JPH0868765A - Foreign object detection method by image processing - Google Patents
Foreign object detection method by image processingInfo
- Publication number
- JPH0868765A JPH0868765A JP6203128A JP20312894A JPH0868765A JP H0868765 A JPH0868765 A JP H0868765A JP 6203128 A JP6203128 A JP 6203128A JP 20312894 A JP20312894 A JP 20312894A JP H0868765 A JPH0868765 A JP H0868765A
- Authority
- JP
- Japan
- Prior art keywords
- foreign matter
- particles
- grayscale image
- image
- determined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 60
- 239000000428 dust Substances 0.000 claims abstract description 45
- 239000002245 particle Substances 0.000 claims description 112
- 238000007689 inspection Methods 0.000 claims description 34
- 239000000126 substance Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 11
- 238000005259 measurement Methods 0.000 description 11
- 238000005096 rolling process Methods 0.000 description 7
- 239000010445 mica Substances 0.000 description 6
- 229910052618 mica group Inorganic materials 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 238000005498 polishing Methods 0.000 description 5
- 235000012489 doughnuts Nutrition 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 241000519995 Stachys sylvatica Species 0.000 description 2
- 238000010191 image analysis Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- -1 scratches Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
(57)【要約】 (修正有)
【目的】 水滴、ゴミ、キズ、しみ等を非金属介在物と
区別して検出する。
【構成】 対象物を撮像して濃淡画像を生成し、この濃
淡画像中の丸みを帯びた異物の中央部を通るライン上の
濃度プロフィールを求め、この濃度プロフィールの一次
微分が0点を通る個数を求め、この0点を通る個数が3
以上の時、異物を水滴とする。また、異物の濃度・形状
から、ゴミ、キズ及びしみを判定する。
(57) [Summary] (Corrected) [Purpose] To detect water droplets, dust, scratches, and stains separately from non-metallic inclusions. [Structure] An image of an object is picked up to generate a grayscale image, a density profile on a line passing through a central portion of a rounded foreign object in the grayscale image is obtained, and the first derivative of this density profile passes through 0 points. Is calculated and the number of points passing through this 0 point is 3
In the above case, the foreign matter is treated as water droplets. Also, dust, scratches, and stains are determined from the density and shape of the foreign matter.
Description
【0001】[0001]
【産業上の利用分野】本発明は金属組織を顕微鏡で検査
する際、試料上のゴミ、キズ、水滴などを画像解析によ
り判定する画像処理による異物検出方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a foreign matter detection method by image processing for determining dust, scratches, water drops, etc. on a sample by image analysis when inspecting a metallographic structure with a microscope.
【0002】[0002]
【従来の技術】金属顕微鏡にテレビカメラを接続し、撮
像された画像から測定対象の鋼材中の非金属介在物を測
定することが行われている。これらはJIS−G−05
55やASTM−E45・1245等の規格によって行
われ、撮像した画像から2値画像を作成し、粒子の大き
さや形状、所定の間隔以内で連続する個数などを測定
し、非金属介在物を検出する。2. Description of the Related Art A television camera is connected to a metallographic microscope to measure non-metallic inclusions in a steel material to be measured from a captured image. These are JIS-G-05
55, ASTM-E45 / 1245, etc., a binary image is created from the captured image, and the size and shape of particles and the number of consecutive particles within a predetermined interval are measured to detect non-metallic inclusions. To do.
【0003】測定対象の試料の表面は研磨機により十分
磨いた鏡面状態に仕上げられたもの、またはこれをエッ
チングしたものである。これらの研磨機により試料表面
に傷が発生することがある。また研磨した後、水洗いを
し、熱風乾燥または溶剤により表面を拭きとって顕微鏡
に設定するが、水滴が残っている場合がある。また水滴
が乾燥した後、水滴中に浮かんでいたゴミが乾燥して試
料に付着してしみになる場合がある。また拭き取り時に
ゴミが試料に付着することもある。The surface of the sample to be measured is one that has been polished into a mirror-finished state by a polishing machine or that has been etched. These polishing machines may cause scratches on the sample surface. Further, after polishing, the surface is washed with water, dried with hot air or wiped with a solvent to set the surface on a microscope, but water droplets may remain. In addition, after the water droplets are dried, dust floating in the water droplets may be dried and adhere to the sample to cause stains. In addition, dust may adhere to the sample during wiping.
【0004】[0004]
【発明が解決しようとする課題】非金属介在物の測定に
ついては、画像処理技術を用いて自動測定が進められて
いるが、水滴、ゴミ、キズ、しみ等が混在する場合、こ
れらの判定が難しく、検査員が顕微鏡画像を直接見なが
らこれらを判定しなければならない場合が多く、自動測
定の大きな障害となっていた。Regarding the measurement of non-metallic inclusions, automatic measurement is being carried out by using image processing technology. However, when water drops, dust, scratches, stains, etc. are mixed, these judgments are made. In many cases, it is difficult for the inspector to judge them by directly looking at the microscopic image, which is a major obstacle to automatic measurement.
【0005】本発明は上述の問題点に鑑みてなされたも
ので、水滴、ゴミ、キズ、しみなど自動的に判定する方
法を提供することを目的とする。The present invention has been made in view of the above problems, and an object of the present invention is to provide a method for automatically determining water drops, dust, scratches, stains and the like.
【0006】[0006]
【課題を解決するための手段】上記目的を達成するた
め、請求項1の発明では、対象物を撮像して濃淡画像を
生成し、この濃淡画像に現れた円形に近い異物の中央部
を通るライン上の濃度プロフィールを求め、該濃度プロ
フィールの一次微分曲線が0を通過する点の個数を求
め、この個数が3以上のとき、前記異物を水滴と判定す
る。In order to achieve the above object, in the invention of claim 1, an object is imaged to generate a grayscale image, and the grayscale image appears in the grayscale image and passes through the central portion of the foreign matter having a shape close to a circle. The concentration profile on the line is determined, and the number of points where the first derivative curve of the concentration profile passes through 0 is determined. When the number is 3 or more, the foreign matter is determined to be a water drop.
【0007】また、請求項2の発明では、対象物を撮像
して濃淡画像を生成し、この濃淡画像に現れた異物の面
積が所定値よりも大きく、異物を通る複数本のライン上
の濃度プロフィールを求め、各濃度プロフィールの一次
微分曲線が0を通過する点の個数を求め、この個数の最
大値が3以上のときは前記異物を水滴またはゴミと判定
する。According to the second aspect of the present invention, an object is imaged to generate a grayscale image, the area of the foreign matter appearing in the grayscale image is larger than a predetermined value, and the density on a plurality of lines passing through the foreign matter is high. The profile is determined, and the number of points at which the first-order differential curve of each concentration profile passes 0 is determined. When the maximum value of this number is 3 or more, the foreign matter is determined to be a water drop or dust.
【0008】また、請求項3の発明では、対象物を撮像
して濃淡画像を生成し、この濃淡画像に現れた異物の面
積が所定値よりも大きく、異物を通る複数本のライン上
の濃度プロフィールを求め、濃度プロフィールの一次微
分曲線の異物の端部における勾配が所定の値以下のと
き、前記異物をゴミと判定する。According to the third aspect of the present invention, an object is imaged to generate a grayscale image, the area of the foreign matter appearing in the grayscale image is larger than a predetermined value, and the density on a plurality of lines passing through the foreign matter is high. The profile is obtained, and when the gradient at the end of the foreign substance of the first derivative curve of the concentration profile is less than or equal to a predetermined value, the foreign substance is determined to be dust.
