JPS51137441A - Radiation gauge for measuring outline of moving strip - Google Patents

Radiation gauge for measuring outline of moving strip

Info

Publication number
JPS51137441A
JPS51137441A JP51053111A JP5311176A JPS51137441A JP S51137441 A JPS51137441 A JP S51137441A JP 51053111 A JP51053111 A JP 51053111A JP 5311176 A JP5311176 A JP 5311176A JP S51137441 A JPS51137441 A JP S51137441A
Authority
JP
Japan
Prior art keywords
moving strip
radiation gauge
outline
measuring
measuring outline
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP51053111A
Other languages
English (en)
Other versions
JPS5816445B2 (ja
Inventor
Kenneth Browning Smith
Derek William Adams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Cambridge Research Ltd
Original Assignee
Heath Gloucester Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heath Gloucester Ltd filed Critical Heath Gloucester Ltd
Publication of JPS51137441A publication Critical patent/JPS51137441A/ja
Publication of JPS5816445B2 publication Critical patent/JPS5816445B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP51053111A 1975-05-10 1976-05-10 移動しているストリツプの輪郭を測定するための放射線ゲ−ジ Expired JPS5816445B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB19743/75A GB1552224A (en) 1975-05-10 1975-05-10 Strip profile gauge

Publications (2)

Publication Number Publication Date
JPS51137441A true JPS51137441A (en) 1976-11-27
JPS5816445B2 JPS5816445B2 (ja) 1983-03-31

Family

ID=10134470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51053111A Expired JPS5816445B2 (ja) 1975-05-10 1976-05-10 移動しているストリツプの輪郭を測定するための放射線ゲ−ジ

Country Status (5)

Country Link
US (1) US4047036A (ja)
JP (1) JPS5816445B2 (ja)
DE (1) DE2618906C2 (ja)
FR (1) FR2325020A1 (ja)
GB (1) GB1552224A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810604A (ja) * 1981-07-13 1983-01-21 Toshiba Corp 板厚測定装置
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計
JP2011196837A (ja) * 2010-03-19 2011-10-06 Yokogawa Electric Corp Ｘ線測定装置

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU83049A1 (fr) * 1981-01-07 1982-09-10 Arbed Installation de controle de la geometrie de produits lamines
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
DE3142759A1 (de) * 1981-10-28 1983-05-05 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zum durchleuchten von koerpern mit roentgenstrahlung
GB2109924B (en) * 1981-11-25 1985-02-06 Schlumberger Electronics Apparatus and method for measuring temperature profile
FR2538905B1 (fr) * 1982-12-29 1985-07-12 Sereg Soc Procede et dispositif de controle par jauge radioactive d'une bande de materiau en defilement, en particulier d'une bande de caoutchouc pour pneumatiques
GB2138561B (en) * 1983-04-21 1987-03-18 Schlumberger Electronics Strip profile gauge
EP0233389A1 (en) * 1986-02-12 1987-08-26 Josef W. Repsch A method of measuring the weight per unit area, density and thickness of a moving sheet
DE3530109A1 (de) * 1985-08-23 1987-03-05 Hoesch Stahl Ag Vorrichtung zur messung des dickenprofils von gewalzten baendern
US4928257A (en) * 1988-01-25 1990-05-22 Bethlehem Steel Corporation Method and apparatus for monitoring the thickness profile of a strip
US5351203A (en) * 1992-08-03 1994-09-27 Bethlehem Steel Corporation Online tomographic gauging of sheet metal
US5490196A (en) * 1994-03-18 1996-02-06 Metorex International Oy Multi energy system for x-ray imaging applications
US7045787B1 (en) * 1995-10-23 2006-05-16 Science Applications International Corporation Density detection using real time discrete photon counting for fast moving targets
US7388205B1 (en) 1995-10-23 2008-06-17 Science Applications International Corporation System and method for target inspection using discrete photon counting and neutron detection
DE19722482A1 (de) * 1997-05-28 1998-12-03 Siemens Ag Materialprüfanlage
ES2223334T3 (es) * 1999-05-28 2005-03-01 Ims-Messsysteme Gmbh Procedimiento para la determinacion delaplanitud deuna banda de material.
DE10160398B4 (de) * 2001-12-10 2004-11-11 Dieffenbacher Gmbh + Co. Kg Verfahren und Vorrichtung zur Prüfung einer Matte aus Biomassepartikeln
US8314394B1 (en) 2009-11-04 2012-11-20 Science Applications International Corporation System and method for three-dimensional imaging using scattering from annihilation coincidence photons
DE102010014238B4 (de) 2010-03-29 2013-09-19 Mesacon Messelektronik Gmbh Dresden Verfahren zur Bestimmung der Dicke platten-oder bandförmiger Werkstücke
TWI426227B (zh) 2010-12-30 2014-02-11 財團法人工業技術研究院 移動樣品之形貌的量測方法及其裝置
US9111331B2 (en) 2011-09-07 2015-08-18 Rapiscan Systems, Inc. X-ray inspection system that integrates manifest data with imaging/detection processing
JP2015537196A (ja) * 2012-10-02 2015-12-24 アナロジック コーポレイション 放射線システム用エネルギーシールド｛ｅｎｅｒｇｙｓｈｉｅｌｄｆｏｒｒａｄｉａｔｉｏｎｓｙｓｔｅｍ｝
DE102015108060A1 (de) * 2015-05-21 2016-11-24 Ims Messsysteme Gmbh Verfahren und Vorrichtung zur Charakterisierung eines Gefüges eines Bands oder Blechs aus Metall
JP6342437B2 (ja) * 2016-02-22 2018-06-13 ゼネラル・エレクトリック・カンパニイ 放射線断層撮影システム及びその制御プログラム
PL3764281T3 (pl) 2016-02-22 2025-02-10 Rapiscan Systems, Inc. Sposoby identyfikacji broni palnej na obrazach radiograficznych
CN112243310B (zh) * 2019-07-16 2022-04-22 清华大学 多射线源加速器和检查方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3016460A (en) * 1958-04-14 1962-01-09 Goodyear Tire & Rubber Method and apparatus for web thickness control
JPS48106251U (ja) * 1972-03-13 1973-12-10

