JPH10170611A - 実装済み回路基板の標準及び制限アクセス・ハイブリッド試験用取付具 - Google Patents

実装済み回路基板の標準及び制限アクセス・ハイブリッド試験用取付具

Info

Publication number
JPH10170611A
JPH10170611A JP9296508A JP29650897A JPH10170611A JP H10170611 A JPH10170611 A JP H10170611A JP 9296508 A JP9296508 A JP 9296508A JP 29650897 A JP29650897 A JP 29650897A JP H10170611 A JPH10170611 A JP H10170611A
Authority
JP
Japan
Prior art keywords
test
probe
probes
spring
fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9296508A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10170611A5 (2
Inventor
Tracy L Sayre
トレーシー・エル・セイアー
Robert A Slutz
ロバート・エイ・シュルツ
Leanne C Pelzel
レーニー・シー・ペルツェ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH10170611A publication Critical patent/JPH10170611A/ja
Publication of JPH10170611A5 publication Critical patent/JPH10170611A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP9296508A 1996-10-29 1997-10-29 実装済み回路基板の標準及び制限アクセス・ハイブリッド試験用取付具 Pending JPH10170611A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/741,151 US5773988A (en) 1996-10-29 1996-10-29 Standard- and limited-access hybrid test fixture
US741151 1996-10-29

Publications (2)

Publication Number Publication Date
JPH10170611A true JPH10170611A (ja) 1998-06-26
JPH10170611A5 JPH10170611A5 (2) 2005-06-23

Family

ID=24979604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9296508A Pending JPH10170611A (ja) 1996-10-29 1997-10-29 実装済み回路基板の標準及び制限アクセス・ハイブリッド試験用取付具

Country Status (4)

Country Link
US (1) US5773988A (2)
EP (1) EP0840130B1 (2)
JP (1) JPH10170611A (2)
DE (1) DE69735795D1 (2)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180004753A (ko) * 2015-05-07 2018-01-12 테크노프로브 에스.피.에이. 특히 감소된 피치 적용을 위한, 수직형 프로브를 구비한 테스트 헤드
KR20220041716A (ko) * 2020-09-25 2022-04-01 에세, 아이엔씨. 이중 각도 공동을 갖는 집적 회로 디바이스 테스트 툴링

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW360790B (en) 1996-10-28 1999-06-11 Atg Test Systems Gmbh Printed circuit board test apparatus and method
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
US5945836A (en) * 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US5949243A (en) * 1997-02-27 1999-09-07 Star Technology Group, Inc. Translator fixture for use in circuit board testing
US6194908B1 (en) * 1997-06-26 2001-02-27 Delaware Capital Formation, Inc. Test fixture for testing backplanes or populated circuit boards
US5945838A (en) * 1997-06-26 1999-08-31 Star Technology Group, Inc. Apparatus for testing circuit boards
US6005405A (en) * 1997-06-30 1999-12-21 Hewlett Packard Company Probe plate assembly for high-node-count circuit board test fixtures
US6025729A (en) * 1997-09-11 2000-02-15 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US6005402A (en) * 1998-05-08 1999-12-21 Delaware Capital Formation, Inc. Translator fixture for use in circuit board testing
US6268719B1 (en) 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
EP0989409A1 (en) * 1998-09-23 2000-03-29 Delaware Capital Formation, Inc. Scan test machine for densely spaced test sites
US6281692B1 (en) 1998-10-05 2001-08-28 International Business Machines Corporation Interposer for maintaining temporary contact between a substrate and a test bed
US6414504B2 (en) * 1999-05-20 2002-07-02 Delaware Capital Formation, Inc. Coaxial tilt pin fixture for testing high frequency circuit boards
US6255832B1 (en) 1999-12-03 2001-07-03 International Business Machines Corporation Flexible wafer level probe
US6559664B2 (en) * 2001-08-13 2003-05-06 Desimone Peter Probe plate assembly for a circuit board test fixture
US6788078B2 (en) 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards
EP1491058A4 (en) * 2002-04-04 2005-10-05 MODULAR TELEVISION PRODUCTS
US7059046B2 (en) * 2002-06-24 2006-06-13 Delaware Capital Formation, Inc. Method for producing a captive wired test fixture and fixture therefor
US6784675B2 (en) * 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
DE102005030550B3 (de) * 2005-06-22 2006-10-26 JHS Technik Josef Schäfer Vorrichtung zum Prüfen von bestückten oder unbestückten Leiterplatten
JP4923494B2 (ja) * 2005-09-22 2012-04-25 富士通株式会社 多層回路基板設計支援方法、プログラム、装置及び多層回路基板
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
DE102012016449A1 (de) * 2012-08-16 2014-03-13 Feinmetall Gmbh Prüfkopf für die elektrische Prüfung eines Prüflings
KR101462466B1 (ko) 2013-03-07 2014-11-17 대림산업 주식회사 올레핀의 중합 방법
CN111675298B (zh) * 2020-06-19 2021-06-29 绍兴皓诚环境建设工程有限公司 一种减少资源浪费的含银废水处理装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4799007A (en) * 1985-11-01 1989-01-17 Hewlett-Packard Company Bendable pin board test fixture
US4818933A (en) * 1986-10-08 1989-04-04 Hewlett-Packard Company Board fixturing system
US4771234A (en) * 1986-11-20 1988-09-13 Hewlett-Packard Company Vacuum actuated test fixture
US4935696A (en) * 1987-04-16 1990-06-19 Teradyne, Inc. Test pin assembly for circuit board tester
US4977370A (en) * 1988-12-06 1990-12-11 Genrad, Inc. Apparatus and method for circuit board testing
FR2688975B1 (fr) * 1992-03-19 1996-10-04 Testelec Dispositif interface entre un appareil testeur et une carte de circuit imprime.
US5510722A (en) * 1992-12-18 1996-04-23 Tti Testron, Inc. Test fixture for printed circuit boards
DE4335841C1 (de) * 1993-10-20 1995-06-01 Siemens Nixdorf Inf Syst Vakuumadapter
US5450017A (en) * 1993-12-03 1995-09-12 Everett Charles Technologies, Inc. Test fixture having translator for grid interface
US5493230A (en) * 1994-02-25 1996-02-20 Everett Charles Technologies, Inc. Retention of test probes in translator fixtures
US5485096A (en) * 1994-04-05 1996-01-16 Aksu; Allen Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards
US5506510A (en) * 1994-05-18 1996-04-09 Genrad, Inc. Adaptive alignment probe fixture for circuit board tester

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180004753A (ko) * 2015-05-07 2018-01-12 테크노프로브 에스.피.에이. 특히 감소된 피치 적용을 위한, 수직형 프로브를 구비한 테스트 헤드
KR20220041716A (ko) * 2020-09-25 2022-04-01 에세, 아이엔씨. 이중 각도 공동을 갖는 집적 회로 디바이스 테스트 툴링

Also Published As

Publication number Publication date
DE69735795D1 (de) 2006-06-08
EP0840130A3 (en) 1999-06-09
EP0840130B1 (en) 2006-05-03
US5773988A (en) 1998-06-30
EP0840130A2 (en) 1998-05-06

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