JPS49103566A - - Google Patents
Info
- Publication number
- JPS49103566A JPS49103566A JP48013975A JP1397573A JPS49103566A JP S49103566 A JPS49103566 A JP S49103566A JP 48013975 A JP48013975 A JP 48013975A JP 1397573 A JP1397573 A JP 1397573A JP S49103566 A JPS49103566 A JP S49103566A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48013975A JPS49103566A (ja) | 1973-02-02 | 1973-02-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48013975A JPS49103566A (ja) | 1973-02-02 | 1973-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS49103566A true JPS49103566A (ja) | 1974-10-01 |
Family
ID=11848212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48013975A Pending JPS49103566A (ja) | 1973-02-02 | 1973-02-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS49103566A (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51118366A (en) * | 1975-04-11 | 1976-10-18 | Hitachi Ltd | Scanning type electric microscope |
| JPS5378162A (en) * | 1976-12-22 | 1978-07-11 | Jeol Ltd | Cubic measurement method for scanning electron image and its unit |
| JPS56118254A (en) * | 1980-02-22 | 1981-09-17 | Hitachi Ltd | Scan type electron microscope |
-
1973
- 1973-02-02 JP JP48013975A patent/JPS49103566A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51118366A (en) * | 1975-04-11 | 1976-10-18 | Hitachi Ltd | Scanning type electric microscope |
| JPS5378162A (en) * | 1976-12-22 | 1978-07-11 | Jeol Ltd | Cubic measurement method for scanning electron image and its unit |
| JPS56118254A (en) * | 1980-02-22 | 1981-09-17 | Hitachi Ltd | Scan type electron microscope |