JPH09210904A - Microscopic observation method of infrared transmission image and contact microscope - Google Patents
Microscopic observation method of infrared transmission image and contact microscopeInfo
- Publication number
- JPH09210904A JPH09210904A JP1862796A JP1862796A JPH09210904A JP H09210904 A JPH09210904 A JP H09210904A JP 1862796 A JP1862796 A JP 1862796A JP 1862796 A JP1862796 A JP 1862796A JP H09210904 A JPH09210904 A JP H09210904A
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- JP
- Japan
- Prior art keywords
- infrared
- visible light
- light
- sample
- thin film
- Prior art date
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Abstract
(57)【要約】
【課題】 化学物質の空間分布情報を含む赤外光像を、
可視光波長の空間分解能で得ること。
【解決手段】 赤外/可視光変換薄膜の表面に密着した
試料に赤外光を投影し、赤外光透過像を試料の近接場領
域にて可視光像に変換し、可視光用光学顕微鏡で観察す
る。
(57) [Abstract] [Problem] Infrared light image containing spatial distribution information of chemical substances,
Obtaining with spatial resolution of visible light wavelength. An optical microscope for visible light, which projects infrared light onto a sample in close contact with the surface of an infrared / visible light converting thin film, converts the infrared light transmission image into a visible light image in a near-field region of the sample, and Observe at.
Description
【0001】[0001]
【発明の属する技術分野】単色赤外透過像は化学物質の
情報を含むため、赤外像から試料の二次元化学分析が行
なえる。本発明は、この赤外光透過像の顕微観察方法お
よび密着型顕微鏡に関する。BACKGROUND OF THE INVENTION Since a monochromatic infrared transmission image contains information on chemical substances, two-dimensional chemical analysis of a sample can be performed from the infrared image. The present invention relates to a method of microscopically observing this infrared light transmission image and a contact microscope.
【0002】[0002]
【従来の技術】赤外光透過像を得るには、赤外光を屈折
または反射する材質で造られる光学系から構成される光
学顕微鏡、ないしは細く収束された赤外光ビームで試料
を走査するタイプの走査型顕微鏡で可能である。しか
し、光学顕微鏡で観察される遠視野像にしても、収束さ
れたビームにしても空間分解能はレイリーの回折限界の
ため、使用波長のλ/2程度に制限されている。2. Description of the Related Art In order to obtain an infrared light transmission image, a sample is scanned with an optical microscope composed of an optical system made of a material that refracts or reflects infrared light, or a finely focused infrared light beam. This is possible with any type of scanning microscope. However, the spatial resolution of a far-field image observed by an optical microscope or a converged beam is limited to about λ / 2 of the used wavelength due to Rayleigh's diffraction limit.
【0003】[0003]
【発明が解決しようとする課題】赤外光は化学情報に関
する情報を含むが可視光に比べ波長が長いことから、赤
外像の空間分解能は必然的に劣ってしまう。そこで、本
発明は、可視光像なみの空間分解能で赤外像を得る手段
を提供することを目的とする。Infrared light contains information relating to chemical information, but since it has a longer wavelength than visible light, the spatial resolution of infrared images is inevitably inferior. Therefore, an object of the present invention is to provide a means for obtaining an infrared image with a spatial resolution similar to that of a visible light image.
【0004】[0004]
【課題を解決するための手段】本発明では、観察対象の
試料を透過した赤外光像を試料の実質的な近接場領域内
に配置された赤外/可視光変換板に投影し、変換された
可視光像を通常の可視光用光学顕微鏡で観察することに
より、赤外光像を可視光の波長で制限される空間分解能
で得ることが可能になる。According to the present invention, an infrared light image transmitted through a sample to be observed is projected on an infrared / visible light conversion plate arranged in a substantial near-field region of the sample and converted. By observing the obtained visible light image with a normal optical microscope for visible light, it becomes possible to obtain an infrared light image with a spatial resolution limited by the wavelength of visible light.
