JPH084176B2 - Method for manufacturing semiconductor laser device - Google Patents

Method for manufacturing semiconductor laser device

Info

Publication number
JPH084176B2
JPH084176B2 JP62062945A JP6294587A JPH084176B2 JP H084176 B2 JPH084176 B2 JP H084176B2 JP 62062945 A JP62062945 A JP 62062945A JP 6294587 A JP6294587 A JP 6294587A JP H084176 B2 JPH084176 B2 JP H084176B2
Authority
JP
Japan
Prior art keywords
laser
layer
wavelength
gaas
semiconductor laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62062945A
Other languages
Japanese (ja)
Other versions
JPS63228791A (en
Inventor
晧元 芹澤
義和 堀
康 松井
智昭 宇野
順 雄谷
博昭 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62062945A priority Critical patent/JPH084176B2/en
Publication of JPS63228791A publication Critical patent/JPS63228791A/en
Publication of JPH084176B2 publication Critical patent/JPH084176B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は光ファイバ通信や光計測システム、あるいは
光ディスクなどの光情報処理に必要とされる半導体レー
ザ装置の製造方法に関するものであり、特に、信号の多
重化や多機能化に必要とされるモノリシックな複数波長
半導体レーザ装置の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a semiconductor laser device required for optical fiber communication, an optical measurement system, or optical information processing such as an optical disk. The present invention relates to a method for manufacturing a monolithic multi-wavelength semiconductor laser device which is required for multiplexing and multifunctioning.

従来の技術 半導体レーザは光ファイバ通信や光ディスクなどを中
心として実用化の段階に入り、大量生産の時代に入って
きた。研究開発はさらに高性能化に向けられている。そ
の1つの方向として複数波長の半導体レーザアレイが要
望されている。従来提案されているものとしては波長の
異なる半導体レーザチップを別々に作製し、同一サブマ
ウント上に並べてボンディングし、モジュールとして2
波長レーザとしたものや、同一基板上で同一なエピタキ
シャル成長を行ない、注入キャリアが再結合し光を放出
する活性層は同一組成,同一膜厚であるが波長を決定す
る回折格子の周期をレーザごとにかえて波長を少しづつ
シフトさせた複数波長DFBレーザアレイが提案されてい
る。しかし、このレーザは5波で波長間隔が50Å程度で
あり、多重度として多くとれるが波長の分離方法に困難
さを残す。
2. Description of the Related Art Semiconductor lasers have entered the stage of practical application, centering on optical fiber communications and optical disks, and have entered the age of mass production. Research and development is aimed at higher performance. A semiconductor laser array having a plurality of wavelengths is required as one of the directions. As a conventional proposal, semiconductor laser chips with different wavelengths are separately manufactured, and they are arranged and bonded on the same submount to form a module 2
Wavelength lasers or active layers that perform the same epitaxial growth on the same substrate and recombine injected carriers to emit light have the same composition and the same thickness, but the period of the diffraction grating that determines the wavelength is set for each laser. On the other hand, a multi-wavelength DFB laser array in which the wavelength is gradually shifted has been proposed. However, this laser has five waves and a wavelength interval of about 50 Å, and although a large multiplicity can be obtained, the wavelength separation method remains difficult.

第4図に他の2波長レーザの例の断面構造を示す。断
差を有するGaAs基板20上にAlGaAsクラッド層21,AlGaAs
活性層22,AlGaAsクラッド層23を順次成長させてレーザ
構造としたものである。断差直上の活性層25は膜厚は厚
くAl組成は少ないのに対して平坦部の膜厚は薄くAl組成
が高いものが成長する。従って、分離層26,電極27を設
けレーザ構造としたときには段差上のレーザは平坦部を
活性層とした時に比べてより長波長のレーザ光を発する
ものである。
FIG. 4 shows a sectional structure of another example of the two-wavelength laser. AlGaAs clad layer 21, AlGaAs on GaAs substrate 20 with a gap
An active layer 22 and an AlGaAs cladding layer 23 are sequentially grown to form a laser structure. The active layer 25 immediately above the gap has a large film thickness and a small Al composition, while a flat film having a small film thickness and a high Al composition grows. Therefore, when the separation layer 26 and the electrode 27 are provided to form a laser structure, the laser on the step emits laser light having a longer wavelength than in the case where the flat portion is the active layer.