【0009】また、請求項4の発明では、対象物を撮像
して濃淡画像を生成し、この濃淡画像に現れた異物の長
さと幅の比が第1設定値以上であり、長さが第2設定値
以上で圧延方向と異なる方向に線状の粒子があり、この
粒子の長さ方向に線を伸ばし、この線の太さをSkとし
た帯状領域をLとし、この帯状領域L内の粒子をすべて
キズと判定する。Further, in the invention of claim 4, the object is imaged to generate a grayscale image, and the ratio of the length to the width of the foreign matter appearing in the grayscale image is not less than the first set value, and the length is the first. There are linear particles in a direction different from the rolling direction with a setting value of 2 or more, and a line is extended in the length direction of the particle, and a band-shaped region having the thickness of this line as Sk is defined as L, and within this band-shaped region L All particles are judged as scratches.
【0010】また、請求項5の発明では、対象物を撮像
して濃淡画像を生成し、この濃淡画像に現れた異物の長
さと幅の比が第1設定値以上であり、長さが第2設定値
未満の線状粒子があり、この粒子の長さ方向に線を伸ば
し、この線の太さをSkとした帯状領域をLとし、この
帯状領域L内の粒子の数が所定値以上のとき、この帯状
領域L内の粒子をキズ判定とする。Further, in the invention of claim 5, an object is imaged to generate a grayscale image, and the ratio of the length to the width of the foreign matter appearing in the grayscale image is not less than the first set value, and the length is the first. There is a linear particle of less than 2 set values, a line is extended in the length direction of this particle, and the band-shaped region where the thickness of this line is Sk is L, and the number of particles in this band-shaped region L is a predetermined value or more. At this time, the particles in the band-shaped region L are determined as scratches.
【0011】また、請求項6の発明では、対象物を撮像
して濃淡画像を生成し、この濃淡画像に現れた粒子につ
いて各粒子を中心に矩形h×vの検査枠を設定し、m個
以上の粒子を含む検査枠でかつ他の検査枠と重なった検
査枠を取り出し、この重なった検査枠群に含まれる全て
の粒子を囲む最小の矩形を設定し、この矩形がほぼ正方
形となるとき、この矩形内の粒子をしみと判定する。In the sixth aspect of the present invention, an object is imaged to generate a grayscale image, and for the particles appearing in this grayscale image, a rectangular h × v inspection frame is set around each particle, and m When an inspection frame that includes the above particles and that overlaps with other inspection frames is taken out, and the minimum rectangle that encloses all the particles included in this overlapping inspection frame group is set, and this rectangle becomes almost square , The particles in this rectangle are determined as stains.
【0012】[0012]
【作用】請求項1の発明において、水滴の場合、円形に
近く、円形の度合いを例えば円形係数πML2 /(4A
0)(MLは異物の最大長さ、A0は異物の面積)で調
べ、この円形係数が1に近くなれば、(例えば0.7以
上)円形に近いものとする。また、水滴の場合、図2に
示すように中央が明るくなり、その周囲はドーナツ状に
暗くなっている。このため水滴の濃淡画像のほぼ中央部
を通るライン上の濃度プロフィールは破線で示すように
ドーナツ部で暗いピークが生じ、中央部で明るいピーク
が生じている。このため一次微分をとると、それぞれの
ピーク位置で0となり、このような0となる点が3点生
じる。これにより水滴を検出できる。水滴の盛り上がり
とこれに当たる照明の具合によっては非同心の2重リン
グになることもある。In the invention of claim 1, in the case of a water drop, it is close to a circle, and the degree of the circle is determined by, for example, a circle coefficient πML 2 / (4A
0) (ML is the maximum length of the foreign matter, A0 is the area of the foreign matter), and if the circular coefficient is close to 1, it is close to a circle (for example, 0.7 or more). In the case of water drops, as shown in FIG. 2, the center is bright and the surroundings are dark like a donut. Therefore, as shown by the broken line, the concentration profile on the line passing through the substantially central portion of the grayscale image of the water drop has a dark peak at the donut portion and a bright peak at the central portion. Therefore, if the first derivative is taken, it becomes 0 at each peak position, and three such 0 points occur. This makes it possible to detect water drops. It may become a non-concentric double ring depending on the swell of the water drop and the condition of the illumination that hits it.
【0013】請求項2の発明では、2値化した黒粒子で
ある異物を複数の方向に走査して水滴またはゴミを検出
する方法を示し、水滴に反射による明るい部分があると
きや、焦点深度内の厚さのゴミの中に白点が1個以上あ
るときには、その走査線のいずれかにおいて、濃度プロ
フィールの一次微分曲線の0を通過する点が3点以上の
ときは水滴またはゴミと判定できる。According to a second aspect of the present invention, there is shown a method for detecting a water drop or dust by scanning a foreign material which is a binarized black particle in a plurality of directions, and when a water drop has a bright portion due to reflection or a depth of focus. If there are one or more white spots in the dust of the inside thickness, and if there are three or more points that pass through 0 of the first derivative curve of the concentration profile on any of the scanning lines, then it is judged as a water drop or dust. it can.
【0014】請求項3の発明において、ゴミの場合、そ
の面積が所定値、例えば1μm2 より大きく、さらに試
料表面より盛り上がって存在する。顕微鏡の焦点は試料
表面に合っているので、ゴミはぼけて見える。このため
濃淡画像に表れた異物を通るライン上の濃度プロフィー
ルと、この一次微分曲線を求め、この一次微分曲線の異
物の端部における勾配が所定の値より小さい時はゴミと
判定できる。つまり非金属介在物のように焦点の合って
いるものは一次微分曲線の勾配がその端部で大きく鮮明
な濃淡画像となっておりゴミは区別できる。In the third aspect of the present invention, in the case of dust, the area thereof is larger than a predetermined value, for example, 1 μm 2 , and is present higher than the sample surface. Since the focus of the microscope is on the sample surface, the dust looks blurry. Therefore, the density profile on the line passing through the foreign matter appearing in the grayscale image and this primary differential curve are obtained, and when the gradient at the end of the foreign matter of this primary differential curve is smaller than a predetermined value, it can be determined as dust. In other words, a non-metallic inclusion that is in focus, such as a non-metallic inclusion, has a sharp gradient image of the first-order derivative curve at its end and is a clear gray image, and dust can be distinguished.
【0015】請求項4の発明において、異物の長さと幅
の比が第1設定値以上で細長く、長さが第2設定以上の
場合で圧延方向と異なる方向に伸びた線状の粒子である
場合、この線状の粒子をその長さ方向に伸ばし、幅をS
kとした帯状領域Lを設け、この帯状領域L内の粒子を
全てキズと判定する。Skとしては例えば1μm程度が
よい。In a fourth aspect of the present invention, when the ratio of the length to the width of the foreign matter is not less than the first set value and is elongated, and the length is not less than the second setting, it is a linear particle extending in a direction different from the rolling direction. In this case, extend this linear particle in its length direction and set its width to S
A band-shaped region L having a length of k is provided, and all particles in the band-shaped region L are determined to be scratched. Sk is preferably about 1 μm, for example.
