JPH08219947A - Optical fiber inspection equipment - Google Patents
Optical fiber inspection equipmentInfo
- Publication number
- JPH08219947A JPH08219947A JP7021618A JP2161895A JPH08219947A JP H08219947 A JPH08219947 A JP H08219947A JP 7021618 A JP7021618 A JP 7021618A JP 2161895 A JP2161895 A JP 2161895A JP H08219947 A JPH08219947 A JP H08219947A
- Authority
- JP
- Japan
- Prior art keywords
- converter
- light
- frequency
- output
- optical fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
(57)【要約】
【目的】DUTに与える光が可干渉性の低いものとなる
ようにして近接する反射光の干渉を防止する。
【構成】スイープ発振器とこれにより強度変調されるE
/O変換器を備え、この出力光を光カプラを介して被測
定対象に入射し被測定対象内で反射された光をO/E変
換器により電気信号に変換し、この電気信号とスイープ
発振器出力とをミキサでミキシングして差周波数の信号
を得て、この差周波数を周波数アナライザで解析するこ
とにより被測定対象内の反射点までの距離と反射量を検
出するように構成された光ファイバ検査装置において、
前記被測定対象に与える光を元のE/O変換器の光のス
ペクトル線幅よりも拡大し、前記被測定対象中の反射点
からの反射光どうしの干渉を防ぐための手段を備える。
(57) [Abstract] [Purpose] The light applied to the DUT is made to have low coherence so as to prevent the interference of reflected light in the vicinity. [Structure] Sweep oscillator and intensity modulated E
/ O converter, the output light is incident on the object to be measured through the optical coupler, and the light reflected in the object to be measured is converted into an electric signal by the O / E converter, and this electric signal and the sweep oscillator An optical fiber that is configured to detect the distance to the reflection point and the amount of reflection in the object to be measured by mixing the output with a mixer to obtain a signal with a difference frequency and analyzing this difference frequency with a frequency analyzer. In the inspection device,
A means for expanding the light to be given to the object to be measured to be wider than the spectral line width of the light of the original E / O converter and preventing the interference of the reflected lights from the reflection points in the object to be measured is provided.
Description
【0001】[0001]
【産業上の利用分野】本発明は、光ファイバ等の検査装
置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection device for optical fibers and the like.
【0002】[0002]
【従来の技術】光ファイバ検査装置には、よく知られて
いるOTDR(Optical Time DomainReflectmeter)の
他に、OFDR(Optical Frequency Domain Reflectme
ter)がある。図3にファイバ形干渉計によるOFDR
のブロック図を示す。2. Description of the Related Art In addition to a well-known OTDR (Optical Time Domain Reflectmeter), an optical fiber inspection apparatus includes an OFDR (Optical Frequency Domain Reflectme
ter). Figure 3 OFDR with fiber interferometer
The block diagram of is shown.
【0003】図3において、電気・光変換器(以下E/
O変換器という)3から発せられる光(例えばレーザ
光)は、分配器2を介して与えられるスイープ発振器1
の出力により駆動され、出力光の周波数が掃引されるよ
うに制御されている。この出力光は光カプラ4を経て被
測定対象の光ファイバ(以下DUT(Device Under Tes
t )5に入り、DUT5中の障害点(例えば、破断面)
等で反射する。その反射光は光カプラ4を経て光・電気
変換器(O/E変換器)6に入り、電気信号に変換さ
れ、ミキサ7に入る。In FIG. 3, an electric / optical converter (hereinafter referred to as E /
The light (for example, laser light) emitted from the O converter 3 is supplied to the sweep oscillator 1 through the distributor 2.
It is driven by the output of the output light and is controlled so that the frequency of the output light is swept. The output light passes through the optical coupler 4 and is measured by an optical fiber (hereinafter referred to as DUT (Device Under Tes).
t) 5 is entered and the obstacle point in DUT 5 (eg fracture surface)
And so on. The reflected light enters the optical / electrical converter (O / E converter) 6 through the optical coupler 4, is converted into an electric signal, and enters the mixer 7.
【0004】ミキサ7にはまた前記スイープ発振器1の
出力が分配器2を経由して入力されており、2つの入力
信号の差周波数の信号を出力する。この信号は周波数ア
ナライザ8に入力され、その差周波数が解析される。The output of the sweep oscillator 1 is also input to the mixer 7 via the distributor 2 and outputs a signal having a difference frequency between the two input signals. This signal is input to the frequency analyzer 8 and its difference frequency is analyzed.
【0005】ここでスイープ発振器1を、単位時間(Δ
t)当たりΔfの周波数変化となるようにリニアに掃引
する。ミキサ7の2つの入力周波数差は遅れ時間差に比
例する。遅れ時間差はDUT5内の障害点までの距離に
比例することから、周波数解析を行うことにより、障害
点までの距離を知ることができ、また信号の大きさから
障害点での反射量すなわち障害点の大きさを知ることが
できる。Here, the sweep oscillator 1 is set to a unit time (Δ
The sweep is performed linearly so that the frequency changes by Δf per t). The difference between the two input frequencies of the mixer 7 is proportional to the delay time difference. Since the delay time difference is proportional to the distance to the fault point in the DUT 5, the distance to the fault point can be known by performing frequency analysis, and the amount of reflection at the fault point, that is, the fault point can be determined from the signal size. You can know the size of.
【0006】例えば、スイープ発振器1の出力信号は1
GHz/secの割合で掃引されているものとする。D
UT5が屈折率n=1.5の光ファイバであれば、ファ
イバ内を光が1m往復する時間tは、 t=2×n/C≒1×10-8(sec) ただし、Cは真空中の光速 である。スイープ発振器1の掃引レートよりこの時間t
では10Hzの周波数差を生じる。つまり、周波数アナ
ライザ8で差周波数を解析することにより、10Hzあ
たり1mで障害点の位置を検出することができる。For example, the output signal of the sweep oscillator 1 is 1
It is assumed that the sweep is performed at a rate of GHz / sec. D
If the UT 5 is an optical fiber with a refractive index of n = 1.5, the time t during which light travels back and forth through the fiber for 1 m is: t = 2 × n / C≈1 × 10 −8 (sec) where C is in vacuum Is the speed of light. From the sweep rate of the sweep oscillator 1, this time t
Causes a frequency difference of 10 Hz. That is, by analyzing the difference frequency with the frequency analyzer 8, the position of the fault point can be detected at 1 m per 10 Hz.
【0007】さて、光の可干渉距離について考察すると
次の通りである。簡易的に可干渉距離Lは、 L=C/Δν ただし、Δνはスペクトル線幅(半値幅) である。そして、スペクトル線幅Δνが100MHzで
あるとすると、 L=3(m) となる。これは真空中の片道距離であるので、ファイバ
中の往復と屈折率(n=1.5)を考慮して換算すると
1mに相当する。Now, the coherence length of light will be considered as follows. The coherence length L is simply L = C / Δν, where Δν is the spectral line width (half-value width). Then, assuming that the spectral line width Δν is 100 MHz, L = 3 (m). Since this is a one-way distance in a vacuum, it corresponds to 1 m when converted in consideration of the round trip in the fiber and the refractive index (n = 1.5).
【0008】[0008]
【発明が解決しようとする課題】しかしながら、DUT
5内の障害点が複数かつ近接している場合、E/Oとし
て可干渉性の高いもの(レーザ光等)を使用すると、近
接した障害点からの反射光どうしが干渉し、ノイズ成分
となってしまうという問題があった。DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention
If multiple obstacle points in 5 are close and if E / O with high coherence is used (laser light etc.), the reflected lights from the adjacent obstacle points interfere with each other and become a noise component. There was a problem that it would end up.
【0009】本発明の目的は、強度変調形OFDRにお
いてDUTに与える光が可干渉性の低いものとなるよう
にして上記課題を解決した光ファイバ検査装置を提供す
ることにある。It is an object of the present invention to provide an optical fiber inspection apparatus which solves the above problems by making the light applied to the DUT in the intensity modulation type OFDR have low coherence.
【0010】[0010]
【課題を解決するための手段】このような目的を達成す
るために本発明では、スイープ発振器の出力によりE/
O変換器の出力光を強度変調し、この出力光を光カプラ
を介して被測定対象に入射し被測定対象内で反射された
光をO/E変換器により電気信号に変換し、この電気信
号とスイープ発振器出力とをミキサでミキシングするこ
とにより差周波数の信号を得て、この差周波数を周波数
アナライザで解析することにより被測定対象内の反射点
までの距離と反射量を検出するように構成された光ファ
イバ検査装置において、前記被測定対象に与える光を元
のE/O変換器の光のスペクトル線幅よりも拡大し、前
記被測定対象中の反射点からの反射光どうしの干渉を防
ぐための手段を具備したことを特徴とする。In order to achieve such an object, according to the present invention, the E /
The output light of the O converter is intensity-modulated, the output light is incident on the object to be measured through the optical coupler, and the light reflected within the object to be measured is converted into an electric signal by the O / E converter. The signal of the difference frequency is obtained by mixing the signal and the output of the sweep oscillator with a mixer, and by analyzing this difference frequency with a frequency analyzer, the distance to the reflection point in the object to be measured and the reflection amount are detected. In the configured optical fiber inspection device, the light to be given to the object to be measured is expanded more than the spectral line width of the light of the original E / O converter, and the interference between the reflected lights from the reflection points in the object to be measured is caused. It is characterized in that it is provided with a means for preventing.