しかるに、この場合も、発光されるレーザ光の波長間
隔が狭く、任意の波長差に制御するのは困難である。
However, also in this case, the wavelength intervals of the emitted laser light are narrow, and it is difficult to control the wavelength difference to an arbitrary value.

発明が解決しようとする問題点 このように従来においては、波長間隔を広く、かつ任
意に制御することが困難なものであった。
DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention As described above, in the related art, it was difficult to control the wavelength interval widely and arbitrarily.

そこで本発明は波長間隔を広くなおかつ任意に設定で
きるとともに、作製上の最も重要な工程であるエピタキ
シャル成長の回数をできるだけ少なくしようとするもの
である。
Therefore, the present invention is intended to set the wavelength interval to be wide and arbitrary, and to reduce the number of times of epitaxial growth, which is the most important step in manufacturing, as much as possible.

問題点を解決するための手段 本発明はAlGaAs,InGaAsP,InGaP,AlGaInPを活性層とす
る半導体レーザのうち少なくとも2波長以上を並べるレ
ーザアレイ構成において、レーザ活性層部の埋込み層を
AlGaInPあるいはAlInPの共通層にしようとするものであ
る。これにより、同一基体上に任意のレーザを設定でき
るとともに埋込み層は1回の成長ですべてのレーザに共
通に行なえるようにしたものである。
Means for Solving the Problems The present invention provides a buried layer of a laser active layer portion in a laser array structure in which at least two wavelengths of semiconductor lasers having AlGaAs, InGaAsP, InGaP, and AlGaInP as active layers are arranged.
It is intended to be a common layer of AlGaInP or AlInP. As a result, an arbitrary laser can be set on the same substrate, and the buried layer can be shared by all the lasers by one growth.

すなわち、本発明の半導体レーザ装置の製造方法は、
GaAs基板上に、GaAsと格子整合するAlGaAs(GaAsを含
む)あるいはInGaAsPあるいはAlGaInP(InGaPを含む)
を、注入キャリアが再結合し光を発生する活性領域とす
るダブルヘテロ接合を波長の異なる光が発生するように
複数個配置する工程と、前記活性領域の水平方向のスト
ライプ状の埋込みをGaAsと格子整合するAlGaInP(AlIn
P,InGaPを含む)あるいはInGaAsP層で同時に行う工程と
を備えてなるものである。
That is, the method for manufacturing a semiconductor laser device of the present invention is
AlGaAs (including GaAs) or InGaAsP or AlGaInP (including InGaP) lattice-matched with GaAs on a GaAs substrate
A step of arranging a plurality of double heterojunctions as an active region in which injected carriers are recombined to generate light so as to generate light of different wavelengths, and a horizontal stripe-shaped buried of the active region is formed of GaAs. Lattice-matching AlGaInP (AlIn
(Including P, InGaP) or InGaAsP layer is performed at the same time.

作用 本発明は、レーザとなる材料、組成の適当な組み合わ
せを選択することにより、同一基体上に複数異なるレー
ザを容易に形成できる。基体と格子定数を合わせ、バン
ドギャップが大きい物質にて埋込みクラッド層を共通に
行なうことで、良質な半導体レーザを作成することが可
能となる。
Action In the present invention, a plurality of different lasers can be easily formed on the same substrate by selecting an appropriate combination of materials and compositions to be lasers. By matching the substrate and the lattice constant and forming the buried clad layer in common with a material having a large band gap, it becomes possible to produce a high-quality semiconductor laser.