【0005】[0005]
【発明の実施の形態】本発明で用いられる赤外/可視光
変換材料はユウロピウム、セリウム、サマリウムなどの
2種の希土類を不純物として含むアルカリ土類カルコゲ
ン蛍光物質である。図1にその原理を示す。両方の希土
類のエネルギー準位はホスト材料の価電子帯1と伝導帯
2の間に存在する。紫外光3を照射すると、希土類1の
基底状態4にある電子5が希土類1の高エネルギー準位
6に励起され、最終的に希土類2の基底状態7に遷移す
る。この状態は安定している。次に赤外光8を照射する
と、希土類2の基底状態7にある電子は、希土類2の高
エネルギー準位9へ励起され、最終的に希土類1の基底
状態4へ戻る。この過程で、可視光10が発する。すな
わち、紫外光で励起された状態で赤外光を照射すること
により、赤外光に対応した可視光を得るのである。BEST MODE FOR CARRYING OUT THE INVENTION The infrared / visible light converting material used in the present invention is an alkaline earth chalcogen fluorescent substance containing two kinds of rare earths such as europium, cerium and samarium as impurities. FIG. 1 shows the principle. The energy levels of both rare earths lie between the valence band 1 and the conduction band 2 of the host material. When the ultraviolet light 3 is irradiated, the electrons 5 in the ground state 4 of the rare earth 1 are excited to the high energy level 6 of the rare earth 1 and finally transition to the ground state 7 of the rare earth 2. This condition is stable. Next, when the infrared light 8 is irradiated, the electrons in the ground state 7 of the rare earth 2 are excited to the high energy level 9 of the rare earth 2 and finally return to the ground state 4 of the rare earth 1. In this process, visible light 10 is emitted. That is, visible light corresponding to infrared light is obtained by irradiating infrared light while being excited by ultraviolet light.
【0006】したがって、図2に示すように、赤外/可
視光変換材料であるユウロピウム、セリウム、サマリウ
ムなどの2種の希土類を不純物として含むアルカリ土類
カルコゲン蛍光物質とホスト材料とにより、赤外/可視
光変換材料薄膜11を構成して、これに紫外光12を照
射後、赤外光像13を投影すると、可視光用結像系14
を用いることにより可視光像15が得られる。Therefore, as shown in FIG. 2, the infrared / visible light conversion material is converted into infrared rays by the alkaline earth chalcogen fluorescent substance containing two kinds of rare earths such as europium, cerium and samarium as impurities and the host material. / Constituting the visible light conversion material thin film 11, irradiating this with the ultraviolet light 12, and then projecting the infrared light image 13, the visible light imaging system 14
The visible light image 15 can be obtained by using.
【0007】実施例1 実施例1の構成の概念図を図3に示す。紫外光16を照
射した赤外/可視光変換材料薄膜17上に、薄い試料1
8を密着させ、単色赤外光19を照射する。その結果、
試料内観察対象化学物質20の空間分布情報を含む赤外
光透過像21が赤外/可視光変換材料薄膜17に投影さ
れることになる。赤外光透過像21は赤外/可視光変換
材料薄膜17で波長変換され、化学情報を含む可視光像
22としてダイクロイックミラー23を介して分離さ
れ、可視光用結像系24によって高空間分解能で結像さ
れる。First Embodiment FIG. 3 shows a conceptual diagram of the configuration of the first embodiment. The thin sample 1 is placed on the infrared / visible light conversion material thin film 17 irradiated with the ultraviolet light 16.
8 are brought into close contact with each other, and monochromatic infrared light 19 is irradiated. as a result,
The infrared light transmission image 21 including the spatial distribution information of the chemical substance 20 to be observed in the sample is projected on the infrared / visible light conversion material thin film 17. The infrared light transmission image 21 is wavelength-converted by the infrared / visible light conversion material thin film 17, separated as a visible light image 22 containing chemical information via a dichroic mirror 23, and has a high spatial resolution by an imaging system 24 for visible light. Is imaged at.
【0008】本実施例では、試料18は変換材料薄膜1
7と密着しているため、投影像の空間分解能は近接場の
それによって定められ、遠視野における場合よりも十分
高くなる。In this embodiment, the sample 18 is the conversion material thin film 1
Due to its close contact with 7, the spatial resolution of the projected image is determined by that of the near field and is much higher than in the far field.
【0009】なお、この実施例では、紫外光16の照射
は試料18の中に分布する化学物質20の空間分布情報
に実質的な影響を受けない。したがって、試料18を変
換材料薄膜17にセットした後に紫外光16を照射して
も、赤外/可視光変換材料薄膜17の励起は実質的に均
質に行なわれるので、支障はない。In this embodiment, the irradiation of the ultraviolet light 16 is not substantially influenced by the spatial distribution information of the chemical substance 20 distributed in the sample 18. Therefore, even if the ultraviolet light 16 is irradiated after the sample 18 is set on the conversion material thin film 17, excitation of the infrared / visible light conversion material thin film 17 is performed substantially uniformly, and there is no problem.
