JPH1151858A - Microscopic fourier transform infrared spectrophotometer - Google Patents

Microscopic fourier transform infrared spectrophotometer

Info

Publication number
JPH1151858A
JPH1151858A JP22753397A JP22753397A JPH1151858A JP H1151858 A JPH1151858 A JP H1151858A JP 22753397 A JP22753397 A JP 22753397A JP 22753397 A JP22753397 A JP 22753397A JP H1151858 A JPH1151858 A JP H1151858A
Authority
JP
Japan
Prior art keywords
mirror
sample
infrared light
interferometer
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22753397A
Other languages
Japanese (ja)
Other versions
JP3607055B2 (en
Inventor
Tetsuji Yamaguchi
哲司 山口
Juichiro Ukon
寿一郎 右近
Kazuyuki Ikemoto
和幸 池本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
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Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP22753397A priority Critical patent/JP3607055B2/en
Publication of JPH1151858A publication Critical patent/JPH1151858A/en
Application granted granted Critical
Publication of JP3607055B2 publication Critical patent/JP3607055B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a microscopic Fourier transform spectrophotometer having a small and compact overall structure in which compact optical arrangement can be realized. SOLUTION: The spectrophotometer comprises an infrared light source 2 for irradiating a sample S with an infrared light IR through an interferometer 3 and analyzes the infrared light IR transmitted through the sample S or the infrared light IR transmitted through the sample S and reflected on a member 8 for holding the sample S. A concave mirror 5 is disposed on the post-stage of the interferometer 3 and a convex mirror 19 sharing the geometric focal point with the concave mirror 5 is located in the reflection light path retractively therefrom.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、顕微式フーリエ
変換赤外線分光光度計(以下、顕微FTIRという)に
関する。
The present invention relates to a microscopic Fourier transform infrared spectrophotometer (hereinafter, referred to as microscopic FTIR).

【0002】[0002]

【従来の技術】顕微FTIRは、フーリエ変換赤外線分
光光度計(FTIR)に赤外線顕微鏡を取り付け、微小
な試料を測定するのに有用であり、その顕微分光測定手
法として透過法と反射法とがある。
2. Description of the Related Art Microscopic FTIR is useful for measuring a minute sample by attaching an infrared microscope to a Fourier transform infrared spectrophotometer (FTIR), and there are a transmission method and a reflection method as microspectroscopic measurement methods. .

【0003】すなわち、透過法では、干渉計を出た赤外
光は、試料の下部に位置する集光鏡を介して試料面に集
光する。試料を透過した赤外光は、対物鏡で拡大像を結
像し、この結像面に置かれたマスクを通った赤外光だけ
が検出器に導かれる。一方、反射法では、干渉計を出た
赤外光は顕微鏡上部に導かれ、ハーフミラーまたはエッ
ジミラーにおいて半分だけ反射して、対物鏡を介して試
料面に集光する。試料を透過し試料を保持する反射板に
おいて反射した赤外光は、試料を再び透過して対物鏡で
拡大像を結像し、この結像面に置かれたマスクを通った
赤外光だけが光検出器に導かれる。
That is, in the transmission method, infrared light that has exited the interferometer is focused on a sample surface via a focusing mirror located below the sample. The infrared light transmitted through the sample forms an enlarged image with an objective mirror, and only the infrared light passing through a mask placed on the image forming surface is guided to the detector. On the other hand, in the reflection method, infrared light that has exited the interferometer is guided to the upper part of the microscope, reflected only half by a half mirror or an edge mirror, and condensed on a sample surface via an objective mirror. The infrared light transmitted through the sample and reflected by the reflector holding the sample is transmitted again through the sample, forms an enlarged image with the objective mirror, and only the infrared light that has passed through the mask placed on this image plane Is guided to the photodetector.

