JPS52137984A - Drawing apparatus - Google Patents
Drawing apparatusInfo
- Publication number
- JPS52137984A JPS52137984A JP5485776A JP5485776A JPS52137984A JP S52137984 A JPS52137984 A JP S52137984A JP 5485776 A JP5485776 A JP 5485776A JP 5485776 A JP5485776 A JP 5485776A JP S52137984 A JPS52137984 A JP S52137984A
- Authority
- JP
- Japan
- Prior art keywords
- radiated
- disturbance
- wafer
- development
- data output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electron Beam Exposure (AREA)
Abstract
PURPOSE: To make easy checking of false positions possible despite error in patterns owing to disturbance at the time of drawing and even after development by comparing signal widths and phase differences between drawing data output signals and beam current signals obtainable from the wafer radiated thereto with a beam.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51054857A JPS5849019B2 (en) | 1976-05-14 | 1976-05-14 | drawing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP51054857A JPS5849019B2 (en) | 1976-05-14 | 1976-05-14 | drawing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52137984A true JPS52137984A (en) | 1977-11-17 |
| JPS5849019B2 JPS5849019B2 (en) | 1983-11-01 |
Family
ID=12982251
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51054857A Expired JPS5849019B2 (en) | 1976-05-14 | 1976-05-14 | drawing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5849019B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62162328A (en) * | 1986-01-10 | 1987-07-18 | Advantest Corp | Charged particle beam exposure equipment |
| JP2006093455A (en) * | 2004-09-24 | 2006-04-06 | Toshiba Corp | Pattern drawing apparatus, pattern inspection apparatus, and pattern drawing system |
| JP2011221555A (en) * | 2011-07-22 | 2011-11-04 | Toshiba Corp | Pattern inspection device and pattern drawing system |
-
1976
- 1976-05-14 JP JP51054857A patent/JPS5849019B2/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62162328A (en) * | 1986-01-10 | 1987-07-18 | Advantest Corp | Charged particle beam exposure equipment |
| JP2006093455A (en) * | 2004-09-24 | 2006-04-06 | Toshiba Corp | Pattern drawing apparatus, pattern inspection apparatus, and pattern drawing system |
| JP2011221555A (en) * | 2011-07-22 | 2011-11-04 | Toshiba Corp | Pattern inspection device and pattern drawing system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5849019B2 (en) | 1983-11-01 |
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