JPH11248545A - Temperature measuring system - Google Patents
Temperature measuring systemInfo
- Publication number
- JPH11248545A JPH11248545A JP5375598A JP5375598A JPH11248545A JP H11248545 A JPH11248545 A JP H11248545A JP 5375598 A JP5375598 A JP 5375598A JP 5375598 A JP5375598 A JP 5375598A JP H11248545 A JPH11248545 A JP H11248545A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- temperature
- core cable
- cable
- change
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000009529 body temperature measurement Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 2
- 239000004020 conductor Substances 0.000 description 9
- 239000013307 optical fiber Substances 0.000 description 7
- 238000009532 heart rate measurement Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000035699 permeability Effects 0.000 description 3
- 238000001069 Raman spectroscopy Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
Landscapes
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は温度測定システムに
関し、特に、2芯ケーブルを用いた温度測定システムに
関する。The present invention relates to a temperature measuring system, and more particularly to a temperature measuring system using a two-core cable.
【0002】[0002]
【従来の技術】一般に、温度測定には、熱電対又は白金
抵抗体等の感温素子を用いて限定された範囲(環境範
囲)の温度を測定する所謂点測定方式が知られており、
さらに、温度分布を測定する際には、光ファイバケーブ
ルの誘導ラマンら散乱現象を用いて温度分布を測定する
所謂分布型方式が用いられる。2. Description of the Related Art Generally, a so-called point measurement method for measuring a temperature in a limited range (environmental range) using a thermocouple or a temperature-sensitive element such as a platinum resistor is known for temperature measurement.
Further, when measuring the temperature distribution, a so-called distribution type method of measuring the temperature distribution using a stimulated Raman scattering phenomenon of an optical fiber cable is used.
【0003】分布型方式では、広い範囲の温度分布測定
を1本の光ファイバケーブルを用いて測定でき、このた
め、土木計測の領域においても、例えば、コンクリート
の打設温度管理に用いられている。In the distribution type method, a wide range of temperature distribution can be measured by using one optical fiber cable. For this reason, the temperature distribution is used in the area of civil engineering measurement, for example, for controlling concrete placing temperature. .
【0004】[0004]
【発明が解決しようとする課題】ところで、上述の分布
型方式では、光ファイバケーブルの設置に当っては、伝
送損失の関係上、曲率半径に制限があるばかりでなく、
光ファイバケーブルの接続及びコネクタの取付等製造上
及び取付上に種々の制約がある。By the way, in the above-mentioned distribution type system, when the optical fiber cable is installed, not only the radius of curvature is limited due to the transmission loss, but also the optical fiber cable is limited.
There are various restrictions on manufacturing and mounting, such as connection of optical fiber cables and mounting of connectors.
【0005】加えて、上述のラマン散乱現象を用いた手
法では、微小信号を検出する必要があるため、つまり、
微小信号を取り扱う必要がある関係上、光ファイバケー
ブルの長さ方向において、測定限界があり、しかも、測
定装置自体が高価となってしまうという問題点がある。In addition, in the method using the Raman scattering phenomenon described above, it is necessary to detect a small signal.
Due to the need to handle small signals, there is a problem that there is a measurement limit in the length direction of the optical fiber cable, and that the measuring device itself becomes expensive.
【0006】本発明の目的は製造上及び取付上の制約が
ない温度測定システムに提供することにある。It is an object of the present invention to provide a temperature measuring system which has no manufacturing and mounting restrictions.
【0007】本発明の他の目的は測定限界が大きくしか
も安価な温度測定システムを提供することにある。Another object of the present invention is to provide an inexpensive temperature measurement system having a large measurement limit.
【0008】[0008]
【課題を解決するための手段】本発明によれば、一端が
入射端として規定された2芯ケーブルと、該2芯ケーブ
ルの入射端から電気パルスを入射パルスとして入射する
パルス発生回路と、前記2芯ケーブルにおける長さ方向
の温度変化に基づいて前記2芯ケーブル内において前記
入射パルスに応じて生じる反射パルスを前記入射端で受
け前記反射パルスの極性と前記入射パルスからの遅れ時
間とを検出して前記温度変化を温度分布として測定する
測定回路とを有することを特徴とする温度測定システム
が得られる。According to the present invention, there is provided a two-core cable having one end defined as an incident end, a pulse generating circuit for emitting an electric pulse as an incident pulse from the incident end of the two-core cable, A reflected pulse generated in response to the incident pulse in the two-core cable is received at the incident end based on a temperature change in the length direction of the two-core cable, and the polarity of the reflected pulse and a delay time from the incident pulse are detected. And a measuring circuit for measuring the temperature change as a temperature distribution.
