JPS49105448A - - Google Patents
Info
- Publication number
- JPS49105448A JPS49105448A JP1466973A JP1466973A JPS49105448A JP S49105448 A JPS49105448 A JP S49105448A JP 1466973 A JP1466973 A JP 1466973A JP 1466973 A JP1466973 A JP 1466973A JP S49105448 A JPS49105448 A JP S49105448A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1466973A JPS49105448A (fr) | 1973-02-07 | 1973-02-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1466973A JPS49105448A (fr) | 1973-02-07 | 1973-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS49105448A true JPS49105448A (fr) | 1974-10-05 |
Family
ID=11867610
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1466973A Pending JPS49105448A (fr) | 1973-02-07 | 1973-02-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS49105448A (fr) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60148137A (ja) * | 1984-01-13 | 1985-08-05 | Nec Corp | 単結晶半導体表面の結晶性評価法 |
| JP2009182331A (ja) * | 2008-01-31 | 2009-08-13 | Interuniv Micro Electronica Centrum Vzw | ゲルマニウムの欠陥エッチング |
-
1973
- 1973-02-07 JP JP1466973A patent/JPS49105448A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60148137A (ja) * | 1984-01-13 | 1985-08-05 | Nec Corp | 単結晶半導体表面の結晶性評価法 |
| JP2009182331A (ja) * | 2008-01-31 | 2009-08-13 | Interuniv Micro Electronica Centrum Vzw | ゲルマニウムの欠陥エッチング |