JPS51134175A - Supersonic inspection device - Google Patents
Supersonic inspection deviceInfo
- Publication number
- JPS51134175A JPS51134175A JP50057326A JP5732675A JPS51134175A JP S51134175 A JPS51134175 A JP S51134175A JP 50057326 A JP50057326 A JP 50057326A JP 5732675 A JP5732675 A JP 5732675A JP S51134175 A JPS51134175 A JP S51134175A
- Authority
- JP
- Japan
- Prior art keywords
- inspection device
- supersonic
- supersonic inspection
- feasible
- observe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
PURPOSE: A supersonic inspection device which is designed to raise the resolving power and detecting sensitivity of a supersonic signal to the great extent, thus making it feasible to observe the whole properties of the object under inspection with much more precision.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50057326A JPS5848856B2 (en) | 1975-05-16 | 1975-05-16 | Chiyouonpakensaouchi |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50057326A JPS5848856B2 (en) | 1975-05-16 | 1975-05-16 | Chiyouonpakensaouchi |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51134175A true JPS51134175A (en) | 1976-11-20 |
| JPS5848856B2 JPS5848856B2 (en) | 1983-10-31 |
Family
ID=13052438
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50057326A Expired JPS5848856B2 (en) | 1975-05-16 | 1975-05-16 | Chiyouonpakensaouchi |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5848856B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5815105A (en) * | 1981-07-22 | 1983-01-28 | Hitachi Ltd | Ultrasonic wave thickness gage |
-
1975
- 1975-05-16 JP JP50057326A patent/JPS5848856B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5815105A (en) * | 1981-07-22 | 1983-01-28 | Hitachi Ltd | Ultrasonic wave thickness gage |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5848856B2 (en) | 1983-10-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS51142372A (en) | Time measuring device | |
| JPS5262043A (en) | Automatic testing instrument | |
| JPS5218170A (en) | Position detection method | |
| JPS51120242A (en) | Fiber diameter measuring instrument | |
| JPS51131002A (en) | Car inspection and examination device | |
| JPS5212833A (en) | Jam detection device | |
| JPS51141684A (en) | Automatic flaw detector | |
| JPS51142349A (en) | Standard-setting device of cylinder gauge | |
| JPS5216177A (en) | Probe card | |
| JPS5220076A (en) | Dew-point measurement device | |
| JPS522758A (en) | Measuring system of the outside diameter of a cable | |
| JPS5258947A (en) | Measuring device for solids | |
| JPS5245955A (en) | Method for measuring characteristics of round test piece without any c ontact | |
| JPS51149087A (en) | Sampling device with a flushing unit | |
| JPS5227380A (en) | Measuring system of semiconductor breakdown voltage | |
| JPS546594A (en) | Numerical value controlling ultrasonic flaw detecting system | |
| JPS5234770A (en) | Detection circuit of multiple input maximum value | |
| JPS523472A (en) | Automatic range changing apparatus | |
| JPS51129226A (en) | Distance measure device | |
| JPS51144287A (en) | Ultrasonic wave flaw detector | |
| JPS51115796A (en) | Automatic consevation detection apparatus of an automatic fire alarm | |
| JPS522470A (en) | Circuit gauge | |
| JPS51118996A (en) | Material detector | |
| JPS5222970A (en) | Absolute displacement vibrometer | |
| JPS5376867A (en) | Maximum and minimum detecting circuit |