実施例 第1図は本特許の実施例の斜視図を示す。GaAs基板1
上に埋込み型半導体レーザ2個がモノリシックに1チッ
プに構成されている。第1の半導体レーザ13はGaAlAs系
で発振波長λ=800nm,第2の半導体レーザ14はInGaAs
P系でλ=700nmである。第1図のレーザの製造工程を
第2図に断面構造で示し、第3図にその組成をAlP−GaP
−InP系、GaP−InP−InAs−GaAs系、GaAs−InAs−AlAs
系を3相図で示す。第3図においてA−B−C−DはGa
Asと格子整合のとれた組成を示し、A,B,……Iは各点で
の組成を示す。
Embodiment FIG. 1 shows a perspective view of an embodiment of this patent. GaAs substrate 1
Two embedded semiconductor lasers are monolithically formed on one chip. The first semiconductor laser 13 is a GaAlAs-based oscillation wavelength λ 1 = 800 nm, and the second semiconductor laser 14 is InGaAs.
In the P system, λ 2 = 700 nm. The manufacturing process of the laser of FIG. 1 is shown in a sectional structure in FIG. 2, and its composition is shown in FIG.
-InP system, GaP-InP-InAs-GaAs system, GaAs-InAs-AlAs
The system is shown in a three-phase diagram. In FIG. 3, ABCD is Ga
The composition is lattice-matched with As, and A, B, ... I are the compositions at each point.

第2の製造工程にそってその製法を示す。 The manufacturing method will be described along the second manufacturing process.

n−GaAs基板上にGaを溶媒とする液相成長法にてAlGaAs
クラッド層2(組成E)、AlGaAs活性層3(F),AlGaA
sクラッド層4(E)を順次成長させる(第2図
(a))。次に成長層の一部にSiO2マスク15を形成し、
成長層の一部をエッチングにて除去する(第2図
(b))。エッチングされた基板はマスクを残したまま
In溶媒による液相成長法にてP−InGaAsP層をエッチン
グ除去した部分にエピタキシャル成長する。n−InGaP
クラッド層5(B)、InGaAsP活性層6(G)、P−InG
aPクラッド層7(B)を順次成長させる(第2図
(c))。成長させたエピタキシャル層を第2図(d)
のようにストライプ状にメサエッチングを施す。16,17
はSiO2マスクを示す。メサ上にエッチングされたウエハ
は液相成長法にてP−InGaP埋込み層8,n−InGaP埋込み
層9を順次成長させる。(第2図(e))。さらに、各
素子間を分離エッチングを入れることによって各レーザ
を分離する(第2図(f))。これを各電極を施すこと
によって第1斜視図に示されるような2波長モノリシッ
クアレイレーザが構成される。
AlGaAs on n-GaAs substrate by liquid phase epitaxy using Ga as solvent
Cladding layer 2 (composition E), AlGaAs active layer 3 (F), AlGaA
s Clad layer 4 (E) is sequentially grown (FIG. 2 (a)). Next, a SiO 2 mask 15 is formed on a part of the growth layer,
A part of the growth layer is removed by etching (FIG. 2 (b)). The etched substrate remains the mask
The P-InGaAsP layer is epitaxially grown on a portion where the P-InGaAsP layer is removed by etching by a liquid phase growth method using an In solvent. n-InGaP
Cladding layer 5 (B), InGaAsP active layer 6 (G), P-InG
The aP clad layer 7 (B) is sequentially grown (FIG. 2 (c)). Figure 2 (d) of the grown epitaxial layer
As shown in FIG. 16,17
Indicates a SiO 2 mask. The P-InGaP burying layer 8 and the n-InGaP burying layer 9 are sequentially grown on the wafer etched on the mesa by a liquid phase growth method. (FIG. 2 (e)). Further, each laser is separated by inserting a separation etching between each element (FIG. 2 (f)). By applying each electrode to this, a two-wavelength monolithic array laser as shown in the first perspective view is constructed.

このように3回のエピタキシャル成長工程で2波長レ
ーザが構成できる。第3図に示すように、組成と成分を
うまく選択することにより成分元素の異なるあるいは組
成の異なる層をレーザ活性部として用い、なおかつ、格
子整合のとれた状態で両レーザのクラッド層を同時に構
成することが可能となる。このような構成によって、Al
GaAs系レーザとInGaAsP系レーザが同一基板上に構成さ
れ、λ=800nm,λ=700nmと波長間隔を大きくとっ
た2波長レーザが可能となった。
In this way, a two-wavelength laser can be constructed by three epitaxial growth steps. As shown in FIG. 3, layers having different constituent elements or different compositions are used as the laser active portion by properly selecting the composition and the constituents, and the cladding layers of both lasers are simultaneously formed in a lattice-matched state. It becomes possible to do. With this configuration, Al
A GaAs laser and an InGaAsP laser were constructed on the same substrate, and a two-wavelength laser with a large wavelength interval of λ 1 = 800 nm and λ 2 = 700 nm became possible.