【0004】図2は、上記透過法および反射法の双方に
よってそれぞれ顕微分光測定を行うことができる従来の
顕微FTIRの光学系を概略的に示すもので、この図に
おいて、1は適宜の素材よりなるハウジングで、内部と
外部とを気密に遮断するように構成されており、その内
部には、次のような機器が設けられている。すなわち、
2は赤外光源、3は干渉計、4は干渉計3からの平行な
赤外光IRを90°曲げて下方に反射する平面鏡、5は
平面鏡4からの平行な赤外光IRを90°曲げて水平方
向に反射する放物面鏡(凹面鏡の一種)である。
FIG. 2 schematically shows a conventional micro FTIR optical system capable of measuring microspectroscopy by both the transmission method and the reflection method. In this figure, reference numeral 1 denotes an appropriate material. The housing is configured to hermetically shut off the inside and the outside, and the following devices are provided inside the housing. That is,
2 is an infrared light source, 3 is an interferometer, 4 is a plane mirror that bends the parallel infrared light IR from the interferometer 3 by 90 ° and reflects it downward, and 5 is a parallel infrared light IR from the plane mirror 4 that is 90 °. It is a parabolic mirror (a kind of concave mirror) that bends and reflects in the horizontal direction.

【0005】6は放物面鏡5に対しその焦点位置7より
も遠くに設けられ、放物面鏡5からの赤外光IRを90
°曲げて上方に反射し、試料保持部材8に保持された試
料Sに集光させる楕円面鏡(集光鏡の一種)、9はカセ
グレン対物鏡、10はカセグレン対物鏡9に対しその結
像位置よりも近くに設けられるハーフミラー、11はカ
セグレン対物鏡9の結像位置に設けられるマスクとして
のアパーチャ、12はアパーチャ11を経た赤外光IR
を適宜反射する平面鏡、13は平面鏡12からの赤外光
IRを光検出器14に集光させる凹面鏡である。
[0005] Reference numeral 6 denotes a parabolic mirror which is provided farther than a focal position 7 with respect to the parabolic mirror 5, and which transmits infrared light IR from the parabolic mirror 5 to 90.
An ellipsoidal mirror (a type of condensing mirror) that bends and reflects upward and condenses it on the sample S held by the sample holding member 8, 9 is a Cassegrain objective mirror, and 10 is an image thereof formed on the Cassegrain objective mirror 9. A half mirror provided closer to the position, 11 is an aperture as a mask provided at an image forming position of the Cassegrain objective mirror 9, and 12 is an infrared light IR passing through the aperture 11.
Is a plane mirror for appropriately reflecting infrared light IR from the plane mirror 12 to the photodetector 14.

【0006】15は放物面鏡5の楕円面鏡6に対する反
射光路16に対して出入り自在に設けられる放物面鏡
で、その焦点は放物面鏡5と共有し、放物面鏡5からの
赤外光IRを90°曲げて上方に平行な赤外光IRとす
るもので、図中の矢印AまたB方向に移動し、反射光路
16から外れた状態(仮想線で示す状態)と、反射光路
16内に位置する状態(実線で示す状態)とになるよう
に構成されている。17は放物面鏡15とともに反射測
定光路18を構成する凹面鏡で、この凹面鏡17は放物
面鏡15からの平行な赤外光IRを90°曲げてハーフ
ミラー10方向に反射する凹面鏡である。なお、ハーフ
ミラー10に代えてエッジミラーを用いてもよい。
Reference numeral 15 denotes a parabolic mirror provided so as to be able to enter and exit the reflected light path 16 of the parabolic mirror 5 with respect to the ellipsoidal mirror 6, and the focal point is shared with the parabolic mirror 5. From the reflected light path 16 (indicated by a phantom line), moving in the direction of arrow A or B in FIG. And a state (shown by a solid line) located in the reflection optical path 16. Reference numeral 17 denotes a concave mirror that forms a reflection measurement optical path 18 together with the parabolic mirror 15. The concave mirror 17 is a concave mirror that bends the parallel infrared light IR from the parabolic mirror 15 by 90 ° and reflects it in the direction of the half mirror 10. . Note that an edge mirror may be used instead of the half mirror 10.

