JPH10311789A5 - - Google Patents

Info

Publication number
JPH10311789A5
JPH10311789A5 JP1997121806A JP12180697A JPH10311789A5 JP H10311789 A5 JPH10311789 A5 JP H10311789A5 JP 1997121806 A JP1997121806 A JP 1997121806A JP 12180697 A JP12180697 A JP 12180697A JP H10311789 A5 JPH10311789 A5 JP H10311789A5
Authority
JP
Japan
Prior art keywords
applied voltage
photomultiplier
light
photometric
light irradiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1997121806A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10311789A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP9121806A priority Critical patent/JPH10311789A/ja
Priority claimed from JP9121806A external-priority patent/JPH10311789A/ja
Publication of JPH10311789A publication Critical patent/JPH10311789A/ja
Publication of JPH10311789A5 publication Critical patent/JPH10311789A5/ja
Pending legal-status Critical Current

Links

JP9121806A 1997-05-13 1997-05-13 測光装置 Pending JPH10311789A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9121806A JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9121806A JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Publications (2)

Publication Number Publication Date
JPH10311789A JPH10311789A (ja) 1998-11-24
JPH10311789A5 true JPH10311789A5 (th) 2005-03-17

Family

ID=14820399

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9121806A Pending JPH10311789A (ja) 1997-05-13 1997-05-13 測光装置

Country Status (1)

Country Link
JP (1) JPH10311789A (th)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003115625A (ja) * 2001-10-04 2003-04-18 Tochigi Nikon Corp テラヘルツ光発生装置
JP4761893B2 (ja) * 2005-08-29 2011-08-31 アークレイ株式会社 分析用具およびその製造方法
JP2007093249A (ja) * 2005-09-27 2007-04-12 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP5282391B2 (ja) * 2007-10-31 2013-09-04 富士通株式会社 赤外線撮像装置
JP2010107418A (ja) * 2008-10-31 2010-05-13 Optex Co Ltd 光測定方法および装置
JP2010281842A (ja) * 2010-09-24 2010-12-16 Yokogawa Electric Corp 光量計測装置および光量計測方法
JP2011017721A (ja) * 2010-09-24 2011-01-27 Yokogawa Electric Corp 光量計測装置および光量計測方法
EP3392645B1 (en) * 2016-01-22 2026-04-15 Sony Group Corporation Microparticle measurement device, information processing device, and information processing method
US10914631B2 (en) 2017-06-02 2021-02-09 Pioneer Corporation Electromagnetic wave detecting apparatus and method of setting acquisition timing of detection signal
JP6836522B2 (ja) * 2018-01-26 2021-03-03 株式会社日立ハイテク 自動分析装置、及び自動分析装置の制御方法

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