JPS50110577A - - Google Patents

Info

Publication number: JPS50110577A
Authority: JP; Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP1545574A

Other languages

Japanese (ja)

Other versions

JPS5223224B2 (cs

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1974-02-08

Filing date

1974-02-08

Publication date

1975-08-30

1974-02-08 Application filed filed Critical

1974-02-08 Priority to JP1545574A priority Critical patent/JPS5223224B2/ja

1975-08-30 Publication of JPS50110577A publication Critical patent/JPS50110577A/ja

1977-06-22 Publication of JPS5223224B2 publication Critical patent/JPS5223224B2/ja

Status Expired legal-status Critical Current

Links

Landscapes

Testing Of Individual Semiconductor Devices (AREA)

JP1545574A 1974-02-08 1974-02-08 Expired JPS5223224B2 (cs)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP1545574A JPS5223224B2 (cs)	1974-02-08	1974-02-08

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1545574A JPS5223224B2 (cs)	1974-02-08	1974-02-08

Publications (2)

Publication Number	Publication Date
JPS50110577A true JPS50110577A (cs)	1975-08-30
JPS5223224B2 JPS5223224B2 (cs)	1977-06-22

Family

ID=11889265

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1545574A Expired JPS5223224B2 (cs)	1974-02-08	1974-02-08

Country Status (1)

Country	Link
JP (1)	JPS5223224B2 (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2010019840A (ja) *	2008-07-11	2010-01-28	Advantest Corp	測定装置、試験装置および測定方法
JP2015090745A (ja) *	2013-11-05	2015-05-11	エスペック株式会社	外部短絡試験装置及び外部短絡試験方法

1974
- 1974-02-08 JP JP1545574A patent/JPS5223224B2/ja not_active Expired

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2010019840A (ja) *	2008-07-11	2010-01-28	Advantest Corp	測定装置、試験装置および測定方法
JP2015090745A (ja) *	2013-11-05	2015-05-11	エスペック株式会社	外部短絡試験装置及び外部短絡試験方法

Also Published As

Publication number	Publication date
JPS5223224B2 (cs)	1977-06-22

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