【0007】上記構成の光学系においては、透過法によ
って顕微分光測定を行うときは、試料保持部材8として
赤外光透過性材料よりなるものを用い、これに試料Sを
保持させる。そして、放物面鏡15を矢印A方向に移動
させて、仮想線で示すように、放物面鏡5の反射光路1
6から外れた状態とする。この状態では、干渉計3を出
た赤外光IRは平面鏡4および放物面鏡5を経た後、楕
円面鏡6に入射する。そして、この楕円面鏡6で反射し
た赤外光IRは、試料保持部材8を透過した後、試料S
面で集光し、この試料Sを透過した赤外光IRはカセグ
レン対物鏡9によってアパーチャ11において結像し、
さらに、平面鏡12および凹面鏡13を経て光検出器1
4に入射する。
In the optical system having the above-described configuration, when microspectroscopic measurement is performed by the transmission method, a sample holding member 8 made of an infrared light transmitting material is used, and the sample S is held on the material. Then, the parabolic mirror 15 is moved in the direction of arrow A, and the reflected light path 1
6. In this state, the infrared light IR that has exited the interferometer 3 passes through the plane mirror 4 and the parabolic mirror 5, and then enters the elliptical mirror 6. Then, the infrared light IR reflected by the ellipsoidal mirror 6 passes through the sample holding member 8, and then the sample S
The infrared light IR condensed on the surface and transmitted through the sample S forms an image at the aperture 11 by the Cassegrain objective mirror 9,
Further, the photodetector 1 passes through a plane mirror 12 and a concave mirror 13.
4 is incident.

【0008】また、反射法によって顕微分光測定を行う
ときは、試料保持部材8として赤外光を反射させる例え
ば研磨した金属板を用い、これに試料Sを保持させる。
そして、放物面鏡15を、矢印B方向に移動させて、実
線で示すように、放物面鏡5の反射光路16内に位置す
る状態とする。この状態では、干渉計3を出た赤外光I
Rは平面鏡4および放物面鏡5を経た後、放物面鏡15
に入射する。そして、この放物面鏡15で反射した赤外
光IRは平行光となって凹面鏡17に下方から入射し、
この凹面鏡17によって90°曲げられてカセグレン対
物鏡9の上方に位置するハーフミラー10に導かれ、こ
のハーフミラー10において反射して、カセグレン対物
鏡9を介して試料S面に集光する。この集光した光は試
料Sを透過し、試料保持部材8において反射した後、試
料Sを再び透過し、カセグレン対物鏡9によってアパー
チャ11において結像し、さらに、平面鏡12および凹
面鏡13を経て光検出器14に入射する。
When microspectroscopic measurement is performed by the reflection method, a sample holding member 8 is used, for example, a polished metal plate that reflects infrared light, and the sample S is held on the metal plate.
Then, the parabolic mirror 15 is moved in the direction of arrow B so as to be positioned in the reflection optical path 16 of the parabolic mirror 5 as shown by the solid line. In this state, the infrared light I
R passes through a plane mirror 4 and a parabolic mirror 5 and then a parabolic mirror 15
Incident on. Then, the infrared light IR reflected by the parabolic mirror 15 becomes parallel light and enters the concave mirror 17 from below,
The light is bent by 90 ° by the concave mirror 17, guided to the half mirror 10 located above the Cassegrain objective mirror 9, reflected by the half mirror 10, and condensed on the sample S surface via the Cassegrain objective mirror 9. The condensed light passes through the sample S and is reflected by the sample holding member 8, passes through the sample S again, forms an image at the aperture 11 by the Cassegrain objective mirror 9, and further passes through the plane mirror 12 and the concave mirror 13. The light enters the detector 14.

【0009】上述のように、上記従来の顕微FTIRに
おいては、放物面鏡5と楕円面鏡6との間の光路16に
対して出入り自在に設けられる放物面鏡15の位置を出
状態または入り状態に切り換えることにより、透過法に
よる顕微分光測定および反射法による顕微分光測定の双
方を択一的に行うことができる。
As described above, in the above-mentioned conventional microscopic FTIR, the position of the parabolic mirror 15 which is provided so as to be freely movable in and out of the optical path 16 between the parabolic mirror 5 and the ellipsoidal mirror 6 is in an outgoing state. Alternatively, by switching to the ON state, both the microspectroscopic measurement by the transmission method and the microspectroscopic measurement by the reflection method can be performed alternatively.

