検体6の透過光を検出す
る。あるいは、非対称反射結晶案3の上にさらに拡大用
の非対称反射結晶板を並設して拡大を行い、より小さい
領域をより高分解能に計測してもよい。本実施例では、
非対称反射結晶板3を縮小用として用いるため、該結晶
板3を透過X線の経路から外すことが、分解能を向上さ
せることになる。計測走査および光学系・非対称反射結
晶板の調整、前準備等は、前記実施例と同様である。ま
た、非対称反射の際には、やまり左右が反転する点も同
様である。本縮小法の利用は、素子間隔の狭い位置敏感
型の検出器9はどうしても全長が短かくなるので、その
ような検出器9を用いた場合に、特に有効である。Next, another embodiment will be described with reference to FIG. This embodiment is an example of an apparatus characterized in that an X-ray flux that is nearly parallel is used and an image is reduced by asymmetric reflection when measuring the entire tomographic image. The structure of the device is similar to that of FIG.
However, the asymmetric reflection crystal plate 3 which is the resolution changing means is fixed in a direction in which it is contracted, not expanded. When first measuring the entire tomographic plane of the subject 6, the crystal plate 3
By moving the support 12 of the crystal plate 3 to the X-ray of the incident X-ray 1.
Bring the flux to the position where it is asymmetrically reflected. The X-rays that have passed through the subject 6 are asymmetrically reflected here, reduced in size, and incident on the position-sensitive detector 9. With this method, it is possible to measure a tomographic image of the subject 6 having a width wider than the entire length of the detector 9. Next, the attention portion 7 is measured. The support 12 of the crystal plate 3 is moved so that the crystal plate 3 deviates from the path of the X-ray flux, and the transmitted light of the object 6 is detected by the detector 9'installed directly in front of the incident X-ray 1. To detect. Alternatively, an asymmetric reflection crystal plate for enlargement may be further provided in parallel on the asymmetric reflection crystal plan 3 for enlargement, and a smaller region may be measured with higher resolution. In this embodiment,
Since the asymmetric reflection crystal plate 3 is used for reduction, removing the crystal plate 3 from the path of the transmitted X-ray improves the resolution. The measurement scanning, the adjustment of the optical system and the asymmetric reflection crystal plate, the preparation, etc. are the same as those in the above-mentioned embodiment. The same applies to the case where the asymmetric reflection is stopped and the left and right sides are reversed. The use of this reduction method is particularly effective when such a detector 9 is used, because the position-sensitive detector 9 having a narrow element interval has a short total length.
本実施例では、前記実施例と全く同様なシステムをとつ
た。すなわち、X線束にはシンクロトロン軌道放射光を
分光したものを用い、検出器9にはフオトダイオードア
レイを、また非対称反射結晶板3は全く同じものを向き
を変えて、縮小を行うように固定した。断層全体の計測
にあつては、スリツト4でX線束を幅60mm,厚さ0.5mmに
成形し、また被検体6を透過したX線を非対称反射結晶
板3で縮小して、検出器9に入射するようにした。ま
た、注目部分7の計測では、ここではスリツト4′でX
線束を幅15mm,厚さ0.5mmに成形し、それを入射光の正面
に置いた検出器9′で検出するようにした。前記実施例
と同様な手法により、両計測データを組み合わせて、注
目部分7の高分解能な断面像を得た。因みに、縮小率
は、前記実施例の拡大率の逆数で、波長0.827Å(15ke
V)では約1/3,波長0.620Å(20keV)では約1/5である。
測定系,走査系,2組の計測データの組み合わせ法等、本
発明が本実施例に限定されるものでないことは、前記実
施例と全く同様である。特に、より分解能の高い検出器
である撮影管等を用いた場合、検出器の全長が短かく、
本発明は有効である。被検体6を大きくしていくと、そ
れだけ縮小率を上げる必要があるが、その際、非対称反
射結晶板3の全長も、より長いものが必要になる。In this embodiment, a system exactly the same as that of the above embodiment is adopted. That is, a synchrotron orbit radiated light is used as the X-ray flux, a photodiode array is used as the detector 9, and the same asymmetric reflection crystal plate 3 is turned to the same direction and fixed so as to perform reduction. did. For the measurement of the entire fault, the slit 4 forms an X-ray flux with a width of 60 mm and a thickness of 0.5 mm, and the X-rays transmitted through the subject 6 are reduced by the asymmetric reflection crystal plate 3 to be applied to the detector 9. It was made incident. In addition, in the measurement of the attention portion 7, here, X at the slit 4 '.
The line bundle was formed into a width of 15 mm and a thickness of 0.5 mm, and it was detected by a detector 9'placed in front of the incident light. The measurement data were combined by the same method as in the above-described example to obtain a high-resolution cross-sectional image of the target portion 7. Incidentally, the reduction rate is the reciprocal of the enlargement rate of the above-mentioned embodiment, and is the wavelength 0.827Å (15 ke
V) is about 1/3, and wavelength 0.620Å (20keV) is about 1/5.