第2の実施例として、第2図(b)に示すようにAlGa
As系成長を同様に行ない、第2図(c)の第2回目のエ
ピタキシャル成長を有機金属気相成長法を用いてn−Al
GaInPクラッド層5(H)、AlGaInP活性層6(I)、P
−AlGaInPクラッド層7(H)を形成する。有機金属と
しては(CH33Al,(CH33In,(CH33GaおよびPH3がH
2をキャリアガスとして用いられる。さらにMO−CVD法を
用いて、埋込み層としてP−AlGaInP8(H)、n−AlGa
InP9(H)を形成することにより、格子整合をくずすこ
となく第2図(f)の構造が可能となる。このように、
同一基板上にAlGaAsレーザとAlGaInPレーザが同一クラ
ッドで構成でき、波長600nm帯レーザと700〜800nm帯レ
ーザを集積化することが可能となる。
As a second embodiment, as shown in FIG. 2 (b), AlGa
As-based growth is similarly performed, and the second epitaxial growth of FIG. 2 (c) is performed using n-Al using the metal organic chemical vapor deposition method.
GaInP clad layer 5 (H), AlGaInP active layer 6 (I), P
-AlGaInP clad layer 7 (H) is formed. (CH 3 ) 3 Al, (CH 3 ) 3 In, (CH 3 ) 3 Ga and PH 3 are H
2 is used as a carrier gas. Further, by using MO-CVD method, P-AlGaInP8 (H), n-AlGa as a buried layer is formed.
By forming InP9 (H), the structure of FIG. 2 (f) can be realized without breaking the lattice matching. in this way,
An AlGaAs laser and an AlGaInP laser can be configured with the same clad on the same substrate, and it becomes possible to integrate a wavelength 600 nm band laser and a 700 to 800 nm band laser.

また、同様にAlGaInPレーザとInGaAsPレーザのモノリ
シック集積化も可能であるほか同じ成分元素を有するレ
ーザでも組成をかえることによって異なる波長のレーザ
の集積化が可能となる。2波長のみならず、3波長以上
においても同様に構成できることは言うまでもない。
Similarly, it is possible to monolithically integrate an AlGaInP laser and an InGaAsP laser, and it is also possible to integrate lasers having different wavelengths by changing the composition of lasers having the same constituent elements. It goes without saying that not only two wavelengths but also three or more wavelengths can be similarly configured.

発明の効果 このように本発明によれば、GaAs基板上に、AlGaAs
系,InGaAsP系,AlGaInP系の活性層を有する任意の波長で
任意の組み合せによる複数波長レーザがモノリシックに
構成が容易に実現可能となる。さらに、これらのレーザ
はレーザ活性層の横方向の埋込み層を同一の組成のAlGa
InP(AlInP,InGaPを含む)あるいはInGaAsP層で形成す
ることが可能となり、埋込みエピタキシャル工程を少な
くすることが可能となる。
As described above, according to the present invention, AlGaAs is formed on a GaAs substrate.
It is possible to easily realize a monolithic structure of a multi-wavelength laser having an active layer of InGaAsP system, InGaAsP system, or AlGaInP system by an arbitrary combination at an arbitrary wavelength. Furthermore, these lasers have the same composition of AlGa in the lateral buried layer of the laser active layer.
InP (including AlInP and InGaP) or InGaAsP layers can be formed, and the buried epitaxial process can be reduced.