【0010】[0010]

【発明が解決しようとする課題】しかしながら、上記従
来の顕微FTIRにおいては、放物面鏡5と放物面鏡1
5とによって平行な赤外光IRが得られるようにしてい
るため、放物面鏡15を、その焦点が楕円面鏡6の焦点
と重なるように配置する必要があり、放物面鏡5と放物
面鏡15との間の距離は、両者5,15の焦点距離の和
となるため、大きくならざるを得ず、顕微FTIRの光
学系を小型でコンパクトな構成とすることができず、ハ
ウジング1も大型になり、設置のためのスペースがそれ
だけ必要であるといった不都合があった。
However, in the conventional microscopic FTIR, the parabolic mirror 5 and the parabolic mirror 1 are not provided.
5, the parabolic mirror 15 needs to be arranged so that its focal point overlaps with the focal point of the elliptical mirror 6. Since the distance from the parabolic mirror 15 is the sum of the focal lengths of the both 5 and 15, it must be large, and the optical system of the microscopic FTIR cannot be made small and compact. The housing 1 is also large, and there is an inconvenience that the space for installation is required accordingly.

【0011】また、顕微FTIRにおいては、その測定
光路長が大きくなればなるほど、空気中の水分や二酸化
炭素などの影響を受けやすくなる。これに対応する手法
として、ハウジング1内を不活性ガスで置換することが
考えられるが、ハウジング1自体が大きいため、それだ
け大量の不活性ガスが必要になるといった不都合があ
り、このような観点からも改良の余地があった。
Further, in the micro FTIR, the longer the measured optical path length, the more susceptible to moisture and carbon dioxide in the air. As a method corresponding to this, it is conceivable to replace the inside of the housing 1 with an inert gas. However, since the housing 1 itself is large, there is a disadvantage that a large amount of the inert gas is required. There was also room for improvement.

【0012】この発明は、上述の事柄に留意してなされ
たもので、その目的は、コンパクトな光学配置が可能
で、全体として小型かつコンパクトな構成を有する顕微
FTIRを提供することである。
SUMMARY OF THE INVENTION The present invention has been made in consideration of the above-mentioned matters, and an object of the present invention is to provide a microscopic FTIR having a compact and compact structure which can be compactly arranged.

【0013】[0013]

【課題を解決するための手段】上記目的を達成するた
め、この発明では、赤外光源からの赤外光を干渉計を経
て試料に照射し、そのとき試料を透過した赤外光または
試料を透過し試料を保持する部材において反射した赤外
光を分析するようにした顕微FTIRにおいて、前記干
渉計の後段に設けられる凹面鏡の反射光路中に、この凹
面鏡と幾何学的焦点を共有する凸面鏡を、前記光路に対
して出入り自在に設けている。
In order to achieve the above object, according to the present invention, a sample is irradiated with infrared light from an infrared light source via an interferometer, and the infrared light or the sample transmitted through the sample is then irradiated. In a microscopic FTIR configured to analyze infrared light transmitted and reflected by a member holding a sample, a convex mirror sharing a geometrical focus with the concave mirror is provided in a reflection optical path of a concave mirror provided at a subsequent stage of the interferometer. , Are provided so as to be able to enter and exit the optical path.

【0014】上記構成の顕微FTIRにおいては、凹面
鏡と凸面鏡との間の距離は、凹面鏡と凸面鏡の焦点距離
の和となるのではなく、凹面鏡の焦点距離よりも小さく
できるため、従来の顕微FTIRに比べて大幅に小型で
コンパクトな構成とすることができる。
In the micro FTIR having the above configuration, the distance between the concave mirror and the convex mirror is not the sum of the focal lengths of the concave mirror and the convex mirror, but can be smaller than the focal length of the concave mirror. Compared to this, the configuration can be made significantly smaller and more compact.

【0015】[0015]

【発明の実施の形態】発明の実施の形態を図面を参照し
ながら説明する。図1は、この発明の一つの実施の形態
を示す。この実施の形態における顕微FTIRが、図2
に示した従来の顕微FTIRと異なる点は、干渉計の後
段に設けられる凹面鏡の反射光路中に、この凹面鏡と幾
何学的焦点を共有する凸面鏡を、前記光路に対して出入
り自在に設けたことである。なお、図1において、図2
における符号と同一のものは同一物を示している。
Embodiments of the present invention will be described with reference to the drawings. FIG. 1 shows one embodiment of the present invention. The microscopic FTIR in this embodiment is shown in FIG.
The difference from the conventional microscopic FTIR shown in Fig. 1 is that a convex mirror sharing a geometrical focus with the concave mirror is provided in the reflected optical path of the concave mirror provided at the subsequent stage of the interferometer so as to be able to freely enter and exit the optical path. It is. In FIG. 1, FIG.
The same reference numerals as those in indicate the same items.