【0009】[0009]
【発明の実施の形態】以下本発明について図面を参照し
て説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the drawings.
【0010】図1を参照して、図示の温度測定システム
は、パルス発生回路11及び反射パルス測定回路12を
備えており、これらパルス発生回路11及び反射パルス
測定回路12は、図示のように、2芯ケーブル13に接
続されている。いま、パルス発生回路11から2芯ケー
ブル13に電気パルスを入射パルスとして入射して、2
芯ケーブル13からの反射パルスを反射パルス測定回路
12で検出する。Referring to FIG. 1, the illustrated temperature measuring system includes a pulse generating circuit 11 and a reflected pulse measuring circuit 12, and these pulse generating circuit 11 and reflected pulse measuring circuit 12 are arranged as shown in FIG. It is connected to a two-core cable 13. Now, an electric pulse is input from the pulse generation circuit 11 to the two-core cable 13 as an incident pulse,
The reflected pulse from the core cable 13 is detected by the reflected pulse measuring circuit 12.
【0011】入射パルス入射から反射パルスを検出する
までの時間をt、2芯ケーブル13内を伝播するパルス
の速度をv、入射端から反射パルス発生箇所までの2芯
ケーブル13の距離をLとすると、距離Lは数1で表さ
れる。The time from the incidence of the incident pulse to the detection of the reflected pulse is t, the speed of the pulse propagating in the two-core cable 13 is v, and the distance of the two-core cable 13 from the incident end to the point where the reflected pulse is generated is L. Then, the distance L is expressed by Equation 1.
【0012】[0012]
【数1】 (Equation 1)
【0013】時間t(つまり、反射パルスの伝播遅延時
間)を測定すると、数1から反射位置が求められる。When the time t (that is, the propagation delay time of the reflected pulse) is measured, the reflection position can be obtained from Equation 1.
【0014】ところで、平行2芯ケーブルにおいては、
芯線の半径をr、芯線中心間距離をd、導体周囲の透磁
率をμ、導体周囲の誘電率をεとすると、高周波領域に
おける特性インピーダンスZpは、数2で表される。Incidentally, in a parallel two-core cable,
Assuming that the radius of the core wire is r, the center-to-center distance is d, the magnetic permeability around the conductor is μ, and the dielectric constant around the conductor is ε, the characteristic impedance Zp in the high frequency region is expressed by Equation 2.
【0015】[0015]
【数2】 (Equation 2)
【0016】一方、同軸ケーブルにおいては、同軸ケー
ブルの外部導体内径をb、内部導体外径をa、導体間の
透磁率をμ、導体間の誘電率をεとすると、高周波領域
における特性インピーダンスZcは、数3で表される。On the other hand, in a coaxial cable, assuming that the outer conductor inner diameter of the coaxial cable is b, the inner conductor outer diameter is a, the magnetic permeability between conductors is μ, and the dielectric constant between conductors is ε, the characteristic impedance Zc Is represented by Equation 3.
【0017】[0017]
【数3】 (Equation 3)
【0018】数2及び数3において、誘電率εの温度変
化率は、内部導体外径a、外部導体内径b、及び透磁率
μに比べて大きいから、両特性インピーダンスともに1
√εに比例して変化することになる。In equations (2) and (3), the temperature change rate of the dielectric constant ε is larger than the inner conductor outer diameter a, the outer conductor inner diameter b, and the magnetic permeability μ.
It will change in proportion to √ε.