用途面からみても、光ディスク読み出し等小さいスポ
ットに絞る必要のあるものは短波長側レーザを使用し、
消去のようなハイパワーが必要な時は波長側のAlGaAs系
を使う等の使い分けが可能となる。
From the application point of view, if you need to narrow down to a small spot such as optical disk read, use a short wavelength laser,
When high power such as erasing is required, it is possible to use different wavelengths such as AlGaAs series on the wavelength side.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の方法により得られた複数波
長アレイレーザの斜視図、第2図は第1図の複数波長ア
レイレーザ製造方法を説明するための工程断面図、第3
図はInP−GaP−GaAs−InP,AlP−InP−GaP,AlAs−GaAs−
InAsの相図、第4図は従来の方法により得られた2波長
レーザアレイの断面図である。 1……GaAs基板、2…AlGaAsクラッド層、3……AlGaAs
活性層、4……AlGaAsクラッド層、5……n−InGaPク
ラッド層、6……InGaAs活性層、8……P−InGaP埋込
み層、9……n−InGaP埋込み層、13……第1の半導体
レーザ、14……第2の半導体レーザ。
FIG. 1 is a perspective view of a multi-wavelength array laser obtained by the method of one embodiment of the present invention, FIG. 2 is a process cross-sectional view for explaining the multi-wavelength array laser manufacturing method of FIG. 1, and FIG.
The figure shows InP-GaP-GaAs-InP, AlP-InP-GaP, AlAs-GaAs-
FIG. 4 is a phase diagram of InAs and FIG. 4 is a sectional view of a two-wavelength laser array obtained by a conventional method. 1 ... GaAs substrate, 2 ... AlGaAs cladding layer, 3 ... AlGaAs
Active layer, 4 ... AlGaAs cladding layer, 5 ... n-InGaP cladding layer, 6 ... InGaAs active layer, 8 ... P-InGaP buried layer, 9 ... n-InGaP buried layer, 13 ... first Semiconductor laser, 14 ... Second semiconductor laser.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 宇野 智昭 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 雄谷 順 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 山本 博昭 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (56)参考文献 特開 昭63−227089(JP,A) 特開 昭62−296587(JP,A) 特開 昭57−124489(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Tomoaki Uno 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. 72) Inventor Hiroaki Yamamoto 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) Reference JP 63-227089 (JP, A) JP 62-296587 (JP, A) JP Sho 57-124489 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】GaAs基板上に、GaAsと格子整合するAlGaAs
あるいはInGaAsPあるいはAlGaInPを、注入キャリアが再
結合し光を発生する活性領域とするダブルヘテロ接合を
波長の異なる光が発生するように複数個配置する工程
と、前記活性領域の水平方向のストライプ状の埋込みを
GaAsと格子整合するAlGaInPあるいはInGaAsP層で同時に
行う工程とを備えてなる半導体レーザ装置の製造方法。
1. An AlGaAs lattice-matched with GaAs on a GaAs substrate.
Alternatively, a step of arranging a plurality of InGaAsPs or AlGaInPs so that the injected carriers are recombined to form an active region for generating light so as to generate light of different wavelengths, and a horizontal stripe shape of the active region is formed. Embed
A method for manufacturing a semiconductor laser device, comprising the steps of simultaneously performing an AlGaInP or InGaAsP layer lattice-matched with GaAs.
JP62062945A 1987-03-18 1987-03-18 Method for manufacturing semiconductor laser device Expired - Fee Related JPH084176B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62062945A JPH084176B2 (en) 1987-03-18 1987-03-18 Method for manufacturing semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62062945A JPH084176B2 (en) 1987-03-18 1987-03-18 Method for manufacturing semiconductor laser device

Publications (2)

Publication Number Publication Date
JPS63228791A JPS63228791A (en) 1988-09-22
JPH084176B2 true JPH084176B2 (en) 1996-01-17

Family

ID=13214951

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62062945A Expired - Fee Related JPH084176B2 (en) 1987-03-18 1987-03-18 Method for manufacturing semiconductor laser device

Country Status (1)

Country Link
JP (1) JPH084176B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE1007282A3 (en) * 1993-07-12 1995-05-09 Philips Electronics Nv An opto-electronic semiconductor device with an array of semiconductor diode lasers and a method for the production thereof.
JP2001244569A (en) * 2000-03-01 2001-09-07 Sony Corp Method for manufacturing semiconductor laser light emitting device

Also Published As

Publication number Publication date
JPS63228791A (en) 1988-09-22

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