JPH09113223A - Non-contacting method and instrument for measuring distance and attitude - Google Patents
Non-contacting method and instrument for measuring distance and attitudeInfo
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- JPH09113223A JPH09113223A JP27038095A JP27038095A JPH09113223A JP H09113223 A JPH09113223 A JP H09113223A JP 27038095 A JP27038095 A JP 27038095A JP 27038095 A JP27038095 A JP 27038095A JP H09113223 A JPH09113223 A JP H09113223A
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- 238000000034 method Methods 0.000 title claims description 18
- 238000005259 measurement Methods 0.000 claims description 13
- 238000004364 calculation method Methods 0.000 claims description 12
- 238000009826 distribution Methods 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims 2
- 230000003321 amplification Effects 0.000 abstract 1
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000003199 nucleic acid amplification method Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 description 28
- 230000036544 posture Effects 0.000 description 22
- 238000001514 detection method Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 12
- 238000003384 imaging method Methods 0.000 description 7
- 239000013598 vector Substances 0.000 description 7
- 238000006073 displacement reaction Methods 0.000 description 3
- 239000000523 sample Substances 0.000 description 3
- 239000013256 coordination polymer Substances 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
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Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は非接触距離姿勢測定
方法及び装置に関し、特に、移動体の位置や姿勢の測定
において、距離と姿勢の測定の高速化及びコストダウン
を実現する非接触距離姿勢測定方法及び装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a non-contact distance / posture measuring method and device, and more particularly to a non-contact distance / posture for realizing speeding up of distance and posture measurement and cost reduction in measuring the position and posture of a moving body. The present invention relates to a measuring method and device.
【0002】[0002]
【従来技術】従来、測定対象までの距離を非接触で測定
する距離測定装置として、三角測量の原理を利用した光
学式距離センサが広く知られている。2. Description of the Related Art Conventionally, an optical distance sensor utilizing the principle of triangulation has been widely known as a distance measuring device for measuring a distance to a measuring object in a non-contact manner.
【0003】このような光学式距離センサによって、例
えば、鏡面状の測定対象物までの距離を測定する場合、
測定の過程で測定対象物の面の姿勢が傾くと、受光側の
変位が距離と傾きに区別できないので、距離の測定が不
可能になるという不都合がある。For example, in the case of measuring the distance to a mirror-like object to be measured with such an optical distance sensor,
If the posture of the surface of the measuring object is tilted in the process of measurement, the displacement on the light receiving side cannot be distinguished into the distance and the tilt, which makes it impossible to measure the distance.
【0004】かかる不都合を解決するものとして、傾
き、即ち、姿勢に影響されないレーザーフォーカス変位
計を用いた距離測定方法が提案されている。この距離測
定方法によると、測定対象物の面の姿勢が変化しても測
定対象物までの距離を測定することができる。しかし、
測定対象物までの距離と姿勢を同時に測定しようとする
と、少なくとも3個のレーザーフォーカス変位計を用い
なければならないという問題がある。As a solution to this inconvenience, there has been proposed a distance measuring method using a laser focus displacement meter which is not affected by the inclination, that is, the posture. According to this distance measuring method, the distance to the measurement object can be measured even if the orientation of the surface of the measurement object changes. But,
There is a problem in that at least three laser focus displacement gauges must be used in order to simultaneously measure the distance and posture to the object to be measured.
【0005】測定対象物までの距離、あるいは位置と姿
勢を非接触で測定する非接触位置姿勢あるいは距離姿勢
測定装置が、例えば、特開平1−203907号公報、
及び特開平4−148814号公報に開示されている。A non-contact position / orientation or distance / orientation measuring device for measuring the distance to the object to be measured, or the position and orientation in a non-contact manner, is disclosed in, for example, Japanese Unexamined Patent Publication No. Hei 1-203907.
And JP-A-4-148814.
【0006】特開平1−203907号公報に示される
非接触位置姿勢測定装置では、測定対象物に対してスリ
ット面の異なった斜めのスリット光を交互に投射してテ
レビカメラで撮像し、撮像された画像に基づいて測定対
象物の3次元での位置と姿勢を求めている。また、特開
平4−148814号公報に示される非接触距離姿勢測
定装置では、少なくとも2個以上のマークパターン光を
投影するパターン投影装置とテレビカメラとを格納した
プローブを有し、プローブ内に設けられるミラーを介し
て被検査物の表面にマークパターン光を投影してテレビ
カメラで撮像し、撮像された画像に基づいて被検査物ま
での距離と姿勢を求めている。In the non-contact position / orientation measuring device disclosed in Japanese Unexamined Patent Publication No. 1-203907, oblique slit lights having different slit surfaces are alternately projected onto a measuring object, imaged by a television camera, and imaged. The three-dimensional position and orientation of the measuring object is obtained based on the image. Further, in the non-contact distance / attitude measuring device disclosed in Japanese Patent Laid-Open No. 4-148814, there is provided a probe in which a pattern projection device for projecting at least two or more mark pattern lights and a television camera are housed, and the probe is provided in the probe. The mark pattern light is projected on the surface of the object to be inspected through the mirror, and the image is picked up by the television camera, and the distance and posture to the object to be inspected are obtained based on the picked-up image.
【0007】[0007]
【発明が解決しようとする課題】しかし、特開平1−2
03907号公報及び特開平4−148814号公報の
非接触位置姿勢あるいは距離姿勢測定装置によると、テ
レビカメラ等の撮像手段にはCCDの2次元センサが用
いられており、1画面のデータ取り込み速度は1/30
秒または1/60秒である。よって、30又は60Hz以
上の高速な測定サイクルで測定が行えない。また、セン
サから取り込むデータは画像情報であるため、処理すべ
き情報量が多く、高速化のためには専用の処理回路が必
要となってコストアップになるという問題がある。従っ
て、本発明の目的はデータの取り込み速度及び処理速度
が速く、簡素な非接触距離姿勢測定方法及び装置を提供
することにある。However, Japanese Patent Laid-Open No. 1-2
According to the non-contact position / orientation or distance / orientation measuring device of JP-A-03907 and JP-A-4-148814, a two-dimensional CCD sensor is used as an image pickup means such as a television camera, and the data acquisition speed of one screen is 1/30
Seconds or 1/60 seconds. Therefore, measurement cannot be performed in a high-speed measurement cycle of 30 or 60 Hz or higher. Further, since the data taken in from the sensor is image information, there is a large amount of information to be processed, and there is a problem that a dedicated processing circuit is required for speeding up and cost increases. Therefore, an object of the present invention is to provide a simple non-contact distance / attitude measuring method and device which has a high data acquisition speed and a high processing speed.