The present invention is not limited to the present embodiment, such as the measurement system, the scanning system, the method of combining two sets of measurement data, and the like, exactly like the above-mentioned embodiments. In particular, when a photo tube such as a detector with higher resolution is used, the total length of the detector is short,
The present invention is effective. As the size of the subject 6 is increased, it is necessary to increase the reduction rate by that amount, but at this time, the total length of the asymmetric reflection crystal plate 3 is also required to be longer.
本発明装置によれば、一定の分解能の検出器に、被検体
の全体と注目部分とを各々別個に透過させたX線であつ
て、少なくともその一方を分解能増加手段により分解能
を異ならせた二組の透過X線を導き、これにより得られ
る二組の透過量計測データからデータ処理装置によつ
て、被検体の注目部分の断層像を検出器の固有分解能よ
り高分解にて得ることができる。According to the device of the present invention, a detector having a constant resolution is an X-ray that separately transmits the entire subject and a target portion, and at least one of the X-rays has a different resolution by the resolution increasing means. A set of transmitted X-rays is derived, and from the two sets of transmission amount measurement data obtained thereby, a tomographic image of the target portion of the subject can be obtained with a higher resolution than the intrinsic resolution of the detector by the data processing device. .
また、本発明装置によれば、分解能変更手段を設けるだ
けで、該検出器の構造を複雑化する必要なく、高分解能
の透過量計測データを得ることができるので、構造簡単
にして、被検体の注目部分の断層像を高分解能で得るこ
とができる。Further, according to the device of the present invention, it is possible to obtain high-resolution transmission amount measurement data without complicating the structure of the detector simply by providing the resolution changing means. It is possible to obtain a tomographic image of the part of interest at a high resolution.
さらに、本発明装置によれば、分解能変更手段を前記と
逆方向に使用することにより、検出器の全長より幅のあ
る被検体の計測も可能となる。Further, according to the device of the present invention, by using the resolution changing means in the opposite direction to the above, it is possible to measure an object having a width wider than the entire length of the detector.
第1図は本発明の一実施例に係るX線断層撮影装置の構
成図、第2図は本発明の他実施例に係る同構成図、第3
図,第4図はそれぞれ非対称反射結晶板による像の拡
大,縮小の原理図、第5図,第6図は断層像全体の計測
データと注目部分の計測データとの組み合わせ法の説明
図、第7図は第6図の吸収係数の求め方を示す説明図で
ある。 1,1′……平行に近い入射X線、2,2′……検出X線、3
……非対称反射結晶板、4,4′……入射スリツト、5,5′
……出射スリット、6……被検体、7……注目部分、8
……被検体支持回転・走査ステージ、9,9′……位置敏
感型検出器、10……検出器用回転ステージ、11……非対
称反射結晶板用回転ステージ、12……非対称反射結晶板
用支持台、13……シーケンサ、14……データ処理装置、
15……キーボード、16……画像表示装置、17……磁気デ
イスク装置。FIG. 1 is a configuration diagram of an X-ray tomography apparatus according to an embodiment of the present invention, and FIG. 2 is a configuration diagram of another embodiment of the present invention, and FIG.
Figures 4 and 5 are principle diagrams of image enlargement and reduction by an asymmetric reflection crystal plate, respectively, and Figures 5 and 6 are explanatory diagrams of a combination method of measurement data of the entire tomographic image and measurement data of a target portion, respectively. FIG. 7 is an explanatory diagram showing how to obtain the absorption coefficient in FIG. 1,1 ′ …… X-rays that are nearly parallel, 2,2 ′ …… Detected X-rays, 3
...... Asymmetric reflection crystal plate, 4,4 ′ …… Injection slit, 5,5 ′
...... Exit slit, 6 …… Subject, 7 …… Attention part, 8
...... Subject support rotation / scanning stage, 9,9 '…… Position sensitive detector, 10 …… Detector rotation stage, 11 …… Asymmetric reflection crystal plate rotation stage, 12 …… Asymmetric reflection crystal plate support Base, 13 ... Sequencer, 14 ... Data processing device,
15 …… Keyboard, 16 …… Image display device, 17 …… Magnetic disk device.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 宇佐美 勝久 茨城県日立市久慈町4026番地 株式会社日 立製作所日立研究所内 (56)参考文献 特開 昭57−200134(JP,A) ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Katsuhisa Usami 4026 Kuji Town, Hitachi City, Ibaraki Prefecture Hitachi Research Laboratory, Hitachi, Ltd. (56) References JP-A-57-200134 (JP, A)
Claims (2)
る検出器と、この検出器で得られた透過量計測データを
処理して被検体の断層像を得るデータ処理装置とからな
るX線断層撮影装置において、X線経路中に設けられる
非対称反射結晶板より成る分解能変更手段を備え、デー
タ処理装置は前記被検体の全体を透過するX線とこの分
解能変更手段で被検体の注目部分を透過するX線を反射
させ拡大したX線が検出器で検出されてそれぞれ得られ
る二組の透過量計測データに基づいて、或いは前記注目
部分を透過したX線と前記分解能変更手段で被検体の全
体を透過するX線を反射させ縮小したX線が検出器で検
出されてそれぞれ得られる二組の透過量計測データに基
づいて、被検体の注目部分の高分解能な断層像を得るも
のとしたことを特徴とするX線断層撮影装置。1. An X-ray source, a detector for detecting X-rays transmitted through an object, and a data processing device for processing transmission amount measurement data obtained by the detector to obtain a tomographic image of the object. In the X-ray tomography apparatus, the data processing apparatus includes resolution changing means formed of an asymmetric reflection crystal plate provided in the X-ray path, and the data processing apparatus uses the X-rays that penetrate the entire subject and the resolution changing means. On the basis of two sets of transmission amount measurement data obtained by detecting and enlarging the X-rays transmitted by the X-ray transmitted through the target portion, or by the X-ray transmitted through the target portion and the resolution changing means. In this way, a high-resolution tomographic image of the target portion of the subject is obtained based on two sets of transmission amount measurement data obtained by detecting the reduced X-rays by reflecting and reducing the X-rays that pass through the entire subject. Specializing in what you got X-ray tomography apparatus according to.