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB638253A (en) * 1947-06-30 1950-06-07 Westinghouse Electric Int Co Improvements in or relating to x-ray apparatus for measuring the thickness of material
US2730566A (en) * 1949-12-27 1956-01-10 Bartow Beacons Inc Method and apparatus for x-ray fluoroscopy
GB890380A (en) * 1958-04-14 1962-02-28 Goodyear Tire & Rubber Method and apparatus for web thickness control
US2983819A (en) * 1958-06-05 1961-05-09 Gen Electric Radiation gauge
US3101407A (en) * 1959-04-09 1963-08-20 Jr John Daniel Shipman Fluoroscope system utilizing an image storage tube
GB1283915A (en) * 1968-08-23 1972-08-02 Emi Ltd A method of and apparatus for examination of a body by radiation such as x or gamma radiation
US3944833A (en) * 1968-08-23 1976-03-16 E M I Limited Apparatus for examining a body by radiation such as X or gamma radiation
DE1812893A1 (de) * 1968-12-05 1970-06-18 Knapsack Ag, 5033 Knapsack Anordnung zur Dickenmessung von Walzgut, insbesondere von Folien
GB1272005A (en) * 1969-08-21 1972-04-26 Mullard Ltd Improvements in or relating to image intensifier tubes
US3729632A (en) * 1970-12-21 1973-04-24 Industrial Nucleonics Corp Penetrating radiation gauge
JPS4874865A (ja) * 1971-12-29 1973-10-09
US3832551A (en) * 1972-06-22 1974-08-27 Bethlehem Steel Corp Radiation gage with sample and hold feature in deviation measuring circuit
FR2226645B3 (ja) * 1973-04-17 1975-10-24 Alcan Res & Dev
JPS5922161B2 (ja) * 1974-05-13 1984-05-24 株式会社東芝 放射線厚み計

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3016460A (en) * 1958-04-14 1962-01-09 Goodyear Tire & Rubber Method and apparatus for web thickness control
JPS48106251U (ja) * 1972-03-13 1973-12-10

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810604A (ja) * 1981-07-13 1983-01-21 Toshiba Corp 板厚測定装置
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計
JP2011196837A (ja) * 2010-03-19 2011-10-06 Yokogawa Electric Corp Ｘ線測定装置

Also Published As

Publication number Publication date
JPS5816445B2 (ja) 1983-03-31
DE2618906A1 (de) 1976-11-25
DE2618906C2 (de) 1986-01-23
FR2325020A1 (fr) 1977-04-15
GB1552224A (en) 1979-09-12
FR2325020B1 (ja) 1979-05-04
US4047036A (en) 1977-09-06

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