【0008】本発明の他の目的はコストダウンを図るこ
とができる非接触距離姿勢測定方法及び装置を提供する
ことにある。Another object of the present invention is to provide a non-contact distance / posture measuring method and apparatus which can reduce the cost.
【0009】[0009]
【課題を解決するための手段】本発明は上記の目的を達
成するため、第1の特徴として、1つの交点を提供する
平行でない2つの線分を含むマーク光を前記対象表面に
ある第1の平面に投影し、第2の平面に少なくとも2つ
の1次元センサを配置し、前記対象表面で反射された前
記マーク光像に含まれる前記2つの線分の線分像を前記
平面に形成して前記少なくとも2つの1次元センサに長
さ方向の受光強度分布を表わす受光信号を発生させ、前
記受光信号に基づいて前記2つの線分像の前記少なくと
も2つの1次元センサ上の位置を演算し、前記少なくと
も2つの1次元センサ上の位置に基づいて前記第1の平
面の方程式を算出し、前記第1の平面の方程式に基づい
て前記対象表面までの距離及び姿勢を演算する非接触距
離姿勢測定方法を提供する。In order to achieve the above-mentioned object, the present invention has, as a first feature, a mark light including two non-parallel line segments providing one intersection, which is present on the target surface. , And at least two one-dimensional sensors are arranged on a second plane to form line segment images of the two line segments included in the mark light image reflected on the target surface on the plane. Generate at least two one-dimensional sensors a light-reception signal representing a light-reception intensity distribution in the longitudinal direction, and calculate the positions of the two line segment images on the at least two one-dimensional sensors based on the light-reception signals. A non-contact distance posture that calculates the equation of the first plane based on the positions on the at least two one-dimensional sensors, and calculates the distance and posture to the target surface based on the equation of the first plane Measuring method Subjected to.
【0010】上記の非接触距離姿勢測定方法において、
線分像の投影は、前記マーク光の前記1つの交点を前記
少なくとも2つの1次元センサに挟まれる領域の内側に
形成するようにしても良い。In the above non-contact distance attitude measuring method,
The line segment image may be projected by forming the one intersection of the mark light inside the region sandwiched by the at least two one-dimensional sensors.
【0011】また、本発明は上記した目的を達成するた
め、第2の特徴として、1つの交点を提供する平行でな
い2つの線分を含むマーク光を前記対象表面にある第1
の平面に投影するマーク光投影手段と、第2の平面に前
記マーク光像に含まれる前記2つの線分の線分像を形成
する像形成手段と、前記平面に配置され、前記2つの線
分像に基づいて長さ方向の受光強度分布を表わす受光信
号を出力する少なくとも2つの1次元センサと、前記受
光信号に基づいて前記2つの線分像の前記少なくとも2
つの1次元センサ上の位置を演算する第1の演算手段
と、前記第1の演算手段の演算結果に基づいて前記第1
の平面の方程式を求め、前記第1の平面の前記方程式に
基づいて前記対象表面までの距離及び姿勢を演算する第
2の演算手段を有する非接触距離姿勢測定装置を提供す
る。In order to achieve the above-mentioned object, the present invention has a second feature that a mark light including two non-parallel line segments providing one intersection is present on the target surface.
Mark light projecting means for projecting onto the plane, image forming means for forming the line segment images of the two line segments included in the mark light image on the second plane, and the two lines arranged on the plane. At least two one-dimensional sensors that output a light receiving signal that represents a light receiving intensity distribution in the length direction based on the image division, and the at least two of the two line segment images based on the light receiving signal.
A first calculation means for calculating a position on one one-dimensional sensor, and the first calculation means based on a calculation result of the first calculation means.
There is provided a non-contact distance / orientation measuring device having a second calculation means for calculating the equation of the plane and the distance and orientation to the target surface based on the equation of the first plane.
【0012】上記の非接触距離姿勢測定装置において、
マーク光投影手段は、前記線分像の前記1つの交点を前
記少なくとも2つの1次元センサに挟まれる領域の内側
に形成する構成とすることが望ましい。In the above non-contact distance / attitude measuring device,
It is preferable that the mark light projection means forms the one intersection of the line segment image inside the region sandwiched by the at least two one-dimensional sensors.
【0013】[0013]
【発明の実施の形態】以下、本発明の非接触距離姿勢測
定方法及び装置を図面を参照しつつ説明する。BEST MODE FOR CARRYING OUT THE INVENTION A noncontact distance attitude measuring method and apparatus according to the present invention will be described below with reference to the drawings.
【0014】図1は、本発明の第1の形態例における非
接触距離姿勢測定装置を示し、対象表面2を有する測定
対象物1と、対象表面2に交差するスリット光23a,
23bを照射する光源3と、対象表面2で反射されたス
リット光23a,23bによって形成されるマーク光3
aの反射光像を結像面7に結像させる結像レンズ4と、
結像面7に設けられる1次元光センサ6a,6bと、光
源3,結像レンズ4及び1次元光センサ6a,6bを有
する結像面7を収容したセンサヘッド8と、同期信号発
生回路10から出力されるタイミング信号に基づいて1
次元光センサ6a,6bを駆動する駆動回路11a,1
1bと、1次元光センサ6a,6bから出力される光強
度信号を増幅するアンプ12a,12bと、増幅された
光強度信号をデジタル信号に変換するA/D変換器13
a,13bと、デジタル信号に変換された光強度信号を
記憶するためのメモリ14と、メモリ14への光強度信
号の書き込み、及びメモリ14からの光強度信号の読み
出しを制御するメモリ制御回路15と、メモリ14から
光強度信号を入力して所定の演算を行うプロセッサ16
と、プロセッサ16における対象表面2までの距離と対
象表面2の姿勢の演算結果を表示する表示部17とを有
する。FIG. 1 shows a non-contact distance / attitude measuring apparatus according to a first embodiment of the present invention, which comprises a measuring object 1 having an object surface 2 and slit light 23a intersecting the object surface 2.
