JPH10509267A - カーボンをスパッタリングするための装置及び方法 - Google Patents
カーボンをスパッタリングするための装置及び方法Info
- Publication number
- JPH10509267A JPH10509267A JP8511142A JP51114296A JPH10509267A JP H10509267 A JPH10509267 A JP H10509267A JP 8511142 A JP8511142 A JP 8511142A JP 51114296 A JP51114296 A JP 51114296A JP H10509267 A JPH10509267 A JP H10509267A
- Authority
- JP
- Japan
- Prior art keywords
- sputtering
- carbon
- target
- film
- targets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 84
- 229910052799 carbon Inorganic materials 0.000 title claims abstract description 79
- 238000004544 sputter deposition Methods 0.000 title claims description 125
- 238000000034 method Methods 0.000 title claims description 78
- 239000007789 gas Substances 0.000 claims abstract description 46
- 229930195733 hydrocarbon Natural products 0.000 claims abstract description 24
- 150000002430 hydrocarbons Chemical class 0.000 claims abstract description 24
- 239000004215 Carbon black (E152) Substances 0.000 claims abstract description 23
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims abstract description 16
- 229910052786 argon Inorganic materials 0.000 claims abstract description 8
- 239000010408 film Substances 0.000 claims description 118
- 239000000758 substrate Substances 0.000 claims description 37
- 238000000151 deposition Methods 0.000 claims description 36
- 230000008021 deposition Effects 0.000 claims description 24
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 23
- 239000001257 hydrogen Substances 0.000 claims description 23
- 229910052739 hydrogen Inorganic materials 0.000 claims description 23
- 230000008569 process Effects 0.000 claims description 16
- 239000003989 dielectric material Substances 0.000 claims description 14
- 239000010409 thin film Substances 0.000 claims description 13
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims description 6
- 239000005977 Ethylene Substances 0.000 claims description 6
- 230000002829 reductive effect Effects 0.000 claims description 4
- 230000002708 enhancing effect Effects 0.000 claims 1
- 230000027756 respiratory electron transport chain Effects 0.000 claims 1
- 238000001755 magnetron sputter deposition Methods 0.000 abstract description 14
- 239000010410 layer Substances 0.000 description 15
- 230000004907 flux Effects 0.000 description 11
- 238000009826 distribution Methods 0.000 description 7
- 238000000427 thin-film deposition Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005477 sputtering target Methods 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 229910002804 graphite Inorganic materials 0.000 description 4
- 239000010439 graphite Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- SNAAJJQQZSMGQD-UHFFFAOYSA-N aluminum magnesium Chemical compound [Mg].[Al] SNAAJJQQZSMGQD-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 238000010494 dissociation reaction Methods 0.000 description 2
- 230000005593 dissociations Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 239000011253 protective coating Substances 0.000 description 2
- 238000005546 reactive sputtering Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 241001417539 Liza Species 0.000 description 1
- -1 Si 3 N 4 Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 239000006249 magnetic particle Substances 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0605—Carbon
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/8408—Processes or apparatus specially adapted for manufacturing record carriers protecting the magnetic layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.磁気の薄いフィルム記録媒体用のカーボンフィルムをスパッタリングする 方法にして、 a)排泄された環境で並んで位置決めされたカーボン含有ターゲットを提供す る工程と、 b)排泄された環境内に、ガスを、スパッタリングを維持することができる圧 力まで流す工程と、 c)前記ターゲットから周期的にスパッタリングして前記媒体にカーボンフィ ルムを形成する工程と、 d)前記ターゲット間に穴を提供して、スパッタリング工程中、陽極に向かう 電子の移動を高める工程と、 を有している方法。 2.請求の範囲第1項記載の方法において、前記工程c)は斜めに入射するフ ラックスを前記ターゲットから遮る遮蔽条件の下で行われる方法。 3.請求の範囲第1項記載の方法において、前記ガスは炭化水素を有している 方法。 4.請求の範囲第3項記載の方法において、前記カーボンフィルムは前記炭化 水素ガスからの水素を有している方法。 5.請求の範囲第1項記載の方法において、前記炭化水素ガスはエチレンを有 している方法。 6.請求の範囲第2項記載の方法において、水素と化合されたカーボンフィル ムは実質上ダイヤモンドのような構造を有している方法。 7.請求の範囲第1項記載の方法において、前記媒体は多層を有し、前記工程 c)は、前記カーボンがスパッタリングされ、且つ、下に横たわっている層が沈 着される温度から比較的低減された温度で実施される方法。 8.磁気の薄いフィルム記録媒体を作る方法にして、 基体上に磁気の薄いフィルム記録層を沈着する工程と、 アルゴンと炭化水素ガスとを有する雰囲気内で、前記磁気の薄いフィルム記録 層を覆って、水素と化合されたカーボン層をスパッタリングし、前記カーボン層 がカーボン含有ターゲットからのカーボンと炭化水素ガスからの水素を有してい る工程と、 を有している方法。 9.基体上に誘電フィルムをスパッタリングする方法にして、 a)互いに隣接するターゲットに交流電源を提供して該ターゲットを、該交流 の周波数に従ってスパッタリング陰極として、また、陽極として次々と作用させ る工程と、 b)前記ターゲット間に電子を指向させてフィルムのスパッタリングの割合を 高める穴開きバッフルによって提供される遮蔽条件の下で前記ターゲットを通り 越して前記基体を移動させる工程とを有している方法。 10.請求の範囲第9項記載の方法において、前記誘電フィルムがカーボンを有 している方法。 11.請求の範囲第9項記載の方法において、前記基体は、炭化水素ガスを有し ている雰囲気において前記ターゲットを通り越して移動せしめられる方法。 12.スパッタリング装置にして、 a)スパッタリング室内に配備された一対のマグネトロンであって、該マグネ トロンがターゲットを有し、該ターゲットが互いに隣接して位置決めされている とともにフィルムの沈着用の共通したスパッタリング域として作用する前記一対 のマグネトロンと、 b)前記マグネトロンに連結されていて対の各ターゲットがスパッタリング陰 極として、次いで、交流の周波数に従って陽極として交互に機能せしめる交流電 源と、 c)前記マグネトロン間の遮蔽手段であって、該遮蔽手段は、前記ターゲット がスパッタリング陰極として、また、陽極として交替する際該陽極に電子を指向 させるよう位置決めされた穴を有している前記遮蔽手段と、 を有しているスパッタリング装置。 13.請求の範囲第12項記載のスパッタリング装置において、前記ターゲット は誘電材料を有しているスパッタリング装置。 14.請求の範囲第12項記載のスパッタリング装置において、前記誘電材料は カーボンを有しているスパッタリング装置。 15.請求の範囲第12項記載のスパッタリング装置にして、前記スパッタリン グ室内に気体状炭化水素を更に有しているスパッタリング装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/311,529 US5830331A (en) | 1994-09-23 | 1994-09-23 | Apparatus and method for sputtering carbon |
| US08/311,529 | 1994-09-23 | ||
| PCT/US1995/012399 WO1996009622A2 (en) | 1994-09-23 | 1995-09-21 | Apparatus and method for sputtering carbon |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10509267A true JPH10509267A (ja) | 1998-09-08 |
| JP3589467B2 JP3589467B2 (ja) | 2004-11-17 |
Family
ID=23207320
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51114296A Expired - Fee Related JP3589467B2 (ja) | 1994-09-23 | 1995-09-21 | カーボンをスパッタリングするための装置及び方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5830331A (ja) |
| EP (1) | EP0782744B1 (ja) |
| JP (1) | JP3589467B2 (ja) |
| KR (1) | KR100281340B1 (ja) |
| CN (1) | CN1164915A (ja) |
| DE (1) | DE69505994T2 (ja) |
| WO (1) | WO1996009622A2 (ja) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW358964B (en) | 1996-11-21 | 1999-05-21 | Applied Materials Inc | Method and apparatus for improving sidewall coverage during sputtering in a chamber having an inductively coupled plasma |
| DE19651615C1 (de) * | 1996-12-12 | 1997-07-10 | Fraunhofer Ges Forschung | Verfahren zum Aufbringen von Kohlenstoffschichten durch reaktives Magnetron-Sputtern |
| US6042700A (en) * | 1997-09-15 | 2000-03-28 | Applied Materials, Inc. | Adjustment of deposition uniformity in an inductively coupled plasma source |
| US6726993B2 (en) * | 1997-12-02 | 2004-04-27 | Teer Coatings Limited | Carbon coatings, method and apparatus for applying them, and articles bearing such coatings |
| US6103320A (en) * | 1998-03-05 | 2000-08-15 | Shincron Co., Ltd. | Method for forming a thin film of a metal compound by vacuum deposition |
| US6312798B1 (en) | 1998-09-25 | 2001-11-06 | Seagate Technology Llc | Magnetic recording medium having a nitrogen-doped hydrogenated carbon protective overcoat |
| WO2001073883A2 (en) * | 2000-03-24 | 2001-10-04 | Cymbet Corporation | Low-temperature fabrication of thin-film energy-storage devices |
| US7294209B2 (en) | 2003-01-02 | 2007-11-13 | Cymbet Corporation | Apparatus and method for depositing material onto a substrate using a roll-to-roll mask |
| US6906436B2 (en) | 2003-01-02 | 2005-06-14 | Cymbet Corporation | Solid state activity-activated battery device and method |
| US7603144B2 (en) | 2003-01-02 | 2009-10-13 | Cymbet Corporation | Active wireless tagging system on peel and stick substrate |
| US20040238583A1 (en) * | 2003-05-28 | 2004-12-02 | Vanessa Gordon | Personal pillow transport system |
| US7211351B2 (en) | 2003-10-16 | 2007-05-01 | Cymbet Corporation | Lithium/air batteries with LiPON as separator and protective barrier and method |
| CN1957487A (zh) | 2004-01-06 | 2007-05-02 | Cymbet公司 | 具有一个或者更多个可限定层的层式阻挡物结构和方法 |
