JPS4724961U - - Google Patents
Info
- Publication number
- JPS4724961U JPS4724961U JP2870071U JP2870071U JPS4724961U JP S4724961 U JPS4724961 U JP S4724961U JP 2870071 U JP2870071 U JP 2870071U JP 2870071 U JP2870071 U JP 2870071U JP S4724961 U JPS4724961 U JP S4724961U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Connecting Device With Holders (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2870071U JPS4724961U (fr) | 1971-04-14 | 1971-04-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2870071U JPS4724961U (fr) | 1971-04-14 | 1971-04-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS4724961U true JPS4724961U (fr) | 1972-11-20 |
Family
ID=27889479
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2870071U Pending JPS4724961U (fr) | 1971-04-14 | 1971-04-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS4724961U (fr) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4935306U (fr) * | 1972-06-29 | 1974-03-28 | ||
| JPS55178978U (fr) * | 1979-06-12 | 1980-12-22 | ||
| JP2008016249A (ja) * | 2006-07-04 | 2008-01-24 | Jeol Ltd | 試料保持体、試料検査方法及び試料検査装置並びに試料検査システム |
| EP2105727A1 (fr) | 2008-03-26 | 2009-09-30 | Jeol Ltd. | Microscope électronique à balayage comprenant un film comme porte-échantillon et un plat pour collecter du matériel d'échantillon d'un film endommagé |
| EP2148359A2 (fr) | 2008-07-23 | 2010-01-27 | Jeol Ltd. | Porte-échantillons, appareil d'inspection d'échantillons et procédé d'inspection d'échantillons |
| US7745802B2 (en) | 2007-01-31 | 2010-06-29 | Jeol Ltd. | Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder |
| US7906760B2 (en) | 2008-04-08 | 2011-03-15 | Jeol Ltd. | Inspection method and reagent solution |
| EP2388575A1 (fr) | 2010-05-20 | 2011-11-23 | JEOL Ltd. | Support d'échantillons, appareil d'inspection et procédé d'inspection |
-
1971
- 1971-04-14 JP JP2870071U patent/JPS4724961U/ja active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4935306U (fr) * | 1972-06-29 | 1974-03-28 | ||
| JPS55178978U (fr) * | 1979-06-12 | 1980-12-22 | ||
| JP2008016249A (ja) * | 2006-07-04 | 2008-01-24 | Jeol Ltd | 試料保持体、試料検査方法及び試料検査装置並びに試料検査システム |
| US7745802B2 (en) | 2007-01-31 | 2010-06-29 | Jeol Ltd. | Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder |
| EP2105727A1 (fr) | 2008-03-26 | 2009-09-30 | Jeol Ltd. | Microscope électronique à balayage comprenant un film comme porte-échantillon et un plat pour collecter du matériel d'échantillon d'un film endommagé |
| US7906760B2 (en) | 2008-04-08 | 2011-03-15 | Jeol Ltd. | Inspection method and reagent solution |
| EP2148359A2 (fr) | 2008-07-23 | 2010-01-27 | Jeol Ltd. | Porte-échantillons, appareil d'inspection d'échantillons et procédé d'inspection d'échantillons |
| EP2388575A1 (fr) | 2010-05-20 | 2011-11-23 | JEOL Ltd. | Support d'échantillons, appareil d'inspection et procédé d'inspection |