【0016】請求項5の発明において、異物の長さと幅
の比が第1設定値以上で細長いが、長さは第2設定値未
満で短い場合、この粒子を長さ方向に伸ばし、その幅を
Skとした帯状領域Lを設け、この帯状領域L内の粒子
の数が所定値以上のとき、この帯状領域L内の粒子は全
てキズと判定する。In the invention of claim 5, when the ratio of the length to the width of the foreign matter is longer than the first set value and elongated but the length is shorter than the second set value and is short, the particles are extended in the length direction and the width thereof is increased. Is set as Sk, and when the number of particles in the belt-shaped region L is equal to or larger than a predetermined value, all the particles in the belt-shaped region L are determined to be scratched.
【0017】請求項6の発明において、各粒子を中心と
して矩形h×vの検査枠を設定し、この検査枠の中にm
個以上の粒子が入っている検査枠を取り出す。さらにこ
の検査枠の内、互いに重なり合った検査枠群を取り出
し、この検査枠群内に含まれる全ての粒子を最小の矩形
で囲み、この矩形がほぼ正方形に近いとき、この矩形内
の粒子をしみと判定する。しみは水分に浮かんだゴミが
乾燥してなる場合が多く、このとき水分はほぼ円とな
り、ここに浮かんだゴミも円形内に残るため、ほぼ正方
形内に集まってしみとなる。In the invention of claim 6, a rectangular h × v inspection frame is set around each particle, and m is set in this inspection frame.
Take out the inspection frame containing more than one particle. Furthermore, take out the inspection frame groups that overlap each other from this inspection frame, enclose all the particles contained in this inspection frame group with the smallest rectangle, and when this rectangle is almost square, stain the particles in this rectangle. To determine. In many cases, stains that are floated on water are dried, and at this time, the moisture becomes a circle, and the dust that floats here also remains in a circle, so it gathers in a square and becomes a stain.
【0018】[0018]
【実施例】以下、本発明の実施例について図面を参照し
て説明する。図1は本実施例を実施する装置の構成を示
すブロック図である。顕微鏡1には接眼レンズ部に撮像
用レンズを取り付け、この撮像レンズを通して撮像する
撮像装置16が取り付けられている。測定試料を載せる
ステージ17はオートステージドライバ10からの信号
によりスタンドに設けたパルスモータで前後左右に移動
させる平面移動機構18により平面位置調整が行われ、
オートフォーカスドライバ11により垂直移動機構19
を作動させてステージ17の上下方向の移動を行い、焦
点を合わせる。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing the arrangement of an apparatus for carrying out this embodiment. An image pickup lens 16 is attached to the eyepiece portion of the microscope 1 and an image pickup device 16 for picking up an image through the image pickup lens is attached. The stage 17 on which the measurement sample is placed is subjected to plane position adjustment by a plane moving mechanism 18 for moving the stage 17 back and forth and left and right by a pulse motor provided on the stand in response to a signal from the auto stage driver 10.
Vertical movement mechanism 19 by autofocus driver 11
Is operated to move the stage 17 in the vertical direction to focus.
【0019】A/D変換器2は撮像装置16からの入力
データをアナログからディジタルに変換し、入力バッフ
ァ3はこのディジタルデータを一時的に格納する。バス
4は信号の伝達を行い、プログラムメモリ5は本装置の
動作を規定するプログラムを格納し、CPU6はこのプ
ログラムに従い装置全体の制御を行う。The A / D converter 2 converts the input data from the image pickup device 16 from analog to digital, and the input buffer 3 temporarily stores the digital data. The bus 4 transmits signals, the program memory 5 stores a program that defines the operation of the apparatus, and the CPU 6 controls the entire apparatus according to this program.
【0020】画像プロセッサ7は入力した画像データの
濃淡処理、2値化処理、画像解析等を行い、濃淡画像メ
モリ8は濃淡画像データを格納し、2値化メモリ9は2
値または多値化画像データを格納する。オートステージ
ドライバ10はCPU6からの指示により測定試料を載
せるステージ17を平面移動機構18を制御してX,Y
方向に移動させ、測定試料の測定位置、領域の設定を行
う。オートフォーカスドライバ11はCPU6より垂直
移動機構19への制御命令を受け、垂直移動機構19を
制御し、自動的に焦点を合わせる。出力バッファ12は
出力するデータを一旦格納し、D/A変換器13はこの
出力データをディジタルよりアナログに変換し、CRT
14はこの出力データを画面に表示する。キーボード1
5よりオペレータが指示やデータを入力する。The image processor 7 performs grayscale processing, binarization processing, image analysis, etc. of the input image data, the grayscale image memory 8 stores the grayscale image data, and the binarization memory 9 stores 2
Stores value or multi-valued image data. The auto stage driver 10 controls the plane moving mechanism 18 to move the stage 17 on which the measurement sample is placed according to an instruction from the CPU 6 to move X, Y.
Direction, and set the measurement position and area of the measurement sample. The autofocus driver 11 receives a control command from the CPU 6 to the vertical movement mechanism 19 and controls the vertical movement mechanism 19 to automatically focus. The output buffer 12 temporarily stores the data to be output, and the D / A converter 13 converts this output data from digital to analog, and the CRT
14 displays this output data on the screen. Keyboard 1
From 5 the operator inputs instructions and data.
【0021】次に第1実施例を説明する。本実施例は水
滴を検出する方法を示す。金属顕微鏡で金属中の非金属
介在物を測定する場合、測定対象の試料の表面は研磨機
により鏡面仕上げされ、水洗いして水分を蒸発または拭
き取った後、金属顕微鏡にセットされるが、水滴が残っ
ている場合がある。図2は水粒子の濃淡画像と、水粒子
の中央部を通るラインAの濃度プロフィールyおよびそ
の一次微分曲線y′を示す。水粒子の濃淡画像は中央部
が明るく、その周囲のドーナツ状の部分は暗くなってい
る。破線はラインAの濃度プロフィールyを示し、縦軸
yは濃度、横軸xは粒子の位置を示す。ドーナツ部で暗
いピークが発生し、中央部で明るいピーク値が発生して
いる。実線は濃度プロフィールyの一次微分曲線y′を
示し、縦軸y′は濃度の一次微分値、横軸xは粒子の位
置を表す。濃度プロフィールがピークまたはボトムとな
る位置で一次微分曲線は0となっている。この0となる
点をゼロクロス点と称する。1つの粒子の領域内で破線
のピークまたはボトムは3個発生するのでゼロクロス点
も3点生じる。水滴を表す粒子は、円形に近いこと、お
よび水粒子のほぼ中央部を通るラインの濃度プロフィー
ルを求め、この一次微分曲線が3点以上のゼロクロス点
を有していることから識別できる。なお、ゼロクロス点
を数える領域は粒子のエッジ間とする。Next, the first embodiment will be described. This example shows a method for detecting water drops. When measuring non-metallic inclusions in metal with a metallurgical microscope, the surface of the sample to be measured is mirror-finished with a polishing machine, washed with water to evaporate or wipe off water, and then set on the metallographic microscope. It may remain. FIG. 2 shows a grayscale image of water particles, a concentration profile y of a line A passing through the central portion of the water particles, and its first derivative curve y '. The gray-scale image of water particles has a bright central part and a dark donut-shaped part around it. The broken line shows the concentration profile y of the line A, the vertical axis y shows the concentration, and the horizontal axis x shows the position of the particles. A dark peak occurs in the donut part and a bright peak value occurs in the center part. The solid line shows the first derivative curve y ′ of the concentration profile y, the vertical axis y ′ represents the first derivative value of the concentration, and the horizontal axis x represents the position of the particle. The first derivative curve is 0 at the position where the concentration profile has a peak or bottom. The point that becomes 0 is called a zero cross point. Since three broken line peaks or bottoms occur in one particle region, three zero cross points also occur. It can be identified from the fact that the particles representing the water droplets are close to a circle, and the concentration profile of the line passing through the substantially central portion of the water particles is obtained, and this first-order differential curve has three or more zero-cross points. The region where the zero-cross points are counted is between the edges of the particles.