ファンビームとし、分解能変更手段を被検体の支持台を
X線源側にファンビームの拡がり範囲を越える位置まで
相対的に接離自在とする構成にしたX線断層撮影装置。2. The X-ray source according to claim 1, wherein the X-ray source is a fan beam, and the resolution changing means relatively contacts the support base of the subject to the X-ray source side to a position beyond the spread range of the fan beam. An X-ray tomography apparatus configured to be detachable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62138756A JPH0783744B2 (en) | 1987-06-02 | 1987-06-02 | X-ray tomography system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62138756A JPH0783744B2 (en) | 1987-06-02 | 1987-06-02 | X-ray tomography system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63302829A JPS63302829A (en) | 1988-12-09 |
| JPH0783744B2 true JPH0783744B2 (en) | 1995-09-13 |
Family
ID=15229449
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62138756A Expired - Fee Related JPH0783744B2 (en) | 1987-06-02 | 1987-06-02 | X-ray tomography system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0783744B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101626770B1 (en) | 2016-01-22 | 2016-06-02 | 주식회사 홈파워 | Multi-function exercise apparatus |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5187694B2 (en) * | 2001-07-11 | 2013-04-24 | 学校法人東京理科大学 | Nondestructive analysis method and nondestructive analyzer |
| JP4498663B2 (en) * | 2001-07-11 | 2010-07-07 | 学校法人東京理科大学 | Thickness setting method for transmission crystal analyte |
| JP5850309B2 (en) * | 2011-09-16 | 2016-02-03 | 国立大学法人 筑波大学 | In vivo indwelling object visualization device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57200134A (en) * | 1981-05-30 | 1982-12-08 | Shimadzu Corp | Computer tomograph photographing apparatus |
-
1987
- 1987-06-02 JP JP62138756A patent/JPH0783744B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101626770B1 (en) | 2016-01-22 | 2016-06-02 | 주식회사 홈파워 | Multi-function exercise apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63302829A (en) | 1988-12-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5291402A (en) | Helical scanning computed tomography apparatus | |
| CA1282192C (en) | Method and apparatus for utilizing an electro-optic detector in a microtomography system | |
| US9066649B2 (en) | Apparatus for phase-contrast imaging comprising a displaceable X-ray detector element and method | |
| US4709382A (en) | Imaging with focused curved radiation detectors | |
| US7646843B2 (en) | Method for producing projective and tomographic phase contrast images with the aid of an X-ray system | |
| US7590215B2 (en) | Coherent-scatter computer tomograph | |
| EP2830505B1 (en) | Hybrid pci system for medical radiographic imaging | |
| US6175609B1 (en) | Methods and apparatus for scanning an object in a computed tomography system | |
| JPH0725923Y2 (en) | Computer tomograph | |
| JP2001269331A (en) | Computed tomography apparatus for determining pulse momentum transfer spectrum in examination area | |
| US4433427A (en) | Method and apparatus for examining a body by means of penetrating radiation such as X-rays | |
| WO2007110795A2 (en) | Effective dual-energy x-ray attenuation measurement | |
| JPH09215688A (en) | System for determining the position of an X-ray beam in a multi-slice computer tomography system | |
| CN101011250A (en) | Focus detector arrangement for generating phase-contrast X-ray images and method for this | |
| US20030091147A1 (en) | Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector | |
| JPH09285462A (en) | A computer for a computed tomography system. | |
| JPH0815182A (en) | Method for compensating for radiation scattering in x-ray imaging system | |
| EP1722216A2 (en) | X-ray imaging system | |
| US6269139B1 (en) | Methods and apparatus for pre-filtering weighting in image reconstruction | |
| IL128035A (en) | Methods and apparatus to desensitize incident angle errors on a multi-slice computed tomograph detector | |
| EP0200939B1 (en) | Emission computed tomography apparatus | |
| DiBianca et al. | A variable resolution x‐ray detector for computed tomography: I. Theoretical basis and experimental verification | |
| JPH0783744B2 (en) | X-ray tomography system | |
| JPH08252248A (en) | X-ray CT system | |
| JP2000107162A (en) | Radiation imaging device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |