JPH0827244B2 - Analytical data processor - Google Patents

Analytical data processor

Info

Publication number
JPH0827244B2
JPH0827244B2 JP63143892A JP14389288A JPH0827244B2 JP H0827244 B2 JPH0827244 B2 JP H0827244B2 JP 63143892 A JP63143892 A JP 63143892A JP 14389288 A JP14389288 A JP 14389288A JP H0827244 B2 JPH0827244 B2 JP H0827244B2
Authority
JP
Japan
Prior art keywords
measurement
data
range
analysis
analytical data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63143892A
Other languages
Japanese (ja)
Other versions
JPH01312449A (en
Inventor
健 服部
鉄夫 梶川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP63143892A priority Critical patent/JPH0827244B2/en
Publication of JPH01312449A publication Critical patent/JPH01312449A/en
Publication of JPH0827244B2 publication Critical patent/JPH0827244B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Recording Measured Values (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、分析データの処理装置に関する。The present invention relates to an analytical data processing apparatus.

(従来の技術) 測定スペクトルから様々な情報を得るには、試料を特
徴づけるピークを含む狭い波長或はエネルギー範囲の分
析データを用いて、試料を特徴づけるスペクトルピーク
毎にデータを管理・分析を行う方が効果的である。しか
し、未知試料では元素スペクトルの分布範囲が不明であ
るために、上記のような必要なスペクトルピークが含ま
れている狭い測定範囲を予め設定することが不可能であ
る。そこで従来は、大きなステップで広範囲にわたって
測定を行い、その測定結果により必要なスペクトルピー
クを含む狭い測定範囲を細かいステップで再度詳細測定
していた。しかし、このような方法では測定に長時間か
かるために非能率であった。
(Prior art) To obtain various information from a measured spectrum, use analysis data in a narrow wavelength or energy range that includes a peak that characterizes a sample, and manage and analyze the data for each spectral peak that characterizes the sample. It is more effective to do so. However, since the distribution range of the elemental spectrum is unknown in the unknown sample, it is impossible to preset the narrow measurement range including the necessary spectrum peak as described above. Therefore, conventionally, the measurement is performed over a wide range in a large step, and the narrow measurement range including a necessary spectrum peak is measured again in detail in a fine step based on the measurement result. However, such a method is inefficient because the measurement takes a long time.

(発明が解決しようとする課題) 本発明は、試料について必要なスペクトルピークを含
む狭い波長或はエネルギー範囲の分析データを能率良く
収集・管理することを目的とする。
(Problems to be Solved by the Invention) An object of the present invention is to efficiently collect and manage analytical data in a narrow wavelength or energy range including a spectrum peak required for a sample.

(課題を解決するための手段) 広範囲の詳細分析データを全て記憶する手段と、上記
分析データを表示する手段と、上記分析データから登録
範囲を指示する手段と、全分析データから上記指示され
た登録範囲の分析データを記憶する手段とを分析データ
処理装置に設けた。
(Means for Solving the Problem) A means for storing all of a wide range of detailed analysis data, a means for displaying the analysis data, a means for instructing a registration range from the analysis data, and an instruction for all analysis data. A means for storing the analytical data of the registered range is provided in the analytical data processing device.

(作用) 最近、記憶媒体の記憶容量が一段と増大し、細かいス
テップで広い波長或はエネルギー範囲を測定して得られ
る測定データを全部記憶できるようになった。本発明は
このような背景により、試料を特徴づけるスペクトルピ
ークが含まれる測定範囲を調査するための予備測定をす
ることなしに、最初から広い測定範囲において細かいス
テップで測定し、得られた測定データを記憶装置に記憶
し、測定終了後、測定データを取り出して表示装置に表
示し、表示されたスペクトルを参考にして、試料を特徴
づけるスペクトルピークの測定データ範囲を登録指定
し、その指定範囲の測定データを管理するようにするこ
とで、測定時間の短縮を計ろうとするするものである。
(Operation) Recently, the storage capacity of a storage medium has been further increased, and it has become possible to store all measurement data obtained by measuring a wide wavelength or energy range in fine steps. Due to such a background, the present invention provides measurement data obtained by performing measurement in fine steps in a wide measurement range from the beginning without performing preliminary measurement for investigating a measurement range in which a spectral peak that characterizes a sample is included. Stored in the storage device, after the measurement is completed, the measured data is taken out and displayed on the display device, and the measured data range of the spectral peak that characterizes the sample is registered and designated with reference to the displayed spectrum. By trying to manage the measurement data, it is intended to reduce the measurement time.

(実施例) 第1図に本発明の一実施例を示す。第1図において、
1は分析装置、2は分析装置1とCPU3との信号の連絡動
作を行うインターフェイスである。CPU3は分析装置1の
制御及び測定データの処理制御を行う。4は測定データ
等を格納するメモリ、5は測定データ及び結果を表示す
る表示装置で、6は種々なデータおよび指令をCPU3に入
力するキーボードである。
(Embodiment) FIG. 1 shows an embodiment of the present invention. In FIG.
Reference numeral 1 is an analyzer, and 2 is an interface for communicating signals between the analyzer 1 and the CPU 3. The CPU 3 controls the analyzer 1 and the measurement data processing. Reference numeral 4 is a memory for storing measurement data and the like, 5 is a display device for displaying the measurement data and the result, and 6 is a keyboard for inputting various data and commands to the CPU 3.

第2図に測定動作のフローチャートを示す。最初に分
析装置1の測定すべき波長或はエネルギー等の範囲、測
定ステップ等の分析条件を設定する(ア)。この場合、
例えば試料の元素分析であれば予め試料に含まれる可能
性のある元素全てのピークが現れる波長範囲を設定し、
このような予想がつけられないときは、分析装置におけ
る全測定範囲を指定し、測定ステップ(サンプリング波
長間隔等)は目標とする分析精度によって予め決定され
る。全スペクトルデータを入手するために上記設定され
た広範囲の測定を行う(イ)。入手した測定データをメ
モリ4に格納する(ウ)。ここで測定は終了し、測定デ
ータの処理に入る。全スペクトルを表示装置5に表示し
(エ)、第3図Aに示すように、表示されたスペクトル
にキーボード6を操作して登録すべきスペクトルピーク
データが含まれる領域1,2,3等をカーソルによって指定
する(オ)。測定データを上記登録条件により分割し、
分割したデータをメモリに格納する。必要に応じて格納
した登録データを第3図Bに示すようにスペクトルピー
ク毎に表示装置5に表示して分析を行う。
FIG. 2 shows a flow chart of the measurement operation. First, analysis conditions such as a range of wavelength or energy to be measured by the analyzer 1 and measurement steps are set (a). in this case,
For example, for elemental analysis of a sample, set the wavelength range in which the peaks of all the elements that may be contained in the sample appear in advance.
When such a prediction cannot be made, the entire measurement range in the analyzer is specified, and the measurement step (sampling wavelength interval, etc.) is determined in advance by the target analysis accuracy. Perform a wide range of measurements set above to obtain all spectral data (a). The obtained measurement data is stored in the memory 4 (c). At this point, the measurement ends and the measurement data is processed. All the spectra are displayed on the display device 5 (d), and as shown in FIG. 3A, the keyboard 1, the keyboard 6 is operated to display the spectra 1, 2, 3, etc. containing the spectrum peak data to be registered. Specify with the cursor (e). Divide the measurement data according to the above registration conditions,
Store the divided data in memory. If necessary, the stored registration data is displayed on the display device 5 for each spectrum peak as shown in FIG. 3B for analysis.

(発明の効果) 本発明によれば、本測定によって細かいステップの全
測定データを測定・記憶させ、測定終了後試料を特徴づ
けるスペクトルピークデータ毎に分割記憶させるように
したことで、予備測定が不必要となり、測定時間を短縮
することが可能になった。
(Effects of the Invention) According to the present invention, all the measurement data in fine steps are measured and stored by the main measurement, and after the measurement, the preliminary measurement is performed by dividing and storing for each spectrum peak data that characterizes the sample. It became unnecessary and it became possible to shorten the measurement time.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の構成図、第2図は測定動作
のフローチャート、第3図はスペクトル図で、同図Aは
全スペクトル図、同図Bは分割スペクトル図である。 1……分析装置、2……インターフェイス、3……CP
U、4……メモリ、5……表示装置。
FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a flow chart of measurement operation, FIG. 3 is a spectrum diagram, FIG. A is a whole spectrum diagram, and FIG. B is a divided spectrum diagram. 1 ... analyzer, 2 ... interface, 3 ... CP
U, 4 ... Memory, 5 ... Display device.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】広範囲の詳細分析データを全て記憶する手
段と、上記分析データを表示する手段と、上記分析デー
タから登録範囲を指示する手段と、全分析データから上
記指示された登録範囲の分析データを記憶する手段とを
設けたことを特徴とする分析データ処理装置。
1. A means for storing all detailed analysis data in a wide range, a means for displaying the analysis data, a means for designating a registration range from the analysis data, and an analysis of the designated registration range from all the analysis data. An analytical data processing device, comprising: a means for storing data.
JP63143892A 1988-06-10 1988-06-10 Analytical data processor Expired - Lifetime JPH0827244B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63143892A JPH0827244B2 (en) 1988-06-10 1988-06-10 Analytical data processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63143892A JPH0827244B2 (en) 1988-06-10 1988-06-10 Analytical data processor

Publications (2)

Publication Number Publication Date
JPH01312449A JPH01312449A (en) 1989-12-18
JPH0827244B2 true JPH0827244B2 (en) 1996-03-21

Family

ID=15349470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63143892A Expired - Lifetime JPH0827244B2 (en) 1988-06-10 1988-06-10 Analytical data processor

Country Status (1)

Country Link
JP (1) JPH0827244B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001264212A (en) * 2000-03-14 2001-09-26 Advantest Corp Waveform measuring device, method and recording medium
JP5069078B2 (en) 2007-10-16 2012-11-07 日本電子株式会社 Analysis method using X-ray spectrum

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5446085A (en) * 1977-09-19 1979-04-11 Omron Tateisi Electronics Co Spectrophotometer
JPS60100726A (en) * 1983-11-07 1985-06-04 Hitachi Ltd Spectrophotometer with CRT
JPH0678943B2 (en) * 1984-06-13 1994-10-05 株式会社島津製作所 Method and apparatus for removing background of spectrum
JPS61159158A (en) * 1984-12-29 1986-07-18 Japan Spectroscopic Co Method for preserving data of chromatogram
JPS62127673A (en) * 1985-11-29 1987-06-09 Jeol Ltd Fourier transform processor

Also Published As

Publication number Publication date
JPH01312449A (en) 1989-12-18

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