【0010】実施例2 実施例2の構成の概念図を図4に示す。赤外/可視光変
換材料薄膜25の上に薄い試料26を密着させた。薄膜
25を紫外光27で照射後、ハーフミラー28、全反射
鏡29、ダイクロイックミラー30、50を用い薄膜2
5の両面からコヒーレント赤外光31を照射し、薄膜2
5中で干渉させた。ここでダイクロイックミラー30は
赤外光に対しては実質的に反射鏡として作用し、紫外光
27に対しては充分な透過率を持つものとされる。ま
た、ダイクロイックミラー50は赤外光に対しては実質
的に反射鏡として作用し、可視光33に対しては充分な
透過率を持つものとされる。これにより、試料26の化
学物質の空間分布による位相情報を含む赤外光像を可視
光に変換し、可視光用結像系32で可視光像33として
結像した。Second Embodiment FIG. 4 shows a conceptual diagram of the configuration of the second embodiment. A thin sample 26 was brought into close contact with the infrared / visible light conversion material thin film 25. After the thin film 25 is irradiated with the ultraviolet light 27, the thin film 2 is formed by using the half mirror 28, the total reflection mirror 29, and the dichroic mirrors 30 and 50.
Irradiate the coherent infrared light 31 from both sides of the thin film 2
Interference in 5. Here, the dichroic mirror 30 substantially acts as a reflecting mirror for infrared light and has a sufficient transmittance for the ultraviolet light 27. Further, the dichroic mirror 50 substantially acts as a reflecting mirror for infrared light and has a sufficient transmittance for visible light 33. As a result, the infrared light image including the phase information due to the spatial distribution of the chemical substance of the sample 26 was converted into visible light, and the visible light image forming system 32 formed the visible light image 33.
【0011】本実施例でも、薄膜25の紫外光27によ
る照射は、試料26のセットの前後は問題ではない。Also in this embodiment, the irradiation of the thin film 25 with the ultraviolet light 27 does not matter before and after the setting of the sample 26.
【0012】実施例3 図5に、実施例1の考え方によって、赤外光透過像を可
視光用光学顕微鏡で観察するための顕微鏡の構成例を示
す。図で、34は試料ステージ、35は赤外/可視光変
換材料薄膜、36は試料、37は紫外光光源、38は紫
外光、39は全反射鏡、40は赤外光光源、41は赤外
光、42はダイクロミックミラー、43は長焦点対物レ
ンズ、44は接眼レンズを示す。試料ステージ34に赤
外/可視光変換材料薄膜35および試料36をセット
後、紫外光光源37から紫外光38を発し、全反射鏡3
9を介して、赤外/可視光変換材料薄膜35を励起す
る。その後、赤外光光源40から赤外光41を発し、ダ
イクロミックミラー42を介して試料36に赤外光41
を照射する。その結果、赤外/可視光変換材料薄膜35
から発生する可視光像を長焦点対物レンズ43と接眼レ
ンズ44を介して観察し、試料36の二次元化学物質の
分布の情報を得ることができる。Example 3 FIG. 5 shows a configuration example of a microscope for observing an infrared light transmission image with a visible light optical microscope according to the concept of Example 1. In the figure, 34 is a sample stage, 35 is an infrared / visible light conversion material thin film, 36 is a sample, 37 is an ultraviolet light source, 38 is ultraviolet light, 39 is a total reflection mirror, 40 is an infrared light source, 41 is red. External light, 42 is a dichroic mirror, 43 is a long focus objective lens, and 44 is an eyepiece lens. After the infrared / visible light conversion material thin film 35 and the sample 36 are set on the sample stage 34, ultraviolet light 38 is emitted from the ultraviolet light source 37, and the total reflection mirror 3
The infrared / visible light conversion material thin film 35 is excited via 9. Thereafter, infrared light 41 is emitted from the infrared light source 40, and the infrared light 41 is transmitted to the sample 36 via the dichroic mirror 42.
Is irradiated. As a result, the infrared / visible light conversion material thin film 35
By observing the visible light image generated from the sample through the long-focus objective lens 43 and the eyepiece lens 44, information on the distribution of the two-dimensional chemical substance of the sample 36 can be obtained.