| US7776478B2 (en) | 2005-07-15 | 2010-08-17 | Cymbet Corporation | Thin-film batteries with polymer and LiPON electrolyte layers and method |
| JP2009502011A (ja) | 2005-07-15 | 2009-01-22 | シンベット・コーポレイション | 軟質および硬質電解質層付き薄膜電池および方法 |
| JP4436350B2 (ja) * | 2006-09-14 | 2010-03-24 | 株式会社アルバック | 薄膜形成方法及び薄膜形成装置 |
| CN101535177B (zh) * | 2006-11-10 | 2012-06-13 | 住友电气工业株式会社 | 含有Si-O的氢化碳膜、具有该氢化碳膜的光学装置以及制备含有Si-O的氢化碳膜和光学装置的方法 |
| US10658705B2 (en) | 2018-03-07 | 2020-05-19 | Space Charge, LLC | Thin-film solid-state energy storage devices |
| US11996517B2 (en) | 2011-06-29 | 2024-05-28 | Space Charge, LLC | Electrochemical energy storage devices |
| US9853325B2 (en) | 2011-06-29 | 2017-12-26 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
| US10601074B2 (en) | 2011-06-29 | 2020-03-24 | Space Charge, LLC | Rugged, gel-free, lithium-free, high energy density solid-state electrochemical energy storage devices |
| US11527774B2 (en) | 2011-06-29 | 2022-12-13 | Space Charge, LLC | Electrochemical energy storage devices |
| EP4017223B1 (en) | 2017-06-27 | 2025-10-15 | Canon Anelva Corporation | Plasma processing apparatus |
| CN114666965B (zh) | 2017-06-27 | 2025-08-01 | 佳能安内华股份有限公司 | 等离子体处理装置 |
| EP3648550B1 (en) | 2017-06-27 | 2021-06-02 | Canon Anelva Corporation | Plasma treatment device |
| PL3648554T3 (pl) | 2017-06-27 | 2021-11-22 | Canon Anelva Corporation | Urządzenie do przetwarzania plazmowego |
| PL3817517T3 (pl) * | 2018-06-26 | 2024-10-28 | Canon Anelva Corporation | Urządzenie do obróbki plazmą, sposób obróbki plazmą, program oraz nośnik pamięci |
| CN113564527B (zh) * | 2021-08-10 | 2022-06-07 | 中国科学院兰州化学物理研究所 | 一种抗辐照无氢碳膜聚合物润滑材料及其制备方法和应用 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2549361B2 (ja) * | 1984-01-26 | 1996-10-30 | 電気化学工業株式会社 | 磁気記憶媒体 |
| US4737419A (en) * | 1985-02-11 | 1988-04-12 | International Business Machines Corporation | Overcoat for particulate magnetic recording disk |
| US4778582A (en) * | 1987-06-02 | 1988-10-18 | International Business Machines Corporation | Process for making a thin film metal alloy magnetic recording disk with a hydrogenated carbon overcoat |
| US5074983A (en) * | 1989-04-21 | 1991-12-24 | Hmt Technology Corporation | Thin film testing method |
| DE4138794A1 (de) * | 1991-11-26 | 1993-05-27 | Leybold Ag | Verfahren und vorrichtung zum beschichten eines substrats, insbesondere mit elektrisch nichtleitenden schichten |
| US5415757A (en) * | 1991-11-26 | 1995-05-16 | Leybold Aktiengesellschaft | Apparatus for coating a substrate with electrically nonconductive coatings |
| JPH06145975A (ja) * | 1992-03-20 | 1994-05-27 | Komag Inc | 炭素フィルムをスパタリングする方法及びその製造物 |
| US5512164A (en) * | 1993-06-03 | 1996-04-30 | The United States Of America As Represented By The United States Department Of Energy | Method for sputtering with low frequency alternating current |
| DE4413655A1 (de) * | 1994-04-20 | 1995-10-26 | Leybold Ag | Beschichtungsanlage |
-
1994
- 1994-09-23 US US08/311,529 patent/US5830331A/en not_active Expired - Fee Related
-
1995
- 1995-09-21 CN CN95195233A patent/CN1164915A/zh active Pending
- 1995-09-21 DE DE69505994T patent/DE69505994T2/de not_active Expired - Fee Related
- 1995-09-21 KR KR1019970701840A patent/KR100281340B1/ko not_active Expired - Fee Related
- 1995-09-21 JP JP51114296A patent/JP3589467B2/ja not_active Expired - Fee Related
- 1995-09-21 EP EP95935167A patent/EP0782744B1/en not_active Expired - Lifetime
- 1995-09-21 WO PCT/US1995/012399 patent/WO1996009622A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR100281340B1 (ko) | 2001-02-01 |
| WO1996009622A2 (en) | 1996-03-28 |
| CN1164915A (zh) | 1997-11-12 |
| WO1996009622A3 (en) | 1996-05-30 |
| US5830331A (en) | 1998-11-03 |
| EP0782744A2 (en) | 1997-07-09 |
| JP3589467B2 (ja) | 2004-11-17 |
| EP0782744B1 (en) | 1998-11-11 |
| DE69505994T2 (de) | 1999-04-08 |
| DE69505994D1 (de) | 1998-12-17 |
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