【0019】平行2芯ケーブル及び同軸ケーブルとも
に、電気パルスの伝送路として用いることができ、予め
定められた温度における伝送路の特性インピーダンス
(以下、基準特性インピーダンスという)をZ0 とし
て、温度上昇によって特性インピーダンス(以下、変化
後特性インピーダンスという)がZに変化した際、特性
インピーダンスの変化によって生じる反射波の反射率R
は数4で表される。Both the parallel two-core cable and the coaxial cable can be used as an electric pulse transmission line. The characteristic impedance of the transmission line at a predetermined temperature (hereinafter referred to as reference characteristic impedance) is defined as Z0, and the characteristic is increased by temperature rise. When the impedance (hereinafter, referred to as changed characteristic impedance) changes to Z, the reflectance R of the reflected wave generated by the change in the characteristic impedance
Is represented by Equation 4.
【0020】[0020]
【数4】 (Equation 4)
【0021】ここで、同軸ケーブルの温度上昇による特
性インピーダンスの変化と反射率との関係を求めてみ
る。常温域の特性インピーダンスをZ0 、高温域の特性
インピーダンスをZとして、誘電率の温度係数をα、比
例定数をkとすると、基準特性インピーダンスZ0 及び
変化後特性インピーダンスというZはそれぞれ数5及び
数6で表すことができる。Here, the relationship between the change in the characteristic impedance due to the temperature rise of the coaxial cable and the reflectance will be obtained. Assuming that the characteristic impedance in the normal temperature range is Z0, the characteristic impedance in the high temperature range is Z, the temperature coefficient of the dielectric constant is α, and the proportionality constant is k, the reference characteristic impedance Z0 and the changed characteristic impedance Z are represented by Equations 5 and 6, respectively. Can be represented by
【0022】[0022]
【数5】 (Equation 5)
【0023】[0023]
【数6】 但し、比例定数kは数7で表すものとする。(Equation 6) However, the proportionality constant k is represented by Expression 7.
【0024】[0024]
【数7】 ここで、数8(近似公式)を用いて数6を変形すると、
数9が得られる。(Equation 7) Here, when Equation 6 is transformed using Equation 8 (approximation formula),
Equation 9 is obtained.
【0025】[0025]
【数8】 (Equation 8)
【0026】[0026]
【数9】 (Equation 9)
【0027】数4に数5及び数9を代入すると、数10
が得られる。Substituting Equations 5 and 9 into Equation 4 gives Equation 10
Is obtained.
【0028】[0028]
【数10】 (Equation 10)
【0029】同様にして、平行2芯ケーブルの特性イン
ピーダンスを示す数2を数4に代入して、平行2芯ケー
ブルにおける反射率Rを求めると、同軸ケーブルと同様
に数10が得られる。Similarly, by substituting Equation 2 representing the characteristic impedance of the parallel two-core cable into Equation 4, and calculating the reflectance R of the parallel two-core cable, Equation 10 is obtained in the same manner as with the coaxial cable.
【0030】数10は、誘電率の温度係数αが反射率R
に及ぼす影響を示しており、ここでは、誘電率の温度係
数αの1/4に比例して反射率Rが変化することを示し
ている。なお、数10において、符号“−”は反射波の
極性を示している。Equation 10 indicates that the temperature coefficient α of the dielectric constant is the reflectance R
In this case, it is shown that the reflectance R changes in proportion to 1/4 of the temperature coefficient α of the dielectric constant. Note that, in Expression 10, the sign “−” indicates the polarity of the reflected wave.
【0031】例えば、3C−2V高周波同軸ケーブルで
は、その基準特性インピーダンスZ0 は常温で75Ωで
あり、内外導体間に使用される誘電体として誘電率の温
度係数が−1500(ppm/℃)のポリエチレンが用
いられている(出典:電子通信学会/電子通信ハンドブ
ック 402頁/1997年)。この3C−2V高周波
同軸ケーブルにおいては、反射率が約375ppm/℃
であり、3C−2V高周波同軸ケーブルは、反射率が約
375ppm/℃となる温度係数を有する温度分布セン
サケーブルとして用いることができる。For example, in a 3C-2V high-frequency coaxial cable, its reference characteristic impedance Z0 is 75Ω at room temperature, and polyethylene having a temperature coefficient of a dielectric constant of −1500 (ppm / ° C.) as a dielectric used between the inner and outer conductors. (Source: IEICE / Electronic Communications Handbook, 402 pages / 1997). In this 3C-2V high-frequency coaxial cable, the reflectance is about 375 ppm / ° C.