23b and the mark light 3 formed by the slit lights 23a and 23b reflected by the target surface 2.
an image forming lens 4 for forming the reflected light image of a on the image forming surface 7;
A one-dimensional optical sensor 6a, 6b provided on the imaging surface 7, a sensor head 8 containing the light source 3, the imaging lens 4, and the imaging surface 7 having the one-dimensional optical sensor 6a, 6b, and a synchronization signal generation circuit 10. 1 based on the timing signal output from
Driving circuits 11a, 1 for driving the three-dimensional photosensors 6a, 6b
1b, amplifiers 12a and 12b for amplifying the light intensity signals output from the one-dimensional photosensors 6a and 6b, and an A / D converter 13 for converting the amplified light intensity signals into digital signals.
a, 13b, a memory 14 for storing the light intensity signal converted into a digital signal, and a memory control circuit 15 for controlling writing of the light intensity signal to the memory 14 and reading of the light intensity signal from the memory 14. And a processor 16 that inputs a light intensity signal from the memory 14 and performs a predetermined calculation.
And a display unit 17 for displaying the calculation result of the distance to the target surface 2 and the posture of the target surface 2 in the processor 16.
【0015】マーク光3aは、所定の幅を有するスリッ
ト光23a,23bを照射するスリット光源を2つ用い
て照射される光束が交差するようにスリット光源を配置
することにより形成される。スリット光23a,23b
は、例えば、レーザ光源から照射されるレーザビームを
シリンドリカルレンズ等の光学系に透過させて一方向に
のみ集束させることにより形成しても良い。The mark light 3a is formed by arranging the slit light sources so that the light fluxes emitted from the two slit light sources radiating the slit lights 23a and 23b having a predetermined width intersect. Slit light 23a, 23b
May be formed, for example, by transmitting a laser beam emitted from a laser light source through an optical system such as a cylindrical lens and focusing it in only one direction.
【0016】図1の構成において、測定対象物1の対象
表面2には光源3からスリット光23a,23bが照射
されることによって、直線L1 ,L2 を有するマーク光
3aが投影される。このマーク光3aは、対象表面2で
反射され、結像レンズ4によって集光されて1次元光セ
ンサ6a,6bが設けられる結像面7にマーク光像3
a’(図2)として結像する。1次元光センサ6a,6
bは1次元CCDや受光素子アレイ等であり、結像面7
に結像されるマーク光像3a’が交差する位置の画素に
おける光強度を検出してアンプ12a,12bに出力す
る。アンプ12a,12bで増幅された光強度信号はA
/D変換器13a,13bにおいてデジタル信号に変換
されてメモリ14に転送される。メモリ14はプロセッ
サ16から出力される制御信号によってメモリ制御回路
15から出力される書き込み信号に基づいて光強度信号
の書き込みを行い、更に、メモリ制御回路15から出力
される読み出し信号に基づいて光強度信号をプロセッサ
16に出力する。プロセッサ16はメモリ14から入力
される光強度信号に基づいて測定対象物1の対象表面2
までの距離と対象表面2の姿勢を演算し、その演算結果
を表示部17に出力させる。In the configuration of FIG. 1, the target surface 2 of the measuring object 1 is irradiated with the slit lights 23a and 23b from the light source 3, so that the mark light 3a having the straight lines L 1 and L 2 is projected. The mark light 3a is reflected by the target surface 2 and is condensed by the image forming lens 4 to form the mark light image 3 on the image forming surface 7 on which the one-dimensional photosensors 6a and 6b are provided.
The image is formed as a '(FIG. 2). One-dimensional optical sensor 6a, 6
Reference numeral b denotes a one-dimensional CCD, a light receiving element array, etc.
The light intensity in the pixel at the position where the mark light image 3a ′ formed in the position intersects is detected and output to the amplifiers 12a and 12b. The light intensity signal amplified by the amplifiers 12a and 12b is A
The signals are converted into digital signals in the / D converters 13a and 13b and transferred to the memory 14. The memory 14 writes the light intensity signal based on the write signal output from the memory control circuit 15 according to the control signal output from the processor 16, and further writes the light intensity signal based on the read signal output from the memory control circuit 15. The signal is output to the processor 16. The processor 16 determines the target surface 2 of the measurement target 1 based on the light intensity signal input from the memory 14.
And the posture of the target surface 2 are calculated, and the calculation result is output to the display unit 17.
【0017】図2は、結像面7に結像されたマーク光像
3a’を示し、対象表面(図示せず)で反射されたマー
ク光3aは、結像面7に結像されることによって交点
P’及び直線L1R,L2Rを有するマーク光像3a’を形
成する。このマーク光像3a’と1次元光センサ6a,
6bとが交わる点A11とA21から直線L1Rが復元され、
マーク光像3a’と1次元光センサ6a,6bとが交わ
る点A12,A22から直線L2Rが復元される。FIG. 2 shows the mark light image 3a 'imaged on the image plane 7, and the mark light 3a reflected on the target surface (not shown) is imaged on the image plane 7. Thereby forming a mark light image 3a 'having an intersection P'and straight lines L1R and L2R . The mark light image 3a 'and the one-dimensional light sensor 6a,
The straight line L 1R is restored from the points A 11 and A 21 where 6b intersects,
The straight line L 2R is restored from the points A 12 and A 22 where the mark light image 3a ′ and the one-dimensional photosensors 6a and 6b intersect.
【0018】図3は、測定対象物1の対象表面2におけ
る物体座標系と結像面7における2次元座標系の対応関
係を示し、図3においては仮想的に結像面7を主点OR
を有する結像レンズ(図示せず)の前に配置した光学系
構成としており、以下の記載においては説明を容易にす
るために図3の光学系構成を用いて説明する。FIG. 3 shows the correspondence between the object coordinate system on the target surface 2 of the measuring object 1 and the two-dimensional coordinate system on the image plane 7, and in FIG. R
The optical system configuration is arranged in front of an imaging lens (not shown) having the above. The optical system configuration of FIG. 3 is used in the following description to facilitate the description.
【0019】物体座標を(x,y,z)、1次元光セン
サ6a,6bが設けられる結像面7での2次元座標を
(hR ,vR )として、1次元光センサ6a,6bを有
する撮像ユニットのカメラパラメータをCとすると、式
(1)によってAssuming that the object coordinates are (x, y, z) and the two-dimensional coordinates on the image plane 7 on which the one-dimensional photosensors 6a, 6b are provided are (h R , v R ), the one-dimensional photosensors 6a, 6b. Let C be the camera parameter of the imaging unit having
【数1】 と表される。(Equation 1) It is expressed as
【0020】また、物体座標と結像面7における2次元
座標は、媒介変数fを用いて 〔fhR fvR f〕t =C〔x,y,z,1〕t −−−(2) と表わすことができる。ここで、〔〕t は転置行列を表
わす。The object coordinates and the two-dimensional coordinates on the image plane 7 are [fh R fv R f] t = C [x, y, z, 1] t --- (2) using the parameter f. Can be expressed as Here, [] t represents a transposed matrix.