【0022】図3は水滴を識別する動作フロー図であ
る。まず測定する領域を設定する(S1)。この場合、
各粒子毎に測定するので測定領域は1つの粒子とする。
次に粒子の円形への近さを調べるため円形状係数を用い
る。円形状係数は下式で示される。 円形状係数=πML2 /(4A0) ……(1) ここでMLは粒子の最大長を表し、A0は粒子の面積を
示す。円形状係数は粒子が真円のとき1となり、真円よ
り離れるに従い小さな値となる。円形に近いか否かの基
準として設定値Kを0.6〜0.7とするのがよく、実
施例では0.6とする。なお、円形に近いかの判定は、
上記の円形状係数を用いることに限定する必要はなく、
円に近いか細長いものかなどのように大まかな分類がで
きればよい。このようにして円形に近いかを調べ(S
2)、円形に近くないものは水滴でないとし(S9)、
円形に近いと判断されると、図2に示したように粒子の
中央部を通る濃度プロフィールを得て(S3)、この濃
度プロフィールを必要に応じて滑らかにした後(S
4)、濃度プロフィールの一次微分曲線を得る(S
5)。FIG. 3 is an operation flow chart for identifying water drops. First, the area to be measured is set (S1). in this case,
Since each particle is measured, the measurement area is one particle.
Next, the circular shape factor is used to investigate the closeness of particles to a circle. The circular shape factor is expressed by the following equation. Circular shape factor = πML 2 / (4A0) (1) Here, ML represents the maximum length of the particle, and A0 represents the area of the particle. The circular shape factor becomes 1 when the particle is a perfect circle, and becomes a smaller value as it goes away from the perfect circle. The set value K is preferably set to 0.6 to 0.7 as a reference of whether or not it is close to a circle, and is set to 0.6 in the embodiment. In addition, the judgment of whether it is close to a circle is
It is not necessary to limit to using the above circular shape factor,
It is only necessary to be able to make a rough classification such as whether it is close to a circle or elongated. In this way, check if it is close to a circle (S
2) If it is not a circle, it is not a water drop (S9).
If it is determined that the concentration is close to a circle, a concentration profile passing through the center of the particle is obtained as shown in FIG. 2 (S3), and the concentration profile is smoothed as necessary (S3).
4) Obtain the first derivative curve of the concentration profile (S
5).
【0023】一次微分曲線がゼロを通過する点を調べn
個得られたとする(S6)。このn個が基準値n1個以
上かを調べる(S7)。基準値n1は図2で説明したよ
うに水滴の場合3個はあるので3個とする。nが3個以
上のとき粒子を水滴とし(S8)、3個未満は水滴でな
いとする(S9)。これにより粒子を水滴と判定するこ
とができる。The point where the first derivative curve passes through zero is examined and n
It is assumed that individual pieces have been obtained (S6). It is checked whether or not the number n is the reference value n1 or more (S7). As described with reference to FIG. 2, the reference value n1 is set to three because there are three in the case of water droplets. When n is 3 or more, the particles are regarded as water droplets (S8), and when less than 3 particles are not water droplets (S9). This makes it possible to determine the particles as water droplets.
【0024】次に第2実施例を説明する。本実施例は第
1実施例では検出できない水滴と雲母、アルミナ箔、プ
ラスチックのように厚みがなく、内部に反射部分や白色
部があるゴミの検出および一般の厚さのあるゴミの検出
を行う。雲母などの薄くて反射部のあるものは水滴と同
様に明るい範囲があり、水滴と区別できない場合がある
ので水滴と共に検出する。図4は粒子の形状が円形より
離れ、明るい範囲が偏心している水滴、または、部分的
に明るい範囲を有する雲母などの粒子について、中央部
を通るラインAの濃度プロフィールyとその一次微分曲
線y′を示す。破線で示す濃度プロフィールyは縦軸y
に濃度を示し、横軸xは粒子の位置を表す。実線で示す
一次微分曲線y′は縦軸y′に濃度の一次微分値、横軸
xに粒子の位置を表す。図5は濃度プロフィールを求め
る粒子のラインの方向を示す。Aを基準としてBはAに
直交し、CはAより45°反時計方向に傾斜し、DはC
と直交している。また、CとDは矩形領域の対角線とし
てもよい。本実施例の水滴やゴミの粒子は中央から離れ
た所に反射部や白点があることを考慮して、複数のライ
ン、通常A,B,C,Dの4本のラインについて濃度プ
ロフィールとその一次微分曲線を求め判定を行う。Next, a second embodiment will be described. In the present embodiment, unlike the first embodiment, water particles, mica, alumina foil, plastic, etc., which have no thickness and have a reflection part or white part inside, and dust having a general thickness are detected. . Mica and other thin and reflective parts have the same bright range as water droplets and are sometimes indistinguishable from water droplets, so they are detected together with water droplets. FIG. 4 shows the concentration profile y of the line A passing through the central portion and the first derivative curve y of the particle such as a water drop in which the shape of the particle is deviated from the circular shape and the bright range is eccentric, or a particle such as mica having a partially bright range. ′ Is shown. The concentration profile y shown by the broken line is the vertical axis y
Represents the concentration, and the horizontal axis x represents the position of the particle. The first-order differential curve y ′ shown by the solid line represents the first-order differential value of the concentration on the vertical axis y ′ and the position of the particle on the horizontal axis x. FIG. 5 shows the direction of the particle lines for which the concentration profile is determined. B is orthogonal to A with A as a reference, C is inclined 45 ° counterclockwise from A, and D is C
Is orthogonal to. Further, C and D may be diagonal lines of the rectangular area. In consideration of the fact that the water droplets and dust particles of this embodiment have a reflection part and a white spot apart from the center, the density profile is obtained for a plurality of lines, usually four lines A, B, C, and D. The first-order differential curve is obtained and determination is performed.
【0025】水滴や雲母などの場合、粒子内に明るい範
囲を有するので、第1実施例と同様に粒子の濃度プロフ
ィールの一次微分曲線が0を通過する点が3個以上のと
き、水滴やゴミと判定する。ただし、この場合、一次微
分曲線を得るラインは複数とし、このいずれかのライン
の一次微分曲線により判断する。また、これらの粒子
は、一般にある値以上の面積を有しており、所定値以上
の面積と、いずれかの一次微分曲線の0を通過する点が
3点以上の条件とから水滴またはゴミと判定する。図4
においてB方向に走査すると一次微分曲線の0を通過す
る点は1点であるが、図5のようにABCDの4本のラ
インの中の1本以上に0を通過する点が3個以上のとき
には、水滴またはゴミと判定する。図4では左方に1個
のみ水滴または雲母の明るい範囲がある例を示したが、
これが複数ある場合もある。このときには、2個の明領
域を通るラインには一次微分曲線の0を通過する点は5
個以上ある。同様に明領域数に応じ通過点は増加する。In the case of water drops or mica, since there is a bright range within the particles, when there are three or more points where the first derivative curve of the concentration profile of the particles passes through 0, as in the first embodiment, water drops and dust particles are present. To determine. However, in this case, there are a plurality of lines for obtaining the primary differential curve, and the determination is made based on the primary differential curve of any one of these lines. In addition, these particles generally have an area of a certain value or more, and when the area of a predetermined value or more and the number of points where 0 of any one of the first-order differential curves passes is three or more points, they are regarded as water drops or dust. judge. FIG.