【0011】[0011]
【作用】DUTに入射する光が可干渉性の低いものとな
るようにする手段を設け、スペクトル線幅を元のE/O
変換器のものより拡大させることにより、近接する反射
光どうしの干渉を防止する。A means for ensuring that the light incident on the DUT has low coherence is provided, and the spectral line width is set to the original E / O.
By making it larger than that of the converter, interference between reflected lights that are close to each other is prevented.
【0012】[0012]
【実施例】以下本発明を詳しく説明する。図1は本発明
に係る光ファイバ検査装置の一実施例を示す構成図であ
り、DUT5に与える光を元のE/O変換器の光のスペ
クトル線幅よりも拡大し障害点からの反射光どうしの干
渉を防ぐための手段として、E/O駆動信号に高周波を
重畳する高周波信号発生器と合成器を用いたものであ
る。なお、図3と同等部分には同一符号を付し、その部
分の説明は省略する。図において、9は高周波信号(波
形は例えば正弦波)を発生する高周波信号発生器、10
は分配器2の出力に高周波信号発生器9の出力を重畳す
る合成器である。The present invention will be described in detail below. FIG. 1 is a block diagram showing an embodiment of the optical fiber inspection apparatus according to the present invention, in which the light given to the DUT 5 is expanded more than the spectral line width of the light of the original E / O converter, and the reflected light from the fault point is shown. As a means for preventing mutual interference, a high frequency signal generator for superimposing a high frequency on the E / O drive signal and a synthesizer are used. The same parts as those in FIG. 3 are designated by the same reference numerals, and the description thereof will be omitted. In the figure, 9 is a high-frequency signal generator that generates a high-frequency signal (waveform is, for example, a sine wave), 10
Is a combiner that superimposes the output of the high-frequency signal generator 9 on the output of the distributor 2.
【0013】このような構成において、E/O変換器3
は、スイープ発振器1の出力信号と高周波信号発生器9
の出力信号とを合成した信号により駆動される。なお、
この場合E/O変換器3としてはレーザダイオードを用
いる。これによりレーザダイオードからはスペクトル線
幅の拡大されたレーザ光を容易に発生することができ、
DUT5内の障害点が複数かつ近接している場合でも、
障害点からの反射光どうしの干渉を防ぐことができる。
なお、高周波信号発生器9の出力信号の周波数はスイー
プ発振器1の出力信号の周波数と異ならせておくのが望
ましい。In such a configuration, the E / O converter 3
Is the output signal of the sweep oscillator 1 and the high frequency signal generator 9
It is driven by a signal obtained by combining the output signal of In addition,
In this case, a laser diode is used as the E / O converter 3. This allows the laser diode to easily generate laser light with an expanded spectral line width,
Even if there are multiple points of failure in the DUT 5
It is possible to prevent interference between reflected lights from the obstacle point.
The frequency of the output signal of the high frequency signal generator 9 is preferably different from the frequency of the output signal of the sweep oscillator 1.
【0014】図2は本発明の他の実施例であり、DUT
5に与える光を元のE/O変換器の光のスペクトル線幅
よりも拡大し障害点からの反射光どうしの干渉を防ぐた
めの手段として、可干渉性の高いレーザ光(スペクトル
線幅100MHz以下)と光周波数シフタを用いたもの
である。図において、11はE/O変換器3の出力光の
周波数をシフトしスペクトル線幅を拡大する周波数シフ
タである。なお、E/O変換器3としては可干渉性の高
いレーザ光(スペクトル線幅100MHz以下)も使用
できる。これにより、上記実施例と同様に障害点からの
反射光どうしの干渉を防ぐことができる。FIG. 2 shows another embodiment of the present invention, which is a DUT.
As a means for preventing the interference of the reflected light from the fault point with each other by expanding the light to be given to 5 to the spectral line width of the light of the original E / O converter, a highly coherent laser beam (spectral line width 100 MHz The following) and an optical frequency shifter are used. In the figure, 11 is a frequency shifter for shifting the frequency of the output light of the E / O converter 3 and expanding the spectral line width. As the E / O converter 3, laser light having a high coherence (spectrum line width 100 MHz or less) can also be used. As a result, it is possible to prevent the interference of the reflected lights from the obstacle points, as in the above-described embodiment.