【0013】実施例4 図6に、実施例2の考え方によって、赤外光透過像を可
視光用光学顕微鏡で観察するための顕微鏡の構成例を示
す。図6では、試料ステージ34、赤外/可視光変換材
料薄膜35、試料36、紫外光光源37、紫外光38、
全反射鏡39、赤外光光源40、赤外光41、ダイクロ
ミックミラー42、長焦点対物レンズ43、接眼レンズ
44については図5と同じである。この実施例では、赤
外/可視光変換材料薄膜35の両面からコヒーレント赤
外光を照射し、干渉させる必要があるから、赤外光の光
路にハーフミラー45を置き、これで反射した赤外光
を、さらに紫外光の光路に置いたダイクロックミラー4
6によって反射させた。ここで、ダイクロイックミラー
46は赤外光41に対しては実質的に反射鏡として作用
し、紫外光38に対しては充分な透過率を持つものとさ
れる。47は試料ステージ34に設けた赤外光の光路の
ための貫通孔である。Embodiment 4 FIG. 6 shows an example of the configuration of a microscope for observing an infrared light transmission image with a visible light optical microscope according to the concept of Embodiment 2. In FIG. 6, a sample stage 34, an infrared / visible light conversion material thin film 35, a sample 36, an ultraviolet light source 37, an ultraviolet light 38,
The total reflection mirror 39, the infrared light source 40, the infrared light 41, the dichroic mirror 42, the long focus objective lens 43, and the eyepiece lens 44 are the same as those in FIG. In this embodiment, since it is necessary to irradiate the coherent infrared light from both sides of the infrared / visible light conversion material thin film 35 to cause interference, the half mirror 45 is placed in the optical path of the infrared light, and the infrared reflected by this is reflected. A dichroic mirror 4 that places light in the optical path of ultraviolet light.
Reflected by 6. Here, the dichroic mirror 46 substantially acts as a reflecting mirror for the infrared light 41 and has a sufficient transmittance for the ultraviolet light 38. Reference numeral 47 is a through hole provided in the sample stage 34 for an optical path of infrared light.
【0014】試料ステージ34に赤外/可視光変換材料
薄膜35および試料36をセット後、紫外光光源37か
ら紫外光38を発し、ダイクロックミラー46を経由し
て全反射鏡39を介して、赤外/可視光変換材料薄膜3
5を励起する。その後、赤外光光源40から赤外光41
を発し、ハーフミラー45を経由してダイクロミックミ
ラー42を介して試料36に赤外光41を照射するとと
もに、ハーフミラー45、ダイクロックミラー46を経
由して全反射鏡39を介して試料36に赤外光41を照
射する。その結果、長焦点対物レンズ43とレンズ接眼
レンズ44を介して試料36の化学物質の空間分布によ
る位相情報が得られる。After the infrared / visible light conversion material thin film 35 and the sample 36 are set on the sample stage 34, ultraviolet light 38 is emitted from an ultraviolet light source 37, and a dichroic mirror 46 and a total reflection mirror 39 are passed through. Infrared / visible light conversion material thin film 3
Excite 5. Then, from the infrared light source 40 to the infrared light 41
And irradiates the sample 36 with infrared light 41 via the dichroic mirror 42 via the half mirror 45, and via the total reflection mirror 39 via the half mirror 45 and the dichroic mirror 46. The infrared light 41 is radiated on. As a result, phase information based on the spatial distribution of the chemical substance of the sample 36 is obtained via the long-focus objective lens 43 and the lens eyepiece lens 44.
【0015】なお、上記の実施例では、試料を、直接、
赤外/可視光変換材料薄膜上に乗せる例について延べた
が、試料の取扱の便等から、試料を薄い保持膜に保持さ
せたうえで赤外/可視光変換材料薄膜上に乗せることと
しても良い。この場合、試料が、直接、赤外/可視光変
換材料薄膜に接するようにすると、試料と赤外/可視光
変換材料薄膜がより接近したものとなり好都合である。In the above embodiment, the sample is directly
Although the example of placing it on the infrared / visible light conversion material thin film has been described, it is also possible to place the sample on the infrared / visible light conversion material thin film after holding the sample on a thin holding film for convenience of handling the sample. good. In this case, if the sample is brought into direct contact with the infrared / visible light conversion material thin film, it is convenient because the sample and the infrared / visible light conversion material thin film are closer to each other.