【0021】図3において、平面F1L及びF2Lはスリッ
ト光23a,23bの光束であり、平面F1L及びF2Lの
交線はL3 で表される。この平面F1L,F2L及び交線L
3 は一度設定すれば不変であるので、距離及び姿勢の測
定の前に測定しておく。In FIG. 3, planes F 1L and F 2L are luminous fluxes of the slit lights 23a and 23b, and an intersection line of the planes F 1L and F 2L is represented by L 3 . This plane F 1L , F 2L and the intersection line L
Since 3 does not change once set, measure it before measuring the distance and posture.
【0022】図4は、結像面7aにおけるマーク光像3
a’の直線L1R,L2Rの位置と1次元光センサ6a,6
bの信号出力との関係を示し、マーク光像3a’の直線
L1R,L2Rは一定の幅を持つ線であり、1次元光センサ
6a,6bと交差する部位ではセンサ値は高くなる。よ
って、マーク光像3a’の直線L1R,L2Rの位置q
ij(i=1,2、j=1,2)は、図5に示すように、
その近傍で適当な閾値I以上の範囲の画素データを用い
て、例えば、斜線で示す部分の重心位置として求める。
そのときの重心位置qijは、例えば、式(3)で演算す
る。FIG. 4 shows the mark light image 3 on the image plane 7a.
Positions of straight lines L 1R and L 2R of a ′ and one-dimensional optical sensors 6a and 6a
The straight line L 1R , L 2R of the mark light image 3a ′ shows a relationship with the signal output of b, and the sensor value becomes high at the portion intersecting the one-dimensional photosensors 6a, 6b. Therefore, the positions q of the straight lines L 1R and L 2R of the mark light image 3a ′
ij (i = 1, 2, j = 1, 2), as shown in FIG.
By using the pixel data in the vicinity of an appropriate threshold value I or more, for example, the position of the center of gravity of the shaded portion is obtained.
The barycentric position q ij at that time is calculated by, for example, Expression (3).
【数2】 ここで、D(q)は画素qにおける出力値である。(Equation 2) Here, D (q) is an output value in the pixel q.
【0023】また、i番目の1次元光センサが結像面7
aでの2次元座標で 〔hR ,vR 〕t =q〔ai ,bi 〕t +〔ci ,di 〕t (i=1,2) −−−(4) (ここで、〔ai ,bi 〕t は大きさが画素ピッチの方
向ベクトル、〔ci ,d i 〕t は1次元光センサの端の
画素の中心座標、qは画素番号である。)と表されると
き、1次元光センサ6a,6b上のマーク光像3a’の
位置は、式(4)により結像面7での2次元座標
(hR ,vR )に変換される。よって、A 11〜A22はq
11〜q22を式(4)に代入することにより得られる。そ
して、Aijを(hij,vij)とするとき、直線L1R,L
2Rの結像面7における直線の方程式は L1R:(h21−h11)(vR −v11)=(v21−v11)(hR −h11) −−−(5) L2R:(h22−h12)(vR −v12)=(v22−v12)(hR −h12) −−−(6) となる。In addition, the i-th one-dimensional photosensor is the image plane 7
Two-dimensional coordinates in a [hR, VR]t= Q [ai, Bi]t+ [Ci, Di]t (I = 1, 2) --- (4) (where [ai, Bi]tIs the pixel pitch
Vector, [ci, D i]tIs at the end of the one-dimensional optical sensor
The center coordinates of the pixel, q is the pixel number. )
Of the mark light image 3a 'on the one-dimensional photosensors 6a and 6b.
The position is a two-dimensional coordinate on the image plane 7 according to the equation (4).
(HR, VR) Is converted to. Therefore, A 11~ Atwenty twoIs q
11~ Qtwenty twoIs obtained by substituting in the equation (4). So
And then Aij(Hij, Vij), The straight line L1R, L
2RThe equation of the straight line on the image plane 7 is1R: (Htwenty one-H11) (VR-V11) = (Vtwenty one-V11) (HR-H11) --- (5) L2R: (Htwenty two-H12) (VR-V12) = (Vtwenty two-V12) (HR-H12) --- (6).
【0024】次に、上記の過程で求めたマーク光像3
a’の直線L1R,L2Rに基づいて対象表面2の平面とし
ての方程式を求める。求め方にはいくつかの方法がある
が、例えば、レンズ主点OR を通り直線L1RとL1 を含
む平面F1Rと、レンズ主点ORを通り直線L2RとL2 を
含む平面F2Rの平面の方程式を求め、平面F1Lと平面F
1Rより、その交線であるL1 、平面F2Lと平面F2Rよ
り、その交線であるL2 の直線の方程式を求め、この2
直線L1 ,L2 を含む平面として演算する。しかし、こ
の方法によると、撮像時の撮像素子による読み取り誤差
やモデル誤差等により、演算される直線L1 ,L2 は、
ねじれの関係になることがあり、対象表面の平面の方程
式が求まらない場合がある。Next, the mark light image 3 obtained in the above process
straight line L of a '1R, L2RBased on the plane of the target surface 2
For all equations. There are several ways to ask
However, for example, the lens principal point ORStraight line L1RAnd L1Including
Mu plane F1RAnd the lens principal point ORStraight line L2RAnd LTwoTo
Plane F including2R, The plane equation of1LAnd plane F
1RIs the intersection line L1, Plane F2LAnd plane F2RYo
, The intersection line LTwoFind the equation of the straight line of
Straight line L1, LTwoIs calculated as a plane including. But this
Method, the reading error by the image sensor during image pickup
Line L that is calculated based on model error and model error1, LTwoIs
There may be a twist relationship, so the plane of the target surface
The formula may not be found.