When scanning in the B direction, there is only one point that passes 0 of the first-order differential curve, but as shown in FIG. 5, one or more of the four lines of ABCD have three or more points that pass 0. Sometimes it is determined to be a water drop or dust. FIG. 4 shows an example in which there is only one water drop or bright range of mica on the left side,
There may be more than one. At this time, the point passing through 0 of the first-order differential curve is 5 on the line passing through the two bright regions.
There are more than one. Similarly, the number of passing points increases according to the number of bright areas.
【0026】図6は非金属介在物(a)とゴミ(b)の
特徴を説明する図である。非金属介在物またはゴミのそ
れぞれの粒子について中央部を通るラインAの濃度プロ
フィールyとその一次微分曲線y′を示す。破線で示す
濃度プロフィールyは縦軸yに濃度を表し、横軸xは粒
子の位置を表す。実線で示す一次微分曲線y′は縦軸
y′に濃度の一次微分値、横軸xに粒子の位置を表す。
非金属介在物は測定試料の表面のレベルにあり、この表
面に対して顕微鏡の焦点が合っているので鮮明な濃淡画
像が得られる。これに対し、ゴミは試料の表面に盛り上
がって存在するため焦点が合わずぼけて見える。この鮮
明さ、即ちぼけの程度は、粒子のエッジ(端部)近傍の
一次微分曲線の勾配に明確に表れる。一次微分曲線の勾
配の取り方の一例を非金属介在物について説明する。
(a)に示すようにエッジ近傍の一次微分曲線のピーク
の値hoに対し微分値が、例えば、25%となるh=
0.25hoの点とピーク点との距離をxとし、次式に
より勾配を求める。 勾配=(ho−h)/x ……(2) (a)に示す非金属介在物の勾配に対し(b)に示すゴ
ミの勾配は小さくなっている。また、ゴミは一般にある
値以上の面積を有しており、この面積が指定値以上ある
ことと勾配からゴミを検出することができる。FIG. 6 is a diagram for explaining the characteristics of non-metallic inclusions (a) and dust (b). The concentration profile y of the line A passing through the central portion and the first derivative curve y'of each particle of non-metallic inclusions or dust are shown. The concentration profile y shown by the broken line represents the concentration on the vertical axis y, and the horizontal axis x represents the position of the particles. The first-order differential curve y ′ shown by the solid line represents the first-order differential value of the concentration on the vertical axis y ′ and the position of the particle on the horizontal axis x.
Since the non-metallic inclusions are at the level of the surface of the measurement sample and the microscope is focused on this surface, a clear gray-scale image can be obtained. On the other hand, since dust is raised on the surface of the sample, the dust is out of focus and looks blurred. This sharpness, that is, the degree of blurring is clearly shown in the gradient of the first-order derivative curve near the edge of the particle. An example of how to obtain the slope of the first-order differential curve will be described for non-metallic inclusions.
As shown in (a), the differential value is, for example, 25% with respect to the peak value ho of the first-order differential curve near the edge.
The distance between the point at 0.25 ho and the peak point is x, and the gradient is calculated by the following equation. Gradient = (ho-h) / x (2) The gradient of dust shown in (b) is smaller than the gradient of non-metallic inclusions shown in (a). In addition, dust generally has an area of a certain value or more, and it is possible to detect the dust from the fact that this area is a specified value or more and the gradient.
【0027】測定する粒子についてはラインは複数本、
通常A,B,C,Dの4本設け、各ラインの一次微分曲
線の粒子のエッジにおける勾配を(2)式より得る。4
本のラインではエッジは8個得られる。これらの勾配の
最大のものでも所定値P以下の場合は全体がぼけている
ものとしてゴミとする。また所定値Pを超えるものがあ
っても(部分的にぼけていない所があっても)、最小の
勾配が所定値Q以下のときは、部分的にぼけの程度が大
きいとしてゴミする。所定値P,Qは測定対象粒子の組
成によって予め設定しておくものとする。Regarding the particles to be measured, there are a plurality of lines,
Usually, four lines A, B, C, and D are provided, and the gradient at the edge of the particle of the first-order differential curve of each line is obtained from equation (2). Four
Eight edges are obtained in the line of the book. If the maximum of these gradients is less than or equal to the predetermined value P, the whole is regarded as blurred and regarded as dust. Further, even if there is a value exceeding the predetermined value P (even if there is a part that is not partially blurred), if the minimum gradient is equal to or less than the predetermined value Q, the degree of partial blur is considered to be large and dust is generated. The predetermined values P and Q are set in advance according to the composition of the particles to be measured.
【0028】図7は第2実施例の動作フロー図である。
まず測定領域として1つの粒子とする(S10)。例え
ば、粒子のX座標の両端とY座標の両端で囲まれた範囲
をとる。2値化した粒子の外周を領域としてもよい。次
に粒子の面積が設定値A1以上か調べる(S11)。設
定値A1としては、本実施例では1μm2 を用いるが、
水滴やゴミは測定環境によっても異なるものであるの
で、環境に応じた値を設定する。次にk本分の濃度プロ
フィールを取得する(S12)。kとしては前述した
A,B,C,Dの4本が適切であるが増減してもよい。
しかし少なくとも1本は設ける。次に各濃度プロフィー
ルをスムージングし(S13)、一次微分する(S1
4)。次に一次微分曲線Po〜Pkのそれぞれのゼロク
ロス点の数n1,n2,……,を検出し(S15)、n
1,n2,……の最大値が設定値Nより小さくないかを
調べ(S16)、小さくなければ水滴、またはゴミとす
る(S17)。なお、Nは通常3とするが、変更も可能
である。これにより、図4に示したような水滴、または
雲母などのゴミを検出できる。FIG. 7 is an operation flow chart of the second embodiment.
First, one particle is set as a measurement region (S10). For example, the range surrounded by both ends of the X coordinate and the Y coordinate of the particle is taken. The outer circumference of the binarized particles may be used as the area. Next, it is checked whether the area of the particles is the set value A1 or more (S11). As the set value A1, 1 μm 2 is used in this embodiment,
Since water drops and dust vary depending on the measurement environment, set the value according to the environment. Next, the concentration profiles for k lines are acquired (S12). As k, the four lines A, B, C, and D described above are suitable, but the number may be increased or decreased.
However, at least one is provided. Next, each density profile is smoothed (S13) and first-order differentiated (S1).
4). Next, the numbers n1, n2, ... Of the respective zero-cross points of the primary differential curves Po to Pk are detected (S15), and n
It is checked whether the maximum value of 1, n2, ... Is smaller than the set value N (S16). If it is not smaller, it is determined as a water drop or dust (S17). Note that N is usually 3, but it can be changed. This makes it possible to detect water drops as shown in FIG. 4 or dust such as mica.