【0016】すなわち、図1において、19は干渉計3
の後段に設けられる凹面鏡としての放物面鏡5の反射光
路20に対して出入り自在に設けられる逆放物面鏡(凸
面鏡の一種)で、図2に示した楕円面鏡15と同様に、
図中の矢印AまたB方向に移動し、放物面鏡5の反射光
路20から外れた状態(仮想線で示す状態)と、反射光
路内に位置する状態(実線で示す状態)とになるように
構成されているとともに、放物面鏡5と幾何学的焦点を
共有している。したがって、逆放物面鏡19が実線で示
す位置にあるとき、放物面鏡5方向から入射する赤外光
IRは90°上方に曲げられて平行な赤外光IRとなっ
て凹面鏡17に向けて反射される。
That is, in FIG. 1, reference numeral 19 denotes the interferometer 3
2 is a reverse parabolic mirror (a type of convex mirror) provided to be able to enter and exit the reflected light path 20 of the parabolic mirror 5 as a concave mirror provided at the subsequent stage, similar to the elliptical mirror 15 shown in FIG.
It moves in the directions of arrows A and B in the figure, and becomes a state deviating from the reflected light path 20 of the parabolic mirror 5 (a state shown by a virtual line) and a state located in the reflected light path (a state shown by a solid line). And shares a geometrical focus with the parabolic mirror 5. Therefore, when the inverted parabolic mirror 19 is at the position indicated by the solid line, the infrared light IR incident from the direction of the parabolic mirror 5 is bent upward by 90 ° to become parallel infrared light IR, and the parallel infrared light IR is transmitted to the concave mirror 17. Reflected toward.

【0017】21は逆放物面鏡19が仮想線で示すよう
に反射光路20から外れた位置にあるとき、放物面鏡5
からの赤外光IRを90°曲げて試料S方向に反射する
平面鏡であり、この実施の形態においては、放物面鏡5
からの赤外光IRが平面鏡21において反射されて、試
料Sで集光するように構成されている。
Reference numeral 21 denotes a parabolic mirror 5 when the inverted parabolic mirror 19 is located at a position deviated from the reflected light path 20 as shown by a virtual line.
Is a plane mirror that bends the infrared light IR from the object by 90 ° and reflects it in the sample S direction. In this embodiment, the parabolic mirror 5
Is reflected by the plane mirror 21 and collected by the sample S.

【0018】上記構成の顕微FTIRにおいては、透過
法によって顕微分光測定を行うときは、試料保持部材8
として赤外光透過性材料よりなるものを用い、これに試
料Sを保持させる。そして、逆放物面鏡19を矢印A方
向に移動させて、仮想線で示すように、放物面鏡5の反
射光路20から外れた状態とする。この状態では、干渉
計3を出た赤外光IRは平面鏡4および放物面鏡5を経
た後、平面鏡21に入射する。そして、この平面鏡21
で反射した赤外光IRは試料S面で集光し、この試料S
を透過した赤外光IRはカセグレン対物鏡9によってア
パーチャ11において結像し、さらに、平面鏡12およ
び凹面鏡13を経て光検出器14に入射する。
In the microscopic FTIR having the above configuration, when microspectroscopic measurement is performed by the transmission method, the sample holding member 8 is required.
A sample made of an infrared light-transmitting material is used as the sample S. Then, the inverted parabolic mirror 19 is moved in the direction of arrow A so as to be out of the reflection optical path 20 of the parabolic mirror 5 as shown by a virtual line. In this state, the infrared light IR that has exited the interferometer 3 passes through the plane mirror 4 and the parabolic mirror 5, and then enters the plane mirror 21. And this plane mirror 21
The infrared light IR reflected by the sample is condensed on the surface of the sample S, and this sample S
The infrared light IR transmitted through is focused on the aperture 11 by the Cassegrain objective mirror 9, and further enters the photodetector 14 via the plane mirror 12 and the concave mirror 13.