The 3C-2V high-frequency coaxial cable can be used as a temperature distribution sensor cable having a temperature coefficient having a reflectance of about 375 ppm / ° C.
【0032】なお、平行2芯ケーブルにおいても、同軸
ケーブルと同様に、特性インピーダンスは1/√εに比
例して変化するから、平行2芯ケーブルにおいても、特
性インピーダンスに対する温度変化は同軸ケーブルと同
様になる。従って、平行2芯ケーブルも温度分布センサ
ケーブルとして用いることができる。In the parallel two-core cable, the characteristic impedance changes in proportion to 1 / √ε, as in the case of the coaxial cable. become. Therefore, a parallel two-core cable can also be used as a temperature distribution sensor cable.
【0033】ここで、図2も参照して、2芯ケーブル1
3が直線状に敷設されているとする。この際、図2
(a)に示すように、ケーブルの長さ方向にケーブル温
度が高い領域(温度上昇領域)があるものとする。この
ような状態で、パルス発生回路11から入射パルスを与
えると、図2(b)に示すように、パルス入射端からみ
て、温度上昇領域の開始点と終止点において、入射パル
スに応じた反射パルスが発生する(以下開始点における
反射パルスを開始点パルスといい、終止点における反射
パルスを終止点パルスという)。さらに、ケーブルの終
端においても反射パルスが発生する(以下終端パルスと
いう)。Here, referring also to FIG.
3 is laid in a straight line. At this time, FIG.
As shown in (a), there is a region where the cable temperature is high (temperature rising region) in the length direction of the cable. When an incident pulse is applied from the pulse generation circuit 11 in such a state, as shown in FIG. A pulse is generated (hereinafter, the reflection pulse at the start point is called a start point pulse, and the reflection pulse at the end point is called an end point pulse). Further, a reflected pulse is also generated at the end of the cable (hereinafter referred to as an end pulse).
【0034】図2(a)に示す例では、温度上昇領域が
存在しており、その開始点では、特性インピーダンスが
低い領域から高い領域へと変化するため、開始点におけ
る反射パルスは入射パルスと同一の極性となる。In the example shown in FIG. 2A, there is a temperature rise region, and at the start point, the characteristic impedance changes from a low region to a high region. It has the same polarity.
【0035】一方、終了点では、特性インピーダンスが
高い領域から低い領域へと変化してするから、終止点に
おける反射パルスは入射パルスと逆の極性となる。On the other hand, at the end point, since the characteristic impedance changes from a high region to a low region, the reflected pulse at the end point has a polarity opposite to that of the incident pulse.
【0036】上述のようにして発生した反射パルスは反
射パルス測定回路12に与えられる。そして、パルス発
生回路11と反射パルス測定回路12とを連動させて、
パルス発生回路11が入射パルスを入射すると、反射パ
ルス測定回路12がカウント(計時)を開始し、最初に
反射パルス(開始点パルス)を受けた時点でのカウント
値を計測する(以下第1のカウント値という)。反射パ
ルス測定回路12は数1に基づいて、開始点までの距離
を求める。さらに、反射パルス測定回路12は計時を続
けて、第2回目に反射パルス(終止点パルス)を受けた
時点でのカウント値を計測する(第2のカウント値とい
う)。反射パルス測定回路12は数1に基づいて、終止
点までの距離を求める。The reflected pulse generated as described above is supplied to the reflected pulse measuring circuit 12. Then, the pulse generation circuit 11 and the reflected pulse measurement circuit 12 are linked to each other,
When the pulse generation circuit 11 receives an incident pulse, the reflection pulse measurement circuit 12 starts counting (time measurement), and measures the count value when the reflection pulse (start point pulse) is first received (hereinafter referred to as a first pulse). Count value). The reflected pulse measuring circuit 12 obtains the distance to the starting point based on Equation 1. Further, the reflected pulse measuring circuit 12 continues counting time and measures the count value at the time when the reflected pulse (end point pulse) is received for the second time (referred to as a second count value). The reflected pulse measuring circuit 12 obtains the distance to the end point based on Equation 1.