【0029】次に粒子のエッジ付近の一次微分曲線Po
〜Pk の勾配の絶対値L1,L2,……を(2)式を用
いて求める(S18)。1本の一次微分曲線につき粒子
の両端のエッジの勾配を求めるので2個の勾配が得ら
れ、k本の濃度プロフィールでは2k個の勾配の絶対値
が得られる。次に勾配の絶対値L1,L2,……の最大
値が設定値Pより大きくないか調べ(S19)、大きく
なければゴミとする(S21)。大きい場合は、絶対値
L1,L2,……の最小値が設定値Qより大きくないか
調べ(S20)、大きくなければゴミとする(S2
1)。設定値Qより大きい場合は、ゴミ、水滴でないと
判定する(S22)。設定値P,Qについては、測定対
象粒子の組成に応じて適切な値を予め設定しておく。そ
の理由は、ゴミでもエッジの一部が薄く、かつ試料に密
着している場合があっても走査線が複数であるときに
は、エッジのどこかで表面から浮き上がって焦点がボケ
るので、焦点が全周にわたり合っている介在物と区別す
ることができるからである。Next, the primary differential curve Po near the edge of the particle
The absolute values L1, L2, ... Of the gradient of .about.Pk are obtained using the equation (2) (S18). Since the gradients of the edges at both ends of the particle are obtained for one primary differential curve, two gradients are obtained, and in the k concentration profile, absolute values of 2k gradients are obtained. Next, it is checked whether or not the maximum value of the absolute values L1, L2, ... Of the gradient is larger than the set value P (S19), and if it is not larger, it is regarded as dust (S21). If it is larger, it is checked whether the minimum value of the absolute values L1, L2, ... Is larger than the set value Q (S20). If it is not larger, it is considered as dust (S2).
1). If it is larger than the set value Q, it is determined that it is not dust or water droplets (S22). Appropriate values are set in advance for the set values P and Q according to the composition of the particles to be measured. The reason is that even if dust has a part of the edge thin and even if it is in close contact with the sample, if there are multiple scanning lines, it will float from the surface somewhere on the edge and the focus will be blurred, so the focus will be This is because it can be distinguished from inclusions that are fitted over the entire circumference.
【0030】次に第3実施例を説明する。本実施例は試
料を研磨するとき生じるキズを検出する方法である。キ
ズは細長い粒子となって現れるが、切れ切れになって現
れる場合もある。なお、細長い粒子が圧延方向に発生し
ている場合、非金属介在物の可能性が大きいので、本実
施例ではキズではないと判定し、後の検査に委ねる。Next, a third embodiment will be described. The present embodiment is a method for detecting scratches that occur when polishing a sample. The scratches appear as elongated particles, but they may also appear as pieces. If elongated particles are generated in the rolling direction, there is a high possibility of non-metallic inclusions, so in this embodiment it is determined that they are not scratches, and the subsequent inspection is entrusted.
【0031】図8は本実施例の動作フロー図である。ま
ず、粒子の最大長MLをその幅Bdで割った値が設定値
B1より大きいか調べる(S31)。設定値B1として
は本実施例では30としている。この値も発生するキズ
の形状に応じて適切な値としてよい。設定値B1より小
さければキズではないとする(S32)。設定値B1以
上の場合、粒子の最大長MLが設定値B2以上か調べ
(S33)、以上であれば、更に粒子の配置方向(長さ
方向)が圧延方向かを調べる(S34)。なお、非圧延
材の場合は、粒子の配向方向は圧延方向ではないとして
S35以降へ進む。設定値B2は本実施例では20μm
とするが、この値も発生するキズの形状に応じて適切な
値としてよい。S34で圧延方向の場合は、非金属介在
物の可能性があるので、キズではないとして(S3
2)、後の検査に委ねる。FIG. 8 is an operation flow chart of this embodiment. First, it is checked whether a value obtained by dividing the maximum particle length ML by the width Bd is larger than the set value B1 (S31). The set value B1 is 30 in this embodiment. This value may also be an appropriate value depending on the shape of the scratches that occur. If it is smaller than the set value B1, it is determined that there is no scratch (S32). If the value is equal to or larger than the set value B1, it is checked whether the maximum length ML of the particles is equal to or larger than the set value B2 (S33). If the value is equal to or larger than the set value B2, it is further checked whether the arrangement direction (length direction) of the particles is the rolling direction (S34). In the case of a non-rolled material, the grain orientation direction is not the rolling direction, and the process proceeds to S35 and thereafter. The set value B2 is 20 μm in this embodiment.
However, this value may also be an appropriate value depending on the shape of the scratches that occur. In the case of S34 in the rolling direction, there is a possibility of non-metallic inclusions, so there is no flaw (S3
2) Leave it to the subsequent inspection.
【0032】S34で圧延方向でない場合、粒子の長さ
方向に伸ばした線分Sを設定する(S35)。図9はキ
ズを検出する場合の作図を説明する図で、粒子Fの最大
長ML方向に線分Sを描いた状態を示す。この線分の幅
をSkとした帯状領域Lを設定する(S36)。線分S
の長さは、その長さ方向に他の粒子が並んでいる範囲と
し、幅Skは1〜3μm程度とし本実施例では1μmと
する。この帯状領域L内の粒子は全てキズとする(S3
7)。キズは同一線上に一体で、または切れ切れに存在
するのが普通なので、このように帯状領域L内のものは
全てキズとしたものである。なお、帯状領域Lと交差す
る粒子はキズとはしない。If it is not in the rolling direction in S34, the line segment S extended in the length direction of the particles is set (S35). FIG. 9 is a diagram for explaining drawing when detecting a flaw, and shows a state in which a line segment S is drawn in the maximum length ML direction of the particle F. A band-shaped region L having the width of this line segment as Sk is set (S36). Line segment S
Has a range in which other particles are arranged in the length direction, and has a width Sk of about 1 to 3 μm and 1 μm in this embodiment. All particles in this band-shaped region L are scratched (S3
7). Since scratches are usually present on the same line integrally or in pieces, all the scratches in the strip-shaped region L are scratches. Particles that intersect the strip region L are not scratched.
【0033】S33において粒子の最大長MLが設定値
B2より短い時も、粒子方向に線分Sを伸ばし(S3
8)、線分の幅をSkとした帯状領域Lを得る(S3
9)。S38,S39はS35,S36と同じ内容であ
る。次に帯状領域L内の粒子の数iを得る(S40)。
このiが設定値I以上であるか調べ(S41)、未満で
あるとキズではないとし(S42)、以上であれば帯状
領域L内の粒子は全てキズとする(S43)。設定値I
は本実施例では3個としている。これはキズの場合、あ
る程度長い範囲に発生するが、S33で短い粒子を選択
しており、これらが少なくとも3個以上帯状領域L内に
並んだ場合、キズと判定したものである。なお、帯状領
域Lと交差する粒子はキズとはしない。Even when the maximum particle length ML is shorter than the set value B2 in S33, the line segment S is extended in the particle direction (S3
8), a strip-shaped region L having a line segment width of Sk is obtained (S3
9). S38 and S39 have the same contents as S35 and S36. Next, the number i of particles in the strip region L is obtained (S40).