【0025】このことより、本形態例では、対象表面2
に投影されたマーク光3aの直線L 1 ,L2 の交点Pの
座標(x1 ,y1 ,z1 )と、平面の法線ベクトルq
(aP,bP ,cP )を別に求めて、以下の平面の方程
式 aP (x−x1 )+bP (y−y1 )+cP (z−z1 )=0−−−(7) を求める。Therefore, in the present embodiment, the target surface 2
Straight line L of the mark light 3a projected on 1, LTwoAt the intersection P of
Coordinates (x1, Y1, Z1) And the plane normal vector q
(AP, BP, CP) Separately, the following plane
Formula aP(Xx1) + BP(Y-y1) + CP(Z-z1) = 0 --- (7) is calculated.
【0026】まず、交点Pの座標の求め方について説明
する。交点Pの座標を演算する方法は幾つかあるが、例
えば、平面F1LとF2Lの交線L3 と平面F1Lとの交点を
P1(図示せず)、交線L3 と平面F2Lとの交点をP2
(図示せず)とし、交点P1,P2 の中点をPとして演
算する。First, how to obtain the coordinates of the intersection P will be described. There are several methods of calculating the coordinates of the intersection point P. For example, the intersection point of the intersection line L 3 of the planes F 1L and F 2L and the plane F 1L is P 1 (not shown), and the intersection line L 3 and the plane F are the same. The intersection with 2L is P 2
(Not shown), and the midpoint of the intersection points P 1 and P 2 is calculated as P.
【0027】次に、平面F1Rの方程式を求める。式
(2)よりfを消去して hR =(C11x+C12y+C13z+C14) /(C31x+C32y+C33z+C34)−−−(8) vR =(C21x+C22y+C23z+C24) /(C31x+C32y+C33z+C34)−−−(9) となり、これを直線L1Rの式(5)に代入すると、平面
F1Rは F1R: a1Rx+b1Ry+c1Rz+d1R=0 −−−(10) a1R=n1 (C21−v11C31)−m1 (C11−h11C31) b1R=n1 (C22−v11C31)−m1 (C12−h11C31) c1R=n1 (C23−v11C31)−m1 (C13−h11C31) d1R=n1 (C24−v11C31)−m1 (C14−h11C31) n1 =h21−h11 m1 =v21−v11 となる。この式(10)と交線L3 の方程式によって交
点P1 (図示せず)を演算する。また、式(8)(9)
に式(6)を代入することによって平面F2Rの方程式が
得られ、この平面F2Rの方程式と交線L3 の交点P
2 (図示せず)を演算し、交点P1 と交点P2 との中点
Pを演算する。Next, the equation of the plane F 1R is obtained. By eliminating f from the formula (2), h R = (C 11 x + C 12 y + C 13 z + C 14 ) / (C 31 x + C 32 y + C 33 z + C 34 ) −−− (8) v R = (C 21 x + C 22 y + C 23). z + C 24 ) / (C 31 x + C 32 y + C 33 z + C 34 ) −−− (9), which is substituted into the equation (5) of the straight line L 1R , the plane F 1R is F 1R : a 1R x + b 1R y + c 1R z + d 1R = 0 --- (10) a 1R = n 1 (C 21 -v 11 C 31) -m 1 (C 11 -h 11 C 31) b 1R = n 1 (C 22 -v 11 C 31) - m 1 (C 12 -h 11 C 31) c 1R = n 1 (C 23 -v 11 C 31) -m 1 (C 13 -h 11 C 31) d 1R = n 1 (C 24 -v 11 C 31 ) becomes -m 1 (C 14 -h 11 C 31) n 1 = h 21 -h 11 m 1 = v 21 -v 11. The intersection point P 1 (not shown) is calculated by the equation (10) and the equation of the intersection line L 3 . Also, equations (8) and (9)
The equation of the plane F 2R is obtained by substituting the equation (6) into the equation, and the intersection P of the equation of the plane F 2R and the intersection line L 3 is obtained.
2 (not shown) is calculated, and the midpoint P between the intersection points P 1 and P 2 is calculated.
【0028】次に、法線ベクトルqの求め方について説
明する。法線ベクトルqは、平面F1L,F2L,F1R,F
2Rの法線ベクトルをf1L,f2L,f1R,f2Rとすると q =(f1L×f1R)×(f2L×f2R) −−−(11) となる。Next, how to obtain the normal vector q will be described. The normal vector q is the plane F 1L , F 2L , F 1R , F
If the normal vectors of 2R are f 1L , f 2L , f 1R , and f 2R , then q = (f 1L × f 1R ) × (f 2L × f 2R )-(11).
【0029】以上のようにして求めた交点Pと、法線ベ
クトルqに基づいて物体座標系の原点OM からz軸と平
行な方向に対象表面2の平面までの距離gは、式(7)
にx=0,y=0を代入して得られるzの値であり、 g =(aP x1+bP y1+cP z1)/cP −−−(12) として求められる。The distance g from the origin O M of the object coordinate system to the plane of the target surface 2 in the direction parallel to the z-axis on the basis of the intersection point P obtained as described above and the normal vector q is given by the equation (7) )
To a value of z which is obtained by substituting x = 0, y = 0, g = is determined as (a P x1 + b P y1 + c P z1) / c P --- (12).
【0030】図6は、対象表面2の平面の各座標軸回り
の姿勢を示し、対象表面2の姿勢をθx,θyで示すと
き、法線ベクトルqがz軸の平行なときを基準の姿勢と
すると θx =−tan-1(bP /cP ) −−−(13) θy = tan-1(aP /cP ) −−−(14)FIG. 6 shows the postures of the plane of the target surface 2 around each coordinate axis. When the postures of the target surface 2 are represented by θx and θy, when the normal vector q is parallel to the z axis, the reference posture is taken. Then, θx = −tan −1 (b P / c P ) −−− (13) θy = tan −1 (a P / c P ) −−− (14)
【0031】図7は、プロセッサ16における演算処理
過程を示すフローチャートであり、ステップS1 ,
S2 ,S3 ,S4 ,S5 ,S6 ,S7 で対象表面2の距
離を求めることができ、ステップS1 ,S2 ,S3 ,S
4 ,S6 ,S8 で対象表面2の姿勢を求めることができ
る。FIG. 7 is a flow chart showing the arithmetic processing steps in the processor 16, in which steps S 1 ,
S 2, S 3, S 4 , S 5, S 6, S 7 in can determine the distance of the object surface 2, Step S 1, S 2, S 3 , S
The posture of the target surface 2 can be obtained by 4 , S 6 , and S 8 .