【0037】反射パルス測定回路12は開始点までの距
離と終止点まで距離から温度変化領域を求める。さら
に、開始点パルスは入射パルスと同極性であり、終止点
パルスは入射パルスと逆極性であるから、反射パルス測
定回路12は、温度変化領域が温度上昇領域であると判
定して、例えば、図2(a)に示す温度分布表示を行
う。The reflected pulse measuring circuit 12 obtains a temperature change area from the distance to the start point and the distance to the end point. Further, since the start point pulse has the same polarity as the incident pulse and the end point pulse has the opposite polarity to the incident pulse, the reflected pulse measurement circuit 12 determines that the temperature change region is the temperature rise region, and, for example, The temperature distribution display shown in FIG.
【0038】図示の例では、さらに、終端パルスを受け
ることになるが、その後、さらに反射パルスを受けるこ
とがないので、パルス測定回路12は終端パルスである
と判断することになる。In the example shown in the figure, the terminal pulse is further received. However, since no further reflected pulse is received thereafter, the pulse measuring circuit 12 determines that it is the terminal pulse.
【0039】なお、温度変化領域が温度下降領域である
場合には、開始点で入射パルスと逆極性の反射パルスが
発生し、終止点で入射パルスと同極性の反射パルスが発
生するから、反射パルス測定回路12はまず逆極性の開
始点パルスを受け、次に、同極性の終止点パルスを受け
ることになり、これによって、温度変化領域が温度下降
領域であると判断できることになる。When the temperature change area is a temperature drop area, a reflected pulse having a polarity opposite to that of the incident pulse is generated at the start point and a reflected pulse having the same polarity as the incident pulse is generated at the end point. The pulse measurement circuit 12 first receives a start point pulse of the opposite polarity, and then receives an end point pulse of the same polarity, whereby it is possible to determine that the temperature change region is a temperature decrease region.
【0040】さらに、温度変化領域が複数あっても、開
始点パルスと終止点パルスの対で考えると、奇数回目に
受ける反射パルスと偶数回目に受ける反射パルスの極性
は互いに逆の関係になっているから、同様にして、複数
の温度変化領域について温度上昇領域か温度下降領域か
を判定できることになる。Furthermore, even if there are a plurality of temperature change regions, the polarity of the reflected pulse received at the odd number and the polarity of the reflected pulse received at the even number become opposite to each other, considering the pair of the start point pulse and the end point pulse. Therefore, similarly, it can be determined whether a plurality of temperature change regions are a temperature rise region or a temperature fall region.
【0041】[0041]
【発明の効果】以上説明したように、本発明では、2芯
ケーブルを温度分布センサケーブルとして用いているか
ら、光ファイバケーブルに比べて敷設上の制約が少ない
という利点がある。加えて、本発明では、光学部品を用
いる必要がないから、測定器の構成が簡単となり、しか
も測定範囲(距離)を拡大できるという効果がある。As described above, in the present invention, since the two-core cable is used as the temperature distribution sensor cable, there is an advantage that there is less restriction on the laying as compared with the optical fiber cable. In addition, according to the present invention, since it is not necessary to use an optical component, there is an effect that the configuration of the measuring device is simplified and the measuring range (distance) can be expanded.
【図1】本発明による温度測定システムの一例を示す図
である。FIG. 1 is a diagram showing an example of a temperature measurement system according to the present invention.
【図2】図1に示す温度測定システムの動作を説明する
ための図であり、(a)はケーブル敷設方向に存在する
温度上昇領域を示す図であり、(b)は温度上昇領域に
よる反射パルスを説明するための図である。FIGS. 2A and 2B are diagrams for explaining the operation of the temperature measurement system shown in FIG. 1; FIG. 2A is a diagram showing a temperature rising region existing in a cable laying direction; FIG. It is a figure for explaining a pulse.
