JPS52109984A - Infrared rays spectrometer - Google Patents

Infrared rays spectrometer

Info

Publication number
JPS52109984A
JPS52109984A JP2614976A JP2614976A JPS52109984A JP S52109984 A JPS52109984 A JP S52109984A JP 2614976 A JP2614976 A JP 2614976A JP 2614976 A JP2614976 A JP 2614976A JP S52109984 A JPS52109984 A JP S52109984A
Authority
JP
Japan
Prior art keywords
spectrometer
infrared rays
optical
adapting
inclination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2614976A
Other languages
Japanese (ja)
Inventor
Makoto Ishikawa
Hikosaburo Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2614976A priority Critical patent/JPS52109984A/en
Publication of JPS52109984A publication Critical patent/JPS52109984A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

PURPOSE:To always obtain a stabilized base line by adapting that all of the angles of inclination to incident optical beams of optical elements used in reference and specimen optical paths are aligned.
JP2614976A 1976-03-12 1976-03-12 Infrared rays spectrometer Pending JPS52109984A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2614976A JPS52109984A (en) 1976-03-12 1976-03-12 Infrared rays spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2614976A JPS52109984A (en) 1976-03-12 1976-03-12 Infrared rays spectrometer

Publications (1)

Publication Number Publication Date
JPS52109984A true JPS52109984A (en) 1977-09-14

Family

ID=12185472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2614976A Pending JPS52109984A (en) 1976-03-12 1976-03-12 Infrared rays spectrometer

Country Status (1)

Country Link
JP (1) JPS52109984A (en)

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