【0032】図8は、他のパターンのマーク光19を形
成する光源3を示す。光源3は、対象表面2において互
いに平行でない2直線L1 ,L2 を投影できれば良いこ
とから、ランプ8から出射される光をマークパターン2
0がくり抜かれた板21に照射させてマークパターン光
19を発生させ、測定対象物1の対象表面2に投影する
構成であっても良い。FIG. 8 shows a light source 3 which forms the mark light 19 of another pattern. The light source 3 has only to project two straight lines L 1 and L 2 which are not parallel to each other on the target surface 2, and therefore the light emitted from the lamp 8 is emitted from the mark pattern 2.
It is also possible to irradiate a plate 21 in which 0 is cut out to generate mark pattern light 19 and project the mark pattern light 19 on the target surface 2 of the measurement target 1.
【0033】図9は、対象表面2に投影されたマークパ
ターン光19の輪郭線をマーク光像3a’として利用す
るものであり、1次元光センサ6a,6bの信号出力レ
ベルに所定の閾値Iを設けることによってマーク光像3
a’の直線位置q11〜q22を検出する。図4と共通する
部分については共通する引用数字及び引用符号を附して
いるので、重複する説明は省略する。FIG. 9 uses the contour line of the mark pattern light 19 projected on the target surface 2 as the mark light image 3a ', and a predetermined threshold I for the signal output level of the one-dimensional photosensors 6a, 6b. By providing the mark light image 3
detecting the linear position q 11 to q 22 of a '. The same parts as those in FIG. 4 are designated by the same reference numerals and reference numerals, and the duplicated description will be omitted.
【0034】図10は、結像面7における1次元光セン
サ6a,6bの配置の変形例を示し、(a)のように1
次元光センサ6a,6bを非平行に配置したり、(b)
のように直交して配置する構成としても良い。FIG. 10 shows a modified example of the arrangement of the one-dimensional photosensors 6a and 6b on the image plane 7, and as shown in FIG.
The two-dimensional optical sensors 6a and 6b are arranged non-parallel to each other, or (b)
The configuration may be such that they are arranged orthogonally.
【0035】図11は、1次元光センサ6a,6bの配
置の他の変形例を示す。(a)では、直線L1Rが1次元
光センサ6a,6bに結像し、直線L2Rが1次元光セン
サ6b,6cに結像している。(b)では、直線L1Rが
1次元光センサ6a,6bに結像し、直線L2Rが1次元
光センサ6c,6dに結像している。(c)では、直線
L1Rが1次元光センサ6a,6bに結像し、直線L2Rが
1次元光センサ6b,6cに結像している。(d)で
は、交点P’が1次元光センサ6a,6bによって形成
される領域内に位置している。一方、(b)では交点
P’が1次元光センサ6a,6bによって形成される領
域外に位置している。FIG. 11 shows another modification of the arrangement of the one-dimensional photosensors 6a and 6b. In (a), the straight line L 1R is imaged on the one-dimensional optical sensors 6a and 6b, and the straight line L 2R is imaged on the one-dimensional optical sensors 6b and 6c. In (b), the straight line L 1R is imaged on the one-dimensional photosensors 6a and 6b, and the straight line L 2R is imaged on the one-dimensional photosensors 6c and 6d. In (c), the straight line L 1R is imaged on the one-dimensional optical sensors 6a and 6b, and the straight line L 2R is imaged on the one-dimensional optical sensors 6b and 6c. In (d), the intersection P'is located in the area formed by the one-dimensional photosensors 6a and 6b. On the other hand, in (b), the intersection P'is located outside the area formed by the one-dimensional photosensors 6a and 6b.
【0036】次に、マーク光像3a’の直線L1R,L2R
の交点P’の検出精度を検討する。例えば、図12に示
すように、1次元光センサ6a,6bがvR =1及びv
R =−1、直線L1R,L2Rの交点が(0,w)、直線L
1Rが1次元光センサ6aとなす角度が45度、直線
L1R,L2Rのなす角度が90度とし、このときの交点
P’の座標(hR ,vR )の検出精度を検討する。Next, the straight lines L 1R and L 2R of the mark light image 3a '
The detection accuracy of the intersection P'of For example, as shown in FIG. 12, the one-dimensional optical sensors 6a and 6b have v R = 1 and v
R = -1, the intersection of the straight lines L1R and L2R is (0, w), and the straight line L
Angle of 45 degrees 1R makes with one-dimensional optical sensor 6a, the straight line L 1R, angle between L 2R is set to 90 degrees, considering the detection accuracy of the coordinates (h R, v R) of the intersection point P 'at this time.
【0037】1次元光センサ6a,6bにおける直線L
1R,L2Rの検出誤差が、平均零、標準偏差σS の正規分
布にそれぞれ従うとき、交点P’の座標(hR ,vR )
の検出誤差をシミュレートすると、それらの標準偏差σ
h 、σv はStraight line L in the one-dimensional photosensors 6a and 6b
When the detection errors of 1R and L 2R follow the normal distributions of mean zero and standard deviation σ S , respectively, the coordinates (h R , v R ) of the intersection point P ′
Simulating the detection error of, their standard deviation σ
h and σ v are
【数3】 と近似される。(Equation 3) Is approximated.
【0038】図13にこのグラフを示す。w=0のと
き、つまり交点P’が1次元光センサ6a,6bの中心
にあるほど検出精度が高いことが示されている。直線L
1Rの傾きや直線L1R,L2Rのなす角の値が異なる場合で
も、σh 、σv の絶対値は異なるが、交点P’が1次元
光センサ6a,6bの中心にあるほど検出精度が高いと
いう特徴は同様である。また、1次元光センサ6a,6
bが平行になっていない場合でも、同じように直線
L1R,L2Rの交点P’が比較的内側にあるほど検出精度
が高い。このことも、シミュレーションにより確認され
た。FIG. 13 shows this graph. It is shown that when w = 0, that is, the intersection P ′ is located at the center of the one-dimensional optical sensors 6a and 6b, the detection accuracy is higher. Straight line L
Even if the inclination of 1R and the values of the angles formed by the straight lines L 1R and L 2R are different, the absolute values of σ h and σ v are different, but the detection accuracy increases as the intersection point P ′ is located at the center of the one-dimensional optical sensors 6a and 6b. The characteristics of high are similar. In addition, the one-dimensional optical sensors 6a, 6
Even when b is not parallel, the detection accuracy is higher as the intersection P ′ of the straight lines L 1R and L 2R is relatively inside. This was also confirmed by simulation.