11 パルス発生回路 12 反射パルス測定回路 13 2芯ケーブル 11 pulse generation circuit 12 reflected pulse measurement circuit 13 two-core cable
Claims (3)
ブルと、該2芯ケーブルの入射端から電気パルスを入射
パルスとして入射するパルス発生回路と、前記2芯ケー
ブルにおける長さ方向の温度変化に基づいて前記2芯ケ
ーブル内において前記入射パルスに応じて生じる反射パ
ルスを前記入射端で受け前記反射パルスの極性と前記入
射パルスからの遅れ時間とを検出して前記温度変化を温
度分布として測定する測定回路とを有することを特徴と
する温度測定システム。1. A two-core cable having one end defined as an input end, a pulse generating circuit for inputting an electric pulse as an input pulse from the input end of the two-core cable, and a temperature change in the length direction of the two-core cable. Receiving a reflected pulse generated in accordance with the incident pulse in the two-core cable at the incident end based on the detection of the polarity of the reflected pulse and a delay time from the incident pulse, and measuring the temperature change as a temperature distribution. A temperature measurement system comprising:
において、前記反射パルスは前記温度変化に応じて生じ
る前記2芯ケーブルの特性インピーダンスの変化によっ
て発生し、前記測定回路は前記極性に基づいて前記温度
変化が温度上昇変化であるか温度下降変化であるかを測
定し、前記遅れ時間に基づいて前記温度変化の大きさを
測定するようにしたことを特徴とする温度測定システ
ム。2. The temperature measurement system according to claim 1, wherein the reflected pulse is generated by a change in a characteristic impedance of the two-core cable generated according to the temperature change, and the measurement circuit is configured to perform the measurement based on the polarity. A temperature measurement system for measuring whether the temperature change is a temperature rise change or a temperature fall change, and measuring the magnitude of the temperature change based on the delay time.
ステムにおいて、前記2芯ケーブルは同軸ケーブルであ
ることを特徴とする温度測定システム。3. The temperature measurement system according to claim 1, wherein the two-core cable is a coaxial cable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5375598A JPH11248545A (en) | 1998-03-05 | 1998-03-05 | Temperature measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5375598A JPH11248545A (en) | 1998-03-05 | 1998-03-05 | Temperature measuring system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH11248545A true JPH11248545A (en) | 1999-09-17 |
Family
ID=12951642
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5375598A Withdrawn JPH11248545A (en) | 1998-03-05 | 1998-03-05 | Temperature measuring system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH11248545A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7275011B2 (en) | 2005-06-30 | 2007-09-25 | International Business Machines Corporation | Method and apparatus for monitoring integrated circuit temperature through deterministic path delays |
| JP2010237065A (en) * | 2009-03-31 | 2010-10-21 | Japan Fine Ceramics Center | Surface temperature distribution detection device and pipe thinning detection method using the same |
| JP2018097905A (en) * | 2016-12-14 | 2018-06-21 | 富士通株式会社 | Semiconductor device and method for controlling semiconductor device |
| JP2024506204A (en) * | 2021-02-18 | 2024-02-09 | モレックス エルエルシー | Antenna assembly and related methods |
| WO2024262612A1 (en) * | 2023-06-23 | 2024-12-26 | パナソニックIpマネジメント株式会社 | Refrigerator |
-
1998
- 1998-03-05 JP JP5375598A patent/JPH11248545A/en not_active Withdrawn
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7275011B2 (en) | 2005-06-30 | 2007-09-25 | International Business Machines Corporation | Method and apparatus for monitoring integrated circuit temperature through deterministic path delays |
| JP2010237065A (en) * | 2009-03-31 | 2010-10-21 | Japan Fine Ceramics Center | Surface temperature distribution detection device and pipe thinning detection method using the same |
| JP2018097905A (en) * | 2016-12-14 | 2018-06-21 | 富士通株式会社 | Semiconductor device and method for controlling semiconductor device |
| JP2024506204A (en) * | 2021-02-18 | 2024-02-09 | モレックス エルエルシー | Antenna assembly and related methods |
| US12388192B2 (en) | 2021-02-18 | 2025-08-12 | Molex, Llc | Antenna assemblies and related methods |
| WO2024262612A1 (en) * | 2023-06-23 | 2024-12-26 | パナソニックIpマネジメント株式会社 | Refrigerator |
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