JPS52177A - Prober - Google Patents
ProberInfo
- Publication number
- JPS52177A JPS52177A JP7556875A JP7556875A JPS52177A JP S52177 A JPS52177 A JP S52177A JP 7556875 A JP7556875 A JP 7556875A JP 7556875 A JP7556875 A JP 7556875A JP S52177 A JPS52177 A JP S52177A
- Authority
- JP
- Japan
- Prior art keywords
- needle
- prober
- checked
- supporting
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 abstract 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE: To provide adjustable contacting degree of inspection needle contacted with a part to be checked in predetermined pressure range by supporting the needle at the ends of leaf springs of a pair provided in parallel with each other.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7556875A JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7556875A JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS52177A true JPS52177A (en) | 1977-01-05 |
Family
ID=13579902
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7556875A Pending JPS52177A (en) | 1975-06-23 | 1975-06-23 | Prober |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52177A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0362938A (en) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | Inspection apparatus |
-
1975
- 1975-06-23 JP JP7556875A patent/JPS52177A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0362938A (en) * | 1989-07-31 | 1991-03-19 | Tokyo Electron Ltd | Inspection apparatus |
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