【0016】[0016]
【発明の効果】試料の赤外光領域の透過率または位相情
報を含む像を、可視光波長の空間分解能で得られ、化学
物質の高空間分解能、空間分布情報が得られる。According to the present invention, an image containing transmittance or phase information in the infrared light region of a sample can be obtained with a spatial resolution of visible light wavelength, and high spatial resolution and spatial distribution information of a chemical substance can be obtained.
【図1】赤外/可視光変換材料の原理を示す図。FIG. 1 is a diagram showing the principle of an infrared / visible light conversion material.
【図2】赤外光像が可視光像に変換される様子を示す
図。FIG. 2 is a diagram showing how an infrared light image is converted into a visible light image.
【図3】密着された試料の赤外光透過像が試料の近接場
領域で可視光像に変換される様子を示す図。FIG. 3 is a diagram showing how an infrared light transmission image of a closely attached sample is converted into a visible light image in a near field region of the sample.
【図4】密着された試料の赤外光位相像が試料の近接場
領域で可視光像に変換される様子を示す図。FIG. 4 is a view showing a state in which an infrared light phase image of a closely attached sample is converted into a visible light image in a near field region of the sample.
【図5】試料の赤外光透過像を、可視光用光学顕微鏡で
観察する様子を示す図。FIG. 5 is a diagram showing how an infrared light transmission image of a sample is observed with an optical microscope for visible light.
【図6】試料の位相情報を含む像を、可視光用光学顕微
鏡で観察する様子を示す図。FIG. 6 is a diagram showing how an image including phase information of a sample is observed with an optical microscope for visible light.
1…価電子帯、2…伝導帯、3…紫外光、4…希土類1
の基底状態、5…電子、6…希土類1の高エネルギー準
位、7…希土類2の基底状態、8…赤外光、9…希土類
2の高エネルギー準位、10…可視光、11…赤外/可
視光変換材料薄膜、12…紫外光、13…赤外光像、1
4…可視光用結像系、15…可視光像、16…紫外光、
17…赤外/可視光変換材料薄膜、18…試料、19…
単色赤外光、20…試料内観察対象化学物質、21…赤
外光透過像、22…可視光像、23…ダイクロイックミ
ラー、24…可視光用結像系、25…赤外/可視変換材
料薄膜、26…試料、27…紫外光、28…ハーフミラ
ー、29…全反射鏡、30、50…ダイクロイックミラ
ー、31…赤外光、32…可視光用結像系、33…可視
光像、34…試料ステージ、35…赤外/可視光変換材
料薄膜、36…試料、37…紫外光光源、38…紫外
光、39…全反射鏡、40…赤外光光源、41…赤外
光、42…ダイクロミックミラー、43…長焦点対物レ
ンズ、44…接眼レンズ、45…ハーフミラー、46…
ダイクロミックミラー、47…光路の為の貫通孔。1 ... Valence band, 2 ... Conduction band, 3 ... Ultraviolet light, 4 ... Rare earth 1
Ground state, 5 ... Electron, 6 ... High energy level of rare earth 1, 7 ... Ground state of rare earth 2, 8 ... Infrared light, 9 ... High energy level of rare earth 2, 10 ... Visible light, 11 ... Red Outer / visible light conversion material thin film, 12 ... Ultraviolet light, 13 ... Infrared light image, 1
4 ... Imaging system for visible light, 15 ... Visible light image, 16 ... Ultraviolet light,
17 ... Infrared / visible light conversion material thin film, 18 ... Sample, 19 ...
Monochromatic infrared light, 20 ... Chemical substance to be observed in sample, 21 ... Infrared light transmission image, 22 ... Visible light image, 23 ... Dichroic mirror, 24 ... Visible light imaging system, 25 ... Infrared / visible conversion material Thin film, 26 ... Sample, 27 ... Ultraviolet light, 28 ... Half mirror, 29 ... Total reflection mirror, 30, 50 ... Dichroic mirror, 31 ... Infrared light, 32 ... Visible light imaging system, 33 ... Visible light image, 34 ... Sample stage, 35 ... Infrared / visible light conversion material thin film, 36 ... Sample, 37 ... Ultraviolet light source, 38 ... Ultraviolet light, 39 ... Total reflection mirror, 40 ... Infrared light source, 41 ... Infrared light, 42 ... dichroic mirror, 43 ... long focus objective lens, 44 ... eyepiece lens, 45 ... half mirror, 46 ...