It is checked whether or not this i is equal to or larger than the set value I (S41), and if it is smaller than the set value I (S42), it is determined that all the particles in the band-shaped region L are scratched (S43). Set value I
Is three in this embodiment. In the case of scratches, this occurs in a somewhat long range, but short particles are selected in S33, and if at least three particles are lined up in the strip region L, it is determined as a scratch. Particles that intersect the strip region L are not scratched.
【0034】次に第4実施例を説明する。本実施例はし
みの検出方法に関するものである。しみは水滴に浮かん
だゴミが水滴の乾燥後、残されたものである程度まとま
って存在し、しかも正方形に近い矩形内に集中すること
が多い。これは水滴が丸いことから生じるものである。Next, a fourth embodiment will be described. The present embodiment relates to a stain detection method. The stains are left behind after the water droplets are dried after the water droplets are dried, and are present together in a certain amount, and are often concentrated in a rectangle close to a square. This results from the round water droplets.
【0035】図10は本実施例の動作フロー図である。
図11は図10の動作フローの具体例を示した図であ
る。まず視野内の各粒子を中心にv×hの検査枠を設定
する(S51)。この場合、粒子は粒子1〜10と10
個あるので、検査枠も10個設定される。ここでvとh
は共に20μmとしている。この大きさもしみの大きさ
によって変えることができる。次にm個以上の粒子を含
みかつ他の検査枠と重なった検査枠を取り出す(S5
2)。mとしてはv×hの大きさによるが、v,hが2
0μmの場合、10個程度が適当である。この場合、説
明を容易にするためm=3とする。するとNO.1,N
O.8〜NO.10検査枠は該当しなくなり、NO.2
〜NO.7検査枠が3個以上を有する。かつNO.2〜
NO.7検査枠は互いに他の検査枠と重なっている。FIG. 10 is an operation flow chart of this embodiment.
FIG. 11 is a diagram showing a specific example of the operation flow of FIG. First, a v × h inspection frame is set around each particle in the visual field (S51). In this case, the particles are particles 1-10 and 10
Since there are pieces, 10 inspection frames are also set. Where v and h
Are both 20 μm. This size can also be changed according to the size of the stain. Next, an inspection frame containing m or more particles and overlapping with other inspection frames is taken out (S5).
2). Although m depends on the size of v × h, v and h are 2
In the case of 0 μm, about 10 pieces are suitable. In this case, m = 3 for ease of explanation. Then NO. 1, N
O. 8 to NO. No. 10 inspection frame no longer applicable, NO. Two
~ NO. 7 inspection frames have 3 or more. And NO. Two
NO. The 7 inspection frames overlap each other.
【0036】NO.2〜NO.7検査枠には次のような
粒子が含まれている。NO.2検査枠は粒子2,3,7
を有する。NO.3検査枠は粒子1,2,3,4,6を
有する。NO.4検査枠は粒子3,4,5を有する。N
O.5検査枠は粒子4,5,6を有する。NO.6検査
枠は粒子3,5,6,7を有する。NO.7検査枠は粒
子2,6,7を有する。このNO.2〜NO.7検査枠
群に含まれる全ての粒子1〜7を囲む最小の矩形を図1
1にRで示すように設定し(S53)、この矩形がほぼ
正方形であるので、この矩形R内の粒子1〜7をしみと
する(S54)。NO. 2 to NO. The 7 inspection frames include the following particles. NO. 2 inspection frames are particles 2, 3, 7
Have. NO. The three inspection frames have particles 1, 2, 3, 4, 6. NO. The 4 inspection frame has particles 3, 4, 5. N
O. The 5 inspection frame has particles 4, 5 and 6. NO. The 6 inspection frame has particles 3, 5, 6, 7. NO. The 7 inspection frame has particles 2, 6, 7. This NO. 2 to NO. The smallest rectangle that encloses all particles 1 to 7 included in the 7 inspection frame group is shown in FIG.
1 is set as indicated by R (S53), and since this rectangle is almost square, particles 1 to 7 within this rectangle R are used as spots (S54).
【0037】なお、本実施例の重要な機能として、上述
のように機械的に異物判断した視野画像を記憶媒体にメ
モリしておき、検査終了後にオペレータコール(操作)
で画像を呼び出し修正する再測定、またはオペレータコ
ール(操作)してその視野の再測定を行うことができ、
検査の省力化と精度向上を図っている。As an important function of this embodiment, the visual field image in which the foreign matter is mechanically judged as described above is stored in a storage medium, and an operator call (operation) is performed after the inspection is completed.
You can re-measure the image by calling and correct the image, or you can re-measure the field of view by calling (operating) the operator.
We are working to reduce inspection labor and improve accuracy.
【0038】[0038]
【発明の効果】以上の説明から明らかなように、本発明
は金属組織を顕微鏡で検査する際、試料上の水滴、ゴ
ミ、キズ、およびしみを画像処理により、ほぼ自動的に
検出できるので、検査員の負担を大きく軽減することが
できる。As is clear from the above description, according to the present invention, when inspecting a metallographic structure with a microscope, water drops, dust, scratches, and stains on a sample can be detected almost automatically by image processing. The burden on the inspector can be greatly reduced.
【図1】本実施例を実現する装置のブロック図である。FIG. 1 is a block diagram of an apparatus that realizes the present exemplary embodiment.
【図2】水滴の濃度プロフィールとその一次微分曲線を
示す図である。FIG. 2 is a diagram showing a concentration profile of a water drop and its first derivative curve.
【図3】水滴を検出する動作フロー図である。FIG. 3 is an operation flow chart for detecting water drops.
【図4】偏心した位置に明部を有する水滴またはゴミの
濃度プロフィールとその一次微分曲線を示す図である。FIG. 4 is a diagram showing a concentration profile of a water drop or dust having a bright portion at an eccentric position and its first derivative curve.
【図5】水滴またはゴミを検出するための濃度プロフィ
ールを得るライン方向の例を示す図である。FIG. 5 is a diagram showing an example in a line direction for obtaining a concentration profile for detecting water drops or dust.
【図6】非金属介在物と試料上に盛り上がったゴミの濃
度プロフィールとその一次微分曲線を示す図である。FIG. 6 is a diagram showing a concentration profile of non-metallic inclusions and dust raised on a sample and a first derivative curve thereof.
【図7】ゴミと水滴を検出する動作フロー図である。FIG. 7 is an operation flow chart for detecting dust and water droplets.
【図8】キズを検出する動作フロー図である。FIG. 8 is an operation flow chart for detecting a flaw.
【図9】キズの検出する場合の帯状領域設定図である。FIG. 9 is a band-shaped region setting diagram when a flaw is detected.
【図10】しみを検出する動作フロー図である。FIG. 10 is an operation flow chart for detecting a stain.
【図11】しみを検出する場合の検査枠設定例を示す図
である。FIG. 11 is a diagram showing an example of an inspection frame setting when detecting a stain.
1 顕微鏡 6 CPU 7 画像プロセッサ 8 濃淡画像メモリ 9 2値化メモリ 10 XYオートステージドライバ 11 オートフォーカスドライバ 14 CRT 16 撮像装置 17 ステージ 18 平面移動機構 19 垂直移動機構 1 Microscope 6 CPU 7 Image Processor 8 Gray Image Memory 9 Binary Memory 10 XY Auto Stage Driver 11 Auto Focus Driver 14 CRT 16 Imaging Device 17 Stage 18 Plane Moving Mechanism 19 Vertical Moving Mechanism
Claims (6)
の濃淡画像に現れた円形に近い異物の中央部を通るライ
ン上の濃度プロフィールを求め、該濃度プロフィールの
一次微分曲線が0を通過する点の個数を求め、この個数
が3以上のとき、前記異物を水滴と判定することを特徴
とする画像処理による異物検出方法。1. An image of an object is picked up to generate a grayscale image, a density profile on a line passing through a central portion of a foreign substance, which appears in the grayscale image and is close to a circle, is obtained, and the first derivative curve of the density profile is 0. A foreign matter detection method by image processing, characterized in that the number of passing points is determined, and when the number is 3 or more, the foreign matter is determined to be a water drop.