【0039】次に、図14に示すように、1次元光セン
サ6a,6b,6cがvR =1、h R =−1及びhR =
1、直線L1R,L2Rの交点が(0,w)、直線L1Rが1
次元光センサ6aとなす角度が45度、直線L1RとL2R
のなす角度が90度のときの交点P’の座標(hR ,v
R )の検出精度を検討する。Next, as shown in FIG. 14, the one-dimensional optical sensor is
6a, 6b, 6c are vR= 1, h R= -1 and hR=
1, straight line L1R, L2RThe intersection is (0, w), and the straight line L1RIs 1
The angle formed with the three-dimensional optical sensor 6a is 45 degrees, and the straight line L1RAnd L2R
When the angle formed by is 90 degrees, the coordinates (hR, V
R) Is considered.
【0040】1次元光センサ6a,6b,6cにおける
直線L1R,L2Rの位置の検出誤差が、平均零、標準偏差
σS の正規分布にそれぞれ従うとき、交点P’の座標
(hR,vR )の検出誤差をシミュレートする。When the detection errors of the positions of the straight lines L 1R and L 2R in the one-dimensional photosensors 6a, 6b and 6c follow the normal distributions of mean zero and standard deviation σ S , respectively, the coordinates (h R , Simulate the detection error of v R ).
【0041】図15は、それらの標準偏差σh 、σv を
示す。この場合も直線L1R,L2Rの交点P’が内側にあ
るほど検出精度が高い。FIG. 15 shows those standard deviations σ h and σ v . Also in this case, the detection accuracy is higher as the intersection P ′ of the straight lines L 1R and L 2R is closer to the inside.
【0042】以上のように、マーク光像の直線の交点位
置の検出精度を少しでも高めるためには、図11
(c),(d)に示すように、マーク光像の直線の交点
が1次元光センサの内側になるように、マーク光像及び
1次元光センサを設定する必要がある。図3にみるよう
に、マーク光の交点Pの位置は、レンズ主点ORからマ
ーク光像の交点P’へ伸ばした直線の延長線上にあるの
で、マーク光の交点Pの測定精度を上げるには、マーク
光像の交点P’を1次元光センサ6a,6bの内側にし
てマーク光像の交点P’の検出精度を上げることが必要
である。As described above, in order to improve the detection accuracy of the position of the intersection of the straight lines of the mark light image as much as possible, FIG.
As shown in (c) and (d), it is necessary to set the mark light image and the one-dimensional light sensor so that the intersection of the straight lines of the mark light image is inside the one-dimensional light sensor. As seen in FIG. 3, the position of the intersection point P of the mark light, because the lens principal point O R on an extension of a straight line extended to the intersection P 'of the mark light image, improve the measurement accuracy of the intersection P of the mark light Therefore, it is necessary to make the intersection point P ′ of the mark light image inside the one-dimensional optical sensors 6a and 6b to improve the detection accuracy of the intersection point P ′ of the mark light image.
【0043】[0043]
【発明の効果】以上説明した通り、本発明の非接触距離
姿勢測定方法及び装置によると、対象表面に投影された
1つの交点を提供する平行でない2つの線分を含むマー
ク光を少なくとも2本の1次元光センサで受光して対象
表面の距離と姿勢を演算するようにしたため、非接触距
離姿勢測定装置の簡素化及びコストダウンを図ることが
でき、また、高速測定が可能となる。As described above, according to the non-contact distance attitude measuring method and apparatus of the present invention, at least two mark lights including two non-parallel line segments providing one intersection projected on the target surface are provided. Since the one-dimensional optical sensor receives light and calculates the distance and posture of the target surface, the non-contact distance posture measuring device can be simplified and the cost can be reduced, and high-speed measurement can be performed.
【図1】本発明の第1の実施の形態における非接触距離
姿勢測定装置を示す説明図である。FIG. 1 is an explanatory diagram showing a non-contact distance / attitude measuring device according to a first embodiment of the present invention.
【図2】結像面に形成されるマーク光像を示す説明図で
ある。FIG. 2 is an explanatory diagram showing a mark light image formed on an image plane.
【図3】物体座標系と結像面における2次元座標系との
関係を示す説明図である。FIG. 3 is an explanatory diagram showing a relationship between an object coordinate system and a two-dimensional coordinate system on an image plane.
【図4】第1の実施の形態の結像面における1次元光セ
ンサとマーク光像の直線の位置の関係を示す説明図であ
る。FIG. 4 is an explanatory diagram showing the relationship between the position of the straight line of the one-dimensional optical sensor and the mark light image on the image plane of the first embodiment.
【図5】マーク光像3a’の重心位置を求める説明図で
ある。FIG. 5 is an explanatory diagram for obtaining the barycentric position of the mark light image 3a ′.
【図6】対象表面の平面の各座標軸回りの姿勢を示す説
明図である。FIG. 6 is an explanatory diagram showing a posture of each plane of the target surface around each coordinate axis.
【図7】第1の実施の形態において対象表面までの距離
と姿勢を演算するフローチャートである。FIG. 7 is a flowchart for calculating a distance and a posture to a target surface in the first embodiment.
【図8】第1の実施の形態における光源の変形例を示す
説明図である。FIG. 8 is an explanatory diagram showing a modified example of the light source according to the first embodiment.
【図9】第1の実施の形態において対象表面に投影され
たマークパターン光をマーク光像として使用する変形例
を示す説明図である。FIG. 9 is an explanatory diagram showing a modified example in which the mark pattern light projected on the target surface is used as a mark light image in the first embodiment.
【図10】(a)及び(b)は結像面における1次元光
センサの配置の変形例を示す説明図である。10A and 10B are explanatory diagrams showing a modification of the arrangement of the one-dimensional photosensors on the image plane.
【図11】(a)〜(d)はマーク光像の読み取り形態
の変形例を示す説明図である。FIG. 11A to FIG. 11D are explanatory diagrams showing a modified example of the reading form of the mark light image.
【図12】マーク光像の直線の交点の位置と2つの1次
元光センサの位置関係を示す説明図である。FIG. 12 is an explanatory diagram showing the positional relationship between the positions of the intersections of the straight lines of the mark light image and the two one-dimensional optical sensors.
【図13】図12におけるマーク光像の直線の交点の位
置と交点位置検出誤差の標準偏差のグラフである。13 is a graph of the position of the intersection of the straight lines of the mark light image in FIG. 12 and the standard deviation of the intersection position detection error.