【0015】なお本発明は上記実施例に限定されるもの
ではない。例えば、高周波信号発生器と合成器や、周波
数シフタ11を用いることなく、E/O変換器3として
スペクトル線幅が100MHz以上のレーザ光を使用し
てもよく、同様の効果を得ることができる。また、E/
O変換器3として、発光ダイオード(LED)、高輝度
ダイオード(SLD)を用いてもよい。また、E/O変
換器3の出力光を直接的に変える方式ではないが、周波
数解析方法においてフーリエ変換を利用し、近接の障害
点を見つけ得るようにすることもできる。The present invention is not limited to the above embodiment. For example, a laser beam having a spectral line width of 100 MHz or more may be used as the E / O converter 3 without using the high frequency signal generator and the synthesizer or the frequency shifter 11, and the same effect can be obtained. . Also, E /
A light emitting diode (LED) or a high brightness diode (SLD) may be used as the O converter 3. Further, although it is not a method of directly changing the output light of the E / O converter 3, it is also possible to use Fourier transform in the frequency analysis method to find a fault point in the vicinity.
【0016】また、光の伝送損失の大きい場合、障害点
での光反射量の小さい場合等の用途には光アンプ(ファ
イバ形)を設けても良い。さらにまた、運用している光
ファイバを測定する場合には、運用している光の波長と
異なる波長をE/O変換器として使用し、さらに必要で
あればO/E変換器6の前段に不要な波長を除去する波
長弁別器を用いる。この際の波長弁別器としては、光学
フィルタ、干渉フィルタ、物質の吸収を用いることがで
きる。例えば、1.55μmで使用している光ファイバ
の検査には、1.65μmで発光するE/O変換器を使
用し、必要であればO/E変換器の前段に1.55μm
を除去する波長弁別器を用いる。An optical amplifier (fiber type) may be provided for applications such as when the transmission loss of light is large or when the amount of light reflection at the fault point is small. Furthermore, when measuring the operating optical fiber, a wavelength different from the operating light wavelength is used as the E / O converter, and if necessary, in the preceding stage of the O / E converter 6. A wavelength discriminator that removes unnecessary wavelengths is used. As the wavelength discriminator in this case, an optical filter, an interference filter, or substance absorption can be used. For example, to inspect an optical fiber used at 1.55 μm, an E / O converter that emits light at 1.65 μm is used.
A wavelength discriminator that removes is used.
【0017】[0017]
【発明の効果】以上説明したように本発明によれば次の
ような効果がある。強度変調形のOFDRは、測定可能
距離の大幅な延長が可能であるが(光周波数変調形OF
DRにては、光源の可干渉距離にて制限を受ける)、2
点の近接した障害点がある場合には、この反射光どうし
が干渉してしまい、ノイズ成分となる。このためE/O
変換器として可干渉距離の短い光源が必要となる。本発
明によれば、可干渉距離の短い(等価的な場合も含む)
光源を使用することにより、2点の近接した障害点があ
る場合にも高い分解能(<1m)で障害点を検出できる
光ファイバ検査装置を実現することができる。As described above, the present invention has the following effects. Although the intensity modulation type OFDR can greatly extend the measurable distance (optical frequency modulation type OFDR
In DR, it is limited by the coherence length of the light source), 2
If there are obstacle points close to each other, the reflected lights interfere with each other and become a noise component. Therefore, E / O
A light source with a short coherence length is required as a converter. According to the present invention, the coherence length is short (including equivalent cases).
By using the light source, it is possible to realize an optical fiber inspection apparatus capable of detecting a fault point with high resolution (<1 m) even when there are two fault points close to each other.
【図1】本発明に係る光ファイバ検査装置の一実施例を
示す構成図FIG. 1 is a configuration diagram showing an embodiment of an optical fiber inspection apparatus according to the present invention.
【図2】本発明の他の実施例構成図FIG. 2 is a block diagram of another embodiment of the present invention.
【図3】従来の光ファイバ検査装置の一例を示す構成図
である。FIG. 3 is a configuration diagram showing an example of a conventional optical fiber inspection apparatus.
1 スイープ発振器 2 分配器 3 E/O変換器 4 光カプラ 5 DUT 6 O/E変換器 7 ミキサ 8 周波数アナライザ 9 高周波信号発生器 10 合成器 11 周波数シフタ 1 Sweep Oscillator 2 Divider 3 E / O Converter 4 Optical Coupler 5 DUT 6 O / E Converter 7 Mixer 8 Frequency Analyzer 9 High Frequency Signal Generator 10 Combiner 11 Frequency Shifter
───────────────────────────────────────────────────── フロントページの続き (72)発明者 立川 義彦 東京都武蔵野市中町2丁目9番32号 横河 電機株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yoshihiko Tachikawa 2-3-9 Nakamachi, Musashino-shi, Tokyo Yokogawa Electric Co., Ltd.