Dichromic mirror, 47 ... Through hole for optical path.
Claims (5)
紫外光によって励起すること、該変換膜上に置かれた試
料を介して赤外光を該変換膜に照射すること、該変換膜
から得られる可視光像を顕微観察することとよりなる観
察方法。1. An infrared / visible light conversion film containing a plurality of rare earths is excited by ultraviolet light, and the conversion film is irradiated with infrared light through a sample placed on the conversion film. An observation method comprising microscopically observing a visible light image obtained from the conversion film.
紫外光によって励起すること、該変換膜上に置かれた試
料を介してコヒーレント赤外光を該変換膜に照射すると
ともに、該変換膜の他面からコヒーレント赤外光を照射
して両方のコヒーレント赤外光を該変換膜内で干渉させ
ること、該変換膜から得られる位相情報を含む可視光像
を顕微観察することとよりなる観察方法。2. An infrared / visible light conversion film containing a plurality of rare earths is excited by ultraviolet light, and the conversion film is irradiated with coherent infrared light through a sample placed on the conversion film, Irradiating coherent infrared light from the other surface of the conversion film to cause both coherent infrared light to interfere in the conversion film, and microscopically observing a visible light image including phase information obtained from the conversion film. The observation method that consists of.
ム、サマリウムである請求項1または2記載の観察方
法。3. The observation method according to claim 1, wherein the plurality of rare earth elements are europium, cerium, and samarium.
その一部に試料が配置される複数の希土類を含む赤外/
可視光変換材料薄膜、該赤外/可視光変換材料薄膜を紫
外光で励起するための紫外光光源、該励起後の赤外/可
視光変換材料薄膜に試料を介して赤外光を照射するため
の赤外光光源、紫外光光源および赤外光光源の発する紫
外光および赤外光の所定の光路を構成するための反射手
段および、赤外/可視光変換材料薄膜に得られた可視光
像を観察するための手段とよりなることを特徴とする密
着型顕微鏡。4. A sample stage, an infrared ray containing a plurality of rare earth elements placed on the sample stage, and a sample is placed on a part of the sample stage.
Visible light converting material thin film, ultraviolet light source for exciting the infrared / visible light converting material thin film with ultraviolet light, and irradiating the infrared / visible light converting material thin film after the excitation with infrared light through a sample Infrared light source, an ultraviolet light source, a reflecting means for forming a predetermined optical path of the ultraviolet light and the infrared light emitted from the infrared light source, and visible light obtained in the infrared / visible light conversion material thin film A contact microscope comprising a means for observing an image.
ム、サマリウムである請求項4記載の密着型顕微鏡。5. The contact microscope according to claim 4, wherein the plurality of rare earths are europium, cerium, and samarium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1862796A JPH09210904A (en) | 1996-02-05 | 1996-02-05 | Microscopic observation method of infrared transmission image and contact microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1862796A JPH09210904A (en) | 1996-02-05 | 1996-02-05 | Microscopic observation method of infrared transmission image and contact microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH09210904A true JPH09210904A (en) | 1997-08-15 |
Family
ID=11976864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1862796A Pending JPH09210904A (en) | 1996-02-05 | 1996-02-05 | Microscopic observation method of infrared transmission image and contact microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH09210904A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111380847A (en) * | 2020-03-31 | 2020-07-07 | 深圳大学 | Thin film double-sided fluorescent signal detection device and detection method |
| JP2024516053A (en) * | 2021-01-29 | 2024-04-12 | ジェイ・エイ・ウーラム・カンパニー・インコーポレイテッド | Sample inspection system and sample inspection method |
-
1996
- 1996-02-05 JP JP1862796A patent/JPH09210904A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111380847A (en) * | 2020-03-31 | 2020-07-07 | 深圳大学 | Thin film double-sided fluorescent signal detection device and detection method |
| CN111380847B (en) * | 2020-03-31 | 2023-08-18 | 深圳大学 | A thin-film double-sided fluorescent signal detection device and detection method |
| JP2024516053A (en) * | 2021-01-29 | 2024-04-12 | ジェイ・エイ・ウーラム・カンパニー・インコーポレイテッド | Sample inspection system and sample inspection method |
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