【0019】また、反射法によって顕微分光測定を行う
ときは、試料保持部材8として赤外光を反射させる例え
ば研磨した金属板を用い、これに試料Sを保持させる。
そして、逆放物面鏡19を、矢印B方向に移動させて、
実線で示すように、放物面鏡5の反射光路20内に位置
する状態とする。この状態では、干渉計3を出た赤外光
IRは平面鏡4および放物面鏡5を経た後、逆放物面鏡
19に入射する。そして、この逆放物面鏡19で反射し
た赤外光IRは平行光となって凹面鏡17に下方から入
射し、この凹面鏡17によって90°曲げられてカセグ
レン対物鏡9の上方に位置するハーフミラー10に導か
れ、このハーフミラー10において反射して、カセグレ
ン対物鏡9を介して試料S面に集光する。この集光した
光は試料Sを透過し、試料保持部材8において反射した
後、試料Sを再び透過し、カセグレン対物鏡9によって
アパーチャ11において結像し、さらに、平面鏡12お
よび凹面鏡13を経て光検出器14に入射する。
When performing microspectroscopy measurement by the reflection method, a sample holding member 8 is used, for example, a polished metal plate that reflects infrared light, and the sample S is held on the plate.
Then, the inverted parabolic mirror 19 is moved in the direction of arrow B,
As shown by the solid line, it is assumed that it is located in the reflection optical path 20 of the parabolic mirror 5. In this state, the infrared light IR that has exited the interferometer 3 passes through the plane mirror 4 and the parabolic mirror 5 and then enters the inverted parabolic mirror 19. The infrared light IR reflected by the inverted parabolic mirror 19 becomes parallel light and enters the concave mirror 17 from below, is bent by 90 ° by the concave mirror 17, and is a half mirror positioned above the Cassegrain objective mirror 9. The light is guided to the half mirror 10, reflected by the half mirror 10, and condensed on the surface of the sample S via the Cassegrain objective mirror 9. The condensed light passes through the sample S and is reflected by the sample holding member 8, passes through the sample S again, forms an image at the aperture 11 by the Cassegrain objective mirror 9, and further passes through the plane mirror 12 and the concave mirror 13. The light enters the detector 14.

【0020】このように、上記構成の顕微FTIRにお
いては、放物面鏡5と平面鏡21との間の光路20に対
して出入り自在に設けられる逆放物面鏡19の位置を出
状態または入り状態に切り換えることにより、透過法に
よる顕微分光測定および反射法による顕微分光測定の双
方を択一的に行うことができる。
As described above, in the microscopic FTIR having the above-described configuration, the position of the inverted parabolic mirror 19 provided to be able to enter and exit the optical path 20 between the parabolic mirror 5 and the plane mirror 21 is set to the outgoing state or the incoming state. By switching to the state, it is possible to selectively perform both the microscopic light measurement by the transmission method and the microscopic light measurement by the reflection method.

【0021】そして、上記顕微FTIRにおいては、放
物面鏡5と逆放物面鏡19との間の距離は、両者5,1
9の焦点距離の和となるのではなく、放物面鏡5の焦点
距離よりも小さいので、従来の顕微FTIRに比べて大
幅に小型でコンパクトな構成とすることができる。特
に、放物面鏡5の焦点を試料Sのセット位置に合わせて
あるので、従来の顕微FTIRと同様に、透過法および
反射法による顕微分光測定を択一的に行うことができ
る。
In the microscopic FTIR, the distance between the parabolic mirror 5 and the inverted parabolic mirror 19 is 5, 1
9 is smaller than the focal length of the parabolic mirror 5 instead of the sum of the focal lengths of the focal lengths, so that the configuration can be made significantly smaller and more compact than the conventional microscopic FTIR. In particular, since the focal point of the parabolic mirror 5 is set to the set position of the sample S, the microspectroscopy measurement by the transmission method and the reflection method can be alternatively performed as in the conventional micro FTIR.

【0022】この発明は、上述の実施の形態に限られる
ものではなく、例えば放物面鏡5に代えて、他の凹面鏡
を用いてもよく、また、逆放物面鏡19に代えて、他の
凸面鏡を用いてもよい。
The present invention is not limited to the above-described embodiment. For example, another concave mirror may be used instead of the parabolic mirror 5, and instead of the inverted parabolic mirror 19, Other convex mirrors may be used.