Claims (4)
の出力光を強度変調し、この出力光を光カプラを介して
被測定対象に入射し被測定対象内で反射された光をO/
E変換器により電気信号に変換し、この電気信号とスイ
ープ発振器出力とをミキサでミキシングすることにより
差周波数の信号を得て、この差周波数を周波数アナライ
ザで解析することにより被測定対象内の反射点までの距
離と反射量を検出するように構成された光ファイバ検査
装置において、 前記被測定対象に与える光を元のE/O変換器の光のス
ペクトル線幅よりも拡大し、前記被測定対象中の反射点
からの反射光どうしの干渉を防ぐための手段を具備した
ことを特徴とする光ファイバ検査装置。1. An output light of an E / O converter is intensity-modulated by an output of a sweep oscillator, and the output light is made incident on an object to be measured through an optical coupler and the light reflected inside the object to be measured is O / O.
The signal of the difference frequency is obtained by converting the electric signal with the E converter and mixing the electric signal with the output of the sweep oscillator with a mixer, and analyzing the difference frequency with a frequency analyzer In an optical fiber inspection device configured to detect a distance to a point and an amount of reflection, the light to be given to the object to be measured is expanded more than the spectral line width of the light of the original E / O converter, An optical fiber inspection apparatus comprising means for preventing interference between reflected lights from a reflection point in an object.
ーザ光を使用すると共に、前記反射点からの反射光どう
しの干渉を防ぐための手段として前記E/O変換器の出
力光の周波数をシフトする光周波数シフタを使用し、見
かけ上のスペクトル線幅を元のE/O変換器よりも拡大
するように構成したことを特徴とする請求項1記載の光
ファイバ検査装置。2. A laser beam having high coherence is used as the E / O converter, and the output light of the E / O converter is used as a means for preventing interference between reflected lights from the reflection points. 2. The optical fiber inspection apparatus according to claim 1, wherein an optical frequency shifter for shifting the frequency is used, and the apparent spectral line width is made wider than that of the original E / O converter.
ぐための手段は、高周波信号を発生する高周波信号発生
器と、前記スイープ発振器の出力に前記高周波信号を重
畳する合成器からなり、この合成器の出力で前記E/O
変換器を駆動するようにしたことを特徴とする請求項1
記載の光ファイバ検査装置。3. A means for preventing interference between reflected lights from the reflection point comprises a high frequency signal generator for generating a high frequency signal, and a combiner for superimposing the high frequency signal on the output of the sweep oscillator. With the output of this synthesizer, the E / O
2. A converter is driven so as to drive the converter.
The optical fiber inspection device described.
プ発振器の出力信号の周波数以外とすることを特徴とす
る請求項1記載の光ファイバ検査装置。4. The optical fiber inspection apparatus according to claim 1, wherein the frequency for performing the high frequency superposition is set to a frequency other than the frequency of the output signal of the sweep oscillator.
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02161895A JP3453746B2 (en) | 1995-02-09 | 1995-02-09 | Optical fiber inspection equipment |
| DE0754939T DE754939T1 (en) | 1995-02-02 | 1996-01-30 | MEASURING DEVICE FOR OPTICAL FIBERS |
| DE69632000T DE69632000T2 (en) | 1995-02-02 | 1996-01-30 | MEASURING DEVICE FOR OPTICAL FIBERS |
| EP96901143A EP0754939B1 (en) | 1995-02-02 | 1996-01-30 | Optical fibre detecting device |
| PCT/JP1996/000170 WO1996024038A1 (en) | 1995-02-02 | 1996-01-30 | Optical fibre detecting device |
| US08/727,377 US5844235A (en) | 1995-02-02 | 1996-01-30 | Optical frequency domain reflectometer for use as an optical fiber testing device |
| US09/039,944 US6008487A (en) | 1995-02-02 | 1998-03-16 | Optical-fiber inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP02161895A JP3453746B2 (en) | 1995-02-09 | 1995-02-09 | Optical fiber inspection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08219947A true JPH08219947A (en) | 1996-08-30 |
| JP3453746B2 JP3453746B2 (en) | 2003-10-06 |
Family
ID=12060046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP02161895A Expired - Fee Related JP3453746B2 (en) | 1995-02-02 | 1995-02-09 | Optical fiber inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3453746B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08210944A (en) * | 1995-02-02 | 1996-08-20 | Yokogawa Electric Corp | Optical fiber inspection equipment |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP3453746B2 (en) | 2003-10-06 |
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