の濃淡画像に現れた異物の面積が所定値よりも大きく、
異物を通る複数本のライン上の濃度プロフィールを求
め、各濃度プロフィールの一次微分曲線が0を通過する
点の個数を求め、この個数の最大値が3以上のときは前
記異物を水滴またはゴミと判定することを特徴とする画
像処理による異物検出方法。2. An object is imaged to generate a grayscale image, and the area of the foreign matter appearing in the grayscale image is larger than a predetermined value,
The concentration profiles on a plurality of lines passing through the foreign matter are determined, and the number of points at which the first derivative curve of each concentration profile passes 0 is determined. When the maximum value of this number is 3 or more, the foreign matter is regarded as a water drop or dust. A foreign matter detection method by image processing characterized by making a determination.
の濃淡画像に現れた異物の面積が所定値よりも大きく、
異物を通る複数本のライン上の濃度プロフィールを求
め、濃度プロフィールの一次微分曲線の異物の端部にお
ける勾配が所定の値以下のとき、前記異物をゴミと判定
することを特徴とする画像処理による異物検出方法。3. An object is imaged to generate a grayscale image, and the area of the foreign matter appearing in the grayscale image is larger than a predetermined value,
By the density processing on a plurality of lines passing through the foreign matter, when the gradient at the end of the foreign matter of the first derivative curve of the density profile is less than a predetermined value, the foreign matter is determined to be dust. Foreign matter detection method.
の濃淡画像に現れた異物の長さと幅の比が第1設定値以
上であり、長さが第2設定値以上で圧延方向と異なる方
向に線状の粒子があり、この粒子の長さ方向に線を伸ば
し、この線の太さをkとした帯状領域をLとし、この帯
状領域L内の粒子をすべてキズと判定することを特徴と
する異物検出方法。4. An object is imaged to generate a grayscale image, and the ratio of the length and width of the foreign matter appearing in the grayscale image is equal to or greater than a first set value, and the length is equal to or greater than a second set value. There is a linear particle in a direction different from that, and a line is extended in the length direction of this particle, and a band-shaped region having the thickness of this line as k is defined as L, and all particles in this band-shaped region L are determined as scratches. A foreign matter detection method characterized by the above.
この濃淡画像に現れた異物の長さと幅の比が第1設定値
以上であり、長さが第2設定値未満の線状粒子があり、
この粒子の長さ方向に線を伸ばし、この線の太さをkと
した帯状領域をLとし、この帯状領域L内の粒子の数が
所定値以上のとき、この帯状領域L内の粒子をキズ判定
とすることを特徴とする画像処理による異物検出方法。5. An object is imaged to generate a grayscale image,
There is a linear particle whose length-width ratio of the foreign matter appearing in this grayscale image is equal to or greater than the first set value and whose length is less than the second set value.
A line is extended in the length direction of the particle, and a band-shaped region having the thickness of the line as k is defined as L. When the number of particles in the band-shaped region L is a predetermined value or more, the particles in the band-shaped region L are A foreign matter detection method by image processing, which is characterized by a flaw determination.
の濃淡画像に現れた粒子について各粒子を中心に矩形h
×vの検査枠を設定し、m個以上の粒子を含む検査枠で
かつ他の検査枠と重なった検査枠を取り出し、この重な
った検査枠群に含まれる全ての粒子を囲む最小の矩形を
設定し、この矩形がほぼ正方形となるとき、この矩形内
の粒子をしみと判定することを特徴とする画像処理によ
る異物検出方法。6. An object is imaged to generate a grayscale image, and particles appearing in the grayscale image are surrounded by a rectangle h with each particle at the center.
The inspection frame of xv is set, and the inspection frame that includes m or more particles and overlaps with other inspection frames is taken out, and the smallest rectangle that encloses all particles included in this overlapped inspection frame group is set. A foreign matter detection method by image processing, which is set, and when the rectangle becomes substantially square, the particles in the rectangle are determined to be spots.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6203128A JP2847667B2 (en) | 1994-08-29 | 1994-08-29 | Foreign matter detection method by image processing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6203128A JP2847667B2 (en) | 1994-08-29 | 1994-08-29 | Foreign matter detection method by image processing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0868765A true JPH0868765A (en) | 1996-03-12 |
| JP2847667B2 JP2847667B2 (en) | 1999-01-20 |
Family
ID=16468877
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6203128A Expired - Fee Related JP2847667B2 (en) | 1994-08-29 | 1994-08-29 | Foreign matter detection method by image processing |
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Cited By (6)
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| JP2009133728A (en) * | 2007-11-30 | 2009-06-18 | Toppan Printing Co Ltd | Remaining water judgment method by pattern inspection machine |
| JP2011033575A (en) * | 2009-08-05 | 2011-02-17 | Mitsubishi Electric Corp | Object position recognizing device of member, object positioning device, system and method for adjoining objects |
| JP2012103217A (en) * | 2010-11-12 | 2012-05-31 | Toyota Motor Corp | Surface defect inspection device |
| WO2015129585A1 (en) * | 2014-02-25 | 2015-09-03 | 株式会社アプライド・ビジョン・システムズ | Image reconstruction device, image reconstruction method, and program |
| US10552706B2 (en) | 2016-10-24 | 2020-02-04 | Fujitsu Ten Limited | Attachable matter detection apparatus and attachable matter detection method |
| JP2022166376A (en) * | 2021-04-21 | 2022-11-02 | 株式会社ジェイテクト | Device and method for determining state of polishing and quality evaluation device |
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1994
- 1994-08-29 JP JP6203128A patent/JP2847667B2/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009133728A (en) * | 2007-11-30 | 2009-06-18 | Toppan Printing Co Ltd | Remaining water judgment method by pattern inspection machine |
| JP2011033575A (en) * | 2009-08-05 | 2011-02-17 | Mitsubishi Electric Corp | Object position recognizing device of member, object positioning device, system and method for adjoining objects |
| JP2012103217A (en) * | 2010-11-12 | 2012-05-31 | Toyota Motor Corp | Surface defect inspection device |
| WO2015129585A1 (en) * | 2014-02-25 | 2015-09-03 | 株式会社アプライド・ビジョン・システムズ | Image reconstruction device, image reconstruction method, and program |
| JPWO2015129585A1 (en) * | 2014-02-25 | 2017-03-30 | 株式会社アプライド・ビジョン・システムズ | Image restoration apparatus, image restoration method, and program |
| US10552706B2 (en) | 2016-10-24 | 2020-02-04 | Fujitsu Ten Limited | Attachable matter detection apparatus and attachable matter detection method |
| JP2022166376A (en) * | 2021-04-21 | 2022-11-02 | 株式会社ジェイテクト | Device and method for determining state of polishing and quality evaluation device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2847667B2 (en) | 1999-01-20 |
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