JPS5242792A - Magnetic flaw detection device - Google Patents

Magnetic flaw detection device

Info

Publication number
JPS5242792A
JPS5242792A JP11925075A JP11925075A JPS5242792A JP S5242792 A JPS5242792 A JP S5242792A JP 11925075 A JP11925075 A JP 11925075A JP 11925075 A JP11925075 A JP 11925075A JP S5242792 A JPS5242792 A JP S5242792A
Authority
JP
Japan
Prior art keywords
flaw detection
detection device
magnetic flaw
magnetic
magnets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11925075A
Other languages
Japanese (ja)
Inventor
Tatsuo Hiroshima
Tetsuya Hirota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP11925075A priority Critical patent/JPS5242792A/en
Publication of JPS5242792A publication Critical patent/JPS5242792A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE: Both axial and circumferential magnetic fields to be given to a cylindrical body, etc. which are an object to be examined are generated by a compact magnetic flaw detection unit consisting of two pieces of magnets and a suitable number of magnetic field detecting elements, whereby the reduction in size is facilitated.
COPYRIGHT: (C)1977,JPO&Japio
JP11925075A 1975-10-01 1975-10-01 Magnetic flaw detection device Pending JPS5242792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11925075A JPS5242792A (en) 1975-10-01 1975-10-01 Magnetic flaw detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11925075A JPS5242792A (en) 1975-10-01 1975-10-01 Magnetic flaw detection device

Publications (1)

Publication Number Publication Date
JPS5242792A true JPS5242792A (en) 1977-04-02

Family

ID=14756667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11925075A Pending JPS5242792A (en) 1975-10-01 1975-10-01 Magnetic flaw detection device

Country Status (1)

Country Link
JP (1) JPS5242792A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4594549A (en) * 1984-05-11 1986-06-10 United Technologies Corporation Uniform field generating eddy current testing processing method and apparatus
US5739685A (en) * 1994-06-23 1998-04-14 Sumitomo Metal Industries Limited Method and apparatus for flaw detection by leakage fluexes and leakage flux sensor
US5747988A (en) * 1994-06-23 1998-05-05 Sumitomo Metal Industires Limited Method and apparatus for flaw detection by leakage fluxes and leakage flux sensor
JP4829883B2 (en) * 2004-07-16 2011-12-07 ファウ・ウント・エム・ドイチュラント・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング Method and apparatus for non-destructive inspection of tubes

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4917290A (en) * 1972-06-03 1974-02-15

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4917290A (en) * 1972-06-03 1974-02-15

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4594549A (en) * 1984-05-11 1986-06-10 United Technologies Corporation Uniform field generating eddy current testing processing method and apparatus
US5739685A (en) * 1994-06-23 1998-04-14 Sumitomo Metal Industries Limited Method and apparatus for flaw detection by leakage fluexes and leakage flux sensor
US5747988A (en) * 1994-06-23 1998-05-05 Sumitomo Metal Industires Limited Method and apparatus for flaw detection by leakage fluxes and leakage flux sensor
JP4829883B2 (en) * 2004-07-16 2011-12-07 ファウ・ウント・エム・ドイチュラント・ゲゼルシャフト・ミット・ベシュレンクテル・ハフツング Method and apparatus for non-destructive inspection of tubes

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