【図14】マーク光像の直線の交点の位置と3つの1次
元光センサの位置関係を示す説明図である。FIG. 14 is an explanatory diagram showing a positional relationship between the positions of the intersections of the straight lines of the mark light image and the three one-dimensional optical sensors.
【図15】図14におけるマーク光像の直線の交点の位
置と交点位置検出誤差の標準偏差のグラフである。15 is a graph of the position of the intersection of the straight lines of the mark light image in FIG. 14 and the standard deviation of the intersection position detection error.
1,測定対象物 2,対象表面 3,光源 3a,マーク光 3a’,マーク光像 4,結像レンズ 6a,6b,1次元光センサ 7,結像面 8,センサヘッド 10,同期信号発生器 11a,11b,駆動回路 12a,12b,アンプ 13a,13b,A/D変換器 14,メモリ 15,メモリ制御回路 16,プロセッサ 17,表示部 18a,18b,18c,読み取りライン L1 ,L2 ,マーク光の直線 L1 ’,L2 ’ ,マーク光像の直線 P,マーク光の交点 P’,マーク光像の交点1, measurement object 2, target surface 3, light source 3a, mark light 3a ', mark light image 4, imaging lenses 6a, 6b, one-dimensional optical sensor 7, imaging surface 8, sensor head 10, synchronization signal generator 11a, 11b, drive circuits 12a, 12b, amplifiers 13a, 13b, A / D converter 14, memory 15, memory control circuit 16, processor 17, display units 18a, 18b, 18c, read lines L 1 , L 2 , mark Light straight line L 1 ', L 2 ', mark light image straight line P, mark light intersection P ', mark light image intersection
Claims (4)
光を照射して得られる反射光像に基づいて前記対象表面
までの距離と前記対象表面の姿勢を測定する非接触距離
姿勢測定方法において、 1つの交点を提供する平行でない2つの線分を含むマー
ク光を前記対象表面にある第1の平面に投影し、 第2の平面に少なくとも2つの1次元センサを配置し、 前記対象表面で反射された前記マーク光像に含まれる前
記2つの線分の線分像を前記平面に形成して前記少なく
とも2つの1次元センサに長さ方向の受光強度分布を表
わす受光信号を発生させ、 前記受光信号に基づいて前記2つの線分像の前記少なく
とも2つの1次元センサ上の位置を演算し、 前記少なくとも2つの1次元センサ上の位置に基づいて
前記第1の平面の方程式を算出し、 前記第1の平面の方程式に基づいて前記対象表面までの
距離及び姿勢を演算することを特徴とする非接触距離姿
勢測定方法。1. A non-contact distance posture measuring method for measuring a distance to the target surface and a posture of the target surface based on a reflected light image obtained by irradiating a target surface of a measurement target with a mark light from a light source. , Projecting a mark light including two non-parallel line segments providing one intersection on a first plane in the target surface, arranging at least two one-dimensional sensors in the second plane, Forming a line segment image of the two line segments included in the reflected mark light image on the plane, and causing the at least two one-dimensional sensors to generate a light receiving signal representing a light receiving intensity distribution in the longitudinal direction; Calculating the positions of the two line segment images on the at least two one-dimensional sensors based on the received light signals, and calculating the equation of the first plane based on the positions on the at least two one-dimensional sensors, Before Note: A non-contact distance / orientation measuring method, characterized in that the distance and attitude to the target surface are calculated based on the equation of the first plane.
記1つの交点を前記少なくとも2つの1次元センサに挟
まれる領域の内側に形成する請求項第1項記載の非接触
距離姿勢測定方法。2. The non-contact distance attitude measurement according to claim 1, wherein the projection of the mark light forms the one intersection of the line segment image inside an area sandwiched by the at least two one-dimensional sensors. Method.
光を照射して得られるマーク光像に基づいて前記対象表
面までの距離と前記対象表面の姿勢を測定する非接触距
離姿勢測定装置において、 1つの交点を提供する平行でない2つの線分を含むマー
ク光を前記対象表面にある第1の平面に投影するマーク
光投影手段と、 第2の平面に前記反射光像に含まれる前記2つの線分の
線分像を形成する像形成手段と、 前記平面に配置され、前記2つの線分像に基づいて長さ
方向の受光強度分布を表わす受光信号を出力する少なく
とも2つの1次元センサと、 前記受光信号に基づいて前記2つの線分像の前記少なく
とも2つの1次元センサ上の位置を演算する第1の演算
手段と、 前記第1の演算手段の演算結果に基づいて前記第1の平
面の方程式を求め、前記第1の平面の前記方程式に基づ
いて前記対象表面までの距離及び姿勢を演算する第2の
演算手段を有することを特徴とする非接触距離姿勢測定
装置。3. A non-contact distance attitude measuring device for measuring the distance to the object surface and the attitude of the object surface based on a mark light image obtained by irradiating the object surface of the object to be measured with mark light from a light source. Mark light projecting means for projecting mark light including two non-parallel line segments providing one intersection to a first plane on the target surface, and a mark light projecting means included in the reflected light image on a second plane. Image forming means for forming a line segment image of one line segment, and at least two one-dimensional sensors arranged on the plane and outputting a light receiving signal representing a light receiving intensity distribution in the longitudinal direction based on the two line segment images. A first calculation means for calculating the positions of the two line segment images on the at least two one-dimensional sensors based on the received light signal; and the first calculation means based on a calculation result of the first calculation means. The equation of the plane of Because, the non-contact distance and orientation measuring apparatus characterized by having a second calculating means for calculating the distance and orientation to the object surface based on the equation of the first plane.
前記1つの交点を前記少なくとも2つの1次元センサに
挟まれる領域の内側に形成する構成の請求項第3項記載
の非接触距離姿勢測定装置。4. The non-contact distance according to claim 3, wherein the mark light projecting means forms the one intersection of the line segment image inside an area sandwiched by the at least two one-dimensional sensors. Attitude measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27038095A JPH09113223A (en) | 1995-10-18 | 1995-10-18 | Non-contacting method and instrument for measuring distance and attitude |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27038095A JPH09113223A (en) | 1995-10-18 | 1995-10-18 | Non-contacting method and instrument for measuring distance and attitude |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH09113223A true JPH09113223A (en) | 1997-05-02 |
Family
ID=17485457
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27038095A Pending JPH09113223A (en) | 1995-10-18 | 1995-10-18 | Non-contacting method and instrument for measuring distance and attitude |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH09113223A (en) |
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