【0023】[0023]

【発明の効果】この発明の顕微FTIRにおいては、凹
面鏡と凸面鏡との間の距離は、凹面鏡と凸面鏡の焦点距
離の和となるのではなく、凹面鏡の焦点距離よりも小さ
くできるため、従来の顕微FTIRに比べて大幅に小型
でコンパクトな光学配置が可能となる。したがって、こ
の発明によれば、測定光路長が短い小型でコンパクトな
顕微FTIRを構成することができ、空気中の水分や二
酸化炭素などの影響を受けにくくなり、精度の高い測定
を行うことができるとともに、設置スペースも小さくて
済むなど、優れた特長を有する顕微FTIRを得ること
ができる。
In the microscopic FTIR of the present invention, the distance between the concave mirror and the convex mirror is not the sum of the focal lengths of the concave mirror and the convex mirror, but can be smaller than the focal length of the concave mirror. An optical arrangement that is significantly smaller and more compact than FTIR is possible. Therefore, according to the present invention, a small and compact microscopic FTIR having a short measurement optical path length can be configured, and is less affected by moisture or carbon dioxide in the air, and highly accurate measurement can be performed. At the same time, it is possible to obtain a micro FTIR having excellent features such as a small installation space.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の顕微FTIRの光学的構成の一例を
概略的に示す図である。
FIG. 1 is a diagram schematically showing an example of an optical configuration of a microscopic FTIR of the present invention.

【図2】従来の顕微FTIRの光学的構成を概略的に示
す図である。
FIG. 2 is a diagram schematically showing an optical configuration of a conventional microscopic FTIR.

【符号の説明】[Explanation of symbols]

2…赤外光源、3…干渉計、5…凹面鏡、8…試料保持
部材、19…凸面鏡、20…反射光路、S…試料、IR
…赤外光。
2 infrared light source 3 interferometer 5 concave mirror 8 sample holding member 19 convex mirror 20 reflected light path S sample and IR
... infrared light.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 赤外光源からの赤外光を干渉計を経て試
料に照射し、そのとき試料を透過した赤外光または試料
を透過し試料を保持する部材において反射した赤外光を
分析するようにした顕微式フーリエ変換赤外線分光光度
計において、前記干渉計の後段に設けられる凹面鏡の反
射光路中に、この凹面鏡と幾何学的焦点を共有する凸面
鏡を、前記光路に対して出入り自在に設けたことを特徴
とする顕微式フーリエ変換赤外線分光光度計。
1. A sample is irradiated with infrared light from an infrared light source via an interferometer, and the infrared light transmitted through the sample or the infrared light transmitted through the sample and reflected by a member holding the sample is analyzed. In the microscopic Fourier transform infrared spectrophotometer, a convex mirror sharing a geometrical focus with the concave mirror is freely inserted into and out of the optical path in the reflection optical path of the concave mirror provided at the subsequent stage of the interferometer. A microscopic Fourier transform infrared spectrophotometer, which is provided.
JP22753397A 1997-08-07 1997-08-07 Microscopic Fourier transform infrared spectrophotometer Expired - Fee Related JP3607055B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22753397A JP3607055B2 (en) 1997-08-07 1997-08-07 Microscopic Fourier transform infrared spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22753397A JP3607055B2 (en) 1997-08-07 1997-08-07 Microscopic Fourier transform infrared spectrophotometer

Publications (2)

Publication Number Publication Date
JPH1151858A true JPH1151858A (en) 1999-02-26
JP3607055B2 JP3607055B2 (en) 2005-01-05

Family

ID=16862404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22753397A Expired - Fee Related JP3607055B2 (en) 1997-08-07 1997-08-07 Microscopic Fourier transform infrared spectrophotometer

Country Status (1)

Country Link
JP (1) JP3607055B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012117936A (en) * 2010-12-01 2012-06-21 Ritsumeikan Infrared microscope and an infrared microscope system
CN102621076A (en) * 2012-03-14 2012-08-01 中国石油大学(北京) Device, method and system for detecting energy source gas
CN108074829A (en) * 2016-11-10 2018-05-25 上海新昇半导体科技有限公司 Characterization equipment based on FTIR

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012117936A (en) * 2010-12-01 2012-06-21 Ritsumeikan Infrared microscope and an infrared microscope system
CN102621076A (en) * 2012-03-14 2012-08-01 中国石油大学(北京) Device, method and system for detecting energy source gas
CN108074829A (en) * 2016-11-10 2018-05-25 上海新昇半导体科技有限公司 Characterization equipment based on FTIR

Also Published As

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