JPS4995306U - - Google Patents
Info
- Publication number
- JPS4995306U JPS4995306U JP14121372U JP14121372U JPS4995306U JP S4995306 U JPS4995306 U JP S4995306U JP 14121372 U JP14121372 U JP 14121372U JP 14121372 U JP14121372 U JP 14121372U JP S4995306 U JPS4995306 U JP S4995306U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Valve-Gear Or Valve Arrangements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14121372U JPS5219046Y2 (fr) | 1972-12-11 | 1972-12-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14121372U JPS5219046Y2 (fr) | 1972-12-11 | 1972-12-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4995306U true JPS4995306U (fr) | 1974-08-16 |
| JPS5219046Y2 JPS5219046Y2 (fr) | 1977-04-30 |
Family
ID=28420250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14121372U Expired JPS5219046Y2 (fr) | 1972-12-11 | 1972-12-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5219046Y2 (fr) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6232789B1 (en) | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
| DE10143173A1 (de) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafersonde |
| JP2005527823A (ja) | 2002-05-23 | 2005-09-15 | カスケード マイクロテック インコーポレイテッド | デバイスのテスト用プローブ |
| US6724205B1 (en) | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
| US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
| DE202004021093U1 (de) | 2003-12-24 | 2006-09-28 | Cascade Microtech, Inc., Beaverton | Aktiver Halbleiterscheibenmessfühler |
| KR20070058522A (ko) | 2004-09-13 | 2007-06-08 | 캐스케이드 마이크로테크 인코포레이티드 | 양측 프루빙 구조 |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| JP5080459B2 (ja) | 2005-06-13 | 2012-11-21 | カスケード マイクロテック インコーポレイテッド | 広帯域能動／受動差動信号プローブ |
| DE202007018733U1 (de) | 2006-06-09 | 2009-03-26 | Cascade Microtech, Inc., Beaverton | Messfühler für differentielle Signale mit integrierter Symmetrieschaltung |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
-
1972
- 1972-12-11 JP JP14121372U patent/JPS5219046Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5219046Y2 (fr) | 1977-04-30 |