JPS51138379A - Scanning type electron microscope - Google Patents
Scanning type electron microscopeInfo
- Publication number
- JPS51138379A JPS51138379A JP50062001A JP6200175A JPS51138379A JP S51138379 A JPS51138379 A JP S51138379A JP 50062001 A JP50062001 A JP 50062001A JP 6200175 A JP6200175 A JP 6200175A JP S51138379 A JPS51138379 A JP S51138379A
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- type electron
- scanning type
- decrease
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 238000005192 partition Methods 0.000 abstract 1
Abstract
PURPOSE: To prevent the decrease in the magnetic field and scattered electron beam caused by eddy current by the use of metal bellows as a partition wall between a scanning coil and an electron passage.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50062001A JPS51138379A (en) | 1975-05-26 | 1975-05-26 | Scanning type electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50062001A JPS51138379A (en) | 1975-05-26 | 1975-05-26 | Scanning type electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS51138379A true JPS51138379A (en) | 1976-11-29 |
Family
ID=13187469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50062001A Pending JPS51138379A (en) | 1975-05-26 | 1975-05-26 | Scanning type electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS51138379A (en) |
-
1975
- 1975-05-26 JP JP50062001A patent/JPS51138379A/en active Pending
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